From patchwork Thu Jan 4 02:37:41 2024 Content-Type: text/plain; charset="utf-8" MIME-Version: 1.0 Content-Transfer-Encoding: 7bit X-Patchwork-Submitter: Ivan Hu X-Patchwork-Id: 1882280 Return-Path: X-Original-To: incoming@patchwork.ozlabs.org Delivered-To: patchwork-incoming@legolas.ozlabs.org Authentication-Results: legolas.ozlabs.org; spf=pass (sender SPF authorized) smtp.mailfrom=lists.ubuntu.com (client-ip=185.125.189.65; helo=lists.ubuntu.com; envelope-from=fwts-devel-bounces@lists.ubuntu.com; receiver=patchwork.ozlabs.org) Received: from lists.ubuntu.com (lists.ubuntu.com [185.125.189.65]) (using TLSv1.2 with cipher ECDHE-ECDSA-AES256-GCM-SHA384 (256/256 bits)) (No client certificate requested) by legolas.ozlabs.org (Postfix) with ESMTPS id 4T59k10fjgz1yQ5 for ; Thu, 4 Jan 2024 13:38:00 +1100 (AEDT) Received: from localhost ([127.0.0.1] helo=lists.ubuntu.com) by lists.ubuntu.com with esmtp (Exim 4.86_2) (envelope-from ) id 1rLDcF-0007sy-HX; Thu, 04 Jan 2024 02:37:51 +0000 Received: from smtp-relay-canonical-1.internal ([10.131.114.174] helo=smtp-relay-canonical-1.canonical.com) by lists.ubuntu.com with esmtps (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1rLDcB-0007sf-N6 for fwts-devel@lists.ubuntu.com; Thu, 04 Jan 2024 02:37:47 +0000 Received: from canonical.com (unknown [10.101.194.164]) (using TLSv1.3 with cipher TLS_AES_256_GCM_SHA384 (256/256 bits) key-exchange ECDHE (P-256) server-signature RSA-PSS (2048 bits) server-digest SHA256) (No client certificate requested) by smtp-relay-canonical-1.canonical.com (Postfix) with ESMTPSA id 0974242F9F for ; Thu, 4 Jan 2024 02:37:46 +0000 (UTC) From: Ivan Hu To: fwts-devel@lists.ubuntu.com Subject: [PATCH 1/2] acpi: method: add _PDO test (mantis 2293) Date: Thu, 4 Jan 2024 10:37:41 +0800 Message-Id: <20240104023742.124564-1-ivan.hu@canonical.com> X-Mailer: git-send-email 2.34.1 MIME-Version: 1.0 X-BeenThere: fwts-devel@lists.ubuntu.com X-Mailman-Version: 2.1.20 Precedence: list List-Id: Firmware Test Suite Development List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Errors-To: fwts-devel-bounces@lists.ubuntu.com Sender: "fwts-devel" BugLink: https://bugs.launchpad.net/fwts/+bug/2047212 The new method _PDO was added in ACPI 6.5 Signed-off-by: Ivan Hu --- src/acpi/method/method.c | 84 ++++++++++++++++++++++++++++++++++++++++ 1 file changed, 84 insertions(+) diff --git a/src/acpi/method/method.c b/src/acpi/method/method.c index 80cef114..71ccbb4e 100644 --- a/src/acpi/method/method.c +++ b/src/acpi/method/method.c @@ -158,6 +158,7 @@ * _PCT Y * _PDC deprecated * _PDL Y + * _PDO Y * _PIC Y * _PIF Y * _PLD Y @@ -2908,6 +2909,86 @@ static int method_test_UPC(fwts_framework *fw) "_UPC", NULL, 0, method_test_UPC_return, NULL); } +/* + * Section 9.13 USB Power Data Object ACPI6.5 + */ +static void method_test_PDO_return( + fwts_framework *fw, + char *name, + ACPI_BUFFER *buf, + ACPI_OBJECT *obj, + void *private) +{ + uint32_t i, j; + bool failed = false; + uint32_t flags; + + FWTS_UNUSED(private); + + if (fwts_method_check_type(fw, name, buf, ACPI_TYPE_PACKAGE) != FWTS_OK) + return; + + if (obj->Package.Elements[0].Type != ACPI_TYPE_INTEGER) { + fwts_failed(fw, LOG_LEVEL_HIGH, + "Method_PDOBadElementType", + "%s element %" PRIu32 " is not an integer.", name, 0); + failed = true; + } + + if (obj->Package.Elements[1].Type != ACPI_TYPE_INTEGER) { + fwts_failed(fw, LOG_LEVEL_HIGH, + "Method_PDOBadElementType", + "%s element %" PRIu32 " is not an integer.", name, 1); + failed = true; + } + flags = obj->Package.Elements[1].Integer.Value; + if (flags & 0xfffffff0) { + fwts_failed(fw, LOG_LEVEL_MEDIUM, + "Method_PDOElementValue", + "%s package element 1 had upper 28 bits " + "of bits that were non-zero, value 0x%4.4" PRIu32 + ".", name, flags); + failed = true; + } + if ((flags & 0x7) > 4) { + fwts_failed(fw, LOG_LEVEL_MEDIUM, + "Method_PDOElementValue", + "%s package element 1 has reserved bits that are non-zero " + "Bits[2:0] value 101b-111b is reserved.", name); + failed = true; + } + + for (i = 2; i < 4; i++) { + ACPI_OBJECT *pkg; + if (obj->Package.Elements[i].Type != ACPI_TYPE_PACKAGE) { + fwts_failed(fw, LOG_LEVEL_HIGH, + "Method_PDOBadElementType", + "%s element %" PRIu32 " is not a package.", name, i); + failed = true; + continue; + } + pkg = &obj->Package.Elements[i]; + for (j = 0; j < pkg->Package.Count; j++) { + if (pkg->Package.Elements[j].Type != ACPI_TYPE_INTEGER) { + fwts_failed(fw, LOG_LEVEL_HIGH, + "Method_PDOBadSubElementType", + "%s sub-package %" PRIu32 " element %" PRIu32 " is not " + "an integer.", name, i, j); + failed = true; + } + } + } + + if (!failed) + fwts_method_passed_sane(fw, name, "package"); +} + +static int method_test_PDO(fwts_framework *fw) +{ + return method_evaluate_method(fw, METHOD_OPTIONAL, + "_PDO", NULL, 0, method_test_PDO_return, NULL); +} + /* * Section 9.16 User Presence Detection Device */ @@ -4892,6 +4973,9 @@ static fwts_framework_minor_test method_tests[] = { /* Section 9.13 USB Port Capabilities */ { method_test_UPC, "Test _UPC (USB Port Capabilities)." }, + /* Section 9.13 USB Power Data Object ACPI(6.5)*/ + { method_test_PDO, "Test _PDO (USB Power Data Object)." }, + /* Section 9.14 Device Object Name Collision */ /* { method_test_DSM, "Test _DSM (Device Specific Method)." }, */ From patchwork Thu Jan 4 02:37:42 2024 Content-Type: text/plain; charset="utf-8" MIME-Version: 1.0 Content-Transfer-Encoding: 7bit X-Patchwork-Submitter: Ivan Hu X-Patchwork-Id: 1882281 Return-Path: X-Original-To: incoming@patchwork.ozlabs.org Delivered-To: patchwork-incoming@legolas.ozlabs.org Authentication-Results: legolas.ozlabs.org; spf=pass (sender SPF authorized) smtp.mailfrom=lists.ubuntu.com (client-ip=185.125.189.65; helo=lists.ubuntu.com; envelope-from=fwts-devel-bounces@lists.ubuntu.com; receiver=patchwork.ozlabs.org) Received: from lists.ubuntu.com (lists.ubuntu.com [185.125.189.65]) (using TLSv1.2 with cipher ECDHE-ECDSA-AES256-GCM-SHA384 (256/256 bits)) (No client certificate requested) by legolas.ozlabs.org (Postfix) with ESMTPS id 4T59k41dGWz1yQ5 for ; Thu, 4 Jan 2024 13:38:04 +1100 (AEDT) Received: from localhost ([127.0.0.1] helo=lists.ubuntu.com) by lists.ubuntu.com with esmtp (Exim 4.86_2) (envelope-from ) id 1rLDcN-0007u0-JG; Thu, 04 Jan 2024 02:37:59 +0000 Received: from smtp-relay-canonical-0.internal ([10.131.114.83] helo=smtp-relay-canonical-0.canonical.com) by lists.ubuntu.com with esmtps (TLS1.2:ECDHE_RSA_AES_128_GCM_SHA256:128) (Exim 4.86_2) (envelope-from ) id 1rLDcH-0007tD-Ap for fwts-devel@lists.ubuntu.com; Thu, 04 Jan 2024 02:37:53 +0000 Received: from canonical.com (unknown [10.101.194.164]) (using TLSv1.3 with cipher TLS_AES_256_GCM_SHA384 (256/256 bits) key-exchange ECDHE (P-256) server-signature RSA-PSS (2048 bits) server-digest SHA256) (No client certificate requested) by smtp-relay-canonical-0.canonical.com (Postfix) with ESMTPSA id 473453F2D3 for ; Thu, 4 Jan 2024 02:37:50 +0000 (UTC) From: Ivan Hu To: fwts-devel@lists.ubuntu.com Subject: [PATCH 2/2] fwts-test: sync up the method _PDO was added Date: Thu, 4 Jan 2024 10:37:42 +0800 Message-Id: <20240104023742.124564-2-ivan.hu@canonical.com> X-Mailer: git-send-email 2.34.1 In-Reply-To: <20240104023742.124564-1-ivan.hu@canonical.com> References: <20240104023742.124564-1-ivan.hu@canonical.com> MIME-Version: 1.0 X-BeenThere: fwts-devel@lists.ubuntu.com X-Mailman-Version: 2.1.20 Precedence: list List-Id: Firmware Test Suite Development List-Unsubscribe: , List-Archive: List-Post: List-Help: List-Subscribe: , Errors-To: fwts-devel-bounces@lists.ubuntu.com Sender: "fwts-devel" Signed-off-by: Ivan Hu --- fwts-test/method-0001/method-0001.log | 812 +++++++++++++------------- 1 file changed, 408 insertions(+), 404 deletions(-) diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log index a1f9a265..58e15aa5 100644 --- a/fwts-test/method-0001/method-0001.log +++ b/fwts-test/method-0001/method-0001.log @@ -1,41 +1,41 @@ method method: ACPI DSDT Method Semantic tests. method ---------------------------------------------------------- -method Test 1 of 208: Test Method Names. +method Test 1 of 209: Test Method Names. method Found 1061 Objects method PASSED: Test 1, Method names contain legal characters. method -method Test 2 of 208: Test _AEI. +method Test 2 of 209: Test _AEI. method SKIPPED: Test 2, Skipping test for non-existent object method _AEI. method -method Test 3 of 208: Test _EVT (Event Method). +method Test 3 of 209: Test _EVT (Event Method). method SKIPPED: Test 3, Skipping test for non-existent object method _EVT. method -method Test 4 of 208: Test _DLM (Device Lock Mutex). +method Test 4 of 209: Test _DLM (Device Lock Mutex). method