| Message ID | 1432967481-31038-1-git-send-email-alex.hung@canonical.com |
|---|---|
| State | Accepted |
| Headers | show |
On 30/05/15 07:31, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/arg-help-0001/arg-help-0001.log | 1 + > fwts-test/arg-help-0001/arg-help-0002.log | 1 + > fwts-test/arg-help-0001/test-0001.sh | 2 +- > .../arg-show-tests-0001/arg-show-tests-0001.log | 15 ++ > .../arg-show-tests-full-0001.log | 217 ++++++++++++++++++++- > 5 files changed, 234 insertions(+), 2 deletions(-) > > diff --git a/fwts-test/arg-help-0001/arg-help-0001.log b/fwts-test/arg-help-0001/arg-help-0001.log > index 6773a6c..3b79179 100644 > --- a/fwts-test/arg-help-0001/arg-help-0001.log > +++ b/fwts-test/arg-help-0001/arg-help-0001.log > @@ -1,3 +1,4 @@ > +--acpi Run ACPI tests. > --acpica Enable ACPICA run > time options. > --acpica-debug Enable ACPICA debug > diff --git a/fwts-test/arg-help-0001/arg-help-0002.log b/fwts-test/arg-help-0001/arg-help-0002.log > index 6773a6c..3b79179 100644 > --- a/fwts-test/arg-help-0001/arg-help-0002.log > +++ b/fwts-test/arg-help-0001/arg-help-0002.log > @@ -1,3 +1,4 @@ > +--acpi Run ACPI tests. > --acpica Enable ACPICA run > time options. > --acpica-debug Enable ACPICA debug > diff --git a/fwts-test/arg-help-0001/test-0001.sh b/fwts-test/arg-help-0001/test-0001.sh > index 38b3dbb..b06383f 100755 > --- a/fwts-test/arg-help-0001/test-0001.sh > +++ b/fwts-test/arg-help-0001/test-0001.sh > @@ -35,5 +35,5 @@ fi > stty cols 80 2> /dev/null > tset 2> /dev/null > > -#rm $TMPLOG > +rm $TMPLOG > exit $ret > diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > index e34af88..8d9b691 100644 > --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > @@ -1,3 +1,18 @@ > +ACPI tests: > + acpiinfo General ACPI information test. > + acpitables ACPI table settings sanity tests. > + apicinstance Test for single instance of APIC/MADT table. > + checksum ACPI table checksum test. > + cstates Processor C state support test. > + dmar DMA Remapping (VT-d) test. > + fadt FADT SCI_EN enabled tests. > + hpet_check HPET configuration tests. > + mcfg MCFG PCI Express* memory mapped config space test. > + method ACPI DSDT Method Semantic tests. > + pcc Processor Clocking Control (PCC) test. > + spcr SPCR Serial Port Console Redirection Table test. > + wmi Extract and analyse Windows Management Instrumentation (WMI). > + > Batch tests: > acpiinfo General ACPI information test. > acpitables ACPI table settings sanity tests. > diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > index b72ee5b..b32cf2e 100644 > --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > @@ -1,3 +1,218 @@ > +ACPI tests: > + acpiinfo (3 tests): > + Determine Kernel ACPI version. > + Determine machine's ACPI version. > + Determine AML compiler. > + acpitables (2 tests): > + Test ACPI tables. > + Test ACPI headers. > + apicinstance (1 test): > + Test for single instance of APIC/MADT table. > + checksum (1 test): > + ACPI table checksum test. > + cstates (1 test): > + Test all CPUs C-states. > + dmar (1 test): > + DMA Remapping test. > + fadt (2 tests): > + Test FADT SCI_EN bit is enabled. > + Test FADT reset register. > + hpet_check (4 tests): > + Test HPET base in kernel log. > + Test HPET base in HPET table. > + Test HPET base in DSDT and/or SSDT. > + Test HPET configuration. > + mcfg (2 tests): > + Validate MCFG table. > + Validate MCFG PCI config space. > + method (180 tests): > + Test Method Names. > + Test _AEI. > + Test _EVT (Event Method). > + Test _DLM (Device Lock Mutex). > + Test _PIC (Inform AML of Interrupt Model). > + Test _CID (Compatible ID). > + Test _DDN (DOS Device Name). > + Test _HID (Hardware ID). > + Test _HRV (Hardware Revision Number). > + Test _MLS (Multiple Language String). > + Test _PLD (Physical Device Location). > + Test _SUB (Subsystem ID). > + Test _SUN (Slot User Number). > + Test _STR (String). > + Test _UID (Unique ID). > + Test _CDM (Clock Domain). > + Test _CRS (Current Resource Settings). > + Test _DSD (Device Specific Data). > + Test _DIS (Disable). > + Test _DMA (Direct Memory Access). > + Test _FIX (Fixed Register Resource Provider). > + Test _GSB (Global System Interrupt Base). > + Test _HPP (Hot Plug Parameters). > + Test _PRS (Possible Resource Settings). > + Test _PXM (Proximity). > + Test _CCA (Cache Coherency Attribute). > + Test _EDL (Eject Device List). > + Test _EJD (Ejection Dependent Device). > + Test _EJ0 (Eject). > + Test _EJ1 (Eject). > + Test _EJ2 (Eject). > + Test _EJ3 (Eject). > + Test _EJ4 (Eject). > + Test _LCK (Lock). > + Test _RMV (Remove). > + Test _STA (Status). > + Test _DEP (Operational Region Dependencies). > + Test _BDN (BIOS Dock Name). > + Test _BBN (Base Bus Number). > + Test _DCK (Dock). > + Test _INI (Initialize). > + Test _GLK (Global Lock). > + Test _SEG (Segment). > + Test _OFF (Set resource off). > + Test _ON (Set resource on). > + Test _DSW (Device Sleep Wake). > + Test _IRC (In Rush Current). > + Test _PRE (Power Resources for Enumeration). > + Test _PR0 (Power Resources for D0). > + Test _PR1 (Power Resources for D1). > + Test _PR2 (Power Resources for D2). > + Test _PR3 (Power Resources for D3). > + Test _PRW (Power Resources for Wake). > + Test _PS0 (Power State 0). > + Test _PS1 (Power State 1). > + Test _PS2 (Power State 2). > + Test _PS3 (Power State 3). > + Test _PSC (Power State Current). > + Test _PSE (Power State for Enumeration). > + Test _PSW (Power State Wake). > + Test _S1D (S1 Device State). > + Test _S2D (S2 Device State). > + Test _S3D (S3 Device State). > + Test _S4D (S4 Device State). > + Test _S0W (S0 Device Wake State). > + Test _S1W (S1 Device Wake State). > + Test _S2W (S2 Device Wake State). > + Test _S3W (S3 Device Wake State). > + Test _S4W (S4 Device Wake State). > + Test _S0_ (S0 System State). > + Test _S1_ (S1 System State). > + Test _S2_ (S2 System State). > + Test _S3_ (S3 System State). > + Test _S4_ (S4 System State). > + Test _S5_ (S5 System State). > + Test _SWS (System Wake Source). > + Test _PSS (Performance Supported States). > + Test _CPC (Continuous Performance Control). > + Test _CSD (C State Dependencies). > + Test _CST (C States). > + Test _PCT (Performance Control). > + Test _PDL (P-State Depth Limit). > + Test _PPC (Performance Present Capabilities). > + Test _PPE (Polling for Platform Error). > + Test _PSD (Power State Dependencies). > + Test _TDL (T-State Depth Limit). > + Test _TPC (Throttling Present Capabilities). > + Test _TSD (Throttling State Dependencies). > + Test _TSS (Throttling Supported States). > + Test _PUR (Processor Utilization Request). > + Test _MSG (Message). > + Test _SST (System Status). > + Test _ALC (Ambient Light Colour Chromaticity). > + Test _ALI (Ambient Light Illuminance). > + Test _ALT (Ambient Light Temperature). > + Test _ALP (Ambient Light Polling). > + Test _ALR (Ambient Light Response). > + Test _LID (Lid Status). > + Test _GTF (Get Task File). > + Test _GTM (Get Timing Mode). > + Test _MBM (Memory Bandwidth Monitoring Data). > + Test _UPC (USB Port Capabilities). > + Test _UPD (User Presence Detect). > + Test _UPP (User Presence Polling). > + Test _GCP (Get Capabilities). > + Test _GRT (Get Real Time). > + Test _GWS (Get Wake Status). > + Test _STP (Set Expired Timer Wake Policy). > + Test _STV (Set Timer Value). > + Test _TIP (Expired Timer Wake Policy). > + Test _TIV (Timer Values). > + Test _SBS (Smart Battery Subsystem). > + Test _BCT (Battery Charge Time). > + Test _BIF (Battery Information). > + Test _BIX (Battery Information Extended). > + Test _BMA (Battery Measurement Averaging). > + Test _BMC (Battery Maintenance Control). > + Test _BMD (Battery Maintenance Data). > + Test _BMS (Battery Measurement Sampling Time). > + Test _BST (Battery Status). > + Test _BTP (Battery Trip Point). > + Test _BTM (Battery Time). > + Test _PCL (Power Consumer List). > + Test _PIF (Power Source Information). > + Test _PRL (Power Source Redundancy List). > + Test _PSR (Power Source). > + Test _GAI (Get Averaging Level). > + Test _GHL (Get Harware Limit). > + Test _PMD (Power Meter Devices). > + Test _PMM (Power Meter Measurement). > + Test _FIF (Fan Information). > + Test _FPS (Fan Performance States). > + Test _FSL (Fan Set Level). > + Test _FST (Fan Status). > + Test _ACx (Active Cooling). > + Test _ART (Active Cooling Relationship Table). > + Test _CRT (Critical Trip Point). > + Test _DTI (Device Temperature Indication). > + Test _HOT (Hot Temperature). > + Test _NTT (Notification Temp Threshold). > + Test _PSL (Passive List). > + Test _PSV (Passive Temp). > + Test _RTV (Relative Temp Values). > + Test _SCP (Set Cooling Policy). > + Test _TC1 (Thermal Constant 1). > + Test _TC2 (Thermal Constant 2). > + Test _TMP (Thermal Zone Current Temp). > + Test _TPT (Trip Point Temperature). > + Test _TRT (Thermal Relationship Table). > + Test _TSP (Thermal Sampling Period). > + Test _TST (Temperature Sensor Threshold). > + Test _TZD (Thermal Zone Devices). > + Test _TZM (Thermal Zone member). > + Test _TZP (Thermal Zone Polling). > + Test _PTS (Prepare to Sleep). > + Test _TTS (Transition to State). > + Test _S0 (System S0 State). > + Test _S1 (System S1 State). > + Test _S2 (System S2 State). > + Test _S3 (System S3 State). > + Test _S4 (System S4 State). > + Test _S5 (System S5 State). > + Test _WAK (System Wake). > + Test _ADR (Return Unique ID for Device). > + Test _BCL (Query List of Brightness Control Levels Supported). > + Test _BCM (Set Brightness Level). > + Test _BQC (Brightness Query Current Level).. > + Test _DCS (Return the Status of Output Device). > + Test _DDC (Return the EDID for this Device). > + Test _DSS (Device Set State). > + Test _DGS (Query Graphics State). > + Test _DOD (Enumerate All Devices Attached to Display Adapter). > + Test _DOS (Enable/Disable Output Switching). > + Test _GPD (Get POST Device). > + Test _ROM (Get ROM Data). > + Test _SPD (Set POST Device). > + Test _VPO (Video POST Options). > + Test _CBA (Configuration Base Address). > + Test _IFT (IPMI Interface Type). > + Test _SRV (IPMI Interface Revision). > + pcc (1 test): > + Processor Clocking Control (PCC) test. > + spcr (1 test): > + SPCR Serial Port Console Redirection Table test. > + wmi (1 test): > + Windows Management Instrumentation test. > + > Batch tests: > acpiinfo (3 tests): > Determine Kernel ACPI version. > @@ -489,4 +704,4 @@ UEFI tests: > Test UEFI RT service query variable info interface stress test. > Test UEFI RT service get variable interface, invalid parameters. > > -Total of 403 tests > +Total of 603 tests > Acked-by: Colin Ian King <colin.king@canonical.com>
On 2015年05月30日 14:31, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/arg-help-0001/arg-help-0001.log | 1 + > fwts-test/arg-help-0001/arg-help-0002.log | 1 + > fwts-test/arg-help-0001/test-0001.sh | 2 +- > .../arg-show-tests-0001/arg-show-tests-0001.log | 15 ++ > .../arg-show-tests-full-0001.log | 217 ++++++++++++++++++++- > 5 files changed, 234 insertions(+), 2 deletions(-) > > diff --git a/fwts-test/arg-help-0001/arg-help-0001.log b/fwts-test/arg-help-0001/arg-help-0001.log > index 6773a6c..3b79179 100644 > --- a/fwts-test/arg-help-0001/arg-help-0001.log > +++ b/fwts-test/arg-help-0001/arg-help-0001.log > @@ -1,3 +1,4 @@ > +--acpi Run ACPI tests. > --acpica Enable ACPICA run > time options. > --acpica-debug Enable ACPICA debug > diff --git a/fwts-test/arg-help-0001/arg-help-0002.log b/fwts-test/arg-help-0001/arg-help-0002.log > index 6773a6c..3b79179 100644 > --- a/fwts-test/arg-help-0001/arg-help-0002.log > +++ b/fwts-test/arg-help-0001/arg-help-0002.log > @@ -1,3 +1,4 @@ > +--acpi Run ACPI tests. > --acpica