fwts-test: sync up with the fwts method tests changed

Signed-off-by: Ivan Hu <ivan.hu@canonical.com>
---
 .../arg-show-tests-full-0001.log                   |  24 +-
 fwts-test/method-0001/method-0001.log              | 612 ++++++++++-----------
 2 files changed, 300 insertions(+), 336 deletions(-)

On 03/14/2016 04:39 PM, Ivan Hu wrote:
> Signed-off-by: Ivan Hu <ivan.hu@canonical.com>
> ---
>   .../arg-show-tests-full-0001.log                   |  24 +-
>   fwts-test/method-0001/method-0001.log              | 612 ++++++++++-----------
>   2 files changed, 300 insertions(+), 336 deletions(-)
>
> diff --git a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index 547d43e..8ea14ac 100644
> --- a/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/fwts-test/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -70,7 +70,7 @@ ACPI tests:
>     Validate MCFG PCI config space.
>    mchi            (1 test):
>     MCHI Management Controller Host Interface Table test.
> - method          (195 tests):
> + method          (189 tests):
>     Test Method Names.
>     Test _AEI.
>     Test _EVT (Event Method).
> @@ -116,7 +116,7 @@ ACPI tests:
>     Test _GLK (Global Lock).
>     Test _SEG (Segment).
>     Test _OFF (Set resource off).
> -  Test _ON  (Set resource on).
> +  Test _ON_ (Set resource on).
>     Test _DSW (Device Sleep Wake).
>     Test _IRC (In Rush Current).
>     Test _PRE (Power Resources for Enumeration).
> @@ -239,15 +239,9 @@ ACPI tests:
>     Test _TZM (Thermal Zone member).
>     Test _TZP (Thermal Zone Polling).
>     Test _GPE (General Purpose Events).
> -  Test _EC  (EC Offset Query).
> +  Test _EC_ (EC Offset Query).
>     Test _PTS (Prepare to Sleep).
>     Test _TTS (Transition to State).
> -  Test _S0  (System S0 State).
> -  Test _S1  (System S1 State).
> -  Test _S2  (System S2 State).
> -  Test _S3  (System S3 State).
> -  Test _S4  (System S4 State).
> -  Test _S5  (System S5 State).
>     Test _WAK (System Wake).
>     Test _ADR (Return Unique ID for Device).
>     Test _BCL (Query List of Brightness Control Levels Supported).
> @@ -418,7 +412,7 @@ Batch tests:
>     Validate MCFG PCI config space.
>    mchi            (1 test):
>     MCHI Management Controller Host Interface Table test.
> - method          (195 tests):
> + method          (189 tests):
>     Test Method Names.
>     Test _AEI.
>     Test _EVT (Event Method).
> @@ -464,7 +458,7 @@ Batch tests:
>     Test _GLK (Global Lock).
>     Test _SEG (Segment).
>     Test _OFF (Set resource off).
> -  Test _ON  (Set resource on).
> +  Test _ON_ (Set resource on).
>     Test _DSW (Device Sleep Wake).
>     Test _IRC (In Rush Current).
>     Test _PRE (Power Resources for Enumeration).
> @@ -587,15 +581,9 @@ Batch tests:
>     Test _TZM (Thermal Zone member).
>     Test _TZP (Thermal Zone Polling).
>     Test _GPE (General Purpose Events).
> -  Test _EC  (EC Offset Query).
> +  Test _EC_ (EC Offset Query).
>     Test _PTS (Prepare to Sleep).
>     Test _TTS (Transition to State).
> -  Test _S0  (System S0 State).
> -  Test _S1  (System S1 State).
> -  Test _S2  (System S2 State).
> -  Test _S3  (System S3 State).
> -  Test _S4  (System S4 State).
> -  Test _S5  (System S5 State).
>     Test _WAK (System Wake).
>     Test _ADR (Return Unique ID for Device).
>     Test _BCL (Query List of Brightness Control Levels Supported).
> diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log
> index fefdc5d..fc268d3 100644
> --- a/fwts-test/method-0001/method-0001.log
> +++ b/fwts-test/method-0001/method-0001.log
> @@ -1,37 +1,37 @@
>   method          method: ACPI DSDT Method Semantic tests.
>   method          ----------------------------------------------------------
> -method          Test 1 of 195: Test Method Names.
> +method          Test 1 of 189: Test Method Names.
>   method          Found 1061 Objects
>   method          PASSED: Test 1, Method names contain legal characters.
>   method
> -method          Test 2 of 195: Test _AEI.
> +method          Test 2 of 189: Test _AEI.
>   method          SKIPPED: Test 2, Skipping test for non-existant object
>   method          _AEI.
>   method
> -method          Test 3 of 195: Test _EVT (Event Method).
> +method          Test 3 of 189: Test _EVT (Event Method).
>   method          SKIPPED: Test 3, Skipping test for non-existant object
>   method          _EVT.
>   method
> -method          Test 4 of 195: Test _DLM (Device Lock Mutex).
> +method          Test 4 of 189: Test _DLM (Device Lock Mutex).
>   method          SKIPPED: Test 4, Skipping test for non-existant object
>   method          _DLM.
>   method
> -method          Test 5 of 195: Test _PIC (Inform AML of Interrupt Model).
> +method          Test 5 of 189: Test _PIC (Inform AML of Interrupt Model).
>   method          PASSED: Test 5, \_PIC returned no values as expected.
>   method          PASSED: Test 5, \_PIC returned no values as expected.
>   method          PASSED: Test 5, \_PIC returned no values as expected.
>   method
> -method          Test 6 of 195: Test _CID (Compatible ID).
> +method          Test 6 of 189: Test _CID (Compatible ID).
>   method          PASSED: Test 6, \_SB_.PCI0._CID returned an integer
>   method          0x030ad041 (EISA ID PNP0A03).
>   method          PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an
>   method          integer 0x010cd041 (EISA ID PNP0C01).
>   method
> -method          Test 7 of 195: Test _DDN (DOS Device Name).
> +method          Test 7 of 189: Test _DDN (DOS Device Name).
>   method          SKIPPED: Test 7, Skipping test for non-existant object
>   method          _DDN.
>   method
> -method          Test 8 of 195: Test _HID (Hardware ID).
> +method          Test 8 of 189: Test _HID (Hardware ID).
>   method          PASSED: Test 8, \_SB_.AMW0._HID returned a string
>   method          'PNP0C14' as expected.
>   method          PASSED: Test 8, \_SB_.LID0._HID returned an integer
> @@ -85,31 +85,31 @@ method          integer 0x0303d041 (EISA ID PNP0303).
>   method          PASSED: Test 8, \_SB_.PCI0.LPCB.PS2M._HID returned an
>   method          integer 0x130fd041 (EISA ID PNP0F13).
>   method
> -method          Test 9 of 195: Test _HRV (Hardware Revision Number).
> +method          Test 9 of 189: Test _HRV (Hardware Revision Number).
>   method          SKIPPED: Test 9, Skipping test for non-existant object
>   method          _HRV.
>   method
> -method          Test 10 of 195: Test _MLS (Multiple Language String).
> +method          Test 10 of 189: Test _MLS (Multiple Language String).
>   method          SKIPPED: Test 10, Skipping test for non-existant object
>   method          _MLS.
>   method
> -method          Test 11 of 195: Test _PLD (Physical Device Location).
> +method          Test 11 of 189: Test _PLD (Physical Device Location).
>   method          SKIPPED: Test 11, Skipping test for non-existant object
>   method          _PLD.
>   method
> -method          Test 12 of 195: Test _SUB (Subsystem ID).
> +method          Test 12 of 189: Test _SUB (Subsystem ID).
>   method          SKIPPED: Test 12, Skipping test for non-existant object
>   method          _SUB.
>   method
> -method          Test 13 of 195: Test _SUN (Slot User Number).
> +method          Test 13 of 189: Test _SUN (Slot User Number).
