| Message ID | 1386683290-25932-1-git-send-email-colin.king@canonical.com |
|---|---|
| State | Accepted |
| Headers | show |
On Tue, Dec 10, 2013 at 9:48 PM, Colin King <colin.king@canonical.com> wrote: > From: Colin Ian King <colin.king@canonical.com> > > The method test as included some new tests, so sync the test > to fwts method commit 711254be06ba5cfdecdae12d55ef5efe07d2eb78 > > Signed-off-by: Colin Ian King <colin.king@canonical.com> > --- > method-0001/method-0001.log | 1022 ++++++++++++++++++++++--------------------- > 1 file changed, 522 insertions(+), 500 deletions(-) > > diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log > index 1d4adb2..d8802a8 100644 > --- a/method-0001/method-0001.log > +++ b/method-0001/method-0001.log > @@ -1,536 +1,541 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 150: Test Method Names. > +method Test 1 of 155: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 150: Test _AEI. > +method Test 2 of 155: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existant object > method _AEI. > method > -method Test 3 of 150: Test _CID (Compatible ID). > -method PASSED: Test 3, \_SB_.PCI0._CID returned an integer > +method Test 3 of 155: Test _PIC (Inform AML of Interrupt Model). > +method PASSED: Test 3, \_PIC returned no values as expected. > +method PASSED: Test 3, \_PIC returned no values as expected. > +method PASSED: Test 3, \_PIC returned no values as expected. > +method > +method Test 4 of 155: Test _CID (Compatible ID). > +method PASSED: Test 4, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > -method PASSED: Test 3, \_SB_.PCI0.LPCB.HPET._CID returned an > +method PASSED: Test 4, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 4 of 150: Test _DDN (DOS Device Name). > -method SKIPPED: Test 4, Skipping test for non-existant object > +method Test 5 of 155: Test _DDN (DOS Device Name). > +method SKIPPED: Test 5, Skipping test for non-existant object > method _DDN. > method > -method Test 5 of 150: Test _HID (Hardware ID). > -method PASSED: Test 5, \_SB_.AMW0._HID returned a string > +method Test 6 of 155: Test _HID (Hardware ID). > +method PASSED: Test 6, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > -method PASSED: Test 5, \_SB_.LID0._HID returned an integer > +method PASSED: Test 6, \_SB_.LID0._HID returned an integer > method 0x0d0cd041 (EISA ID PNP0C0D). > -method PASSED: Test 5, \_SB_.PWRB._HID returned an integer > +method PASSED: Test 6, \_SB_.PWRB._HID returned an integer > method 0x0c0cd041 (EISA ID PNP0C0C). > -method PASSED: Test 5, \_SB_.PCI0._HID returned an integer > +method PASSED: Test 6, \_SB_.PCI0._HID returned an integer > method 0x080ad041 (EISA ID PNP0A08). > -method PASSED: Test 5, \_SB_.PCI0.PDRC._HID returned an integer > +method PASSED: Test 6, \_SB_.PCI0.PDRC._HID returned an integer > method 0x020cd041 (EISA ID PNP0C02). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKA._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKA._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKB._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKB._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKC._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKD._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKD._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKE._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKE._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKF._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKF._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKG._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKG._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKH._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKH._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.DMAC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.DMAC._HID returned an > method integer 0x0002d041 (EISA ID PNP0200). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.FWHD._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.FWHD._HID returned an > method integer 0x0008d425 (EISA ID INT0800). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.HPET._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._HID returned an > method integer 0x0301d041 (EISA ID PNP0103). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.IPIC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.IPIC._HID returned an > method integer 0x0000d041 (EISA ID PNP0000). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.MATH._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.MATH._HID returned an > method integer 0x040cd041 (EISA ID PNP0C04). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LDRC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LDRC._HID returned an > method integer 0x020cd041 (EISA ID PNP0C02). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.RTC_._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.RTC_._HID returned an > method integer 0x000bd041 (EISA ID PNP0B00). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.TIMR._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.TIMR._HID returned an > method integer 0x0001d041 (EISA ID PNP0100). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.ACAD._HID returned a > +method PASSED: Test 6, \_SB_.PCI0.LPCB.ACAD._HID returned a > method string 'ACPI0003' as expected. > -method PASSED: Test 5, \_SB_.PCI0.LPCB.EC0_._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.EC0_._HID returned an > method integer 0x090cd041 (EISA ID PNP0C09). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.BAT1._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.BAT1._HID returned an > method integer 0x0a0cd041 (EISA ID PNP0C0A). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2K._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2K._HID returned an > method integer 0x0303d041 (EISA ID PNP0303). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2M._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 6 of 150: Test _HRV (Hardware Revision Number). > -method SKIPPED: Test 6, Skipping test for non-existant object > +method Test 7 of 155: Test _HRV (Hardware Revision Number). > +method SKIPPED: Test 7, Skipping test for non-existant object > method _HRV. > method > -method Test 7 of 150: Test _PLD (Physical Device Location). > -method SKIPPED: Test 7, Skipping test for non-existant object > +method Test 8 of 155: Test _PLD (Physical Device Location). > +method SKIPPED: Test 8, Skipping test for non-existant object > method _PLD. > method > -method Test 8 of 150: Test _SUB (Subsystem ID). > -method SKIPPED: Test 8, Skipping test for non-existant object > +method Test 9 of 155: Test _SUB (Subsystem ID). > +method SKIPPED: Test 9, Skipping test for non-existant object > method _SUB. > method > -method Test 9 of 150: Test _SUN (Slot User Number). > -method SKIPPED: Test 9, Skipping test for non-existant object > +method Test 10 of 155: Test _SUN (Slot User Number). > +method SKIPPED: Test 10, Skipping test for non-existant object > method _SUN. > method > -method Test 10 of 150: Test _STR (String). > -method SKIPPED: Test 10, Skipping test for non-existant object > +method Test 11 of 155: Test _STR (String). > +method SKIPPED: Test 11, Skipping test for non-existant object > method _STR. > method > -method Test 11 of 150: Test _UID (Unique ID). > -method PASSED: Test 11, \_SB_.AMW0._UID correctly returned sane > +method Test 12 of 155: Test _UID (Unique ID). > +method PASSED: Test 12, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > -method PASSED: Test 11, \_SB_.PCI0.PDRC._UID correctly returned > +method PASSED: Test 12, \_SB_.PCI0.PDRC._UID correctly returned > method sane looking value 0x00000001. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKA._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._UID correctly > method returned sane looking value 0x00000001. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKB._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._UID correctly > method returned sane looking value 0x00000002. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKC._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKC._UID correctly > method returned sane looking value 0x00000003. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKD._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKD._UID correctly > method returned sane looking value 0x00000004. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKE._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKE._UID correctly > method returned sane looking value 0x00000005. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKF._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKF._UID correctly > method returned sane looking value 0x00000006. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKG._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKG._UID correctly > method returned sane looking value 0x00000007. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKH._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._UID correctly > method returned sane looking value 0x00000008. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LDRC._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LDRC._UID correctly > method returned sane looking value 0x00000002. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.BAT1._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 12 of 150: Test _CDM (Clock Domain). > -method SKIPPED: Test 12, Skipping test for non-existant object > +method Test 13 of 155: Test _CDM (Clock Domain). > +method SKIPPED: Test 13, Skipping test for non-existant object > method _CDM. > method > -method Test 13 of 150: Test _CRS (Current Resource Settings). > -method PASSED: Test 13, \_SB_.PCI0._CRS (WORD Address Space > +method Test 14 of 155: Test _CRS (Current Resource Settings). > +method PASSED: Test 14, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 14 of 150: Test _DIS (Disable). > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._DIS returned no > +method Test 15 of 155: Test _DIS (Disable). > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKB._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKC._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKD._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKE._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKF._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKG._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 15 of 150: Test _DMA (Direct Memory Access). > -method SKIPPED: Test 15, Skipping test for non-existant object > +method Test 16 of 155: Test _DMA (Direct Memory Access). > +method SKIPPED: Test 16, Skipping test for non-existant object > method _DMA. > method > -method Test 16 of 150: Test _FIX (Fixed Register Resource > +method Test 17 of 155: Test _FIX (Fixed Register Resource > method Provider). > -method SKIPPED: Test 16, Skipping test for non-existant object > +method SKIPPED: Test 17, Skipping test for non-existant object > method _FIX. > method > -method Test 17 of 150: Test _GSB (Global System Interrupt Base). > -method SKIPPED: Test 17, Skipping test for non-existant object > +method Test 18 of 155: Test _GSB (Global System Interrupt Base). > +method SKIPPED: Test 18, Skipping test for non-existant object > method _GSB. > method > -method Test 18 of 150: Test _HPP (Hot Plug Parameters). > -method SKIPPED: Test 18, Skipping test for non-existant object > +method Test 19 of 155: Test _HPP (Hot Plug Parameters). > +method SKIPPED: Test 19, Skipping test for non-existant object > method _HPP. > method > -method Test 19 of 150: Test _PRS (Possible Resource Settings). > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > +method Test 20 of 155: Test _PRS (Possible Resource Settings). > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 20 of 150: Test _PXM (Proximity). > -method SKIPPED: Test 20, Skipping test for non-existant object > +method Test 21 of 155: Test _PXM (Proximity). > +method SKIPPED: Test 21, Skipping test for non-existant object > method _PXM. > method > -method Test 21 of 150: Test _EDL (Eject Device List). > -method SKIPPED: Test 21, Skipping test for non-existant object > +method Test 22 of 155: Test _EDL (Eject Device List). > +method SKIPPED: Test 22, Skipping test for non-existant object > method _EDL. > method > -method Test 22 of 150: Test _EJD (Ejection Dependent Device). > -method SKIPPED: Test 22, Skipping test for non-existant object > +method Test 23 of 155: Test _EJD (Ejection Dependent Device). > +method SKIPPED: Test 23, Skipping test for non-existant object > method _EJD. > method > -method Test 23 of 150: Test _EJ0 (Eject). > -method SKIPPED: Test 23, Skipping test for non-existant object > +method Test 24 of 155: Test _EJ0 (Eject). > +method SKIPPED: Test 24, Skipping test for non-existant object > method _EJ0. > method > -method Test 24 of 150: Test _EJ1 (Eject). > -method SKIPPED: Test 24, Skipping test for non-existant object > +method Test 25 of 155: Test _EJ1 (Eject). > +method SKIPPED: Test 25, Skipping test for non-existant object > method _EJ1. > method > -method Test 25 of 150: Test _EJ2 (Eject). > -method SKIPPED: Test 25, Skipping test for non-existant object > +method Test 26 of 155: Test _EJ2 (Eject). > +method SKIPPED: Test 26, Skipping test for non-existant object > method _EJ2. > method > -method Test 26 of 150: Test _EJ3 (Eject). > -method SKIPPED: Test 26, Skipping test for non-existant object > +method Test 27 of 155: Test _EJ3 (Eject). > +method SKIPPED: Test 27, Skipping test for non-existant object > method _EJ3. > method > -method Test 27 of 150: Test _EJ4 (Eject). > -method SKIPPED: Test 27, Skipping test for non-existant object > +method Test 28 of 155: Test _EJ4 (Eject). > +method SKIPPED: Test 28, Skipping test for non-existant object > method _EJ4. > method > -method Test 28 of 150: Test _LCK (Lock). > -method SKIPPED: Test 28, Skipping test for non-existant object > +method Test 29 of 155: Test _LCK (Lock). > +method SKIPPED: Test 29, Skipping test for non-existant object > method _LCK. > method > -method Test 29 of 150: Test _RMV (Remove). > -method PASSED: Test 29, \_SB_.PCI0.RP03.PXSX._RMV correctly > +method Test 30 of 155: Test _RMV (Remove). > +method PASSED: Test 30, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 30 of 150: Test _STA (Status). > -method PASSED: Test 30, \_SB_.PCI0.PEGP.VGA_._STA correctly > +method Test 31 of 155: Test _STA (Status). > +method PASSED: Test 31, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKA._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKA._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKB._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKB._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKC._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKC._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKD._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKD._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKE._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKE._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKF._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKF._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKG._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKG._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKH._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKH._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.HPET._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.HPET._STA correctly > method returned sane looking value 0x00000000. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.BAT1._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 31 of 150: Test _BDN (BIOS Dock Name). > -method SKIPPED: Test 31, Skipping test for non-existant object > +method Test 32 of 155: Test _BDN (BIOS Dock Name). > +method SKIPPED: Test 32, Skipping test for non-existant object > method _BDN. > method > -method Test 32 of 150: Test _BBN (Base Bus Number). > -method SKIPPED: Test 32, Skipping test for non-existant object > +method Test 33 of 155: Test _BBN (Base Bus Number). > +method SKIPPED: Test 33, Skipping test for non-existant object > method _BBN. > method > -method Test 33 of 150: Test _DCK (Dock). > -method SKIPPED: Test 33, Skipping test for non-existant object > +method Test 34 of 155: Test _DCK (Dock). > +method SKIPPED: Test 34, Skipping test for non-existant object > method _DCK. > method > -method Test 34 of 150: Test _INI (Initialize). > -method PASSED: Test 34, \_SB_._INI returned no values as > +method Test 35 of 155: Test _INI (Initialize). > +method PASSED: Test 35, \_SB_._INI returned no values as > method expected. > method > -method Test 35 of 150: Test _SEG (Segment). > -method SKIPPED: Test 35, Skipping test for non-existant object > +method Test 36 of 155: Test _SEG (Segment). > +method SKIPPED: Test 36, Skipping test for non-existant object > method _SEG. > method > -method Test 36 of 150: Test _OFF (Set resource off). > -method SKIPPED: Test 36, Skipping test for non-existant object > +method Test 37 of 155: Test _OFF (Set resource off). > +method SKIPPED: Test 37, Skipping test for non-existant object > method _OFF. > method > -method Test 37 of 150: Test _ON (Set resource on). > -method SKIPPED: Test 37, Skipping test for non-existant object > +method Test 38 of 155: Test _ON (Set resource on). > +method SKIPPED: Test 38, Skipping test for non-existant object > method _ON. > method > -method Test 38 of 150: Test _DSW (Device Sleep Wake). > -method SKIPPED: Test 38, Skipping test for non-existant object > +method Test 39 of 155: Test _DSW (Device Sleep Wake). > +method SKIPPED: Test 39, Skipping test for non-existant object > method _DSW. > method > -method Test 39 of 150: Test _IRC (In Rush Current). > -method SKIPPED: Test 39, Skipping test for non-existant object > +method Test 40 of 155: Test _IRC (In Rush Current). > +method SKIPPED: Test 40, Skipping test for non-existant object > method _IRC. > method > -method Test 40 of 150: Test _PRE (Power Resources for > +method Test 41 of 155: Test _PRE (Power Resources for > method Enumeration). > -method SKIPPED: Test 40, Skipping test for non-existant object > +method SKIPPED: Test 41, Skipping test for non-existant object > method _PRE. > method > -method Test 41 of 150: Test _PR0 (Power Resources for D0). > -method SKIPPED: Test 41, Skipping test for non-existant object > +method Test 42 of 155: Test _PR0 (Power Resources for D0). > +method SKIPPED: Test 42, Skipping test for non-existant object > method _PR0. > method > -method Test 42 of 150: Test _PR1 (Power Resources for D1). > -method SKIPPED: Test 42, Skipping test for non-existant object > +method Test 43 of 155: Test _PR1 (Power Resources for D1). > +method SKIPPED: Test 43, Skipping test for non-existant object > method _PR1. > method > -method Test 43 of 150: Test _PR2 (Power Resources for D2). > -method SKIPPED: Test 43, Skipping test for non-existant object > +method Test 44 of 155: Test _PR2 (Power Resources for D2). > +method SKIPPED: Test 44, Skipping test for non-existant object > method _PR2. > method > -method Test 44 of 150: Test _PR3 (Power Resources for D3). > -method SKIPPED: Test 44, Skipping test for non-existant object > +method Test 45 of 155: Test _PR3 (Power Resources for D3). > +method SKIPPED: Test 45, Skipping test for non-existant object > method _PR3. > method > -method Test 45 of 150: Test _PS0 (Power State 0). > -method PASSED: Test 45, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > +method Test 46 of 155: Test _PS0 (Power State 0). > +method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > -method PASSED: Test 45, \_PS0 returned no values as expected. > +method PASSED: Test 46, \_PS0 returned no values as expected. > method > -method Test 46 of 150: Test _PS1 (Power State 1). > -method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > +method Test 47 of 155: Test _PS1 (Power State 1). > +method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 47 of 150: Test _PS2 (Power State 2). > -method SKIPPED: Test 47, Skipping test for non-existant object > +method Test 48 of 155: Test _PS2 (Power State 2). > +method SKIPPED: Test 48, Skipping test for non-existant object > method _PS2. > method > -method Test 48 of 150: Test _PS3 (Power State 3). > -method PASSED: Test 48, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > +method Test 49 of 155: Test _PS3 (Power State 3). > +method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > -method PASSED: Test 48, \_PS3 returned no values as expected. > +method PASSED: Test 49, \_PS3 returned no values as expected. > method > -method Test 49 of 150: Test _PSC (Power State Current). > -method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PSC correctly > +method Test 50 of 155: Test _PSC (Power State Current). > +method PASSED: Test 50, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > -method PASSED: Test 49, \_PSC correctly returned an integer. > +method PASSED: Test 50, \_PSC correctly returned an integer. > method > -method Test 50 of 150: Test _PSE (Power State for Enumeration). > -method SKIPPED: Test 50, Skipping test for non-existant object > +method Test 51 of 155: Test _PSE (Power State for Enumeration). > +method SKIPPED: Test 51, Skipping test for non-existant object > method _PSE. > method > -method Test 51 of 150: Test _PSW (Power State Wake). > -method PASSED: Test 51, \_SB_.PCI0.USB1._PSW returned no values > +method Test 52 of 155: Test _PSW (Power State Wake). > +method PASSED: Test 52, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB2._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB2._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB3._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB3._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB4._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB4._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB5._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 52 of 150: Test _S1D (S1 Device State). > -method SKIPPED: Test 52, Skipping test for non-existant object > +method Test 53 of 155: Test _S1D (S1 Device State). > +method SKIPPED: Test 53, Skipping test for non-existant object > method _S1D. > method > -method Test 53 of 150: Test _S2D (S2 Device State). > -method SKIPPED: Test 53, Skipping test for non-existant object > +method Test 54 of 155: Test _S2D (S2 Device State). > +method SKIPPED: Test 54, Skipping test for non-existant object > method _S2D. > method > -method Test 54 of 150: Test _S3D (S3 Device State). > -method PASSED: Test 54, \_SB_.PCI0._S3D correctly returned an > +method Test 55 of 155: Test _S3D (S3 Device State). > +method PASSED: Test 55, \_SB_.PCI0._S3D correctly returned an > method integer. > -method PASSED: Test 54, \_SB_.PCI0.USB1._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB1._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB2._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB2._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB3._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB3._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB4._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB4._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB5._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB5._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.EHC1._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.EHC1._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.EHC2._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 55 of 150: Test _S4D (S4 Device State). > -method PASSED: Test 55, \_SB_.PCI0._S4D correctly returned an > +method Test 56 of 155: Test _S4D (S4 Device State). > +method PASSED: Test 56, \_SB_.PCI0._S4D correctly returned an > method integer. > -method PASSED: Test 55, \_SB_.PCI0.USB1._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB1._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB2._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB2._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB3._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB3._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB4._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB4._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB5._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB5._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.EHC1._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.EHC1._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.EHC2._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 56 of 150: Test _S0W (S0 Device Wake State). > -method SKIPPED: Test 56, Skipping test for non-existant object > +method Test 57 of 155: Test _S0W (S0 