SKIPPED: Test 4, Skipping test for non-existent object method _DLM. method -method Test 5 of 208: Test _PIC (Inform AML of Interrupt Model). +method Test 5 of 209: Test _PIC (Inform AML of Interrupt Model). method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method -method Test 6 of 208: Test _CID (Compatible ID). +method Test 6 of 209: Test _CID (Compatible ID). method PASSED: Test 6, \_SB_.PCI0._CID returned an integer method 0x030ad041 (EISA ID PNP0A03). method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an method integer 0x010cd041 (EISA ID PNP0C01). method -method Test 7 of 208: Test _CLS (Class Code). +method Test 7 of 209: Test _CLS (Class Code). method SKIPPED: Test 7, Skipping test for non-existent object method _CLS. method -method Test 8 of 208: Test _DDN (DOS Device Name). +method Test 8 of 209: Test _DDN (DOS Device Name). method SKIPPED: Test 8, Skipping test for non-existent object method _DDN. method -method Test 9 of 208: Test _HID (Hardware ID). +method Test 9 of 209: Test _HID (Hardware ID). method PASSED: Test 9, \_SB_.AMW0._HID returned a string method 'PNP0C14' as expected. method PASSED: Test 9, \_SB_.LID0._HID returned an integer @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an method integer 0x130fd041 (EISA ID PNP0F13). method -method Test 10 of 208: Test _HRV (Hardware Revision Number). +method Test 10 of 209: Test _HRV (Hardware Revision Number). method SKIPPED: Test 10, Skipping test for non-existent object method _HRV. method -method Test 11 of 208: Test _MLS (Multiple Language String). +method Test 11 of 209: Test _MLS (Multiple Language String). method SKIPPED: Test 11, Skipping test for non-existent object method _MLS. method -method Test 12 of 208: Test _PLD (Physical Device Location). +method Test 12 of 209: Test _PLD (Physical Device Location). method SKIPPED: Test 12, Skipping test for non-existent object method _PLD. method -method Test 13 of 208: Test _SUB (Subsystem ID). +method Test 13 of 209: Test _SUB (Subsystem ID). method SKIPPED: Test 13, Skipping test for non-existent object method _SUB. method -method Test 14 of 208: Test _SUN (Slot User Number). +method Test 14 of 209: Test _SUN (Slot User Number). method SKIPPED: Test 14, Skipping test for non-existent object method _SUN. method -method Test 15 of 208: Test _STR (String). +method Test 15 of 209: Test _STR (String). method SKIPPED: Test 15, Skipping test for non-existent object method _STR. method -method Test 16 of 208: Test _UID (Unique ID). +method Test 16 of 209: Test _UID (Unique ID). method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane method looking value 0x00000000. method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly method returned sane looking value 0x00000001. method -method Test 17 of 208: Test _CDM (Clock Domain). +method Test 17 of 209: Test _CDM (Clock Domain). method SKIPPED: Test 17, Skipping test for non-existent object method _CDM. method -method Test 18 of 208: Test _CRS (Current Resource Settings). +method Test 18 of 209: Test _CRS (Current Resource Settings). method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed @@ -187,11 +187,11 @@ method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ method Descriptor) looks sane. method -method Test 19 of 208: Test _DSD (Device Specific Data). +method Test 19 of 209: Test _DSD (Device Specific Data). method SKIPPED: Test 19, Skipping test for non-existent object method _DSD. method -method Test 20 of 208: Test _DIS (Disable). +method Test 20 of 209: Test _DIS (Disable). method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no @@ -209,28 +209,28 @@ method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no method values as expected. method -method Test 21 of 208: Test _DMA (Direct Memory Access). +method Test 21 of 209: Test _DMA (Direct Memory Access). method SKIPPED: Test 21, Skipping test for non-existent object method _DMA. method -method Test 22 of 208: Test _FIX (Fixed Register Resource +method Test 22 of 209: Test _FIX (Fixed Register Resource method Provider). method SKIPPED: Test 22, Skipping test for non-existent object method _FIX. method -method Test 23 of 208: Test _GSB (Global System Interrupt Base). +method Test 23 of 209: Test _GSB (Global System Interrupt Base). method SKIPPED: Test 23, Skipping test for non-existent object method _GSB. method -method Test 24 of 208: Test _HPP (Hot Plug Parameters). +method Test 24 of 209: Test _HPP (Hot Plug Parameters). method SKIPPED: Test 24, Skipping test for non-existent object method _HPP. method -method Test 25 of 208: Test _MAT (Multiple APIC Table Entry). +method Test 25 of 209: Test _MAT (Multiple APIC Table Entry). method SKIPPED: Test 25, Skipping test for non-existent object method _MAT. method -method Test 26 of 208: Test _PRS (Possible Resource Settings). +method Test 26 of 209: Test _PRS (Possible Resource Settings). method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ method Descriptor) looks sane. method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ @@ -248,7 +248,7 @@ method Descriptor) looks sane. method PASSED: Test 26, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ method Descriptor) looks sane. method -method Test 27 of 208: Test _PRT (PCI Routing Table). +method Test 27 of 209: Test _PRT (PCI Routing Table). method PASSED: Test 27, \_SB_.PCI0._PRT correctly returned a sane method looking package. method PASSED: Test 27, \_SB_.PCI0.PEGP._PRT correctly returned a @@ -268,55 +268,55 @@ method sane looking package. method PASSED: Test 27, \_SB_.PCI0.PCIB._PRT correctly returned a method sane looking package. method -method Test 28 of 208: Test _PXM (Proximity). +method Test 28 of 209: Test _PXM (Proximity). method SKIPPED: Test 28, Skipping test for non-existent object method _PXM. method -method Test 29 of 208: Test _SLI (System Locality Information). +method Test 29 of 209: Test _SLI (System Locality Information). method SKIPPED: Test 29, Skipping test for non-existent object method _SLI. method -method Test 30 of 208: Test _CCA (Cache Coherency Attribute). +method Test 30 of 209: Test _CCA (Cache Coherency Attribute). method SKIPPED: Test 30, Skipping test for non-existent object method _CCA. method -method Test 31 of 208: Test _EDL (Eject Device List). +method Test 31 of 209: Test _EDL (Eject Device List). method SKIPPED: Test 31, Skipping test for non-existent object method _EDL. method -method Test 32 of 208: Test _EJD (Ejection Dependent Device). +method Test 32 of 209: Test _EJD (Ejection Dependent Device). method SKIPPED: Test 32, Skipping test for non-existent object method _EJD. method -method Test 33 of 208: Test _EJ0 (Eject). +method Test 33 of 209: Test _EJ0 (Eject). method SKIPPED: Test 33, Skipping test for non-existent object method _EJ0. method -method Test 34 of 208: Test _EJ1 (Eject). +method Test 34 of 209: Test _EJ1 (Eject). method SKIPPED: Test 34, Skipping test for non-existent object method _EJ1. method -method Test 35 of 208: Test _EJ2 (Eject). +method Test 35 of 209: Test _EJ2 (Eject). method SKIPPED: Test 35, Skipping test for non-existent object method _EJ2. method -method Test 36 of 208: Test _EJ3 (Eject). +method Test 36 of 209: Test _EJ3 (Eject). method SKIPPED: Test 36, Skipping test for non-existent object method _EJ3. method -method Test 37 of 208: Test _EJ4 (Eject). +method Test 37 of 209: Test _EJ4 (Eject). method SKIPPED: Test 37, Skipping test for non-existent object method _EJ4. method -method Test 38 of 208: Test _LCK (Lock). +method Test 38 of 209: Test _LCK (Lock). method SKIPPED: Test 38, Skipping test for non-existent object method _LCK. method -method Test 39 of 208: Test _RMV (Remove). +method Test 39 of 209: Test _RMV (Remove). method PASSED: Test 39, \_SB_.PCI0.RP03.PXSX._RMV correctly method returned sane looking value 0x00000001. method -method Test 40 of 208: Test _STA (Status). +method Test 40 of 209: Test _STA (Status). method PASSED: Test 40, \_SB_.PCI0.PEGP.VGA_._STA correctly method returned sane looking value 0x0000000f. method PASSED: Test 40, \_SB_.PCI0.LPCB.LNKA._STA correctly @@ -340,85 +340,85 @@ method returned sane looking value 0x00000000. method PASSED: Test 40, \_SB_.PCI0.LPCB.BAT1._STA correctly method returned sane looking value 0x0000001f. method -method Test 41 of 208: Test _DEP (Operational Region +method Test 41 of 209: Test _DEP (Operational Region method Dependencies). method SKIPPED: Test 41, Skipping test for non-existent object method _DEP. method -method Test 42 of 208: Test _FIT (Firmware Interface Table). +method Test 42 of 209: Test _FIT (Firmware Interface Table). method SKIPPED: Test 42, Skipping test for non-existent