>   method          SKIPPED: Test 13, Skipping test for non-existant object
>   method          _SUN.
>   method
> -method          Test 14 of 195: Test _STR (String).
> +method          Test 14 of 189: Test _STR (String).
>   method          SKIPPED: Test 14, Skipping test for non-existant object
>   method          _STR.
>   method
> -method          Test 15 of 195: Test _UID (Unique ID).
> +method          Test 15 of 189: Test _UID (Unique ID).
>   method          PASSED: Test 15, \_SB_.AMW0._UID correctly returned sane
>   method          looking value 0x00000000.
>   method          PASSED: Test 15, \_SB_.PCI0.PDRC._UID correctly returned
> @@ -135,11 +135,11 @@ method          returned sane looking value 0x00000002.
>   method          PASSED: Test 15, \_SB_.PCI0.LPCB.BAT1._UID correctly
>   method          returned sane looking value 0x00000001.
>   method
> -method          Test 16 of 195: Test _CDM (Clock Domain).
> +method          Test 16 of 189: Test _CDM (Clock Domain).
>   method          SKIPPED: Test 16, Skipping test for non-existant object
>   method          _CDM.
>   method
> -method          Test 17 of 195: Test _CRS (Current Resource Settings).
> +method          Test 17 of 189: Test _CRS (Current Resource Settings).
>   method          PASSED: Test 17, \_SB_.PCI0._CRS (WORD Address Space
>   method          Descriptor) looks sane.
>   method          PASSED: Test 17, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
> @@ -183,11 +183,11 @@ method          Descriptor) looks sane.
>   method          PASSED: Test 17, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
>   method          Descriptor) looks sane.
>   method
> -method          Test 18 of 195: Test _DSD (Device Specific Data).
> +method          Test 18 of 189: Test _DSD (Device Specific Data).
>   method          SKIPPED: Test 18, Skipping test for non-existant object
>   method          _DSD.
>   method
> -method          Test 19 of 195: Test _DIS (Disable).
> +method          Test 19 of 189: Test _DIS (Disable).
>   method          PASSED: Test 19, \_SB_.PCI0.LPCB.LNKA._DIS returned no
>   method          values as expected.
>   method          PASSED: Test 19, \_SB_.PCI0.LPCB.LNKB._DIS returned no
> @@ -205,24 +205,24 @@ method          values as expected.
>   method          PASSED: Test 19, \_SB_.PCI0.LPCB.LNKH._DIS returned no
>   method          values as expected.
>   method
> -method          Test 20 of 195: Test _DMA (Direct Memory Access).
> +method          Test 20 of 189: Test _DMA (Direct Memory Access).
>   method          SKIPPED: Test 20, Skipping test for non-existant object
>   method          _DMA.
>   method
> -method          Test 21 of 195: Test _FIX (Fixed Register Resource
> +method          Test 21 of 189: Test _FIX (Fixed Register Resource
>   method          Provider).
>   method          SKIPPED: Test 21, Skipping test for non-existant object
>   method          _FIX.
>   method
> -method          Test 22 of 195: Test _GSB (Global System Interrupt Base).
> +method          Test 22 of 189: Test _GSB (Global System Interrupt Base).
>   method          SKIPPED: Test 22, Skipping test for non-existant object
>   method          _GSB.
>   method
> -method          Test 23 of 195: Test _HPP (Hot Plug Parameters).
> +method          Test 23 of 189: Test _HPP (Hot Plug Parameters).
>   method          SKIPPED: Test 23, Skipping test for non-existant object
>   method          _HPP.
>   method
> -method          Test 24 of 195: Test _PRS (Possible Resource Settings).
> +method          Test 24 of 189: Test _PRS (Possible Resource Settings).
>   method          PASSED: Test 24, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
>   method          Descriptor) looks sane.
>   method          PASSED: Test 24, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
> @@ -240,7 +240,7 @@ method          Descriptor) looks sane.
>   method          PASSED: Test 24, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
>   method          Descriptor) looks sane.
>   method
> -method          Test 25 of 195: Test _PRT (PCI Routing Table).
> +method          Test 25 of 189: Test _PRT (PCI Routing Table).
>   method          PASSED: Test 25, \_SB_.PCI0._PRT correctly returned a sane
>   method          looking package.
>   method          PASSED: Test 25, \_SB_.PCI0.PEGP._PRT correctly returned a
> @@ -260,51 +260,51 @@ method          sane looking package.
>   method          PASSED: Test 25, \_SB_.PCI0.PCIB._PRT correctly returned a
>   method          sane looking package.
>   method
> -method          Test 26 of 195: Test _PXM (Proximity).
> +method          Test 26 of 189: Test _PXM (Proximity).
>   method          SKIPPED: Test 26, Skipping test for non-existant object
>   method          _PXM.
>   method
> -method          Test 27 of 195: Test _CCA (Cache Coherency Attribute).
> +method          Test 27 of 189: Test _CCA (Cache Coherency Attribute).
>   method          SKIPPED: Test 27, Skipping test for non-existant object
>   method          _CCA.
>   method
> -method          Test 28 of 195: Test _EDL (Eject Device List).
> +method          Test 28 of 189: Test _EDL (Eject Device List).
>   method          SKIPPED: Test 28, Skipping test for non-existant object
>   method          _EDL.
>   method
> -method          Test 29 of 195: Test _EJD (Ejection Dependent Device).
> +method          Test 29 of 189: Test _EJD (Ejection Dependent Device).
>   method          SKIPPED: Test 29, Skipping test for non-existant object
>   method          _EJD.
>   method
> -method          Test 30 of 195: Test _EJ0 (Eject).
> +method          Test 30 of 189: Test _EJ0 (Eject).
>   method          SKIPPED: Test 30, Skipping test for non-existant object
>   method          _EJ0.
>   method
> -method          Test 31 of 195: Test _EJ1 (Eject).
> +method          Test 31 of 189: Test _EJ1 (Eject).
>   method          SKIPPED: Test 31, Skipping test for non-existant object
>   method          _EJ1.
>   method
> -method          Test 32 of 195: Test _EJ2 (Eject).
> +method          Test 32 of 189: Test _EJ2 (Eject).
>   method          SKIPPED: Test 32, Skipping test for non-existant object
>   method          _EJ2.
>   method
> -method          Test 33 of 195: Test _EJ3 (Eject).
> +method          Test 33 of 189: Test _EJ3 (Eject).
>   method          SKIPPED: Test 33, Skipping test for non-existant object
>   method          _EJ3.
>   method
> -method          Test 34 of 195: Test _EJ4 (Eject).
> +method          Test 34 of 189: Test _EJ4 (Eject).
>   method          SKIPPED: Test 34, Skipping test for non-existant object
>   method          _EJ4.
>   method
> -method          Test 35 of 195: Test _LCK (Lock).
> +method          Test 35 of 189: Test _LCK (Lock).
>   method          SKIPPED: Test 35, Skipping test for non-existant object
>   method          _LCK.
>   method
> -method          Test 36 of 195: Test _RMV (Remove).
> +method          Test 36 of 189: Test _RMV (Remove).
>   method          PASSED: Test 36, \_SB_.PCI0.RP03.PXSX._RMV correctly
>   method          returned sane looking value 0x00000001.
>   method
> -method          Test 37 of 195: Test _STA (Status).
> +method          Test 37 of 189: Test _STA (Status).
>   method          PASSED: Test 37, \_SB_.PCI0.PEGP.VGA_._STA correctly
>   method          returned sane looking value 0x0000000f.
>   method          PASSED: Test 37, \_SB_.PCI0.LPCB.LNKA._STA correctly
> @@ -328,73 +328,73 @@ method          returned sane looking value 0x00000000.
>   method          PASSED: Test 37, \_SB_.PCI0.LPCB.BAT1._STA correctly
>   method          returned sane looking value 0x0000001f.
