fwts-test: remove arg-show-tests and arg-show-tests-full

From: Colin Ian King <colin.king@canonical.com>

These tests don't really add much test coverage, plus they are a pain to
maintain because of the various different build configurations have different
fwts tests enabled/disabled, so the output is different per configuration.

I'm going to take the pragmatic easy path and remove these tests, especially
since these tests have never found a regressions and are a maintenance
overhead.

Signed-off-by: Colin Ian King <colin.king@canonical.com>
---
 Makefile.am                                        |   3 -
 .../arg-show-tests-0001/arg-show-tests-0001.log    | 187 -----
 fwts-test/arg-show-tests-0001/test-0001.sh         |  39 -
 fwts-test/arg-show-tests-0001/test-0002.sh         |  39 -
 .../arg-show-tests-full-0001.log                   | 930 ---------------------
 fwts-test/arg-show-tests-full-0001/test-0001.sh    |  27 -
 6 files changed, 1225 deletions(-)
 delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
 delete mode 100755 fwts-test/arg-show-tests-0001/test-0001.sh
 delete mode 100755 fwts-test/arg-show-tests-0001/test-0002.sh
 delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
 delete mode 100755 fwts-test/arg-show-tests-full-0001/test-0001.sh

On 2016-07-06 03:51 PM, Colin King wrote:
> From: Colin Ian King <colin.king@canonical.com>
>
> These tests don't really add much test coverage, plus they are a pain to
> maintain because of the various different build configurations have different
> fwts tests enabled/disabled, so the output is different per configuration.
>
> I'm going to take the pragmatic easy path and remove these tests, especially
> since these tests have never found a regressions and are a maintenance
> overhead.
>
> Signed-off-by: Colin Ian King <colin.king@canonical.com>
> ---
>   Makefile.am                                        |   3 -
>   .../arg-show-tests-0001/arg-show-tests-0001.log    | 187 -----
>   fwts-test/arg-show-tests-0001/test-0001.sh         |  39 -
>   fwts-test/arg-show-tests-0001/test-0002.sh         |  39 -
>   .../arg-show-tests-full-0001.log                   | 930 ---------------------
>   fwts-test/arg-show-tests-full-0001/test-0001.sh    |  27 -
>   6 files changed, 1225 deletions(-)
>   delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
>   delete mode 100755 fwts-test/arg-show-tests-0001/test-0001.sh
>   delete mode 100755 fwts-test/arg-show-tests-0001/test-0002.sh
>   delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
>   delete mode 100755 fwts-test/arg-show-tests-full-0001/test-0001.sh
>
> diff --git a/Makefile.am b/Makefile.am
> index 86146da..bda44d7 100644
> --- a/Makefile.am
> +++ b/Makefile.am
> @@ -36,9 +36,6 @@ TESTS = fwts-test/acpidump-0001/test-0001.sh \
>   	fwts-test/arg-results-no-separators-0001/test-0001.sh \
>   	fwts-test/arg-show-progress-dialog-0001/test-0001.sh \
>   	fwts-test/arg-show-progress-dialog-0001/test-0002.sh \
> -	fwts-test/arg-show-tests-0001/test-0001.sh \
> -	fwts-test/arg-show-tests-0001/test-0002.sh \
> -	fwts-test/arg-show-tests-full-0001/test-0001.sh \
>   	fwts-test/arg-table-path-0001/test-0001.sh \
>   	fwts-test/arg-table-path-0001/test-0002.sh \
>   	fwts-test/arg-width-0001/test-0001.sh \
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> deleted file mode 100644
> index 1a76b9d..0000000
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ /dev/null
> @@ -1,187 +0,0 @@
> -ACPI tests:
> - acpiinfo        General ACPI information test.
> - acpitables      ACPI table headers sanity tests.
> - apicinstance    Test for single instance of APIC/MADT table.
> - asf             ASF! Alert Standard Format Table test.
> - aspt            ASPT Table test.
> - bert            BERT Boot Error Record Table test.
> - bgrt            BGRT Boot Graphics Resource Table test.
> - boot            BOOT Table test.
> - checksum        ACPI table checksum test.
> - cpep            CPEP Corrected Platform Error Polling Table test.
> - csrt            CSRT Core System Resource Table test.
> - cstates         Processor C state support test.
> - dbg2            DBG2 (Debug Port Table 2) test.
> - dbgp            DBGP (Debug Port) Table test.
> - dmar            DMA Remapping (VT-d) test.
> - ecdt            ECDT Embedded Controller Boot Resources Table test.
> - einj            EINJ Error Injection Table test.
> - erst            ERST Error Record Serialization Table test.
> - facs            FACS Firmware ACPI Control Structure test.
> - fadt            FADT Fixed ACPI Description Table tests.
> - fpdt            FPDT Firmware Performance Data Table test.
> - gtdt            GTDT Generic Timer Description Table test.
> - hest            HEST Hardware Error Source Table test.
> - hpet            HPET IA-PC High Precision Event Timer Table tests.
> - iort            IORT IO Remapping Table test.
> - lpit            LPIT Low Power Idle Table test.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - mcfg            MCFG PCI Express* memory mapped config space test.
> - mchi            MCHI Management Controller Host Interface Table test.
> - method          ACPI DSDT Method Semantic tests.
> - msct            MSCT Maximum System Characteristics Table test.
> - msdm            MSDM Microsoft Data Management Table test.
> - pcc             Processor Clocking Control (PCC) test.
> - rsdp            RSDP Root System Description Pointer test.
> - rsdt            RSDT Root System Description Table test.
> - sbst            SBST Smart Battery Specification Table test.
> - slic            SLIC Software Licensing Description Table test.
> - slit            SLIT System Locality Distance Information test.
> - spcr            SPCR Serial Port Console Redirection Table test.
> - spmi            SPMI Service Processor Management Interface Description Table test.
> - srat            SRAT System Resource Affinity Table test.
> - stao            STAO Status Override Table test.
> - tcpa            TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2            TPM2 Trusted Platform Module 2 test.
> - uefi            UEFI Data Table test.
> - waet            WAET Windows ACPI Emulated Devices Table test.
> - wdat            WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             Extract and analyse Windows Management Instrumentation (WMI).
> - xenv            XENV Xen Environment Table tests.
> - xsdt            XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo        General ACPI information test.
> - acpitables      ACPI table headers sanity tests.
> - apicedge        APIC edge/level test.
> - apicinstance    Test for single instance of APIC/MADT table.
> - asf             ASF! Alert Standard Format Table test.
> - aspm            PCIe ASPM test.
> - aspt            ASPT Table test.
> - autobrightness  Automated LCD brightness test.
> - bert            BERT Boot Error Record Table test.
> - bgrt            BGRT Boot Graphics Resource Table test.
> - bios32          BIOS32 Service Directory test.
> - bios_info       Gather BIOS DMI information.
> - bmc_info        BMC Info
> - boot            BOOT Table test.
> - checksum        ACPI table checksum test.
> - cpep            CPEP Corrected Platform Error Polling Table test.
> - cpufreq         CPU frequency scaling tests.
> - crs             Test PCI host bridge configuration using _CRS.
> - csm             UEFI Compatibility Support Module test.
> - csrt            CSRT Core System Resource Table test.
> - cstates         Processor C state support test.
> - dbg2            DBG2 (Debug Port Table 2) test.
> - dbgp            DBGP (Debug Port) Table test.
> - dmar            DMA Remapping (VT-d) test.
> - dmicheck        DMI/SMBIOS table tests.
> - dt_base         Base device tree validity check
> - dt_sysinfo      Device tree system information test
> - ebda            Test EBDA region is mapped and reserved in memory map table.
> - ecdt            ECDT Embedded Controller Boot Resources Table test.
> - einj            EINJ Error Injection Table test.
> - erst            ERST Error Record Serialization Table test.
> - facs            FACS Firmware ACPI Control Structure test.
> - fadt            FADT Fixed ACPI Description Table tests.
> - fan             Simple fan tests.
> - fpdt            FPDT Firmware Performance Data Table test.
> - gtdt            GTDT Generic Timer Description Table test.
> - hda_audio       HDA Audio Pin Configuration test.
> - hest            HEST Hardware Error Source Table test.
> - hpet            HPET IA-PC High Precision Event Timer Table tests.
> - iort            IORT IO Remapping Table test.
> - klog            Scan kernel log for errors and warnings.
> - lpit            LPIT Low Power Idle Table test.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - maxfreq         Test max CPU frequencies against max scaling frequency.
> - maxreadreq      Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg            MCFG PCI Express* memory mapped config space test.
> - mchi            MCHI Management Controller Host Interface Table test.
> - method          ACPI DSDT Method Semantic tests.
> - microcode       Test if system is using latest microcode.
> - mpcheck         MultiProcessor Tables tests.
> - msct            MSCT Maximum System Characteristics Table test.
> - msdm            MSDM Microsoft Data Management Table test.
> - msr             MSR register tests.
> - mtrr            MTRR tests.
> - nx              Test if CPU NX is disabled by the BIOS.
> - olog            Run OLOG scan and analysis checks.
> - oops            Scan kernel log for Oopses.
> - osilinux        Disassemble DSDT to check for _OSI("Linux").
> - pcc             Processor Clocking Control (PCC) test.
> - pciirq          PCI IRQ Routing Table test.
> - pnp             BIOS Support Installation structure test.
> - prd_info        OPAL Processor Recovery Diagnostics Info
> - rsdp            RSDP Root System Description Pointer test.
> - rsdt            RSDT Root System Description Table test.
> - sbst            SBST Smart Battery Specification Table test.
> - securebootcert  UEFI secure boot test.
> - slic            SLIC Software Licensing Description Table test.
> - slit            SLIT System Locality Distance Information test.
> - spcr            SPCR Serial Port Console Redirection Table test.
> - spmi            SPMI Service Processor Management Interface Description Table test.
> - srat            SRAT System Resource Affinity Table test.
> - stao            STAO Status Override Table test.
> - syntaxcheck     Re-assemble DSDT and SSDTs to find syntax errors and warnings.
> - tcpa            TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2            TPM2 Trusted Platform Module 2 test.
> - uefi            UEFI Data Table test.
> - uefibootpath    Sanity check for UEFI Boot Path Boot####.
> - version         Gather kernel system information.
> - virt            CPU Virtualisation Configuration test.
> - waet            WAET Windows ACPI Emulated Devices Table test.
> - wakealarm       ACPI Wakealarm tests.
> - wdat            WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             Extract and analyse Windows Management Instrumentation (WMI).
> - xenv            XENV Xen Environment Table tests.
> - xsdt            XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter      Interactive ac_adapter power test.
> - battery         Battery tests.
> - brightness      Interactive LCD brightness test.
> - hotkey          Hotkey scan code tests.
> - lid             Interactive lid button test.
> - power_button    Interactive power_button button test.
> -
> -Power States tests:
> - s3              S3 suspend/resume test.
> - s3power         S3 power loss during suspend test (takes minimum of 10 minutes to run).
> - s4              S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump        Dump ACPI tables.
> - cmosdump        Dump CMOS Memory.
> - crsdump         Dump ACPI _CRS resources.
> - ebdadump        Dump EBDA region.
> - esrtdump        Dump ESRT table.
> - gpedump         Dump GPEs.
> - memmapdump      Dump system memory map.
> - mpdump          Dump MultiProcessor Data.
> - plddump         Dump ACPI _PLD (Physical Device Location).
> - prsdump         Dump ACPI _PRS resources.
> - romdump         Dump ROM data.
> - uefidump        Dump UEFI variables.
> - uefivarinfo     UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar   Authenticated variable tests.
> - uefirtmisc      UEFI miscellaneous runtime service interface tests.
> - uefirttime      UEFI Runtime service time interface tests.
> - uefirtvariable  UEFI Runtime service variable interface tests.
> -
> -UEFI tests:
> - csm             UEFI Compatibility Support Module test.
> - esrt            Sanity check UEFI ESRT Table.
> - securebootcert  UEFI secure boot test.
> - uefibootpath    Sanity check for UEFI Boot Path Boot####.
> - uefirtauthvar   Authenticated variable tests.
> - uefirtmisc      UEFI miscellaneous runtime service interface tests.
> - uefirttime      UEFI Runtime service time interface tests.
> - uefirtvariable  UEFI Runtime service variable interface tests.
> -
> -ACPI Spec Compliance tests:
> - fadt            FADT Fixed ACPI Description Table tests.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - rsdp            RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh b/fwts-test/arg-show-tests-0001/test-0001.sh
> deleted file mode 100755
> index a62071c..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0001.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test -s option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -#  If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> -        tset 2> /dev/null
> -        echo SKIP: $TEST, $NAME
> -        exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh b/fwts-test/arg-show-tests-0001/test-0002.sh
> deleted file mode 100755
> index f92fd8f..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0002.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests option"
> -NAME=test-0002.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -#  If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> -        tset 2> /dev/null
> -        echo SKIP: $TEST, $NAME
> -        exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> deleted file mode 100644
> index 3eb5e3e..0000000
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ /dev/null
> @@ -1,930 +0,0 @@
> -ACPI tests:
> - acpiinfo        (3 tests):
> -  Determine Kernel ACPI version.