Enable ACPICA run > time options. > --acpica-debug Enable ACPICA debug > diff --git a/fwts-test/arg-help-0001/test-0001.sh b/fwts-test/arg-help-0001/test-0001.sh > index 38b3dbb..b06383f 100755 > --- a/fwts-test/arg-help-0001/test-0001.sh > +++ b/fwts-test/arg-help-0001/test-0001.sh > @@ -35,5 +35,5 @@ fi > stty cols 80 2> /dev/null > tset 2> /dev/null > > -#rm $TMPLOG > +rm $TMPLOG > exit $ret > diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > index e34af88..8d9b691 100644 > --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log > @@ -1,3 +1,18 @@ > +ACPI tests: > + acpiinfo General ACPI information test. > + acpitables ACPI table settings sanity tests. > + apicinstance Test for single instance of APIC/MADT table. > + checksum ACPI table checksum test. > + cstates Processor C state support test. > + dmar DMA Remapping (VT-d) test. > + fadt FADT SCI_EN enabled tests. > + hpet_check HPET configuration tests. > + mcfg MCFG PCI Express* memory mapped config space test. > + method ACPI DSDT Method Semantic tests. > + pcc Processor Clocking Control (PCC) test. > + spcr SPCR Serial Port Console Redirection Table test. > + wmi Extract and analyse Windows Management Instrumentation (WMI). > + > Batch tests: > acpiinfo General ACPI information test. > acpitables ACPI table settings sanity tests. > diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > index b72ee5b..b32cf2e 100644 > --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log > @@ -1,3 +1,218 @@ > +ACPI tests: > + acpiinfo (3 tests): > + Determine Kernel ACPI version. > + Determine machine's ACPI version. > + Determine AML compiler. > + acpitables (2 tests): > + Test ACPI tables. > + Test ACPI headers. > + apicinstance (1 test): > + Test for single instance of APIC/MADT table. > + checksum (1 test): > + ACPI table checksum test. > + cstates (1 test): > + Test all CPUs C-states. > + dmar (1 test): > + DMA Remapping test. > + fadt (2 tests): > + Test FADT SCI_EN bit is enabled. > + Test FADT reset register. > + hpet_check (4 tests): > + Test HPET base in kernel log. > + Test HPET base in HPET table. > + Test HPET base in DSDT and/or SSDT. > + Test HPET configuration. > + mcfg (2 tests): > + Validate MCFG table. > + Validate MCFG PCI config space. > + method (180 tests): > + Test Method Names. > + Test _AEI. > + Test _EVT (Event Method). > + Test _DLM (Device Lock Mutex). > + Test _PIC (Inform AML of Interrupt Model). > + Test _CID (Compatible ID). > + Test _DDN (DOS Device Name). > + Test _HID (Hardware ID). > + Test _HRV (Hardware Revision Number). > + Test _MLS (Multiple Language String). > + Test _PLD (Physical Device Location). > + Test _SUB (Subsystem ID). > + Test _SUN (Slot User Number). > + Test _STR (String). > + Test _UID (Unique ID). > + Test _CDM (Clock Domain). > + Test _CRS (Current Resource Settings). > + Test _DSD (Device Specific Data). > + Test _DIS (Disable). > + Test _DMA (Direct Memory Access). > + Test _FIX (Fixed Register Resource Provider). > + Test _GSB (Global System Interrupt Base). > + Test _HPP (Hot Plug Parameters). > + Test _PRS (Possible Resource Settings). > + Test _PXM (Proximity). > + Test _CCA (Cache Coherency Attribute). > + Test _EDL (Eject Device List). > + Test _EJD (Ejection Dependent Device). > + Test _EJ0 (Eject). > + Test _EJ1 (Eject). > + Test _EJ2 (Eject). > + Test _EJ3 (Eject). > + Test _EJ4 (Eject). > + Test _LCK (Lock). > + Test _RMV (Remove). > + Test _STA (Status). > + Test _DEP (Operational Region Dependencies). > + Test _BDN (BIOS Dock Name). > + Test _BBN (Base Bus Number). > + Test _DCK (Dock). > + Test _INI (Initialize). > + Test _GLK (Global Lock). > + Test _SEG (Segment). > + Test _OFF (Set resource off). > + Test _ON (Set resource on). > + Test _DSW (Device Sleep Wake). > + Test _IRC (In Rush Current). > + Test _PRE (Power Resources for Enumeration). > + Test _PR0 (Power