>   method
> -method          Test 38 of 195: Test _DEP (Operational Region
> +method          Test 38 of 189: Test _DEP (Operational Region
>   method          Dependencies).
>   method          SKIPPED: Test 38, Skipping test for non-existant object
>   method          _DEP.
>   method
> -method          Test 39 of 195: Test _BDN (BIOS Dock Name).
> +method          Test 39 of 189: Test _BDN (BIOS Dock Name).
>   method          SKIPPED: Test 39, Skipping test for non-existant object
>   method          _BDN.
>   method
> -method          Test 40 of 195: Test _BBN (Base Bus Number).
> +method          Test 40 of 189: Test _BBN (Base Bus Number).
>   method          SKIPPED: Test 40, Skipping test for non-existant object
>   method          _BBN.
>   method
> -method          Test 41 of 195: Test _DCK (Dock).
> +method          Test 41 of 189: Test _DCK (Dock).
>   method          SKIPPED: Test 41, Skipping test for non-existant object
>   method          _DCK.
>   method
> -method          Test 42 of 195: Test _INI (Initialize).
> +method          Test 42 of 189: Test _INI (Initialize).
>   method          PASSED: Test 42, \_SB_._INI returned no values as
>   method          expected.
>   method
> -method          Test 43 of 195: Test _GLK (Global Lock).
> +method          Test 43 of 189: Test _GLK (Global Lock).
>   method          SKIPPED: Test 43, Skipping test for non-existant object
>   method          _GLK.
>   method
> -method          Test 44 of 195: Test _SEG (Segment).
> +method          Test 44 of 189: Test _SEG (Segment).
>   method          SKIPPED: Test 44, Skipping test for non-existant object
>   method          _SEG.
>   method
> -method          Test 45 of 195: Test _OFF (Set resource off).
> +method          Test 45 of 189: Test _OFF (Set resource off).
>   method          SKIPPED: Test 45, Skipping test for non-existant object
>   method          _OFF.
>   method
> -method          Test 46 of 195: Test _ON (Set resource on).
> +method          Test 46 of 189: Test _ON_ (Set resource on).
>   method          SKIPPED: Test 46, Skipping test for non-existant object
> -method          _ON.
> +method          _ON_.
>   method
> -method          Test 47 of 195: Test _DSW (Device Sleep Wake).
> +method          Test 47 of 189: Test _DSW (Device Sleep Wake).
>   method          SKIPPED: Test 47, Skipping test for non-existant object
>   method          _DSW.
>   method
> -method          Test 48 of 195: Test _IRC (In Rush Current).
> +method          Test 48 of 189: Test _IRC (In Rush Current).
>   method          SKIPPED: Test 48, Skipping test for non-existant object
>   method          _IRC.
>   method
> -method          Test 49 of 195: Test _PRE (Power Resources for
> +method          Test 49 of 189: Test _PRE (Power Resources for
>   method          Enumeration).
>   method          SKIPPED: Test 49, Skipping test for non-existant object
>   method          _PRE.
>   method
> -method          Test 50 of 195: Test _PR0 (Power Resources for D0).
> +method          Test 50 of 189: Test _PR0 (Power Resources for D0).
>   method          SKIPPED: Test 50, Skipping test for non-existant object
>   method          _PR0.
>   method
> -method          Test 51 of 195: Test _PR1 (Power Resources for D1).
> +method          Test 51 of 189: Test _PR1 (Power Resources for D1).
>   method          SKIPPED: Test 51, Skipping test for non-existant object
>   method          _PR1.
>   method
> -method          Test 52 of 195: Test _PR2 (Power Resources for D2).
> +method          Test 52 of 189: Test _PR2 (Power Resources for D2).
>   method          SKIPPED: Test 52, Skipping test for non-existant object
>   method          _PR2.
>   method
> -method          Test 53 of 195: Test _PR3 (Power Resources for D3).
> +method          Test 53 of 189: Test _PR3 (Power Resources for D3).
>   method          SKIPPED: Test 53, Skipping test for non-existant object
>   method          _PR3.
>   method
> -method          Test 54 of 195: Test _PRW (Power Resources for Wake).
> +method          Test 54 of 189: Test _PRW (Power Resources for Wake).
>   method          PASSED: Test 54, \_SB_.PCI0.HDEF._PRW correctly returned a
>   method          sane looking package.
>   method          PASSED: Test 54, \_SB_.PCI0.RP03.PXSX._PRW correctly
> @@ -414,34 +414,34 @@ method          sane looking package.
>   method          PASSED: Test 54, \_SB_.PCI0.EHC2._PRW correctly returned a
>   method          sane looking package.
>   method
> -method          Test 55 of 195: Test _PS0 (Power State 0).
> +method          Test 55 of 189: Test _PS0 (Power State 0).
>   method          PASSED: Test 55, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
>   method          values as expected.
>   method          PASSED: Test 55, \_PS0 returned no values as expected.
>   method
> -method          Test 56 of 195: Test _PS1 (Power State 1).
> +method          Test 56 of 189: Test _PS1 (Power State 1).
>   method          PASSED: Test 56, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
>   method          values as expected.
>   method
> -method          Test 57 of 195: Test _PS2 (Power State 2).
> +method          Test 57 of 189: Test _PS2 (Power State 2).
>   method          SKIPPED: Test 57, Skipping test for non-existant object
>   method          _PS2.
>   method
> -method          Test 58 of 195: Test _PS3 (Power State 3).
> +method          Test 58 of 189: Test _PS3 (Power State 3).
>   method          PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
>   method          values as expected.
>   method          PASSED: Test 58, \_PS3 returned no values as expected.
>   method
> -method          Test 59 of 195: Test _PSC (Power State Current).
> +method          Test 59 of 189: Test _PSC (Power State Current).
>   method          PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PSC correctly
>   method          returned an integer.
>   method          PASSED: Test 59, \_PSC correctly returned an integer.
>   method
> -method          Test 60 of 195: Test _PSE (Power State for Enumeration).
> +method          Test 60 of 189: Test _PSE (Power State for Enumeration).
>   method          SKIPPED: Test 60, Skipping test for non-existant object
>   method          _PSE.
>   method
> -method          Test 61 of 195: Test _PSW (Power State Wake).
> +method          Test 61 of 189: Test _PSW (Power State Wake).
>   method          PASSED: Test 61, \_SB_.PCI0.USB1._PSW returned no values
>   method          as expected.
>   method          PASSED: Test 61, \_SB_.PCI0.USB2._PSW returned no values
> @@ -453,15 +453,15 @@ method          as expected.
>   method          PASSED: Test 61, \_SB_.PCI0.USB5._PSW returned no values
>   method          as expected.
>   method
> -method          Test 62 of 195: Test _S1D (S1 Device State).
> +method          Test 62 of 189: Test _S1D (S1 Device State).
>   method          SKIPPED: Test 62, Skipping test for non-existant object
>   method          _S1D.
>   method
> -method          Test 63 of 195: Test _S2D (S2 Device State).
> +method          Test 63 of 189: Test _S2D (S2 Device State).
>   method          SKIPPED: Test 63, Skipping test for non-existant object
>   method          _S2D.
>   method
> -method          Test 64 of 195: Test _S3D (S3 Device State).
> +method          Test 64 of 189: Test _S3D (S3 Device State).
>   method          PASSED: Test 64, \_SB_.PCI0._S3D correctly returned an
>   method          integer.
>   method          PASSED: Test 64, \_SB_.PCI0.USB1._S3D correctly returned
> @@ -479,7 +479,7 @@ method          an integer.
>   method          PASSED: Test 64, \_SB_.PCI0.EHC2._S3D correctly returned
>   method          an integer.
>   method
> -method          Test 65 of 195: Test _S4D (S4 Device State).
> +method          Test 65 of 189: Test _S4D (S4 Device State).