> -  Determine machine's ACPI version.
> -  Determine AML compiler.
> - acpitables      (1 test):
> -  Test ACPI headers.
> - apicinstance    (1 test):
> -  Test for single instance of APIC/MADT table.
> - asf             (1 test):
> -  ASF! Alert Standard Format Table test.
> - aspt            (1 test):
> -  ASPT Table test.
> - bert            (1 test):
> -  BERT Boot Error Record Table test.
> - bgrt            (1 test):
> -  BGRT Boot Graphics Resource Table test.
> - boot            (1 test):
> -  BOOT Table test.
> - checksum        (1 test):
> -  ACPI table checksum test.
> - cpep            (1 test):
> -  CPEP Corrected Platform Error Polling Table test.
> - csrt            (1 test):
> -  CSRT Core System Resource Table test.
> - cstates         (1 test):
> -  Test all CPUs C-states.
> - dbg2            (1 test):
> -  DBG2 (Debug Port Table 2) test.
> - dbgp            (1 test):
> -  DBGP (Debug Port) Table test.
> - dmar            (1 test):
> -  DMA Remapping test.
> - ecdt            (1 test):
> -  ECDT Embedded Controller Boot Resources Table test.
> - einj            (1 test):
> -  EINJ Error Injection Table test.
> - erst            (1 test):
> -  ERST Error Record Serialization Table test.
> - facs            (1 test):
> -  FACS Firmware ACPI Control Structure test.
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - fpdt            (1 test):
> -  FPDT Firmware Performance Data Table test.
> - gtdt            (1 test):
> -  GTDT Generic Timer Description Table test.
> - hest            (1 test):
> -  HEST Hardware Error Source Table test.
> - hpet            (4 tests):
> -  Test HPET base in kernel log.
> -  Test HPET base in HPET table.
> -  Test HPET base in DSDT and/or SSDT.
> -  Test HPET configuration.
> - iort            (1 test):
> -  IORT IO Remapping Table test.
> - lpit            (1 test):
> -  LPIT Low Power Idle Table test.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - mcfg            (2 tests):
> -  Validate MCFG table.
> -  Validate MCFG PCI config space.
> - mchi            (1 test):
> -  MCHI Management Controller Host Interface Table test.
> - method          (191 tests):
> -  Test Method Names.
> -  Test _AEI.
> -  Test _EVT (Event Method).
> -  Test _DLM (Device Lock Mutex).
> -  Test _PIC (Inform AML of Interrupt Model).
> -  Test _CID (Compatible ID).
> -  Test _DDN (DOS Device Name).
> -  Test _HID (Hardware ID).
> -  Test _HRV (Hardware Revision Number).
> -  Test _MLS (Multiple Language String).
> -  Test _PLD (Physical Device Location).
> -  Test _SUB (Subsystem ID).
> -  Test _SUN (Slot User Number).
> -  Test _STR (String).
> -  Test _UID (Unique ID).
> -  Test _CDM (Clock Domain).
> -  Test _CRS (Current Resource Settings).
> -  Test _DSD (Device Specific Data).
> -  Test _DIS (Disable).
> -  Test _DMA (Direct Memory Access).
> -  Test _FIX (Fixed Register Resource Provider).
> -  Test _GSB (Global System Interrupt Base).
> -  Test _HPP (Hot Plug Parameters).
> -  Test _PRS (Possible Resource Settings).
> -  Test _PRT (PCI Routing Table).
> -  Test _PXM (Proximity).
> -  Test _CCA (Cache Coherency Attribute).
> -  Test _EDL (Eject Device List).
> -  Test _EJD (Ejection Dependent Device).
> -  Test _EJ0 (Eject).
> -  Test _EJ1 (Eject).
> -  Test _EJ2 (Eject).
> -  Test _EJ3 (Eject).
> -  Test _EJ4 (Eject).
> -  Test _LCK (Lock).
> -  Test _RMV (Remove).
> -  Test _STA (Status).
> -  Test _DEP (Operational Region Dependencies).
> -  Test _BDN (BIOS Dock Name).
> -  Test _BBN (Base Bus Number).
> -  Test _DCK (Dock).
> -  Test _INI (Initialize).
> -  Test _GLK (Global Lock).
> -  Test _SEG (Segment).
> -  Test _OFF (Set resource off).
> -  Test _ON_ (Set resource on).
> -  Test _DSW (Device Sleep Wake).
> -  Test _IRC (In Rush Current).
> -  Test _PRE (Power Resources for Enumeration).
> -  Test _PR0 (Power Resources for D0).
> -  Test _PR1 (Power Resources for D1).
> -  Test _PR2 (Power Resources for D2).
> -  Test _PR3 (Power Resources for D3).
> -  Test _PRW (Power Resources for Wake).
> -  Test _PS0 (Power State 0).
> -  Test _PS1 (Power State 1).
> -  Test _PS2 (Power State 2).
> -  Test _PS3 (Power State 3).
> -  Test _PSC (Power State Current).
> -  Test _PSE (Power State for Enumeration).
> -  Test _PSW (Power State Wake).
> -  Test _S1D (S1 Device State).
> -  Test _S2D (S2 Device State).
> -  Test _S3D (S3 Device State).
> -  Test _S4D (S4 Device State).
> -  Test _S0W (S0 Device Wake State).
> -  Test _S1W (S1 Device Wake State).
> -  Test _S2W (S2 Device Wake State).
> -  Test _S3W (S3 Device Wake State).
> -  Test _S4W (S4 Device Wake State).
> -  Test _RST (Device Reset).
> -  Test _PRR (Power Resource for Reset).
> -  Test _S0_ (S0 System State).
> -  Test _S1_ (S1 System State).
> -  Test _S2_ (S2 System State).
> -  Test _S3_ (S3 System State).
> -  Test _S4_ (S4 System State).
> -  Test _S5_ (S5 System State).
> -  Test _SWS (System Wake Source).
> -  Test _PSS (Performance Supported States).
> -  Test _CPC (Continuous Performance Control).
> -  Test _CSD (C State Dependencies).
> -  Test _CST (C States).
> -  Test _PCT (Performance Control).
> -  Test _PDL (P-State Depth Limit).
> -  Test _PPC (Performance Present Capabilities).
> -  Test _PPE (Polling for Platform Error).
> -  Test _PSD (Power State Dependencies).
> -  Test _PTC (Processor Throttling Control).
> -  Test _TDL (T-State Depth Limit).
> -  Test _TPC (Throttling Present Capabilities).
> -  Test _TSD (Throttling State Dependencies).
> -  Test _TSS (Throttling Supported States).
> -  Test _LPI (Low Power Idle States).
> -  Test _RDI (Resource Dependencies for Idle).
> -  Test _PUR (Processor Utilization Request).
> -  Test _MSG (Message).
> -  Test _SST (System Status).
> -  Test _ALC (Ambient Light Colour Chromaticity).
> -  Test _ALI (Ambient Light Illuminance).
> -  Test _ALT (Ambient Light Temperature).
> -  Test _ALP (Ambient Light Polling).
> -  Test _ALR (Ambient Light Response).
> -  Test _LID (Lid Status).
> -  Test _GTF (Get Task File).
> -  Test _GTM (Get Timing Mode).
> -  Test _MBM (Memory Bandwidth Monitoring Data).
> -  Test _UPC (USB Port Capabilities).
> -  Test _UPD (User Presence Detect).
> -  Test _UPP (User Presence Polling).
> -  Test _GCP (Get Capabilities).
> -  Test _GRT (Get Real Time).
> -  Test _GWS (Get Wake Status).
> -  Test _CWS (Clear Wake Status).
> -  Test _STP (Set Expired Timer Wake Policy).
> -  Test _STV (Set Timer Value).
> -  Test _TIP (Expired Timer Wake Policy).
> -  Test _TIV (Timer Values).
> -  Test _SBS (Smart Battery Subsystem).
> -  Test _BCT (Battery Charge Time).
> -  Test _BIF (Battery Information).
> -  Test _BIX (Battery Information Extended).
> -  Test _BMA (Battery Measurement Averaging).
> -  Test _BMC (Battery Maintenance Control).
> -  Test _BMD (Battery Maintenance Data).
> -  Test _BMS (Battery Measurement Sampling Time).
> -  Test _BST (Battery Status).
> -  Test _BTP (Battery Trip Point).
> -  Test _BTH (Battery Throttle Limit).
> -  Test _BTM (Battery Time).
> -  Test _PCL (Power Consumer List).
> -  Test _PIF (Power Source Information).
> -  Test _PRL (Power Source Redundancy List).
> -  Test _PSR (Power Source).
> -  Test _GAI (Get Averaging Level).
> -  Test _GHL (Get Harware Limit).
> -  Test _PMC (Power Meter Capabilities).
> -  Test _PMD (Power Meter Devices).
> -  Test _PMM (Power Meter Measurement).
> -  Test _WPC (Wireless Power Calibration).
> -  Test _WPP (Wireless Power Polling).
> -  Test _FIF (Fan Information).
> -  Test _FPS (Fan Performance States).
> -  Test _FSL (Fan Set Level).
> -  Test _FST (Fan Status).
> -  Test _ACx (Active Cooling).
> -  Test _ART (Active Cooling Relationship Table).
> -  Test _CRT (Critical Trip Point).
> -  Test _CR3 (Warm/Standby Temperature).
> -  Test _DTI (Device Temperature Indication).
> -  Test _HOT (Hot Temperature).
> -  Test _MTL (Minimum Throttle Limit).
> -  Test _NTT (Notification Temp Threshold).
> -  Test _PSL (Passive List).
> -  Test _PSV (Passive Temp).
> -  Test _RTV (Relative Temp Values).
> -  Test _SCP (Set Cooling Policy).
> -  Test _TC1 (Thermal Constant 1).
> -  Test _TC2 (Thermal Constant 2).
> -  Test _TFP (Thermal fast Sampling Period).
> -  Test _TMP (Thermal Zone Current Temp).
> -  Test _TPT (Trip Point Temperature).
> -  Test _TRT (Thermal Relationship Table).
> -  Test _TSN (Thermal Sensor Device).
> -  Test _TSP (Thermal Sampling Period).
> -  Test _TST (Temperature Sensor Threshold).
> -  Test _TZD (Thermal Zone Devices).
> -  Test _TZM (Thermal Zone member).
> -  Test _TZP (Thermal Zone Polling).
> -  Test _GPE (General Purpose Events).
> -  Test _EC_ (EC Offset Query).
> -  Test _PTS (Prepare to Sleep).
> -  Test _TTS (Transition to State).
> -  Test _WAK (System Wake).
> -  Test _ADR (Return Unique ID for Device).
> -  Test _BCL (Query List of Brightness Control Levels Supported).
> -  Test _BCM (Set Brightness Level).
> -  Test _BQC (Brightness Query Current Level).
> -  Test _DCS (Return the Status of Output Device).
> -  Test _DDC (Return the EDID for this Device).
> -  Test _DSS (Device Set State).
> -  Test _DGS (Query Graphics State).
> -  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Test _DOS (Enable/Disable Output Switching).
> -  Test _GPD (Get POST Device).
> -  Test _ROM (Get ROM Data).
> -  Test _SPD (Set POST Device).
> -  Test _VPO (Video POST Options).
> -  Test _CBA (Configuration Base Address).
> -  Test _IFT (IPMI Interface Type).
> -  Test _SRV (IPMI Interface Revision).
> - msct            (1 test):
> -  MSCT Maximum System Characteristics Table test.
> - msdm            (1 test):
> -  MSDM Microsoft Data Management Table test.
> - pcc             (1 test):
> -  Processor Clocking Control (PCC) test.
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> - rsdt            (1 test):
> -  RSDT Root System Description Table test.
> - sbst            (1 test):
> -  SBST Smart Battery Specificiation Table test.
> - slic            (1 test):
> -  SLIC Software Licensing Description Table test.
> - slit            (1 test):
> -  SLIT System Locality Distance Information test.
> - spcr            (1 test):
> -  SPCR Serial Port Console Redirection Table test.
> - spmi            (1 test):
> -  SPMI Service Processor Management Interface Description Table test.
> - srat            (1 test):
> -  SRAT System Resource Affinity Table test.
> - stao            (1 test):
> -  STAO Status Override Table test.
> - tcpa            (1 test):
> -  Validate TCPA table.
> - tpm2            (1 test):
> -  Validate TPM2 table.
> - uefi            (1 test):
> -  UEFI Data Table test.
> - waet            (1 test):
> -  Windows ACPI Emulated Devices Table test.
> - wdat            (1 test):
> -  WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             (1 test):
> -  Windows Management Instrumentation test.
> - xenv            (1 test):
> -  Validate XENV table.
> - xsdt            (1 test):
> -  XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo        (3 tests):
> -  Determine Kernel ACPI version.
> -  Determine machine's ACPI version.
> -  Determine AML compiler.
> - acpitables      (1 test):
> -  Test ACPI headers.
> - apicedge        (1 test):
> -  Legacy and PCI Interrupt Edge/Level trigger tests.
> - apicinstance    (1 test):
> -  Test for single instance of APIC/MADT table.
> - asf             (1 test):
> -  ASF! Alert Standard Format Table test.