object method _FIT. method -method Test 43 of 208: Test _BDN (BIOS Dock Name). +method Test 43 of 209: Test _BDN (BIOS Dock Name). method SKIPPED: Test 43, Skipping test for non-existent object method _BDN. method -method Test 44 of 208: Test _BBN (Base Bus Number). +method Test 44 of 209: Test _BBN (Base Bus Number). method SKIPPED: Test 44, Skipping test for non-existent object method _BBN. method -method Test 45 of 208: Test _DCK (Dock). +method Test 45 of 209: Test _DCK (Dock). method SKIPPED: Test 45, Skipping test for non-existent object method _DCK. method -method Test 46 of 208: Test _INI (Initialize). +method Test 46 of 209: Test _INI (Initialize). method PASSED: Test 46, \_SB_._INI returned no values as method expected. method -method Test 47 of 208: Test _GLK (Global Lock). +method Test 47 of 209: Test _GLK (Global Lock). method SKIPPED: Test 47, Skipping test for non-existent object method _GLK. method -method Test 48 of 208: Test _SEG (Segment). +method Test 48 of 209: Test _SEG (Segment). method SKIPPED: Test 48, Skipping test for non-existent object method _SEG. method -method Test 49 of 208: Test _LSI (Label Storage Information). +method Test 49 of 209: Test _LSI (Label Storage Information). method SKIPPED: Test 49, Skipping test for non-existent object method _LSI. method -method Test 50 of 208: Test _CBR (CXL Host Bridge Register). +method Test 50 of 209: Test _CBR (CXL Host Bridge Register). method SKIPPED: Test 50, Skipping test for non-existent object method _CBR. method -method Test 51 of 208: Test _OFF (Set resource off). +method Test 51 of 209: Test _OFF (Set resource off). method SKIPPED: Test 51, Skipping test for non-existent object method _OFF. method -method Test 52 of 208: Test _ON_ (Set resource on). +method Test 52 of 209: Test _ON_ (Set resource on). method SKIPPED: Test 52, Skipping test for non-existent object method _ON_. method -method Test 53 of 208: Test _DSW (Device Sleep Wake). +method Test 53 of 209: Test _DSW (Device Sleep Wake). method SKIPPED: Test 53, Skipping test for non-existent object method _DSW. method -method Test 54 of 208: Test _IRC (In Rush Current). +method Test 54 of 209: Test _IRC (In Rush Current). method SKIPPED: Test 54, Skipping test for non-existent object method _IRC. method -method Test 55 of 208: Test _PRE (Power Resources for +method Test 55 of 209: Test _PRE (Power Resources for method Enumeration). method SKIPPED: Test 55, Skipping test for non-existent object method _PRE. method -method Test 56 of 208: Test _PR0 (Power Resources for D0). +method Test 56 of 209: Test _PR0 (Power Resources for D0). method SKIPPED: Test 56, Skipping test for non-existent object method _PR0. method -method Test 57 of 208: Test _PR1 (Power Resources for D1). +method Test 57 of 209: Test _PR1 (Power Resources for D1). method SKIPPED: Test 57, Skipping test for non-existent object method _PR1. method -method Test 58 of 208: Test _PR2 (Power Resources for D2). +method Test 58 of 209: Test _PR2 (Power Resources for D2). method SKIPPED: Test 58, Skipping test for non-existent object method _PR2. method -method Test 59 of 208: Test _PR3 (Power Resources for D3). +method Test 59 of 209: Test _PR3 (Power Resources for D3). method SKIPPED: Test 59, Skipping test for non-existent object method _PR3. method -method Test 60 of 208: Test _PRW (Power Resources for Wake). +method Test 60 of 209: Test _PRW (Power Resources for Wake). method PASSED: Test 60, \_SB_.PCI0.HDEF._PRW correctly returned a method sane looking package. method PASSED: Test 60, \_SB_.PCI0.RP03.PXSX._PRW correctly @@ -438,34 +438,34 @@ method sane looking package. method PASSED: Test 60, \_SB_.PCI0.EHC2._PRW correctly returned a method sane looking package. method -method Test 61 of 208: Test _PS0 (Power State 0). +method Test 61 of 209: Test _PS0 (Power State 0). method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS0 returned no method values as expected. method PASSED: Test 61, \_PS0 returned no values as expected. method -method Test 62 of 208: Test _PS1 (Power State 1). +method Test 62 of 209: Test _PS1 (Power State 1). method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PS1 returned no method values as expected. method -method Test 63 of 208: Test _PS2 (Power State 2). +method Test 63 of 209: Test _PS2 (Power State 2). method SKIPPED: Test 63, Skipping test for non-existent object method _PS2. method -method Test 64 of 208: Test _PS3 (Power State 3). +method Test 64 of 209: Test _PS3 (Power State 3). method PASSED: Test 64, \_SB_.PCI0.PEGP.VGA_._PS3 returned no method values as expected. method PASSED: Test 64, \_PS3 returned no values as expected. method -method Test 65 of 208: Test _PSC (Power State Current). +method Test 65 of 209: Test _PSC (Power State Current). method PASSED: Test 65, \_SB_.PCI0.PEGP.VGA_._PSC correctly method returned an integer. method PASSED: Test 65, \_PSC correctly returned an integer. method -method Test 66 of 208: Test _PSE (Power State for Enumeration). +method Test 66 of 209: Test _PSE (Power State for Enumeration). method SKIPPED: Test 66, Skipping test for non-existent object method _PSE. method -method Test 67 of 208: Test _PSW (Power State Wake). +method Test 67 of 209: Test _PSW (Power State Wake). method PASSED: Test 67, \_SB_.PCI0.USB1._PSW returned no values method as expected. method PASSED: Test 67, \_SB_.PCI0.USB2._PSW returned no values @@ -477,15 +477,15 @@ method as expected. method PASSED: Test 67, \_SB_.PCI0.USB5._PSW returned no values method as expected. method -method Test 68 of 208: Test _S1D (S1 Device State). +method Test 68 of 209: Test _S1D (S1 Device State). method SKIPPED: Test 68, Skipping test for non-existent object method _S1D. method -method Test 69 of 208: Test _S2D (S2 Device State). +method Test 69 of 209: Test _S2D (S2 Device State). method SKIPPED: Test 69, Skipping test for non-existent object method _S2D. method -method Test 70 of 208: Test _S3D (S3 Device State). +method Test 70 of 209: Test _S3D (S3 Device State). method PASSED: Test 70, \_SB_.PCI0._S3D correctly returned an method integer. method PASSED: Test 70, \_SB_.PCI0.USB1._S3D correctly returned @@ -503,7 +503,7 @@ method an integer. method PASSED: Test 70, \_SB_.PCI0.EHC2._S3D correctly returned method an integer. method -method Test 71 of 208: Test _S4D (S4 Device State). +method Test 71 of 209: Test _S4D (S4 Device State). method PASSED: Test 71, \_SB_.PCI0._S4D correctly returned an method integer. method PASSED: Test 71, \_SB_.PCI0.USB1._S4D correctly returned @@ -521,137 +521,137 @@ method an integer. method PASSED: Test 71, \_SB_.PCI0.EHC2._S4D correctly returned method an integer. method -method Test 72 of 208: Test _S0W (S0 Device Wake State). +method Test 72 of 209: Test _S0W (S0 Device Wake State). method SKIPPED: Test 72, Skipping test for non-existent object method _S0W. method -method Test 73 of 208: Test _S1W (S1 Device Wake State). +method Test 73 of 209: Test _S1W (S1 Device Wake State). method SKIPPED: Test 73, Skipping test for non-existent object method _S1W. method -method Test 74 of 208: Test _S2W (S2 Device Wake State). +method Test 74 of 209: Test _S2W (S2 Device Wake State). method SKIPPED: Test 74, Skipping test for non-existent object method _S2W. method -method Test 75 of 208: Test _S3W (S3 Device Wake State). +method Test 75 of 209: Test _S3W (S3 Device Wake State). method SKIPPED: Test 75, Skipping test for non-existent object method _S3W. method -method Test 76 of 208: Test _S4W (S4 Device Wake State). +method Test 76 of 209: Test _S4W (S4 Device Wake State). method SKIPPED: Test 76, Skipping test for non-existent object method _S4W. method -method Test 77 of 208: Test _RST (Device Reset). +method Test 77 of 209: Test _RST (Device Reset). method SKIPPED: Test 77, Skipping test for non-existent object method _RST. method -method Test 78 of 208: Test _PRR (Power Resource for Reset). +method Test 78 of 209: Test _PRR (Power Resource for Reset). method SKIPPED: Test 78, Skipping test for non-existent object method _PRR. method -method Test 79 of 208: Test _DSC (Deepest State for +method Test 79 of 209: Test _DSC (Deepest State for method Configuration). method SKIPPED: Test 79, Skipping test for non-existent object method _DSC. method -method Test 80 of 208: Test _S0_ (S0 System State). +method Test 80 of 209: Test _S0_ (S0 System State). method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 method PASSED: Test 80, \_S0_ correctly returned a sane looking method package. method -method Test 81 of 208: Test _S1_ (S1 System State). +method Test 81 of 209: Test _S1_ (S1 System State). method SKIPPED: Test 81, Skipping test