>   method          PASSED: Test 65, \_SB_.PCI0._S4D correctly returned an
>   method          integer.
>   method          PASSED: Test 65, \_SB_.PCI0.USB1._S4D correctly returned
> @@ -497,132 +497,132 @@ method          an integer.
>   method          PASSED: Test 65, \_SB_.PCI0.EHC2._S4D correctly returned
>   method          an integer.
>   method
> -method          Test 66 of 195: Test _S0W (S0 Device Wake State).
> +method          Test 66 of 189: Test _S0W (S0 Device Wake State).
>   method          SKIPPED: Test 66, Skipping test for non-existant object
>   method          _S0W.
>   method
> -method          Test 67 of 195: Test _S1W (S1 Device Wake State).
> +method          Test 67 of 189: Test _S1W (S1 Device Wake State).
>   method          SKIPPED: Test 67, Skipping test for non-existant object
>   method          _S1W.
>   method
> -method          Test 68 of 195: Test _S2W (S2 Device Wake State).
> +method          Test 68 of 189: Test _S2W (S2 Device Wake State).
>   method          SKIPPED: Test 68, Skipping test for non-existant object
>   method          _S2W.
>   method
> -method          Test 69 of 195: Test _S3W (S3 Device Wake State).
> +method          Test 69 of 189: Test _S3W (S3 Device Wake State).
>   method          SKIPPED: Test 69, Skipping test for non-existant object
>   method          _S3W.
>   method
> -method          Test 70 of 195: Test _S4W (S4 Device Wake State).
> +method          Test 70 of 189: Test _S4W (S4 Device Wake State).
>   method          SKIPPED: Test 70, Skipping test for non-existant object
>   method          _S4W.
>   method
> -method          Test 71 of 195: Test _RST (Device Reset).
> +method          Test 71 of 189: Test _RST (Device Reset).
>   method          SKIPPED: Test 71, Skipping test for non-existant object
>   method          _RST.
>   method
> -method          Test 72 of 195: Test _PRR (Power Resource for Reset).
> +method          Test 72 of 189: Test _PRR (Power Resource for Reset).
>   method          SKIPPED: Test 72, Skipping test for non-existant object
>   method          _PRR.
>   method
> -method          Test 73 of 195: Test _S0_ (S0 System State).
> +method          Test 73 of 189: Test _S0_ (S0 System State).
>   method          \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
>   method          \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
>   method          PASSED: Test 73, \_S0_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 74 of 195: Test _S1_ (S1 System State).
> +method          Test 74 of 189: Test _S1_ (S1 System State).
>   method          SKIPPED: Test 74, Skipping test for non-existant object
>   method          _S1_.
>   method
> -method          Test 75 of 195: Test _S2_ (S2 System State).
> +method          Test 75 of 189: Test _S2_ (S2 System State).
>   method          SKIPPED: Test 75, Skipping test for non-existant object
>   method          _S2_.
>   method
> -method          Test 76 of 195: Test _S3_ (S3 System State).
> +method          Test 76 of 189: Test _S3_ (S3 System State).
>   method          \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
>   method          \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
>   method          PASSED: Test 76, \_S3_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 77 of 195: Test _S4_ (S4 System State).
> +method          Test 77 of 189: Test _S4_ (S4 System State).
>   method          \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
>   method          \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
>   method          PASSED: Test 77, \_S4_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 78 of 195: Test _S5_ (S5 System State).
> +method          Test 78 of 189: Test _S5_ (S5 System State).
>   method          \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
>   method          \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
>   method          PASSED: Test 78, \_S5_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 79 of 195: Test _SWS (System Wake Source).
> +method          Test 79 of 189: Test _SWS (System Wake Source).
>   method          SKIPPED: Test 79, Skipping test for non-existant object
>   method          _SWS.
>   method
> -method          Test 80 of 195: Test _PSS (Performance Supported States).
> +method          Test 80 of 189: Test _PSS (Performance Supported States).
>   method          SKIPPED: Test 80, Skipping test for non-existant object
>   method          _PSS.
>   method
> -method          Test 81 of 195: Test _CPC (Continuous Performance
> +method          Test 81 of 189: Test _CPC (Continuous Performance
>   method          Control).
>   method          SKIPPED: Test 81, Skipping test for non-existant object
>   method          _CPC.
>   method
> -method          Test 82 of 195: Test _CSD (C State Dependencies).
> +method          Test 82 of 189: Test _CSD (C State Dependencies).
>   method          SKIPPED: Test 82, Skipping test for non-existant object
>   method          _CSD.
>   method
> -method          Test 83 of 195: Test _CST (C States).
> +method          Test 83 of 189: Test _CST (C States).
>   method          SKIPPED: Test 83, Skipping test for non-existant object
>   method          _CST.
>   method
> -method          Test 84 of 195: Test _PCT (Performance Control).
> +method          Test 84 of 189: Test _PCT (Performance Control).
>   method          SKIPPED: Test 84, Skipping test for non-existant object
>   method          _PCT.
>   method
> -method          Test 85 of 195: Test _PDL (P-State Depth Limit).
> +method          Test 85 of 189: Test _PDL (P-State Depth Limit).
>   method          SKIPPED: Test 85, Skipping test for non-existant object
>   method          _PDL.
>   method
> -method          Test 86 of 195: Test _PPC (Performance Present
> +method          Test 86 of 189: Test _PPC (Performance Present
>   method          Capabilities).
>   method          SKIPPED: Test 86, Skipping test for non-existant object
>   method          _PPC.
>   method
> -method          Test 87 of 195: Test _PPE (Polling for Platform Error).
> +method          Test 87 of 189: Test _PPE (Polling for Platform Error).
>   method          SKIPPED: Test 87, Skipping test for non-existant object
>   method          _PPE.
>   method
> -method          Test 88 of 195: Test _PSD (Power State Dependencies).
> +method          Test 88 of 189: Test _PSD (Power State Dependencies).
>   method          SKIPPED: Test 88, Skipping test for non-existant object
>   method          _PSD.
>   method
> -method          Test 89 of 195: Test _PTC (Processor Throttling Control).
> +method          Test 89 of 189: Test _PTC (Processor Throttling Control).
>   method          PASSED: Test 89, \_PR_.CPU0._PTC correctly returned a sane
>   method          looking package.
>   method          PASSED: Test 89, \_PR_.CPU1._PTC correctly returned a sane
>   method          looking package.
>   method
> -method          Test 90 of 195: Test _TDL (T-State Depth Limit).
> +method          Test 90 of 189: Test _TDL (T-State Depth Limit).
>   method          SKIPPED: Test 90, Skipping test for non-existant object
>   method          _TDL.
>   method
> -method          Test 91 of 195: Test _TPC (Throttling Present
> +method          Test 91 of 189: Test _TPC (Throttling Present
>   method          Capabilities).
>   method          PASSED: Test 91, \_PR_.CPU0._TPC correctly returned an
>   method          integer.
>   method          PASSED: Test 91, \_PR_.CPU1._TPC correctly returned an
>   method          integer.
>   method
> -method          Test 92 of 195: Test _TSD (Throttling State Dependencies).
> +method          Test 92 of 189: Test _TSD (Throttling State Dependencies).
>   method          PASSED: Test 92, \_PR_.CPU0._TSD correctly returned a sane
>   method          looking package.
>   method          PASSED: Test 92, \_PR_.CPU1._TSD correctly returned a sane
>   method          looking package.
>   method
> -method          Test 93 of 195: Test _TSS (Throttling Supported States).
> +method          Test 93 of 189: Test _TSS (Throttling Supported States).
>   method          \_PR_.CPU0._TSS values:
>   method          T-State  CPU     Power   Latency  Control  Status
>   method                   Freq    (mW)    (usecs)
> @@ -650,53 +650,53 @@ method              7     13%      125        0      09      00
>   method          PASSED: Test 93, \_PR_.CPU1._TSS correctly returned a sane
>   method          looking package.