> - aspm            (2 tests):
> -  PCIe ASPM ACPI test.
> -  PCIe ASPM registers test.
> - aspt            (1 test):
> -  ASPT Table test.
> - autobrightness  (2 tests):
> -  Test for maximum and actual brightness.
> -  Change actual brightness.
> - bert            (1 test):
> -  BERT Boot Error Record Table test.
> - bgrt            (1 test):
> -  BGRT Boot Graphics Resource Table test.
> - bios32          (1 test):
> -  BIOS32 Service Directory test.
> - bios_info       (1 test):
> -  Gather BIOS DMI information
> - bmc_info        (1 test):
> -  BMC Info
> - boot            (1 test):
> -  BOOT Table test.
> - checksum        (1 test):
> -  ACPI table checksum test.
> - cpep            (1 test):
> -  CPEP Corrected Platform Error Polling Table test.
> - cpufreq         (7 tests):
> -  CPU frequency table consistency
> -  CPU frequency table duplicates
> -  CPU frequency firmware limits
> -  CPU frequency claimed maximum
> -  CPU frequency SW_ANY control
> -  CPU frequency SW_ALL control
> -  CPU frequency performance tests.
> - crs             (1 test):
> -  Test PCI host bridge configuration using _CRS.
> - csm             (1 test):
> -  UEFI Compatibility Support Module test.
> - csrt            (1 test):
> -  CSRT Core System Resource Table test.
> - cstates         (1 test):
> -  Test all CPUs C-states.
> - dbg2            (1 test):
> -  DBG2 (Debug Port Table 2) test.
> - dbgp            (1 test):
> -  DBGP (Debug Port) Table test.
> - dmar            (1 test):
> -  DMA Remapping test.
> - dmicheck        (3 tests):
> -  Find and test SMBIOS Table Entry Points.
> -  Test DMI/SMBIOS tables for errors.
> -  Test DMI/SMBIOS3 tables for errors.
> - dt_base         (3 tests):
> -  Check device tree presence
> -  Check device tree baseline validity
> -  Check device tree warnings
> - dt_sysinfo      (3 tests):
> -  Check model property
> -  Check system-id property
> -  Check OpenPOWER Reference compatible
> - ebda            (1 test):
> -  Test EBDA is reserved in E820 table.
> - ecdt            (1 test):
> -  ECDT Embedded Controller Boot Resources Table test.
> - einj            (1 test):
> -  EINJ Error Injection Table test.
> - erst            (1 test):
> -  ERST Error Record Serialization Table test.
> - facs            (1 test):
> -  FACS Firmware ACPI Control Structure test.
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - fan             (2 tests):
> -  Test fan status.
> -  Load system, check CPU fan status.
> - fpdt            (1 test):
> -  FPDT Firmware Performance Data Table test.
> - gtdt            (1 test):
> -  GTDT Generic Timer Description Table test.
> - hda_audio       (1 test):
> -  HDA Audio Pin Configuration test.
> - hest            (1 test):
> -  HEST Hardware Error Source Table test.
> - hpet            (4 tests):
> -  Test HPET base in kernel log.
> -  Test HPET base in HPET table.
> -  Test HPET base in DSDT and/or SSDT.
> -  Test HPET configuration.
> - iort            (1 test):
> -  IORT IO Remapping Table test.
> - klog            (1 test):
> -  Kernel log error check.
> - lpit            (1 test):
> -  LPIT Low Power Idle Table test.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - maxfreq         (1 test):
> -  Maximum CPU frequency test.
> - maxreadreq      (1 test):
> -  Test firmware settings MaxReadReq for PCI Express devices.
> - mcfg            (2 tests):
> -  Validate MCFG table.
> -  Validate MCFG PCI config space.
> - mchi            (1 test):
> -  MCHI Management Controller Host Interface Table test.
> - method          (191 tests):
> -  Test Method Names.
> -  Test _AEI.
> -  Test _EVT (Event Method).
> -  Test _DLM (Device Lock Mutex).
> -  Test _PIC (Inform AML of Interrupt Model).
> -  Test _CID (Compatible ID).
> -  Test _DDN (DOS Device Name).
> -  Test _HID (Hardware ID).
> -  Test _HRV (Hardware Revision Number).
> -  Test _MLS (Multiple Language String).
> -  Test _PLD (Physical Device Location).
> -  Test _SUB (Subsystem ID).
> -  Test _SUN (Slot User Number).
> -  Test _STR (String).
> -  Test _UID (Unique ID).
> -  Test _CDM (Clock Domain).
> -  Test _CRS (Current Resource Settings).
> -  Test _DSD (Device Specific Data).
> -  Test _DIS (Disable).
> -  Test _DMA (Direct Memory Access).
> -  Test _FIX (Fixed Register Resource Provider).
> -  Test _GSB (Global System Interrupt Base).
> -  Test _HPP (Hot Plug Parameters).
> -  Test _PRS (Possible Resource Settings).
> -  Test _PRT (PCI Routing Table).
> -  Test _PXM (Proximity).
> -  Test _CCA (Cache Coherency Attribute).
> -  Test _EDL (Eject Device List).
> -  Test _EJD (Ejection Dependent Device).
> -  Test _EJ0 (Eject).
> -  Test _EJ1 (Eject).
> -  Test _EJ2 (Eject).
> -  Test _EJ3 (Eject).
> -  Test _EJ4 (Eject).
> -  Test _LCK (Lock).
> -  Test _RMV (Remove).
> -  Test _STA (Status).
> -  Test _DEP (Operational Region Dependencies).
> -  Test _BDN (BIOS Dock Name).
> -  Test _BBN (Base Bus Number).
> -  Test _DCK (Dock).
> -  Test _INI (Initialize).
> -  Test _GLK (Global Lock).
> -  Test _SEG (Segment).
> -  Test _OFF (Set resource off).
> -  Test _ON_ (Set resource on).
> -  Test _DSW (Device Sleep Wake).
> -  Test _IRC (In Rush Current).
> -  Test _PRE (Power Resources for Enumeration).
> -  Test _PR0 (Power Resources for D0).
> -  Test _PR1 (Power Resources for D1).
> -  Test _PR2 (Power Resources for D2).
> -  Test _PR3 (Power Resources for D3).
> -  Test _PRW (Power Resources for Wake).
> -  Test _PS0 (Power State 0).
> -  Test _PS1 (Power State 1).
> -  Test _PS2 (Power State 2).
> -  Test _PS3 (Power State 3).
> -  Test _PSC (Power State Current).
> -  Test _PSE (Power State for Enumeration).
> -  Test _PSW (Power State Wake).
> -  Test _S1D (S1 Device State).
> -  Test _S2D (S2 Device State).
> -  Test _S3D (S3 Device State).
> -  Test _S4D (S4 Device State).
> -  Test _S0W (S0 Device Wake State).
> -  Test _S1W (S1 Device Wake State).
> -  Test _S2W (S2 Device Wake State).
> -  Test _S3W (S3 Device Wake State).
> -  Test _S4W (S4 Device Wake State).
> -  Test _RST (Device Reset).
> -  Test _PRR (Power Resource for Reset).
> -  Test _S0_ (S0 System State).
> -  Test _S1_ (S1 System State).
> -  Test _S2_ (S2 System State).
> -  Test _S3_ (S3 System State).
> -  Test _S4_ (S4 System State).
> -  Test _S5_ (S5 System State).
> -  Test _SWS (System Wake Source).
> -  Test _PSS (Performance Supported States).
> -  Test _CPC (Continuous Performance Control).
> -  Test _CSD (C State Dependencies).
> -  Test _CST (C States).
> -  Test _PCT (Performance Control).
> -  Test _PDL (P-State Depth Limit).
> -  Test _PPC (Performance Present Capabilities).
> -  Test _PPE (Polling for Platform Error).
> -  Test _PSD (Power State Dependencies).
> -  Test _PTC (Processor Throttling Control).
> -  Test _TDL (T-State Depth Limit).
> -  Test _TPC (Throttling Present Capabilities).
> -  Test _TSD (Throttling State Dependencies).
> -  Test _TSS (Throttling Supported States).
> -  Test _LPI (Low Power Idle States).
> -  Test _RDI (Resource Dependencies for Idle).
> -  Test _PUR (Processor Utilization Request).
> -  Test _MSG (Message).
> -  Test _SST (System Status).
> -  Test _ALC (Ambient Light Colour Chromaticity).
> -  Test _ALI (Ambient Light Illuminance).
> -  Test _ALT (Ambient Light Temperature).
> -  Test _ALP (Ambient Light Polling).
> -  Test _ALR (Ambient Light Response).
> -  Test _LID (Lid Status).
> -  Test _GTF (Get Task File).
> -  Test _GTM (Get Timing Mode).
> -  Test _MBM (Memory Bandwidth Monitoring Data).
> -  Test _UPC (USB Port Capabilities).
> -  Test _UPD (User Presence Detect).
> -  Test _UPP (User Presence Polling).
> -  Test _GCP (Get Capabilities).
> -  Test _GRT (Get Real Time).
> -  Test _GWS (Get Wake Status).
> -  Test _CWS (Clear Wake Status).
> -  Test _STP (Set Expired Timer Wake Policy).
> -  Test _STV (Set Timer Value).
> -  Test _TIP (Expired Timer Wake Policy).
> -  Test _TIV (Timer Values).
> -  Test _SBS (Smart Battery Subsystem).
> -  Test _BCT (Battery Charge Time).
> -  Test _BIF (Battery Information).
> -  Test _BIX (Battery Information Extended).
> -  Test _BMA (Battery Measurement Averaging).
> -  Test _BMC (Battery Maintenance Control).
> -  Test _BMD (Battery Maintenance Data).
> -  Test _BMS (Battery Measurement Sampling Time).
> -  Test _BST (Battery Status).
> -  Test _BTP (Battery Trip Point).
> -  Test _BTH (Battery Throttle Limit).
> -  Test _BTM (Battery Time).
> -  Test _PCL (Power Consumer List).
> -  Test _PIF (Power Source Information).
> -  Test _PRL (Power Source Redundancy List).
> -  Test _PSR (Power Source).
> -  Test _GAI (Get Averaging Level).
> -  Test _GHL (Get Harware Limit).
> -  Test _PMC (Power Meter Capabilities).
> -  Test _PMD (Power Meter Devices).
> -  Test _PMM (Power Meter Measurement).
> -  Test _WPC (Wireless Power Calibration).
> -  Test _WPP (Wireless Power Polling).
> -  Test _FIF (Fan Information).
> -  Test _FPS (Fan Performance States).
> -  Test _FSL (Fan Set Level).
> -  Test _FST (Fan Status).
> -  Test _ACx (Active Cooling).
> -  Test _ART (Active Cooling Relationship Table).
> -  Test _CRT (Critical Trip Point).
> -  Test _CR3 (Warm/Standby Temperature).
> -  Test _DTI (Device Temperature Indication).
> -  Test _HOT (Hot Temperature).
> -  Test _MTL (Minimum Throttle Limit).
> -  Test _NTT (Notification Temp Threshold).
> -  Test _PSL (Passive List).
> -  Test _PSV (Passive Temp).
> -  Test _RTV (Relative Temp Values).
> -  Test _SCP (Set Cooling Policy).
> -  Test _TC1 (Thermal Constant 1).
> -  Test _TC2 (Thermal Constant 2).
> -  Test _TFP (Thermal fast Sampling Period).
> -  Test _TMP (Thermal Zone Current Temp).
> -  Test _TPT (Trip Point Temperature).
> -  Test _TRT (Thermal Relationship Table).
> -  Test _TSN (Thermal Sensor Device).
> -  Test _TSP (Thermal Sampling Period).
> -  Test _TST (Temperature Sensor Threshold).
> -  Test _TZD (Thermal Zone Devices).
> -  Test _TZM (Thermal Zone member).
> -  Test _TZP (Thermal Zone Polling).
> -  Test _GPE (General Purpose Events).
> -  Test _EC_ (EC Offset Query).
> -  Test _PTS (Prepare to Sleep).
> -  Test _TTS (Transition to State).
> -  Test _WAK (System Wake).
> -  Test _ADR (Return Unique ID for Device).
> -  Test _BCL (Query List of Brightness Control Levels Supported).
> -  Test _BCM (Set Brightness Level).
> -  Test _BQC (Brightness Query Current Level).
> -  Test _DCS (Return the Status of Output Device).
> -  Test _DDC (Return the EDID for this Device).
> -  Test _DSS (Device Set State).
> -  Test _DGS (Query Graphics State).
> -  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Test _DOS (Enable/Disable Output Switching).
> -  Test _GPD (Get POST Device).
> -  Test _ROM (Get ROM Data).
> -  Test _SPD (Set POST Device).
> -  Test _VPO (Video POST Options).
> -  Test _CBA (Configuration Base Address).
> -  Test _IFT (IPMI Interface Type).
> -  Test _SRV (IPMI Interface Revision).
> - microcode       (1 test):
> -  Test for most recent microcode being loaded.
> - mpcheck         (9 tests):
> -  Test MP header.
> -  Test MP CPU entries.
> -  Test MP Bus entries.
> -  Test MP IO APIC entries.
> -  Test MP IO Interrupt entries.
