diff mbox series

[PULL,08/24] tests/tcg/s390x: Add ex-relative-long.c

Message ID 20230320130330.406378-9-thuth@redhat.com
State New
Headers show
Series [PULL,01/24] MAINTAINERS: Mark the Nios II CPU as orphan | expand

Commit Message

Thomas Huth March 20, 2023, 1:03 p.m. UTC
From: Ilya Leoshkevich <iii@linux.ibm.com>

Test EXECUTE and EXECUTE RELATIVE LONG with relative long instructions
as targets.

Signed-off-by: Ilya Leoshkevich <iii@linux.ibm.com>
Reviewed-by: Richard Henderson <richard.henderson@linaro.org>
Reviewed-by: Nina Schoetterl-Glausch <nsg@linux.ibm.com>
Message-Id: <20230316210751.302423-3-iii@linux.ibm.com>
Signed-off-by: Thomas Huth <thuth@redhat.com>
---
 tests/tcg/s390x/ex-relative-long.c | 156 +++++++++++++++++++++++++++++
 tests/tcg/s390x/Makefile.target    |   1 +
 2 files changed, 157 insertions(+)
 create mode 100644 tests/tcg/s390x/ex-relative-long.c
diff mbox series

Patch

diff --git a/tests/tcg/s390x/ex-relative-long.c b/tests/tcg/s390x/ex-relative-long.c
new file mode 100644
index 0000000000..21fbef6258
--- /dev/null
+++ b/tests/tcg/s390x/ex-relative-long.c
@@ -0,0 +1,156 @@ 
+/* Check EXECUTE with relative long instructions as targets. */
+#include <stdlib.h>
+#include <stdio.h>
+
+struct test {
+    const char *name;
+    long (*func)(long reg, long *cc);
+    long exp_reg;
+    long exp_mem;
+    long exp_cc;
+};
+
+/*
+ * Each test sets the MEM_IDXth element of the mem array to MEM and uses a
+ * single relative long instruction on it. The other elements remain zero.
+ * This is in order to prevent stumbling upon MEM in random memory in case
+ * there is an off-by-a-small-value bug.
+ *
+ * Note that while gcc supports the ZL constraint for relative long operands,
+ * clang doesn't, so the assembly code accesses mem[MEM_IDX] using MEM_ASM.
+ */
+static long mem[0x1000];
+#define MEM_IDX 0x800
+#define MEM_ASM "mem+0x800*8"
+
+/* Initial %r2 value. */
+#define REG 0x1234567887654321
+
+/* Initial mem[MEM_IDX] value. */
+#define MEM 0xfedcba9889abcdef
+
+/* Initial cc value. */
+#define CC 0
+
+/* Relative long instructions and their expected effects. */
+#define FOR_EACH_INSN(F)                                                       \
+    F(cgfrl,  REG,                 MEM,                2)                      \
+    F(cghrl,  REG,                 MEM,                2)                      \
+    F(cgrl,   REG,                 MEM,                2)                      \
+    F(chrl,   REG,                 MEM,                1)                      \
+    F(clgfrl, REG,                 MEM,                2)                      \
+    F(clghrl, REG,                 MEM,                2)                      \
+    F(clgrl,  REG,                 MEM,                1)                      \
+    F(clhrl,  REG,                 MEM,                2)                      \
+    F(clrl,   REG,                 MEM,                1)                      \
+    F(crl,    REG,                 MEM,                1)                      \
+    F(larl,   (long)&mem[MEM_IDX], MEM,                CC)                     \
+    F(lgfrl,  0xfffffffffedcba98,  MEM,                CC)                     \
+    F(lghrl,  0xfffffffffffffedc,  MEM,                CC)                     \
+    F(lgrl,   MEM,                 MEM,                CC)                     \
+    F(lhrl,   0x12345678fffffedc,  MEM,                CC)                     \
+    F(llghrl, 0x000000000000fedc,  MEM,                CC)                     \
+    F(llhrl,  0x123456780000fedc,  MEM,                CC)                     \
+    F(lrl,    0x12345678fedcba98,  MEM,                CC)                     \
+    F(stgrl,  REG,                 REG,                CC)                     \
+    F(sthrl,  REG,                 0x4321ba9889abcdef, CC)                     \
+    F(strl,   REG,                 0x8765432189abcdef, CC)
+
+/* Test functions. */
+#define DEFINE_EX_TEST(insn, exp_reg, exp_mem, exp_cc)                         \
+    static long test_ex_ ## insn(long reg, long *cc)                           \
+    {                                                                          \
+        register long r2 asm("r2");                                            \
+        char mask = 0x20;  /* make target use %r2 */                           \
+        long pm, target;                                                       \
+                                                                               \
+        r2 = reg;                                                              \
+        asm("larl %[target],0f\n"                                              \
+            "cr %%r0,%%r0\n"  /* initial cc */                                 \
+            "ex %[mask],0(%[target])\n"                                        \
+            "jg 1f\n"                                                          \
