Patchwork [FWTS-TEST] tests: keep in sync with changes from fwts bug LP: #1246650

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Submitter Colin King
Date Oct. 31, 2013, 12:01 p.m.
Message ID <1383220919-17743-1-git-send-email-colin.king@canonical.com>
Download mbox | patch
Permalink /patch/287464/
State Accepted
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Comments

Colin King - Oct. 31, 2013, 12:01 p.m.
From: Colin Ian King <colin.king@canonical.com>

Replacment of "Check" with "Test" in LP: #1246650 means we
need to update the affected tests.

Signed-off-by: Colin Ian King <colin.king@canonical.com>
---
 acpitables-0001/acpitables-0001.log                |   4 +-
 acpitables-0002/acpitables-0001.log                |   4 +-
 acpitables-0002/acpitables-0002.log                |   4 +-
 acpitables-0003/acpitables-0001.log                |   4 +-
 acpitables-0004/acpitables-0001.log                |   4 +-
 acpitables-0005/acpitables-0001.log                |   4 +-
 acpitables-0006/acpitables-0001.log                |   4 +-
 acpitables-0007/acpitables-0001.log                |   4 +-
 acpitables-0008/acpitables-0001.log                |   4 +-
 apicinstance-0001/apicinstance-0001.log            |   5 +-
 apicinstance-0001/apicinstance-0002.log            |   5 +-
 arg-show-tests-0001/arg-show-tests-0001.log        |  62 ++--
 .../arg-show-tests-full-0001.log                   | 394 ++++++++++-----------
 checksum-0001/checksum-0001.log                    |   4 +-
 checksum-0001/checksum-0003.log                    |   4 +-
 checksum-0001/checksum-0004.log                    |   4 +-
 method-0001/method-0001.log                        | 296 ++++++++--------
 wmi-0001/wmi-0001.log                              |   2 +-
 wmi-0001/wmi-0002.log                              |   2 +-
 wmi-0001/wmi-0003.log                              |   2 +-
 20 files changed, 405 insertions(+), 411 deletions(-)
Ivan Hu - Nov. 11, 2013, 10:27 a.m.
On 10/31/2013 08:01 PM, Colin King wrote:
> From: Colin Ian King <colin.king@canonical.com>
>
> Replacment of "Check" with "Test" in LP: #1246650 means we
> need to update the affected tests.
>
> Signed-off-by: Colin Ian King <colin.king@canonical.com>
> ---
>   acpitables-0001/acpitables-0001.log                |   4 +-
>   acpitables-0002/acpitables-0001.log                |   4 +-
>   acpitables-0002/acpitables-0002.log                |   4 +-
>   acpitables-0003/acpitables-0001.log                |   4 +-
>   acpitables-0004/acpitables-0001.log                |   4 +-
>   acpitables-0005/acpitables-0001.log                |   4 +-
>   acpitables-0006/acpitables-0001.log                |   4 +-
>   acpitables-0007/acpitables-0001.log                |   4 +-
>   acpitables-0008/acpitables-0001.log                |   4 +-
>   apicinstance-0001/apicinstance-0001.log            |   5 +-
>   apicinstance-0001/apicinstance-0002.log            |   5 +-
>   arg-show-tests-0001/arg-show-tests-0001.log        |  62 ++--
>   .../arg-show-tests-full-0001.log                   | 394 ++++++++++-----------
>   checksum-0001/checksum-0001.log                    |   4 +-
>   checksum-0001/checksum-0003.log                    |   4 +-
>   checksum-0001/checksum-0004.log                    |   4 +-
>   method-0001/method-0001.log                        | 296 ++++++++--------
>   wmi-0001/wmi-0001.log                              |   2 +-
>   wmi-0001/wmi-0002.log                              |   2 +-
>   wmi-0001/wmi-0003.log                              |   2 +-
>   20 files changed, 405 insertions(+), 411 deletions(-)
>
> diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log
> index 2f05d15..57d8813 100644
> --- a/acpitables-0001/acpitables-0001.log
> +++ b/acpitables-0001/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      PASSED: Test 1, Table APIC passed.
>   acpitables      Table ECDT not present to check.
>   acpitables      PASSED: Test 1, Table FACP passed.
> diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log
> index 042c83e..22f07a2 100644
> --- a/acpitables-0002/acpitables-0001.log
> +++ b/acpitables-0002/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      PASSED: Test 1, Table APIC passed.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log
> index db437af..c16d257 100644
> --- a/acpitables-0002/acpitables-0002.log
> +++ b/acpitables-0002/acpitables-0002.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local
>   acpitables      APIC flags field, bits 1..31 are reserved and should be
>   acpitables      zero, but are set as: f.
> diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log
> index 2a4d63e..715978b 100644
> --- a/acpitables-0003/acpitables-0001.log
> +++ b/acpitables-0003/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit
> diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log
> index 52491c3..f33e083 100644
> --- a/acpitables-0004/acpitables-0001.log
> +++ b/acpitables-0004/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log
> index cf09a01..2e97b45 100644
> --- a/acpitables-0005/acpitables-0001.log
> +++ b/acpitables-0005/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log
> index 1c2633c..b931cf3 100644
> --- a/acpitables-0006/acpitables-0001.log
> +++ b/acpitables-0006/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log
> index 3e02f91..5d17103 100644
> --- a/acpitables-0007/acpitables-0001.log
> +++ b/acpitables-0007/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log
> index 1a127a6..80ecd20 100644
> --- a/acpitables-0008/acpitables-0001.log
> +++ b/acpitables-0008/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>   acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>   acpitables      Table APIC not present to check.
>   acpitables      Table ECDT not present to check.
>   acpitables      Table FACP not present to check.
> diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log
> index a185d24..0fcec6e 100644
> --- a/apicinstance-0001/apicinstance-0001.log
> +++ b/apicinstance-0001/apicinstance-0001.log
> @@ -1,7 +1,6 @@
> -apicinstance    apicinstance: Check for single instance of APIC/MADT
> -apicinstance    table.
> +apicinstance    apicinstance: Test for single instance of APIC/MADT table.
>   apicinstance    ----------------------------------------------------------
> -apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
>   apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
>   apicinstance    Found APIC/MADT table APIC @ bf6dff70, length 0x104
>   apicinstance     (and differs from first APIC/MADT table).
> diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log
> index 91fd42e..d3f2eb3 100644
> --- a/apicinstance-0001/apicinstance-0002.log
> +++ b/apicinstance-0001/apicinstance-0002.log
> @@ -1,7 +1,6 @@
> -apicinstance    apicinstance: Check for single instance of APIC/MADT
> -apicinstance    table.
> +apicinstance    apicinstance: Test for single instance of APIC/MADT table.
>   apicinstance    ----------------------------------------------------------
> -apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
>   apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
>   apicinstance    PASSED: Test 1, Found 1 APIC/MADT table(s), as expected.
>   apicinstance
> diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log
> index 06a7619..3068592 100644
> --- a/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -1,49 +1,49 @@
>   Batch tests:
> - acpiinfo        General ACPI information check.
> - acpitables      ACPI table settings sanity checks.
> - apicedge        APIC Edge/Level Check.
> - apicinstance    Check for single instance of APIC/MADT table.
> - aspm            PCIe ASPM check.
> - bios32          Check BIOS32 Service Directory.
> + acpiinfo        General ACPI information test.
> + acpitables      ACPI table settings sanity tests.
> + apicedge        APIC edge/level test.
> + apicinstance    Test for single instance of APIC/MADT table.
> + aspm            PCIe ASPM test.
> + bios32          BIOS32 Service Directory test.
>    bios_info       Gather BIOS DMI information.
> - checksum        Check ACPI table checksum.
> + checksum        ACPI table checksum test.
>    cpufreq         CPU frequency scaling tests.
> - crs             Check PCI host bridge configuration using _CRS.
> - csm             Check for UEFI Compatibility Support Module.
> - cstates         Check processor C state support.
> - dmar            Check sane DMA Remapping (VT-d).
> - dmicheck        Test DMI/SMBIOS tables for errors.
> - ebda            Validate EBDA region is mapped and reserved in memory map table.
> - fadt            FADT SCI_EN enabled check.
> - fan             Simple Fan Tests.
> - hda_audio       Check HDA Audio Pin Configs.
> - hpet_check      HPET configuration test.
> + crs             Test PCI host bridge configuration using _CRS.
> + csm             UEFI Compatibility Support Module test.
> + cstates         Processor C state support test.
> + dmar            DMA Remapping (VT-d) test.
> + dmicheck        DMI/SMBIOS table tests.
> + ebda            Test EBDA region is mapped and reserved in memory map table.
> + fadt            FADT SCI_EN enabled tests.
> + fan             Simple fan tests.
> + hda_audio       HDA Audio Pin Configuration test.
> + hpet_check      HPET configuration tests.
>    klog            Scan kernel log for errors and warnings.
> - maxfreq         Check max CPU frequencies against max scaling frequency.
> - maxreadreq      Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg            MCFG PCI Express* memory mapped config space.
> - method          ACPI DSDT Method Semantic Tests.
> - microcode       Check if system is using latest microcode.
> - mpcheck         Check MultiProcessor Tables.
> + maxfreq         Test max CPU frequencies against max scaling frequency.
> + maxreadreq      Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> + mcfg            MCFG PCI Express* memory mapped config space test.
> + method          ACPI DSDT Method Semantic tests.
> + microcode       Test if system is using latest microcode.
> + mpcheck         MultiProcessor Tables tests.
>    msr             MSR register tests.
> - mtrr            MTRR validation.
> + mtrr            MTRR tests.
>    nx              Test if CPU NX is disabled by the BIOS.
>    oops            Scan kernel log for Oopses.
>    os2gap          OS/2 memory hole test.
>    osilinux        Disassemble DSDT to check for _OSI("Linux").
> - pcc             Processor Clocking Control (PCC) Test.
> - pciirq          Check PCI IRQ Routing Table.
> - pnp             Check BIOS Support Installation structure.
> + pcc             Processor Clocking Control (PCC) test.
> + pciirq          PCI IRQ Routing Table test.
> + pnp             BIOS Support Installation structure test.
>    securebootcert  Ubuntu UEFI secure boot test.
>    syntaxcheck     Re-assemble DSDT and find syntax errors and warnings.
>    version         Gather kernel system information.
> - virt            Test CPU Virtualisation Configuration.
> - wakealarm       Test ACPI Wakealarm.
> + virt            CPU Virtualisation Configuration test.
> + wakealarm       ACPI Wakealarm tests.
>    wmi             Extract and analyse Windows Management Instrumentation (WMI).
>
>   Interactive tests:
>    ac_adapter      Interactive ac_adapter power test.
> - battery         Battery Tests.
> + battery         Battery tests.
>    brightness      Interactive LCD brightness test.
>    hotkey          Hotkey scan code tests.
>    lid             Interactive lid button test.
> @@ -71,7 +71,7 @@ Unsafe tests:
>    uefirtvariable  UEFI Runtime service variable interface tests.
>
>   UEFI tests:
> - csm             Check for UEFI Compatibility Support Module.
> + csm             UEFI Compatibility Support Module test.
>    securebootcert  Ubuntu UEFI secure boot test.
>    uefirtmisc      UEFI miscellaneous runtime service interface tests.
>    uefirttime      UEFI Runtime service time interface tests.
> diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index f6d3b89..c9c13c5 100644
> --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -4,240 +4,240 @@ Batch tests:
>     Determine machine's ACPI version.
>     Determine AML compiler.
>    acpitables      (1 test):
> -  Check ACPI tables.
> +  Test ACPI tables.
>    apicedge        (1 test):
> -  Legacy and PCI Interrupt Edge/Level trigger checks.
> +  Legacy and PCI Interrupt Edge/Level trigger tests.
>    apicinstance    (1 test):
> -  Check single instance of APIC/MADT table.
> +  Test for single instance of APIC/MADT table.
>    aspm            (2 tests):
>     PCIe ASPM ACPI test.
>     PCIe ASPM registers test.
>    bios32          (1 test):
> -  Check BIOS32 Service Directory.
> +  BIOS32 Service Directory test.
>    bios_info       (1 test):
>     Gather BIOS DMI information
>    checksum        (1 test):
> -  Check ACPI table checksums.
> +  ACPI table checksum test.
>    cpufreq         (1 test):
> -  CPU P-State Checks.
> +  CPU P-State tests.
>    crs             (1 test):
> -  Check PCI host bridge configuration using _CRS.
> +  Test PCI host bridge configuration using _CRS.
>    csm             (1 test):
> -  Check for UEFI Compatibility Support Module.
> +  UEFI Compatibility Support Module test.
>    cstates         (1 test):
> -  Check all CPUs C-states.
> +  Test all CPUs C-states.
>    dmar            (1 test):
> -  Check DMA Remapping.
> +  DMA Remapping test.
>    dmicheck        (2 tests):
> -  Find and Check SMBIOS Table Entry Point.
> +  Find and test SMBIOS Table Entry Point.
>     Test DMI/SMBIOS tables for errors.
>    ebda            (1 test):
> -  Check EBDA is reserved in E820 table.
> +  Test EBDA is reserved in E820 table.
>    fadt            (2 tests):
> -  Check FADT SCI_EN bit is enabled.
> -  Check FADT reset register.
> +  Test FADT SCI_EN bit is enabled.
> +  Test FADT reset register.
>    fan             (2 tests):
> -  Check fan status.
> +  Test fan status.
>     Load system, check CPU fan status.
>    hda_audio       (1 test):
> -  Check HDA Audio Pin Configs.
> +  HDA Audio Pin Configuration test.
>    hpet_check      (4 tests):
> -  Check HPET base in kernel log.
> -  Check HPET base in HPET table.
> -  Check HPET base in DSDT and/or SSDT.
> -  Sanity check HPET configuration.
> +  Test HPET base in kernel log.
> +  Test HPET base in HPET table.
> +  Test HPET base in DSDT and/or SSDT.
> +  Test HPET configuration.
>    klog            (1 test):
>     Kernel log error check.
>    maxfreq         (1 test):
> -  Maximum CPU frequency check.
> +  Maximum CPU frequency test.
>    maxreadreq      (1 test):
> -  Check firmware settings MaxReadReq for PCI Express devices.
> +  Test firmware settings MaxReadReq for PCI Express devices.
>    mcfg            (2 tests):
>     Validate MCFG table.
>     Validate MCFG PCI config space.
>    method          (144 tests):
> -  Check Method Names.
> -  Check _AEI.
> -  Check _DDN (DOS Device Name).
> -  Check _HID (Hardware ID).
> -  Check _HRV (Hardware Revision Number).
> -  Check _PLD (Physical Device Location).
> -  Check _SUB (Subsystem ID).
> -  Check _SUN (Slot User Number).
> -  Check _STR (String).
> -  Check _UID (Unique ID).
> -  Check _CRS (Current Resource Settings).
> -  Check _DIS (Disable).
> -  Check _DMA (Direct Memory Access).
> -  Check _FIX (Fixed Register Resource Provider).
> -  Check _GSB (Global System Interrupt Base).
> -  Check _HPP (Hot Plug Parameters).
> -  Check _PRS (Possible Resource Settings).
> -  Check _PXM (Proximity).
> -  Check _EDL (Eject Device List).
> -  Check _EJD (Ejection Dependent Device).
> -  Check _EJ0 (Eject).
> -  Check _EJ1 (Eject).
> -  Check _EJ2 (Eject).
> -  Check _EJ3 (Eject).
> -  Check _EJ4 (Eject).
> -  Check _LCK (Lock).
> -  Check _RMV (Remove).
> -  Check _STA (Status).
> -  Check _BDN (BIOS Dock Name).
> -  Check _BBN (Base Bus Number).
> -  Check _DCK (Dock).
> -  Check _INI (Initialize).
> -  Check _SEG (Segment).
> -  Check _OFF (Set resource off).
> -  Check _ON  (Set resource on).
> -  Check _DSW (Device Sleep Wake).
> -  Check _IRC (In Rush Current).
> -  Check _PRE (Power Resources for Enumeration).
> -  Check _PR0 (Power Resources for D0).
> -  Check _PR1 (Power Resources for D1).
> -  Check _PR2 (Power Resources for D2).
> -  Check _PR3 (Power Resources for D3).
> -  Check _PS0 (Power State 0).
> -  Check _PS1 (Power State 1).
> -  Check _PS2 (Power State 2).
> -  Check _PS3 (Power State 3).
> -  Check _PSC (Power State Current).
> -  Check _PSE (Power State for Enumeration).
> -  Check _PSW (Power State Wake).
> -  Check _S1D (S1 Device State).
> -  Check _S2D (S2 Device State).
> -  Check _S3D (S3 Device State).
> -  Check _S4D (S4 Device State).
> -  Check _S0W (S0 Device Wake State).
> -  Check _S1W (S1 Device Wake State).
> -  Check _S2W (S2 Device Wake State).
> -  Check _S3W (S3 Device Wake State).
> -  Check _S4W (S4 Device Wake State).
> -  Check _S0_ (S0 System State).
> -  Check _S1_ (S1 System State).
> -  Check _S2_ (S2 System State).
> -  Check _S3_ (S3 System State).
> -  Check _S4_ (S4 System State).
> -  Check _S5_ (S5 System State).
> -  Check _SWS (System Wake Source).
> -  Check _PSS (Performance Supported States).
> -  Check _CPC (Continuous Performance Control).
> -  Check _CSD (C State Dependencies).
> -  Check _CST (C States).
> -  Check _PCT (Performance Control).
> -  Check _PDL (P-State Depth Limit).
> -  Check _PPC (Performance Present Capabilities).
> -  Check _PPE (Polling for Platform Error).
> -  Check _TDL (T-State Depth Limit).
> -  Check _TPC (Throttling Present Capabilities).
> -  Check _TSD (Throttling State Dependencies).
> -  Check _TSS (Throttling Supported States).
> -  Check _ALC (Ambient Light Colour Chromaticity).
> -  Check _ALI (Ambient Light Illuminance).
> -  Check _ALT (Ambient Light Temperature).
> -  Check _ALP (Ambient Light Polling).
> -  Check _LID (Lid Status).
> -  Check _GCP (Get Capabilities).
> -  Check _GRT (Get Real Time).
> -  Check _GWS (Get Wake Status).
> -  Check _STP (Set Expired Timer Wake Policy).
> -  Check _STV (Set Timer Value).
> -  Check _TIP (Expired Timer Wake Policy).
> -  Check _TIV (Timer Values).
> -  Check _SBS (Smart Battery Subsystem).
> -  Check _BCT (Battery Charge Time).
> -  Check _BIF (Battery Information).
> -  Check _BIX (Battery Information Extended).
> -  Check _BMA (Battery Measurement Averaging).
> -  Check _BMC (Battery Maintenance Control).
> -  Check _BMD (Battery Maintenance Data).
> -  Check _BMS (Battery Measurement Sampling Time).
> -  Check _BST (Battery Status).
> -  Check _BTP (Battery Trip Point).
> -  Check _BTM (Battery Time).
> -  Check _PCL (Power Consumer List).
> -  Check _PIF (Power Source Information).
> -  Check _PSR (Power Source).
> -  Check _FIF (Fan Information).
> -  Check _FSL (Fan Set Level).
> -  Check _FST (Fan Status).
> -  Check _ACx (Active Cooling).
> -  Check _CRT (Critical Trip Point).
> -  Check _DTI (Device Temperature Indication).
> -  Check _HOT (Hot Temperature).
> -  Check _NTT (Notification Temp Threshold).
> -  Check _PSV (Passive Temp).
> -  Check _RTV (Relative Temp Values).
> -  Check _SCP (Set Cooling Policy).
> -  Check _TC1 (Thermal Constant 1).
> -  Check _TC2 (Thermal Constant 2).
> -  Check _TMP (Thermal Zone Current Temp).
> -  Check _TPT (Trip Point Temperature).
> -  Check _TSP (Thermal Sampling Period).
> -  Check _TST (Temperature Sensor Threshold).
> -  Check _TZP (Thermal Zone Polling).
> -  Check _PTS (Prepare to Sleep).
> -  Check _TTS (Transition to State).
> -  Check _S0  (System S0 State).
> -  Check _S1  (System S1 State).
> -  Check _S2  (System S2 State).
> -  Check _S3  (System S3 State).
> -  Check _S4  (System S4 State).
> -  Check _S5  (System S5 State).
> -  Check _WAK (System Wake).
> -  Check _ADR (Return Unique ID for Device).
> -  Check _BCL (Query List of Brightness Control Levels Supported).
> -  Check _BCM (Set Brightness Level).
> -  Check _BQC (Brightness Query Current Level).
> -  Check _DCS (Return the Status of Output Device).
> -  Check _DDC (Return the EDID for this Device).
> -  Check _DSS (Device Set State).
> -  Check _DGS (Query Graphics State).
> -  Check _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Check _DOS (Enable/Disable Output Switching).
> -  Check _GPD (Get POST Device).
> -  Check _ROM (Get ROM Data).
> -  Check _SPD (Set POST Device).
> -  Check _VPO (Video POST Options).
> +  Test Method Names.
> +  Test _AEI.
> +  Test _DDN (DOS Device Name).
> +  Test _HID (Hardware ID).
> +  Test _HRV (Hardware Revision Number).
> +  Test _PLD (Physical Device Location).
> +  Test _SUB (Subsystem ID).
> +  Test _SUN (Slot User Number).
> +  Test _STR (String).
> +  Test _UID (Unique ID).
> +  Test _CRS (Current Resource Settings).
> +  Test _DIS (Disable).
> +  Test _DMA (Direct Memory Access).
> +  Test _FIX (Fixed Register Resource Provider).
> +  Test _GSB (Global System Interrupt Base).
> +  Test _HPP (Hot Plug Parameters).
> +  Test _PRS (Possible Resource Settings).
> +  Test _PXM (Proximity).
> +  Test _EDL (Eject Device List).
> +  Test _EJD (Ejection Dependent Device).
> +  Test _EJ0 (Eject).
> +  Test _EJ1 (Eject).
> +  Test _EJ2 (Eject).
> +  Test _EJ3 (Eject).
> +  Test _EJ4 (Eject).
> +  Test _LCK (Lock).
> +  Test _RMV (Remove).
> +  Test _STA (Status).
> +  Test _BDN (BIOS Dock Name).
> +  Test _BBN (Base Bus Number).
> +  Test _DCK (Dock).
> +  Test _INI (Initialize).
> +  Test _SEG (Segment).
> +  Test _OFF (Set resource off).
> +  Test _ON  (Set resource on).
> +  Test _DSW (Device Sleep Wake).
> +  Test _IRC (In Rush Current).
> +  Test _PRE (Power Resources for Enumeration).
> +  Test _PR0 (Power Resources for D0).
> +  Test _PR1 (Power Resources for D1).
> +  Test _PR2 (Power Resources for D2).
> +  Test _PR3 (Power Resources for D3).
> +  Test _PS0 (Power State 0).
> +  Test _PS1 (Power State 1).
> +  Test _PS2 (Power State 2).
> +  Test _PS3 (Power State 3).
> +  Test _PSC (Power State Current).
> +  Test _PSE (Power State for Enumeration).
> +  Test _PSW (Power State Wake).
> +  Test _S1D (S1 Device State).
> +  Test _S2D (S2 Device State).
> +  Test _S3D (S3 Device State).
> +  Test _S4D (S4 Device State).
> +  Test _S0W (S0 Device Wake State).
> +  Test _S1W (S1 Device Wake State).
> +  Test _S2W (S2 Device Wake State).
> +  Test _S3W (S3 Device Wake State).
> +  Test _S4W (S4 Device Wake State).
> +  Test _S0_ (S0 System State).
> +  Test _S1_ (S1 System State).
> +  Test _S2_ (S2 System State).
> +  Test _S3_ (S3 System State).
> +  Test _S4_ (S4 System State).
> +  Test _S5_ (S5 System State).
> +  Test _SWS (System Wake Source).
> +  Test _PSS (Performance Supported States).
> +  Test _CPC (Continuous Performance Control).
> +  Test _CSD (C State Dependencies).
> +  Test _CST (C States).
> +  Test _PCT (Performance Control).
> +  Test _PDL (P-State Depth Limit).
> +  Test _PPC (Performance Present Capabilities).
> +  Test _PPE (Polling for Platform Error).
> +  Test _TDL (T-State Depth Limit).
> +  Test _TPC (Throttling Present Capabilities).
> +  Test _TSD (Throttling State Dependencies).
> +  Test _TSS (Throttling Supported States).
> +  Test _ALC (Ambient Light Colour Chromaticity).
> +  Test _ALI (Ambient Light Illuminance).
> +  Test _ALT (Ambient Light Temperature).
> +  Test _ALP (Ambient Light Polling).
> +  Test _LID (Lid Status).
> +  Test _GCP (Get Capabilities).
> +  Test _GRT (Get Real Time).
> +  Test _GWS (Get Wake Status).
> +  Test _STP (Set Expired Timer Wake Policy).
> +  Test _STV (Set Timer Value).
> +  Test _TIP (Expired Timer Wake Policy).
> +  Test _TIV (Timer Values).
> +  Test _SBS (Smart Battery Subsystem).
> +  Test _BCT (Battery Charge Time).
> +  Test _BIF (Battery Information).
> +  Test _BIX (Battery Information Extended).
> +  Test _BMA (Battery Measurement Averaging).
> +  Test _BMC (Battery Maintenance Control).
> +  Test _BMD (Battery Maintenance Data).
> +  Test _BMS (Battery Measurement Sampling Time).
> +  Test _BST (Battery Status).
> +  Test _BTP (Battery Trip Point).
> +  Test _BTM (Battery Time).
> +  Test _PCL (Power Consumer List).
> +  Test _PIF (Power Source Information).
> +  Test _PSR (Power Source).
> +  Test _FIF (Fan Information).
> +  Test _FSL (Fan Set Level).
> +  Test _FST (Fan Status).
> +  Test _ACx (Active Cooling).
> +  Test _CRT (Critical Trip Point).
> +  Test _DTI (Device Temperature Indication).
> +  Test _HOT (Hot Temperature).
> +  Test _NTT (Notification Temp Threshold).
> +  Test _PSV (Passive Temp).
> +  Test _RTV (Relative Temp Values).
> +  Test _SCP (Set Cooling Policy).
> +  Test _TC1 (Thermal Constant 1).