> -  Test MP Local Interrupt entries.
> -  Test MP System Address entries.
> -  Test MP Bus Hierarchy entries.
> -  Test MP Compatible Bus Address Space entries.
> - msct            (1 test):
> -  MSCT Maximum System Characteristics Table test.
> - msdm            (1 test):
> -  MSDM Microsoft Data Management Table test.
> - msr             (5 tests):
> -  Test CPU generic MSRs.
> -  Test CPU specific model MSRs.
> -  Test all P State Ratios.
> -  Test C1 and C3 autodemotion.
> -  Test SMRR MSR registers.
> - mtrr            (3 tests):
> -  Validate the kernel MTRR IOMEM setup.
> -  Validate the MTRR setup across all processors.
> -  Test for AMD MtrrFixDramModEn being cleared by the BIOS.
> - nx              (3 tests):
> -  Test CPU NX capability.
> -  Test all CPUs have same BIOS set NX flag.
> -  Test all CPUs have same msr setting in MSR 0x1a0.
> - olog            (1 test):
> -  OLOG scan and analysis checks results.
> - oops            (1 test):
> -  Kernel log oops check.
> - osilinux        (1 test):
> -  Disassemble DSDT to check for _OSI("Linux").
> - pcc             (1 test):
> -  Processor Clocking Control (PCC) test.
> - pciirq          (1 test):
> -  PCI IRQ Routing Table test.
> - pnp             (1 test):
> -  PnP BIOS Support Installation structure test.
> - prd_info        (1 test):
> -  OPAL Processor Recovery Diagnostics Info
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> - rsdt            (1 test):
> -  RSDT Root System Description Table test.
> - sbst            (1 test):
> -  SBST Smart Battery Specificiation Table test.
> - securebootcert  (1 test):
> -  UEFI secure boot test.
> - slic            (1 test):
> -  SLIC Software Licensing Description Table test.
> - slit            (1 test):
> -  SLIT System Locality Distance Information test.
> - spcr            (1 test):
> -  SPCR Serial Port Console Redirection Table test.
> - spmi            (1 test):
> -  SPMI Service Processor Management Interface Description Table test.
> - srat            (1 test):
> -  SRAT System Resource Affinity Table test.
> - stao            (1 test):
> -  STAO Status Override Table test.
> - syntaxcheck     (1 test):
> -  Disassemble and reassemble DSDT and SSDTs.
> - tcpa            (1 test):
> -  Validate TCPA table.
> - tpm2            (1 test):
> -  Validate TPM2 table.
> - uefi            (1 test):
> -  UEFI Data Table test.
> - uefibootpath    (1 test):
> -  Test UEFI Boot Path Boot####.
> - version         (4 tests):
> -  Gather kernel signature.
> -  Gather kernel system information.
> -  Gather kernel boot command line.
> -  Gather ACPI driver version.
> - virt            (1 test):
> -  CPU Virtualisation Configuration test.
> - waet            (1 test):
> -  Windows ACPI Emulated Devices Table test.
> - wakealarm       (5 tests):
> -  Test existence of RTC with alarm interface.
> -  Trigger wakealarm for 1 seconds in the future.
> -  Test if wakealarm is fired.
> -  Multiple wakealarm firing tests.
> -  Reset wakealarm time.
> - wdat            (1 test):
> -  WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             (1 test):
> -  Windows Management Instrumentation test.
> - xenv            (1 test):
> -  Validate XENV table.
> - xsdt            (1 test):
> -  XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter      (3 tests):
> -  Test ACPI ac_adapter state.
> -  Test ac_adapter initial on-line state.
> -  Test ac_adapter state changes.
> - battery         (1 test):
> -  Battery test.
> - brightness      (3 tests):
> -  Observe all brightness changes.
> -  Observe min, max brightness changes.
> -  Test brightness hotkeys.
> - hotkey          (1 test):
> -  Hotkey keypress checks.
> - lid             (3 tests):
> -  Test LID buttons report open correctly.
> -  Test LID buttons on a single open/close.
> -  Test LID buttons on multiple open/close events.
> - power_button    (1 test):
> -  Test press of power button and ACPI event.
> -
> -Power States tests:
> - s3              (1 test):
> -  S3 suspend/resume test.
> - s3power         (1 test):
> -  S3 power loss during suspend test.
> - s4              (1 test):
> -  S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump        (1 test):
> -  Dump ACPI tables.
> - cmosdump        (1 test):
> -  Dump CMOS Memory.
> - crsdump         (1 test):
> -  Dump ACPI _CRS (Current Resource Settings).
> - ebdadump        (1 test):
> -  Dump EBDA region.
> - esrtdump        (1 test):
> -  Dump ESRT Table.
> - gpedump         (1 test):
> -  Dump GPEs.
> - memmapdump      (1 test):
> -  Dump system memory map.
> - mpdump          (1 test):
> -  Dump Multi Processor Data.
> - plddump         (1 test):
> -  Dump ACPI _PLD (Physical Device Location).
> - prsdump         (1 test):
> -  Dump ACPI _PRS (Possible Resource Settings).
> - romdump         (1 test):
> -  Dump ROM data.
> - uefidump        (1 test):
> -  Dump UEFI Variables.
> - uefivarinfo     (1 test):
> -  UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar   (12 tests):
> -  Create authenticated variable test.
> -  Authenticated variable test with the same authenticated variable.
> -  Authenticated variable test with another valid authenticated variable.
> -  Append authenticated variable test.
> -  Update authenticated variable test.
> -  Authenticated variable test with old authenticated variable.
> -  Delete authenticated variable test.
> -  Authenticated variable test with invalid modified data.
> -  Authenticated variable test with invalid modified timestamp.
> -  Authenticated variable test with different guid.
> -  Authenticated variable test with invalid attributes.
> -  Set and delete authenticated variable created by different key test.
> - uefirtmisc      (3 tests):
> -  Test for UEFI miscellaneous runtime service interfaces.
> -  Stress test for UEFI miscellaneous runtime service interfaces.
> -  Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime      (35 tests):
> -  Test UEFI RT service get time interface.
> -  Test UEFI RT service get time interface, NULL time parameter.
> -  Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> -  Test UEFI RT service set time interface.
> -  Test UEFI RT service set time interface, invalid year 1899.
> -  Test UEFI RT service set time interface, invalid year 10000.
> -  Test UEFI RT service set time interface, invalid month 0.
> -  Test UEFI RT service set time interface, invalid month 13.
> -  Test UEFI RT service set time interface, invalid day 0.
> -  Test UEFI RT service set time interface, invalid day 32.
> -  Test UEFI RT service set time interface, invalid hour 24.
> -  Test UEFI RT service set time interface, invalid minute 60.
> -  Test UEFI RT service set time interface, invalid second 60.
> -  Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set time interface, invalid timezone -1441.
> -  Test UEFI RT service set time interface, invalid timezone 1441.
> -  Test UEFI RT service get wakeup time interface.
> -  Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> -  Test UEFI RT service get wakeup time interface, NULL pending parameter.
> -  Test UEFI RT service get wakeup time interface, NULL time parameter.
> -  Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> -  Test UEFI RT service set wakeup time interface.
> -  Test UEFI RT service set wakeup time interface, NULL time parameter.
> -  Test UEFI RT service set wakeup time interface, invalid year 1899.
> -  Test UEFI RT service set wakeup time interface, invalid year 10000.
> -  Test UEFI RT service set wakeup time interface, invalid month 0.
> -  Test UEFI RT service set wakeup time interface, invalid month 13.
> -  Test UEFI RT service set wakeup time interface, invalid day 0.
> -  Test UEFI RT service set wakeup time interface, invalid day 32.
> -  Test UEFI RT service set wakeup time interface, invalid hour 24.
> -  Test UEFI RT service set wakeup time interface, invalid minute 60.
> -  Test UEFI RT service set wakeup time interface, invalid second 60.
> -  Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> -  Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable  (8 tests):
> -  Test UEFI RT service get variable interface.
> -  Test UEFI RT service get next variable name interface.
> -  Test UEFI RT service set variable interface.
> -  Test UEFI RT service query variable info interface.
> -  Test UEFI RT service variable interface stress test.
> -  Test UEFI RT service set variable interface stress test.
> -  Test UEFI RT service query variable info interface stress test.
> -  Test UEFI RT service get variable interface, invalid parameters.
> -
> -UEFI tests:
> - csm             (1 test):
> -  UEFI Compatibility Support Module test.
> - esrt            (1 test):
> -  Sanity check UEFI ESRT Table.
> - securebootcert  (1 test):
> -  UEFI secure boot test.
> - uefibootpath    (1 test):
> -  Test UEFI Boot Path Boot####.
> - uefirtauthvar   (12 tests):
> -  Create authenticated variable test.
> -  Authenticated variable test with the same authenticated variable.
> -  Authenticated variable test with another valid authenticated variable.
> -  Append authenticated variable test.
> -  Update authenticated variable test.
> -  Authenticated variable test with old authenticated variable.
> -  Delete authenticated variable test.
> -  Authenticated variable test with invalid modified data.
> -  Authenticated variable test with invalid modified timestamp.
> -  Authenticated variable test with different guid.
> -  Authenticated variable test with invalid attributes.
> -  Set and delete authenticated variable created by different key test.
> - uefirtmisc      (3 tests):
> -  Test for UEFI miscellaneous runtime service interfaces.
> -  Stress test for UEFI miscellaneous runtime service interfaces.
> -  Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime      (35 tests):
> -  Test UEFI RT service get time interface.
> -  Test UEFI RT service get time interface, NULL time parameter.
> -  Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> -  Test UEFI RT service set time interface.
> -  Test UEFI RT service set time interface, invalid year 1899.
> -  Test UEFI RT service set time interface, invalid year 10000.
> -  Test UEFI RT service set time interface, invalid month 0.
> -  Test UEFI RT service set time interface, invalid month 13.
> -  Test UEFI RT service set time interface, invalid day 0.
> -  Test UEFI RT service set time interface, invalid day 32.
> -  Test UEFI RT service set time interface, invalid hour 24.
> -  Test UEFI RT service set time interface, invalid minute 60.
> -  Test UEFI RT service set time interface, invalid second 60.
> -  Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set time interface, invalid timezone -1441.
> -  Test UEFI RT service set time interface, invalid timezone 1441.
> -  Test UEFI RT service get wakeup time interface.
> -  Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> -  Test UEFI RT service get wakeup time interface, NULL pending parameter.
> -  Test UEFI RT service get wakeup time interface, NULL time parameter.
> -  Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> -  Test UEFI RT service set wakeup time interface.
> -  Test UEFI RT service set wakeup time interface, NULL time parameter.
> -  Test UEFI RT service set wakeup time interface, invalid year 1899.
> -  Test UEFI RT service set wakeup time interface, invalid year 10000.
> -  Test UEFI RT service set wakeup time interface, invalid month 0.
> -  Test UEFI RT service set wakeup time interface, invalid month 13.
> -  Test UEFI RT service set wakeup time interface, invalid day 0.
> -  Test UEFI RT service set wakeup time interface, invalid day 32.
> -  Test UEFI RT service set wakeup time interface, invalid hour 24.
> -  Test UEFI RT service set wakeup time interface, invalid minute 60.
> -  Test UEFI RT service set wakeup time interface, invalid second 60.
> -  Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> -  Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable  (8 tests):
> -  Test UEFI RT service get variable interface.
> -  Test UEFI RT service get next variable name interface.
> -  Test UEFI RT service set variable interface.
> -  Test UEFI RT service query variable info interface.
> -  Test UEFI RT service variable interface stress test.
> -  Test UEFI RT service set variable interface stress test.
> -  Test UEFI RT service query variable info interface stress test.
> -  Test UEFI RT service get variable interface, invalid parameters.
> -
> -ACPI Spec Compliance tests:
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh b/fwts-test/arg-show-tests-full-0001/test-0001.sh
> deleted file mode 100755
> index b4e74f7..0000000
> --- a/fwts-test/arg-show-tests-full-0001/test-0001.sh
> +++ /dev/null
> @@ -1,27 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests-full option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests-full.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -stty cols 80
> -$FWTS --show-tests-full > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -rm $TMPLOG
> -exit $ret
>

Acked-by: Alex Hung <alex.hung@canonical.com>

On 2016年07月06日 15:51, Colin King wrote:
> From: Colin Ian King <colin.king@canonical.com>
>
> These tests don't really add much test coverage, plus they are a pain to
> maintain because of the various different build configurations have different
> fwts tests enabled/disabled, so the output is different per configuration.
>
> I'm going to take the pragmatic easy path and remove these tests, especially
> since these tests have never found a regressions and are a maintenance
> overhead.
