| Message ID | 20170213213118.7857-4-david.oberhollenzer@sigma-star.at |
|---|---|
| State | Accepted |
| Delegated to: | David Oberhollenzer |
| Headers | show |
diff --git a/doc/general.xml b/doc/general.xml index 10ea02b..35763e0 100644 --- a/doc/general.xml +++ b/doc/general.xml @@ -124,6 +124,10 @@ git://git.infradead.org/users/ahunter/nand-tests.git <p>The MTD test-suite contains the following tests:</p> <ul> + <li><b>mtd_nandbiterrs</b>: relevant only for NAND flashes, introduces + bit errors and tests for multi-bit error recovery on a NAND page. This + mostly tests the ECC controller / driver.</li> + <li><b>mtd_speedtest</b>: measures and reports read/write/erase speed of the MTD device.</li>
Signed-off-by: David Oberhollenzer <david.oberhollenzer@sigma-star.at> --- doc/general.xml | 4 ++++ 1 file changed, 4 insertions(+)