Patchwork [1/2] arg-show-tests-full-0001: update to sync with acpi method changes

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Submitter Alex Hung
Date Nov. 15, 2013, 7:50 a.m.
Message ID <1384501853-19974-1-git-send-email-alex.hung@canonical.com>
Download mbox | patch
Permalink /patch/291487/
State Accepted
Headers show

Comments

Alex Hung - Nov. 15, 2013, 7:50 a.m.
Signed-off-by: Alex Hung <alex.hung@canonical.com>
---
 arg-show-tests-full-0001/arg-show-tests-full-0001.log | 8 +++++++-
 1 file changed, 7 insertions(+), 1 deletion(-)
Ivan Hu - Nov. 18, 2013, 3:55 a.m.
On 11/15/2013 03:50 PM, Alex Hung wrote:
> Signed-off-by: Alex Hung <alex.hung@canonical.com>
> ---
>   arg-show-tests-full-0001/arg-show-tests-full-0001.log | 8 +++++++-
>   1 file changed, 7 insertions(+), 1 deletion(-)
>
> diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index c9c13c5..063cd2d 100644
> --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -55,9 +55,10 @@ Batch tests:
>    mcfg            (2 tests):
>     Validate MCFG table.
>     Validate MCFG PCI config space.
> - method          (144 tests):
> + method          (150 tests):
>     Test Method Names.
>     Test _AEI.
> +  Test _CID (Compatible ID).
>     Test _DDN (DOS Device Name).
>     Test _HID (Hardware ID).
>     Test _HRV (Hardware Revision Number).
> @@ -66,6 +67,7 @@ Batch tests:
>     Test _SUN (Slot User Number).
>     Test _STR (String).
>     Test _UID (Unique ID).
> +  Test _CDM (Clock Domain).
>     Test _CRS (Current Resource Settings).
>     Test _DIS (Disable).
>     Test _DMA (Direct Memory Access).
> @@ -133,6 +135,7 @@ Batch tests:
>     Test _TPC (Throttling Present Capabilities).
>     Test _TSD (Throttling State Dependencies).
>     Test _TSS (Throttling Supported States).
> +  Test _MSG (Message).
>     Test _ALC (Ambient Light Colour Chromaticity).
>     Test _ALI (Ambient Light Illuminance).
>     Test _ALT (Ambient Light Temperature).
> @@ -159,6 +162,8 @@ Batch tests:
>     Test _PCL (Power Consumer List).
>     Test _PIF (Power Source Information).
>     Test _PSR (Power Source).
> +  Test _GAI (Get Averaging Level).
> +  Test _PMM (Power Meter Measurement).
>     Test _FIF (Fan Information).
>     Test _FSL (Fan Set Level).
>     Test _FST (Fan Status).
> @@ -200,6 +205,7 @@ Batch tests:
>     Test _ROM (Get ROM Data).
>     Test _SPD (Set POST Device).
>     Test _VPO (Video POST Options).
> +  Test _CBA (Configuration Base Address).
>    microcode       (1 test):
>     Test for most recent microcode being loaded.
>    mpcheck         (9 tests):
>

Acked-by: Ivan Hu <ivan.hu@canonical.com>
Keng-Yu Lin - Nov. 28, 2013, 8:40 a.m.
On Fri, Nov 15, 2013 at 3:50 PM, Alex Hung <alex.hung@canonical.com> wrote:
> Signed-off-by: Alex Hung <alex.hung@canonical.com>
> ---
>  arg-show-tests-full-0001/arg-show-tests-full-0001.log | 8 +++++++-
>  1 file changed, 7 insertions(+), 1 deletion(-)
>
> diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index c9c13c5..063cd2d 100644
> --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -55,9 +55,10 @@ Batch tests:
>   mcfg            (2 tests):
>    Validate MCFG table.
>    Validate MCFG PCI config space.
> - method          (144 tests):
> + method          (150 tests):
>    Test Method Names.
>    Test _AEI.
> +  Test _CID (Compatible ID).
>    Test _DDN (DOS Device Name).
>    Test _HID (Hardware ID).
>    Test _HRV (Hardware Revision Number).
> @@ -66,6 +67,7 @@ Batch tests:
>    Test _SUN (Slot User Number).
>    Test _STR (String).
>    Test _UID (Unique ID).
> +  Test _CDM (Clock Domain).
>    Test _CRS (Current Resource Settings).
>    Test _DIS (Disable).
>    Test _DMA (Direct Memory Access).
> @@ -133,6 +135,7 @@ Batch tests:
>    Test _TPC (Throttling Present Capabilities).
>    Test _TSD (Throttling State Dependencies).
>    Test _TSS (Throttling Supported States).
> +  Test _MSG (Message).
>    Test _ALC (Ambient Light Colour Chromaticity).
>    Test _ALI (Ambient Light Illuminance).
>    Test _ALT (Ambient Light Temperature).
> @@ -159,6 +162,8 @@ Batch tests:
>    Test _PCL (Power Consumer List).
>    Test _PIF (Power Source Information).
>    Test _PSR (Power Source).
> +  Test _GAI (Get Averaging Level).
> +  Test _PMM (Power Meter Measurement).
>    Test _FIF (Fan Information).
>    Test _FSL (Fan Set Level).
>    Test _FST (Fan Status).
> @@ -200,6 +205,7 @@ Batch tests:
>    Test _ROM (Get ROM Data).
>    Test _SPD (Set POST Device).
>    Test _VPO (Video POST Options).
> +  Test _CBA (Configuration Base Address).
>   microcode       (1 test):
>    Test for most recent microcode being loaded.
>   mpcheck         (9 tests):
> --
> 1.8.1.2
>

Acked-by: Keng-Yu Lin <kengyu@canonical.com>

Patch

diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
index c9c13c5..063cd2d 100644
--- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
+++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
@@ -55,9 +55,10 @@  Batch tests:
  mcfg            (2 tests):
   Validate MCFG table.
   Validate MCFG PCI config space.
- method          (144 tests):
+ method          (150 tests):
   Test Method Names.
   Test _AEI.
+  Test _CID (Compatible ID).
   Test _DDN (DOS Device Name).
   Test _HID (Hardware ID).
   Test _HRV (Hardware Revision Number).
@@ -66,6 +67,7 @@  Batch tests:
   Test _SUN (Slot User Number).
   Test _STR (String).
   Test _UID (Unique ID).
+  Test _CDM (Clock Domain).
   Test _CRS (Current Resource Settings).
   Test _DIS (Disable).
   Test _DMA (Direct Memory Access).
@@ -133,6 +135,7 @@  Batch tests:
   Test _TPC (Throttling Present Capabilities).
   Test _TSD (Throttling State Dependencies).
   Test _TSS (Throttling Supported States).
+  Test _MSG (Message).
   Test _ALC (Ambient Light Colour Chromaticity).
   Test _ALI (Ambient Light Illuminance).
   Test _ALT (Ambient Light Temperature).
@@ -159,6 +162,8 @@  Batch tests:
   Test _PCL (Power Consumer List).
   Test _PIF (Power Source Information).
   Test _PSR (Power Source).
+  Test _GAI (Get Averaging Level).
+  Test _PMM (Power Meter Measurement).
   Test _FIF (Fan Information).
   Test _FSL (Fan Set Level).
   Test _FST (Fan Status).
@@ -200,6 +205,7 @@  Batch tests:
   Test _ROM (Get ROM Data).
   Test _SPD (Set POST Device).
   Test _VPO (Video POST Options).
+  Test _CBA (Configuration Base Address).
  microcode       (1 test):
   Test for most recent microcode being loaded.
  mpcheck         (9 tests):