> +  Test _TC2 (Thermal Constant 2).
> +  Test _TMP (Thermal Zone Current Temp).
> +  Test _TPT (Trip Point Temperature).
> +  Test _TSP (Thermal Sampling Period).
> +  Test _TST (Temperature Sensor Threshold).
> +  Test _TZP (Thermal Zone Polling).
> +  Test _PTS (Prepare to Sleep).
> +  Test _TTS (Transition to State).
> +  Test _S0  (System S0 State).
> +  Test _S1  (System S1 State).
> +  Test _S2  (System S2 State).
> +  Test _S3  (System S3 State).
> +  Test _S4  (System S4 State).
> +  Test _S5  (System S5 State).
> +  Test _WAK (System Wake).
> +  Test _ADR (Return Unique ID for Device).
> +  Test _BCL (Query List of Brightness Control Levels Supported).
> +  Test _BCM (Set Brightness Level).
> +  Test _BQC (Brightness Query Current Level).
> +  Test _DCS (Return the Status of Output Device).
> +  Test _DDC (Return the EDID for this Device).
> +  Test _DSS (Device Set State).
> +  Test _DGS (Query Graphics State).
> +  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> +  Test _DOS (Enable/Disable Output Switching).
> +  Test _GPD (Get POST Device).
> +  Test _ROM (Get ROM Data).
> +  Test _SPD (Set POST Device).
> +  Test _VPO (Video POST Options).
>    microcode       (1 test):
> -  Check for most recent microcode being loaded.
> +  Test for most recent microcode being loaded.
>    mpcheck         (9 tests):
> -  Check MP header.
> -  Check MP CPU entries.
> -  Check MP Bus entries.
> -  Check MP IO APIC entries.
> -  Check MP IO Interrupt entries.
> -  Check MP Local Interrupt entries.
> -  Check MP System Address entries.
> -  Check MP Bus Hierarchy entries.
> -  Check MP Compatible Bus Address Space entries.
> +  Test MP header.
> +  Test MP CPU entries.
> +  Test MP Bus entries.
> +  Test MP IO APIC entries.
> +  Test MP IO Interrupt entries.
> +  Test MP Local Interrupt entries.
> +  Test MP System Address entries.
> +  Test MP Bus Hierarchy entries.
> +  Test MP Compatible Bus Address Space entries.
>    msr             (5 tests):
> -  Check CPU generic MSRs.
> -  Check CPU specific model MSRs.
> -  Check all P State Ratios.
> -  Check C1 and C3 autodemotion.
> -  Check SMRR MSR registers.
> +  Test CPU generic MSRs.
> +  Test CPU specific model MSRs.
> +  Test all P State Ratios.
> +  Test C1 and C3 autodemotion.
> +  Test SMRR MSR registers.
>    mtrr            (3 tests):
>     Validate the kernel MTRR IOMEM setup.
>     Validate the MTRR setup across all processors.
> -  Check for AMD MtrrFixDramModEn being cleared by the BIOS.
> +  Test for AMD MtrrFixDramModEn being cleared by the BIOS.
>    nx              (3 tests):
> -  Check CPU NX capability.
> -  Check all CPUs have same BIOS set NX flag.
> -  Check all CPUs have same msr setting in MSR 0x1a0.
> +  Test CPU NX capability.
> +  Test all CPUs have same BIOS set NX flag.
> +  Test all CPUs have same msr setting in MSR 0x1a0.
>    oops            (1 test):
>     Kernel log oops check.
>    os2gap          (1 test):
> -  Check the OS/2 15Mb memory hole is absent.
> +  Test the OS/2 15Mb memory hole is absent.
>    osilinux        (1 test):
>     Disassemble DSDT to check for _OSI("Linux").
>    pcc             (1 test):
> -  Check PCCH.
> +  Processor Clocking Control (PCC) test.
>    pciirq          (1 test):
> -  PCI IRQ Routing Table.
> +  PCI IRQ Routing Table test.
>    pnp             (1 test):
> -  Check PnP BIOS Support Installation structure.
> +  PnP BIOS Support Installation structure test.
>    securebootcert  (1 test):
>     Ubuntu UEFI secure boot test.
>    syntaxcheck     (2 tests):
> @@ -249,14 +249,14 @@ Batch tests:
>     Gather kernel boot command line.
>     Gather ACPI driver version.
>    virt            (1 test):
> -  Check CPU Virtualisation Configuration.
> +  CPU Virtualisation Configuration test.
>    wakealarm       (4 tests):
> -  Check existence of /sys/class/rtc/rtc0/wakealarm.
> +  Test existence of /sys/class/rtc/rtc0/wakealarm.
>     Trigger wakealarm for 1 seconds in the future.
> -  Check if wakealarm is fired.
> +  Test if wakealarm is fired.
>     Multiple wakealarm firing tests.
>    wmi             (1 test):
> -  Check Windows Management Instrumentation
> +  Windows Management Instrumentation test.
>
>   Interactive tests:
>    ac_adapter      (3 tests):
> @@ -264,13 +264,13 @@ Interactive tests:
>     Test ac_adapter initial on-line state.
>     Test ac_adapter state changes.
>    battery         (1 test):
> -  Check batteries.
> +  Battery test.
>    brightness      (5 tests):
> -  Check for maximum and actual brightness.
> +  Test for maximum and actual brightness.
>     Change actual brightness.
>     Observe all brightness changes.
>     Observe min, max brightness changes.
> -  Check brightness hotkeys.
> +  Test brightness hotkeys.
>    hotkey          (1 test):
>     Hotkey keypress checks.
>    lid             (3 tests):
> @@ -328,7 +328,7 @@ Unsafe tests:
>
>   UEFI tests:
>    csm             (1 test):
> -  Check for UEFI Compatibility Support Module.
> +  UEFI Compatibility Support Module test.
>    securebootcert  (1 test):
>     Ubuntu UEFI secure boot test.
>    uefirtmisc      (2 tests):
> diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log
> index 4efca9b..d720e06 100644
> --- a/checksum-0001/checksum-0001.log
> +++ b/checksum-0001/checksum-0001.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>   checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>   checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
>   checksum        PASSED: Test 1, Table FACP has correct checksum 0x52.
>   checksum        PASSED: Test 1, Table APIC has correct checksum 0xcc.
> diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log
> index 75925bb..4ab586a 100644
> --- a/checksum-0001/checksum-0003.log
> +++ b/checksum-0001/checksum-0003.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>   checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>   checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got
>   checksum        0x10.
>   checksum
> diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log
> index d092674..f69a42a 100644
> --- a/checksum-0001/checksum-0004.log
> +++ b/checksum-0001/checksum-0004.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>   checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>   checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
>   checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got
>   checksum        0x53.
> diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log
> index e41aa26..bf2c976 100644
> --- a/method-0001/method-0001.log
> +++ b/method-0001/method-0001.log
> @@ -1,18 +1,18 @@
> -method          method: ACPI DSDT Method Semantic Tests.
> +method          method: ACPI DSDT Method Semantic tests.
>   method          ----------------------------------------------------------
> -method          Test 1 of 144: Check Method Names.
> +method          Test 1 of 144: Test Method Names.
>   method          Found 1061 Objects
>   method          PASSED: Test 1, Method names contain legal characters.
>   method
> -method          Test 2 of 144: Check _AEI.
> +method          Test 2 of 144: Test _AEI.
>   method          SKIPPED: Test 2, Skipping test for non-existant object
>   method          _AEI.
>   method
> -method          Test 3 of 144: Check _DDN (DOS Device Name).
> +method          Test 3 of 144: Test _DDN (DOS Device Name).
>   method          SKIPPED: Test 3, Skipping test for non-existant object
>   method          _DDN.
>   method
> -method          Test 4 of 144: Check _HID (Hardware ID).
> +method          Test 4 of 144: Test _HID (Hardware ID).
>   method          PASSED: Test 4, \_SB_.AMW0._HID returned a string
>   method          'PNP0C14' as expected.
>   method          PASSED: Test 4, \_SB_.LID0._HID returned an integer
> @@ -66,27 +66,27 @@ method          integer 0x0303d041 (EISA ID PNP0303).
>   method          PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an
>   method          integer 0x130fd041 (EISA ID PNP0F13).
>   method
> -method          Test 5 of 144: Check _HRV (Hardware Revision Number).
> +method          Test 5 of 144: Test _HRV (Hardware Revision Number).
>   method          SKIPPED: Test 5, Skipping test for non-existant object
>   method          _HRV.
>   method
> -method          Test 6 of 144: Check _PLD (Physical Device Location).
> +method          Test 6 of 144: Test _PLD (Physical Device Location).
>   method          SKIPPED: Test 6, Skipping test for non-existant object
>   method          _PLD.
>   method
> -method          Test 7 of 144: Check _SUB (Subsystem ID).
> +method          Test 7 of 144: Test _SUB (Subsystem ID).
>   method          SKIPPED: Test 7, Skipping test for non-existant object
>   method          _SUB.
>   method
> -method          Test 8 of 144: Check _SUN (Slot User Number).
> +method          Test 8 of 144: Test _SUN (Slot User Number).
>   method          SKIPPED: Test 8, Skipping test for non-existant object
>   method          _SUN.
>   method
> -method          Test 9 of 144: Check _STR (String).
> +method          Test 9 of 144: Test _STR (String).
>   method          SKIPPED: Test 9, Skipping test for non-existant object
>   method          _STR.
>   method
> -method          Test 10 of 144: Check _UID (Unique ID).
> +method          Test 10 of 144: Test _UID (Unique ID).
>   method          PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane
>   method          looking value 0x00000000.
>   method          PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned
> @@ -112,7 +112,7 @@ method          returned sane looking value 0x00000002.
>   method          PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly
>   method          returned sane looking value 0x00000001.
>   method
> -method          Test 11 of 144: Check _CRS (Current Resource Settings).
> +method          Test 11 of 144: Test _CRS (Current Resource Settings).
>   method          PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space
>   method          Descriptor) looks sane.
>   method          PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
> @@ -156,7 +156,7 @@ method          Descriptor) looks sane.
>   method          PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
>   method          Descriptor) looks sane.
>   method
> -method          Test 12 of 144: Check _DIS (Disable).
> +method          Test 12 of 144: Test _DIS (Disable).
>   method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no
>   method          values as expected.
>   method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no
> @@ -174,24 +174,24 @@ method          values as expected.
>   method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no
>   method          values as expected.
>   method
> -method          Test 13 of 144: Check _DMA (Direct Memory Access).
> +method          Test 13 of 144: Test _DMA (Direct Memory Access).
>   method          SKIPPED: Test 13, Skipping test for non-existant object
>   method          _DMA.
>   method
> -method          Test 14 of 144: Check _FIX (Fixed Register Resource
> +method          Test 14 of 144: Test _FIX (Fixed Register Resource
>   method          Provider).
>   method          SKIPPED: Test 14, Skipping test for non-existant object
>   method          _FIX.
>   method
> -method          Test 15 of 144: Check _GSB (Global System Interrupt Base).
> +method          Test 15 of 144: Test _GSB (Global System Interrupt Base).
>   method          SKIPPED: Test 15, Skipping test for non-existant object
>   method          _GSB.
>   method
> -method          Test 16 of 144: Check _HPP (Hot Plug Parameters).
> +method          Test 16 of 144: Test _HPP (Hot Plug Parameters).
>   method          SKIPPED: Test 16, Skipping test for non-existant object
>   method          _HPP.
>   method
> -method          Test 17 of 144: Check _PRS (Possible Resource Settings).
> +method          Test 17 of 144: Test _PRS (Possible Resource Settings).
>   method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
>   method          Descriptor) looks sane.
>   method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
> @@ -209,47 +209,47 @@ method          Descriptor) looks sane.
>   method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
>   method          Descriptor) looks sane.
>   method
> -method          Test 18 of 144: Check _PXM (Proximity).
> +method          Test 18 of 144: Test _PXM (Proximity).
>   method          SKIPPED: Test 18, Skipping test for non-existant object
>   method          _PXM.
>   method
> -method          Test 19 of 144: Check _EDL (Eject Device List).
> +method          Test 19 of 144: Test _EDL (Eject Device List).
>   method          SKIPPED: Test 19, Skipping test for non-existant object
>   method          _EDL.
>   method
> -method          Test 20 of 144: Check _EJD (Ejection Dependent Device).
> +method          Test 20 of 144: Test _EJD (Ejection Dependent Device).
>   method          SKIPPED: Test 20, Skipping test for non-existant object
>   method          _EJD.
>   method
> -method          Test 21 of 144: Check _EJ0 (Eject).
> +method          Test 21 of 144: Test _EJ0 (Eject).
>   method          SKIPPED: Test 21, Skipping test for non-existant object
>   method          _EJ0.
>   method
> -method          Test 22 of 144: Check _EJ1 (Eject).
> +method          Test 22 of 144: Test _EJ1 (Eject).
>   method          SKIPPED: Test 22, Skipping test for non-existant object
>   method          _EJ1.
>   method
> -method          Test 23 of 144: Check _EJ2 (Eject).
> +method          Test 23 of 144: Test _EJ2 (Eject).
>   method          SKIPPED: Test 23, Skipping test for non-existant object
>   method          _EJ2.
>   method
> -method          Test 24 of 144: Check _EJ3 (Eject).
> +method          Test 24 of 144: Test _EJ3 (Eject).
>   method          SKIPPED: Test 24, Skipping test for non-existant object
>   method          _EJ3.
>   method
> -method          Test 25 of 144: Check _EJ4 (Eject).
> +method          Test 25 of 144: Test _EJ4 (Eject).
>   method          SKIPPED: Test 25, Skipping test for non-existant object
>   method          _EJ4.
>   method
> -method          Test 26 of 144: Check _LCK (Lock).
> +method          Test 26 of 144: Test _LCK (Lock).
>   method          SKIPPED: Test 26, Skipping test for non-existant object
>   method          _LCK.
>   method
> -method          Test 27 of 144: Check _RMV (Remove).
> +method          Test 27 of 144: Test _RMV (Remove).
>   method          PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly
>   method          returned sane looking value 0x00000001.
>   method
> -method          Test 28 of 144: Check _STA (Status).
> +method          Test 28 of 144: Test _STA (Status).
>   method          PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly
>   method          returned sane looking value 0x0000000f.
>   method          PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly
> @@ -273,91 +273,91 @@ method          returned sane looking value 0x00000000.
>   method          PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly
>   method          returned sane looking value 0x0000001f.
>   method
> -method          Test 29 of 144: Check _BDN (BIOS Dock Name).
> +method          Test 29 of 144: Test _BDN (BIOS Dock Name).
>   method          SKIPPED: Test 29, Skipping test for non-existant object
>   method          _BDN.
>   method
> -method          Test 30 of 144: Check _BBN (Base Bus Number).
> +method          Test 30 of 144: Test _BBN (Base Bus Number).
>   method          SKIPPED: Test 30, Skipping test for non-existant object
>   method          _BBN.
>   method
> -method          Test 31 of 144: Check _DCK (Dock).
> +method          Test 31 of 144: Test _DCK (Dock).
>   method          SKIPPED: Test 31, Skipping test for non-existant object
>   method          _DCK.
>   method
> -method          Test 32 of 144: Check _INI (Initialize).
> +method          Test 32 of 144: Test _INI (Initialize).
>   method          PASSED: Test 32, \_SB_._INI returned no values as
>   method          expected.
>   method
> -method          Test 33 of 144: Check _SEG (Segment).
> +method          Test 33 of 144: Test _SEG (Segment).
>   method          SKIPPED: Test 33, Skipping test for non-existant object
>   method          _SEG.
>   method
> -method          Test 34 of 144: Check _OFF (Set resource off).
> +method          Test 34 of 144: Test _OFF (Set resource off).
>   method          SKIPPED: Test 34, Skipping test for non-existant object
>   method          _OFF.
>   method
> -method          Test 35 of 144: Check _ON (Set resource on).
> +method          Test 35 of 144: Test _ON (Set resource on).
>   method          SKIPPED: Test 35, Skipping test for non-existant object
>   method          _ON.
>   method
> -method          Test 36 of 144: Check _DSW (Device Sleep Wake).
> +method          Test 36 of 144: Test _DSW (Device Sleep Wake).
>   method          SKIPPED: Test 36, Skipping test for non-existant object
>   method          _DSW.
>   method
> -method          Test 37 of 144: Check _IRC (In Rush Current).
> +method          Test 37 of 144: Test _IRC (In Rush Current).
>   method          SKIPPED: Test 37, Skipping test for non-existant object
>   method          _IRC.
>   method
> -method          Test 38 of 144: Check _PRE (Power Resources for
> +method          Test 38 of 144: Test _PRE (Power Resources for
>   method          Enumeration).
>   method          SKIPPED: Test 38, Skipping test for non-existant object
>   method          _PRE.
>   method
> -method          Test 39 of 144: Check _PR0 (Power Resources for D0).
> +method          Test 39 of 144: Test _PR0 (Power Resources for D0).
>   method          SKIPPED: Test 39, Skipping test for non-existant object
>   method          _PR0.
>   method
> -method          Test 40 of 144: Check _PR1 (Power Resources for D1).
> +method          Test 40 of 144: Test _PR1 (Power Resources for D1).
>   method          SKIPPED: Test 40, Skipping test for non-existant object
>   method          _PR1.
>   method
> -method          Test 41 of 144: Check _PR2 (Power Resources for D2).
> +method          Test 41 of 144: Test _PR2 (Power Resources for D2).
>   method          SKIPPED: Test 41, Skipping test for non-existant object
>   method          _PR2.
>   method
> -method          Test 42 of 144: Check _PR3 (Power Resources for D3).
> +method          Test 42 of 144: Test _PR3 (Power Resources for D3).
>   method          SKIPPED: Test 42, Skipping test for non-existant object
>   method          _PR3.
>   method
> -method          Test 43 of 144: Check _PS0 (Power State 0).
> +method          Test 43 of 144: Test _PS0 (Power State 0).
>   method          PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
>   method          values as expected.
>   method          PASSED: Test 43, \_PS0 returned no values as expected.
>   method
> -method          Test 44 of 144: Check _PS1 (Power State 1).
> +method          Test 44 of 144: Test _PS1 (Power State 1).
>   method          PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
>   method          values as expected.
>   method
> -method          Test 45 of 144: Check _PS2 (Power State 2).
> +method          Test 45 of 144: Test _PS2 (Power State 2).
>   method          SKIPPED: Test 45, Skipping test for non-existant object
>   method          _PS2.
>   method
> -method          Test 46 of 144: Check _PS3 (Power State 3).
> +method          Test 46 of 144: Test _PS3 (Power State 3).
>   method          PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
>   method          values as expected.
>   method          PASSED: Test 46, \_PS3 returned no values as expected.
>   method
> -method          Test 47 of 144: Check _PSC (Power State Current).
> +method          Test 47 of 144: Test _PSC (Power State Current).
>   method          PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly
>   method          returned an integer.
>   method          PASSED: Test 47, \_PSC correctly returned an integer.
>   method
> -method          Test 48 of 144: Check _PSE (Power State for Enumeration).
> +method          Test 48 of 144: Test _PSE (Power State for Enumeration).
>   method          SKIPPED: Test 48, Skipping test for non-existant object
>   method          _PSE.
>   method
> -method          Test 49 of 144: Check _PSW (Power State Wake).
> +method          Test 49 of 144: Test _PSW (Power State Wake).
>   method          PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values
>   method          as expected.
>   method          PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values
> @@ -369,15 +369,15 @@ method          as expected.
>   method          PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values
>   method          as expected.
>   method
> -method          Test 50 of 144: Check _S1D (S1 Device State).
> +method          Test 50 of 144: Test _S1D (S1 Device State).
>   method          SKIPPED: Test 50, Skipping test for non-existant object
>   method          _S1D.
>   method
> -method          Test 51 of 144: Check _S2D (S2 Device State).
> +method          Test 51 of 144: Test _S2D (S2 Device State).
>   method          SKIPPED: Test 51, Skipping test for non-existant object
>   method          _S2D.
>   method
> -method          Test 52 of 144: Check _S3D (S3 Device State).
> +method          Test 52 of 144: Test _S3D (S3 Device State).
>   method          PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an
>   method          integer.
>   method          PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned
> @@ -395,7 +395,7 @@ method          an integer.
>   method          PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned
>   method          an integer.
>   method
> -method          Test 53 of 144: Check _S4D (S4 Device State).
> +method          Test 53 of 144: Test _S4D (S4 Device State).
>   method          PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an
>   method          integer.
>   method          PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned
> @@ -413,115 +413,114 @@ method          an integer.
>   method          PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned
>   method          an integer.
>   method
> -method          Test 54 of 144: Check _S0W (S0 Device Wake State).
> +method          Test 54 of 144: Test _S0W (S0 Device Wake State).
>   method          SKIPPED: Test 54, Skipping test for non-existant object
>   method          _S0W.
>   method
> -method          Test 55 of 144: Check _S1W (S1 Device Wake State).
> +method          Test 55 of 144: Test _S1W (S1 Device Wake State).
>   method          SKIPPED: Test 55, Skipping test for non-existant object
>   method          _S1W.
>   method
> -method          Test 56 of 144: Check _S2W (S2 Device Wake State).
> +method          Test 56 of 144: Test _S2W (S2 Device Wake State).
>   method          SKIPPED: Test 56, Skipping test for non-existant object
>   method          _S2W.
>   method
> -method          Test 57 of 144: Check _S3W (S3 Device Wake State).
> +method          Test 57 of 144: Test _S3W (S3 Device Wake State).
>   method          SKIPPED: Test 57, Skipping test for non-existant object
>   method          _S3W.
>   method
> -method          Test 58 of 144: Check _S4W (S4 Device Wake State).
> +method          Test 58 of 144: Test _S4W (S4 Device Wake State).
>   method          SKIPPED: Test 58, Skipping test for non-existant object
>   method          _S4W.
>   method
> -method          Test 59 of 144: Check _S0_ (S0 System State).
> +method          Test 59 of 144: Test _S0_ (S0 System State).
>   method          \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
>   method          \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
>   method          PASSED: Test 59, \_S0_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 60 of 144: Check _S1_ (S1 System State).
> +method          Test 60 of 144: Test _S1_ (S1 System State).
>   method          SKIPPED: Test 60, Skipping test for non-existant object
>   method          _S1_.
>   method
> -method          Test 61 of 144: Check _S2_ (S2 System State).
> +method          Test 61 of 144: Test _S2_ (S2 System State).
>   method          SKIPPED: Test 61, Skipping test for non-existant object
>   method          _S2_.
>   method
> -method          Test 62 of 144: Check _S3_ (S3 System State).
> +method          Test 62 of 144: Test _S3_ (S3 System State).
>   method          \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
>   method          \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
>   method          PASSED: Test 62, \_S3_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 63 of 144: Check _S4_ (S4 System State).
> +method          Test 63 of 144: Test _S4_ (S4 System State).
>   method          \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
>   method          \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
>   method          PASSED: Test 63, \_S4_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 64 of 144: Check _S5_ (S5 System State).
> +method          Test 64 of 144: Test _S5_ (S5 System State).
>   method          \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
>   method          \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
>   method          PASSED: Test 64, \_S5_ correctly returned a sane looking
>   method          package.
>   method
> -method          Test 65 of 144: Check _SWS (System Wake Source).
> +method          Test 65 of 144: Test _SWS (System Wake Source).
>   method          SKIPPED: Test 65, Skipping test for non-existant object
>   method          _SWS.
>   method
> -method          Test 66 of 144: Check _PSS (Performance Supported States).
> +method          Test 66 of 144: Test _PSS (Performance Supported States).
>   method          SKIPPED: Test 66, Skipping test for non-existant object
>   method          _PSS.
>   method
> -method          Test 67 of 144: Check _CPC (Continuous Performance
> +method          Test 67 of 144: Test _CPC (Continuous Performance
>   method          Control).
>   method          SKIPPED: Test 67, Skipping test for non-existant object
>   method          _CPC.
>   method
> -method          Test 68 of 144: Check _CSD (C State Dependencies).
> +method          Test 68 of 144: Test _CSD (C State Dependencies).
>   method          SKIPPED: Test 68, Skipping test for non-existant object
>   method          _CSD.
>   method
> -method          Test 69 of 144: Check _CST (C States).
> +method          Test 69 of 144: Test _CST (C States).
>   method          SKIPPED: Test 69, Skipping test for non-existant object
>   method          _CST.
>   method
> -method          Test 70 of 144: Check _PCT (Performance Control).
> +method          Test 70 of 144: Test _PCT (Performance Control).
>   method          SKIPPED: Test 70, Skipping test for non-existant object
>   method          _PCT.
>   method
> -method          Test 71 of 144: Check _PDL (P-State Depth Limit).
> +method          Test 71 of 144: Test _PDL (P-State Depth Limit).
>   method          SKIPPED: Test 71, Skipping test for non-existant object
>   method          _PDL.
>   method
> -method          Test 72 of 144: Check _PPC (Performance Present
> +method          Test 72 of 144: Test _PPC (Performance Present
>   method          Capabilities).
>   method          SKIPPED: Test 72, Skipping test for non-existant object
>   method          _PPC.
>   method
> -method          Test 73 of 144: Check _PPE (Polling for Platform Error).
> +method          Test 73 of 144: Test _PPE (Polling for Platform Error).
>   method          SKIPPED: Test 73, Skipping test for non-existant object
>   method          _PPE.
>   method
> -method          Test 74 of 144: Check _TDL (T-State Depth Limit).
> +method          Test 74 of 144: Test _TDL (T-State Depth Limit).
>   method          SKIPPED: Test 74, Skipping test for non-existant object
>   method          _TDL.
>   method
> -method          Test 75 of 144: Check _TPC (Throttling Present
> +method          Test 75 of 144: Test _TPC (Throttling Present
>   method          Capabilities).
>   method          PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an
>   method          integer.
>   method          PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an
>   method          integer.
>   method
> -method          Test 76 of 144: Check _TSD (Throttling State
> -method          Dependencies).
> +method          Test 76 of 144: Test _TSD (Throttling State Dependencies).
>   method          PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane
>   method          looking package.
>   method          PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane
>   method          looking package.
>   method
> -method          Test 77 of 144: Check _TSS (Throttling Supported States).
> +method          Test 77 of 144: Test _TSS (Throttling Supported States).