Device Wake State). > +method SKIPPED: Test 57, Skipping test for non-existant object > method _S0W. > method > -method Test 57 of 150: Test _S1W (S1 Device Wake State). > -method SKIPPED: Test 57, Skipping test for non-existant object > +method Test 58 of 155: Test _S1W (S1 Device Wake State). > +method SKIPPED: Test 58, Skipping test for non-existant object > method _S1W. > method > -method Test 58 of 150: Test _S2W (S2 Device Wake State). > -method SKIPPED: Test 58, Skipping test for non-existant object > +method Test 59 of 155: Test _S2W (S2 Device Wake State). > +method SKIPPED: Test 59, Skipping test for non-existant object > method _S2W. > method > -method Test 59 of 150: Test _S3W (S3 Device Wake State). > -method SKIPPED: Test 59, Skipping test for non-existant object > +method Test 60 of 155: Test _S3W (S3 Device Wake State). > +method SKIPPED: Test 60, Skipping test for non-existant object > method _S3W. > method > -method Test 60 of 150: Test _S4W (S4 Device Wake State). > -method SKIPPED: Test 60, Skipping test for non-existant object > +method Test 61 of 155: Test _S4W (S4 Device Wake State). > +method SKIPPED: Test 61, Skipping test for non-existant object > method _S4W. > method > -method Test 61 of 150: Test _S0_ (S0 System State). > +method Test 62 of 155: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > -method PASSED: Test 61, \_S0_ correctly returned a sane looking > +method PASSED: Test 62, \_S0_ correctly returned a sane looking > method package. > method > -method Test 62 of 150: Test _S1_ (S1 System State). > -method SKIPPED: Test 62, Skipping test for non-existant object > +method Test 63 of 155: Test _S1_ (S1 System State). > +method SKIPPED: Test 63, Skipping test for non-existant object > method _S1_. > method > -method Test 63 of 150: Test _S2_ (S2 System State). > -method SKIPPED: Test 63, Skipping test for non-existant object > +method Test 64 of 155: Test _S2_ (S2 System State). > +method SKIPPED: Test 64, Skipping test for non-existant object > method _S2_. > method > -method Test 64 of 150: Test _S3_ (S3 System State). > +method Test 65 of 155: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > -method PASSED: Test 64, \_S3_ correctly returned a sane looking > +method PASSED: Test 65, \_S3_ correctly returned a sane looking > method package. > method > -method Test 65 of 150: Test _S4_ (S4 System State). > +method Test 66 of 155: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > -method PASSED: Test 65, \_S4_ correctly returned a sane looking > +method PASSED: Test 66, \_S4_ correctly returned a sane looking > method package. > method > -method Test 66 of 150: Test _S5_ (S5 System State). > +method Test 67 of 155: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > -method PASSED: Test 66, \_S5_ correctly returned a sane looking > +method PASSED: Test 67, \_S5_ correctly returned a sane looking > method package. > method > -method Test 67 of 150: Test _SWS (System Wake Source). > -method SKIPPED: Test 67, Skipping test for non-existant object > +method Test 68 of 155: Test _SWS (System Wake Source). > +method SKIPPED: Test 68, Skipping test for non-existant object > method _SWS. > method > -method Test 68 of 150: Test _PSS (Performance Supported States). > -method SKIPPED: Test 68, Skipping test for non-existant object > +method Test 69 of 155: Test _PSS (Performance Supported States). > +method SKIPPED: Test 69, Skipping test for non-existant object > method _PSS. > method > -method Test 69 of 150: Test _CPC (Continuous Performance > +method Test 70 of 155: Test _CPC (Continuous Performance > method Control). > -method SKIPPED: Test 69, Skipping test for non-existant object > +method SKIPPED: Test 70, Skipping test for non-existant object > method _CPC. > method > -method Test 70 of 150: Test _CSD (C State Dependencies). > -method SKIPPED: Test 70, Skipping test for non-existant object > +method Test 71 of 155: Test _CSD (C State Dependencies). > +method SKIPPED: Test 71, Skipping test for non-existant object > method _CSD. > method > -method Test 71 of 150: Test _CST (C States). > -method SKIPPED: Test 71, Skipping test for non-existant object > +method Test 72 of 155: Test _CST (C States). > +method SKIPPED: Test 72, Skipping test for non-existant object > method _CST. > method > -method Test 72 of 150: Test _PCT (Performance Control). > -method SKIPPED: Test 72, Skipping test for non-existant object > +method Test 73 of 155: Test _PCT (Performance Control). > +method SKIPPED: Test 73, Skipping test for non-existant object > method _PCT. > method > -method Test 73 of 150: Test _PDL (P-State Depth Limit). > -method SKIPPED: Test 73, Skipping test for non-existant object > +method Test 74 of 155: Test _PDL (P-State Depth Limit). > +method SKIPPED: Test 74, Skipping test for non-existant object > method _PDL. > method > -method Test 74 of 150: Test _PPC (Performance Present > +method Test 75 of 155: Test _PPC (Performance Present > method Capabilities). > -method SKIPPED: Test 74, Skipping test for non-existant object > +method SKIPPED: Test 75, Skipping test for non-existant object > method _PPC. > method > -method Test 75 of 150: Test _PPE (Polling for Platform Error). > -method SKIPPED: Test 75, Skipping test for non-existant object > +method Test 76 of 155: Test _PPE (Polling for Platform Error). > +method SKIPPED: Test 76, Skipping test for non-existant object > method _PPE. > method > -method Test 76 of 150: Test _TDL (T-State Depth Limit). > -method SKIPPED: Test 76, Skipping test for non-existant object > +method Test 77 of 155: Test _TDL (T-State Depth Limit). > +method SKIPPED: Test 77, Skipping test for non-existant object > method _TDL. > method > -method Test 77 of 150: Test _TPC (Throttling Present > +method Test 78 of 155: Test _TPC (Throttling Present > method Capabilities). > -method PASSED: Test 77, \_PR_.CPU0._TPC correctly returned an > +method PASSED: Test 78, \_PR_.CPU0._TPC correctly returned an > method integer. > -method PASSED: Test 77, \_PR_.CPU1._TPC correctly returned an > +method PASSED: Test 78, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 78 of 150: Test _TSD (Throttling State Dependencies). > -method PASSED: Test 78, \_PR_.CPU0._TSD correctly returned a sane > +method Test 79 of 155: Test _TSD (Throttling State Dependencies). > +method PASSED: Test 79, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > -method PASSED: Test 78, \_PR_.CPU1._TSD correctly returned a sane > +method PASSED: Test 79, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 79 of 150: Test _TSS (Throttling Supported States). > +method Test 80 of 155: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -542,7 +547,7 @@ method 4 50% 500 0 0c 00 > method 5 38% 375 0 0b 00 > method 6 25% 250 0 0a 00 > method 7 13% 125 0 09 00 > -method PASSED: Test 79, \_PR_.CPU0._TSS correctly returned a sane > +method PASSED: Test 80, \_PR_.CPU0._TSS correctly returned a sane > method looking package. > method \_PR_.CPU1._TSS values: > method T-State CPU Power Latency Control Status > @@ -555,494 +560,503 @@ method 4 50% 500 0 0c 00 > method 5 38% 375 0 0b 00 > method 6 25% 250 0 0a 00 > method 7 13% 125 0 09 00 > -method PASSED: Test 79, \_PR_.CPU1._TSS correctly returned a sane > +method PASSED: Test 80, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 80 of 150: Test _MSG (Message). > -method SKIPPED: Test 80, Skipping test for non-existant object > +method Test 81 of 155: Test _MSG (Message). > +method SKIPPED: Test 81, Skipping test for non-existant object > method _MSG. > method > -method Test 81 of 150: Test _ALC (Ambient Light Colour > +method Test 82 of 155: Test _ALC (Ambient Light Colour > method Chromaticity). > -method SKIPPED: Test 81, Skipping test for non-existant object > +method SKIPPED: Test 82, Skipping test for non-existant object > method _ALC. > method > -method Test 82 of 150: Test _ALI (Ambient Light Illuminance). > -method SKIPPED: Test 82, Skipping test for non-existant object > +method Test 83 of 155: Test _ALI (Ambient Light Illuminance). > +method SKIPPED: Test 83, Skipping test for non-existant object > method _ALI. > method > -method Test 83 of 150: Test _ALT (Ambient Light Temperature). > -method SKIPPED: Test 83, Skipping test for