>
> Signed-off-by: Colin Ian King <colin.king@canonical.com>
> ---
>   Makefile.am                                        |   3 -
>   .../arg-show-tests-0001/arg-show-tests-0001.log    | 187 -----
>   fwts-test/arg-show-tests-0001/test-0001.sh         |  39 -
>   fwts-test/arg-show-tests-0001/test-0002.sh         |  39 -
>   .../arg-show-tests-full-0001.log                   | 930 ---------------------
>   fwts-test/arg-show-tests-full-0001/test-0001.sh    |  27 -
>   6 files changed, 1225 deletions(-)
>   delete mode 100644 fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
>   delete mode 100755 fwts-test/arg-show-tests-0001/test-0001.sh
>   delete mode 100755 fwts-test/arg-show-tests-0001/test-0002.sh
>   delete mode 100644 fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
>   delete mode 100755 fwts-test/arg-show-tests-full-0001/test-0001.sh
>
> diff --git a/Makefile.am b/Makefile.am
> index 86146da..bda44d7 100644
> --- a/Makefile.am
> +++ b/Makefile.am
> @@ -36,9 +36,6 @@ TESTS = fwts-test/acpidump-0001/test-0001.sh \
>   	fwts-test/arg-results-no-separators-0001/test-0001.sh \
>   	fwts-test/arg-show-progress-dialog-0001/test-0001.sh \
>   	fwts-test/arg-show-progress-dialog-0001/test-0002.sh \
> -	fwts-test/arg-show-tests-0001/test-0001.sh \
> -	fwts-test/arg-show-tests-0001/test-0002.sh \
> -	fwts-test/arg-show-tests-full-0001/test-0001.sh \
>   	fwts-test/arg-table-path-0001/test-0001.sh \
>   	fwts-test/arg-table-path-0001/test-0002.sh \
>   	fwts-test/arg-width-0001/test-0001.sh \
> diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> deleted file mode 100644
> index 1a76b9d..0000000
> --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log
> +++ /dev/null
> @@ -1,187 +0,0 @@
> -ACPI tests:
> - acpiinfo        General ACPI information test.
> - acpitables      ACPI table headers sanity tests.
> - apicinstance    Test for single instance of APIC/MADT table.
> - asf             ASF! Alert Standard Format Table test.
> - aspt            ASPT Table test.
> - bert            BERT Boot Error Record Table test.
> - bgrt            BGRT Boot Graphics Resource Table test.
> - boot            BOOT Table test.
> - checksum        ACPI table checksum test.
> - cpep            CPEP Corrected Platform Error Polling Table test.
> - csrt            CSRT Core System Resource Table test.
> - cstates         Processor C state support test.
> - dbg2            DBG2 (Debug Port Table 2) test.
> - dbgp            DBGP (Debug Port) Table test.
> - dmar            DMA Remapping (VT-d) test.
> - ecdt            ECDT Embedded Controller Boot Resources Table test.
> - einj            EINJ Error Injection Table test.
> - erst            ERST Error Record Serialization Table test.
> - facs            FACS Firmware ACPI Control Structure test.
> - fadt            FADT Fixed ACPI Description Table tests.
> - fpdt            FPDT Firmware Performance Data Table test.
> - gtdt            GTDT Generic Timer Description Table test.
> - hest            HEST Hardware Error Source Table test.
> - hpet            HPET IA-PC High Precision Event Timer Table tests.
> - iort            IORT IO Remapping Table test.
> - lpit            LPIT Low Power Idle Table test.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - mcfg            MCFG PCI Express* memory mapped config space test.
> - mchi            MCHI Management Controller Host Interface Table test.
> - method          ACPI DSDT Method Semantic tests.
> - msct            MSCT Maximum System Characteristics Table test.
> - msdm            MSDM Microsoft Data Management Table test.
> - pcc             Processor Clocking Control (PCC) test.
> - rsdp            RSDP Root System Description Pointer test.
> - rsdt            RSDT Root System Description Table test.
> - sbst            SBST Smart Battery Specification Table test.
> - slic            SLIC Software Licensing Description Table test.
> - slit            SLIT System Locality Distance Information test.
> - spcr            SPCR Serial Port Console Redirection Table test.
> - spmi            SPMI Service Processor Management Interface Description Table test.
> - srat            SRAT System Resource Affinity Table test.
> - stao            STAO Status Override Table test.
> - tcpa            TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2            TPM2 Trusted Platform Module 2 test.
> - uefi            UEFI Data Table test.
> - waet            WAET Windows ACPI Emulated Devices Table test.
> - wdat            WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             Extract and analyse Windows Management Instrumentation (WMI).
> - xenv            XENV Xen Environment Table tests.
> - xsdt            XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo        General ACPI information test.
> - acpitables      ACPI table headers sanity tests.
> - apicedge        APIC edge/level test.
> - apicinstance    Test for single instance of APIC/MADT table.
> - asf             ASF! Alert Standard Format Table test.
> - aspm            PCIe ASPM test.
> - aspt            ASPT Table test.
> - autobrightness  Automated LCD brightness test.
> - bert            BERT Boot Error Record Table test.
> - bgrt            BGRT Boot Graphics Resource Table test.
> - bios32          BIOS32 Service Directory test.
> - bios_info       Gather BIOS DMI information.
> - bmc_info        BMC Info
> - boot            BOOT Table test.
> - checksum        ACPI table checksum test.
> - cpep            CPEP Corrected Platform Error Polling Table test.
> - cpufreq         CPU frequency scaling tests.
> - crs             Test PCI host bridge configuration using _CRS.
> - csm             UEFI Compatibility Support Module test.
> - csrt            CSRT Core System Resource Table test.
> - cstates         Processor C state support test.
> - dbg2            DBG2 (Debug Port Table 2) test.
> - dbgp            DBGP (Debug Port) Table test.
> - dmar            DMA Remapping (VT-d) test.
> - dmicheck        DMI/SMBIOS table tests.
> - dt_base         Base device tree validity check
> - dt_sysinfo      Device tree system information test
> - ebda            Test EBDA region is mapped and reserved in memory map table.
> - ecdt            ECDT Embedded Controller Boot Resources Table test.
> - einj            EINJ Error Injection Table test.
> - erst            ERST Error Record Serialization Table test.
> - facs            FACS Firmware ACPI Control Structure test.
> - fadt            FADT Fixed ACPI Description Table tests.
> - fan             Simple fan tests.
> - fpdt            FPDT Firmware Performance Data Table test.
> - gtdt            GTDT Generic Timer Description Table test.
> - hda_audio       HDA Audio Pin Configuration test.
> - hest            HEST Hardware Error Source Table test.
> - hpet            HPET IA-PC High Precision Event Timer Table tests.
> - iort            IORT IO Remapping Table test.
> - klog            Scan kernel log for errors and warnings.
> - lpit            LPIT Low Power Idle Table test.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - maxfreq         Test max CPU frequencies against max scaling frequency.
> - maxreadreq      Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg            MCFG PCI Express* memory mapped config space test.
> - mchi            MCHI Management Controller Host Interface Table test.
> - method          ACPI DSDT Method Semantic tests.
> - microcode       Test if system is using latest microcode.
> - mpcheck         MultiProcessor Tables tests.
> - msct            MSCT Maximum System Characteristics Table test.
> - msdm            MSDM Microsoft Data Management Table test.
> - msr             MSR register tests.
> - mtrr            MTRR tests.
> - nx              Test if CPU NX is disabled by the BIOS.
> - olog            Run OLOG scan and analysis checks.
> - oops            Scan kernel log for Oopses.
> - osilinux        Disassemble DSDT to check for _OSI("Linux").
> - pcc             Processor Clocking Control (PCC) test.
> - pciirq          PCI IRQ Routing Table test.
> - pnp             BIOS Support Installation structure test.
> - prd_info        OPAL Processor Recovery Diagnostics Info
> - rsdp            RSDP Root System Description Pointer test.
> - rsdt            RSDT Root System Description Table test.
> - sbst            SBST Smart Battery Specification Table test.
> - securebootcert  UEFI secure boot test.
> - slic            SLIC Software Licensing Description Table test.
> - slit            SLIT System Locality Distance Information test.
> - spcr            SPCR Serial Port Console Redirection Table test.
> - spmi            SPMI Service Processor Management Interface Description Table test.
> - srat            SRAT System Resource Affinity Table test.
> - stao            STAO Status Override Table test.
> - syntaxcheck     Re-assemble DSDT and SSDTs to find syntax errors and warnings.
> - tcpa            TCPA Trusted Computing Platform Alliance Capabilities Table test.
> - tpm2            TPM2 Trusted Platform Module 2 test.
> - uefi            UEFI Data Table test.
> - uefibootpath    Sanity check for UEFI Boot Path Boot####.
> - version         Gather kernel system information.
> - virt            CPU Virtualisation Configuration test.
> - waet            WAET Windows ACPI Emulated Devices Table test.
> - wakealarm       ACPI Wakealarm tests.
> - wdat            WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             Extract and analyse Windows Management Instrumentation (WMI).
> - xenv            XENV Xen Environment Table tests.
> - xsdt            XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter      Interactive ac_adapter power test.
> - battery         Battery tests.
> - brightness      Interactive LCD brightness test.
> - hotkey          Hotkey scan code tests.
> - lid             Interactive lid button test.
> - power_button    Interactive power_button button test.
> -
> -Power States tests:
> - s3              S3 suspend/resume test.
> - s3power         S3 power loss during suspend test (takes minimum of 10 minutes to run).
> - s4              S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump        Dump ACPI tables.
> - cmosdump        Dump CMOS Memory.
> - crsdump         Dump ACPI _CRS resources.
> - ebdadump        Dump EBDA region.
> - esrtdump        Dump ESRT table.
> - gpedump         Dump GPEs.
> - memmapdump      Dump system memory map.
> - mpdump          Dump MultiProcessor Data.
> - plddump         Dump ACPI _PLD (Physical Device Location).
> - prsdump         Dump ACPI _PRS resources.
> - romdump         Dump ROM data.
> - uefidump        Dump UEFI variables.
> - uefivarinfo     UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar   Authenticated variable tests.
> - uefirtmisc      UEFI miscellaneous runtime service interface tests.
> - uefirttime      UEFI Runtime service time interface tests.
> - uefirtvariable  UEFI Runtime service variable interface tests.
> -
> -UEFI tests:
> - csm             UEFI Compatibility Support Module test.
> - esrt            Sanity check UEFI ESRT Table.
> - securebootcert  UEFI secure boot test.
> - uefibootpath    Sanity check for UEFI Boot Path Boot####.
> - uefirtauthvar   Authenticated variable tests.
> - uefirtmisc      UEFI miscellaneous runtime service interface tests.
> - uefirttime      UEFI Runtime service time interface tests.
> - uefirtvariable  UEFI Runtime service variable interface tests.
> -
> -ACPI Spec Compliance tests:
> - fadt            FADT Fixed ACPI Description Table tests.
> - madt            MADT Multiple APIC Description Table (spec compliant).
> - rsdp            RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-0001/test-0001.sh b/fwts-test/arg-show-tests-0001/test-0001.sh
> deleted file mode 100755
> index a62071c..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0001.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test -s option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -#  If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> -        tset 2> /dev/null
> -        echo SKIP: $TEST, $NAME
> -        exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-0001/test-0002.sh b/fwts-test/arg-show-tests-0001/test-0002.sh
> deleted file mode 100755
> index f92fd8f..0000000
> --- a/fwts-test/arg-show-tests-0001/test-0002.sh
> +++ /dev/null
> @@ -1,39 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests option"
> -NAME=test-0002.sh
> -TMPLOG=$TMP/arg-show-tests.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -cols=$(stty -a | tr ';' '\n' | grep "columns" | cut -d' ' -f3) 2> /dev/null
> -#
> -#  If we can't set the tty then we can't test
> -#
> -stty cols 80 2> /dev/null
> -if [ $? -eq 1 ]; then
> -        tset 2> /dev/null
> -        echo SKIP: $TEST, $NAME
> -        exit 77
> -fi
> -$FWTS -s > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-0001/arg-show-tests-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -stty cols 80 2> /dev/null
> -tset 2> /dev/null
> -
> -rm $TMPLOG
> -exit $ret
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> deleted file mode 100644
> index 3eb5e3e..0000000
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ /dev/null
> @@ -1,930 +0,0 @@
> -ACPI tests:
> - acpiinfo        (3 tests):
> -  Determine Kernel ACPI version.
> -  Determine machine's ACPI version.
> -  Determine AML compiler.
> - acpitables      (1 test):
> -  Test ACPI headers.
> - apicinstance    (1 test):
> -  Test for single instance of APIC/MADT table.
> - asf             (1 test):
> -  ASF! Alert Standard Format Table test.
> - aspt            (1 test):
> -  ASPT Table test.
> - bert            (1 test):
> -  BERT Boot Error Record Table test.
> - bgrt            (1 test):
> -  BGRT Boot Graphics Resource Table test.
> - boot            (1 test):
> -  BOOT Table test.
> - checksum        (1 test):
> -  ACPI table checksum test.
> - cpep            (1 test):
> -  CPEP Corrected Platform Error Polling Table test.
> - csrt            (1 test):
> -  CSRT Core System Resource Table test.
> - cstates         (1 test):
> -  Test all CPUs C-states.
> - dbg2            (1 test):
> -  DBG2 (Debug Port Table 2) test.
> - dbgp            (1 test):
> -  DBGP (Debug Port) Table test.
> - dmar            (1 test):
> -  DMA Remapping test.
> - ecdt            (1 test):
> -  ECDT Embedded Controller Boot Resources Table test.
> - einj            (1 test):
> -  EINJ Error Injection Table test.