+            "0: " #insn " %%r0," MEM_ASM "\n"                                  \
+            "1: ipm %[pm]\n"                                                   \
+            : [target] "=&a" (target), [r2] "+r" (r2), [pm] "=r" (pm)          \
+            : [mask] "a" (mask)                                                \
+            : "cc", "memory");                                                 \
+        reg = r2;                                                              \
+        *cc = (pm >> 28) & 3;                                                  \
+                                                                               \
+        return reg;                                                            \
+    }
+
+#define DEFINE_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc)                       \
+    static long test_exrl_ ## insn(long reg, long *cc)                         \
+    {                                                                          \
+        register long r2 asm("r2");                                            \
+        char mask = 0x20;  /* make target use %r2 */                           \
+        long pm;                                                               \
+                                                                               \
+        r2 = reg;                                                              \
+        asm("cr %%r0,%%r0\n"  /* initial cc */                                 \
+            "exrl %[mask],0f\n"                                                \
+            "jg 1f\n"                                                          \
+            "0: " #insn " %%r0," MEM_ASM "\n"                                  \
+            "1: ipm %[pm]\n"                                                   \
+            : [r2] "+r" (r2), [pm] "=r" (pm)                                   \
+            : [mask] "a" (mask)                                                \
+            : "cc", "memory");                                                 \
+        reg = r2;                                                              \
+        *cc = (pm >> 28) & 3;                                                  \
+                                                                               \
+        return reg;                                                            \
+    }
+
+FOR_EACH_INSN(DEFINE_EX_TEST)
+FOR_EACH_INSN(DEFINE_EXRL_TEST)
+
+/* Test definitions. */
+#define REGISTER_EX_EXRL_TEST(ex_insn, insn, _exp_reg, _exp_mem, _exp_cc)      \
+    {                                                                          \
+        .name = #ex_insn " " #insn,                                            \
+        .func = test_ ## ex_insn ## _ ## insn,                                 \
+        .exp_reg = (_exp_reg),                                                 \
+        .exp_mem = (_exp_mem),                                                 \
+        .exp_cc = (_exp_cc),                                                   \
+    },
+
+#define REGISTER_EX_TEST(insn, exp_reg, exp_mem, exp_cc)                       \
+    REGISTER_EX_EXRL_TEST(ex, insn, exp_reg, exp_mem, exp_cc)
+
+#define REGISTER_EXRL_TEST(insn, exp_reg, exp_mem, exp_cc)                     \
+    REGISTER_EX_EXRL_TEST(exrl, insn, exp_reg, exp_mem, exp_cc)
+
+static const struct test tests[] = {
+    FOR_EACH_INSN(REGISTER_EX_TEST)
+    FOR_EACH_INSN(REGISTER_EXRL_TEST)
+};
+
+/* Loop over all tests and run them. */
+int main(void)
+{
+    const struct test *test;
+    int ret = EXIT_SUCCESS;
+    long reg, cc;
+    size_t i;
+
+    for (i = 0; i < sizeof(tests) / sizeof(tests[0]); i++) {
+        test = &tests[i];
+        mem[MEM_IDX] = MEM;
+        cc = -1;
+        reg = test->func(REG, &cc);
+#define ASSERT_EQ(expected, actual) do {                                       \
+    if (expected != actual) {                                                  \
+        fprintf(stderr, "%s: " #expected " (0x%lx) != " #actual " (0x%lx)\n",  \
+                test->name, expected, actual);                                 \
+        ret = EXIT_FAILURE;                                                    \
+    }                                                                          \
+} while (0)
+        ASSERT_EQ(test->exp_reg, reg);
+        ASSERT_EQ(test->exp_mem, mem[MEM_IDX]);
+        ASSERT_EQ(test->exp_cc, cc);
+#undef ASSERT_EQ
+    }
+
+    return ret;
+}
diff --git a/tests/tcg/s390x/Makefile.target b/tests/tcg/s390x/Makefile.target
index 3c940ac952..510bbd9b28 100644
--- a/tests/tcg/s390x/Makefile.target
+++ b/tests/tcg/s390x/Makefile.target
@@ -30,6 +30,7 @@  TESTS+=long-double
 TESTS+=cdsg
 TESTS+=chrl
 TESTS+=rxsbg
+TESTS+=ex-relative-long
 
 cdsg: CFLAGS+=-pthread
 cdsg: LDFLAGS+=-pthread