non-existant object > +method Test 84 of 155: Test _ALT (Ambient Light Temperature). > +method SKIPPED: Test 84, Skipping test for non-existant object > method _ALT. > method > -method Test 84 of 150: Test _ALP (Ambient Light Polling). > -method SKIPPED: Test 84, Skipping test for non-existant object > +method Test 85 of 155: Test _ALP (Ambient Light Polling). > +method SKIPPED: Test 85, Skipping test for non-existant object > method _ALP. > method > -method Test 85 of 150: Test _LID (Lid Status). > -method PASSED: Test 85, \_SB_.LID0._LID correctly returned sane > +method Test 86 of 155: Test _LID (Lid Status). > +method PASSED: Test 86, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 86 of 150: Test _GCP (Get Capabilities). > -method SKIPPED: Test 86, Skipping test for non-existant object > +method Test 87 of 155: Test _UPD (User Presence Detect). > +method SKIPPED: Test 87, Skipping test for non-existant object > +method _UPD. > +method > +method Test 88 of 155: Test _UPP (User Presence Polling). > +method SKIPPED: Test 88, Skipping test for non-existant object > +method _UPP. > +method > +method Test 89 of 155: Test _GCP (Get Capabilities). > +method SKIPPED: Test 89, Skipping test for non-existant object > method _GCP. > method > -method Test 87 of 150: Test _GRT (Get Real Time). > -method SKIPPED: Test 87, Skipping test for non-existant object > +method Test 90 of 155: Test _GRT (Get Real Time). > +method SKIPPED: Test 90, Skipping test for non-existant object > method _GRT. > method > -method Test 88 of 150: Test _GWS (Get Wake Status). > -method SKIPPED: Test 88, Skipping test for non-existant object > +method Test 91 of 155: Test _GWS (Get Wake Status). > +method SKIPPED: Test 91, Skipping test for non-existant object > method _GWS. > method > -method Test 89 of 150: Test _STP (Set Expired Timer Wake Policy). > -method SKIPPED: Test 89, Skipping test for non-existant object > +method Test 92 of 155: Test _STP (Set Expired Timer Wake Policy). > +method SKIPPED: Test 92, Skipping test for non-existant object > method _STP. > method > -method Test 90 of 150: Test _STV (Set Timer Value). > -method SKIPPED: Test 90, Skipping test for non-existant object > +method Test 93 of 155: Test _STV (Set Timer Value). > +method SKIPPED: Test 93, Skipping test for non-existant object > method _STV. > method > -method Test 91 of 150: Test _TIP (Expired Timer Wake Policy). > -method SKIPPED: Test 91, Skipping test for non-existant object > +method Test 94 of 155: Test _TIP (Expired Timer Wake Policy). > +method SKIPPED: Test 94, Skipping test for non-existant object > method _TIP. > method > -method Test 92 of 150: Test _TIV (Timer Values). > -method SKIPPED: Test 92, Skipping test for non-existant object > +method Test 95 of 155: Test _TIV (Timer Values). > +method SKIPPED: Test 95, Skipping test for non-existant object > method _TIV. > method > -method Test 93 of 150: Test _SBS (Smart Battery Subsystem). > -method SKIPPED: Test 93, Skipping test for non-existant object > +method Test 96 of 155: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 96, Skipping test for non-existant object > method _SBS. > method > -method Test 94 of 150: Test _BCT (Battery Charge Time). > -method SKIPPED: Test 94, Skipping test for non-existant object > +method Test 97 of 155: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 97, Skipping test for non-existant object > method _BCT. > method > -method Test 95 of 150: Test _BIF (Battery Information). > -method PASSED: Test 95, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 98 of 155: Test _BIF (Battery Information). > +method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 96 of 150: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 96, Skipping test for non-existant object > +method Test 99 of 155: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 99, Skipping test for non-existant object > method _BIX. > method > -method Test 97 of 150: Test _BMA (Battery Measurement Averaging). > -method SKIPPED: Test 97, Skipping test for non-existant object > +method Test 100 of 155: Test _BMA (Battery Measurement > +method Averaging). > +method SKIPPED: Test 100, Skipping test for non-existant object > method _BMA. > method > -method Test 98 of 150: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 98, Skipping test for non-existant object > +method Test 101 of 155: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 101, Skipping test for non-existant object > method _BMC. > method > -method Test 99 of 150: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 99, Skipping test for non-existant object > +method Test 102 of 155: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 102, Skipping test for non-existant object > method _BMD. > method > -method Test 100 of 150: Test _BMS (Battery Measurement Sampling > +method Test 103 of 155: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 100, Skipping test for non-existant object > +method SKIPPED: Test 103, Skipping test for non-existant object > method _BMS. > method > -method Test 101 of 150: Test _BST (Battery Status). > -method PASSED: Test 101, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 104 of 155: Test _BST (Battery Status). > +method PASSED: Test 104, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 102 of 150: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 102, Skipping test for non-existant object > +method Test 105 of 155: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 105, Skipping test for non-existant object > method _BTP. > method > -method Test 103 of 150: Test _BTM (Battery Time). > -method SKIPPED: Test 103, Skipping test for non-existant object > +method Test 106 of 155: Test _BTM (Battery Time). > +method SKIPPED: Test 106, Skipping test for non-existant object > method _BTM. > method > -method Test 104 of 150: Test _PCL (Power Consumer List). > +method Test 107 of 155: Test _PCL (Power Consumer List). > method > -method Test 105 of 150: Test _PIF (Power Source Information). > -method SKIPPED: Test 105, Skipping test for non-existant object > +method Test 108 of 155: Test _PIF (Power Source Information). > +method SKIPPED: Test 108, Skipping test for non-existant object > method _PIF. > method > -method Test 106 of 150: Test _PSR (Power Source). > -method PASSED: Test 106, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 109 of 155: Test _PSR (Power Source). > +method PASSED: Test 109, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 107 of 150: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 107, Skipping test for non-existant object > +method Test 110 of 155: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 110, Skipping test for non-existant object > method _GAI. > method > -method Test 108 of 150: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 108, Skipping test for non-existant object > +method Test 111 of 155: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 111, Skipping test for non-existant object > method _PMM. > method > -method Test 109 of 150: Test _FIF (Fan Information). > -method SKIPPED: Test 109, Skipping test for non-existant object > +method Test 112 of 155: Test _FIF (Fan Information). > +method SKIPPED: Test 112, Skipping test for non-existant object > method _FIF. > method > -method Test 110 of 150: Test _FSL (Fan Set Level). > -method SKIPPED: Test 110, Skipping test for non-existant object > +method Test 113 of 155: Test _FSL (Fan Set Level). > +method SKIPPED: Test 113, Skipping test for non-existant object > method _FSL. > method > -method Test 111 of 150: Test _FST (Fan Status). > -method SKIPPED: Test 111, Skipping test for non-existant object > +method Test 114 of 155: Test _FST (Fan Status). > +method SKIPPED: Test 114, Skipping test for non-existant object > method _FST. > method > -method Test 112 of 150: Test _ACx (Active Cooling). > -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > +method Test 115 of 155: Test _ACx (Active Cooling). > +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > method returned a sane looking return type. > method > -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly > +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly > method returned a sane looking return type. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC2. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC3. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC4. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC5. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC6. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC7. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC8. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC9. > method > method > -method Test 113 of 150: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 113, Skipping test for non-existant object > +method Test 116 of 155: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 116, Skipping test for non-existant object > method _CRT. > method > -method Test 114 of 150: Test _DTI (Device Temperature > +method Test 117 of 155: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 114, Skipping test for non-existant object > +method SKIPPED: Test 117, Skipping test for non-existant object > method _DTI. > method > -method Test 115 of 150: Test _HOT (Hot Temperature). > -method SKIPPED: Test 115, Skipping test for non-existant object > +method Test 118 of 155: Test _HOT (Hot Temperature). > +method SKIPPED: Test 118, Skipping test for non-existant object > method _HOT. > method > -method Test 116 of 150: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 116, Skipping test for non-existant object > +method Test 119 of 155: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 119, Skipping test for non-existant object > method _NTT. > method > -method Test 117 of 150: Test _PSV (Passive Temp). > -method SKIPPED: Test 117, Skipping test for non-existant object > +method Test 120 of 155: Test _PSV (Passive Temp). > +method SKIPPED: Test 120, Skipping test for non-existant object > method _PSV. > method > -method Test 118 of 150: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 118, Skipping test for non-existant object > +method Test 121 of 155: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 121, Skipping test for non-existant object > method _RTV. > method > -method Test 119 of 150: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 119, Skipping test for non-existant object > +method Test 122 of 155: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 122, Skipping test for non-existant object > method _DTI. > method > -method Test 120 of 150: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 120, Skipping test for non-existant object > +method Test 123 of 155: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 123, Skipping test for non-existant object > method _TC1. > method > -method Test 121 of 150: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 121, Skipping test for non-existant object > +method Test 124 of 155: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 124, Skipping test for non-existant object > method _TC2. > method > -method Test 122 of 150: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 122, Skipping test for non-existant object > +method Test 125 of 155: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 125, Skipping test for non-existant object > method _TMP. > method > -method Test 123 of 150: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 123, Skipping test for non-existant object > +method Test 126 of 155: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 126, Skipping test for non-existant object > method _TPT. > method > -method Test 124 of 150: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 124, Skipping test for non-existant object > +method Test 127 of 155: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 127, Skipping test for non-existant object > method _TSP. > method > -method Test 125 of 150: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 125, Skipping test for non-existant object > +method Test 128 of 155: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 128, Skipping test for non-existant object > method _TST. > method > -method Test 126 of 150: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 126, Skipping test for non-existant object > +method Test 129 of 155: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 129, Skipping test for non-existant object > method _TZP. > method > -method Test 127 of 150: Test _PTS (Prepare to Sleep). > +method Test 130 of 155: Test _PTS (Prepare to Sleep). > method Test _PTS(1). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(2). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(3). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method > -method Test 128 of 150: Test _TTS (Transition to State). > -method SKIPPED: Test 128, Optional control method _TTS does not > +method Test 131 of 155: Test _TTS (Transition to State). > +method SKIPPED: Test 131, Optional control method _TTS does not > method exist. > method > -method Test 129 of 150: Test _S0 (System S0 State). > -method SKIPPED: Test 129, Skipping test for non-existant object > +method Test 132 of 155: Test _S0 (System S0 State). > +method SKIPPED: Test 132, Skipping test for non-existant object > method _S0. > method > -method Test 130 of 150: Test _S1 (System S1 State). > -method SKIPPED: Test 130, Skipping test for non-existant object > +method Test 133 of 155: Test _S1 (System S1 State). > +method SKIPPED: Test 133, Skipping test for non-existant object > method _S1. > method > -method Test 131 of 150: Test _S2 (System S2 State). > -method SKIPPED: Test 131, Skipping test for non-existant object > +method Test 134 of 155: Test _S2 (System S2 State). > +method SKIPPED: Test 134, Skipping test for non-existant object > method _S2. > method > -method Test 132 of 150: Test _S3 (System S3 State). > -method SKIPPED: Test 132, Skipping test for non-existant object > +method Test 135 of 155: Test _S3 (System S3 State). > +method SKIPPED: Test 135, Skipping test for non-existant object > method _S3. > method > -method Test 133 of 150: Test _S4 (System S4 State). > -method SKIPPED: Test 133, Skipping test for non-existant object > +method Test 136 of 155: Test _S4 (System S4 State). > +method SKIPPED: Test 136, Skipping test for non-existant object > method _S4. > method > -method Test 134 of 150: Test _S5 (System S5 State). > -method SKIPPED: Test 134, Skipping test for non-existant object > +method Test 137 of 155: Test _S5 (System S5 State). > +method SKIPPED: Test 137, Skipping test for non-existant object > method _S5. > method > -method Test 135 of 150: Test _WAK (System Wake). > +method Test 138 of 155: Test _WAK (System Wake). > method Test _WAK(1) System Wake, State S1. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(2) System Wake, State S2. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 136 of 150: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 136, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 139 of 155: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 139, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 137 of 150: Test _BCL (Query List of Brightness > +method Test 140 of 155: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 137, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 138 of 150: Test _BCM (Set Brightness Level). > -method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 141 of 155: Test _BCM (Set Brightness Level). > +method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 138, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 141, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 139 of 150: Test _BQC (Brightness Query Current > +method Test 142 of 155: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 140 of 150: Test _DCS (Return the Status of Output > +method Test 143 of 155: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 141 of 150: Test _DDC (Return the EDID for this > +method Test 144 of 155: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 141, Skipping test for non-existant object > +method SKIPPED: Test 144, Skipping test for non-existant object > method _DDC. > method > -method Test 142 of 150: Test _DSS (Device Set State). > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 145 of 155: Test _DSS (Device Set State). > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 143 of 150: Test _DGS (Query Graphics State). > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 