Resources for D0). > + Test _PR1 (Power Resources for D1). > + Test _PR2 (Power Resources for D2). > + Test _PR3 (Power Resources for D3). > + Test _PRW (Power Resources for Wake). > + Test _PS0 (Power State 0). > + Test _PS1 (Power State 1). > + Test _PS2 (Power State 2). > + Test _PS3 (Power State 3). > + Test _PSC (Power State Current). > + Test _PSE (Power State for Enumeration). > + Test _PSW (Power State Wake). > + Test _S1D (S1 Device State). > + Test _S2D (S2 Device State). > + Test _S3D (S3 Device State). > + Test _S4D (S4 Device State). > + Test _S0W (S0 Device Wake State). > + Test _S1W (S1 Device Wake State). > + Test _S2W (S2 Device Wake State). > + Test _S3W (S3 Device Wake State). > + Test _S4W (S4 Device Wake State). > + Test _S0_ (S0 System State). > + Test _S1_ (S1 System State). > + Test _S2_ (S2 System State). > + Test _S3_ (S3 System State). > + Test _S4_ (S4 System State). > + Test _S5_ (S5 System State). > + Test _SWS (System Wake Source). > + Test _PSS (Performance Supported States). > + Test _CPC (Continuous Performance Control). > + Test _CSD (C State Dependencies). > + Test _CST (C States). > + Test _PCT (Performance Control). > + Test _PDL (P-State Depth Limit). > + Test _PPC (Performance Present Capabilities). > + Test _PPE (Polling for Platform Error). > + Test _PSD (Power State Dependencies). > + Test _TDL (T-State Depth Limit). > + Test _TPC (Throttling Present Capabilities). > + Test _TSD (Throttling State Dependencies). > + Test _TSS (Throttling Supported States). > + Test _PUR (Processor Utilization Request). > + Test _MSG (Message). > + Test _SST (System Status). > + Test _ALC (Ambient Light Colour Chromaticity). > + Test _ALI (Ambient Light Illuminance). > + Test _ALT (Ambient Light Temperature). > + Test _ALP (Ambient Light Polling). > + Test _ALR (Ambient Light Response). > + Test _LID (Lid Status). > + Test _GTF (Get Task File). > + Test _GTM (Get Timing Mode). > + Test _MBM (Memory Bandwidth Monitoring Data). > + Test _UPC (USB Port Capabilities). > + Test _UPD (User Presence Detect). > + Test _UPP (User Presence Polling). > + Test _GCP (Get Capabilities). > + Test _GRT (Get Real Time). > + Test _GWS (Get Wake Status). > + Test _STP (Set Expired Timer Wake Policy). > + Test _STV (Set Timer Value). > + Test _TIP (Expired Timer Wake Policy). > + Test _TIV (Timer Values). > + Test _SBS (Smart Battery Subsystem). > + Test _BCT (Battery Charge Time). > + Test _BIF (Battery Information). > + Test _BIX (Battery Information Extended). > + Test _BMA (Battery Measurement Averaging). > + Test _BMC (Battery Maintenance Control). > + Test _BMD (Battery Maintenance Data). > + Test _BMS (Battery Measurement Sampling Time). > + Test _BST (Battery Status). > + Test _BTP (Battery Trip Point). > + Test _BTM (Battery Time). > + Test _PCL (Power Consumer List). > + Test _PIF (Power Source Information). > + Test _PRL (Power Source Redundancy List). > + Test _PSR (Power Source). > + Test _GAI (Get Averaging Level). > + Test _GHL (Get Harware Limit). > + Test _PMD (Power Meter Devices). > + Test _PMM (Power Meter Measurement). > + Test _FIF (Fan Information). > + Test _FPS (Fan Performance States). > + Test _FSL (Fan Set Level). > + Test _FST (Fan Status). > + Test _ACx (Active Cooling). > + Test _ART (Active Cooling Relationship Table). > + Test _CRT (Critical Trip Point). > + Test _DTI (Device Temperature Indication). > + Test _HOT (Hot Temperature). > + Test _NTT (Notification Temp Threshold). > + Test _PSL (Passive List). > + Test _PSV (Passive Temp). > + Test _RTV (Relative Temp Values). > + Test _SCP (Set Cooling Policy). > + Test _TC1 (Thermal Constant 1). > + Test _TC2 (Thermal Constant 2). > + Test _TMP (Thermal Zone Current Temp). > + Test _TPT (Trip Point Temperature). > + Test _TRT (Thermal Relationship Table). > + Test _TSP (Thermal Sampling Period). > + Test _TST (Temperature