>   method          \_PR_.CPU0._TSS values:
>   method          T-State  CPU     Power   Latency  Control  Status
>   method                   Freq    (mW)    (usecs)
> @@ -549,125 +548,123 @@ method              7     13%      125        0      09      00
>   method          PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane
>   method          looking package.
>   method
> -method          Test 78 of 144: Check _ALC (Ambient Light Colour
> +method          Test 78 of 144: Test _ALC (Ambient Light Colour
>   method          Chromaticity).
>   method          SKIPPED: Test 78, Skipping test for non-existant object
>   method          _ALC.
>   method
> -method          Test 79 of 144: Check _ALI (Ambient Light Illuminance).
> +method          Test 79 of 144: Test _ALI (Ambient Light Illuminance).
>   method          SKIPPED: Test 79, Skipping test for non-existant object
>   method          _ALI.
>   method
> -method          Test 80 of 144: Check _ALT (Ambient Light Temperature).
> +method          Test 80 of 144: Test _ALT (Ambient Light Temperature).
>   method          SKIPPED: Test 80, Skipping test for non-existant object
>   method          _ALT.
>   method
> -method          Test 81 of 144: Check _ALP (Ambient Light Polling).
> +method          Test 81 of 144: Test _ALP (Ambient Light Polling).
>   method          SKIPPED: Test 81, Skipping test for non-existant object
>   method          _ALP.
>   method
> -method          Test 82 of 144: Check _LID (Lid Status).
> +method          Test 82 of 144: Test _LID (Lid Status).
>   method          PASSED: Test 82, \_SB_.LID0._LID correctly returned sane
>   method          looking value 0x00000000.
>   method
> -method          Test 83 of 144: Check _GCP (Get Capabilities).
> +method          Test 83 of 144: Test _GCP (Get Capabilities).
>   method          SKIPPED: Test 83, Skipping test for non-existant object
>   method          _GCP.
>   method
> -method          Test 84 of 144: Check _GRT (Get Real Time).
> +method          Test 84 of 144: Test _GRT (Get Real Time).
>   method          SKIPPED: Test 84, Skipping test for non-existant object
>   method          _GRT.
>   method
> -method          Test 85 of 144: Check _GWS (Get Wake Status).
> +method          Test 85 of 144: Test _GWS (Get Wake Status).
>   method          SKIPPED: Test 85, Skipping test for non-existant object
>   method          _GWS.
>   method
> -method          Test 86 of 144: Check _STP (Set Expired Timer Wake
> -method          Policy).
> +method          Test 86 of 144: Test _STP (Set Expired Timer Wake Policy).
>   method          SKIPPED: Test 86, Skipping test for non-existant object
>   method          _STP.
>   method
> -method          Test 87 of 144: Check _STV (Set Timer Value).
> +method          Test 87 of 144: Test _STV (Set Timer Value).
>   method          SKIPPED: Test 87, Skipping test for non-existant object
>   method          _STV.
>   method
> -method          Test 88 of 144: Check _TIP (Expired Timer Wake Policy).
> +method          Test 88 of 144: Test _TIP (Expired Timer Wake Policy).
>   method          SKIPPED: Test 88, Skipping test for non-existant object
>   method          _TIP.
>   method
> -method          Test 89 of 144: Check _TIV (Timer Values).
> +method          Test 89 of 144: Test _TIV (Timer Values).
>   method          SKIPPED: Test 89, Skipping test for non-existant object
>   method          _TIV.
>   method
> -method          Test 90 of 144: Check _SBS (Smart Battery Subsystem).
> +method          Test 90 of 144: Test _SBS (Smart Battery Subsystem).
>   method          SKIPPED: Test 90, Skipping test for non-existant object
>   method          _SBS.
>   method
> -method          Test 91 of 144: Check _BCT (Battery Charge Time).
> +method          Test 91 of 144: Test _BCT (Battery Charge Time).
>   method          SKIPPED: Test 91, Skipping test for non-existant object
>   method          _BCT.
>   method
> -method          Test 92 of 144: Check _BIF (Battery Information).
> +method          Test 92 of 144: Test _BIF (Battery Information).
>   method          PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly
>   method          returned a sane looking package.
>   method
> -method          Test 93 of 144: Check _BIX (Battery Information Extended).
> +method          Test 93 of 144: Test _BIX (Battery Information Extended).
>   method          SKIPPED: Test 93, Skipping test for non-existant object
>   method          _BIX.
>   method
> -method          Test 94 of 144: Check _BMA (Battery Measurement
> -method          Averaging).
> +method          Test 94 of 144: Test _BMA (Battery Measurement Averaging).
>   method          SKIPPED: Test 94, Skipping test for non-existant object
>   method          _BMA.
>   method
> -method          Test 95 of 144: Check _BMC (Battery Maintenance Control).
> +method          Test 95 of 144: Test _BMC (Battery Maintenance Control).
>   method          SKIPPED: Test 95, Skipping test for non-existant object
>   method          _BMC.
>   method
> -method          Test 96 of 144: Check _BMD (Battery Maintenance Data).
> +method          Test 96 of 144: Test _BMD (Battery Maintenance Data).
>   method          SKIPPED: Test 96, Skipping test for non-existant object
>   method          _BMD.
>   method
> -method          Test 97 of 144: Check _BMS (Battery Measurement Sampling
> +method          Test 97 of 144: Test _BMS (Battery Measurement Sampling
>   method          Time).
>   method          SKIPPED: Test 97, Skipping test for non-existant object
>   method          _BMS.
>   method
> -method          Test 98 of 144: Check _BST (Battery Status).
> +method          Test 98 of 144: Test _BST (Battery Status).
>   method          PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly
>   method          returned a sane looking package.
>   method
> -method          Test 99 of 144: Check _BTP (Battery Trip Point).
> +method          Test 99 of 144: Test _BTP (Battery Trip Point).
>   method          SKIPPED: Test 99, Skipping test for non-existant object
>   method          _BTP.
>   method
> -method          Test 100 of 144: Check _BTM (Battery Time).
> +method          Test 100 of 144: Test _BTM (Battery Time).
>   method          SKIPPED: Test 100, Skipping test for non-existant object
>   method          _BTM.
>   method
> -method          Test 101 of 144: Check _PCL (Power Consumer List).
> +method          Test 101 of 144: Test _PCL (Power Consumer List).
>   method
> -method          Test 102 of 144: Check _PIF (Power Source Information).
> +method          Test 102 of 144: Test _PIF (Power Source Information).
>   method          SKIPPED: Test 102, Skipping test for non-existant object
>   method          _PIF.
>   method
> -method          Test 103 of 144: Check _PSR (Power Source).
> +method          Test 103 of 144: Test _PSR (Power Source).
>   method          PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly
>   method          returned sane looking value 0x00000000.
>   method
> -method          Test 104 of 144: Check _FIF (Fan Information).
> +method          Test 104 of 144: Test _FIF (Fan Information).
>   method          SKIPPED: Test 104, Skipping test for non-existant object
>   method          _FIF.
>   method
> -method          Test 105 of 144: Check _FSL (Fan Set Level).
> +method          Test 105 of 144: Test _FSL (Fan Set Level).
>   method          SKIPPED: Test 105, Skipping test for non-existant object
>   method          _FSL.
>   method
> -method          Test 106 of 144: Check _FST (Fan Status).
> +method          Test 106 of 144: Test _FST (Fan Status).
>   method          SKIPPED: Test 106, Skipping test for non-existant object
>   method          _FST.
>   method
> -method          Test 107 of 144: Check _ACx (Active Cooling).
> +method          Test 107 of 144: Test _ACx (Active Cooling).
>   method          PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly
>   method          returned a sane looking return type.
>   method
> @@ -699,65 +696,64 @@ method          SKIPPED: Test 107, Skipping test for non-existant object
>   method          AC9.
>   method
>   method
> -method          Test 108 of 144: Check _CRT (Critical Trip Point).
> +method          Test 108 of 144: Test _CRT (Critical Trip Point).
>   method          SKIPPED: Test 108, Skipping test for non-existant object
>   method          _CRT.
>   method
> -method          Test 109 of 144: Check _DTI (Device Temperature
> +method          Test 109 of 144: Test _DTI (Device Temperature
>   method          Indication).
>   method          SKIPPED: Test 109, Skipping test for non-existant object
>   method          _DTI.
>   method
> -method          Test 110 of 144: Check _HOT (Hot Temperature).
> +method          Test 110 of 144: Test _HOT (Hot Temperature).
>   method          SKIPPED: Test 110, Skipping test for non-existant object
>   method          _HOT.
>   method
> -method          Test 111 of 144: Check _NTT (Notification Temp Threshold).
> +method          Test 111 of 144: Test _NTT (Notification Temp Threshold).
>   method          SKIPPED: Test 111, Skipping test for non-existant object
>   method          _NTT.
>   method
> -method          Test 112 of 144: Check _PSV (Passive Temp).
> +method          Test 112 of 144: Test _PSV (Passive Temp).
>   method          SKIPPED: Test 112, Skipping test for non-existant object
>   method          _PSV.
>   method
> -method          Test 113 of 144: Check _RTV (Relative Temp Values).
> +method          Test 113 of 144: Test _RTV (Relative Temp Values).
>   method          SKIPPED: Test 113, Skipping test for non-existant object
>   method          _RTV.
>   method
> -method          Test 114 of 144: Check _SCP (Set Cooling Policy).
> +method          Test 114 of 144: Test _SCP (Set Cooling Policy).
>   method          SKIPPED: Test 114, Skipping test for non-existant object
>   method          _DTI.
>   method
> -method          Test 115 of 144: Check _TC1 (Thermal Constant 1).
> +method          Test 115 of 144: Test _TC1 (Thermal Constant 1).
>   method          SKIPPED: Test 115, Skipping test for non-existant object
>   method          _TC1.
>   method
> -method          Test 116 of 144: Check _TC2 (Thermal Constant 2).
> +method          Test 116 of 144: Test _TC2 (Thermal Constant 2).
>   method          SKIPPED: Test 116, Skipping test for non-existant object
>   method          _TC2.
>   method
> -method          Test 117 of 144: Check _TMP (Thermal Zone Current Temp).
> +method          Test 117 of 144: Test _TMP (Thermal Zone Current Temp).
>   method          SKIPPED: Test 117, Skipping test for non-existant object
>   method          _TMP.
>   method
> -method          Test 118 of 144: Check _TPT (Trip Point Temperature).
> +method          Test 118 of 144: Test _TPT (Trip Point Temperature).
>   method          SKIPPED: Test 118, Skipping test for non-existant object
>   method          _TPT.
>   method
> -method          Test 119 of 144: Check _TSP (Thermal Sampling Period).
> +method          Test 119 of 144: Test _TSP (Thermal Sampling Period).
>   method          SKIPPED: Test 119, Skipping test for non-existant object
>   method          _TSP.
>   method
> -method          Test 120 of 144: Check _TST (Temperature Sensor
> -method          Threshold).
> +method          Test 120 of 144: Test _TST (Temperature Sensor Threshold).
>   method          SKIPPED: Test 120, Skipping test for non-existant object
>   method          _TST.
>   method
> -method          Test 121 of 144: Check _TZP (Thermal Zone Polling).
> +method          Test 121 of 144: Test _TZP (Thermal Zone Polling).
>   method          SKIPPED: Test 121, Skipping test for non-existant object
>   method          _TZP.
>   method
> -method          Test 122 of 144: Check _PTS (Prepare to Sleep).
> +method          Test 122 of 144: Test _PTS (Prepare to Sleep).
>   method          Test _PTS(1).
>   method          PASSED: Test 122, \_PTS returned no values as expected.
>   method
> @@ -774,35 +770,35 @@ method          Test _PTS(5).
>   method          PASSED: Test 122, \_PTS returned no values as expected.
>   method
>   method
> -method          Test 123 of 144: Check _TTS (Transition to State).
> +method          Test 123 of 144: Test _TTS (Transition to State).
>   method          SKIPPED: Test 123, Optional control method _TTS does not
>   method          exist.
>   method
> -method          Test 124 of 144: Check _S0 (System S0 State).
> +method          Test 124 of 144: Test _S0 (System S0 State).
>   method          SKIPPED: Test 124, Skipping test for non-existant object
>   method          _S0.
>   method
> -method          Test 125 of 144: Check _S1 (System S1 State).
> +method          Test 125 of 144: Test _S1 (System S1 State).
>   method          SKIPPED: Test 125, Skipping test for non-existant object
>   method          _S1.
>   method
> -method          Test 126 of 144: Check _S2 (System S2 State).
> +method          Test 126 of 144: Test _S2 (System S2 State).
>   method          SKIPPED: Test 126, Skipping test for non-existant object
>   method          _S2.
>   method
> -method          Test 127 of 144: Check _S3 (System S3 State).
> +method          Test 127 of 144: Test _S3 (System S3 State).
>   method          SKIPPED: Test 127, Skipping test for non-existant object
>   method          _S3.
>   method
> -method          Test 128 of 144: Check _S4 (System S4 State).
> +method          Test 128 of 144: Test _S4 (System S4 State).
>   method          SKIPPED: Test 128, Skipping test for non-existant object
>   method          _S4.
>   method
> -method          Test 129 of 144: Check _S5 (System S5 State).
> +method          Test 129 of 144: Test _S5 (System S5 State).
>   method          SKIPPED: Test 129, Skipping test for non-existant object
>   method          _S5.
>   method
> -method          Test 130 of 144: Check _WAK (System Wake).
> +method          Test 130 of 144: Test _WAK (System Wake).
>   method          Test _WAK(1) System Wake, State S1.
>   method          PASSED: Test 130, \_WAK correctly returned a sane looking
>   method          package.
> @@ -824,7 +820,7 @@ method          PASSED: Test 130, \_WAK correctly returned a sane looking
>   method          package.
>   method
>   method
> -method          Test 131 of 144: Check _ADR (Return Unique ID for Device).
> +method          Test 131 of 144: Test _ADR (Return Unique ID for Device).
>   method          PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned
>   method          an integer.
>   method          PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned
> @@ -936,7 +932,7 @@ method          returned an integer.
>   method          PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned
>   method          an integer.
>   method
> -method          Test 132 of 144: Check _BCL (Query List of Brightness
> +method          Test 132 of 144: Test _BCL (Query List of Brightness
>   method          Control Levels Supported).
>   method          Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
>   method            Level on full power   : 70
> @@ -951,20 +947,20 @@ method            Brightness Levels     : 0, 10, 20, 30, 40, 50, 60, 70
>   method          PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a
>   method          sane package of 10 integers.
>   method
> -method          Test 133 of 144: Check _BCM (Set Brightness Level).
> +method          Test 133 of 144: Test _BCM (Set Brightness Level).
>   method          PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
>   method          no values as expected.
>   method          PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no
>   method          values as expected.
>   method
> -method          Test 134 of 144: Check _BQC (Brightness Query Current
> +method          Test 134 of 144: Test _BQC (Brightness Query Current
>   method          Level).
>   method          PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
>   method          returned an integer.
>   method          PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly
>   method          returned an integer.
>   method
> -method          Test 135 of 144: Check _DCS (Return the Status of Output
> +method          Test 135 of 144: Test _DCS (Return the Status of Output
>   method          Device).
>   method          PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
>   method          returned an integer.
> @@ -983,12 +979,12 @@ method          returned an integer.
>   method          PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly
>   method          returned an integer.
>   method
> -method          Test 136 of 144: Check _DDC (Return the EDID for this
> +method          Test 136 of 144: Test _DDC (Return the EDID for this
>   method          Device).
>   method          SKIPPED: Test 136, Skipping test for non-existant object
>   method          _DDC.
>   method
> -method          Test 137 of 144: Check _DSS (Device Set State).
> +method          Test 137 of 144: Test _DSS (Device Set State).
>   method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
>   method          no values as expected.
>   method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> @@ -1006,7 +1002,7 @@ method          values as expected.
>   method          PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no
>   method          values as expected.
>   method
> -method          Test 138 of 144: Check _DGS (Query Graphics State).
> +method          Test 138 of 144: Test _DGS (Query Graphics State).
>   method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
>   method          returned an integer.
>   method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> @@ -1024,8 +1020,8 @@ method          returned an integer.
>   method          PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly
>   method          returned an integer.
>   method
> -method          Test 139 of 144: Check _DOD (Enumerate All Devices
> -method          Attached to Display Adapter).
> +method          Test 139 of 144: Test _DOD (Enumerate All Devices Attached
> +method          to Display Adapter).
>   method          Device 0:
>   method            Instance:                0
>   method            Display port attachment: 0
> @@ -1059,26 +1055,26 @@ method            Head or pipe ID:         0
>   method          PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned
>   method          a sane looking package.
>   method
> -method          Test 140 of 144: Check _DOS (Enable/Disable Output
> +method          Test 140 of 144: Test _DOS (Enable/Disable Output
>   method          Switching).
>   method          PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no
>   method          values as expected.
>   method          PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values
>   method          as expected.
>   method
> -method          Test 141 of 144: Check _GPD (Get POST Device).
> +method          Test 141 of 144: Test _GPD (Get POST Device).
>   method          SKIPPED: Test 141, Skipping test for non-existant object
>   method          _GPD.
>   method
> -method          Test 142 of 144: Check _ROM (Get ROM Data).
> +method          Test 142 of 144: Test _ROM (Get ROM Data).
>   method          SKIPPED: Test 142, Skipping test for non-existant object
>   method          _ROM.
>   method
> -method          Test 143 of 144: Check _SPD (Set POST Device).
> +method          Test 143 of 144: Test _SPD (Set POST Device).
>   method          SKIPPED: Test 143, Skipping test for non-existant object
>   method          _SPD.
>   method
> -method          Test 144 of 144: Check _VPO (Video POST Options).
> +method          Test 144 of 144: Test _VPO (Video POST Options).
>   method          SKIPPED: Test 144, Skipping test for non-existant object
>   method          _VPO.
>   method
> diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log
> index 0540ba3..aca6243 100644
> --- a/wmi-0001/wmi-0001.log
> +++ b/wmi-0001/wmi-0001.log
> @@ -1,7 +1,7 @@
>   wmi             wmi: Extract and analyse Windows Management
>   wmi             Instrumentation (WMI).
>   wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>   wmi
>   wmi             \_SB_.WMI1._WDG (1 of 9)
>   wmi               GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7
> diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log
> index ab5b704..1732e65 100644
> --- a/wmi-0001/wmi-0002.log
> +++ b/wmi-0001/wmi-0002.log
> @@ -1,7 +1,7 @@
>   wmi             wmi: Extract and analyse Windows Management
>   wmi             Instrumentation (WMI).
>   wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>   wmi
>   wmi             \_SB_.ATKD._WDG (1 of 2)
>   wmi               GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66
> diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log
> index 5f4084d..f1e9aa3 100644
> --- a/wmi-0001/wmi-0003.log
> +++ b/wmi-0001/wmi-0003.log
> @@ -1,7 +1,7 @@
>   wmi             wmi: Extract and analyse Windows Management
>   wmi             Instrumentation (WMI).
>   wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>   wmi
>   wmi             \_SB_.AMW0._WDG (1 of 6)
>   wmi               GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492
>

Acked-by: Ivan Hu <ivan.hu@canonical.com>
Keng-Yu Lin - Nov. 11, 2013, 2:02 p.m.
On Thu, Oct 31, 2013 at 8:01 PM, Colin King <colin.king@canonical.com> wrote:
> From: Colin Ian King <colin.king@canonical.com>
>
> Replacment of "Check" with "Test" in LP: #1246650 means we
> need to update the affected tests.
>
> Signed-off-by: Colin Ian King <colin.king@canonical.com>
> ---
>  acpitables-0001/acpitables-0001.log                |   4 +-
>  acpitables-0002/acpitables-0001.log                |   4 +-
>  acpitables-0002/acpitables-0002.log                |   4 +-
>  acpitables-0003/acpitables-0001.log                |   4 +-
>  acpitables-0004/acpitables-0001.log                |   4 +-
>  acpitables-0005/acpitables-0001.log                |   4 +-
>  acpitables-0006/acpitables-0001.log                |   4 +-
>  acpitables-0007/acpitables-0001.log                |   4 +-
>  acpitables-0008/acpitables-0001.log                |   4 +-
>  apicinstance-0001/apicinstance-0001.log            |   5 +-
>  apicinstance-0001/apicinstance-0002.log            |   5 +-
>  arg-show-tests-0001/arg-show-tests-0001.log        |  62 ++--
>  .../arg-show-tests-full-0001.log                   | 394 ++++++++++-----------
>  checksum-0001/checksum-0001.log                    |   4 +-
>  checksum-0001/checksum-0003.log                    |   4 +-
>  checksum-0001/checksum-0004.log                    |   4 +-
>  method-0001/method-0001.log                        | 296 ++++++++--------
>  wmi-0001/wmi-0001.log                              |   2 +-
>  wmi-0001/wmi-0002.log                              |   2 +-
>  wmi-0001/wmi-0003.log                              |   2 +-
>  20 files changed, 405 insertions(+), 411 deletions(-)
>
> diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log
> index 2f05d15..57d8813 100644
> --- a/acpitables-0001/acpitables-0001.log
> +++ b/acpitables-0001/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      PASSED: Test 1, Table APIC passed.
>  acpitables      Table ECDT not present to check.
>  acpitables      PASSED: Test 1, Table FACP passed.
> diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log
> index 042c83e..22f07a2 100644
> --- a/acpitables-0002/acpitables-0001.log
> +++ b/acpitables-0002/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      PASSED: Test 1, Table APIC passed.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log
> index db437af..c16d257 100644
> --- a/acpitables-0002/acpitables-0002.log
> +++ b/acpitables-0002/acpitables-0002.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local
>  acpitables      APIC flags field, bits 1..31 are reserved and should be
>  acpitables      zero, but are set as: f.
> diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log
> index 2a4d63e..715978b 100644
> --- a/acpitables-0003/acpitables-0001.log
> +++ b/acpitables-0003/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit
> diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log
> index 52491c3..f33e083 100644
> --- a/acpitables-0004/acpitables-0001.log
> +++ b/acpitables-0004/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log
> index cf09a01..2e97b45 100644
> --- a/acpitables-0005/acpitables-0001.log
> +++ b/acpitables-0005/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log
> index 1c2633c..b931cf3 100644
> --- a/acpitables-0006/acpitables-0001.log
> +++ b/acpitables-0006/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log
> index 3e02f91..5d17103 100644
> --- a/acpitables-0007/acpitables-0001.log
> +++ b/acpitables-0007/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log
> index 1a127a6..80ecd20 100644
> --- a/acpitables-0008/acpitables-0001.log
> +++ b/acpitables-0008/acpitables-0001.log
> @@ -1,6 +1,6 @@
> -acpitables      acpitables: ACPI table settings sanity checks.
> +acpitables      acpitables: ACPI table settings sanity tests.
>  acpitables      ----------------------------------------------------------
> -acpitables      Test 1 of 1: Check ACPI tables.
> +acpitables      Test 1 of 1: Test ACPI tables.
>  acpitables      Table APIC not present to check.
>  acpitables      Table ECDT not present to check.
>  acpitables      Table FACP not present to check.
> diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log
> index a185d24..0fcec6e 100644
> --- a/apicinstance-0001/apicinstance-0001.log
> +++ b/apicinstance-0001/apicinstance-0001.log
> @@ -1,7 +1,6 @@
> -apicinstance    apicinstance: Check for single instance of APIC/MADT
> -apicinstance    table.
> +apicinstance    apicinstance: Test for single instance of APIC/MADT table.
>  apicinstance    ----------------------------------------------------------
> -apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
>  apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
>  apicinstance    Found APIC/MADT table APIC @ bf6dff70, length 0x104
>  apicinstance     (and differs from first APIC/MADT table).
> diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log
> index 91fd42e..d3f2eb3 100644
> --- a/apicinstance-0001/apicinstance-0002.log
> +++ b/apicinstance-0001/apicinstance-0002.log
> @@ -1,7 +1,6 @@
> -apicinstance    apicinstance: Check for single instance of APIC/MADT
> -apicinstance    table.
> +apicinstance    apicinstance: Test for single instance of APIC/MADT table.
>  apicinstance    ----------------------------------------------------------
> -apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
> +apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
>  apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104
>  apicinstance    PASSED: Test 1, Found 1 APIC/MADT table(s), as expected.
>  apicinstance
> diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log
> index 06a7619..3068592 100644
> --- a/arg-show-tests-0001/arg-show-tests-0001.log
> +++ b/arg-show-tests-0001/arg-show-tests-0001.log
> @@ -1,49 +1,49 @@
>  Batch tests:
> - acpiinfo        General ACPI information check.
> - acpitables      ACPI table settings sanity checks.
> - apicedge        APIC Edge/Level Check.
> - apicinstance    Check for single instance of APIC/MADT table.
> - aspm            PCIe ASPM check.
> - bios32          Check BIOS32 Service Directory.
> + acpiinfo        General ACPI information test.
> + acpitables      ACPI table settings sanity tests.
> + apicedge        APIC edge/level test.
> + apicinstance    Test for single instance of APIC/MADT table.
> + aspm            PCIe ASPM test.
> + bios32          BIOS32 Service Directory test.
>   bios_info       Gather BIOS DMI information.
> - checksum        Check ACPI table checksum.
> + checksum        ACPI table checksum test.
>   cpufreq         CPU frequency scaling tests.
> - crs             Check PCI host bridge configuration using _CRS.
> - csm             Check for UEFI Compatibility Support Module.
> - cstates         Check processor C state support.
> - dmar            Check sane DMA Remapping (VT-d).
> - dmicheck        Test DMI/SMBIOS tables for errors.
> - ebda            Validate EBDA region is mapped and reserved in memory map table.
> - fadt            FADT SCI_EN enabled check.
> - fan             Simple Fan Tests.
> - hda_audio       Check HDA Audio Pin Configs.
> - hpet_check      HPET configuration test.
> + crs             Test PCI host bridge configuration using _CRS.
> + csm             UEFI Compatibility Support Module test.
> + cstates         Processor C state support test.
> + dmar            DMA Remapping (VT-d) test.
> + dmicheck        DMI/SMBIOS table tests.
> + ebda            Test EBDA region is mapped and reserved in memory map table.
> + fadt            FADT SCI_EN enabled tests.
> + fan             Simple fan tests.