for non-existent object method _S1_. method -method Test 82 of 208: Test _S2_ (S2 System State). +method Test 82 of 209: Test _S2_ (S2 System State). method SKIPPED: Test 82, Skipping test for non-existent object method _S2_. method -method Test 83 of 208: Test _S3_ (S3 System State). +method Test 83 of 209: Test _S3_ (S3 System State). method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 method PASSED: Test 83, \_S3_ correctly returned a sane looking method package. method -method Test 84 of 208: Test _S4_ (S4 System State). +method Test 84 of 209: Test _S4_ (S4 System State). method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 method PASSED: Test 84, \_S4_ correctly returned a sane looking method package. method -method Test 85 of 208: Test _S5_ (S5 System State). +method Test 85 of 209: Test _S5_ (S5 System State). method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 method PASSED: Test 85, \_S5_ correctly returned a sane looking method package. method -method Test 86 of 208: Test _SWS (System Wake Source). +method Test 86 of 209: Test _SWS (System Wake Source). method SKIPPED: Test 86, Skipping test for non-existent object method _SWS. method -method Test 87 of 208: Test _PSS (Performance Supported States). +method Test 87 of 209: Test _PSS (Performance Supported States). method SKIPPED: Test 87, Skipping test for non-existent object method _PSS. method -method Test 88 of 208: Test _CPC (Continuous Performance +method Test 88 of 209: Test _CPC (Continuous Performance method Control). method SKIPPED: Test 88, Skipping test for non-existent object method _CPC. method -method Test 89 of 208: Test _CSD (C State Dependencies). +method Test 89 of 209: Test _CSD (C State Dependencies). method SKIPPED: Test 89, Skipping test for non-existent object method _CSD. method -method Test 90 of 208: Test _CST (C States). +method Test 90 of 209: Test _CST (C States). method SKIPPED: Test 90, Skipping test for non-existent object method _CST. method -method Test 91 of 208: Test _PCT (Performance Control). +method Test 91 of 209: Test _PCT (Performance Control). method SKIPPED: Test 91, Skipping test for non-existent object method _PCT. method -method Test 92 of 208: Test _PDL (P-State Depth Limit). +method Test 92 of 209: Test _PDL (P-State Depth Limit). method SKIPPED: Test 92, Skipping test for non-existent object method _PDL. method -method Test 93 of 208: Test _PPC (Performance Present +method Test 93 of 209: Test _PPC (Performance Present method Capabilities). method SKIPPED: Test 93, Skipping test for non-existent object method _PPC. method -method Test 94 of 208: Test _PPE (Polling for Platform Error). +method Test 94 of 209: Test _PPE (Polling for Platform Error). method SKIPPED: Test 94, Skipping test for non-existent object method _PPE. method -method Test 95 of 208: Test _PSD (Power State Dependencies). +method Test 95 of 209: Test _PSD (Power State Dependencies). method SKIPPED: Test 95, Skipping test for non-existent object method _PSD. method -method Test 96 of 208: Test _PTC (Processor Throttling Control). +method Test 96 of 209: Test _PTC (Processor Throttling Control). method PASSED: Test 96, \_PR_.CPU0._PTC correctly returned a sane method looking package. method PASSED: Test 96, \_PR_.CPU1._PTC correctly returned a sane method looking package. method -method Test 97 of 208: Test _TDL (T-State Depth Limit). +method Test 97 of 209: Test _TDL (T-State Depth Limit). method SKIPPED: Test 97, Skipping test for non-existent object method _TDL. method -method Test 98 of 208: Test _TPC (Throttling Present +method Test 98 of 209: Test _TPC (Throttling Present method Capabilities). method PASSED: Test 98, \_PR_.CPU0._TPC correctly returned an method integer. method PASSED: Test 98, \_PR_.CPU1._TPC correctly returned an method integer. method -method Test 99 of 208: Test _TSD (Throttling State Dependencies). +method Test 99 of 209: Test _TSD (Throttling State Dependencies). method PASSED: Test 99, \_PR_.CPU0._TSD correctly returned a sane method looking package. method PASSED: Test 99, \_PR_.CPU1._TSD correctly returned a sane method looking package. method -method Test 100 of 208: Test _TSS (Throttling Supported States). +method Test 100 of 209: Test _TSS (Throttling Supported States). method \_PR_.CPU0._TSS values: method T-State CPU Power Latency Control Status method Freq (mW) (usecs) @@ -679,54 +679,54 @@ method 7 13% 125 0 09 00 method PASSED: Test 100, \_PR_.CPU1._TSS correctly returned a method sane looking package. method -method Test 101 of 208: Test _LPI (Low Power Idle States). +method Test 101 of 209: Test _LPI (Low Power Idle States). method SKIPPED: Test 101, Skipping test for non-existent object method _LPI. method -method Test 102 of 208: Test _RDI (Resource Dependencies for +method Test 102 of 209: Test _RDI (Resource Dependencies for method Idle). method SKIPPED: Test 102, Skipping test for non-existent object method _RDI. method -method Test 103 of 208: Test _PUR (Processor Utilization +method Test 103 of 209: Test _PUR (Processor Utilization method Request). method SKIPPED: Test 103, Skipping test for non-existent object method _PUR. method -method Test 104 of 208: Test _MSG (Message). +method Test 104 of 209: Test _MSG (Message). method SKIPPED: Test 104, Skipping test for non-existent object method _MSG. method -method Test 105 of 208: Test _SST (System Status). +method Test 105 of 209: Test _SST (System Status). method SKIPPED: Test 105, Skipping test for non-existent object method _SST. method -method Test 106 of 208: Test _ALC (Ambient Light Colour +method Test 106 of 209: Test _ALC (Ambient Light Colour method Chromaticity). method SKIPPED: Test 106, Skipping test for non-existent object method _ALC. method -method Test 107 of 208: Test _ALI (Ambient Light Illuminance). +method Test 107 of 209: Test _ALI (Ambient Light Illuminance). method SKIPPED: Test 107, Skipping test for non-existent object method _ALI. method -method Test 108 of 208: Test _ALT (Ambient Light Temperature). +method Test 108 of 209: Test _ALT (Ambient Light Temperature). method SKIPPED: Test 108, Skipping test for non-existent object method _ALT. method -method Test 109 of 208: Test _ALP (Ambient Light Polling). +method Test 109 of 209: Test _ALP (Ambient Light Polling). method SKIPPED: Test 109, Skipping test for non-existent object method _ALP. method -method Test 110 of 208: Test _ALR (Ambient Light Response). +method Test 110 of 209: Test _ALR (Ambient Light Response). method SKIPPED: Test 110, Skipping test for non-existent object method _ALR. method -method Test 111 of 208: Test _LID (Lid Status). +method Test 111 of 209: Test _LID (Lid Status). method PASSED: Test 111, \_SB_.LID0._LID correctly returned an method integer. method -method Test 112 of 208: Test _GTF (Get Task File). +method Test 112 of 209: Test _GTF (Get Task File). method PASSED: Test 112, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly method returned a sane looking buffer. method PASSED: Test 112, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly @@ -738,609 +738,613 @@ method returned a sane looking buffer. method PASSED: Test 112, \_SB_.PCI0.SATA.PRT2._GTF correctly method returned a sane looking buffer. method -method Test 113 of 208: Test _GTM (Get Timing Mode). +method Test 113 of 209: Test _GTM (Get Timing Mode). method PASSED: Test 113, \_SB_.PCI0.PATA.PRID._GTM correctly method returned a sane looking buffer. method -method Test 114 of 208: Test _MBM (Memory Bandwidth Monitoring +method Test 114 of 209: Test _MBM (Memory Bandwidth Monitoring method Data). method SKIPPED: Test 114, Skipping test for non-existent object method _MBM. method -method Test 115 of 208: Test _UPC (USB Port Capabilities). +method Test 115 of 209: Test _UPC (USB Port Capabilities). method SKIPPED: Test 115, Skipping test for non-existent object method _UPC. method -method Test 116 of 208: Test _UPD (User Presence Detect). +method Test 116 of 209: Test _PDO (USB Power Data Object). method SKIPPED: Test 116, Skipping test for non-existent object -method _UPD. +method _PDO. method -method Test 117 of 208: Test _UPP (User Presence Polling). +method Test 117 of 209: Test _UPD (User Presence Detect). method SKIPPED: Test 117, Skipping test for non-existent object -method _UPP. +method _UPD. method -method Test 118 of 208: Test _GCP (Get Capabilities). +method Test 118 of 209: Test _UPP (User Presence Polling). method SKIPPED: Test 118, Skipping test for non-existent object -method _GCP. +method _UPP. method -method Test 119 of 208: Test _GRT (Get Real Time). +method Test 119 of 209: Test _GCP (Get Capabilities). method SKIPPED: Test 119, Skipping test for non-existent object -method _GRT. +method _GCP. method -method Test 120 of 208: Test _GWS (Get Wake Status). +method Test 120 of 209: Test _GRT (Get Real Time). method SKIPPED: Test 120, Skipping test for non-existent object -method _GWS. +method _GRT. method -method Test 121 of 208: Test _CWS (Clear Wake Status). +method Test 121 of 209: Test _GWS (Get Wake Status). method SKIPPED: Test 121, Skipping test for non-existent object -method _CWS. +method _GWS. method -method Test 122 of 208: Test _SRT (Set Real Time). +method Test 122 of 209: Test _CWS (Clear Wake Status). method SKIPPED: Test 122, Skipping test for non-existent object +method _CWS. +method +method Test 123 of 209: Test _SRT (Set Real Time). +method SKIPPED: Test 123, Skipping test for non-existent object method _SRT. method -method Test 123 of 208: Test _STP (Set Expired Timer Wake +method Test 124 of 209: Test _STP (Set Expired Timer Wake method Policy). -method SKIPPED: Test 123, Skipping test for non-existent object +method SKIPPED: Test 124, Skipping test for non-existent object method _STP. method -method Test 124 of 208: Test _STV (Set Timer Value). -method SKIPPED: Test 124, Skipping test for non-existent object +method Test 125 of 209: Test _STV (Set Timer Value). +method SKIPPED: Test 125, Skipping test for non-existent object method _STV. method -method Test 125 of 208: Test _TIP (Expired Timer Wake Policy). -method SKIPPED: Test 125, Skipping test for non-existent object +method Test 126 of 209: Test _TIP (Expired Timer Wake Policy). +method SKIPPED: Test 126, Skipping test for non-existent object method _TIP. method -method Test 126 of 208: Test _TIV (Timer Values). -method SKIPPED: Test 126, Skipping test for non-existent object +method Test 127 of 209: Test _TIV (Timer Values). +method SKIPPED: Test 127, Skipping test for non-existent object method _TIV. method -method Test 127 of 208: Test _NBS (NVDIMM Boot Status). -method SKIPPED: Test 127, Skipping test for non-existent object +method Test 128 of 209: Test _NBS (NVDIMM Boot Status). +method SKIPPED: Test 128, Skipping test for non-existent object method _NBS. method -method Test 128 of 208: Test _NCH (NVDIMM Current Health +method Test 129 of 209: Test _NCH (NVDIMM Current Health method Information). -method SKIPPED: Test 128, Skipping test for non-existent object +method SKIPPED: Test 129, Skipping test for non-existent object method _NCH. method -method Test 129 of 208: Test _NIC (NVDIMM Health Error Injection +method Test 130 of 209: Test _NIC (NVDIMM Health Error Injection method Capabilities). -method SKIPPED: Test 129, Skipping test for non-existent object +method SKIPPED: Test 130, Skipping test for non-existent object method _NIC. method -method Test 130 of 208: Test _NIH (NVDIMM Inject/Clear Health +method Test 131 of 209: Test _NIH (NVDIMM Inject/Clear Health method Errors). -method SKIPPED: Test 130, Skipping test for non-existent object +method SKIPPED: Test 131, Skipping test for non-existent object method _NIH. method -method Test 131 of 208: Test _NIG (NVDIMM Inject Health Error +method Test 132 of 209: Test _NIG (NVDIMM Inject Health Error method Status). -method SKIPPED: Test 131, Skipping test for non-existent object +method SKIPPED: Test 132, Skipping test for non-existent object method _NIG. method -method Test 132 of 208: Test _SBS (Smart Battery Subsystem). -method SKIPPED: Test 132, Skipping test for non-existent object +method Test 133 of 209: Test _SBS (Smart Battery Subsystem). +method SKIPPED: Test 133, Skipping test for non-existent object method _SBS. method -method Test 133 of 208: Test _BCT (Battery Charge Time). -method SKIPPED: Test 133, Skipping test for non-existent object +method Test 134 of 209: Test _BCT (Battery Charge Time). +method SKIPPED: Test 134, Skipping test for non-existent object method _BCT. method -method Test 134 of 208: Test _BIF (Battery Information). -method PASSED: Test 134, \_SB_.PCI0.LPCB.BAT1._BIF correctly +method Test 135 of 209: Test _BIF (Battery Information). +method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._BIF correctly method returned a sane looking package. method -method Test 135 of 208: Test _BIX (Battery Information Extended). -method SKIPPED: Test 135, Skipping test for non-existent object +method Test 136 of 209: Test _BIX (Battery Information Extended). +method SKIPPED: Test 136, Skipping test for non-existent object method _BIX. method -method Test 136 of 208: Test _BMA (Battery Measurement +method Test 137 of 209: Test _BMA (Battery Measurement method Averaging). -method SKIPPED: Test 136, Skipping test for non-existent object +method SKIPPED: Test 137, Skipping test for non-existent object method _BMA. method -method Test 137 of 208: Test _BMC (Battery Maintenance Control). -method SKIPPED: Test 137, Skipping test for non-existent object +method Test 138 of 209: Test _BMC (Battery Maintenance Control). +method SKIPPED: Test 138, Skipping test for non-existent object method _BMC. method -method Test 138 of 208: Test _BMD (Battery Maintenance Data). -method SKIPPED: Test 138, Skipping test for non-existent object +method Test 139 of 209: Test _BMD (Battery Maintenance Data). +method SKIPPED: Test 139, Skipping test for non-existent object method _BMD. method -method Test 139 of 208: Test _BMS (Battery Measurement Sampling +method Test 140 of 209: Test _BMS (Battery Measurement Sampling method Time). -method SKIPPED: Test 139, Skipping test for non-existent object +method SKIPPED: Test 140, Skipping test for non-existent object method _BMS. method -method Test 140 of 208: Test _BPC (Battery Power +method Test 141 of 209: Test _BPC (Battery Power method Characteristics). -method SKIPPED: Test 140, Skipping test for non-existent object +method SKIPPED: Test 141, Skipping test for non-existent object method _BPC. method -method Test 141 of 208: Test _BPS (Battery Power State). -method SKIPPED: Test 141, Skipping test for non-existent object +method Test 142 of 209: Test _BPS (Battery Power State). +method SKIPPED: Test 142, Skipping test for non-existent object method _BPS. method -method Test 142 of 208: Test _BPT (Battery Power Threshold). -method SKIPPED: Test 142, Skipping test for non-existent object +method Test 143 of 209: Test _BPT (Battery Power Threshold). +method SKIPPED: Test 143, Skipping test for non-existent object method _BPT. method -method Test 143 of 208: Test _BST (Battery Status). -method PASSED: Test 143, \_SB_.PCI0.LPCB.BAT1._BST correctly +method Test 144 of 209: Test _BST (Battery Status). +method PASSED: Test 144, \_SB_.PCI0.LPCB.BAT1._BST correctly method returned a sane looking package. method -method Test 144 of 208: Test _BTP (Battery Trip Point). -method SKIPPED: Test 144, Skipping test for non-existent object +method Test 145 of 209: Test _BTP (Battery Trip Point). +method SKIPPED: Test 145, Skipping test for non-existent object method _BTP. method -method Test 145 of 208: Test _BTH (Battery Throttle Limit). -method SKIPPED: Test 145, Skipping test for non-existent object +method Test 146 of 209: Test _BTH (Battery Throttle Limit). +method SKIPPED: Test 146, Skipping test for non-existent object method _BTH. method -method Test 146 of 208: Test _BTM (Battery Time). -method SKIPPED: Test 146, Skipping test for non-existent object +method Test 147 of 209: Test _BTM (Battery Time). +method SKIPPED: Test 147, Skipping test for non-existent object method _BTM. method -method Test 147 of 208: Test _PCL (Power Consumer List). -method PASSED: Test 147, \_SB_.PCI0.LPCB.ACAD._PCL returned a +method Test 148 of 209: Test _PCL (Power Consumer List). +method PASSED: Test 148, \_SB_.PCI0.LPCB.ACAD._PCL returned a method sane package of 1 references. -method PASSED: Test 147, \_SB_.PCI0.LPCB.BAT1._PCL returned a +method PASSED: Test 148, \_SB_.PCI0.LPCB.BAT1._PCL returned a method sane package of 1 references. method -method Test 148 of 208: Test _PIF (Power Source Information). -method SKIPPED: Test 148, Skipping test for non-existent object +method Test 149 of 209: Test _PIF (Power Source Information). +method SKIPPED: Test 149, Skipping test for non-existent object method _PIF. method -method Test 149 of 208: Test _PRL (Power Source Redundancy List). -method SKIPPED: Test 149, Skipping test for non-existent object +method Test 150 of 209: Test _PRL (Power Source Redundancy List). +method SKIPPED: Test 150, Skipping test for non-existent object method _PRL. method -method Test 150 of 208: Test _PSR (Power Source). -method PASSED: Test 150, \_SB_.PCI0.LPCB.ACAD._PSR correctly +method Test 151 of 209: Test _PSR (Power Source). +method PASSED: Test 