>   method
> -method          Test 94 of 195: Test _LPI (Low Power Idle States).
> +method          Test 94 of 189: Test _LPI (Low Power Idle States).
>   method          SKIPPED: Test 94, Skipping test for non-existant object
>   method          _LPI.
>   method
> -method          Test 95 of 195: Test _RDI (Resource Dependencies for
> +method          Test 95 of 189: Test _RDI (Resource Dependencies for
>   method          Idle).
>   method          SKIPPED: Test 95, Skipping test for non-existant object
>   method          _RDI.
>   method
> -method          Test 96 of 195: Test _PUR (Processor Utilization Request).
> +method          Test 96 of 189: Test _PUR (Processor Utilization Request).
>   method          SKIPPED: Test 96, Skipping test for non-existant object
>   method          _PUR.
>   method
> -method          Test 97 of 195: Test _MSG (Message).
> +method          Test 97 of 189: Test _MSG (Message).
>   method          SKIPPED: Test 97, Skipping test for non-existant object
>   method          _MSG.
>   method
> -method          Test 98 of 195: Test _SST (System Status).
> +method          Test 98 of 189: Test _SST (System Status).
>   method          SKIPPED: Test 98, Skipping test for non-existant object
>   method          _SST.
>   method
> -method          Test 99 of 195: Test _ALC (Ambient Light Colour
> +method          Test 99 of 189: Test _ALC (Ambient Light Colour
>   method          Chromaticity).
>   method          SKIPPED: Test 99, Skipping test for non-existant object
>   method          _ALC.
>   method
> -method          Test 100 of 195: Test _ALI (Ambient Light Illuminance).
> +method          Test 100 of 189: Test _ALI (Ambient Light Illuminance).
>   method          SKIPPED: Test 100, Skipping test for non-existant object
>   method          _ALI.
>   method
> -method          Test 101 of 195: Test _ALT (Ambient Light Temperature).
> +method          Test 101 of 189: Test _ALT (Ambient Light Temperature).
>   method          SKIPPED: Test 101, Skipping test for non-existant object
>   method          _ALT.
>   method
> -method          Test 102 of 195: Test _ALP (Ambient Light Polling).
> +method          Test 102 of 189: Test _ALP (Ambient Light Polling).
>   method          SKIPPED: Test 102, Skipping test for non-existant object
>   method          _ALP.
>   method
> -method          Test 103 of 195: Test _ALR (Ambient Light Response).
> +method          Test 103 of 189: Test _ALR (Ambient Light Response).
>   method          SKIPPED: Test 103, Skipping test for non-existant object
>   method          _ALR.
>   method
> -method          Test 104 of 195: Test _LID (Lid Status).
> +method          Test 104 of 189: Test _LID (Lid Status).
>   method          PASSED: Test 104, \_SB_.LID0._LID correctly returned sane
>   method          looking value 0x00000000.
>   method
> -method          Test 105 of 195: Test _GTF (Get Task File).
> +method          Test 105 of 189: Test _GTF (Get Task File).
>   method          PASSED: Test 105, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly
>   method          returned a sane looking buffer.
>   method          PASSED: Test 105, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly
> @@ -711,165 +711,165 @@ method          FAILED [MEDIUM] Method_GTFBadBufferSize: Test 105,
>   method          \_SB_.PCI0.SATA.PRT2._GTF should return a buffer with size
>   method          of multiple of 7.
>   method
> -method          Test 106 of 195: Test _GTM (Get Timing Mode).
> +method          Test 106 of 189: Test _GTM (Get Timing Mode).
>   method          PASSED: Test 106, \_SB_.PCI0.PATA.PRID._GTM correctly
>   method          returned a sane looking buffer.
>   method
> -method          Test 107 of 195: Test _MBM (Memory Bandwidth Monitoring
> +method          Test 107 of 189: Test _MBM (Memory Bandwidth Monitoring
>   method          Data).
>   method          SKIPPED: Test 107, Skipping test for non-existant object
>   method          _MBM.
>   method
> -method          Test 108 of 195: Test _UPC (USB Port Capabilities).
> +method          Test 108 of 189: Test _UPC (USB Port Capabilities).
>   method          SKIPPED: Test 108, Skipping test for non-existant object
>   method          _UPC.
>   method
> -method          Test 109 of 195: Test _UPD (User Presence Detect).
> +method          Test 109 of 189: Test _UPD (User Presence Detect).
>   method          SKIPPED: Test 109, Skipping test for non-existant object
>   method          _UPD.
>   method
> -method          Test 110 of 195: Test _UPP (User Presence Polling).
> +method          Test 110 of 189: Test _UPP (User Presence Polling).
>   method          SKIPPED: Test 110, Skipping test for non-existant object
>   method          _UPP.
>   method
> -method          Test 111 of 195: Test _GCP (Get Capabilities).
> +method          Test 111 of 189: Test _GCP (Get Capabilities).
>   method          SKIPPED: Test 111, Skipping test for non-existant object
>   method          _GCP.
>   method
> -method          Test 112 of 195: Test _GRT (Get Real Time).
> +method          Test 112 of 189: Test _GRT (Get Real Time).
>   method          SKIPPED: Test 112, Skipping test for non-existant object
>   method          _GRT.
>   method
> -method          Test 113 of 195: Test _GWS (Get Wake Status).
> +method          Test 113 of 189: Test _GWS (Get Wake Status).
>   method          SKIPPED: Test 113, Skipping test for non-existant object
>   method          _GWS.
>   method
> -method          Test 114 of 195: Test _CWS (Clear Wake Status).
> +method          Test 114 of 189: Test _CWS (Clear Wake Status).
>   method          SKIPPED: Test 114, Skipping test for non-existant object
>   method          _CWS.
>   method
> -method          Test 115 of 195: Test _STP (Set Expired Timer Wake
> +method          Test 115 of 189: Test _STP (Set Expired Timer Wake
>   method          Policy).
>   method          SKIPPED: Test 115, Skipping test for non-existant object
>   method          _STP.
>   method
> -method          Test 116 of 195: Test _STV (Set Timer Value).
> +method          Test 116 of 189: Test _STV (Set Timer Value).
>   method          SKIPPED: Test 116, Skipping test for non-existant object
>   method          _STV.
>   method
> -method          Test 117 of 195: Test _TIP (Expired Timer Wake Policy).
> +method          Test 117 of 189: Test _TIP (Expired Timer Wake Policy).
>   method          SKIPPED: Test 117, Skipping test for non-existant object
>   method          _TIP.
>   method
> -method          Test 118 of 195: Test _TIV (Timer Values).
> +method          Test 118 of 189: Test _TIV (Timer Values).
>   method          SKIPPED: Test 118, Skipping test for non-existant object
>   method          _TIV.
>   method
> -method          Test 119 of 195: Test _SBS (Smart Battery Subsystem).
> +method          Test 119 of 189: Test _SBS (Smart Battery Subsystem).
>   method          SKIPPED: Test 119, Skipping test for non-existant object
>   method          _SBS.
>   method
> -method          Test 120 of 195: Test _BCT (Battery Charge Time).
> +method          Test 120 of 189: Test _BCT (Battery Charge Time).
>   method          SKIPPED: Test 120, Skipping test for non-existant object
>   method          _BCT.
>   method
> -method          Test 121 of 195: Test _BIF (Battery Information).
> +method          Test 121 of 189: Test _BIF (Battery Information).
>   method          PASSED: Test 121, \_SB_.PCI0.LPCB.BAT1._BIF correctly
>   method          returned a sane looking package.
>   method
> -method          Test 122 of 195: Test _BIX (Battery Information Extended).
> +method          Test 122 of 189: Test _BIX (Battery Information Extended).
>   method          SKIPPED: Test 122, Skipping test for non-existant object
>   method          _BIX.