Sensor Threshold). > + Test _TZD (Thermal Zone Devices). > + Test _TZM (Thermal Zone member). > + Test _TZP (Thermal Zone Polling). > + Test _PTS (Prepare to Sleep). > + Test _TTS (Transition to State). > + Test _S0 (System S0 State). > + Test _S1 (System S1 State). > + Test _S2 (System S2 State). > + Test _S3 (System S3 State). > + Test _S4 (System S4 State). > + Test _S5 (System S5 State). > + Test _WAK (System Wake). > + Test _ADR (Return Unique ID for Device). > + Test _BCL (Query List of Brightness Control Levels Supported). > + Test _BCM (Set Brightness Level). > + Test _BQC (Brightness Query Current Level). > + Test _DCS (Return the Status of Output Device). > + Test _DDC (Return the EDID for this Device). > + Test _DSS (Device Set State). > + Test _DGS (Query Graphics State). > + Test _DOD (Enumerate All Devices Attached to Display Adapter). > + Test _DOS (Enable/Disable Output Switching). > + Test _GPD (Get POST Device). > + Test _ROM (Get ROM Data). > + Test _SPD (Set POST Device). > + Test _VPO (Video POST Options). > + Test _CBA (Configuration Base Address). > + Test _IFT (IPMI Interface Type). > + Test _SRV (IPMI Interface Revision). > + pcc (1 test): > + Processor Clocking Control (PCC) test. > + spcr (1 test): > + SPCR Serial Port Console Redirection Table test. > + wmi (1 test): > + Windows Management Instrumentation test. > + > Batch tests: > acpiinfo (3 tests): > Determine Kernel ACPI version. > @@ -489,4 +704,4 @@ UEFI tests: > Test UEFI RT service query variable info interface stress test. > Test UEFI RT service get variable interface, invalid parameters. > > -Total of 403 tests > +Total of 603 tests Acked-by: Ivan Hu<ivan.hu@canonical.com>
diff --git a/fwts-test/arg-help-0001/arg-help-0001.log b/fwts-test/arg-help-0001/arg-help-0001.log index 6773a6c..3b79179 100644 --- a/fwts-test/arg-help-0001/arg-help-0001.log +++ b/fwts-test/arg-help-0001/arg-help-0001.log @@ -1,3 +1,4 @@ +--acpi Run ACPI tests. --acpica Enable ACPICA run time options. --acpica-debug Enable ACPICA debug diff --git a/fwts-test/arg-help-0001/arg-help-0002.log b/fwts-test/arg-help-0001/arg-help-0002.log index 6773a6c..3b79179 100644 --- a/fwts-test/arg-help-0001/arg-help-0002.log +++ b/fwts-test/arg-help-0001/arg-help-0002.log @@ -1,3 +1,4 @@ +--acpi Run ACPI tests. --acpica Enable ACPICA run time options. --acpica-debug Enable ACPICA debug diff --git a/fwts-test/arg-help-0001/test-0001.sh b/fwts-test/arg-help-0001/test-0001.sh index 38b3dbb..b06383f 100755 --- a/fwts-test/arg-help-0001/test-0001.sh +++ b/fwts-test/arg-help-0001/test-0001.sh @@ -35,5 +35,5 @@ fi stty cols 80 2> /dev/null tset 2> /dev/null -#rm $TMPLOG +rm $TMPLOG exit $ret diff --git a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log index e34af88..8d9b691 100644 --- a/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log +++ b/fwts-test/arg-show-tests-0001/arg-show-tests-0001.log @@ -1,3 +1,18 @@ +ACPI tests: + acpiinfo General ACPI information test. + acpitables ACPI table settings sanity tests. + apicinstance Test for single instance of APIC/MADT table. + checksum ACPI table checksum test. + cstates Processor C state support test. + dmar DMA Remapping (VT-d) test. + fadt FADT SCI_EN enabled tests. + hpet_check HPET configuration tests. + mcfg MCFG PCI Express* memory mapped config space test. + method ACPI DSDT Method Semantic tests. + pcc Processor Clocking Control (PCC) test. + spcr SPCR Serial Port Console Redirection Table test. + wmi Extract and analyse Windows Management Instrumentation (WMI). + Batch tests: acpiinfo General ACPI information test. acpitables ACPI table settings sanity tests. diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log index b72ee5b..b32cf2e 100644 --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log @@ -1,3 +1,218 @@ +ACPI tests: + acpiinfo (3 tests): + Determine Kernel ACPI version. + Determine