> + hda_audio       HDA Audio Pin Configuration test.
> + hpet_check      HPET configuration tests.
>   klog            Scan kernel log for errors and warnings.
> - maxfreq         Check max CPU frequencies against max scaling frequency.
> - maxreadreq      Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> - mcfg            MCFG PCI Express* memory mapped config space.
> - method          ACPI DSDT Method Semantic Tests.
> - microcode       Check if system is using latest microcode.
> - mpcheck         Check MultiProcessor Tables.
> + maxfreq         Test max CPU frequencies against max scaling frequency.
> + maxreadreq      Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
> + mcfg            MCFG PCI Express* memory mapped config space test.
> + method          ACPI DSDT Method Semantic tests.
> + microcode       Test if system is using latest microcode.
> + mpcheck         MultiProcessor Tables tests.
>   msr             MSR register tests.
> - mtrr            MTRR validation.
> + mtrr            MTRR tests.
>   nx              Test if CPU NX is disabled by the BIOS.
>   oops            Scan kernel log for Oopses.
>   os2gap          OS/2 memory hole test.
>   osilinux        Disassemble DSDT to check for _OSI("Linux").
> - pcc             Processor Clocking Control (PCC) Test.
> - pciirq          Check PCI IRQ Routing Table.
> - pnp             Check BIOS Support Installation structure.
> + pcc             Processor Clocking Control (PCC) test.
> + pciirq          PCI IRQ Routing Table test.
> + pnp             BIOS Support Installation structure test.
>   securebootcert  Ubuntu UEFI secure boot test.
>   syntaxcheck     Re-assemble DSDT and find syntax errors and warnings.
>   version         Gather kernel system information.
> - virt            Test CPU Virtualisation Configuration.
> - wakealarm       Test ACPI Wakealarm.
> + virt            CPU Virtualisation Configuration test.
> + wakealarm       ACPI Wakealarm tests.
>   wmi             Extract and analyse Windows Management Instrumentation (WMI).
>
>  Interactive tests:
>   ac_adapter      Interactive ac_adapter power test.
> - battery         Battery Tests.
> + battery         Battery tests.
>   brightness      Interactive LCD brightness test.
>   hotkey          Hotkey scan code tests.
>   lid             Interactive lid button test.
> @@ -71,7 +71,7 @@ Unsafe tests:
>   uefirtvariable  UEFI Runtime service variable interface tests.
>
>  UEFI tests:
> - csm             Check for UEFI Compatibility Support Module.
> + csm             UEFI Compatibility Support Module test.
>   securebootcert  Ubuntu UEFI secure boot test.
>   uefirtmisc      UEFI miscellaneous runtime service interface tests.
>   uefirttime      UEFI Runtime service time interface tests.
> diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> index f6d3b89..c9c13c5 100644
> --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
> @@ -4,240 +4,240 @@ Batch tests:
>    Determine machine's ACPI version.
>    Determine AML compiler.
>   acpitables      (1 test):
> -  Check ACPI tables.
> +  Test ACPI tables.
>   apicedge        (1 test):
> -  Legacy and PCI Interrupt Edge/Level trigger checks.
> +  Legacy and PCI Interrupt Edge/Level trigger tests.
>   apicinstance    (1 test):
> -  Check single instance of APIC/MADT table.
> +  Test for single instance of APIC/MADT table.
>   aspm            (2 tests):
>    PCIe ASPM ACPI test.
>    PCIe ASPM registers test.
>   bios32          (1 test):
> -  Check BIOS32 Service Directory.
> +  BIOS32 Service Directory test.
>   bios_info       (1 test):
>    Gather BIOS DMI information
>   checksum        (1 test):
> -  Check ACPI table checksums.
> +  ACPI table checksum test.
>   cpufreq         (1 test):
> -  CPU P-State Checks.
> +  CPU P-State tests.
>   crs             (1 test):
> -  Check PCI host bridge configuration using _CRS.
> +  Test PCI host bridge configuration using _CRS.
>   csm             (1 test):
> -  Check for UEFI Compatibility Support Module.
> +  UEFI Compatibility Support Module test.
>   cstates         (1 test):
> -  Check all CPUs C-states.
> +  Test all CPUs C-states.
>   dmar            (1 test):
> -  Check DMA Remapping.
> +  DMA Remapping test.
>   dmicheck        (2 tests):
> -  Find and Check SMBIOS Table Entry Point.
> +  Find and test SMBIOS Table Entry Point.
>    Test DMI/SMBIOS tables for errors.
>   ebda            (1 test):
> -  Check EBDA is reserved in E820 table.
> +  Test EBDA is reserved in E820 table.
>   fadt            (2 tests):
> -  Check FADT SCI_EN bit is enabled.
> -  Check FADT reset register.
> +  Test FADT SCI_EN bit is enabled.
> +  Test FADT reset register.
>   fan             (2 tests):
> -  Check fan status.
> +  Test fan status.
>    Load system, check CPU fan status.
>   hda_audio       (1 test):
> -  Check HDA Audio Pin Configs.
> +  HDA Audio Pin Configuration test.
>   hpet_check      (4 tests):
> -  Check HPET base in kernel log.
> -  Check HPET base in HPET table.
> -  Check HPET base in DSDT and/or SSDT.
> -  Sanity check HPET configuration.
> +  Test HPET base in kernel log.
> +  Test HPET base in HPET table.
> +  Test HPET base in DSDT and/or SSDT.
> +  Test HPET configuration.
>   klog            (1 test):
>    Kernel log error check.
>   maxfreq         (1 test):
> -  Maximum CPU frequency check.
> +  Maximum CPU frequency test.
>   maxreadreq      (1 test):
> -  Check firmware settings MaxReadReq for PCI Express devices.
> +  Test firmware settings MaxReadReq for PCI Express devices.
>   mcfg            (2 tests):
>    Validate MCFG table.
>    Validate MCFG PCI config space.
>   method          (144 tests):
> -  Check Method Names.
> -  Check _AEI.
> -  Check _DDN (DOS Device Name).
> -  Check _HID (Hardware ID).
> -  Check _HRV (Hardware Revision Number).
> -  Check _PLD (Physical Device Location).
> -  Check _SUB (Subsystem ID).
> -  Check _SUN (Slot User Number).
> -  Check _STR (String).
> -  Check _UID (Unique ID).
> -  Check _CRS (Current Resource Settings).
> -  Check _DIS (Disable).
> -  Check _DMA (Direct Memory Access).
> -  Check _FIX (Fixed Register Resource Provider).
> -  Check _GSB (Global System Interrupt Base).
> -  Check _HPP (Hot Plug Parameters).
> -  Check _PRS (Possible Resource Settings).
> -  Check _PXM (Proximity).
> -  Check _EDL (Eject Device List).
> -  Check _EJD (Ejection Dependent Device).
> -  Check _EJ0 (Eject).
> -  Check _EJ1 (Eject).
> -  Check _EJ2 (Eject).
> -  Check _EJ3 (Eject).
> -  Check _EJ4 (Eject).
> -  Check _LCK (Lock).
> -  Check _RMV (Remove).
> -  Check _STA (Status).
> -  Check _BDN (BIOS Dock Name).
> -  Check _BBN (Base Bus Number).
> -  Check _DCK (Dock).
> -  Check _INI (Initialize).
> -  Check _SEG (Segment).
> -  Check _OFF (Set resource off).
> -  Check _ON  (Set resource on).
> -  Check _DSW (Device Sleep Wake).
> -  Check _IRC (In Rush Current).
> -  Check _PRE (Power Resources for Enumeration).
> -  Check _PR0 (Power Resources for D0).
> -  Check _PR1 (Power Resources for D1).
> -  Check _PR2 (Power Resources for D2).
> -  Check _PR3 (Power Resources for D3).
> -  Check _PS0 (Power State 0).
> -  Check _PS1 (Power State 1).
> -  Check _PS2 (Power State 2).
> -  Check _PS3 (Power State 3).
> -  Check _PSC (Power State Current).
> -  Check _PSE (Power State for Enumeration).
> -  Check _PSW (Power State Wake).
> -  Check _S1D (S1 Device State).
> -  Check _S2D (S2 Device State).
> -  Check _S3D (S3 Device State).
> -  Check _S4D (S4 Device State).
> -  Check _S0W (S0 Device Wake State).
> -  Check _S1W (S1 Device Wake State).
> -  Check _S2W (S2 Device Wake State).
> -  Check _S3W (S3 Device Wake State).
> -  Check _S4W (S4 Device Wake State).
> -  Check _S0_ (S0 System State).
> -  Check _S1_ (S1 System State).
> -  Check _S2_ (S2 System State).
> -  Check _S3_ (S3 System State).
> -  Check _S4_ (S4 System State).
> -  Check _S5_ (S5 System State).
> -  Check _SWS (System Wake Source).
> -  Check _PSS (Performance Supported States).
> -  Check _CPC (Continuous Performance Control).
> -  Check _CSD (C State Dependencies).
> -  Check _CST (C States).
> -  Check _PCT (Performance Control).
> -  Check _PDL (P-State Depth Limit).
> -  Check _PPC (Performance Present Capabilities).
> -  Check _PPE (Polling for Platform Error).
> -  Check _TDL (T-State Depth Limit).
> -  Check _TPC (Throttling Present Capabilities).
> -  Check _TSD (Throttling State Dependencies).
> -  Check _TSS (Throttling Supported States).
> -  Check _ALC (Ambient Light Colour Chromaticity).
> -  Check _ALI (Ambient Light Illuminance).
> -  Check _ALT (Ambient Light Temperature).
> -  Check _ALP (Ambient Light Polling).
> -  Check _LID (Lid Status).
> -  Check _GCP (Get Capabilities).
> -  Check _GRT (Get Real Time).
> -  Check _GWS (Get Wake Status).
> -  Check _STP (Set Expired Timer Wake Policy).
> -  Check _STV (Set Timer Value).
> -  Check _TIP (Expired Timer Wake Policy).
> -  Check _TIV (Timer Values).
> -  Check _SBS (Smart Battery Subsystem).
> -  Check _BCT (Battery Charge Time).
> -  Check _BIF (Battery Information).
> -  Check _BIX (Battery Information Extended).
> -  Check _BMA (Battery Measurement Averaging).
> -  Check _BMC (Battery Maintenance Control).
> -  Check _BMD (Battery Maintenance Data).
> -  Check _BMS (Battery Measurement Sampling Time).
> -  Check _BST (Battery Status).
> -  Check _BTP (Battery Trip Point).
> -  Check _BTM (Battery Time).
> -  Check _PCL (Power Consumer List).
> -  Check _PIF (Power Source Information).
> -  Check _PSR (Power Source).
> -  Check _FIF (Fan Information).
> -  Check _FSL (Fan Set Level).
> -  Check _FST (Fan Status).
> -  Check _ACx (Active Cooling).
> -  Check _CRT (Critical Trip Point).
> -  Check _DTI (Device Temperature Indication).
> -  Check _HOT (Hot Temperature).
> -  Check _NTT (Notification Temp Threshold).
> -  Check _PSV (Passive Temp).
> -  Check _RTV (Relative Temp Values).
> -  Check _SCP (Set Cooling Policy).
> -  Check _TC1 (Thermal Constant 1).
> -  Check _TC2 (Thermal Constant 2).
> -  Check _TMP (Thermal Zone Current Temp).
> -  Check _TPT (Trip Point Temperature).
> -  Check _TSP (Thermal Sampling Period).
> -  Check _TST (Temperature Sensor Threshold).
> -  Check _TZP (Thermal Zone Polling).
> -  Check _PTS (Prepare to Sleep).
> -  Check _TTS (Transition to State).
> -  Check _S0  (System S0 State).
> -  Check _S1  (System S1 State).
> -  Check _S2  (System S2 State).
> -  Check _S3  (System S3 State).
> -  Check _S4  (System S4 State).
> -  Check _S5  (System S5 State).
> -  Check _WAK (System Wake).
> -  Check _ADR (Return Unique ID for Device).
> -  Check _BCL (Query List of Brightness Control Levels Supported).
> -  Check _BCM (Set Brightness Level).
> -  Check _BQC (Brightness Query Current Level).
> -  Check _DCS (Return the Status of Output Device).
> -  Check _DDC (Return the EDID for this Device).
> -  Check _DSS (Device Set State).
> -  Check _DGS (Query Graphics State).
> -  Check _DOD (Enumerate All Devices Attached to Display Adapter).
> -  Check _DOS (Enable/Disable Output Switching).
> -  Check _GPD (Get POST Device).
> -  Check _ROM (Get ROM Data).
> -  Check _SPD (Set POST Device).
> -  Check _VPO (Video POST Options).
> +  Test Method Names.
> +  Test _AEI.
> +  Test _DDN (DOS Device Name).
> +  Test _HID (Hardware ID).
> +  Test _HRV (Hardware Revision Number).
> +  Test _PLD (Physical Device Location).
> +  Test _SUB (Subsystem ID).
> +  Test _SUN (Slot User Number).
> +  Test _STR (String).
> +  Test _UID (Unique ID).
> +  Test _CRS (Current Resource Settings).
> +  Test _DIS (Disable).
> +  Test _DMA (Direct Memory Access).
> +  Test _FIX (Fixed Register Resource Provider).
> +  Test _GSB (Global System Interrupt Base).
> +  Test _HPP (Hot Plug Parameters).
> +  Test _PRS (Possible Resource Settings).
> +  Test _PXM (Proximity).
> +  Test _EDL (Eject Device List).
> +  Test _EJD (Ejection Dependent Device).
> +  Test _EJ0 (Eject).
> +  Test _EJ1 (Eject).
> +  Test _EJ2 (Eject).
> +  Test _EJ3 (Eject).
> +  Test _EJ4 (Eject).
> +  Test _LCK (Lock).
> +  Test _RMV (Remove).
> +  Test _STA (Status).
> +  Test _BDN (BIOS Dock Name).
> +  Test _BBN (Base Bus Number).
> +  Test _DCK (Dock).
> +  Test _INI (Initialize).
> +  Test _SEG (Segment).
> +  Test _OFF (Set resource off).
> +  Test _ON  (Set resource on).
> +  Test _DSW (Device Sleep Wake).
> +  Test _IRC (In Rush Current).
> +  Test _PRE (Power Resources for Enumeration).
> +  Test _PR0 (Power Resources for D0).
> +  Test _PR1 (Power Resources for D1).
> +  Test _PR2 (Power Resources for D2).
> +  Test _PR3 (Power Resources for D3).
> +  Test _PS0 (Power State 0).
> +  Test _PS1 (Power State 1).
> +  Test _PS2 (Power State 2).
> +  Test _PS3 (Power State 3).
> +  Test _PSC (Power State Current).
> +  Test _PSE (Power State for Enumeration).
> +  Test _PSW (Power State Wake).
> +  Test _S1D (S1 Device State).
> +  Test _S2D (S2 Device State).
> +  Test _S3D (S3 Device State).
> +  Test _S4D (S4 Device State).
> +  Test _S0W (S0 Device Wake State).
> +  Test _S1W (S1 Device Wake State).
> +  Test _S2W (S2 Device Wake State).
> +  Test _S3W (S3 Device Wake State).
> +  Test _S4W (S4 Device Wake State).
> +  Test _S0_ (S0 System State).
> +  Test _S1_ (S1 System State).
> +  Test _S2_ (S2 System State).
> +  Test _S3_ (S3 System State).
> +  Test _S4_ (S4 System State).
> +  Test _S5_ (S5 System State).
> +  Test _SWS (System Wake Source).
> +  Test _PSS (Performance Supported States).
> +  Test _CPC (Continuous Performance Control).
> +  Test _CSD (C State Dependencies).
> +  Test _CST (C States).
> +  Test _PCT (Performance Control).
> +  Test _PDL (P-State Depth Limit).
> +  Test _PPC (Performance Present Capabilities).
> +  Test _PPE (Polling for Platform Error).
> +  Test _TDL (T-State Depth Limit).
> +  Test _TPC (Throttling Present Capabilities).
> +  Test _TSD (Throttling State Dependencies).
> +  Test _TSS (Throttling Supported States).
> +  Test _ALC (Ambient Light Colour Chromaticity).
> +  Test _ALI (Ambient Light Illuminance).
> +  Test _ALT (Ambient Light Temperature).
> +  Test _ALP (Ambient Light Polling).
> +  Test _LID (Lid Status).
> +  Test _GCP (Get Capabilities).
> +  Test _GRT (Get Real Time).
> +  Test _GWS (Get Wake Status).
> +  Test _STP (Set Expired Timer Wake Policy).
> +  Test _STV (Set Timer Value).
> +  Test _TIP (Expired Timer Wake Policy).
> +  Test _TIV (Timer Values).
> +  Test _SBS (Smart Battery Subsystem).
> +  Test _BCT (Battery Charge Time).
> +  Test _BIF (Battery Information).
> +  Test _BIX (Battery Information Extended).
> +  Test _BMA (Battery Measurement Averaging).
> +  Test _BMC (Battery Maintenance Control).
> +  Test _BMD (Battery Maintenance Data).
> +  Test _BMS (Battery Measurement Sampling Time).
> +  Test _BST (Battery Status).
> +  Test _BTP (Battery Trip Point).
> +  Test _BTM (Battery Time).
> +  Test _PCL (Power Consumer List).
> +  Test _PIF (Power Source Information).
> +  Test _PSR (Power Source).
> +  Test _FIF (Fan Information).
> +  Test _FSL (Fan Set Level).
> +  Test _FST (Fan Status).
> +  Test _ACx (Active Cooling).
> +  Test _CRT (Critical Trip Point).
> +  Test _DTI (Device Temperature Indication).
> +  Test _HOT (Hot Temperature).
> +  Test _NTT (Notification Temp Threshold).
> +  Test _PSV (Passive Temp).
> +  Test _RTV (Relative Temp Values).
> +  Test _SCP (Set Cooling Policy).
> +  Test _TC1 (Thermal Constant 1).
> +  Test _TC2 (Thermal Constant 2).
> +  Test _TMP (Thermal Zone Current Temp).
> +  Test _TPT (Trip Point Temperature).
> +  Test _TSP (Thermal Sampling Period).
> +  Test _TST (Temperature Sensor Threshold).
> +  Test _TZP (Thermal Zone Polling).
> +  Test _PTS (Prepare to Sleep).
> +  Test _TTS (Transition to State).
> +  Test _S0  (System S0 State).
> +  Test _S1  (System S1 State).
> +  Test _S2  (System S2 State).
> +  Test _S3  (System S3 State).
> +  Test _S4  (System S4 State).
> +  Test _S5  (System S5 State).
> +  Test _WAK (System Wake).
> +  Test _ADR (Return Unique ID for Device).
> +  Test _BCL (Query List of Brightness Control Levels Supported).
> +  Test _BCM (Set Brightness Level).
> +  Test _BQC (Brightness Query Current Level).
> +  Test _DCS (Return the Status of Output Device).
> +  Test _DDC (Return the EDID for this Device).
> +  Test _DSS (Device Set State).
> +  Test _DGS (Query Graphics State).
> +  Test _DOD (Enumerate All Devices Attached to Display Adapter).
> +  Test _DOS (Enable/Disable Output Switching).
> +  Test _GPD (Get POST Device).
> +  Test _ROM (Get ROM Data).
> +  Test _SPD (Set POST Device).
> +  Test _VPO (Video POST Options).
>   microcode       (1 test):
> -  Check for most recent microcode being loaded.
> +  Test for most recent microcode being loaded.
>   mpcheck         (9 tests):
> -  Check MP header.
> -  Check MP CPU entries.
> -  Check MP Bus entries.
> -  Check MP IO APIC entries.
> -  Check MP IO Interrupt entries.
> -  Check MP Local Interrupt entries.
> -  Check MP System Address entries.
> -  Check MP Bus Hierarchy entries.
> -  Check MP Compatible Bus Address Space entries.
> +  Test MP header.
> +  Test MP CPU entries.
> +  Test MP Bus entries.
> +  Test MP IO APIC entries.
> +  Test MP IO Interrupt entries.
> +  Test MP Local Interrupt entries.
> +  Test MP System Address entries.
> +  Test MP Bus Hierarchy entries.
> +  Test MP Compatible Bus Address Space entries.
>   msr             (5 tests):
> -  Check CPU generic MSRs.
> -  Check CPU specific model MSRs.
> -  Check all P State Ratios.
> -  Check C1 and C3 autodemotion.
> -  Check SMRR MSR registers.
> +  Test CPU generic MSRs.
> +  Test CPU specific model MSRs.
> +  Test all P State Ratios.
> +  Test C1 and C3 autodemotion.
> +  Test SMRR MSR registers.
>   mtrr            (3 tests):
>    Validate the kernel MTRR IOMEM setup.
>    Validate the MTRR setup across all processors.
> -  Check for AMD MtrrFixDramModEn being cleared by the BIOS.
> +  Test for AMD MtrrFixDramModEn being cleared by the BIOS.
>   nx              (3 tests):
> -  Check CPU NX capability.
> -  Check all CPUs have same BIOS set NX flag.
> -  Check all CPUs have same msr setting in MSR 0x1a0.
> +  Test CPU NX capability.
> +  Test all CPUs have same BIOS set NX flag.
> +  Test all CPUs have same msr setting in MSR 0x1a0.
>   oops            (1 test):
>    Kernel log oops check.
>   os2gap          (1 test):
> -  Check the OS/2 15Mb memory hole is absent.
> +  Test the OS/2 15Mb memory hole is absent.
>   osilinux        (1 test):
>    Disassemble DSDT to check for _OSI("Linux").
>   pcc             (1 test):
> -  Check PCCH.
> +  Processor Clocking Control (PCC) test.
>   pciirq          (1 test):
> -  PCI IRQ Routing Table.
> +  PCI IRQ Routing Table test.
>   pnp             (1 test):
> -  Check PnP BIOS Support Installation structure.
> +  PnP BIOS Support Installation structure test.
>   securebootcert  (1 test):
>    Ubuntu UEFI secure boot test.
>   syntaxcheck     (2 tests):
> @@ -249,14 +249,14 @@ Batch tests:
>    Gather kernel boot command line.
>    Gather ACPI driver version.
>   virt            (1 test):
> -  Check CPU Virtualisation Configuration.
> +  CPU Virtualisation Configuration test.
>   wakealarm       (4 tests):
> -  Check existence of /sys/class/rtc/rtc0/wakealarm.
> +  Test existence of /sys/class/rtc/rtc0/wakealarm.
>    Trigger wakealarm for 1 seconds in the future.
> -  Check if wakealarm is fired.
> +  Test if wakealarm is fired.
>    Multiple wakealarm firing tests.
>   wmi             (1 test):
> -  Check Windows Management Instrumentation
> +  Windows Management Instrumentation test.
>
>  Interactive tests:
>   ac_adapter      (3 tests):
> @@ -264,13 +264,13 @@ Interactive tests:
>    Test ac_adapter initial on-line state.
>    Test ac_adapter state changes.
>   battery         (1 test):
> -  Check batteries.
> +  Battery test.
>   brightness      (5 tests):
> -  Check for maximum and actual brightness.
> +  Test for maximum and actual brightness.
>    Change actual brightness.
>    Observe all brightness changes.
>    Observe min, max brightness changes.
> -  Check brightness hotkeys.
> +  Test brightness hotkeys.
>   hotkey          (1 test):
>    Hotkey keypress checks.
>   lid             (3 tests):
> @@ -328,7 +328,7 @@ Unsafe tests:
>
>  UEFI tests:
>   csm             (1 test):
> -  Check for UEFI Compatibility Support Module.
> +  UEFI Compatibility Support Module test.
>   securebootcert  (1 test):
>    Ubuntu UEFI secure boot test.
>   uefirtmisc      (2 tests):
> diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log
> index 4efca9b..d720e06 100644
> --- a/checksum-0001/checksum-0001.log
> +++ b/checksum-0001/checksum-0001.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>  checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>  checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
>  checksum        PASSED: Test 1, Table FACP has correct checksum 0x52.
>  checksum        PASSED: Test 1, Table APIC has correct checksum 0xcc.
> diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log
> index 75925bb..4ab586a 100644
> --- a/checksum-0001/checksum-0003.log
> +++ b/checksum-0001/checksum-0003.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>  checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>  checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got
>  checksum        0x10.
>  checksum
> diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log
> index d092674..f69a42a 100644
> --- a/checksum-0001/checksum-0004.log
> +++ b/checksum-0001/checksum-0004.log
> @@ -1,6 +1,6 @@
> -checksum        checksum: Check ACPI table checksum.
> +checksum        checksum: ACPI table checksum test.
>  checksum        --------------------------------------------------------------------------------------------------
> -checksum        Test 1 of 1: Check ACPI table checksums.
> +checksum        Test 1 of 1: ACPI table checksum test.
>  checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
>  checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got
>  checksum        0x53.
> diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log
> index e41aa26..bf2c976 100644
> --- a/method-0001/method-0001.log
> +++ b/method-0001/method-0001.log
> @@ -1,18 +1,18 @@
> -method          method: ACPI DSDT Method Semantic Tests.
> +method          method: ACPI DSDT Method Semantic tests.
>  method          ----------------------------------------------------------
> -method          Test 1 of 144: Check Method Names.
> +method          Test 1 of 144: Test Method Names.
>  method          Found 1061 Objects
>  method          PASSED: Test 1, Method names contain legal characters.
>  method
> -method          Test 2 of 144: Check _AEI.
> +method          Test 2 of 144: Test _AEI.
>  method          SKIPPED: Test 2, Skipping test for non-existant object
>  method          _AEI.
>  method
> -method          Test 3 of 144: Check _DDN (DOS Device Name).
> +method          Test 3 of 144: Test _DDN (DOS Device Name).
>  method          SKIPPED: Test 3, Skipping test for non-existant object
>  method          _DDN.
>  method
> -method          Test 4 of 144: Check _HID (Hardware ID).
> +method          Test 4 of 144: Test _HID (Hardware ID).
>  method          PASSED: Test 4, \_SB_.AMW0._HID returned a string
>  method          'PNP0C14' as expected.
>  method          PASSED: Test 4, \_SB_.LID0._HID returned an integer
> @@ -66,27 +66,27 @@ method          integer 0x0303d041 (EISA ID PNP0303).
>  method          PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an
>  method          integer 0x130fd041 (EISA ID PNP0F13).