> - erst            (1 test):
> -  ERST Error Record Serialization Table test.
> - facs            (1 test):
> -  FACS Firmware ACPI Control Structure test.
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - fpdt            (1 test):
> -  FPDT Firmware Performance Data Table test.
> - gtdt            (1 test):
> -  GTDT Generic Timer Description Table test.
> - hest            (1 test):
> -  HEST Hardware Error Source Table test.
> - hpet            (4 tests):
> -  Test HPET base in kernel log.
> -  Test HPET base in HPET table.
> -  Test HPET base in DSDT and/or SSDT.
> -  Test HPET configuration.
> - iort            (1 test):
> -  IORT IO Remapping Table test.
> - lpit            (1 test):
> -  LPIT Low Power Idle Table test.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - mcfg            (2 tests):
> -  Validate MCFG table.
> -  Validate MCFG PCI config space.
> - mchi            (1 test):
> -  MCHI Management Controller Host Interface Table test.
> - method          (191 tests):
> -  Test Method Names.
> -  Test _AEI.
> -  Test _EVT (Event Method).
> -  Test _DLM (Device Lock Mutex).
> -  Test _PIC (Inform AML of Interrupt Model).
> -  Test _CID (Compatible ID).
> -  Test _DDN (DOS Device Name).
> -  Test _HID (Hardware ID).
> -  Test _HRV (Hardware Revision Number).
> -  Test _MLS (Multiple Language String).
> -  Test _PLD (Physical Device Location).
> -  Test _SUB (Subsystem ID).
> -  Test _SUN (Slot User Number).
> -  Test _STR (String).
> -  Test _UID (Unique ID).
> -  Test _CDM (Clock Domain).
> -  Test _CRS (Current Resource Settings).
> -  Test _DSD (Device Specific Data).
> -  Test _DIS (Disable).
> -  Test _DMA (Direct Memory Access).
> -  Test _FIX (Fixed Register Resource Provider).
> -  Test _GSB (Global System Interrupt Base).
> -  Test _HPP (Hot Plug Parameters).
> -  Test _PRS (Possible Resource Settings).
> -  Test _PRT (PCI Routing Table).
> -  Test _PXM (Proximity).
> -  Test _CCA (Cache Coherency Attribute).
> -  Test _EDL (Eject Device List).
> -  Test _EJD (Ejection Dependent Device).
> -  Test _EJ0 (Eject).
> -  Test _EJ1 (Eject).
> -  Test _EJ2 (Eject).
> -  Test _EJ3 (Eject).
> -  Test _EJ4 (Eject).
> -  Test _LCK (Lock).
> -  Test _RMV (Remove).
> -  Test _STA (Status).
> -  Test _DEP (Operational Region Dependencies).
> -  Test _BDN (BIOS Dock Name).
> -  Test _BBN (Base Bus Number).
> -  Test _DCK (Dock).
> -  Test _INI (Initialize).
> -  Test _GLK (Global Lock).
> -  Test _SEG (Segment).
> -  Test _OFF (Set resource off).
> -  Test _ON_ (Set resource on).
> -  Test _DSW (Device Sleep Wake).
> -  Test _IRC (In Rush Current).
> -  Test _PRE (Power Resources for Enumeration).
> -  Test _PR0 (Power Resources for D0).
> -  Test _PR1 (Power Resources for D1).
> -  Test _PR2 (Power Resources for D2).
> -  Test _PR3 (Power Resources for D3).
> -  Test _PRW (Power Resources for Wake).
> -  Test _PS0 (Power State 0).
> -  Test _PS1 (Power State 1).
> -  Test _PS2 (Power State 2).
> -  Test _PS3 (Power State 3).
> -  Test _PSC (Power State Current).
> -  Test _PSE (Power State for Enumeration).
> -  Test _PSW (Power State Wake).
> -  Test _S1D (S1 Device State).
> -  Test _S2D (S2 Device State).
> -  Test _S3D (S3 Device State).
> -  Test _S4D (S4 Device State).
> -  Test _S0W (S0 Device Wake State).
> -  Test _S1W (S1 Device Wake State).
> -  Test _S2W (S2 Device Wake State).
> -  Test _S3W (S3 Device Wake State).
> -  Test _S4W (S4 Device Wake State).
> -  Test _RST (Device Reset).
> -  Test _PRR (Power Resource for Reset).
> -  Test _S0_ (S0 System State).
> -  Test _S1_ (S1 System State).
> -  Test _S2_ (S2 System State).
> -  Test _S3_ (S3 System State).
> -  Test _S4_ (S4 System State).
> -  Test _S5_ (S5 System State).
> -  Test _SWS (System Wake Source).
> -  Test _PSS (Performance Supported States).
> -  Test _CPC (Continuous Performance Control).
> -  Test _CSD (C State Dependencies).
> -  Test _CST (C States).
> -  Test _PCT (Performance Control).
> -  Test _PDL (P-State Depth Limit).
> -  Test _PPC (Performance Present Capabilities).
> -  Test _PPE (Polling for Platform Error).
> -  Test _PSD (Power State Dependencies).
> -  Test _PTC (Processor Throttling Control).
> -  Test _TDL (T-State Depth Limit).
> -  Test _TPC (Throttling Present Capabilities).
> -  Test _TSD (Throttling State Dependencies).
> -  Test _TSS (Throttling Supported States).
> -  Test _LPI (Low Power Idle States).
> -  Test _RDI (Resource Dependencies for Idle).
> -  Test _PUR (Processor Utilization Request).
> -  Test _MSG (Message).
> -  Test _SST (System Status).
> -  Test _ALC (Ambient Light Colour Chromaticity).
> -  Test _ALI (Ambient Light Illuminance).
> -  Test _ALT (Ambient Light Temperature).
> -  Test _ALP (Ambient Light Polling).
> -  Test _ALR (Ambient Light Response).
> -  Test _LID (Lid Status).
> -  Test _GTF (Get Task File).
> -  Test _GTM (Get Timing Mode).
> -  Test _MBM (Memory Bandwidth Monitoring Data).
> -  Test _UPC (USB Port Capabilities).
> -  Test _UPD (User Presence Detect).
> -  Test _UPP (User Presence Polling).
> -  Test _GCP (Get Capabilities).
> -  Test _GRT (Get Real Time).
> -  Test _GWS (Get Wake Status).
> -  Test _CWS (Clear Wake Status).
> -  Test _STP (Set Expired Timer Wake Policy).
> -  Test _STV (Set Timer Value).
> -  Test _TIP (Expired Timer Wake Policy).
> -  Test _TIV (Timer Values).
> -  Test _SBS (Smart Battery Subsystem).
> -  Test _BCT (Battery Charge Time).
> -  Test _BIF (Battery Information).
> -  Test _BIX (Battery Information Extended).
> -  Test _BMA (Battery Measurement Averaging).
> -  Test _BMC (Battery Maintenance Control).
> -  Test _BMD (Battery Maintenance Data).
> -  Test _BMS (Battery Measurement Sampling Time).
> -  Test _BST (Battery Status).
> -  Test _BTP (Battery Trip Point).
> -  Test _BTH (Battery Throttle Limit).
> -  Test _BTM (Battery Time).
> -  Test _PCL (Power Consumer List).
> -  Test _PIF (Power Source Information).
> -  Test _PRL (Power Source Redundancy List).
> -  Test _PSR (Power Source).
> -  Test _GAI (Get Averaging Level).
> -  Test _GHL (Get Harware Limit).
> -  Test _PMC (Power Meter Capabilities).
> -  Test _PMD (Power Meter Devices).
> -  Test _PMM (Power Meter Measurement).
> -  Test _WPC (Wireless Power Calibration).
> -  Test _WPP (Wireless Power Polling).
> -  Test _FIF (Fan Information).
> -  Test _FPS (Fan Performance States).
> -  Test _FSL (Fan Set Level).
> -  Test _FST (Fan Status).
> -  Test _ACx (Active Cooling).
> -  Test _ART (Active Cooling Relationship Table).
> -  Test _CRT (Critical Trip Point).
> -  Test _CR3 (Warm/Standby Temperature).
> -  Test _DTI (Device Temperature Indication).
> -  Test _HOT (Hot Temperature).
> -  Test _MTL (Minimum Throttle Limit).
> -  Test _NTT (Notification Temp Threshold).
> -  Test _PSL (Passive List).
> -  Test _PSV (Passive Temp).
> -  Test _RTV (Relative Temp Values).
> -  Test _SCP (Set Cooling Policy).
> -  Test _TC1 (Thermal Constant 1).
> -  Test _TC2 (Thermal Constant 2).
> -  Test _TFP (Thermal fast Sampling Period).
> -  Test _TMP (Thermal Zone Current Temp).
> -  Test _TPT (Trip Point Temperature).
> -  Test _TRT (Thermal Relationship Table).
> -  Test _TSN (Thermal Sensor Device).
> -  Test _TSP (Thermal Sampling Period).
> -  Test _TST (Temperature Sensor Threshold).
> -  Test _TZD (Thermal Zone Devices).
> -  Test _TZM (Thermal Zone member).
> -  Test _TZP (Thermal Zone Polling).
> -  Test _GPE (General Purpose Events).
> -  Test _EC_ (EC Offset Query).
> -  Test _PTS (Prepare to Sleep).
> -  Test _TTS (Transition to State).
> -  Test _WAK (System Wake).
> -  Test _ADR (Return Unique ID for Device).
> -  Test _BCL (Query List of Brightness Control Levels Supported).
> -  Test _BCM (Set Brightness Level).
> -  Test _BQC (Brightness Query Current Level).
> -  Test _DCS (Return the Status of Output Device).
> -  Test _DDC (Return the EDID for this Device).
> -  Test _DSS (Device Set State).
> -  Test _DGS (Query Graphics State).
> -  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Test _DOS (Enable/Disable Output Switching).
> -  Test _GPD (Get POST Device).
> -  Test _ROM (Get ROM Data).
> -  Test _SPD (Set POST Device).
> -  Test _VPO (Video POST Options).
> -  Test _CBA (Configuration Base Address).
> -  Test _IFT (IPMI Interface Type).
> -  Test _SRV (IPMI Interface Revision).
> - msct            (1 test):
> -  MSCT Maximum System Characteristics Table test.
> - msdm            (1 test):
> -  MSDM Microsoft Data Management Table test.
> - pcc             (1 test):
> -  Processor Clocking Control (PCC) test.
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> - rsdt            (1 test):
> -  RSDT Root System Description Table test.
> - sbst            (1 test):
> -  SBST Smart Battery Specificiation Table test.
> - slic            (1 test):
> -  SLIC Software Licensing Description Table test.
> - slit            (1 test):
> -  SLIT System Locality Distance Information test.
> - spcr            (1 test):
> -  SPCR Serial Port Console Redirection Table test.
> - spmi            (1 test):
> -  SPMI Service Processor Management Interface Description Table test.
> - srat            (1 test):
> -  SRAT System Resource Affinity Table test.
> - stao            (1 test):
> -  STAO Status Override Table test.
> - tcpa            (1 test):
> -  Validate TCPA table.
> - tpm2            (1 test):
> -  Validate TPM2 table.
> - uefi            (1 test):
> -  UEFI Data Table test.
> - waet            (1 test):
> -  Windows ACPI Emulated Devices Table test.
> - wdat            (1 test):
> -  WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             (1 test):
> -  Windows Management Instrumentation test.
> - xenv            (1 test):
> -  Validate XENV table.
> - xsdt            (1 test):
> -  XSDT Extended System Description Table test.
> -
> -Batch tests:
> - acpiinfo        (3 tests):
> -  Determine Kernel ACPI version.
> -  Determine machine's ACPI version.
> -  Determine AML compiler.
> - acpitables      (1 test):
> -  Test ACPI headers.
> - apicedge        (1 test):
> -  Legacy and PCI Interrupt Edge/Level trigger tests.
> - apicinstance    (1 test):
> -  Test for single instance of APIC/MADT table.
> - asf             (1 test):
> -  ASF! Alert Standard Format Table test.
> - aspm            (2 tests):
> -  PCIe ASPM ACPI test.
> -  PCIe ASPM registers test.
> - aspt            (1 test):
> -  ASPT Table test.
> - autobrightness  (2 tests):
> -  Test for maximum and actual brightness.
> -  Change actual brightness.
> - bert            (1 test):
> -  BERT Boot Error Record Table test.
> - bgrt            (1 test):
> -  BGRT Boot Graphics Resource Table test.
> - bios32          (1 test):
> -  BIOS32 Service Directory test.
> - bios_info       (1 test):
> -  Gather BIOS DMI information
> - bmc_info        (1 test):
> -  BMC Info
> - boot            (1 test):
> -  BOOT Table test.
> - checksum        (1 test):
> -  ACPI table checksum test.
> - cpep            (1 test):
> -  CPEP Corrected Platform Error Polling Table test.
> - cpufreq         (7 tests):
> -  CPU frequency table consistency
> -  CPU frequency table duplicates
> -  CPU frequency firmware limits
> -  CPU frequency claimed maximum
> -  CPU frequency SW_ANY control
> -  CPU frequency SW_ALL control
> -  CPU frequency performance tests.
> - crs             (1 test):
> -  Test PCI host bridge configuration using _CRS.