>   method
> -method          Test 123 of 195: Test _BMA (Battery Measurement
> +method          Test 123 of 189: Test _BMA (Battery Measurement
>   method          Averaging).
>   method          SKIPPED: Test 123, Skipping test for non-existant object
>   method          _BMA.
>   method
> -method          Test 124 of 195: Test _BMC (Battery Maintenance Control).
> +method          Test 124 of 189: Test _BMC (Battery Maintenance Control).
>   method          SKIPPED: Test 124, Skipping test for non-existant object
>   method          _BMC.
>   method
> -method          Test 125 of 195: Test _BMD (Battery Maintenance Data).
> +method          Test 125 of 189: Test _BMD (Battery Maintenance Data).
>   method          SKIPPED: Test 125, Skipping test for non-existant object
>   method          _BMD.
>   method
> -method          Test 126 of 195: Test _BMS (Battery Measurement Sampling
> +method          Test 126 of 189: Test _BMS (Battery Measurement Sampling
>   method          Time).
>   method          SKIPPED: Test 126, Skipping test for non-existant object
>   method          _BMS.
>   method
> -method          Test 127 of 195: Test _BST (Battery Status).
> +method          Test 127 of 189: Test _BST (Battery Status).
>   method          PASSED: Test 127, \_SB_.PCI0.LPCB.BAT1._BST correctly
>   method          returned a sane looking package.
>   method
> -method          Test 128 of 195: Test _BTP (Battery Trip Point).
> +method          Test 128 of 189: Test _BTP (Battery Trip Point).
>   method          SKIPPED: Test 128, Skipping test for non-existant object
>   method          _BTP.
>   method
> -method          Test 129 of 195: Test _BTH (Battery Throttle Limit).
> +method          Test 129 of 189: Test _BTH (Battery Throttle Limit).
>   method          SKIPPED: Test 129, Skipping test for non-existant object
>   method          _BTH.
>   method
> -method          Test 130 of 195: Test _BTM (Battery Time).
> +method          Test 130 of 189: Test _BTM (Battery Time).
>   method          SKIPPED: Test 130, Skipping test for non-existant object
>   method          _BTM.
>   method
> -method          Test 131 of 195: Test _PCL (Power Consumer List).
> +method          Test 131 of 189: Test _PCL (Power Consumer List).
>   method          PASSED: Test 131, \_SB_.PCI0.LPCB.ACAD._PCL returned a
>   method          sane package of 1 references.
>   method          PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._PCL returned a
>   method          sane package of 1 references.
>   method
> -method          Test 132 of 195: Test _PIF (Power Source Information).
> +method          Test 132 of 189: Test _PIF (Power Source Information).
>   method          SKIPPED: Test 132, Skipping test for non-existant object
>   method          _PIF.
>   method
> -method          Test 133 of 195: Test _PRL (Power Source Redundancy List).
> +method          Test 133 of 189: Test _PRL (Power Source Redundancy List).
>   method          SKIPPED: Test 133, Skipping test for non-existant object
>   method          _PRL.
>   method
> -method          Test 134 of 195: Test _PSR (Power Source).
> +method          Test 134 of 189: Test _PSR (Power Source).
>   method          PASSED: Test 134, \_SB_.PCI0.LPCB.ACAD._PSR correctly
>   method          returned sane looking value 0x00000000.
>   method
> -method          Test 135 of 195: Test _GAI (Get Averaging Level).
> +method          Test 135 of 189: Test _GAI (Get Averaging Level).
>   method          SKIPPED: Test 135, Skipping test for non-existant object
>   method          _GAI.
>   method
> -method          Test 136 of 195: Test _GHL (Get Harware Limit).
> +method          Test 136 of 189: Test _GHL (Get Harware Limit).
>   method          SKIPPED: Test 136, Skipping test for non-existant object
>   method          _GHL.
>   method
> -method          Test 137 of 195: Test _PMC (Power Meter Capabilities).
> +method          Test 137 of 189: Test _PMC (Power Meter Capabilities).
>   method          SKIPPED: Test 137, Skipping test for non-existant object
>   method          _PMC.
>   method
> -method          Test 138 of 195: Test _PMD (Power Meter Devices).
> +method          Test 138 of 189: Test _PMD (Power Meter Devices).
>   method          SKIPPED: Test 138, Skipping test for non-existant object
>   method          _PMD.
>   method
> -method          Test 139 of 195: Test _PMM (Power Meter Measurement).
> +method          Test 139 of 189: Test _PMM (Power Meter Measurement).
>   method          SKIPPED: Test 139, Skipping test for non-existant object
>   method          _PMM.
>   method
> -method          Test 140 of 195: Test _FIF (Fan Information).
> +method          Test 140 of 189: Test _FIF (Fan Information).
>   method          SKIPPED: Test 140, Skipping test for non-existant object
>   method          _FIF.
>   method
> -method          Test 141 of 195: Test _FPS (Fan Performance States).
> +method          Test 141 of 189: Test _FPS (Fan Performance States).
>   method          SKIPPED: Test 141, Skipping test for non-existant object
>   method          _FPS.
>   method
> -method          Test 142 of 195: Test _FSL (Fan Set Level).
> +method          Test 142 of 189: Test _FSL (Fan Set Level).
>   method          SKIPPED: Test 142, Skipping test for non-existant object
>   method          _FSL.
>   method
> -method          Test 143 of 195: Test _FST (Fan Status).
> +method          Test 143 of 189: Test _FST (Fan Status).
>   method          SKIPPED: Test 143, Skipping test for non-existant object
>   method          _FST.
>   method
> -method          Test 144 of 195: Test _ACx (Active Cooling).
> +method          Test 144 of 189: Test _ACx (Active Cooling).
>   method          SKIPPED: Test 144, Skipping test for non-existant object
>   method          _AC0.
>   method
> @@ -901,109 +901,109 @@ method          SKIPPED: Test 144, Skipping test for non-existant object
>   method          _AC9.
>   method
>   method
> -method          Test 145 of 195: Test _ART (Active Cooling Relationship
> +method          Test 145 of 189: Test _ART (Active Cooling Relationship
>   method          Table).
>   method          SKIPPED: Test 145, Skipping test for non-existant object
>   method          _ART.
>   method
> -method          Test 146 of 195: Test _CRT (Critical Trip Point).
> +method          Test 146 of 189: Test _CRT (Critical Trip Point).
>   method          SKIPPED: Test 146, Skipping test for non-existant object
>   method          _CRT.
>   method
> -method          Test 147 of 195: Test _CR3 (Warm/Standby Temperature).
> +method          Test 147 of 189: Test _CR3 (Warm/Standby Temperature).
>   method          SKIPPED: Test 147, Skipping test for non-existant object
>   method          _CR3.
>   method
> -method          Test 148 of 195: Test _DTI (Device Temperature
> +method          Test 148 of 189: Test _DTI (Device Temperature
>   method          Indication).
>   method          SKIPPED: Test 148, Skipping test for non-existant object
>   method          _DTI.
>   method
> -method          Test 149 of 195: Test _HOT (Hot Temperature).
> +method          Test 149 of 189: Test _HOT (Hot Temperature).
>   method          SKIPPED: Test 149, Skipping test for non-existant object
>   method          _HOT.
>   method
> -method          Test 150 of 195: Test _MTL (Minimum Throttle Limit).
> +method          Test 150 of 189: Test _MTL (Minimum Throttle Limit).
>   method          SKIPPED: Test 150, Skipping test for non-existant object
>   method          _MTL.
>   method
> -method          Test 151 of 195: Test _NTT (Notification Temp Threshold).
> +method          Test 151 of 189: Test _NTT (Notification Temp Threshold).
>   method          SKIPPED: Test 151, Skipping test for non-existant object
>   method          _NTT.
>   method
> -method          Test 152 of 195: Test _PSL (Passive List).
> +method          Test 152 of 189: Test _PSL (Passive List).