151, \_SB_.PCI0.LPCB.ACAD._PSR correctly method returned sane looking value 0x00000000. method -method Test 151 of 208: Test _GAI (Get Averaging Level). -method SKIPPED: Test 151, Skipping test for non-existent object +method Test 152 of 209: Test _GAI (Get Averaging Level). +method SKIPPED: Test 152, Skipping test for non-existent object method _GAI. method -method Test 152 of 208: Test _GHL (Get Hardware Limit). -method SKIPPED: Test 152, Skipping test for non-existent object +method Test 153 of 209: Test _GHL (Get Hardware Limit). +method SKIPPED: Test 153, Skipping test for non-existent object method _GHL. method -method Test 153 of 208: Test _PMC (Power Meter Capabilities). -method SKIPPED: Test 153, Skipping test for non-existent object +method Test 154 of 209: Test _PMC (Power Meter Capabilities). +method SKIPPED: Test 154, Skipping test for non-existent object method _PMC. method -method Test 154 of 208: Test _PMD (Power Meter Devices). -method SKIPPED: Test 154, Skipping test for non-existent object +method Test 155 of 209: Test _PMD (Power Meter Devices). +method SKIPPED: Test 155, Skipping test for non-existent object method _PMD. method -method Test 155 of 208: Test _PMM (Power Meter Measurement). -method SKIPPED: Test 155, Skipping test for non-existent object +method Test 156 of 209: Test _PMM (Power Meter Measurement). +method SKIPPED: Test 156, Skipping test for non-existent object method _PMM. method -method Test 156 of 208: Test _WPC (Wireless Power Calibration). -method SKIPPED: Test 156, Skipping test for non-existent object +method Test 157 of 209: Test _WPC (Wireless Power Calibration). +method SKIPPED: Test 157, Skipping test for non-existent object method _WPC. method -method Test 157 of 208: Test _WPP (Wireless Power Polling). -method SKIPPED: Test 157, Skipping test for non-existent object +method Test 158 of 209: Test _WPP (Wireless Power Polling). +method SKIPPED: Test 158, Skipping test for non-existent object method _WPP. method -method Test 158 of 208: Test _FIF (Fan Information). -method SKIPPED: Test 158, Skipping test for non-existent object +method Test 159 of 209: Test _FIF (Fan Information). +method SKIPPED: Test 159, Skipping test for non-existent object method _FIF. method -method Test 159 of 208: Test _FPS (Fan Performance States). -method SKIPPED: Test 159, Skipping test for non-existent object +method Test 160 of 209: Test _FPS (Fan Performance States). +method SKIPPED: Test 160, Skipping test for non-existent object method _FPS. method -method Test 160 of 208: Test _FSL (Fan Set Level). -method SKIPPED: Test 160, Skipping test for non-existent object +method Test 161 of 209: Test _FSL (Fan Set Level). +method SKIPPED: Test 161, Skipping test for non-existent object method _FSL. method -method Test 161 of 208: Test _FST (Fan Status). -method SKIPPED: Test 161, Skipping test for non-existent object +method Test 162 of 209: Test _FST (Fan Status). +method SKIPPED: Test 162, Skipping test for non-existent object method _FST. method -method Test 162 of 208: Test _ACx (Active Cooling). -method SKIPPED: Test 162, Skipping test for non-existent object +method Test 163 of 209: Test _ACx (Active Cooling). +method SKIPPED: Test 163, Skipping test for non-existent object method _AC0. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC1. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC2. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC3. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC4. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC5. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC6. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC7. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC8. method -method SKIPPED: Test 162, Skipping test for non-existent object +method SKIPPED: Test 163, Skipping test for non-existent object method _AC9. method method -method Test 163 of 208: Test _ART (Active Cooling Relationship +method Test 164 of 209: Test _ART (Active Cooling Relationship method Table). -method SKIPPED: Test 163, Skipping test for non-existent object +method SKIPPED: Test 164, Skipping test for non-existent object method _ART. method -method Test 164 of 208: Test _ALx (Active List). -method SKIPPED: Test 164, Skipping test for non-existent object +method Test 165 of 209: Test _ALx (Active List). +method SKIPPED: Test 165, Skipping test for non-existent object method _AL0. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL1. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL2. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL3. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL4. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL5. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL6. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL7. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL8. method -method SKIPPED: Test 164, Skipping test for non-existent object +method SKIPPED: Test 165, Skipping test for non-existent object method _AL9. method method -method Test 165 of 208: Test _CRT (Critical Trip Point). -method SKIPPED: Test 165, Skipping test for non-existent object +method Test 166 of 209: Test _CRT (Critical Trip Point). +method SKIPPED: Test 166, Skipping test for non-existent object method _CRT. method -method Test 166 of 208: Test _CR3 (Warm/Standby Temperature). -method SKIPPED: Test 166, Skipping test for non-existent object +method Test 167 of 209: Test _CR3 (Warm/Standby Temperature). +method SKIPPED: Test 167, Skipping test for non-existent object method _CR3. method -method Test 167 of 208: Test _DTI (Device Temperature +method Test 168 of 209: Test _DTI (Device Temperature method Indication). -method SKIPPED: Test 167, Skipping test for non-existent object +method SKIPPED: Test 168, Skipping test for non-existent object method _DTI. method -method Test 168 of 208: Test _HOT (Hot Temperature). -method SKIPPED: Test 168, Skipping test for non-existent object +method Test 169 of 209: Test _HOT (Hot Temperature). +method SKIPPED: Test 169, Skipping test for non-existent object method _HOT. method -method Test 169 of 208: Test _MTL (Minimum Throttle Limit). -method SKIPPED: Test 169, Skipping test for non-existent object +method Test 170 of 209: Test _MTL (Minimum Throttle Limit). +method SKIPPED: Test 170, Skipping test for non-existent object method _MTL. method -method Test 170 of 208: Test _NTT (Notification Temp Threshold). -method SKIPPED: Test 170, Skipping test for non-existent object +method Test 171 of 209: Test _NTT (Notification Temp Threshold). +method SKIPPED: Test 171, Skipping test for non-existent object method _NTT. method -method Test 171 of 208: Test _PSL (Passive List). -method SKIPPED: Test 171, Skipping test for non-existent object +method Test 172 of 209: Test _PSL (Passive List). +method SKIPPED: Test 172, Skipping test for non-existent object method _PSL. method -method Test 172 of 208: Test _PSV (Passive Temp). -method SKIPPED: Test 172, Skipping test for non-existent object +method Test 173 of 209: Test _PSV (Passive Temp). +method SKIPPED: Test 173, Skipping test for non-existent object method _PSV. method -method Test 173 of 208: Test _RTV (Relative Temp Values). -method SKIPPED: Test 173, Skipping test for non-existent object +method Test 174 of 209: Test _RTV (Relative Temp Values). +method SKIPPED: Test 174, Skipping test for non-existent object method _RTV. method -method Test 174 of 208: Test _SCP (Set Cooling Policy). -method SKIPPED: Test 174, Skipping test for non-existent object +method Test 175 of 209: Test _SCP (Set Cooling Policy). +method SKIPPED: Test 175, Skipping test for non-existent object method _DTI. method -method Test 175 of 208: Test _TC1 (Thermal Constant 1). -method SKIPPED: Test 175, Skipping test for non-existent object +method Test 176 of 209: Test _TC1 (Thermal Constant 1). +method SKIPPED: Test 176, Skipping test for non-existent object method _TC1. method -method Test 176 of 208: Test _TC2 (Thermal Constant 2). -method SKIPPED: Test 176, Skipping test for non-existent object +method Test 177 of 209: Test _TC2 (Thermal Constant 2). +method SKIPPED: Test 177, Skipping test for non-existent object method _TC2. method -method Test 177 of 208: Test _TFP (Thermal fast Sampling Period). -method SKIPPED: Test 177, Skipping test for non-existent object +method Test 178 of 209: Test _TFP (Thermal fast Sampling Period). +method SKIPPED: Test 178, Skipping test for non-existent object method _TFP. method -method Test 178 of 208: Test _TMP (Thermal Zone Current Temp). -method SKIPPED: Test 178, Skipping test for non-existent object +method Test 179 of 209: Test _TMP (Thermal Zone Current Temp). +method SKIPPED: Test 179, Skipping test for non-existent object method _TMP. method -method Test 179 of 208: Test _TPT (Trip Point Temperature). -method SKIPPED: Test 179, Skipping test for non-existent object +method Test 180 of 209: Test _TPT (Trip Point Temperature). +method SKIPPED: Test 180, Skipping test for non-existent object method _TPT. method -method Test 180 of 208: Test _TRT (Thermal Relationship Table). -method SKIPPED: Test 180, Skipping test for non-existent object +method Test 181 of 209: Test _TRT (Thermal Relationship Table). +method SKIPPED: Test 181, Skipping test for non-existent object method _TRT. method -method Test 181 of 208: Test _TSN (Thermal Sensor Device). -method SKIPPED: Test 181, Skipping test for non-existent object +method Test 182 of 209: Test _TSN (Thermal Sensor Device). +method SKIPPED: Test 182, Skipping test for non-existent object method _TSN. method -method Test 182 of 208: Test _TSP (Thermal Sampling Period). -method SKIPPED: Test 182, Skipping test for non-existent object +method Test 183 of 209: Test _TSP (Thermal Sampling Period). +method SKIPPED: Test 183, Skipping test for non-existent object method _TSP. method -method Test 183 of 208: Test _TST (Temperature Sensor Threshold). -method SKIPPED: Test 183, Skipping test for non-existent object +method Test 184 of 209: Test _TST (Temperature Sensor Threshold). +method SKIPPED: Test 184, Skipping test for non-existent object method _TST. method -method Test 184 of 208: Test _TZD (Thermal Zone Devices). -method SKIPPED: Test 184, Skipping test for non-existent object +method Test 185 of 209: Test _TZD (Thermal Zone Devices). +method SKIPPED: Test 185, Skipping test for non-existent object method _TZD. method -method Test 185 of 208: Test _TZM (Thermal Zone member). -method SKIPPED: Test 185, Skipping test for non-existent object +method Test 186 of 209: Test _TZM (Thermal Zone member). +method SKIPPED: Test 186, Skipping test for non-existent object method _TZM. method -method Test 186 of 208: Test _TZP (Thermal Zone Polling). -method SKIPPED: Test 186, Skipping test for non-existent object +method Test 187 of 209: Test _TZP (Thermal Zone Polling). +method SKIPPED: Test 187, Skipping test for non-existent object method _TZP. method -method Test 187 of 208: Test _GPE (General Purpose Events). -method PASSED: Test 187, \_SB_.PCI0.LPCB.EC0_._GPE returned an +method Test 188 of 209: Test _GPE (General Purpose Events). +method PASSED: Test 188, \_SB_.PCI0.LPCB.EC0_._GPE returned an method integer 0x0000001c method -method Test 188 of 208: Test _EC_ (EC Offset Query). -method SKIPPED: Test 188, Skipping test for non-existent object +method Test 189 of 209: Test _EC_ (EC Offset Query). +method SKIPPED: Test 189, Skipping test for non-existent object method _EC_. method -method Test 189 of 208: Test _PTS (Prepare to Sleep). +method Test 190 of 209: Test _PTS (Prepare to Sleep). method Test _PTS(3). -method PASSED: Test 189, \_PTS returned no values as expected. +method PASSED: Test 190, \_PTS returned no values as expected. method method Test _PTS(4). -method PASSED: Test 189, \_PTS returned no values as expected. +method PASSED: Test 190, \_PTS returned no values as expected. method method Test _PTS(5). -method PASSED: Test 189, \_PTS returned no values as expected. +method PASSED: Test 190, \_PTS returned no values as expected. method method -method Test 190 of 208: Test _TTS (Transition to State). -method SKIPPED: Test 190, Optional control method _TTS does not +method Test 191 of 209: Test _TTS (Transition to State). +method SKIPPED: Test 191, Optional control method _TTS does not method exist. method -method Test 191 of 208: Test _WAK (System Wake). +method Test 192 of 209: Test _WAK (System Wake). method Test _WAK(3) System Wake, State S3. -method PASSED: Test 191, \_WAK correctly returned a sane looking +method PASSED: Test 192, \_WAK correctly returned a sane looking method package. method method Test _WAK(4) System Wake, State S4. -method PASSED: Test 191, \_WAK correctly returned a sane looking +method PASSED: Test 192, \_WAK correctly returned a sane looking method package. method method Test _WAK(5) System Wake, State S5. -method PASSED: Test 191, \_WAK correctly returned a sane looking +method PASSED: Test 192, \_WAK correctly returned a sane looking method package. method method -method Test 192 of 208: Test _ADR (Return Unique ID for Device). -method PASSED: Test 192, \_SB_.PCI0.MCHC._ADR correctly returned +method Test 193 of 209: Test _ADR (Return Unique ID for Device). +method PASSED: Test 193, \_SB_.PCI0.MCHC._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.PEGP._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.GFX0._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD01._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD01._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD02._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD02._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD03._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD03._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD04._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD04._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.GFX0.DD05._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.GFX0.DD05._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.HDEF._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.HDEF._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP01._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP01._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP01.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP01.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.RP02._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP02._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP02.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP02.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.RP03._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP03._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP03.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP03.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.RP04._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP04._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP04.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP04.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.RP05._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP05._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP05.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP05.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.RP06._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.RP06._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.RP06.PXSX._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.RP06.PXSX._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.USB1._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.USB1._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.USB2._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.USB2._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.USB3._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.USB3._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.USB4._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.USB4._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.USB5._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.USB5._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.EHC1._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.EHC2._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2.HUB7._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC2.HUB7._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PCIB._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.PCIB._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.LPCB._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.LPCB._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.PATA._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.PATA._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.PATA.PRID._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PATA.PRID._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.SATA._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.SATA._ADR correctly returned method an integer. -method PASSED: Test 192, \_SB_.PCI0.SATA.PRT0._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.SATA.PRT0._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.SATA.PRT1._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.SATA.PRT1._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.SATA.PRT2._ADR