@@ -758,15 +758,6 @@ static int at24_probe(struct i2c_client *client)
}
pm_runtime_enable(dev);
- at24->nvmem = devm_nvmem_register(dev, &nvmem_config);
- if (IS_ERR(at24->nvmem)) {
- pm_runtime_disable(dev);
- if (!pm_runtime_status_suspended(dev))
- regulator_disable(at24->vcc_reg);
- return dev_err_probe(dev, PTR_ERR(at24->nvmem),
- "failed to register nvmem\n");
- }
-
/*
* Perform a one-byte test read to verify that the chip is functional,
* unless powering on the device is to be avoided during probe (i.e.
@@ -782,6 +773,15 @@ static int at24_probe(struct i2c_client *client)
}
}
+ at24->nvmem = devm_nvmem_register(dev, &nvmem_config);
+ if (IS_ERR(at24->nvmem)) {
+ pm_runtime_disable(dev);
+ if (!pm_runtime_status_suspended(dev))
+ regulator_disable(at24->vcc_reg);
+ return dev_err_probe(dev, PTR_ERR(at24->nvmem),
+ "failed to register nvmem\n");
+ }
+
/* If this a SPD EEPROM, probe for DDR3 thermal sensor */
if (cdata == &at24_data_spd)
at24_probe_temp_sensor(client);
If the eeprom is not accessible, an nvmem device will be registered, the read will fail, and the device will be torn down. If another driver accesses the nvmem device after the teardown, it will reference invalid memory. Move the failure point before registering the nvmem device. Signed-off-by: Daniel Okazaki <dtokazaki@google.com> Fixes: b20eb4c1 ("eeprom: at24: drop unnecessary label") --- drivers/misc/eeprom/at24.c | 18 +++++++++--------- 1 file changed, 9 insertions(+), 9 deletions(-)