machine's ACPI version. + Determine AML compiler. + acpitables (2 tests): + Test ACPI tables. + Test ACPI headers. + apicinstance (1 test): + Test for single instance of APIC/MADT table. + checksum (1 test): + ACPI table checksum test. + cstates (1 test): + Test all CPUs C-states. + dmar (1 test): + DMA Remapping test. + fadt (2 tests): + Test FADT SCI_EN bit is enabled. + Test FADT reset register. + hpet_check (4 tests): + Test HPET base in kernel log. + Test HPET base in HPET table. + Test HPET base in DSDT and/or SSDT. + Test HPET configuration. + mcfg (2 tests): + Validate MCFG table. + Validate MCFG PCI config space. + method (180 tests): + Test Method Names. + Test _AEI. + Test _EVT (Event Method). + Test _DLM (Device Lock Mutex). + Test _PIC (Inform AML of Interrupt Model). + Test _CID (Compatible ID). + Test _DDN (DOS Device Name). + Test _HID (Hardware ID). + Test _HRV (Hardware Revision Number). + Test _MLS (Multiple Language String). + Test _PLD (Physical Device Location). + Test _SUB (Subsystem ID). + Test _SUN (Slot User Number). + Test _STR (String). + Test _UID (Unique ID). + Test _CDM (Clock Domain). + Test _CRS (Current Resource Settings). + Test _DSD (Device Specific Data). + Test _DIS (Disable). + Test _DMA (Direct Memory Access). + Test _FIX (Fixed Register Resource Provider). + Test _GSB (Global System Interrupt Base). + Test _HPP (Hot Plug Parameters). + Test _PRS (Possible Resource Settings). + Test _PXM (Proximity). + Test _CCA (Cache Coherency Attribute). + Test _EDL (Eject Device List). + Test _EJD (Ejection Dependent Device). + Test _EJ0 (Eject). + Test _EJ1 (Eject). + Test _EJ2 (Eject). + Test _EJ3 (Eject). + Test _EJ4 (Eject). + Test _LCK (Lock). + Test _RMV (Remove). + Test _STA (Status). + Test _DEP (Operational Region Dependencies). + Test _BDN (BIOS Dock Name). + Test _BBN (Base Bus Number). + Test _DCK (Dock). + Test _INI (Initialize). + Test _GLK (Global Lock). + Test _SEG (Segment). + Test _OFF (Set resource off). + Test _ON (Set resource on). + Test _DSW (Device Sleep Wake). + Test _IRC (In Rush Current). + Test _PRE (Power Resources for Enumeration). + Test _PR0 (Power Resources for D0). + Test _PR1 (Power Resources for D1). + Test _PR2 (Power Resources for D2). + Test _PR3 (Power Resources for D3). + Test _PRW (Power Resources for Wake). + Test _PS0 (Power State 0). + Test _PS1 (Power State 1). + Test _PS2 (Power State 2). + Test _PS3 (Power State 3). + Test _PSC (Power State Current). + Test _PSE (Power State for Enumeration). + Test _PSW (Power State Wake). + Test _S1D (S1 Device State). + Test _S2D (S2 Device State). + Test _S3D (S3 Device State). + Test _S4D (S4 Device State). + Test _S0W (S0 Device Wake State). + Test _S1W (S1 Device Wake State). + Test _S2W (S2 Device Wake State). + Test _S3W (S3 Device Wake State). + Test _S4W (S4 Device Wake State). + Test _S0_ (S0 System State). + Test _S1_ (S1 System State). + Test _S2_ (S2 System State). + Test _S3_ (S3 System State). + Test _S4_ (S4 System State). + Test _S5_ (S5 System State). + Test _SWS (System Wake Source). + Test _PSS (Performance Supported States). + Test _CPC (Continuous Performance Control). + Test _CSD (C State Dependencies). + Test _CST (C States). + Test _PCT (Performance Control). + Test _PDL (P-State Depth Limit). + Test _PPC (Performance Present Capabilities). + Test _PPE (Polling for Platform Error). + Test _PSD (Power State Dependencies). + Test _TDL (T-State Depth Limit). + Test _TPC (Throttling Present Capabilities). + Test _TSD (Throttling State Dependencies). + Test _TSS (Throttling Supported States). + Test _PUR (Processor Utilization Request). + Test _MSG (Message). + Test _SST (System Status). + Test _ALC (Ambient Light Colour Chromaticity). + Test _ALI (Ambient Light Illuminance). + Test _ALT (Ambient Light Temperature). + Test _ALP (Ambient Light Polling). + Test _ALR (Ambient Light Response). + Test _LID (Lid Status). + Test _GTF (Get Task File). + Test _GTM (Get Timing Mode). + Test _MBM (Memory Bandwidth Monitoring Data). + Test _UPC (USB Port Capabilities). + Test _UPD (User Presence Detect). + Test _UPP (User Presence Polling). + Test _GCP (Get Capabilities). + Test _GRT (Get Real Time). + Test _GWS (Get Wake Status). + Test _STP (Set Expired Timer Wake Policy). + Test _STV (Set Timer Value). + Test _TIP (Expired Timer Wake Policy). + Test _TIV (Timer Values). + Test _SBS (Smart Battery Subsystem). + Test _BCT (Battery Charge Time). + Test _BIF (Battery Information). + Test _BIX (Battery Information Extended). + Test _BMA (Battery Measurement Averaging). + Test _BMC (Battery Maintenance Control). + Test _BMD (Battery Maintenance Data). + Test _BMS (Battery Measurement Sampling Time). + Test _BST (Battery Status). + Test _BTP (Battery Trip Point). + Test _BTM (Battery Time). + Test _PCL (Power Consumer List). + Test _PIF (Power Source Information). + Test _PRL (Power Source Redundancy List). + Test _PSR (Power Source). + Test _GAI (Get Averaging Level). + Test _GHL (Get Harware Limit). + Test _PMD (Power Meter Devices). + Test _PMM (Power Meter Measurement). + Test _FIF (Fan Information). + Test _FPS (Fan Performance States). + Test _FSL (Fan Set Level). + Test _FST (Fan Status). + Test _ACx (Active Cooling). + Test _ART (Active Cooling Relationship Table). + Test _CRT (Critical Trip Point). + Test _DTI (Device Temperature Indication). + Test _HOT (Hot Temperature). + Test _NTT (Notification Temp Threshold). + Test _PSL (Passive List). + Test _PSV (Passive Temp). + Test _RTV (Relative Temp Values). + Test _SCP (Set Cooling Policy). + Test _TC1 (Thermal Constant 1). + Test _TC2 (Thermal Constant 2). + Test _TMP (Thermal Zone Current Temp). + Test _TPT (Trip Point Temperature). + Test _TRT (Thermal Relationship Table). + Test _TSP (Thermal Sampling Period). + Test _TST (Temperature Sensor Threshold). + Test _TZD (Thermal Zone Devices). + Test _TZM (Thermal Zone member). + Test _TZP (Thermal Zone Polling). + Test _PTS (Prepare to Sleep). + Test _TTS (Transition to State). + Test _S0 (System S0 State). + Test _S1 (System S1 State). + Test _S2 (System S2 State). + Test _S3 (System S3 State). + Test _S4 (System S4 State). + Test _S5 (System S5 State). + Test _WAK (System Wake). + Test _ADR (Return Unique ID for Device). + Test _BCL (Query List of Brightness Control Levels Supported). + Test _BCM (Set Brightness Level). + Test _BQC (Brightness Query Current Level). + Test _DCS (Return the Status of Output Device). + Test _DDC (Return the EDID for this Device). + Test _DSS (Device Set State). + Test _DGS (Query Graphics State). + Test _DOD (Enumerate All Devices Attached to Display Adapter). + Test _DOS (Enable/Disable Output Switching). + Test _GPD (Get POST Device). + Test _ROM (Get ROM Data). + Test _SPD (Set POST Device). + Test _VPO (Video POST Options). + Test _CBA (Configuration Base Address). + Test _IFT (IPMI Interface Type). + Test _SRV (IPMI Interface Revision). + pcc (1 test): + Processor Clocking Control (PCC) test. + spcr (1 test): + SPCR Serial Port Console Redirection Table test. + wmi (1 test): + Windows Management Instrumentation test. + Batch tests: acpiinfo (3 tests): Determine Kernel ACPI version. @@ -489,4 +704,4 @@ UEFI tests: Test UEFI RT service query variable info interface stress test. Test UEFI RT service get variable interface, invalid parameters. -Total of 403 tests +Total of 603 tests
Signed-off-by: Alex Hung <alex.hung@canonical.com> --- fwts-test/arg-help-0001/arg-help-0001.log | 1 + fwts-test/arg-help-0001/arg-help-0002.log | 1 + fwts-test/arg-help-0001/test-0001.sh | 2 +- .../arg-show-tests-0001/arg-show-tests-0001.log | 15 ++ .../arg-show-tests-full-0001.log | 217 ++++++++++++++++++++- 5 files changed, 234 insertions(+), 2 deletions(-)