>  method
> -method          Test 5 of 144: Check _HRV (Hardware Revision Number).
> +method          Test 5 of 144: Test _HRV (Hardware Revision Number).
>  method          SKIPPED: Test 5, Skipping test for non-existant object
>  method          _HRV.
>  method
> -method          Test 6 of 144: Check _PLD (Physical Device Location).
> +method          Test 6 of 144: Test _PLD (Physical Device Location).
>  method          SKIPPED: Test 6, Skipping test for non-existant object
>  method          _PLD.
>  method
> -method          Test 7 of 144: Check _SUB (Subsystem ID).
> +method          Test 7 of 144: Test _SUB (Subsystem ID).
>  method          SKIPPED: Test 7, Skipping test for non-existant object
>  method          _SUB.
>  method
> -method          Test 8 of 144: Check _SUN (Slot User Number).
> +method          Test 8 of 144: Test _SUN (Slot User Number).
>  method          SKIPPED: Test 8, Skipping test for non-existant object
>  method          _SUN.
>  method
> -method          Test 9 of 144: Check _STR (String).
> +method          Test 9 of 144: Test _STR (String).
>  method          SKIPPED: Test 9, Skipping test for non-existant object
>  method          _STR.
>  method
> -method          Test 10 of 144: Check _UID (Unique ID).
> +method          Test 10 of 144: Test _UID (Unique ID).
>  method          PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane
>  method          looking value 0x00000000.
>  method          PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned
> @@ -112,7 +112,7 @@ method          returned sane looking value 0x00000002.
>  method          PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly
>  method          returned sane looking value 0x00000001.
>  method
> -method          Test 11 of 144: Check _CRS (Current Resource Settings).
> +method          Test 11 of 144: Test _CRS (Current Resource Settings).
>  method          PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space
>  method          Descriptor) looks sane.
>  method          PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
> @@ -156,7 +156,7 @@ method          Descriptor) looks sane.
>  method          PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
>  method          Descriptor) looks sane.
>  method
> -method          Test 12 of 144: Check _DIS (Disable).
> +method          Test 12 of 144: Test _DIS (Disable).
>  method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no
>  method          values as expected.
>  method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no
> @@ -174,24 +174,24 @@ method          values as expected.
>  method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no
>  method          values as expected.
>  method
> -method          Test 13 of 144: Check _DMA (Direct Memory Access).
> +method          Test 13 of 144: Test _DMA (Direct Memory Access).
>  method          SKIPPED: Test 13, Skipping test for non-existant object
>  method          _DMA.
>  method
> -method          Test 14 of 144: Check _FIX (Fixed Register Resource
> +method          Test 14 of 144: Test _FIX (Fixed Register Resource
>  method          Provider).
>  method          SKIPPED: Test 14, Skipping test for non-existant object
>  method          _FIX.
>  method
> -method          Test 15 of 144: Check _GSB (Global System Interrupt Base).
> +method          Test 15 of 144: Test _GSB (Global System Interrupt Base).
>  method          SKIPPED: Test 15, Skipping test for non-existant object
>  method          _GSB.
>  method
> -method          Test 16 of 144: Check _HPP (Hot Plug Parameters).
> +method          Test 16 of 144: Test _HPP (Hot Plug Parameters).
>  method          SKIPPED: Test 16, Skipping test for non-existant object
>  method          _HPP.
>  method
> -method          Test 17 of 144: Check _PRS (Possible Resource Settings).
> +method          Test 17 of 144: Test _PRS (Possible Resource Settings).
>  method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
>  method          Descriptor) looks sane.
>  method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
> @@ -209,47 +209,47 @@ method          Descriptor) looks sane.
>  method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
>  method          Descriptor) looks sane.
>  method
> -method          Test 18 of 144: Check _PXM (Proximity).
> +method          Test 18 of 144: Test _PXM (Proximity).
>  method          SKIPPED: Test 18, Skipping test for non-existant object
>  method          _PXM.
>  method
> -method          Test 19 of 144: Check _EDL (Eject Device List).
> +method          Test 19 of 144: Test _EDL (Eject Device List).
>  method          SKIPPED: Test 19, Skipping test for non-existant object
>  method          _EDL.
>  method
> -method          Test 20 of 144: Check _EJD (Ejection Dependent Device).
> +method          Test 20 of 144: Test _EJD (Ejection Dependent Device).
>  method          SKIPPED: Test 20, Skipping test for non-existant object
>  method          _EJD.
>  method
> -method          Test 21 of 144: Check _EJ0 (Eject).
> +method          Test 21 of 144: Test _EJ0 (Eject).
>  method          SKIPPED: Test 21, Skipping test for non-existant object
>  method          _EJ0.
>  method
> -method          Test 22 of 144: Check _EJ1 (Eject).
> +method          Test 22 of 144: Test _EJ1 (Eject).
>  method          SKIPPED: Test 22, Skipping test for non-existant object
>  method          _EJ1.
>  method
> -method          Test 23 of 144: Check _EJ2 (Eject).
> +method          Test 23 of 144: Test _EJ2 (Eject).
>  method          SKIPPED: Test 23, Skipping test for non-existant object
>  method          _EJ2.
>  method
> -method          Test 24 of 144: Check _EJ3 (Eject).
> +method          Test 24 of 144: Test _EJ3 (Eject).
>  method          SKIPPED: Test 24, Skipping test for non-existant object
>  method          _EJ3.
>  method
> -method          Test 25 of 144: Check _EJ4 (Eject).
> +method          Test 25 of 144: Test _EJ4 (Eject).
>  method          SKIPPED: Test 25, Skipping test for non-existant object
>  method          _EJ4.
>  method
> -method          Test 26 of 144: Check _LCK (Lock).
> +method          Test 26 of 144: Test _LCK (Lock).
>  method          SKIPPED: Test 26, Skipping test for non-existant object
>  method          _LCK.
>  method
> -method          Test 27 of 144: Check _RMV (Remove).
> +method          Test 27 of 144: Test _RMV (Remove).
>  method          PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly
>  method          returned sane looking value 0x00000001.
>  method
> -method          Test 28 of 144: Check _STA (Status).
> +method          Test 28 of 144: Test _STA (Status).
>  method          PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly
>  method          returned sane looking value 0x0000000f.
>  method          PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly
> @@ -273,91 +273,91 @@ method          returned sane looking value 0x00000000.
>  method          PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly
>  method          returned sane looking value 0x0000001f.
>  method
> -method          Test 29 of 144: Check _BDN (BIOS Dock Name).
> +method          Test 29 of 144: Test _BDN (BIOS Dock Name).
>  method          SKIPPED: Test 29, Skipping test for non-existant object
>  method          _BDN.
>  method
> -method          Test 30 of 144: Check _BBN (Base Bus Number).
> +method          Test 30 of 144: Test _BBN (Base Bus Number).
>  method          SKIPPED: Test 30, Skipping test for non-existant object
>  method          _BBN.
>  method
> -method          Test 31 of 144: Check _DCK (Dock).
> +method          Test 31 of 144: Test _DCK (Dock).
>  method          SKIPPED: Test 31, Skipping test for non-existant object
>  method          _DCK.
>  method
> -method          Test 32 of 144: Check _INI (Initialize).
> +method          Test 32 of 144: Test _INI (Initialize).
>  method          PASSED: Test 32, \_SB_._INI returned no values as
>  method          expected.
>  method
> -method          Test 33 of 144: Check _SEG (Segment).
> +method          Test 33 of 144: Test _SEG (Segment).
>  method          SKIPPED: Test 33, Skipping test for non-existant object
>  method          _SEG.
>  method
> -method          Test 34 of 144: Check _OFF (Set resource off).
> +method          Test 34 of 144: Test _OFF (Set resource off).
>  method          SKIPPED: Test 34, Skipping test for non-existant object
>  method          _OFF.
>  method
> -method          Test 35 of 144: Check _ON (Set resource on).
> +method          Test 35 of 144: Test _ON (Set resource on).
>  method          SKIPPED: Test 35, Skipping test for non-existant object
>  method          _ON.
>  method
> -method          Test 36 of 144: Check _DSW (Device Sleep Wake).
> +method          Test 36 of 144: Test _DSW (Device Sleep Wake).
>  method          SKIPPED: Test 36, Skipping test for non-existant object
>  method          _DSW.
>  method
> -method          Test 37 of 144: Check _IRC (In Rush Current).
> +method          Test 37 of 144: Test _IRC (In Rush Current).
>  method          SKIPPED: Test 37, Skipping test for non-existant object
>  method          _IRC.
>  method
> -method          Test 38 of 144: Check _PRE (Power Resources for
> +method          Test 38 of 144: Test _PRE (Power Resources for
>  method          Enumeration).
>  method          SKIPPED: Test 38, Skipping test for non-existant object
>  method          _PRE.
>  method
> -method          Test 39 of 144: Check _PR0 (Power Resources for D0).
> +method          Test 39 of 144: Test _PR0 (Power Resources for D0).
>  method          SKIPPED: Test 39, Skipping test for non-existant object
>  method          _PR0.
>  method
> -method          Test 40 of 144: Check _PR1 (Power Resources for D1).
> +method          Test 40 of 144: Test _PR1 (Power Resources for D1).
>  method          SKIPPED: Test 40, Skipping test for non-existant object
>  method          _PR1.
>  method
> -method          Test 41 of 144: Check _PR2 (Power Resources for D2).
> +method          Test 41 of 144: Test _PR2 (Power Resources for D2).
>  method          SKIPPED: Test 41, Skipping test for non-existant object
>  method          _PR2.
>  method
> -method          Test 42 of 144: Check _PR3 (Power Resources for D3).
> +method          Test 42 of 144: Test _PR3 (Power Resources for D3).
>  method          SKIPPED: Test 42, Skipping test for non-existant object
>  method          _PR3.
>  method
> -method          Test 43 of 144: Check _PS0 (Power State 0).
> +method          Test 43 of 144: Test _PS0 (Power State 0).
>  method          PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
>  method          values as expected.
>  method          PASSED: Test 43, \_PS0 returned no values as expected.
>  method
> -method          Test 44 of 144: Check _PS1 (Power State 1).
> +method          Test 44 of 144: Test _PS1 (Power State 1).
>  method          PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
>  method          values as expected.
>  method
> -method          Test 45 of 144: Check _PS2 (Power State 2).
> +method          Test 45 of 144: Test _PS2 (Power State 2).
>  method          SKIPPED: Test 45, Skipping test for non-existant object
>  method          _PS2.
>  method
> -method          Test 46 of 144: Check _PS3 (Power State 3).
> +method          Test 46 of 144: Test _PS3 (Power State 3).
>  method          PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
>  method          values as expected.
>  method          PASSED: Test 46, \_PS3 returned no values as expected.
>  method
> -method          Test 47 of 144: Check _PSC (Power State Current).
> +method          Test 47 of 144: Test _PSC (Power State Current).
>  method          PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly
>  method          returned an integer.
>  method          PASSED: Test 47, \_PSC correctly returned an integer.
>  method
> -method          Test 48 of 144: Check _PSE (Power State for Enumeration).
> +method          Test 48 of 144: Test _PSE (Power State for Enumeration).
>  method          SKIPPED: Test 48, Skipping test for non-existant object
>  method          _PSE.
>  method
> -method          Test 49 of 144: Check _PSW (Power State Wake).
> +method          Test 49 of 144: Test _PSW (Power State Wake).
>  method          PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values
>  method          as expected.
>  method          PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values
> @@ -369,15 +369,15 @@ method          as expected.
>  method          PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values
>  method          as expected.
>  method
> -method          Test 50 of 144: Check _S1D (S1 Device State).
> +method          Test 50 of 144: Test _S1D (S1 Device State).
>  method          SKIPPED: Test 50, Skipping test for non-existant object
>  method          _S1D.
>  method
> -method          Test 51 of 144: Check _S2D (S2 Device State).
> +method          Test 51 of 144: Test _S2D (S2 Device State).
>  method          SKIPPED: Test 51, Skipping test for non-existant object
>  method          _S2D.
>  method
> -method          Test 52 of 144: Check _S3D (S3 Device State).
> +method          Test 52 of 144: Test _S3D (S3 Device State).
>  method          PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an
>  method          integer.
>  method          PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned
> @@ -395,7 +395,7 @@ method          an integer.
>  method          PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned
>  method          an integer.
>  method
> -method          Test 53 of 144: Check _S4D (S4 Device State).
> +method          Test 53 of 144: Test _S4D (S4 Device State).
>  method          PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an
>  method          integer.
>  method          PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned
> @@ -413,115 +413,114 @@ method          an integer.
>  method          PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned
>  method          an integer.
>  method
> -method          Test 54 of 144: Check _S0W (S0 Device Wake State).
> +method          Test 54 of 144: Test _S0W (S0 Device Wake State).
>  method          SKIPPED: Test 54, Skipping test for non-existant object
>  method          _S0W.
>  method
> -method          Test 55 of 144: Check _S1W (S1 Device Wake State).
> +method          Test 55 of 144: Test _S1W (S1 Device Wake State).
>  method          SKIPPED: Test 55, Skipping test for non-existant object
>  method          _S1W.
>  method
> -method          Test 56 of 144: Check _S2W (S2 Device Wake State).
> +method          Test 56 of 144: Test _S2W (S2 Device Wake State).
>  method          SKIPPED: Test 56, Skipping test for non-existant object
>  method          _S2W.
>  method
> -method          Test 57 of 144: Check _S3W (S3 Device Wake State).
> +method          Test 57 of 144: Test _S3W (S3 Device Wake State).
>  method          SKIPPED: Test 57, Skipping test for non-existant object
>  method          _S3W.
>  method
> -method          Test 58 of 144: Check _S4W (S4 Device Wake State).
> +method          Test 58 of 144: Test _S4W (S4 Device Wake State).
>  method          SKIPPED: Test 58, Skipping test for non-existant object
>  method          _S4W.
>  method
> -method          Test 59 of 144: Check _S0_ (S0 System State).
> +method          Test 59 of 144: Test _S0_ (S0 System State).
>  method          \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
>  method          \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
>  method          PASSED: Test 59, \_S0_ correctly returned a sane looking
>  method          package.
>  method
> -method          Test 60 of 144: Check _S1_ (S1 System State).
> +method          Test 60 of 144: Test _S1_ (S1 System State).
>  method          SKIPPED: Test 60, Skipping test for non-existant object
>  method          _S1_.
>  method
> -method          Test 61 of 144: Check _S2_ (S2 System State).
> +method          Test 61 of 144: Test _S2_ (S2 System State).
>  method          SKIPPED: Test 61, Skipping test for non-existant object
>  method          _S2_.
>  method
> -method          Test 62 of 144: Check _S3_ (S3 System State).
> +method          Test 62 of 144: Test _S3_ (S3 System State).
>  method          \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
>  method          \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
>  method          PASSED: Test 62, \_S3_ correctly returned a sane looking
>  method          package.
>  method
> -method          Test 63 of 144: Check _S4_ (S4 System State).
> +method          Test 63 of 144: Test _S4_ (S4 System State).
>  method          \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
>  method          \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
>  method          PASSED: Test 63, \_S4_ correctly returned a sane looking
>  method          package.
>  method
> -method          Test 64 of 144: Check _S5_ (S5 System State).
> +method          Test 64 of 144: Test _S5_ (S5 System State).
>  method          \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
>  method          \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
>  method          PASSED: Test 64, \_S5_ correctly returned a sane looking
>  method          package.
>  method
> -method          Test 65 of 144: Check _SWS (System Wake Source).
> +method          Test 65 of 144: Test _SWS (System Wake Source).
>  method          SKIPPED: Test 65, Skipping test for non-existant object
>  method          _SWS.
>  method
> -method          Test 66 of 144: Check _PSS (Performance Supported States).
> +method          Test 66 of 144: Test _PSS (Performance Supported States).
>  method          SKIPPED: Test 66, Skipping test for non-existant object
>  method          _PSS.
>  method
> -method          Test 67 of 144: Check _CPC (Continuous Performance
> +method          Test 67 of 144: Test _CPC (Continuous Performance
>  method          Control).
>  method          SKIPPED: Test 67, Skipping test for non-existant object
>  method          _CPC.
>  method
> -method          Test 68 of 144: Check _CSD (C State Dependencies).
> +method          Test 68 of 144: Test _CSD (C State Dependencies).
>  method          SKIPPED: Test 68, Skipping test for non-existant object
>  method          _CSD.
>  method
> -method          Test 69 of 144: Check _CST (C States).
> +method          Test 69 of 144: Test _CST (C States).
>  method          SKIPPED: Test 69, Skipping test for non-existant object
>  method          _CST.
>  method
> -method          Test 70 of 144: Check _PCT (Performance Control).
> +method          Test 70 of 144: Test _PCT (Performance Control).
>  method          SKIPPED: Test 70, Skipping test for non-existant object
>  method          _PCT.
>  method
> -method          Test 71 of 144: Check _PDL (P-State Depth Limit).
> +method          Test 71 of 144: Test _PDL (P-State Depth Limit).
>  method          SKIPPED: Test 71, Skipping test for non-existant object
>  method          _PDL.
>  method
> -method          Test 72 of 144: Check _PPC (Performance Present
> +method          Test 72 of 144: Test _PPC (Performance Present
>  method          Capabilities).
>  method          SKIPPED: Test 72, Skipping test for non-existant object
>  method          _PPC.
>  method
> -method          Test 73 of 144: Check _PPE (Polling for Platform Error).
> +method          Test 73 of 144: Test _PPE (Polling for Platform Error).
>  method          SKIPPED: Test 73, Skipping test for non-existant object
>  method          _PPE.
>  method
> -method          Test 74 of 144: Check _TDL (T-State Depth Limit).
> +method          Test 74 of 144: Test _TDL (T-State Depth Limit).
>  method          SKIPPED: Test 74, Skipping test for non-existant object
>  method          _TDL.
>  method
> -method          Test 75 of 144: Check _TPC (Throttling Present
> +method          Test 75 of 144: Test _TPC (Throttling Present
>  method          Capabilities).
>  method          PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an
>  method          integer.
>  method          PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an
>  method          integer.
>  method
> -method          Test 76 of 144: Check _TSD (Throttling State
> -method          Dependencies).
> +method          Test 76 of 144: Test _TSD (Throttling State Dependencies).
>  method          PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane
>  method          looking package.
>  method          PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane
>  method          looking package.
>  method
> -method          Test 77 of 144: Check _TSS (Throttling Supported States).
> +method          Test 77 of 144: Test _TSS (Throttling Supported States).
>  method          \_PR_.CPU0._TSS values:
>  method          T-State  CPU     Power   Latency  Control  Status
>  method                   Freq    (mW)    (usecs)
> @@ -549,125 +548,123 @@ method              7     13%      125        0      09      00
>  method          PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane
>  method          looking package.
>  method
> -method          Test 78 of 144: Check _ALC (Ambient Light Colour
> +method          Test 78 of 144: Test _ALC (Ambient Light Colour
>  method          Chromaticity).
>  method          SKIPPED: Test 78, Skipping test for non-existant object
>  method          _ALC.
>  method
> -method          Test 79 of 144: Check _ALI (Ambient Light Illuminance).
> +method          Test 79 of 144: Test _ALI (Ambient Light Illuminance).
>  method          SKIPPED: Test 79, Skipping test for non-existant object
>  method          _ALI.
>  method
> -method          Test 80 of 144: Check _ALT (Ambient Light Temperature).
> +method          Test 80 of 144: Test _ALT (Ambient Light Temperature).
>  method          SKIPPED: Test 80, Skipping test for non-existant object
>  method          _ALT.
>  method
> -method          Test 81 of 144: Check _ALP (Ambient Light Polling).
> +method          Test 81 of 144: Test _ALP (Ambient Light Polling).
>  method          SKIPPED: Test 81, Skipping test for non-existant object
>  method          _ALP.
>  method
> -method          Test 82 of 144: Check _LID (Lid Status).
> +method          Test 82 of 144: Test _LID (Lid Status).
>  method          PASSED: Test 82, \_SB_.LID0._LID correctly returned sane
>  method          looking value 0x00000000.
>  method
> -method          Test 83 of 144: Check _GCP (Get Capabilities).
> +method          Test 83 of 144: Test _GCP (Get Capabilities).
>  method          SKIPPED: Test 83, Skipping test for non-existant object
>  method          _GCP.
>  method
> -method          Test 84 of 144: Check _GRT (Get Real Time).
> +method          Test 84 of 144: Test _GRT (Get Real Time).
>  method          SKIPPED: Test 84, Skipping test for non-existant object
>  method          _GRT.
>  method
> -method          Test 85 of 144: Check _GWS (Get Wake Status).
> +method          Test 85 of 144: Test _GWS (Get Wake Status).
>  method          SKIPPED: Test 85, Skipping test for non-existant object
>  method          _GWS.
>  method
> -method          Test 86 of 144: Check _STP (Set Expired Timer Wake
> -method          Policy).
> +method          Test 86 of 144: Test _STP (Set Expired Timer Wake Policy).
>  method          SKIPPED: Test 86, Skipping test for non-existant object
>  method          _STP.
>  method
> -method          Test 87 of 144: Check _STV (Set Timer Value).
> +method          Test 87 of 144: Test _STV (Set Timer Value).
>  method          SKIPPED: Test 87, Skipping test for non-existant object
>  method          _STV.
>  method
> -method          Test 88 of 144: Check _TIP (Expired Timer Wake Policy).
> +method          Test 88 of 144: Test _TIP (Expired Timer Wake Policy).
>  method          SKIPPED: Test 88, Skipping test for non-existant object
>  method          _TIP.
>  method
> -method          Test 89 of 144: Check _TIV (Timer Values).
> +method          Test 89 of 144: Test _TIV (Timer Values).
>  method          SKIPPED: Test 89, Skipping test for non-existant object
>  method          _TIV.
>  method
> -method          Test 90 of 144: Check _SBS (Smart Battery Subsystem).
> +method          Test 90 of 144: Test _SBS (Smart Battery Subsystem).
>  method          SKIPPED: Test 90, Skipping test for non-existant object
>  method          _SBS.
>  method
> -method          Test 91 of 144: Check _BCT (Battery Charge Time).
> +method          Test 91 of 144: Test _BCT (Battery Charge Time).
>  method          SKIPPED: Test 91, Skipping test for non-existant object
>  method          _BCT.
>  method
> -method          Test 92 of 144: Check _BIF (Battery Information).
> +method          Test 92 of 144: Test _BIF (Battery Information).
>  method          PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly
>  method          returned a sane looking package.
>  method
> -method          Test 93 of 144: Check _BIX (Battery Information Extended).
> +method          Test 93 of 144: Test _BIX (Battery Information Extended).
>  method          SKIPPED: Test 93, Skipping test for non-existant object
>  method          _BIX.
>  method
> -method          Test 94 of 144: Check _BMA (Battery Measurement
> -method          Averaging).
> +method          Test 94 of 144: Test _BMA (Battery Measurement Averaging).
>  method          SKIPPED: Test 94, Skipping test for non-existant object
>  method          _BMA.
>  method
> -method          Test 95 of 144: Check _BMC (Battery Maintenance Control).
> +method          Test 95 of 144: Test _BMC (Battery Maintenance Control).
>  method          SKIPPED: Test 95, Skipping test for non-existant object
>  method          _BMC.
>  method
> -method          Test 96 of 144: Check _BMD (Battery Maintenance Data).
> +method          Test 96 of 144: Test _BMD (Battery Maintenance Data).
>  method          SKIPPED: Test 96, Skipping test for non-existant object
>  method          _BMD.
>  method
> -method          Test 97 of 144: Check _BMS (Battery Measurement Sampling
> +method          Test 97 of 144: Test _BMS (Battery Measurement Sampling
>  method          Time).
>  method          SKIPPED: Test 97, Skipping test for non-existant object
>  method          _BMS.
>  method
> -method          Test 98 of 144: Check _BST (Battery Status).
> +method          Test 98 of 144: Test _BST (Battery Status).
>  method          PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly
>  method          returned a sane looking package.
>  method
> -method          Test 99 of 144: Check _BTP (Battery Trip Point).
> +method          Test 99 of 144: Test _BTP (Battery Trip Point).
>  method          SKIPPED: Test 99, Skipping test for non-existant object
>  method          _BTP.
>  method
> -method          Test 100 of 144: Check _BTM (Battery Time).
> +method          Test 100 of 144: Test _BTM (Battery Time).
>  method          SKIPPED: Test 100, Skipping test for non-existant object
>  method          _BTM.
>  method
> -method          Test 101 of 144: Check _PCL (Power Consumer List).
> +method          Test 101 of 144: Test _PCL (Power Consumer List).
>  method
> -method          Test 102 of 144: Check _PIF (Power Source Information).
> +method          Test 102 of 144: Test _PIF (Power Source Information).
>  method          SKIPPED: Test 102, Skipping test for non-existant object
>  method          _PIF.
>  method
> -method          Test 103 of 144: Check _PSR (Power Source).
> +method          Test 103 of 144: Test _PSR (Power Source).
>  method          PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly
>  method          returned sane looking value 0x00000000.
>  method
> -method          Test 104 of 144: Check _FIF (Fan Information).
> +method          Test 104 of 144: Test _FIF (Fan Information).
>  method          SKIPPED: Test 104, Skipping test for non-existant object
>  method          _FIF.
>  method
> -method          Test 105 of 144: Check _FSL (Fan Set Level).
> +method          Test 105 of 144: Test _FSL (Fan Set Level).
>  method          SKIPPED: Test 105, Skipping test for non-existant object
>  method          _FSL.
>  method
> -method          Test 106 of 144: Check _FST (Fan Status).
> +method          Test 106 of 144: Test _FST (Fan Status).
>  method          SKIPPED: Test 106, Skipping test for non-existant object
>  method          _FST.
>  method
> -method          Test 107 of 144: Check _ACx (Active Cooling).
> +method          Test 107 of 144: Test _ACx (Active Cooling).
>  method          PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly
>  method          returned a sane looking return type.
>  method
> @@ -699,65 +696,64 @@ method          SKIPPED: Test 107, Skipping test for non-existant object
>  method          AC9.
>  method
>  method
> -method          Test 108 of 144: Check _CRT (Critical Trip Point).
> +method          Test 108 of 144: Test _CRT (Critical Trip Point).
