@@ -107,8 +107,21 @@ sysfs interface (referenced above) before adjusting this value.
<h2><a name="L_mtd_tests">MTD tests</a></h2>
-<p>The MTD subsystem includes a set of tests which you may run to verify your
-flash hardware and drivers. The tests are available in the mainline kernels
+<p>The mtd-utils include a set of test programs which you may run to verify
+your flash hardware and drivers. The programs have only been recently ported
+to user space and are also available as kernel modules.</p>
+
+<p>In contrast to the modules, the user space tests also offer more fine
+grained options for controling their behaviour, such as only using specific
+erase blocks or pages.</p>
+
+<p>The user space tests are compiled automatically when
+<a href="../faq/general.html#L_compile_mtd">compiling mtd-utils</a>, but are
+not installed by default. To install the tests through
+<code>make install</code>, the configure option
+<code>--enable-install-tests</code> has to be set.</p>
+
+<p>The kernel module tests are available in the mainline kernels
starting from kernel version <code>2.6.29</code> and they live in the
<code>drivers/mtd/tests</code> directory of the linux kernel source codes. You
may compile the tests as kernel modules by enabling them in the kernel
@@ -124,47 +137,53 @@ git://git.infradead.org/users/ahunter/nand-tests.git
<p>The MTD test-suite contains the following tests:</p>
<ul>
- <li><b>mtd_nandbiterrs</b>: relevant only for NAND flashes, introduces
+ <li><b>nandbiterrs</b>: relevant only for NAND flashes, introduces
bit errors and tests for multi-bit error recovery on a NAND page. This
- mostly tests the ECC controller / driver.</li>
+ mostly tests the ECC controller / driver. The kernel module version is
+ called <b>mtd_nandbiterrs</b>.</li>
- <li><b>mtd_speedtest</b>: measures and reports read/write/erase speed
- of the MTD device.</li>
+ <li><b>flash_speed</b>: measures and reports read/write/erase speed
+ of the MTD device. The kernel module version is called
+ <b>mtd_speedtest</b>.</li>
- <li><b>mtd_stresstest</b>: performs random read/write/erase operations
- and validates the MTD device I/O capabilities.</li>
+ <li><b>flash_stress</b>: performs random read/write/erase operations
+ and validates the MTD device I/O capabilities. The kernel module
+ version is called <b>mtd_stresstest</b>.</li>
- <li><b>mtd_readtest</b>: this tests reads whole MTD device, one NAND
+ <li><b>flash_readtest</b>: this tests reads from an MTD device, one NAND
page at a time including OOB (or 512 bytes at a time in case of flashes
- like NOR) and checks that reading works properly.</li>
+ like NOR) and checks that reading works properly. The kernel module
+ version is called <b>mtd_readtest</b>.</li>
- <li><b>mtd_pagetest</b>: relevant only for NAND flashes, tests NAND page
+ <li><b>nandpagetest</b>: relevant only for NAND flashes, tests NAND page
writing and reading in different sizes and order; this test was
originally developed for testing the OneNAND driver, so it might be a
- little OneNAND-oriented, but must work on any NAND flash.</li>
+ little OneNAND-oriented, but must work on any NAND flash. The kernel
+ module version is called <b>mtd_pagetest</b>.</li>
- <li><b>mtd_oobtest</b>: relevant only for NAND flashes, tests that the
- OOB area I/O works properly by writing data to different offsets and
- verifying it.</li>
+ <li><b>mtd_oobtest</b>: currently only exists as a kernel module.
+ Relevant only for NAND flashes, tests that the OOB area I/O works
+ properly by writing data to different offsets and verifying it.</li>
- <li><b>mtd_subpagetest</b>: relevant only for NAND flashes, tests
- <a href="ubi.html#L_subpage">sub-page</a> I/O.</li>
+ <li><b>nandsubpagetest</b>: relevant only for NAND flashes, tests
+ <a href="ubi.html#L_subpage">sub-page</a> I/O. The kernel module
+ version is called <b>mtd_subpagetest</b>.</li>
- <li><b>mtd_torturetest</b>: this test is designed to wear out flash
+ <li><b>flash_torture</b>: this test is designed to wear out flash
eraseblocks. It repeatedly writes and erases the same group of
- eraseblocks until an I/O error happens, so be careful! The test
- supports a number of options (see <code>modinfo mtd_torturetest</code>)
- which allow you to set the amount of eraseblocks to torture and how the
- torturing is done. You may limit the amount of torturing cycles using
- the <code>cycles_count</code> module parameter. It may be very god idea
- to run this test for some time and validate your flash driver and HW,
- providing you have a spare device. For example, we caught rather rare
- and nasty DMA issues on an OMAP2 board with OneNAND flash, just by
- running this tests for few hours.</li>
+ eraseblocks until an I/O error happens, so be careful! It may be very
+ god idea to run this test for some time and validate your flash driver
+ and HW, providing you have a spare device. For example, we caught
+ rather rare and nasty DMA issues on an OMAP2 board with OneNAND flash,
+ just by running this tests for few hours. The kernel module version
+ is called <b>mtd_torturetest</b> and also supports a number of options
+ (see <code>modinfo mtd_torturetest</code>).</li>
<li><b>mtd_nandecctest</b>: a simple test that checks correctness of the
built-in software ECC for 256 and 512-byte buffers; this test is not
- driver-specific but tests general NAND support code.</li>
+ driver-specific but tests general NAND support code. This tests only
+ exists as a kernel module, as it tests the internal software ECC
+ implementation.</li>
</ul>
Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at> --- doc/general.xml | 75 ++++++++++++++++++++++++++++++++++++--------------------- 1 file changed, 47 insertions(+), 28 deletions(-)