>   method          SKIPPED: Test 152, Skipping test for non-existant object
>   method          _PSL.
>   method
> -method          Test 153 of 195: Test _PSV (Passive Temp).
> +method          Test 153 of 189: Test _PSV (Passive Temp).
>   method          SKIPPED: Test 153, Skipping test for non-existant object
>   method          _PSV.
>   method
> -method          Test 154 of 195: Test _RTV (Relative Temp Values).
> +method          Test 154 of 189: Test _RTV (Relative Temp Values).
>   method          SKIPPED: Test 154, Skipping test for non-existant object
>   method          _RTV.
>   method
> -method          Test 155 of 195: Test _SCP (Set Cooling Policy).
> +method          Test 155 of 189: Test _SCP (Set Cooling Policy).
>   method          SKIPPED: Test 155, Skipping test for non-existant object
>   method          _DTI.
>   method
> -method          Test 156 of 195: Test _TC1 (Thermal Constant 1).
> +method          Test 156 of 189: Test _TC1 (Thermal Constant 1).
>   method          SKIPPED: Test 156, Skipping test for non-existant object
>   method          _TC1.
>   method
> -method          Test 157 of 195: Test _TC2 (Thermal Constant 2).
> +method          Test 157 of 189: Test _TC2 (Thermal Constant 2).
>   method          SKIPPED: Test 157, Skipping test for non-existant object
>   method          _TC2.
>   method
> -method          Test 158 of 195: Test _TFP (Thermal fast Sampling Period).
> +method          Test 158 of 189: Test _TFP (Thermal fast Sampling Period).
>   method          SKIPPED: Test 158, Skipping test for non-existant object
>   method          _TFP.
>   method
> -method          Test 159 of 195: Test _TMP (Thermal Zone Current Temp).
> +method          Test 159 of 189: Test _TMP (Thermal Zone Current Temp).
>   method          SKIPPED: Test 159, Skipping test for non-existant object
>   method          _TMP.
>   method
> -method          Test 160 of 195: Test _TPT (Trip Point Temperature).
> +method          Test 160 of 189: Test _TPT (Trip Point Temperature).
>   method          SKIPPED: Test 160, Skipping test for non-existant object
>   method          _TPT.
>   method
> -method          Test 161 of 195: Test _TRT (Thermal Relationship Table).
> +method          Test 161 of 189: Test _TRT (Thermal Relationship Table).
>   method          SKIPPED: Test 161, Skipping test for non-existant object
>   method          _TRT.
>   method
> -method          Test 162 of 195: Test _TSN (Thermal Sensor Device).
> +method          Test 162 of 189: Test _TSN (Thermal Sensor Device).
>   method          SKIPPED: Test 162, Skipping test for non-existant object
>   method          _TSN.
>   method
> -method          Test 163 of 195: Test _TSP (Thermal Sampling Period).
> +method          Test 163 of 189: Test _TSP (Thermal Sampling Period).
>   method          SKIPPED: Test 163, Skipping test for non-existant object
>   method          _TSP.
>   method
> -method          Test 164 of 195: Test _TST (Temperature Sensor Threshold).
> +method          Test 164 of 189: Test _TST (Temperature Sensor Threshold).
>   method          SKIPPED: Test 164, Skipping test for non-existant object
>   method          _TST.
>   method
> -method          Test 165 of 195: Test _TZD (Thermal Zone Devices).
> +method          Test 165 of 189: Test _TZD (Thermal Zone Devices).
>   method          SKIPPED: Test 165, Skipping test for non-existant object
>   method          _TZD.
>   method
> -method          Test 166 of 195: Test _TZM (Thermal Zone member).
> +method          Test 166 of 189: Test _TZM (Thermal Zone member).
>   method          SKIPPED: Test 166, Skipping test for non-existant object
>   method          _TZM.
>   method
> -method          Test 167 of 195: Test _TZP (Thermal Zone Polling).
> +method          Test 167 of 189: Test _TZP (Thermal Zone Polling).
>   method          SKIPPED: Test 167, Skipping test for non-existant object
>   method          _TZP.
>   method
> -method          Test 168 of 195: Test _GPE (General Purpose Events).
> +method          Test 168 of 189: Test _GPE (General Purpose Events).
>   method          PASSED: Test 168, \_SB_.PCI0.LPCB.EC0_._GPE returned an
>   method          integer 0x0000001c
>   method
> -method          Test 169 of 195: Test _EC (EC Offset Query).
> +method          Test 169 of 189: Test _EC_ (EC Offset Query).
>   method          SKIPPED: Test 169, Skipping test for non-existant object
> -method          _EC.
> +method          _EC_.
>   method
> -method          Test 170 of 195: Test _PTS (Prepare to Sleep).
> +method          Test 170 of 189: Test _PTS (Prepare to Sleep).
>   method          Test _PTS(1).
>   method          PASSED: Test 170, \_PTS returned no values as expected.
>   method
> @@ -1020,257 +1020,233 @@ method          Test _PTS(5).
>   method          PASSED: Test 170, \_PTS returned no values as expected.
>   method
>   method
> -method          Test 171 of 195: Test _TTS (Transition to State).
> +method          Test 171 of 189: Test _TTS (Transition to State).
>   method          SKIPPED: Test 171, Optional control method _TTS does not
>   method          exist.
>   method
> -method          Test 172 of 195: Test _S0 (System S0 State).
> -method          SKIPPED: Test 172, Skipping test for non-existant object
> -method          _S0.
> -method
> -method          Test 173 of 195: Test _S1 (System S1 State).
> -method          SKIPPED: Test 173, Skipping test for non-existant object
> -method          _S1.
> -method
> -method          Test 174 of 195: Test _S2 (System S2 State).
> -method          SKIPPED: Test 174, Skipping test for non-existant object
> -method          _S2.
> -method
> -method          Test 175 of 195: Test _S3 (System S3 State).
> -method          SKIPPED: Test 175, Skipping test for non-existant object
> -method          _S3.
> -method
> -method          Test 176 of 195: Test _S4 (System S4 State).
> -method          SKIPPED: Test 176, Skipping test for non-existant object
> -method          _S4.
> -method
> -method          Test 177 of 195: Test _S5 (System S5 State).
> -method          SKIPPED: Test 177, Skipping test for non-existant object
> -method          _S5.
> -method
> -method          Test 178 of 195: Test _WAK (System Wake).
> +method          Test 172 of 189: Test _WAK (System Wake).
>   method          Test _WAK(1) System Wake, State S1.
> -method          PASSED: Test 178, \_WAK correctly returned a sane looking
> +method          PASSED: Test 172, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method          Test _WAK(2) System Wake, State S2.
> -method          PASSED: Test 178, \_WAK correctly returned a sane looking
> +method          PASSED: Test 172, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method          Test _WAK(3) System Wake, State S3.
> -method          PASSED: Test 178, \_WAK correctly returned a sane looking
> +method          PASSED: Test 172, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method          Test _WAK(4) System Wake, State S4.
> -method          PASSED: Test 178, \_WAK correctly returned a sane looking
> +method          PASSED: Test 172, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method          Test _WAK(5) System Wake, State S5.
> -method          PASSED: Test 178, \_WAK correctly returned a sane looking
> +method          PASSED: Test 172, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method
> -method          Test 179 of 195: Test _ADR (Return Unique ID for Device).
> -method          PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned
> +method          Test 173 of 189: Test _ADR (Return Unique ID for Device).
> +method          PASSED: Test 173, \_SB_.PCI0.MCHC._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.PEGP._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PEGP.VGA_._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0.DD01._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0.DD02._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0.DD03._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0.DD04._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.GFX0.DD05._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.HDEF._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP01._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP01.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP02._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP02.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP03._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP03.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP04._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP04.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP05._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP05.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.RP06._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.RP06.PXSX._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.USB1._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.USB2._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.USB3._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.USB4._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.USB5._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2.HUB7._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.PCIB._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.LPCB._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.PATA._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PATA.PRID._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.SATA._ADR correctly returned
>   method          an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.SATA.PRT0._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.SATA.PRT1._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly
> +method          PASSED: Test 173, \_SB_.PCI0.SATA.PRT2._ADR correctly
>   method          returned an integer.