>  method          SKIPPED: Test 108, Skipping test for non-existant object
>  method          _CRT.
>  method
> -method          Test 109 of 144: Check _DTI (Device Temperature
> +method          Test 109 of 144: Test _DTI (Device Temperature
>  method          Indication).
>  method          SKIPPED: Test 109, Skipping test for non-existant object
>  method          _DTI.
>  method
> -method          Test 110 of 144: Check _HOT (Hot Temperature).
> +method          Test 110 of 144: Test _HOT (Hot Temperature).
>  method          SKIPPED: Test 110, Skipping test for non-existant object
>  method          _HOT.
>  method
> -method          Test 111 of 144: Check _NTT (Notification Temp Threshold).
> +method          Test 111 of 144: Test _NTT (Notification Temp Threshold).
>  method          SKIPPED: Test 111, Skipping test for non-existant object
>  method          _NTT.
>  method
> -method          Test 112 of 144: Check _PSV (Passive Temp).
> +method          Test 112 of 144: Test _PSV (Passive Temp).
>  method          SKIPPED: Test 112, Skipping test for non-existant object
>  method          _PSV.
>  method
> -method          Test 113 of 144: Check _RTV (Relative Temp Values).
> +method          Test 113 of 144: Test _RTV (Relative Temp Values).
>  method          SKIPPED: Test 113, Skipping test for non-existant object
>  method          _RTV.
>  method
> -method          Test 114 of 144: Check _SCP (Set Cooling Policy).
> +method          Test 114 of 144: Test _SCP (Set Cooling Policy).
>  method          SKIPPED: Test 114, Skipping test for non-existant object
>  method          _DTI.
>  method
> -method          Test 115 of 144: Check _TC1 (Thermal Constant 1).
> +method          Test 115 of 144: Test _TC1 (Thermal Constant 1).
>  method          SKIPPED: Test 115, Skipping test for non-existant object
>  method          _TC1.
>  method
> -method          Test 116 of 144: Check _TC2 (Thermal Constant 2).
> +method          Test 116 of 144: Test _TC2 (Thermal Constant 2).
>  method          SKIPPED: Test 116, Skipping test for non-existant object
>  method          _TC2.
>  method
> -method          Test 117 of 144: Check _TMP (Thermal Zone Current Temp).
> +method          Test 117 of 144: Test _TMP (Thermal Zone Current Temp).
>  method          SKIPPED: Test 117, Skipping test for non-existant object
>  method          _TMP.
>  method
> -method          Test 118 of 144: Check _TPT (Trip Point Temperature).
> +method          Test 118 of 144: Test _TPT (Trip Point Temperature).
>  method          SKIPPED: Test 118, Skipping test for non-existant object
>  method          _TPT.
>  method
> -method          Test 119 of 144: Check _TSP (Thermal Sampling Period).
> +method          Test 119 of 144: Test _TSP (Thermal Sampling Period).
>  method          SKIPPED: Test 119, Skipping test for non-existant object
>  method          _TSP.
>  method
> -method          Test 120 of 144: Check _TST (Temperature Sensor
> -method          Threshold).
> +method          Test 120 of 144: Test _TST (Temperature Sensor Threshold).
>  method          SKIPPED: Test 120, Skipping test for non-existant object
>  method          _TST.
>  method
> -method          Test 121 of 144: Check _TZP (Thermal Zone Polling).
> +method          Test 121 of 144: Test _TZP (Thermal Zone Polling).
>  method          SKIPPED: Test 121, Skipping test for non-existant object
>  method          _TZP.
>  method
> -method          Test 122 of 144: Check _PTS (Prepare to Sleep).
> +method          Test 122 of 144: Test _PTS (Prepare to Sleep).
>  method          Test _PTS(1).
>  method          PASSED: Test 122, \_PTS returned no values as expected.
>  method
> @@ -774,35 +770,35 @@ method          Test _PTS(5).
>  method          PASSED: Test 122, \_PTS returned no values as expected.
>  method
>  method
> -method          Test 123 of 144: Check _TTS (Transition to State).
> +method          Test 123 of 144: Test _TTS (Transition to State).
>  method          SKIPPED: Test 123, Optional control method _TTS does not
>  method          exist.
>  method
> -method          Test 124 of 144: Check _S0 (System S0 State).
> +method          Test 124 of 144: Test _S0 (System S0 State).
>  method          SKIPPED: Test 124, Skipping test for non-existant object
>  method          _S0.
>  method
> -method          Test 125 of 144: Check _S1 (System S1 State).
> +method          Test 125 of 144: Test _S1 (System S1 State).
>  method          SKIPPED: Test 125, Skipping test for non-existant object
>  method          _S1.
>  method
> -method          Test 126 of 144: Check _S2 (System S2 State).
> +method          Test 126 of 144: Test _S2 (System S2 State).
>  method          SKIPPED: Test 126, Skipping test for non-existant object
>  method          _S2.
>  method
> -method          Test 127 of 144: Check _S3 (System S3 State).
> +method          Test 127 of 144: Test _S3 (System S3 State).
>  method          SKIPPED: Test 127, Skipping test for non-existant object
>  method          _S3.
>  method
> -method          Test 128 of 144: Check _S4 (System S4 State).
> +method          Test 128 of 144: Test _S4 (System S4 State).
>  method          SKIPPED: Test 128, Skipping test for non-existant object
>  method          _S4.
>  method
> -method          Test 129 of 144: Check _S5 (System S5 State).
> +method          Test 129 of 144: Test _S5 (System S5 State).
>  method          SKIPPED: Test 129, Skipping test for non-existant object
>  method          _S5.
>  method
> -method          Test 130 of 144: Check _WAK (System Wake).
> +method          Test 130 of 144: Test _WAK (System Wake).
>  method          Test _WAK(1) System Wake, State S1.
>  method          PASSED: Test 130, \_WAK correctly returned a sane looking
>  method          package.
> @@ -824,7 +820,7 @@ method          PASSED: Test 130, \_WAK correctly returned a sane looking
>  method          package.
>  method
>  method
> -method          Test 131 of 144: Check _ADR (Return Unique ID for Device).
> +method          Test 131 of 144: Test _ADR (Return Unique ID for Device).
>  method          PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned
>  method          an integer.
>  method          PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned
> @@ -936,7 +932,7 @@ method          returned an integer.
>  method          PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned
>  method          an integer.
>  method
> -method          Test 132 of 144: Check _BCL (Query List of Brightness
> +method          Test 132 of 144: Test _BCL (Query List of Brightness
>  method          Control Levels Supported).
>  method          Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
>  method            Level on full power   : 70
> @@ -951,20 +947,20 @@ method            Brightness Levels     : 0, 10, 20, 30, 40, 50, 60, 70
>  method          PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a
>  method          sane package of 10 integers.
>  method
> -method          Test 133 of 144: Check _BCM (Set Brightness Level).
> +method          Test 133 of 144: Test _BCM (Set Brightness Level).
>  method          PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
>  method          no values as expected.
>  method          PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no
>  method          values as expected.
>  method
> -method          Test 134 of 144: Check _BQC (Brightness Query Current
> +method          Test 134 of 144: Test _BQC (Brightness Query Current
>  method          Level).
>  method          PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
>  method          returned an integer.
>  method          PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly
>  method          returned an integer.
>  method
> -method          Test 135 of 144: Check _DCS (Return the Status of Output
> +method          Test 135 of 144: Test _DCS (Return the Status of Output
>  method          Device).
>  method          PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
>  method          returned an integer.
> @@ -983,12 +979,12 @@ method          returned an integer.
>  method          PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly
>  method          returned an integer.
>  method
> -method          Test 136 of 144: Check _DDC (Return the EDID for this
> +method          Test 136 of 144: Test _DDC (Return the EDID for this
>  method          Device).
>  method          SKIPPED: Test 136, Skipping test for non-existant object
>  method          _DDC.
>  method
> -method          Test 137 of 144: Check _DSS (Device Set State).
> +method          Test 137 of 144: Test _DSS (Device Set State).
>  method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
>  method          no values as expected.
>  method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
> @@ -1006,7 +1002,7 @@ method          values as expected.
>  method          PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no
>  method          values as expected.
>  method
> -method          Test 138 of 144: Check _DGS (Query Graphics State).
> +method          Test 138 of 144: Test _DGS (Query Graphics State).
>  method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
>  method          returned an integer.
>  method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
> @@ -1024,8 +1020,8 @@ method          returned an integer.
>  method          PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly
>  method          returned an integer.
>  method
> -method          Test 139 of 144: Check _DOD (Enumerate All Devices
> -method          Attached to Display Adapter).
> +method          Test 139 of 144: Test _DOD (Enumerate All Devices Attached
> +method          to Display Adapter).
>  method          Device 0:
>  method            Instance:                0
>  method            Display port attachment: 0
> @@ -1059,26 +1055,26 @@ method            Head or pipe ID:         0
>  method          PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned
>  method          a sane looking package.
>  method
> -method          Test 140 of 144: Check _DOS (Enable/Disable Output
> +method          Test 140 of 144: Test _DOS (Enable/Disable Output
>  method          Switching).
>  method          PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no
>  method          values as expected.
>  method          PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values
>  method          as expected.
>  method
> -method          Test 141 of 144: Check _GPD (Get POST Device).
> +method          Test 141 of 144: Test _GPD (Get POST Device).
>  method          SKIPPED: Test 141, Skipping test for non-existant object
>  method          _GPD.
>  method
> -method          Test 142 of 144: Check _ROM (Get ROM Data).
> +method          Test 142 of 144: Test _ROM (Get ROM Data).
>  method          SKIPPED: Test 142, Skipping test for non-existant object
>  method          _ROM.
>  method
> -method          Test 143 of 144: Check _SPD (Set POST Device).
> +method          Test 143 of 144: Test _SPD (Set POST Device).
>  method          SKIPPED: Test 143, Skipping test for non-existant object
>  method          _SPD.
>  method
> -method          Test 144 of 144: Check _VPO (Video POST Options).
> +method          Test 144 of 144: Test _VPO (Video POST Options).
>  method          SKIPPED: Test 144, Skipping test for non-existant object
>  method          _VPO.
>  method
> diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log
> index 0540ba3..aca6243 100644
> --- a/wmi-0001/wmi-0001.log
> +++ b/wmi-0001/wmi-0001.log
> @@ -1,7 +1,7 @@
>  wmi             wmi: Extract and analyse Windows Management
>  wmi             Instrumentation (WMI).
>  wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>  wmi
>  wmi             \_SB_.WMI1._WDG (1 of 9)
>  wmi               GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7
> diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log
> index ab5b704..1732e65 100644
> --- a/wmi-0001/wmi-0002.log
> +++ b/wmi-0001/wmi-0002.log
> @@ -1,7 +1,7 @@
>  wmi             wmi: Extract and analyse Windows Management
>  wmi             Instrumentation (WMI).
>  wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>  wmi
>  wmi             \_SB_.ATKD._WDG (1 of 2)
>  wmi               GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66
> diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log
> index 5f4084d..f1e9aa3 100644
> --- a/wmi-0001/wmi-0003.log
> +++ b/wmi-0001/wmi-0003.log
> @@ -1,7 +1,7 @@
>  wmi             wmi: Extract and analyse Windows Management
>  wmi             Instrumentation (WMI).
>  wmi             ----------------------------------------------------------
> -wmi             Test 1 of 1: Check Windows Management Instrumentation
> +wmi             Test 1 of 1: Windows Management Instrumentation test.
>  wmi
>  wmi             \_SB_.AMW0._WDG (1 of 6)
>  wmi               GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492
> --
> 1.8.3.2
>
Acked-by: Keng-Yu Lin <kengyu@canonical.com>

Patch

diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log
index 2f05d15..57d8813 100644
--- a/acpitables-0001/acpitables-0001.log
+++ b/acpitables-0001/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      PASSED: Test 1, Table APIC passed.
 acpitables      Table ECDT not present to check.
 acpitables      PASSED: Test 1, Table FACP passed.
diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log
index 042c83e..22f07a2 100644
--- a/acpitables-0002/acpitables-0001.log
+++ b/acpitables-0002/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      PASSED: Test 1, Table APIC passed.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log
index db437af..c16d257 100644
--- a/acpitables-0002/acpitables-0002.log
+++ b/acpitables-0002/acpitables-0002.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local
 acpitables      APIC flags field, bits 1..31 are reserved and should be
 acpitables      zero, but are set as: f.
diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log
index 2a4d63e..715978b 100644
--- a/acpitables-0003/acpitables-0001.log
+++ b/acpitables-0003/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit
diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log
index 52491c3..f33e083 100644
--- a/acpitables-0004/acpitables-0001.log
+++ b/acpitables-0004/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log
index cf09a01..2e97b45 100644
--- a/acpitables-0005/acpitables-0001.log
+++ b/acpitables-0005/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log
index 1c2633c..b931cf3 100644
--- a/acpitables-0006/acpitables-0001.log
+++ b/acpitables-0006/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log
index 3e02f91..5d17103 100644
--- a/acpitables-0007/acpitables-0001.log
+++ b/acpitables-0007/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log
index 1a127a6..80ecd20 100644
--- a/acpitables-0008/acpitables-0001.log
+++ b/acpitables-0008/acpitables-0001.log
@@ -1,6 +1,6 @@ 
-acpitables      acpitables: ACPI table settings sanity checks.
+acpitables      acpitables: ACPI table settings sanity tests.
 acpitables      ----------------------------------------------------------
-acpitables      Test 1 of 1: Check ACPI tables.
+acpitables      Test 1 of 1: Test ACPI tables.
 acpitables      Table APIC not present to check.
 acpitables      Table ECDT not present to check.
 acpitables      Table FACP not present to check.
diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log
index a185d24..0fcec6e 100644
--- a/apicinstance-0001/apicinstance-0001.log
+++ b/apicinstance-0001/apicinstance-0001.log
@@ -1,7 +1,6 @@ 
-apicinstance    apicinstance: Check for single instance of APIC/MADT
-apicinstance    table.
+apicinstance    apicinstance: Test for single instance of APIC/MADT table.
 apicinstance    ----------------------------------------------------------
-apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
+apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
 apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 
 apicinstance    Found APIC/MADT table APIC @ bf6dff70, length 0x104 
 apicinstance     (and differs from first APIC/MADT table).
diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log
index 91fd42e..d3f2eb3 100644
--- a/apicinstance-0001/apicinstance-0002.log
+++ b/apicinstance-0001/apicinstance-0002.log
@@ -1,7 +1,6 @@ 
-apicinstance    apicinstance: Check for single instance of APIC/MADT
-apicinstance    table.
+apicinstance    apicinstance: Test for single instance of APIC/MADT table.
 apicinstance    ----------------------------------------------------------
-apicinstance    Test 1 of 1: Check single instance of APIC/MADT table.
+apicinstance    Test 1 of 1: Test for single instance of APIC/MADT table.
 apicinstance    Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 
 apicinstance    PASSED: Test 1, Found 1 APIC/MADT table(s), as expected.
 apicinstance    
diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log
index 06a7619..3068592 100644
--- a/arg-show-tests-0001/arg-show-tests-0001.log
+++ b/arg-show-tests-0001/arg-show-tests-0001.log
@@ -1,49 +1,49 @@ 
 Batch tests:
- acpiinfo        General ACPI information check.
- acpitables      ACPI table settings sanity checks.
- apicedge        APIC Edge/Level Check.
- apicinstance    Check for single instance of APIC/MADT table.
- aspm            PCIe ASPM check.
- bios32          Check BIOS32 Service Directory.
+ acpiinfo        General ACPI information test.
+ acpitables      ACPI table settings sanity tests.
+ apicedge        APIC edge/level test.
+ apicinstance    Test for single instance of APIC/MADT table.
+ aspm            PCIe ASPM test.
+ bios32          BIOS32 Service Directory test.
  bios_info       Gather BIOS DMI information.
- checksum        Check ACPI table checksum.
+ checksum        ACPI table checksum test.
  cpufreq         CPU frequency scaling tests.
- crs             Check PCI host bridge configuration using _CRS.
- csm             Check for UEFI Compatibility Support Module.
- cstates         Check processor C state support.
- dmar            Check sane DMA Remapping (VT-d).
- dmicheck        Test DMI/SMBIOS tables for errors.
- ebda            Validate EBDA region is mapped and reserved in memory map table.
- fadt            FADT SCI_EN enabled check.
- fan             Simple Fan Tests.
- hda_audio       Check HDA Audio Pin Configs.
- hpet_check      HPET configuration test.
+ crs             Test PCI host bridge configuration using _CRS.
+ csm             UEFI Compatibility Support Module test.
+ cstates         Processor C state support test.
+ dmar            DMA Remapping (VT-d) test.
+ dmicheck        DMI/SMBIOS table tests.
+ ebda            Test EBDA region is mapped and reserved in memory map table.
+ fadt            FADT SCI_EN enabled tests.
+ fan             Simple fan tests.
+ hda_audio       HDA Audio Pin Configuration test.
+ hpet_check      HPET configuration tests.
  klog            Scan kernel log for errors and warnings.
- maxfreq         Check max CPU frequencies against max scaling frequency.
- maxreadreq      Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
- mcfg            MCFG PCI Express* memory mapped config space.
- method          ACPI DSDT Method Semantic Tests.
- microcode       Check if system is using latest microcode.
- mpcheck         Check MultiProcessor Tables.
+ maxfreq         Test max CPU frequencies against max scaling frequency.
+ maxreadreq      Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices.
+ mcfg            MCFG PCI Express* memory mapped config space test.
+ method          ACPI DSDT Method Semantic tests.
+ microcode       Test if system is using latest microcode.
+ mpcheck         MultiProcessor Tables tests.
  msr             MSR register tests.
- mtrr            MTRR validation.
+ mtrr            MTRR tests.
  nx              Test if CPU NX is disabled by the BIOS.
  oops            Scan kernel log for Oopses.
  os2gap          OS/2 memory hole test.
  osilinux        Disassemble DSDT to check for _OSI("Linux").
- pcc             Processor Clocking Control (PCC) Test.
- pciirq          Check PCI IRQ Routing Table.
- pnp             Check BIOS Support Installation structure.
+ pcc             Processor Clocking Control (PCC) test.
+ pciirq          PCI IRQ Routing Table test.
+ pnp             BIOS Support Installation structure test.
  securebootcert  Ubuntu UEFI secure boot test.
  syntaxcheck     Re-assemble DSDT and find syntax errors and warnings.
  version         Gather kernel system information.
- virt            Test CPU Virtualisation Configuration.
- wakealarm       Test ACPI Wakealarm.
+ virt            CPU Virtualisation Configuration test.
+ wakealarm       ACPI Wakealarm tests.
  wmi             Extract and analyse Windows Management Instrumentation (WMI).
 
 Interactive tests:
  ac_adapter      Interactive ac_adapter power test.
- battery         Battery Tests.
+ battery         Battery tests.
  brightness      Interactive LCD brightness test.
  hotkey          Hotkey scan code tests.
  lid             Interactive lid button test.
@@ -71,7 +71,7 @@  Unsafe tests:
  uefirtvariable  UEFI Runtime service variable interface tests.
 
 UEFI tests:
- csm             Check for UEFI Compatibility Support Module.
+ csm             UEFI Compatibility Support Module test.
  securebootcert  Ubuntu UEFI secure boot test.
  uefirtmisc      UEFI miscellaneous runtime service interface tests.
  uefirttime      UEFI Runtime service time interface tests.
diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
index f6d3b89..c9c13c5 100644
--- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log
+++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log
@@ -4,240 +4,240 @@  Batch tests:
   Determine machine's ACPI version.
   Determine AML compiler.
  acpitables      (1 test):
-  Check ACPI tables.
+  Test ACPI tables.
  apicedge        (1 test):
-  Legacy and PCI Interrupt Edge/Level trigger checks.
+  Legacy and PCI Interrupt Edge/Level trigger tests.
  apicinstance    (1 test):
-  Check single instance of APIC/MADT table.
+  Test for single instance of APIC/MADT table.
  aspm            (2 tests):
   PCIe ASPM ACPI test.
   PCIe ASPM registers test.
  bios32          (1 test):
-  Check BIOS32 Service Directory.
+  BIOS32 Service Directory test.
  bios_info       (1 test):
   Gather BIOS DMI information
  checksum        (1 test):
-  Check ACPI table checksums.
+  ACPI table checksum test.
  cpufreq         (1 test):
-  CPU P-State Checks.
+  CPU P-State tests.
  crs             (1 test):
-  Check PCI host bridge configuration using _CRS.
+  Test PCI host bridge configuration using _CRS.
  csm             (1 test):
-  Check for UEFI Compatibility Support Module.
+  UEFI Compatibility Support Module test.
  cstates         (1 test):
-  Check all CPUs C-states.
+  Test all CPUs C-states.
  dmar            (1 test):
-  Check DMA Remapping.
+  DMA Remapping test.
  dmicheck        (2 tests):
-  Find and Check SMBIOS Table Entry Point.
+  Find and test SMBIOS Table Entry Point.
   Test DMI/SMBIOS tables for errors.
  ebda            (1 test):
-  Check EBDA is reserved in E820 table.
+  Test EBDA is reserved in E820 table.
  fadt            (2 tests):
-  Check FADT SCI_EN bit is enabled.
-  Check FADT reset register.
+  Test FADT SCI_EN bit is enabled.
+  Test FADT reset register.
  fan             (2 tests):
-  Check fan status.
+  Test fan status.
   Load system, check CPU fan status.
  hda_audio       (1 test):
-  Check HDA Audio Pin Configs.
+  HDA Audio Pin Configuration test.
  hpet_check      (4 tests):
-  Check HPET base in kernel log.
-  Check HPET base in HPET table. 
-  Check HPET base in DSDT and/or SSDT. 
-  Sanity check HPET configuration.
+  Test HPET base in kernel log.
+  Test HPET base in HPET table. 
+  Test HPET base in DSDT and/or SSDT. 
+  Test HPET configuration.
  klog            (1 test):
   Kernel log error check.
  maxfreq         (1 test):
-  Maximum CPU frequency check.
+  Maximum CPU frequency test.
  maxreadreq      (1 test):
-  Check firmware settings MaxReadReq for PCI Express devices.
+  Test firmware settings MaxReadReq for PCI Express devices.
  mcfg            (2 tests):
   Validate MCFG table.
   Validate MCFG PCI config space.
  method          (144 tests):
-  Check Method Names.
-  Check _AEI.
-  Check _DDN (DOS Device Name).
-  Check _HID (Hardware ID).
-  Check _HRV (Hardware Revision Number).
-  Check _PLD (Physical Device Location).
-  Check _SUB (Subsystem ID).
-  Check _SUN (Slot User Number).
-  Check _STR (String).
-  Check _UID (Unique ID).
-  Check _CRS (Current Resource Settings).
-  Check _DIS (Disable).
-  Check _DMA (Direct Memory Access).
-  Check _FIX (Fixed Register Resource Provider).
-  Check _GSB (Global System Interrupt Base).
-  Check _HPP (Hot Plug Parameters).
-  Check _PRS (Possible Resource Settings).
-  Check _PXM (Proximity).
-  Check _EDL (Eject Device List).
-  Check _EJD (Ejection Dependent Device).
-  Check _EJ0 (Eject).
-  Check _EJ1 (Eject).
-  Check _EJ2 (Eject).
-  Check _EJ3 (Eject).
-  Check _EJ4 (Eject).
-  Check _LCK (Lock).
-  Check _RMV (Remove).
-  Check _STA (Status).
-  Check _BDN (BIOS Dock Name).
-  Check _BBN (Base Bus Number).
-  Check _DCK (Dock).
-  Check _INI (Initialize).
-  Check _SEG (Segment).
-  Check _OFF (Set resource off).
-  Check _ON  (Set resource on).
-  Check _DSW (Device Sleep Wake).
-  Check _IRC (In Rush Current).
-  Check _PRE (Power Resources for Enumeration).
-  Check _PR0 (Power Resources for D0).
-  Check _PR1 (Power Resources for D1).
-  Check _PR2 (Power Resources for D2).
-  Check _PR3 (Power Resources for D3).
-  Check _PS0 (Power State 0).
-  Check _PS1 (Power State 1).
-  Check _PS2 (Power State 2).
-  Check _PS3 (Power State 3).
-  Check _PSC (Power State Current).
-  Check _PSE (Power State for Enumeration).
-  Check _PSW (Power State Wake).
-  Check _S1D (S1 Device State).
-  Check _S2D (S2 Device State).
-  Check _S3D (S3 Device State).
-  Check _S4D (S4 Device State).
-  Check _S0W (S0 Device Wake State).
-  Check _S1W (S1 Device Wake State).
-  Check _S2W (S2 Device Wake State).
-  Check _S3W (S3 Device Wake State).
-  Check _S4W (S4 Device Wake State).
-  Check _S0_ (S0 System State).
-  Check _S1_ (S1 System State).
-  Check _S2_ (S2 System State).
-  Check _S3_ (S3 System State).
-  Check _S4_ (S4 System State).
-  Check _S5_ (S5 System State).
-  Check _SWS (System Wake Source).
-  Check _PSS (Performance Supported States).
-  Check _CPC (Continuous Performance Control).
-  Check _CSD (C State Dependencies).
-  Check _CST (C States).
-  Check _PCT (Performance Control).
-  Check _PDL (P-State Depth Limit).
-  Check _PPC (Performance Present Capabilities).
-  Check _PPE (Polling for Platform Error).
-  Check _TDL (T-State Depth Limit).
-  Check _TPC (Throttling Present Capabilities).
-  Check _TSD (Throttling State Dependencies).
-  Check _TSS (Throttling Supported States).
-  Check _ALC (Ambient Light Colour Chromaticity).
-  Check _ALI (Ambient Light Illuminance).
-  Check _ALT (Ambient Light Temperature).
-  Check _ALP (Ambient Light Polling). 
-  Check _LID (Lid Status).
-  Check _GCP (Get Capabilities).
-  Check _GRT (Get Real Time).
-  Check _GWS (Get Wake Status).
-  Check _STP (Set Expired Timer Wake Policy).
-  Check _STV (Set Timer Value).
-  Check _TIP (Expired Timer Wake Policy).
-  Check _TIV (Timer Values).
-  Check _SBS (Smart Battery Subsystem).
-  Check _BCT (Battery Charge Time).
-  Check _BIF (Battery Information).
-  Check _BIX (Battery Information Extended).