correctly +method PASSED: Test 193, \_SB_.PCI0.SATA.PRT2._ADR correctly method returned an integer. -method PASSED: Test 192, \_SB_.PCI0.SBUS._ADR correctly returned +method PASSED: Test 193, \_SB_.PCI0.SBUS._ADR correctly returned method an integer. method -method Test 193 of 208: Test _BCL (Query List of Brightness +method Test 194 of 209: Test _BCL (Query List of Brightness method Control Levels Supported). method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned +method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned method a sane package of 10 integers. method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 193, \_SB_.PCI0.GFX0.DD03._BCL returned a +method PASSED: Test 194, \_SB_.PCI0.GFX0.DD03._BCL returned a method sane package of 10 integers. method -method Test 194 of 208: Test _BCM (Set Brightness Level). -method PASSED: Test 194, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned +method Test 195 of 209: Test _BCM (Set Brightness Level). +method PASSED: Test 195, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned method no values as expected. -method PASSED: Test 194, \_SB_.PCI0.GFX0.DD03._BCM returned no +method PASSED: Test 195, \_SB_.PCI0.GFX0.DD03._BCM returned no method values as expected. method -method Test 195 of 208: Test _BQC (Brightness Query Current +method Test 196 of 209: Test _BQC (Brightness Query Current method Level). -method PASSED: Test 195, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly +method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly method returned an integer. -method PASSED: Test 195, \_SB_.PCI0.GFX0.DD03._BQC correctly +method PASSED: Test 196, \_SB_.PCI0.GFX0.DD03._BQC correctly method returned an integer. method -method Test 196 of 208: Test _DCS (Return the Status of Output +method Test 197 of 209: Test _DCS (Return the Status of Output method Device). -method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.GFX0.DD01._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.GFX0.DD01._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.GFX0.DD02._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.GFX0.DD02._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.GFX0.DD03._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.GFX0.DD03._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.GFX0.DD04._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.GFX0.DD04._DCS correctly method returned an integer. -method PASSED: Test 196, \_SB_.PCI0.GFX0.DD05._DCS correctly +method PASSED: Test 197, \_SB_.PCI0.GFX0.DD05._DCS correctly method returned an integer. method -method Test 197 of 208: Test _DDC (Return the EDID for this +method Test 198 of 209: Test _DDC (Return the EDID for this method Device). -method SKIPPED: Test 197, Skipping test for non-existent object +method SKIPPED: Test 198, Skipping test for non-existent object method _DDC. method -method Test 198 of 208: Test _DSS (Device Set State). -method PASSED: Test 198, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned +method Test 199 of 209: Test _DSS (Device Set State). +method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned method no values as expected. -method PASSED: Test 198, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned +method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned method no values as expected. -method PASSED: Test 198, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned +method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned method no values as expected. -method PASSED: Test 198, \_SB_.PCI0.GFX0.DD01._DSS returned no +method PASSED: Test 199, \_SB_.PCI0.GFX0.DD01._DSS returned no method values as expected. -method PASSED: Test 198, \_SB_.PCI0.GFX0.DD02._DSS returned no +method PASSED: Test 199, \_SB_.PCI0.GFX0.DD02._DSS returned no method values as expected. -method PASSED: Test 198, \_SB_.PCI0.GFX0.DD03._DSS returned no +method PASSED: Test 199, \_SB_.PCI0.GFX0.DD03._DSS returned no method values as expected. -method PASSED: Test 198, \_SB_.PCI0.GFX0.DD04._DSS returned no +method PASSED: Test 199, \_SB_.PCI0.GFX0.DD04._DSS returned no method values as expected. -method PASSED: Test 198, \_SB_.PCI0.GFX0.DD05._DSS returned no +method PASSED: Test 199, \_SB_.PCI0.GFX0.DD05._DSS returned no method values as expected. method -method Test 199 of 208: Test _DGS (Query Graphics State). -method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly +method Test 200 of 209: Test _DGS (Query Graphics State). +method PASSED: Test 200, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.GFX0.DD01._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.GFX0.DD01._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.GFX0.DD02._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.GFX0.DD02._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.GFX0.DD03._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.GFX0.DD03._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.GFX0.DD04._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.GFX0.DD04._DGS correctly method returned an integer. -method PASSED: Test 199, \_SB_.PCI0.GFX0.DD05._DGS correctly +method PASSED: Test 200, \_SB_.PCI0.GFX0.DD05._DGS correctly method returned an integer. method -method Test 200 of 208: Test _DOD (Enumerate All Devices Attached +method Test 201 of 209: Test _DOD (Enumerate All Devices Attached method to Display Adapter). method Device 0: method Instance: 0 @@ -1363,7 +1367,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni method BIOS can detect device: 0 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 200, \_SB_.PCI0.PEGP.VGA_._DOD correctly +method PASSED: Test 201, \_SB_.PCI0.PEGP.VGA_._DOD correctly method returned a sane looking package. method Device 0: method Instance: 0 @@ -1400,45 +1404,45 @@ method Type of display: 0 (Other) method BIOS can detect device: 1 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 200, \_SB_.PCI0.GFX0._DOD correctly returned +method PASSED: Test 201, \_SB_.PCI0.GFX0._DOD correctly returned method a sane looking package. method -method Test 201 of 208: Test _DOS (Enable/Disable Output +method Test 202 of 209: Test _DOS (Enable/Disable Output method Switching). -method PASSED: Test 201, \_SB_.PCI0.PEGP.VGA_._DOS returned no +method PASSED: Test 202, \_SB_.PCI0.PEGP.VGA_._DOS returned no method values as expected. -method PASSED: Test 201, \_SB_.PCI0.GFX0._DOS returned no values +method PASSED: Test 202, \_SB_.PCI0.GFX0._DOS returned no values method as expected. method -method Test 202 of 208: Test _GPD (Get POST Device). -method SKIPPED: Test 202, Skipping test for non-existent object +method Test 203 of 209: Test _GPD (Get POST Device). +method SKIPPED: Test 203, Skipping test for non-existent object method _GPD. method -method Test 203 of 208: Test _ROM (Get ROM Data). -method SKIPPED: Test 203, Skipping test for non-existent object +method Test 204 of 209: Test _ROM (Get ROM Data). +method SKIPPED: Test 204, Skipping test for non-existent object method _ROM. method -method Test 204 of 208: Test _SPD (Set POST Device). -method SKIPPED: Test 204, Skipping test for non-existent object +method Test 205 of 209: Test _SPD (Set POST Device). +method SKIPPED: Test 205, Skipping test for non-existent object method _SPD. method -method Test 205 of 208: Test _VPO (Video POST Options). -method SKIPPED: Test 205, Skipping test for non-existent object +method Test 206 of 209: Test _VPO (Video POST Options). +method SKIPPED: Test 206, Skipping test for non-existent object method _VPO. method -method Test 206 of 208: Test _CBA (Configuration Base Address). -method SKIPPED: Test 206, Skipping test for non-existent object +method Test 207 of 209: Test _CBA (Configuration Base Address). +method SKIPPED: Test 207, Skipping test for non-existent object method _CBA. method -method Test 207 of 208: Test _IFT (IPMI Interface Type). -method SKIPPED: Test 207, Skipping test for non-existent object +method Test 208 of 209: Test _IFT (IPMI Interface Type). +method SKIPPED: Test 208, Skipping test for non-existent object method _IFT. method -method Test 208 of 208: Test _SRV (IPMI Interface Revision). -method SKIPPED: Test 208, Skipping test for non-existent object +method Test 209 of 209: Test _SRV (IPMI Interface Revision). +method SKIPPED: Test 209, Skipping test for non-existent object method _SRV. method method ========================================================== -method 260 passed, 0 failed, 0 warning, 0 aborted, 179 skipped, 0 +method 260 passed, 0 failed, 0 warning, 0 aborted, 180 skipped, 0 method info only. method ==========================================================