> - csm             (1 test):
> -  UEFI Compatibility Support Module test.
> - csrt            (1 test):
> -  CSRT Core System Resource Table test.
> - cstates         (1 test):
> -  Test all CPUs C-states.
> - dbg2            (1 test):
> -  DBG2 (Debug Port Table 2) test.
> - dbgp            (1 test):
> -  DBGP (Debug Port) Table test.
> - dmar            (1 test):
> -  DMA Remapping test.
> - dmicheck        (3 tests):
> -  Find and test SMBIOS Table Entry Points.
> -  Test DMI/SMBIOS tables for errors.
> -  Test DMI/SMBIOS3 tables for errors.
> - dt_base         (3 tests):
> -  Check device tree presence
> -  Check device tree baseline validity
> -  Check device tree warnings
> - dt_sysinfo      (3 tests):
> -  Check model property
> -  Check system-id property
> -  Check OpenPOWER Reference compatible
> - ebda            (1 test):
> -  Test EBDA is reserved in E820 table.
> - ecdt            (1 test):
> -  ECDT Embedded Controller Boot Resources Table test.
> - einj            (1 test):
> -  EINJ Error Injection Table test.
> - erst            (1 test):
> -  ERST Error Record Serialization Table test.
> - facs            (1 test):
> -  FACS Firmware ACPI Control Structure test.
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - fan             (2 tests):
> -  Test fan status.
> -  Load system, check CPU fan status.
> - fpdt            (1 test):
> -  FPDT Firmware Performance Data Table test.
> - gtdt            (1 test):
> -  GTDT Generic Timer Description Table test.
> - hda_audio       (1 test):
> -  HDA Audio Pin Configuration test.
> - hest            (1 test):
> -  HEST Hardware Error Source Table test.
> - hpet            (4 tests):
> -  Test HPET base in kernel log.
> -  Test HPET base in HPET table.
> -  Test HPET base in DSDT and/or SSDT.
> -  Test HPET configuration.
> - iort            (1 test):
> -  IORT IO Remapping Table test.
> - klog            (1 test):
> -  Kernel log error check.
> - lpit            (1 test):
> -  LPIT Low Power Idle Table test.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - maxfreq         (1 test):
> -  Maximum CPU frequency test.
> - maxreadreq      (1 test):
> -  Test firmware settings MaxReadReq for PCI Express devices.
> - mcfg            (2 tests):
> -  Validate MCFG table.
> -  Validate MCFG PCI config space.
> - mchi            (1 test):
> -  MCHI Management Controller Host Interface Table test.
> - method          (191 tests):
> -  Test Method Names.
> -  Test _AEI.
> -  Test _EVT (Event Method).
> -  Test _DLM (Device Lock Mutex).
> -  Test _PIC (Inform AML of Interrupt Model).
> -  Test _CID (Compatible ID).
> -  Test _DDN (DOS Device Name).
> -  Test _HID (Hardware ID).
> -  Test _HRV (Hardware Revision Number).
> -  Test _MLS (Multiple Language String).
> -  Test _PLD (Physical Device Location).
> -  Test _SUB (Subsystem ID).
> -  Test _SUN (Slot User Number).
> -  Test _STR (String).
> -  Test _UID (Unique ID).
> -  Test _CDM (Clock Domain).
> -  Test _CRS (Current Resource Settings).
> -  Test _DSD (Device Specific Data).
> -  Test _DIS (Disable).
> -  Test _DMA (Direct Memory Access).
> -  Test _FIX (Fixed Register Resource Provider).
> -  Test _GSB (Global System Interrupt Base).
> -  Test _HPP (Hot Plug Parameters).
> -  Test _PRS (Possible Resource Settings).
> -  Test _PRT (PCI Routing Table).
> -  Test _PXM (Proximity).
> -  Test _CCA (Cache Coherency Attribute).
> -  Test _EDL (Eject Device List).
> -  Test _EJD (Ejection Dependent Device).
> -  Test _EJ0 (Eject).
> -  Test _EJ1 (Eject).
> -  Test _EJ2 (Eject).
> -  Test _EJ3 (Eject).
> -  Test _EJ4 (Eject).
> -  Test _LCK (Lock).
> -  Test _RMV (Remove).
> -  Test _STA (Status).
> -  Test _DEP (Operational Region Dependencies).
> -  Test _BDN (BIOS Dock Name).
> -  Test _BBN (Base Bus Number).
> -  Test _DCK (Dock).
> -  Test _INI (Initialize).
> -  Test _GLK (Global Lock).
> -  Test _SEG (Segment).
> -  Test _OFF (Set resource off).
> -  Test _ON_ (Set resource on).
> -  Test _DSW (Device Sleep Wake).
> -  Test _IRC (In Rush Current).
> -  Test _PRE (Power Resources for Enumeration).
> -  Test _PR0 (Power Resources for D0).
> -  Test _PR1 (Power Resources for D1).
> -  Test _PR2 (Power Resources for D2).
> -  Test _PR3 (Power Resources for D3).
> -  Test _PRW (Power Resources for Wake).
> -  Test _PS0 (Power State 0).
> -  Test _PS1 (Power State 1).
> -  Test _PS2 (Power State 2).
> -  Test _PS3 (Power State 3).
> -  Test _PSC (Power State Current).
> -  Test _PSE (Power State for Enumeration).
> -  Test _PSW (Power State Wake).
> -  Test _S1D (S1 Device State).
> -  Test _S2D (S2 Device State).
> -  Test _S3D (S3 Device State).
> -  Test _S4D (S4 Device State).
> -  Test _S0W (S0 Device Wake State).
> -  Test _S1W (S1 Device Wake State).
> -  Test _S2W (S2 Device Wake State).
> -  Test _S3W (S3 Device Wake State).
> -  Test _S4W (S4 Device Wake State).
> -  Test _RST (Device Reset).
> -  Test _PRR (Power Resource for Reset).
> -  Test _S0_ (S0 System State).
> -  Test _S1_ (S1 System State).
> -  Test _S2_ (S2 System State).
> -  Test _S3_ (S3 System State).
> -  Test _S4_ (S4 System State).
> -  Test _S5_ (S5 System State).
> -  Test _SWS (System Wake Source).
> -  Test _PSS (Performance Supported States).
> -  Test _CPC (Continuous Performance Control).
> -  Test _CSD (C State Dependencies).
> -  Test _CST (C States).
> -  Test _PCT (Performance Control).
> -  Test _PDL (P-State Depth Limit).
> -  Test _PPC (Performance Present Capabilities).
> -  Test _PPE (Polling for Platform Error).
> -  Test _PSD (Power State Dependencies).
> -  Test _PTC (Processor Throttling Control).
> -  Test _TDL (T-State Depth Limit).
> -  Test _TPC (Throttling Present Capabilities).
> -  Test _TSD (Throttling State Dependencies).
> -  Test _TSS (Throttling Supported States).
> -  Test _LPI (Low Power Idle States).
> -  Test _RDI (Resource Dependencies for Idle).
> -  Test _PUR (Processor Utilization Request).
> -  Test _MSG (Message).
> -  Test _SST (System Status).
> -  Test _ALC (Ambient Light Colour Chromaticity).
> -  Test _ALI (Ambient Light Illuminance).
> -  Test _ALT (Ambient Light Temperature).
> -  Test _ALP (Ambient Light Polling).
> -  Test _ALR (Ambient Light Response).
> -  Test _LID (Lid Status).
> -  Test _GTF (Get Task File).
> -  Test _GTM (Get Timing Mode).
> -  Test _MBM (Memory Bandwidth Monitoring Data).
> -  Test _UPC (USB Port Capabilities).
> -  Test _UPD (User Presence Detect).
> -  Test _UPP (User Presence Polling).
> -  Test _GCP (Get Capabilities).
> -  Test _GRT (Get Real Time).
> -  Test _GWS (Get Wake Status).
> -  Test _CWS (Clear Wake Status).
> -  Test _STP (Set Expired Timer Wake Policy).
> -  Test _STV (Set Timer Value).
> -  Test _TIP (Expired Timer Wake Policy).
> -  Test _TIV (Timer Values).
> -  Test _SBS (Smart Battery Subsystem).
> -  Test _BCT (Battery Charge Time).
> -  Test _BIF (Battery Information).
> -  Test _BIX (Battery Information Extended).
> -  Test _BMA (Battery Measurement Averaging).
> -  Test _BMC (Battery Maintenance Control).
> -  Test _BMD (Battery Maintenance Data).
> -  Test _BMS (Battery Measurement Sampling Time).
> -  Test _BST (Battery Status).
> -  Test _BTP (Battery Trip Point).
> -  Test _BTH (Battery Throttle Limit).
> -  Test _BTM (Battery Time).
> -  Test _PCL (Power Consumer List).
> -  Test _PIF (Power Source Information).
> -  Test _PRL (Power Source Redundancy List).
> -  Test _PSR (Power Source).
> -  Test _GAI (Get Averaging Level).
> -  Test _GHL (Get Harware Limit).
> -  Test _PMC (Power Meter Capabilities).
> -  Test _PMD (Power Meter Devices).
> -  Test _PMM (Power Meter Measurement).
> -  Test _WPC (Wireless Power Calibration).
> -  Test _WPP (Wireless Power Polling).
> -  Test _FIF (Fan Information).
> -  Test _FPS (Fan Performance States).
> -  Test _FSL (Fan Set Level).
> -  Test _FST (Fan Status).
> -  Test _ACx (Active Cooling).
> -  Test _ART (Active Cooling Relationship Table).
> -  Test _CRT (Critical Trip Point).
> -  Test _CR3 (Warm/Standby Temperature).
> -  Test _DTI (Device Temperature Indication).
> -  Test _HOT (Hot Temperature).
> -  Test _MTL (Minimum Throttle Limit).
> -  Test _NTT (Notification Temp Threshold).
> -  Test _PSL (Passive List).
> -  Test _PSV (Passive Temp).
> -  Test _RTV (Relative Temp Values).
> -  Test _SCP (Set Cooling Policy).
> -  Test _TC1 (Thermal Constant 1).
> -  Test _TC2 (Thermal Constant 2).
> -  Test _TFP (Thermal fast Sampling Period).
> -  Test _TMP (Thermal Zone Current Temp).
> -  Test _TPT (Trip Point Temperature).
> -  Test _TRT (Thermal Relationship Table).
> -  Test _TSN (Thermal Sensor Device).
> -  Test _TSP (Thermal Sampling Period).
> -  Test _TST (Temperature Sensor Threshold).
> -  Test _TZD (Thermal Zone Devices).
> -  Test _TZM (Thermal Zone member).
> -  Test _TZP (Thermal Zone Polling).
> -  Test _GPE (General Purpose Events).
> -  Test _EC_ (EC Offset Query).
> -  Test _PTS (Prepare to Sleep).
> -  Test _TTS (Transition to State).
> -  Test _WAK (System Wake).
> -  Test _ADR (Return Unique ID for Device).
> -  Test _BCL (Query List of Brightness Control Levels Supported).
> -  Test _BCM (Set Brightness Level).
> -  Test _BQC (Brightness Query Current Level).
> -  Test _DCS (Return the Status of Output Device).
> -  Test _DDC (Return the EDID for this Device).
> -  Test _DSS (Device Set State).
> -  Test _DGS (Query Graphics State).
> -  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Test _DOS (Enable/Disable Output Switching).
> -  Test _GPD (Get POST Device).
> -  Test _ROM (Get ROM Data).
> -  Test _SPD (Set POST Device).
> -  Test _VPO (Video POST Options).
> -  Test _CBA (Configuration Base Address).
> -  Test _IFT (IPMI Interface Type).
> -  Test _SRV (IPMI Interface Revision).
> - microcode       (1 test):
> -  Test for most recent microcode being loaded.
> - mpcheck         (9 tests):
> -  Test MP header.
> -  Test MP CPU entries.
> -  Test MP Bus entries.
> -  Test MP IO APIC entries.
> -  Test MP IO Interrupt entries.
> -  Test MP Local Interrupt entries.
> -  Test MP System Address entries.
> -  Test MP Bus Hierarchy entries.
> -  Test MP Compatible Bus Address Space entries.
> - msct            (1 test):
> -  MSCT Maximum System Characteristics Table test.
> - msdm            (1 test):
> -  MSDM Microsoft Data Management Table test.
> - msr             (5 tests):
> -  Test CPU generic MSRs.
> -  Test CPU specific model MSRs.
> -  Test all P State Ratios.
> -  Test C1 and C3 autodemotion.
> -  Test SMRR MSR registers.
> - mtrr            (3 tests):
> -  Validate the kernel MTRR IOMEM setup.
> -  Validate the MTRR setup across all processors.
> -  Test for AMD MtrrFixDramModEn being cleared by the BIOS.
> - nx              (3 tests):
> -  Test CPU NX capability.
> -  Test all CPUs have same BIOS set NX flag.
> -  Test all CPUs have same msr setting in MSR 0x1a0.
> - olog            (1 test):
> -  OLOG scan and analysis checks results.
> - oops            (1 test):
> -  Kernel log oops check.
> - osilinux        (1 test):
> -  Disassemble DSDT to check for _OSI("Linux").