-  Check _BMA (Battery Measurement Averaging).
-  Check _BMC (Battery Maintenance Control).
-  Check _BMD (Battery Maintenance Data).
-  Check _BMS (Battery Measurement Sampling Time).
-  Check _BST (Battery Status).
-  Check _BTP (Battery Trip Point).
-  Check _BTM (Battery Time).
-  Check _PCL (Power Consumer List).
-  Check _PIF (Power Source Information).
-  Check _PSR (Power Source).
-  Check _FIF (Fan Information).
-  Check _FSL (Fan Set Level).
-  Check _FST (Fan Status).
-  Check _ACx (Active Cooling).
-  Check _CRT (Critical Trip Point).
-  Check _DTI (Device Temperature Indication).
-  Check _HOT (Hot Temperature).
-  Check _NTT (Notification Temp Threshold).
-  Check _PSV (Passive Temp).
-  Check _RTV (Relative Temp Values).
-  Check _SCP (Set Cooling Policy).
-  Check _TC1 (Thermal Constant 1).
-  Check _TC2 (Thermal Constant 2).
-  Check _TMP (Thermal Zone Current Temp).
-  Check _TPT (Trip Point Temperature).
-  Check _TSP (Thermal Sampling Period).
-  Check _TST (Temperature Sensor Threshold).
-  Check _TZP (Thermal Zone Polling).
-  Check _PTS (Prepare to Sleep).
-  Check _TTS (Transition to State).
-  Check _S0  (System S0 State).
-  Check _S1  (System S1 State).
-  Check _S2  (System S2 State).
-  Check _S3  (System S3 State).
-  Check _S4  (System S4 State).
-  Check _S5  (System S5 State).
-  Check _WAK (System Wake).
-  Check _ADR (Return Unique ID for Device).
-  Check _BCL (Query List of Brightness Control Levels Supported).
-  Check _BCM (Set Brightness Level).
-  Check _BQC (Brightness Query Current Level).
-  Check _DCS (Return the Status of Output Device).
-  Check _DDC (Return the EDID for this Device).
-  Check _DSS (Device Set State).
-  Check _DGS (Query Graphics State).
-  Check _DOD (Enumerate All Devices Attached to Display Adapter).
-  Check _DOS (Enable/Disable Output Switching).
-  Check _GPD (Get POST Device).
-  Check _ROM (Get ROM Data).
-  Check _SPD (Set POST Device).
-  Check _VPO (Video POST Options).
+  Test Method Names.
+  Test _AEI.
+  Test _DDN (DOS Device Name).
+  Test _HID (Hardware ID).
+  Test _HRV (Hardware Revision Number).
+  Test _PLD (Physical Device Location).
+  Test _SUB (Subsystem ID).
+  Test _SUN (Slot User Number).
+  Test _STR (String).
+  Test _UID (Unique ID).
+  Test _CRS (Current Resource Settings).
+  Test _DIS (Disable).
+  Test _DMA (Direct Memory Access).
+  Test _FIX (Fixed Register Resource Provider).
+  Test _GSB (Global System Interrupt Base).
+  Test _HPP (Hot Plug Parameters).
+  Test _PRS (Possible Resource Settings).
+  Test _PXM (Proximity).
+  Test _EDL (Eject Device List).
+  Test _EJD (Ejection Dependent Device).
+  Test _EJ0 (Eject).
+  Test _EJ1 (Eject).
+  Test _EJ2 (Eject).
+  Test _EJ3 (Eject).
+  Test _EJ4 (Eject).
+  Test _LCK (Lock).
+  Test _RMV (Remove).
+  Test _STA (Status).
+  Test _BDN (BIOS Dock Name).
+  Test _BBN (Base Bus Number).
+  Test _DCK (Dock).
+  Test _INI (Initialize).
+  Test _SEG (Segment).
+  Test _OFF (Set resource off).
+  Test _ON  (Set resource on).
+  Test _DSW (Device Sleep Wake).
+  Test _IRC (In Rush Current).
+  Test _PRE (Power Resources for Enumeration).
+  Test _PR0 (Power Resources for D0).
+  Test _PR1 (Power Resources for D1).
+  Test _PR2 (Power Resources for D2).
+  Test _PR3 (Power Resources for D3).
+  Test _PS0 (Power State 0).
+  Test _PS1 (Power State 1).
+  Test _PS2 (Power State 2).
+  Test _PS3 (Power State 3).
+  Test _PSC (Power State Current).
+  Test _PSE (Power State for Enumeration).
+  Test _PSW (Power State Wake).
+  Test _S1D (S1 Device State).
+  Test _S2D (S2 Device State).
+  Test _S3D (S3 Device State).
+  Test _S4D (S4 Device State).
+  Test _S0W (S0 Device Wake State).
+  Test _S1W (S1 Device Wake State).
+  Test _S2W (S2 Device Wake State).
+  Test _S3W (S3 Device Wake State).
+  Test _S4W (S4 Device Wake State).
+  Test _S0_ (S0 System State).
+  Test _S1_ (S1 System State).
+  Test _S2_ (S2 System State).
+  Test _S3_ (S3 System State).
+  Test _S4_ (S4 System State).
+  Test _S5_ (S5 System State).
+  Test _SWS (System Wake Source).
+  Test _PSS (Performance Supported States).
+  Test _CPC (Continuous Performance Control).
+  Test _CSD (C State Dependencies).
+  Test _CST (C States).
+  Test _PCT (Performance Control).
+  Test _PDL (P-State Depth Limit).
+  Test _PPC (Performance Present Capabilities).
+  Test _PPE (Polling for Platform Error).
+  Test _TDL (T-State Depth Limit).
+  Test _TPC (Throttling Present Capabilities).
+  Test _TSD (Throttling State Dependencies).
+  Test _TSS (Throttling Supported States).
+  Test _ALC (Ambient Light Colour Chromaticity).
+  Test _ALI (Ambient Light Illuminance).
+  Test _ALT (Ambient Light Temperature).
+  Test _ALP (Ambient Light Polling). 
+  Test _LID (Lid Status).
+  Test _GCP (Get Capabilities).
+  Test _GRT (Get Real Time).
+  Test _GWS (Get Wake Status).
+  Test _STP (Set Expired Timer Wake Policy).
+  Test _STV (Set Timer Value).
+  Test _TIP (Expired Timer Wake Policy).
+  Test _TIV (Timer Values).
+  Test _SBS (Smart Battery Subsystem).
+  Test _BCT (Battery Charge Time).
+  Test _BIF (Battery Information).
+  Test _BIX (Battery Information Extended).
+  Test _BMA (Battery Measurement Averaging).
+  Test _BMC (Battery Maintenance Control).
+  Test _BMD (Battery Maintenance Data).
+  Test _BMS (Battery Measurement Sampling Time).
+  Test _BST (Battery Status).
+  Test _BTP (Battery Trip Point).
+  Test _BTM (Battery Time).
+  Test _PCL (Power Consumer List).
+  Test _PIF (Power Source Information).
+  Test _PSR (Power Source).
+  Test _FIF (Fan Information).
+  Test _FSL (Fan Set Level).
+  Test _FST (Fan Status).
+  Test _ACx (Active Cooling).
+  Test _CRT (Critical Trip Point).
+  Test _DTI (Device Temperature Indication).
+  Test _HOT (Hot Temperature).
+  Test _NTT (Notification Temp Threshold).
+  Test _PSV (Passive Temp).
+  Test _RTV (Relative Temp Values).
+  Test _SCP (Set Cooling Policy).
+  Test _TC1 (Thermal Constant 1).
+  Test _TC2 (Thermal Constant 2).
+  Test _TMP (Thermal Zone Current Temp).
+  Test _TPT (Trip Point Temperature).
+  Test _TSP (Thermal Sampling Period).
+  Test _TST (Temperature Sensor Threshold).
+  Test _TZP (Thermal Zone Polling).
+  Test _PTS (Prepare to Sleep).
+  Test _TTS (Transition to State).
+  Test _S0  (System S0 State).
+  Test _S1  (System S1 State).
+  Test _S2  (System S2 State).
+  Test _S3  (System S3 State).
+  Test _S4  (System S4 State).
+  Test _S5  (System S5 State).
+  Test _WAK (System Wake).
+  Test _ADR (Return Unique ID for Device).
+  Test _BCL (Query List of Brightness Control Levels Supported).
+  Test _BCM (Set Brightness Level).
+  Test _BQC (Brightness Query Current Level).
+  Test _DCS (Return the Status of Output Device).
+  Test _DDC (Return the EDID for this Device).
+  Test _DSS (Device Set State).
+  Test _DGS (Query Graphics State).
+  Test _DOD (Enumerate All Devices Attached to Display Adapter).
+  Test _DOS (Enable/Disable Output Switching).
+  Test _GPD (Get POST Device).
+  Test _ROM (Get ROM Data).
+  Test _SPD (Set POST Device).
+  Test _VPO (Video POST Options).
  microcode       (1 test):
-  Check for most recent microcode being loaded.
+  Test for most recent microcode being loaded.
  mpcheck         (9 tests):
-  Check MP header.
-  Check MP CPU entries.
-  Check MP Bus entries.
-  Check MP IO APIC entries.
-  Check MP IO Interrupt entries.
-  Check MP Local Interrupt entries.
-  Check MP System Address entries.
-  Check MP Bus Hierarchy entries.
-  Check MP Compatible Bus Address Space entries.
+  Test MP header.
+  Test MP CPU entries.
+  Test MP Bus entries.
+  Test MP IO APIC entries.
+  Test MP IO Interrupt entries.
+  Test MP Local Interrupt entries.
+  Test MP System Address entries.
+  Test MP Bus Hierarchy entries.
+  Test MP Compatible Bus Address Space entries.
  msr             (5 tests):
-  Check CPU generic MSRs.
-  Check CPU specific model MSRs.
-  Check all P State Ratios.
-  Check C1 and C3 autodemotion.
-  Check SMRR MSR registers.
+  Test CPU generic MSRs.
+  Test CPU specific model MSRs.
+  Test all P State Ratios.
+  Test C1 and C3 autodemotion.
+  Test SMRR MSR registers.
  mtrr            (3 tests):
   Validate the kernel MTRR IOMEM setup.
   Validate the MTRR setup across all processors.
-  Check for AMD MtrrFixDramModEn being cleared by the BIOS.
+  Test for AMD MtrrFixDramModEn being cleared by the BIOS.
  nx              (3 tests):
-  Check CPU NX capability.
-  Check all CPUs have same BIOS set NX flag.
-  Check all CPUs have same msr setting in MSR 0x1a0.
+  Test CPU NX capability.
+  Test all CPUs have same BIOS set NX flag.
+  Test all CPUs have same msr setting in MSR 0x1a0.
  oops            (1 test):
   Kernel log oops check.
  os2gap          (1 test):
-  Check the OS/2 15Mb memory hole is absent.
+  Test the OS/2 15Mb memory hole is absent.
  osilinux        (1 test):
   Disassemble DSDT to check for _OSI("Linux").
  pcc             (1 test):
-  Check PCCH.
+  Processor Clocking Control (PCC) test.
  pciirq          (1 test):
-  PCI IRQ Routing Table.
+  PCI IRQ Routing Table test.
  pnp             (1 test):
-  Check PnP BIOS Support Installation structure.
+  PnP BIOS Support Installation structure test.
  securebootcert  (1 test):
   Ubuntu UEFI secure boot test.
  syntaxcheck     (2 tests):
@@ -249,14 +249,14 @@  Batch tests:
   Gather kernel boot command line.
   Gather ACPI driver version.
  virt            (1 test):
-  Check CPU Virtualisation Configuration.
+  CPU Virtualisation Configuration test.
  wakealarm       (4 tests):
-  Check existence of /sys/class/rtc/rtc0/wakealarm.
+  Test existence of /sys/class/rtc/rtc0/wakealarm.
   Trigger wakealarm for 1 seconds in the future.
-  Check if wakealarm is fired.
+  Test if wakealarm is fired.
   Multiple wakealarm firing tests.
  wmi             (1 test):
-  Check Windows Management Instrumentation
+  Windows Management Instrumentation test.
 
 Interactive tests:
  ac_adapter      (3 tests):
@@ -264,13 +264,13 @@  Interactive tests:
   Test ac_adapter initial on-line state.
   Test ac_adapter state changes.
  battery         (1 test):
-  Check batteries.
+  Battery test.
  brightness      (5 tests):
-  Check for maximum and actual brightness.
+  Test for maximum and actual brightness.
   Change actual brightness.
   Observe all brightness changes.
   Observe min, max brightness changes.
-  Check brightness hotkeys.
+  Test brightness hotkeys.
  hotkey          (1 test):
   Hotkey keypress checks.
  lid             (3 tests):
@@ -328,7 +328,7 @@  Unsafe tests:
 
 UEFI tests:
  csm             (1 test):
-  Check for UEFI Compatibility Support Module.
+  UEFI Compatibility Support Module test.
  securebootcert  (1 test):
   Ubuntu UEFI secure boot test.
  uefirtmisc      (2 tests):
diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log
index 4efca9b..d720e06 100644
--- a/checksum-0001/checksum-0001.log
+++ b/checksum-0001/checksum-0001.log
@@ -1,6 +1,6 @@ 
-checksum        checksum: Check ACPI table checksum.
+checksum        checksum: ACPI table checksum test.
 checksum        --------------------------------------------------------------------------------------------------
-checksum        Test 1 of 1: Check ACPI table checksums.
+checksum        Test 1 of 1: ACPI table checksum test.
 checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
 checksum        PASSED: Test 1, Table FACP has correct checksum 0x52.
 checksum        PASSED: Test 1, Table APIC has correct checksum 0xcc.
diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log
index 75925bb..4ab586a 100644
--- a/checksum-0001/checksum-0003.log
+++ b/checksum-0001/checksum-0003.log
@@ -1,6 +1,6 @@ 
-checksum        checksum: Check ACPI table checksum.
+checksum        checksum: ACPI table checksum test.
 checksum        --------------------------------------------------------------------------------------------------
-checksum        Test 1 of 1: Check ACPI table checksums.
+checksum        Test 1 of 1: ACPI table checksum test.
 checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got
 checksum        0x10.
 checksum        
diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log
index d092674..f69a42a 100644
--- a/checksum-0001/checksum-0004.log
+++ b/checksum-0001/checksum-0004.log
@@ -1,6 +1,6 @@ 
-checksum        checksum: Check ACPI table checksum.
+checksum        checksum: ACPI table checksum test.
 checksum        --------------------------------------------------------------------------------------------------
-checksum        Test 1 of 1: Check ACPI table checksums.
+checksum        Test 1 of 1: ACPI table checksum test.
 checksum        PASSED: Test 1, Table DSDT has correct checksum 0x11.
 checksum        FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got
 checksum        0x53.
diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log
index e41aa26..bf2c976 100644
--- a/method-0001/method-0001.log
+++ b/method-0001/method-0001.log
@@ -1,18 +1,18 @@ 
-method          method: ACPI DSDT Method Semantic Tests.
+method          method: ACPI DSDT Method Semantic tests.
 method          ----------------------------------------------------------
-method          Test 1 of 144: Check Method Names.
+method          Test 1 of 144: Test Method Names.
 method          Found 1061 Objects 
 method          PASSED: Test 1, Method names contain legal characters.
 method          
-method          Test 2 of 144: Check _AEI.
+method          Test 2 of 144: Test _AEI.
 method          SKIPPED: Test 2, Skipping test for non-existant object
 method          _AEI.
 method          
-method          Test 3 of 144: Check _DDN (DOS Device Name).
+method          Test 3 of 144: Test _DDN (DOS Device Name).
 method          SKIPPED: Test 3, Skipping test for non-existant object
 method          _DDN.
 method          
-method          Test 4 of 144: Check _HID (Hardware ID).
+method          Test 4 of 144: Test _HID (Hardware ID).
 method          PASSED: Test 4, \_SB_.AMW0._HID returned a string
 method          'PNP0C14' as expected.
 method          PASSED: Test 4, \_SB_.LID0._HID returned an integer
@@ -66,27 +66,27 @@  method          integer 0x0303d041 (EISA ID PNP0303).
 method          PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an
 method          integer 0x130fd041 (EISA ID PNP0F13).
 method          
-method          Test 5 of 144: Check _HRV (Hardware Revision Number).
+method          Test 5 of 144: Test _HRV (Hardware Revision Number).
 method          SKIPPED: Test 5, Skipping test for non-existant object
 method          _HRV.
 method          
-method          Test 6 of 144: Check _PLD (Physical Device Location).
+method          Test 6 of 144: Test _PLD (Physical Device Location).
 method          SKIPPED: Test 6, Skipping test for non-existant object
 method          _PLD.
 method          
-method          Test 7 of 144: Check _SUB (Subsystem ID).
+method          Test 7 of 144: Test _SUB (Subsystem ID).
 method          SKIPPED: Test 7, Skipping test for non-existant object
 method          _SUB.
 method          
-method          Test 8 of 144: Check _SUN (Slot User Number).
+method          Test 8 of 144: Test _SUN (Slot User Number).
 method          SKIPPED: Test 8, Skipping test for non-existant object
 method          _SUN.
 method          
-method          Test 9 of 144: Check _STR (String).
+method          Test 9 of 144: Test _STR (String).
 method          SKIPPED: Test 9, Skipping test for non-existant object
 method          _STR.
 method          
-method          Test 10 of 144: Check _UID (Unique ID).
+method          Test 10 of 144: Test _UID (Unique ID).
 method          PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane
 method          looking value 0x00000000.
 method          PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned
@@ -112,7 +112,7 @@  method          returned sane looking value 0x00000002.
 method          PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly
 method          returned sane looking value 0x00000001.
 method          
-method          Test 11 of 144: Check _CRS (Current Resource Settings).
+method          Test 11 of 144: Test _CRS (Current Resource Settings).
 method          PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space
 method          Descriptor) looks sane.
 method          PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed
@@ -156,7 +156,7 @@  method          Descriptor) looks sane.
 method          PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ
 method          Descriptor) looks sane.
 method          
-method          Test 12 of 144: Check _DIS (Disable).
+method          Test 12 of 144: Test _DIS (Disable).
 method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no
 method          values as expected.
 method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no
@@ -174,24 +174,24 @@  method          values as expected.
 method          PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no
 method          values as expected.
 method          
-method          Test 13 of 144: Check _DMA (Direct Memory Access).
+method          Test 13 of 144: Test _DMA (Direct Memory Access).
 method          SKIPPED: Test 13, Skipping test for non-existant object
 method          _DMA.
 method          
-method          Test 14 of 144: Check _FIX (Fixed Register Resource
+method          Test 14 of 144: Test _FIX (Fixed Register Resource
 method          Provider).
 method          SKIPPED: Test 14, Skipping test for non-existant object
 method          _FIX.
 method          
-method          Test 15 of 144: Check _GSB (Global System Interrupt Base).
+method          Test 15 of 144: Test _GSB (Global System Interrupt Base).
 method          SKIPPED: Test 15, Skipping test for non-existant object
 method          _GSB.
 method          
-method          Test 16 of 144: Check _HPP (Hot Plug Parameters).
+method          Test 16 of 144: Test _HPP (Hot Plug Parameters).
 method          SKIPPED: Test 16, Skipping test for non-existant object
 method          _HPP.
 method          
-method          Test 17 of 144: Check _PRS (Possible Resource Settings).
+method          Test 17 of 144: Test _PRS (Possible Resource Settings).
 method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ
 method          Descriptor) looks sane.
 method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ
@@ -209,47 +209,47 @@  method          Descriptor) looks sane.
 method          PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ
 method          Descriptor) looks sane.
 method          
-method          Test 18 of 144: Check _PXM (Proximity).
+method          Test 18 of 144: Test _PXM (Proximity).
 method          SKIPPED: Test 18, Skipping test for non-existant object
 method          _PXM.
 method          
-method          Test 19 of 144: Check _EDL (Eject Device List).
+method          Test 19 of 144: Test _EDL (Eject Device List).
 method          SKIPPED: Test 19, Skipping test for non-existant object
 method          _EDL.
 method          
-method          Test 20 of 144: Check _EJD (Ejection Dependent Device).
+method          Test 20 of 144: Test _EJD (Ejection Dependent Device).
 method          SKIPPED: Test 20, Skipping test for non-existant object
 method          _EJD.
 method          
-method          Test 21 of 144: Check _EJ0 (Eject).
+method          Test 21 of 144: Test _EJ0 (Eject).
 method          SKIPPED: Test 21, Skipping test for non-existant object
 method          _EJ0.
 method          
-method          Test 22 of 144: Check _EJ1 (Eject).
+method          Test 22 of 144: Test _EJ1 (Eject).
 method          SKIPPED: Test 22, Skipping test for non-existant object
 method          _EJ1.
 method          
-method          Test 23 of 144: Check _EJ2 (Eject).
+method          Test 23 of 144: Test _EJ2 (Eject).
 method          SKIPPED: Test 23, Skipping test for non-existant object
 method          _EJ2.
 method          
-method          Test 24 of 144: Check _EJ3 (Eject).
+method          Test 24 of 144: Test _EJ3 (Eject).
 method          SKIPPED: Test 24, Skipping test for non-existant object
 method          _EJ3.
 method          
-method          Test 25 of 144: Check _EJ4 (Eject).
+method          Test 25 of 144: Test _EJ4 (Eject).
 method          SKIPPED: Test 25, Skipping test for non-existant object
 method          _EJ4.
 method          
-method          Test 26 of 144: Check _LCK (Lock).
+method          Test 26 of 144: Test _LCK (Lock).
 method          SKIPPED: Test 26, Skipping test for non-existant object
 method          _LCK.
 method          
-method          Test 27 of 144: Check _RMV (Remove).
+method          Test 27 of 144: Test _RMV (Remove).
 method          PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly
 method          returned sane looking value 0x00000001.
 method          
-method          Test 28 of 144: Check _STA (Status).
+method          Test 28 of 144: Test _STA (Status).
 method          PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly
 method          returned sane looking value 0x0000000f.
 method          PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly
@@ -273,91 +273,91 @@  method          returned sane looking value 0x00000000.
 method          PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly
 method          returned sane looking value 0x0000001f.
 method          
-method          Test 29 of 144: Check _BDN (BIOS Dock Name).
+method          Test 29 of 144: Test _BDN (BIOS Dock Name).
 method          SKIPPED: Test 29, Skipping test for non-existant object
 method          _BDN.
 method          
-method          Test 30 of 144: Check _BBN (Base Bus Number).
+method          Test 30 of 144: Test _BBN (Base Bus Number).
 method          SKIPPED: Test 30, Skipping test for non-existant object
 method          _BBN.
 method          
-method          Test 31 of 144: Check _DCK (Dock).
+method          Test 31 of 144: Test _DCK (Dock).
 method          SKIPPED: Test 31, Skipping test for non-existant object
 method          _DCK.
 method          
-method          Test 32 of 144: Check _INI (Initialize).
+method          Test 32 of 144: Test _INI (Initialize).
 method          PASSED: Test 32, \_SB_._INI returned no values as
 method          expected.
 method          
-method          Test 33 of 144: Check _SEG (Segment).
+method          Test 33 of 144: Test _SEG (Segment).
 method          SKIPPED: Test 33, Skipping test for non-existant object
 method          _SEG.
 method          
-method          Test 34 of 144: Check _OFF (Set resource off).
+method          Test 34 of 144: Test _OFF (Set resource off).
 method          SKIPPED: Test 34, Skipping test for non-existant object
 method          _OFF.
 method          
-method          Test 35 of 144: Check _ON (Set resource on).
+method          Test 35 of 144: Test _ON (Set resource on).
 method          SKIPPED: Test 35, Skipping test for non-existant object
 method          _ON.
 method          
-method          Test 36 of 144: Check _DSW (Device Sleep Wake).
+method          Test 36 of 144: Test _DSW (Device Sleep Wake).
 method          SKIPPED: Test 36, Skipping test for non-existant object
 method          _DSW.
 method          
-method          Test 37 of 144: Check _IRC (In Rush Current).
+method          Test 37 of 144: Test _IRC (In Rush Current).
 method          SKIPPED: Test 37, Skipping test for non-existant object
 method          _IRC.
 method          
-method          Test 38 of 144: Check _PRE (Power Resources for
+method          Test 38 of 144: Test _PRE (Power Resources for
 method          Enumeration).
 method          SKIPPED: Test 38, Skipping test for non-existant object
 method          _PRE.
 method          
-method          Test 39 of 144: Check _PR0 (Power Resources for D0).
+method          Test 39 of 144: Test _PR0 (Power Resources for D0).
 method          SKIPPED: Test 39, Skipping test for non-existant object
 method          _PR0.
 method          
-method          Test 40 of 144: Check _PR1 (Power Resources for D1).
+method          Test 40 of 144: Test _PR1 (Power Resources for D1).
 method          SKIPPED: Test 40, Skipping test for non-existant object
 method          _PR1.
 method          
-method          Test 41 of 144: Check _PR2 (Power Resources for D2).
+method          Test 41 of 144: Test _PR2 (Power Resources for D2).
 method          SKIPPED: Test 41, Skipping test for non-existant object
 method          _PR2.
 method          
-method          Test 42 of 144: Check _PR3 (Power Resources for D3).
+method          Test 42 of 144: Test _PR3 (Power Resources for D3).
 method          SKIPPED: Test 42, Skipping test for non-existant object
 method          _PR3.
 method          
-method          Test 43 of 144: Check _PS0 (Power State 0).
+method          Test 43 of 144: Test _PS0 (Power State 0).
 method          PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no
 method          values as expected.
 method          PASSED: Test 43, \_PS0 returned no values as expected.
 method          
-method          Test 44 of 144: Check _PS1 (Power State 1).
+method          Test 44 of 144: Test _PS1 (Power State 1).
 method          PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no
 method          values as expected.
 method          
-method          Test 45 of 144: Check _PS2 (Power State 2).
+method          Test 45 of 144: Test _PS2 (Power State 2).
 method          SKIPPED: Test 45, Skipping test for non-existant object
 method          _PS2.
 method          
-method          Test 46 of 144: Check _PS3 (Power State 3).
+method          Test 46 of 144: Test _PS3 (Power State 3).
 method          PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no
 method          values as expected.
 method          PASSED: Test 46, \_PS3 returned no values as expected.
 method          
-method          Test 47 of 144: Check _PSC (Power State Current).