> -method          PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned
> +method          PASSED: Test 173, \_SB_.PCI0.SBUS._ADR correctly returned
>   method          an integer.
>   method
> -method          Test 180 of 195: Test _BCL (Query List of Brightness
> +method          Test 174 of 189: Test _BCL (Query List of Brightness
>   method          Control Levels Supported).
>   method          Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
>   method            Level on full power   : 70
>   method            Level on battery power: 40
>   method            Brightness Levels     : 0, 10, 20, 30, 40, 50, 60, 70
> -method          PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
> +method          PASSED: Test 174, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned
>   method          a sane package of 10 integers.
>   method          Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL:
>   method            Level on full power   : 70
>   method            Level on battery power: 40
>   method            Brightness Levels     : 0, 10, 20, 30, 40, 50, 60, 70
> -method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a
> +method          PASSED: Test 174, \_SB_.PCI0.GFX0.DD03._BCL returned a
>   method          sane package of 10 integers.
>   method
> -method          Test 181 of 195: Test _BCM (Set Brightness Level).
> -method          PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
> +method          Test 175 of 189: Test _BCM (Set Brightness Level).
> +method          PASSED: Test 175, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
>   method          no values as expected.
> -method          PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no
> +method          PASSED: Test 175, \_SB_.PCI0.GFX0.DD03._BCM returned no
>   method          values as expected.
>   method
> -method          Test 182 of 195: Test _BQC (Brightness Query Current
> +method          Test 176 of 189: Test _BQC (Brightness Query Current
>   method          Level).
> -method          PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
> +method          PASSED: Test 176, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
>   method          returned an integer.
> -method          PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly
> +method          PASSED: Test 176, \_SB_.PCI0.GFX0.DD03._BQC correctly
>   method          returned an integer.
>   method
> -method          Test 183 of 195: Test _DCS (Return the Status of Output
> +method          Test 177 of 189: Test _DCS (Return the Status of Output
>   method          Device).
> -method          PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.GFX0.DD01._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.GFX0.DD02._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.GFX0.DD03._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.GFX0.DD04._DCS correctly
>   method          returned an integer.
> -method          PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly
> +method          PASSED: Test 177, \_SB_.PCI0.GFX0.DD05._DCS correctly
>   method          returned an integer.
>   method
> -method          Test 184 of 195: Test _DDC (Return the EDID for this
> +method          Test 178 of 189: Test _DDC (Return the EDID for this
>   method          Device).
> -method          SKIPPED: Test 184, Skipping test for non-existant object
> +method          SKIPPED: Test 178, Skipping test for non-existant object
>   method          _DDC.
>   method
> -method          Test 185 of 195: Test _DSS (Device Set State).
> -method          PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
> +method          Test 179 of 189: Test _DSS (Device Set State).
> +method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
>   method          no values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> +method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
>   method          no values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
> +method          PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned
>   method          no values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no
> +method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._DSS returned no
>   method          values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no
> +method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._DSS returned no
>   method          values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no
> +method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._DSS returned no
>   method          values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no
> +method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._DSS returned no
>   method          values as expected.
> -method          PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no
> +method          PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._DSS returned no
>   method          values as expected.
>   method
> -method          Test 186 of 195: Test _DGS (Query Graphics State).
> -method          PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
> +method          Test 180 of 189: Test _DGS (Query Graphics State).
> +method          PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD01._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD02._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD04._DGS correctly
>   method          returned an integer.
> -method          PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly
> +method          PASSED: Test 180, \_SB_.PCI0.GFX0.DD05._DGS correctly
>   method          returned an integer.
>   method
> -method          Test 187 of 195: Test _DOD (Enumerate All Devices Attached
> +method          Test 181 of 189: Test _DOD (Enumerate All Devices Attached
>   method          to Display Adapter).
>   method          Device 0:
>   method            Instance:                0
> @@ -1293,7 +1269,7 @@ method            Type of display:         2 (TV/HDTV or other Analog-Video Moni
>   method            BIOS can detect device:  0
>   method            Non-VGA device:          0
>   method            Head or pipe ID:         0
> -method          PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly
> +method          PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_._DOD correctly
>   method          returned a sane looking package.
>   method          Device 0:
>   method            Instance:                0
> @@ -1302,45 +1278,45 @@ method            Type of display:         4 (Internal/Integrated Digital Flat P
>   method            BIOS can detect device:  0
>   method            Non-VGA device:          0
>   method            Head or pipe ID:         0
> -method          PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned
> +method          PASSED: Test 181, \_SB_.PCI0.GFX0._DOD correctly returned
>   method          a sane looking package.
>   method
> -method          Test 188 of 195: Test _DOS (Enable/Disable Output
> +method          Test 182 of 189: Test _DOS (Enable/Disable Output
>   method          Switching).
> -method          PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no
> +method          PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_._DOS returned no
>   method          values as expected.
> -method          PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values
> +method          PASSED: Test 182, \_SB_.PCI0.GFX0._DOS returned no values
>   method          as expected.
>   method
> -method          Test 189 of 195: Test _GPD (Get POST Device).
> -method          SKIPPED: Test 189, Skipping test for non-existant object
> +method          Test 183 of 189: Test _GPD (Get POST Device).
> +method          SKIPPED: Test 183, Skipping test for non-existant object
>   method          _GPD.
>   method
> -method          Test 190 of 195: Test _ROM (Get ROM Data).
> -method          SKIPPED: Test 190, Skipping test for non-existant object
> +method          Test 184 of 189: Test _ROM (Get ROM Data).
> +method          SKIPPED: Test 184, Skipping test for non-existant object
>   method          _ROM.
>   method
> -method          Test 191 of 195: Test _SPD (Set POST Device).
> -method          SKIPPED: Test 191, Skipping test for non-existant object
> +method          Test 185 of 189: Test _SPD (Set POST Device).
> +method          SKIPPED: Test 185, Skipping test for non-existant object
>   method          _SPD.
>   method
> -method          Test 192 of 195: Test _VPO (Video POST Options).
> -method          SKIPPED: Test 192, Skipping test for non-existant object
> +method          Test 186 of 189: Test _VPO (Video POST Options).
> +method          SKIPPED: Test 186, Skipping test for non-existant object
>   method          _VPO.
>   method
> -method          Test 193 of 195: Test _CBA (Configuration Base Address).
> -method          SKIPPED: Test 193, Skipping test for non-existant object
> +method          Test 187 of 189: Test _CBA (Configuration Base Address).
> +method          SKIPPED: Test 187, Skipping test for non-existant object
>   method          _CBA.
>   method
> -method          Test 194 of 195: Test _IFT (IPMI Interface Type).
> -method          SKIPPED: Test 194, Skipping test for non-existant object
> +method          Test 188 of 189: Test _IFT (IPMI Interface Type).
> +method          SKIPPED: Test 188, Skipping test for non-existant object
>   method          _IFT.
>   method
> -method          Test 195 of 195: Test _SRV (IPMI Interface Revision).
> -method          SKIPPED: Test 195, Skipping test for non-existant object
> +method          Test 189 of 189: Test _SRV (IPMI Interface Revision).
> +method          SKIPPED: Test 189, Skipping test for non-existant object
>   method          _SRV.
>   method
>   method          ==========================================================
> -method          261 passed, 3 failed, 0 warning, 0 aborted, 157 skipped, 0
> +method          261 passed, 3 failed, 0 warning, 0 aborted, 151 skipped, 0
>   method          info only.
>   method          ==========================================================
>


Acked-by: Alex Hung <alex.hung@canonical.com>