> - pcc             (1 test):
> -  Processor Clocking Control (PCC) test.
> - pciirq          (1 test):
> -  PCI IRQ Routing Table test.
> - pnp             (1 test):
> -  PnP BIOS Support Installation structure test.
> - prd_info        (1 test):
> -  OPAL Processor Recovery Diagnostics Info
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> - rsdt            (1 test):
> -  RSDT Root System Description Table test.
> - sbst            (1 test):
> -  SBST Smart Battery Specificiation Table test.
> - securebootcert  (1 test):
> -  UEFI secure boot test.
> - slic            (1 test):
> -  SLIC Software Licensing Description Table test.
> - slit            (1 test):
> -  SLIT System Locality Distance Information test.
> - spcr            (1 test):
> -  SPCR Serial Port Console Redirection Table test.
> - spmi            (1 test):
> -  SPMI Service Processor Management Interface Description Table test.
> - srat            (1 test):
> -  SRAT System Resource Affinity Table test.
> - stao            (1 test):
> -  STAO Status Override Table test.
> - syntaxcheck     (1 test):
> -  Disassemble and reassemble DSDT and SSDTs.
> - tcpa            (1 test):
> -  Validate TCPA table.
> - tpm2            (1 test):
> -  Validate TPM2 table.
> - uefi            (1 test):
> -  UEFI Data Table test.
> - uefibootpath    (1 test):
> -  Test UEFI Boot Path Boot####.
> - version         (4 tests):
> -  Gather kernel signature.
> -  Gather kernel system information.
> -  Gather kernel boot command line.
> -  Gather ACPI driver version.
> - virt            (1 test):
> -  CPU Virtualisation Configuration test.
> - waet            (1 test):
> -  Windows ACPI Emulated Devices Table test.
> - wakealarm       (5 tests):
> -  Test existence of RTC with alarm interface.
> -  Trigger wakealarm for 1 seconds in the future.
> -  Test if wakealarm is fired.
> -  Multiple wakealarm firing tests.
> -  Reset wakealarm time.
> - wdat            (1 test):
> -  WDAT Microsoft Hardware Watchdog Action Table test.
> - wmi             (1 test):
> -  Windows Management Instrumentation test.
> - xenv            (1 test):
> -  Validate XENV table.
> - xsdt            (1 test):
> -  XSDT Extended System Description Table test.
> -
> -Interactive tests:
> - ac_adapter      (3 tests):
> -  Test ACPI ac_adapter state.
> -  Test ac_adapter initial on-line state.
> -  Test ac_adapter state changes.
> - battery         (1 test):
> -  Battery test.
> - brightness      (3 tests):
> -  Observe all brightness changes.
> -  Observe min, max brightness changes.
> -  Test brightness hotkeys.
> - hotkey          (1 test):
> -  Hotkey keypress checks.
> - lid             (3 tests):
> -  Test LID buttons report open correctly.
> -  Test LID buttons on a single open/close.
> -  Test LID buttons on multiple open/close events.
> - power_button    (1 test):
> -  Test press of power button and ACPI event.
> -
> -Power States tests:
> - s3              (1 test):
> -  S3 suspend/resume test.
> - s3power         (1 test):
> -  S3 power loss during suspend test.
> - s4              (1 test):
> -  S4 hibernate/resume test.
> -
> -Utilities:
> - acpidump        (1 test):
> -  Dump ACPI tables.
> - cmosdump        (1 test):
> -  Dump CMOS Memory.
> - crsdump         (1 test):
> -  Dump ACPI _CRS (Current Resource Settings).
> - ebdadump        (1 test):
> -  Dump EBDA region.
> - esrtdump        (1 test):
> -  Dump ESRT Table.
> - gpedump         (1 test):
> -  Dump GPEs.
> - memmapdump      (1 test):
> -  Dump system memory map.
> - mpdump          (1 test):
> -  Dump Multi Processor Data.
> - plddump         (1 test):
> -  Dump ACPI _PLD (Physical Device Location).
> - prsdump         (1 test):
> -  Dump ACPI _PRS (Possible Resource Settings).
> - romdump         (1 test):
> -  Dump ROM data.
> - uefidump        (1 test):
> -  Dump UEFI Variables.
> - uefivarinfo     (1 test):
> -  UEFI variable info query.
> -
> -Unsafe tests:
> - uefirtauthvar   (12 tests):
> -  Create authenticated variable test.
> -  Authenticated variable test with the same authenticated variable.
> -  Authenticated variable test with another valid authenticated variable.
> -  Append authenticated variable test.
> -  Update authenticated variable test.
> -  Authenticated variable test with old authenticated variable.
> -  Delete authenticated variable test.
> -  Authenticated variable test with invalid modified data.
> -  Authenticated variable test with invalid modified timestamp.
> -  Authenticated variable test with different guid.
> -  Authenticated variable test with invalid attributes.
> -  Set and delete authenticated variable created by different key test.
> - uefirtmisc      (3 tests):
> -  Test for UEFI miscellaneous runtime service interfaces.
> -  Stress test for UEFI miscellaneous runtime service interfaces.
> -  Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime      (35 tests):
> -  Test UEFI RT service get time interface.
> -  Test UEFI RT service get time interface, NULL time parameter.
> -  Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> -  Test UEFI RT service set time interface.
> -  Test UEFI RT service set time interface, invalid year 1899.
> -  Test UEFI RT service set time interface, invalid year 10000.
> -  Test UEFI RT service set time interface, invalid month 0.
> -  Test UEFI RT service set time interface, invalid month 13.
> -  Test UEFI RT service set time interface, invalid day 0.
> -  Test UEFI RT service set time interface, invalid day 32.
> -  Test UEFI RT service set time interface, invalid hour 24.
> -  Test UEFI RT service set time interface, invalid minute 60.
> -  Test UEFI RT service set time interface, invalid second 60.
> -  Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set time interface, invalid timezone -1441.
> -  Test UEFI RT service set time interface, invalid timezone 1441.
> -  Test UEFI RT service get wakeup time interface.
> -  Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> -  Test UEFI RT service get wakeup time interface, NULL pending parameter.
> -  Test UEFI RT service get wakeup time interface, NULL time parameter.
> -  Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> -  Test UEFI RT service set wakeup time interface.
> -  Test UEFI RT service set wakeup time interface, NULL time parameter.
> -  Test UEFI RT service set wakeup time interface, invalid year 1899.
> -  Test UEFI RT service set wakeup time interface, invalid year 10000.
> -  Test UEFI RT service set wakeup time interface, invalid month 0.
> -  Test UEFI RT service set wakeup time interface, invalid month 13.
> -  Test UEFI RT service set wakeup time interface, invalid day 0.
> -  Test UEFI RT service set wakeup time interface, invalid day 32.
> -  Test UEFI RT service set wakeup time interface, invalid hour 24.
> -  Test UEFI RT service set wakeup time interface, invalid minute 60.
> -  Test UEFI RT service set wakeup time interface, invalid second 60.
> -  Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> -  Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable  (8 tests):
> -  Test UEFI RT service get variable interface.
> -  Test UEFI RT service get next variable name interface.
> -  Test UEFI RT service set variable interface.
> -  Test UEFI RT service query variable info interface.
> -  Test UEFI RT service variable interface stress test.
> -  Test UEFI RT service set variable interface stress test.
> -  Test UEFI RT service query variable info interface stress test.
> -  Test UEFI RT service get variable interface, invalid parameters.
> -
> -UEFI tests:
> - csm             (1 test):
> -  UEFI Compatibility Support Module test.
> - esrt            (1 test):
> -  Sanity check UEFI ESRT Table.
> - securebootcert  (1 test):
> -  UEFI secure boot test.
> - uefibootpath    (1 test):
> -  Test UEFI Boot Path Boot####.
> - uefirtauthvar   (12 tests):
> -  Create authenticated variable test.
> -  Authenticated variable test with the same authenticated variable.
> -  Authenticated variable test with another valid authenticated variable.
> -  Append authenticated variable test.
> -  Update authenticated variable test.
> -  Authenticated variable test with old authenticated variable.
> -  Delete authenticated variable test.
> -  Authenticated variable test with invalid modified data.
> -  Authenticated variable test with invalid modified timestamp.
> -  Authenticated variable test with different guid.
> -  Authenticated variable test with invalid attributes.
> -  Set and delete authenticated variable created by different key test.
> - uefirtmisc      (3 tests):
> -  Test for UEFI miscellaneous runtime service interfaces.
> -  Stress test for UEFI miscellaneous runtime service interfaces.
> -  Test GetNextHighMonotonicCount with invalid NULL parameter.
> - uefirttime      (35 tests):
> -  Test UEFI RT service get time interface.
> -  Test UEFI RT service get time interface, NULL time parameter.
> -  Test UEFI RT service get time interface, NULL time and NULL capabilties parameters.
> -  Test UEFI RT service set time interface.
> -  Test UEFI RT service set time interface, invalid year 1899.
> -  Test UEFI RT service set time interface, invalid year 10000.
> -  Test UEFI RT service set time interface, invalid month 0.
> -  Test UEFI RT service set time interface, invalid month 13.
> -  Test UEFI RT service set time interface, invalid day 0.
> -  Test UEFI RT service set time interface, invalid day 32.
> -  Test UEFI RT service set time interface, invalid hour 24.
> -  Test UEFI RT service set time interface, invalid minute 60.
> -  Test UEFI RT service set time interface, invalid second 60.
> -  Test UEFI RT service set time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set time interface, invalid timezone -1441.
> -  Test UEFI RT service set time interface, invalid timezone 1441.
> -  Test UEFI RT service get wakeup time interface.
> -  Test UEFI RT service get wakeup time interface, NULL enabled parameter.
> -  Test UEFI RT service get wakeup time interface, NULL pending parameter.
> -  Test UEFI RT service get wakeup time interface, NULL time parameter.
> -  Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters.
> -  Test UEFI RT service set wakeup time interface.
> -  Test UEFI RT service set wakeup time interface, NULL time parameter.
> -  Test UEFI RT service set wakeup time interface, invalid year 1899.
> -  Test UEFI RT service set wakeup time interface, invalid year 10000.
> -  Test UEFI RT service set wakeup time interface, invalid month 0.
> -  Test UEFI RT service set wakeup time interface, invalid month 13.
> -  Test UEFI RT service set wakeup time interface, invalid day 0.
> -  Test UEFI RT service set wakeup time interface, invalid day 32.
> -  Test UEFI RT service set wakeup time interface, invalid hour 24.
> -  Test UEFI RT service set wakeup time interface, invalid minute 60.
> -  Test UEFI RT service set wakeup time interface, invalid second 60.
> -  Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000.
> -  Test UEFI RT service set wakeup time interface, invalid timezone -1441.
> -  Test UEFI RT service set wakeup time interface, invalid timezone 1441.
> - uefirtvariable  (8 tests):
> -  Test UEFI RT service get variable interface.
> -  Test UEFI RT service get next variable name interface.
> -  Test UEFI RT service set variable interface.
> -  Test UEFI RT service query variable info interface.
> -  Test UEFI RT service variable interface stress test.
> -  Test UEFI RT service set variable interface stress test.
> -  Test UEFI RT service query variable info interface stress test.
> -  Test UEFI RT service get variable interface, invalid parameters.
> -
> -ACPI Spec Compliance tests:
> - fadt            (6 tests):
> -  ACPI FADT Description Table flag info.
> -  FADT checksum test.
> -  FADT revision test.
> -  ACPI FADT Description Table tests.
> -  Test FADT SCI_EN bit is enabled.
> -  Test FADT reset register.
> - madt            (5 tests):
> -  MADT checksum test.
> -  MADT revision test.
> -  MADT architecture minimum revision test.
> -  MADT flags field reserved bits test.
> -  MADT subtable tests.
> - rsdp            (1 test):
> -  RSDP Root System Description Pointer test.
> diff --git a/fwts-test/arg-show-tests-full-0001/test-0001.sh b/fwts-test/arg-show-tests-full-0001/test-0001.sh
> deleted file mode 100755
> index b4e74f7..0000000
> --- a/fwts-test/arg-show-tests-full-0001/test-0001.sh
> +++ /dev/null
> @@ -1,27 +0,0 @@
> -#!/bin/bash
> -#
> -TEST="Test --show-tests-full option"
> -NAME=test-0001.sh
> -TMPLOG=$TMP/arg-show-tests-full.log.$$
> -
> -#
> -#  Non-x86 tests don't have WMI so skip this test
> -#
> -$FWTS --show-tests | grep wmi > /dev/null
> -if [ $? -eq 1 ]; then
> -	echo SKIP: $TEST, $NAME
> -	exit 77
> -fi
> -
> -stty cols 80
> -$FWTS --show-tests-full > $TMPLOG
> -diff $TMPLOG $FWTSTESTDIR/arg-show-tests-full-0001/arg-show-tests-full-0001.log >> $FAILURE_LOG
> -ret=$?
> -if [ $ret -eq 0 ]; then
> -	echo PASSED: $TEST, $NAME
> -else
> -	echo FAILED: $TEST, $NAME
> -fi
> -
> -rm $TMPLOG
> -exit $ret
>

Acked-by: Ivan Hu <ivan.hu@canonical.com>