+method          Test 47 of 144: Test _PSC (Power State Current).
 method          PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly
 method          returned an integer.
 method          PASSED: Test 47, \_PSC correctly returned an integer.
 method          
-method          Test 48 of 144: Check _PSE (Power State for Enumeration).
+method          Test 48 of 144: Test _PSE (Power State for Enumeration).
 method          SKIPPED: Test 48, Skipping test for non-existant object
 method          _PSE.
 method          
-method          Test 49 of 144: Check _PSW (Power State Wake).
+method          Test 49 of 144: Test _PSW (Power State Wake).
 method          PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values
 method          as expected.
 method          PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values
@@ -369,15 +369,15 @@  method          as expected.
 method          PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values
 method          as expected.
 method          
-method          Test 50 of 144: Check _S1D (S1 Device State).
+method          Test 50 of 144: Test _S1D (S1 Device State).
 method          SKIPPED: Test 50, Skipping test for non-existant object
 method          _S1D.
 method          
-method          Test 51 of 144: Check _S2D (S2 Device State).
+method          Test 51 of 144: Test _S2D (S2 Device State).
 method          SKIPPED: Test 51, Skipping test for non-existant object
 method          _S2D.
 method          
-method          Test 52 of 144: Check _S3D (S3 Device State).
+method          Test 52 of 144: Test _S3D (S3 Device State).
 method          PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an
 method          integer.
 method          PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned
@@ -395,7 +395,7 @@  method          an integer.
 method          PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned
 method          an integer.
 method          
-method          Test 53 of 144: Check _S4D (S4 Device State).
+method          Test 53 of 144: Test _S4D (S4 Device State).
 method          PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an
 method          integer.
 method          PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned
@@ -413,115 +413,114 @@  method          an integer.
 method          PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned
 method          an integer.
 method          
-method          Test 54 of 144: Check _S0W (S0 Device Wake State).
+method          Test 54 of 144: Test _S0W (S0 Device Wake State).
 method          SKIPPED: Test 54, Skipping test for non-existant object
 method          _S0W.
 method          
-method          Test 55 of 144: Check _S1W (S1 Device Wake State).
+method          Test 55 of 144: Test _S1W (S1 Device Wake State).
 method          SKIPPED: Test 55, Skipping test for non-existant object
 method          _S1W.
 method          
-method          Test 56 of 144: Check _S2W (S2 Device Wake State).
+method          Test 56 of 144: Test _S2W (S2 Device Wake State).
 method          SKIPPED: Test 56, Skipping test for non-existant object
 method          _S2W.
 method          
-method          Test 57 of 144: Check _S3W (S3 Device Wake State).
+method          Test 57 of 144: Test _S3W (S3 Device Wake State).
 method          SKIPPED: Test 57, Skipping test for non-existant object
 method          _S3W.
 method          
-method          Test 58 of 144: Check _S4W (S4 Device Wake State).
+method          Test 58 of 144: Test _S4W (S4 Device Wake State).
 method          SKIPPED: Test 58, Skipping test for non-existant object
 method          _S4W.
 method          
-method          Test 59 of 144: Check _S0_ (S0 System State).
+method          Test 59 of 144: Test _S0_ (S0 System State).
 method          \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000
 method          \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000
 method          PASSED: Test 59, \_S0_ correctly returned a sane looking
 method          package.
 method          
-method          Test 60 of 144: Check _S1_ (S1 System State).
+method          Test 60 of 144: Test _S1_ (S1 System State).
 method          SKIPPED: Test 60, Skipping test for non-existant object
 method          _S1_.
 method          
-method          Test 61 of 144: Check _S2_ (S2 System State).
+method          Test 61 of 144: Test _S2_ (S2 System State).
 method          SKIPPED: Test 61, Skipping test for non-existant object
 method          _S2_.
 method          
-method          Test 62 of 144: Check _S3_ (S3 System State).
+method          Test 62 of 144: Test _S3_ (S3 System State).
 method          \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005
 method          \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005
 method          PASSED: Test 62, \_S3_ correctly returned a sane looking
 method          package.
 method          
-method          Test 63 of 144: Check _S4_ (S4 System State).
+method          Test 63 of 144: Test _S4_ (S4 System State).
 method          \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006
 method          \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006
 method          PASSED: Test 63, \_S4_ correctly returned a sane looking
 method          package.
 method          
-method          Test 64 of 144: Check _S5_ (S5 System State).
+method          Test 64 of 144: Test _S5_ (S5 System State).
 method          \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007
 method          \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007
 method          PASSED: Test 64, \_S5_ correctly returned a sane looking
 method          package.
 method          
-method          Test 65 of 144: Check _SWS (System Wake Source).
+method          Test 65 of 144: Test _SWS (System Wake Source).
 method          SKIPPED: Test 65, Skipping test for non-existant object
 method          _SWS.
 method          
-method          Test 66 of 144: Check _PSS (Performance Supported States).
+method          Test 66 of 144: Test _PSS (Performance Supported States).
 method          SKIPPED: Test 66, Skipping test for non-existant object
 method          _PSS.
 method          
-method          Test 67 of 144: Check _CPC (Continuous Performance
+method          Test 67 of 144: Test _CPC (Continuous Performance
 method          Control).
 method          SKIPPED: Test 67, Skipping test for non-existant object
 method          _CPC.
 method          
-method          Test 68 of 144: Check _CSD (C State Dependencies).
+method          Test 68 of 144: Test _CSD (C State Dependencies).
 method          SKIPPED: Test 68, Skipping test for non-existant object
 method          _CSD.
 method          
-method          Test 69 of 144: Check _CST (C States).
+method          Test 69 of 144: Test _CST (C States).
 method          SKIPPED: Test 69, Skipping test for non-existant object
 method          _CST.
 method          
-method          Test 70 of 144: Check _PCT (Performance Control).
+method          Test 70 of 144: Test _PCT (Performance Control).
 method          SKIPPED: Test 70, Skipping test for non-existant object
 method          _PCT.
 method          
-method          Test 71 of 144: Check _PDL (P-State Depth Limit).
+method          Test 71 of 144: Test _PDL (P-State Depth Limit).
 method          SKIPPED: Test 71, Skipping test for non-existant object
 method          _PDL.
 method          
-method          Test 72 of 144: Check _PPC (Performance Present
+method          Test 72 of 144: Test _PPC (Performance Present
 method          Capabilities).
 method          SKIPPED: Test 72, Skipping test for non-existant object
 method          _PPC.
 method          
-method          Test 73 of 144: Check _PPE (Polling for Platform Error).
+method          Test 73 of 144: Test _PPE (Polling for Platform Error).
 method          SKIPPED: Test 73, Skipping test for non-existant object
 method          _PPE.
 method          
-method          Test 74 of 144: Check _TDL (T-State Depth Limit).
+method          Test 74 of 144: Test _TDL (T-State Depth Limit).
 method          SKIPPED: Test 74, Skipping test for non-existant object
 method          _TDL.
 method          
-method          Test 75 of 144: Check _TPC (Throttling Present
+method          Test 75 of 144: Test _TPC (Throttling Present
 method          Capabilities).
 method          PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an
 method          integer.
 method          PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an
 method          integer.
 method          
-method          Test 76 of 144: Check _TSD (Throttling State
-method          Dependencies).
+method          Test 76 of 144: Test _TSD (Throttling State Dependencies).
 method          PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane
 method          looking package.
 method          PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane
 method          looking package.
 method          
-method          Test 77 of 144: Check _TSS (Throttling Supported States).
+method          Test 77 of 144: Test _TSS (Throttling Supported States).
 method          \_PR_.CPU0._TSS values:
 method          T-State  CPU     Power   Latency  Control  Status
 method                   Freq    (mW)    (usecs)
@@ -549,125 +548,123 @@  method              7     13%      125        0      09      00
 method          PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane
 method          looking package.
 method          
-method          Test 78 of 144: Check _ALC (Ambient Light Colour
+method          Test 78 of 144: Test _ALC (Ambient Light Colour
 method          Chromaticity).
 method          SKIPPED: Test 78, Skipping test for non-existant object
 method          _ALC.
 method          
-method          Test 79 of 144: Check _ALI (Ambient Light Illuminance).
+method          Test 79 of 144: Test _ALI (Ambient Light Illuminance).
 method          SKIPPED: Test 79, Skipping test for non-existant object
 method          _ALI.
 method          
-method          Test 80 of 144: Check _ALT (Ambient Light Temperature).
+method          Test 80 of 144: Test _ALT (Ambient Light Temperature).
 method          SKIPPED: Test 80, Skipping test for non-existant object
 method          _ALT.
 method          
-method          Test 81 of 144: Check _ALP (Ambient Light Polling). 
+method          Test 81 of 144: Test _ALP (Ambient Light Polling). 
 method          SKIPPED: Test 81, Skipping test for non-existant object
 method          _ALP.
 method          
-method          Test 82 of 144: Check _LID (Lid Status).
+method          Test 82 of 144: Test _LID (Lid Status).
 method          PASSED: Test 82, \_SB_.LID0._LID correctly returned sane
 method          looking value 0x00000000.
 method          
-method          Test 83 of 144: Check _GCP (Get Capabilities).
+method          Test 83 of 144: Test _GCP (Get Capabilities).
 method          SKIPPED: Test 83, Skipping test for non-existant object
 method          _GCP.
 method          
-method          Test 84 of 144: Check _GRT (Get Real Time).
+method          Test 84 of 144: Test _GRT (Get Real Time).
 method          SKIPPED: Test 84, Skipping test for non-existant object
 method          _GRT.
 method          
-method          Test 85 of 144: Check _GWS (Get Wake Status).
+method          Test 85 of 144: Test _GWS (Get Wake Status).
 method          SKIPPED: Test 85, Skipping test for non-existant object
 method          _GWS.
 method          
-method          Test 86 of 144: Check _STP (Set Expired Timer Wake
-method          Policy).
+method          Test 86 of 144: Test _STP (Set Expired Timer Wake Policy).
 method          SKIPPED: Test 86, Skipping test for non-existant object
 method          _STP.
 method          
-method          Test 87 of 144: Check _STV (Set Timer Value).
+method          Test 87 of 144: Test _STV (Set Timer Value).
 method          SKIPPED: Test 87, Skipping test for non-existant object
 method          _STV.
 method          
-method          Test 88 of 144: Check _TIP (Expired Timer Wake Policy).
+method          Test 88 of 144: Test _TIP (Expired Timer Wake Policy).
 method          SKIPPED: Test 88, Skipping test for non-existant object
 method          _TIP.
 method          
-method          Test 89 of 144: Check _TIV (Timer Values).
+method          Test 89 of 144: Test _TIV (Timer Values).
 method          SKIPPED: Test 89, Skipping test for non-existant object
 method          _TIV.
 method          
-method          Test 90 of 144: Check _SBS (Smart Battery Subsystem).
+method          Test 90 of 144: Test _SBS (Smart Battery Subsystem).
 method          SKIPPED: Test 90, Skipping test for non-existant object
 method          _SBS.
 method          
-method          Test 91 of 144: Check _BCT (Battery Charge Time).
+method          Test 91 of 144: Test _BCT (Battery Charge Time).
 method          SKIPPED: Test 91, Skipping test for non-existant object
 method          _BCT.
 method          
-method          Test 92 of 144: Check _BIF (Battery Information).
+method          Test 92 of 144: Test _BIF (Battery Information).
 method          PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly
 method          returned a sane looking package.
 method          
-method          Test 93 of 144: Check _BIX (Battery Information Extended).
+method          Test 93 of 144: Test _BIX (Battery Information Extended).
 method          SKIPPED: Test 93, Skipping test for non-existant object
 method          _BIX.
 method          
-method          Test 94 of 144: Check _BMA (Battery Measurement
-method          Averaging).
+method          Test 94 of 144: Test _BMA (Battery Measurement Averaging).
 method          SKIPPED: Test 94, Skipping test for non-existant object
 method          _BMA.
 method          
-method          Test 95 of 144: Check _BMC (Battery Maintenance Control).
+method          Test 95 of 144: Test _BMC (Battery Maintenance Control).
 method          SKIPPED: Test 95, Skipping test for non-existant object
 method          _BMC.
 method          
-method          Test 96 of 144: Check _BMD (Battery Maintenance Data).
+method          Test 96 of 144: Test _BMD (Battery Maintenance Data).
 method          SKIPPED: Test 96, Skipping test for non-existant object
 method          _BMD.
 method          
-method          Test 97 of 144: Check _BMS (Battery Measurement Sampling
+method          Test 97 of 144: Test _BMS (Battery Measurement Sampling
 method          Time).
 method          SKIPPED: Test 97, Skipping test for non-existant object
 method          _BMS.
 method          
-method          Test 98 of 144: Check _BST (Battery Status).
+method          Test 98 of 144: Test _BST (Battery Status).
 method          PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly
 method          returned a sane looking package.
 method          
-method          Test 99 of 144: Check _BTP (Battery Trip Point).
+method          Test 99 of 144: Test _BTP (Battery Trip Point).
 method          SKIPPED: Test 99, Skipping test for non-existant object
 method          _BTP.
 method          
-method          Test 100 of 144: Check _BTM (Battery Time).
+method          Test 100 of 144: Test _BTM (Battery Time).
 method          SKIPPED: Test 100, Skipping test for non-existant object
 method          _BTM.
 method          
-method          Test 101 of 144: Check _PCL (Power Consumer List).
+method          Test 101 of 144: Test _PCL (Power Consumer List).
 method          
-method          Test 102 of 144: Check _PIF (Power Source Information).
+method          Test 102 of 144: Test _PIF (Power Source Information).
 method          SKIPPED: Test 102, Skipping test for non-existant object
 method          _PIF.
 method          
-method          Test 103 of 144: Check _PSR (Power Source).
+method          Test 103 of 144: Test _PSR (Power Source).
 method          PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly
 method          returned sane looking value 0x00000000.
 method          
-method          Test 104 of 144: Check _FIF (Fan Information).
+method          Test 104 of 144: Test _FIF (Fan Information).
 method          SKIPPED: Test 104, Skipping test for non-existant object
 method          _FIF.
 method          
-method          Test 105 of 144: Check _FSL (Fan Set Level).
+method          Test 105 of 144: Test _FSL (Fan Set Level).
 method          SKIPPED: Test 105, Skipping test for non-existant object
 method          _FSL.
 method          
-method          Test 106 of 144: Check _FST (Fan Status).
+method          Test 106 of 144: Test _FST (Fan Status).
 method          SKIPPED: Test 106, Skipping test for non-existant object
 method          _FST.
 method          
-method          Test 107 of 144: Check _ACx (Active Cooling).
+method          Test 107 of 144: Test _ACx (Active Cooling).
 method          PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly
 method          returned a sane looking return type.
 method          
@@ -699,65 +696,64 @@  method          SKIPPED: Test 107, Skipping test for non-existant object
 method          AC9.
 method          
 method          
-method          Test 108 of 144: Check _CRT (Critical Trip Point).
+method          Test 108 of 144: Test _CRT (Critical Trip Point).
 method          SKIPPED: Test 108, Skipping test for non-existant object
 method          _CRT.
 method          
-method          Test 109 of 144: Check _DTI (Device Temperature
+method          Test 109 of 144: Test _DTI (Device Temperature
 method          Indication).
 method          SKIPPED: Test 109, Skipping test for non-existant object
 method          _DTI.
 method          
-method          Test 110 of 144: Check _HOT (Hot Temperature).
+method          Test 110 of 144: Test _HOT (Hot Temperature).
 method          SKIPPED: Test 110, Skipping test for non-existant object
 method          _HOT.
 method          
-method          Test 111 of 144: Check _NTT (Notification Temp Threshold).
+method          Test 111 of 144: Test _NTT (Notification Temp Threshold).
 method          SKIPPED: Test 111, Skipping test for non-existant object
 method          _NTT.
 method          
-method          Test 112 of 144: Check _PSV (Passive Temp).
+method          Test 112 of 144: Test _PSV (Passive Temp).
 method          SKIPPED: Test 112, Skipping test for non-existant object
 method          _PSV.
 method          
-method          Test 113 of 144: Check _RTV (Relative Temp Values).
+method          Test 113 of 144: Test _RTV (Relative Temp Values).
 method          SKIPPED: Test 113, Skipping test for non-existant object
 method          _RTV.
 method          
-method          Test 114 of 144: Check _SCP (Set Cooling Policy).
+method          Test 114 of 144: Test _SCP (Set Cooling Policy).
 method          SKIPPED: Test 114, Skipping test for non-existant object
 method          _DTI.
 method          
-method          Test 115 of 144: Check _TC1 (Thermal Constant 1).
+method          Test 115 of 144: Test _TC1 (Thermal Constant 1).
 method          SKIPPED: Test 115, Skipping test for non-existant object
 method          _TC1.
 method          
-method          Test 116 of 144: Check _TC2 (Thermal Constant 2).
+method          Test 116 of 144: Test _TC2 (Thermal Constant 2).
 method          SKIPPED: Test 116, Skipping test for non-existant object
 method          _TC2.
 method          
-method          Test 117 of 144: Check _TMP (Thermal Zone Current Temp).
+method          Test 117 of 144: Test _TMP (Thermal Zone Current Temp).
 method          SKIPPED: Test 117, Skipping test for non-existant object
 method          _TMP.
 method          
-method          Test 118 of 144: Check _TPT (Trip Point Temperature).
+method          Test 118 of 144: Test _TPT (Trip Point Temperature).
 method          SKIPPED: Test 118, Skipping test for non-existant object
 method          _TPT.
 method          
-method          Test 119 of 144: Check _TSP (Thermal Sampling Period).
+method          Test 119 of 144: Test _TSP (Thermal Sampling Period).
 method          SKIPPED: Test 119, Skipping test for non-existant object
 method          _TSP.
 method          
-method          Test 120 of 144: Check _TST (Temperature Sensor
-method          Threshold).
+method          Test 120 of 144: Test _TST (Temperature Sensor Threshold).
 method          SKIPPED: Test 120, Skipping test for non-existant object
 method          _TST.
 method          
-method          Test 121 of 144: Check _TZP (Thermal Zone Polling).
+method          Test 121 of 144: Test _TZP (Thermal Zone Polling).
 method          SKIPPED: Test 121, Skipping test for non-existant object
 method          _TZP.
 method          
-method          Test 122 of 144: Check _PTS (Prepare to Sleep).
+method          Test 122 of 144: Test _PTS (Prepare to Sleep).
 method          Test _PTS(1).
 method          PASSED: Test 122, \_PTS returned no values as expected.
 method          
@@ -774,35 +770,35 @@  method          Test _PTS(5).
 method          PASSED: Test 122, \_PTS returned no values as expected.
 method          
 method          
-method          Test 123 of 144: Check _TTS (Transition to State).
+method          Test 123 of 144: Test _TTS (Transition to State).
 method          SKIPPED: Test 123, Optional control method _TTS does not
 method          exist.
 method          
-method          Test 124 of 144: Check _S0 (System S0 State).
+method          Test 124 of 144: Test _S0 (System S0 State).
 method          SKIPPED: Test 124, Skipping test for non-existant object
 method          _S0.
 method          
-method          Test 125 of 144: Check _S1 (System S1 State).
+method          Test 125 of 144: Test _S1 (System S1 State).
 method          SKIPPED: Test 125, Skipping test for non-existant object
 method          _S1.
 method          
-method          Test 126 of 144: Check _S2 (System S2 State).
+method          Test 126 of 144: Test _S2 (System S2 State).
 method          SKIPPED: Test 126, Skipping test for non-existant object
 method          _S2.
 method          
-method          Test 127 of 144: Check _S3 (System S3 State).
+method          Test 127 of 144: Test _S3 (System S3 State).
 method          SKIPPED: Test 127, Skipping test for non-existant object
 method          _S3.
 method          
-method          Test 128 of 144: Check _S4 (System S4 State).
+method          Test 128 of 144: Test _S4 (System S4 State).
 method          SKIPPED: Test 128, Skipping test for non-existant object
 method          _S4.
 method          
-method          Test 129 of 144: Check _S5 (System S5 State).
+method          Test 129 of 144: Test _S5 (System S5 State).
 method          SKIPPED: Test 129, Skipping test for non-existant object
 method          _S5.
 method          
-method          Test 130 of 144: Check _WAK (System Wake).
+method          Test 130 of 144: Test _WAK (System Wake).
 method          Test _WAK(1) System Wake, State S1.
 method          PASSED: Test 130, \_WAK correctly returned a sane looking
 method          package.
@@ -824,7 +820,7 @@  method          PASSED: Test 130, \_WAK correctly returned a sane looking
 method          package.
 method          
 method          
-method          Test 131 of 144: Check _ADR (Return Unique ID for Device).
+method          Test 131 of 144: Test _ADR (Return Unique ID for Device).
 method          PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned
 method          an integer.
 method          PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned
@@ -936,7 +932,7 @@  method          returned an integer.
 method          PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned
 method          an integer.
 method          
-method          Test 132 of 144: Check _BCL (Query List of Brightness
+method          Test 132 of 144: Test _BCL (Query List of Brightness
 method          Control Levels Supported).
 method          Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL:
 method            Level on full power   : 70
@@ -951,20 +947,20 @@  method            Brightness Levels     : 0, 10, 20, 30, 40, 50, 60, 70
 method          PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a
 method          sane package of 10 integers.
 method          
-method          Test 133 of 144: Check _BCM (Set Brightness Level).
+method          Test 133 of 144: Test _BCM (Set Brightness Level).
 method          PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned
 method          no values as expected.
 method          PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no
 method          values as expected.
 method          
-method          Test 134 of 144: Check _BQC (Brightness Query Current
+method          Test 134 of 144: Test _BQC (Brightness Query Current
 method          Level).
 method          PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly
 method          returned an integer.
 method          PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly
 method          returned an integer.
 method          
-method          Test 135 of 144: Check _DCS (Return the Status of Output
+method          Test 135 of 144: Test _DCS (Return the Status of Output
 method          Device).
 method          PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly
 method          returned an integer.
@@ -983,12 +979,12 @@  method          returned an integer.
 method          PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly
 method          returned an integer.
 method          
-method          Test 136 of 144: Check _DDC (Return the EDID for this
+method          Test 136 of 144: Test _DDC (Return the EDID for this
 method          Device).
 method          SKIPPED: Test 136, Skipping test for non-existant object
 method          _DDC.
 method          
-method          Test 137 of 144: Check _DSS (Device Set State).
+method          Test 137 of 144: Test _DSS (Device Set State).
 method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned
 method          no values as expected.
 method          PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned
@@ -1006,7 +1002,7 @@  method          values as expected.
 method          PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no
 method          values as expected.
 method          
-method          Test 138 of 144: Check _DGS (Query Graphics State).
+method          Test 138 of 144: Test _DGS (Query Graphics State).
 method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly
 method          returned an integer.
 method          PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly
@@ -1024,8 +1020,8 @@  method          returned an integer.
 method          PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly
 method          returned an integer.
 method          
-method          Test 139 of 144: Check _DOD (Enumerate All Devices
-method          Attached to Display Adapter).
+method          Test 139 of 144: Test _DOD (Enumerate All Devices Attached
+method          to Display Adapter).
 method          Device 0:
 method            Instance:                0
 method            Display port attachment: 0
@@ -1059,26 +1055,26 @@  method            Head or pipe ID:         0
 method          PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned
 method          a sane looking package.
 method          
-method          Test 140 of 144: Check _DOS (Enable/Disable Output
+method          Test 140 of 144: Test _DOS (Enable/Disable Output
 method          Switching).
 method          PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no
 method          values as expected.
 method          PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values
 method          as expected.
 method          
-method          Test 141 of 144: Check _GPD (Get POST Device).
+method          Test 141 of 144: Test _GPD (Get POST Device).
 method          SKIPPED: Test 141, Skipping test for non-existant object
 method          _GPD.
 method          
-method          Test 142 of 144: Check _ROM (Get ROM Data).
+method          Test 142 of 144: Test _ROM (Get ROM Data).
 method          SKIPPED: Test 142, Skipping test for non-existant object
 method          _ROM.
 method          
-method          Test 143 of 144: Check _SPD (Set POST Device).
+method          Test 143 of 144: Test _SPD (Set POST Device).
 method          SKIPPED: Test 143, Skipping test for non-existant object
 method          _SPD.
 method          
-method          Test 144 of 144: Check _VPO (Video POST Options).
+method          Test 144 of 144: Test _VPO (Video POST Options).
 method          SKIPPED: Test 144, Skipping test for non-existant object
 method          _VPO.
 method          
diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log
index 0540ba3..aca6243 100644
--- a/wmi-0001/wmi-0001.log
+++ b/wmi-0001/wmi-0001.log
@@ -1,7 +1,7 @@ 
 wmi             wmi: Extract and analyse Windows Management
 wmi             Instrumentation (WMI).
 wmi             ----------------------------------------------------------
-wmi             Test 1 of 1: Check Windows Management Instrumentation
+wmi             Test 1 of 1: Windows Management Instrumentation test.
 wmi             
 wmi             \_SB_.WMI1._WDG (1 of 9)
 wmi               GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7
diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log
index ab5b704..1732e65 100644
--- a/wmi-0001/wmi-0002.log
+++ b/wmi-0001/wmi-0002.log
@@ -1,7 +1,7 @@ 
 wmi             wmi: Extract and analyse Windows Management
 wmi             Instrumentation (WMI).
 wmi             ----------------------------------------------------------
-wmi             Test 1 of 1: Check Windows Management Instrumentation
+wmi             Test 1 of 1: Windows Management Instrumentation test.
 wmi             
 wmi             \_SB_.ATKD._WDG (1 of 2)
 wmi               GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66
diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log
index 5f4084d..f1e9aa3 100644
--- a/wmi-0001/wmi-0003.log
+++ b/wmi-0001/wmi-0003.log
@@ -1,7 +1,7 @@ 
 wmi             wmi: Extract and analyse Windows Management
 wmi             Instrumentation (WMI).
 wmi             ----------------------------------------------------------
-wmi             Test 1 of 1: Check Windows Management Instrumentation
+wmi             Test 1 of 1: Windows Management Instrumentation test.
 wmi             
 wmi             \_SB_.AMW0._WDG (1 of 6)
 wmi               GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492