146 of 155: Test _DGS (Query Graphics State). > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 144 of 150: Test _DOD (Enumerate All Devices Attached > +method Test 147 of 155: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1065,7 +1079,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 144, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1074,37 +1088,45 @@ method Type of display: 4 (Internal/Integrated Digital Flat P > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 144, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 147, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 145 of 150: Test _DOS (Enable/Disable Output > +method Test 148 of 155: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 145, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 148, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 146 of 150: Test _GPD (Get POST Device). > -method SKIPPED: Test 146, Skipping test for non-existant object > +method Test 149 of 155: Test _GPD (Get POST Device). > +method SKIPPED: Test 149, Skipping test for non-existant object > method _GPD. > method > -method Test 147 of 150: Test _ROM (Get ROM Data). > -method SKIPPED: Test 147, Skipping test for non-existant object > +method Test 150 of 155: Test _ROM (Get ROM Data). > +method SKIPPED: Test 150, Skipping test for non-existant object > method _ROM. > method > -method Test 148 of 150: Test _SPD (Set POST Device). > -method SKIPPED: Test 148, Skipping test for non-existant object > +method Test 151 of 155: Test _SPD (Set POST Device). > +method SKIPPED: Test 151, Skipping test for non-existant object > method _SPD. > method > -method Test 149 of 150: Test _VPO (Video POST Options). > -method SKIPPED: Test 149, Skipping test for non-existant object > +method Test 152 of 155: Test _VPO (Video POST Options). > +method SKIPPED: Test 152, Skipping test for non-existant object > method _VPO. > method > -method Test 150 of 150: Check _CBA (Configuration Base Address). > -method SKIPPED: Test 150, Skipping test for non-existant object > +method Test 153 of 155: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 153, Skipping test for non-existant object > method _CBA. > method > +method Test 154 of 155: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 154, Skipping test for non-existant object > +method _IFT. > +method > +method Test 155 of 155: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 155, Skipping test for non-existant object > +method _SRV. > +method > method ========================================================== > -method 234 passed, 0 failed, 0 warning, 0 aborted, 117 skipped, 0 > +method 237 passed, 0 failed, 0 warning, 0 aborted, 121 skipped, 0 > method info only. > method ========================================================== > -- > 1.8.5.1 > Acked-by: Keng-Yu Lin <kengyu@canonical.com>
On 12/10/2013 09:48 PM, Colin King wrote: > From: Colin Ian King <colin.king@canonical.com> > > The method test as included some new tests, so sync the test > to fwts method commit 711254be06ba5cfdecdae12d55ef5efe07d2eb78 > > Signed-off-by: Colin Ian King <colin.king@canonical.com> > --- > method-0001/method-0001.log | 1022 ++++++++++++++++++++++--------------------- > 1 file changed, 522 insertions(+), 500 deletions(-) > > diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log > index 1d4adb2..d8802a8 100644 > --- a/method-0001/method-0001.log > +++ b/method-0001/method-0001.log > @@ -1,536 +1,541 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 150: Test Method Names. > +method Test 1 of 155: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 150: Test _AEI. > +method Test 2 of 155: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existant object > method _AEI. > method > -method Test 3 of 150: Test _CID (Compatible ID). > -method PASSED: Test 3, \_SB_.PCI0._CID returned an integer > +method Test 3 of 155: Test _PIC (Inform AML of Interrupt Model). > +method PASSED: Test 3, \_PIC returned no values as expected. > +method PASSED: Test 3, \_PIC returned no values as expected. > +method PASSED: Test 3, \_PIC returned no values as expected. > +method > +method Test 4 of 155: Test _CID (Compatible ID). > +method PASSED: Test 4, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > -method PASSED: Test 3, \_SB_.PCI0.LPCB.HPET._CID returned an > +method PASSED: Test 4, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 4 of 150: Test _DDN (DOS Device Name). > -method SKIPPED: Test 4, Skipping test for non-existant object > +method Test 5 of 155: Test _DDN (DOS Device Name). > +method SKIPPED: Test 5, Skipping test for non-existant object > method _DDN. > method > -method Test 5 of 150: Test _HID (Hardware ID). > -method PASSED: Test 5, \_SB_.AMW0._HID returned a string > +method Test 6 of 155: Test _HID (Hardware ID). > +method PASSED: Test 6, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > -method PASSED: Test 5, \_SB_.LID0._HID returned an integer > +method PASSED: Test 6, \_SB_.LID0._HID returned an integer > method 0x0d0cd041 (EISA ID PNP0C0D). > -method PASSED: Test 5, \_SB_.PWRB._HID returned an integer > +method PASSED: Test 6, \_SB_.PWRB._HID returned an integer > method 0x0c0cd041 (EISA ID PNP0C0C). > -method PASSED: Test 5, \_SB_.PCI0._HID returned an integer > +method PASSED: Test 6, \_SB_.PCI0._HID returned an integer > method 0x080ad041 (EISA ID PNP0A08). > -method PASSED: Test 5, \_SB_.PCI0.PDRC._HID returned an integer > +method PASSED: Test 6, \_SB_.PCI0.PDRC._HID returned an integer > method 0x020cd041 (EISA ID PNP0C02). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKA._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKA._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKB._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKB._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKC._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKD._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKD._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKE._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKE._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKF._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKF._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKG._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKG._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKH._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKH._HID returned an > method integer 0x0f0cd041 (EISA ID PNP0C0F). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.DMAC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.DMAC._HID returned an > method integer 0x0002d041 (EISA ID PNP0200). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.FWHD._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.FWHD._HID returned an > method integer 0x0008d425 (EISA ID INT0800). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.HPET._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._HID returned an > method integer 0x0301d041 (EISA ID PNP0103). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.IPIC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.IPIC._HID returned an > method integer 0x0000d041 (EISA ID PNP0000). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.MATH._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.MATH._HID returned an > method integer 0x040cd041 (EISA ID PNP0C04). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.LDRC._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.LDRC._HID returned an > method integer 0x020cd041 (EISA ID PNP0C02). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.RTC_._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.RTC_._HID returned an > method integer 0x000bd041 (EISA ID PNP0B00). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.TIMR._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.TIMR._HID returned an > method integer 0x0001d041 (EISA ID PNP0100). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.ACAD._HID returned a > +method PASSED: Test 6, \_SB_.PCI0.LPCB.ACAD._HID returned a > method string 'ACPI0003' as expected. > -method PASSED: Test 5, \_SB_.PCI0.LPCB.EC0_._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.EC0_._HID returned an > method integer 0x090cd041 (EISA ID PNP0C09). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.BAT1._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.BAT1._HID returned an > method integer 0x0a0cd041 (EISA ID PNP0C0A). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2K._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2K._HID returned an > method integer 0x0303d041 (EISA ID PNP0303). > -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2M._HID returned an > +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 6 of 150: Test _HRV (Hardware Revision Number). > -method SKIPPED: Test 6, Skipping test for non-existant object > +method Test 7 of 155: Test _HRV (Hardware Revision Number). > +method SKIPPED: Test 7, Skipping test for non-existant object > method _HRV. > method > -method Test 7 of 150: Test _PLD (Physical Device Location). > -method SKIPPED: Test 7, Skipping test for non-existant object > +method Test 8 of 155: Test _PLD (Physical Device Location). > +method SKIPPED: Test 8, Skipping test for non-existant object > method _PLD. > method > -method Test 8 of 150: Test _SUB (Subsystem ID). > -method SKIPPED: Test 8, Skipping test for non-existant object > +method Test 9 of 155: Test _SUB (Subsystem ID). > +method SKIPPED: Test 9, Skipping test for non-existant object > method _SUB. > method > -method Test 9 of 150: Test _SUN (Slot User Number). > -method SKIPPED: Test 9, Skipping test for non-existant object > +method Test 10 of 155: Test _SUN (Slot User Number). > +method SKIPPED: Test 10, Skipping test for non-existant object > method _SUN. > method > -method Test 10 of 150: Test _STR (String). > -method SKIPPED: Test 10, Skipping test for non-existant object > +method Test 11 of 155: Test _STR (String). > +method SKIPPED: Test 11, Skipping test for non-existant object > method _STR. > method > -method Test 11 of 150: Test _UID (Unique ID). > -method PASSED: Test 11, \_SB_.AMW0._UID correctly returned sane > +method Test 12 of 155: Test _UID (Unique ID). > +method PASSED: Test 12, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > -method PASSED: Test 11, \_SB_.PCI0.PDRC._UID correctly returned > +method PASSED: Test 12, \_SB_.PCI0.PDRC._UID correctly returned > method sane looking value 0x00000001. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKA._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._UID correctly > method returned sane looking value 0x00000001. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKB._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._UID correctly > method returned sane looking value 0x00000002. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKC._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKC._UID correctly > method returned sane looking value 0x00000003. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKD._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKD._UID correctly > method returned sane looking value 0x00000004. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKE._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKE._UID correctly > method returned sane looking value 0x00000005. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKF._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKF._UID correctly > method returned sane looking value 0x00000006. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKG._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKG._UID correctly > method returned sane looking value 0x00000007. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKH._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._UID correctly > method returned sane looking value 0x00000008. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.LDRC._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.LDRC._UID correctly > method returned sane looking value 0x00000002. > -method PASSED: Test 11, \_SB_.PCI0.LPCB.BAT1._UID correctly > +method PASSED: Test 12, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 12 of 150: Test _CDM (Clock Domain). > -method SKIPPED: Test 12, Skipping test for non-existant object > +method Test 13 of 155: Test _CDM (Clock Domain). > +method SKIPPED: Test 13, Skipping test for non-existant object > method _CDM. > method > -method Test 13 of 150: Test _CRS (Current Resource Settings). > -method PASSED: Test 13, \_SB_.PCI0._CRS (WORD Address Space > +method Test 14 of 155: Test _CRS (Current Resource Settings). > +method PASSED: Test 14, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed > +method PASSED: Test 14, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed > method Location Memory Range Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port > +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port > method Descriptor) looks sane. > -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 14 of 150: Test _DIS (Disable). > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._DIS returned no > +method Test 15 of 155: Test _DIS (Disable). > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKB._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKC._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKD._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKE._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKF._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKG._DIS returned no > method values as expected. > -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._DIS returned no > +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 15 of 150: Test _DMA (Direct Memory Access). > -method SKIPPED: Test 15, Skipping test for non-existant object > +method Test 16 of 155: Test _DMA (Direct Memory Access). > +method SKIPPED: Test 16, Skipping test for non-existant object > method _DMA. > method > -method Test 16 of 150: Test _FIX (Fixed Register Resource > +method Test 17 of 155: Test _FIX (Fixed Register Resource > method Provider). > -method SKIPPED: Test 16, Skipping test for non-existant object > +method SKIPPED: Test 17, Skipping test for non-existant object > method _FIX. > method > -method Test 17 of 150: Test _GSB (Global System Interrupt Base). > -method SKIPPED: Test 17, Skipping test for non-existant object > +method Test 18 of 155: Test _GSB (Global System Interrupt Base). > +method SKIPPED: Test 18, Skipping test for non-existant object > method _GSB. > method > -method Test 18 of 150: Test _HPP (Hot Plug Parameters). > -method SKIPPED: Test 18, Skipping test for non-existant object > +method Test 19 of 155: Test _HPP (Hot Plug Parameters). > +method SKIPPED: Test 19, Skipping test for non-existant object > method _HPP. > method > -method Test 19 of 150: Test _PRS (Possible Resource Settings). > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > +method Test 20 of 155: Test _PRS (Possible Resource Settings). > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ > method Descriptor) looks sane. > -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 20 of 150: Test _PXM (Proximity). > -method SKIPPED: Test 20, Skipping test for non-existant object > +method Test 21 of 155: Test _PXM (Proximity). > +method SKIPPED: Test 21, Skipping test for non-existant object > method _PXM. > method > -method Test 21 of 150: Test _EDL (Eject Device List). > -method SKIPPED: Test 21, Skipping test for non-existant object > +method Test 22 of 155: Test _EDL (Eject Device List). > +method SKIPPED: Test 22, Skipping test for non-existant object > method _EDL. > method > -method Test 22 of 150: Test _EJD (Ejection Dependent Device). > -method SKIPPED: Test 22, Skipping test for non-existant object > +method Test 23 of 155: Test _EJD (Ejection Dependent Device). > +method SKIPPED: Test 23, Skipping test for non-existant object > method _EJD. > method > -method Test 23 of 150: Test _EJ0 (Eject). > -method SKIPPED: Test 23, Skipping test for non-existant object > +method Test 24 of 155: Test _EJ0 (Eject). > +method SKIPPED: Test 24, Skipping test for non-existant object > method _EJ0. > method > -method Test 24 of 150: Test _EJ1 (Eject). > -method SKIPPED: Test 24, Skipping test for non-existant object > +method Test 25 of 155: Test _EJ1 (Eject). > +method SKIPPED: Test 25, Skipping test for non-existant object > method _EJ1. > method > -method Test 25 of 150: Test _EJ2 (Eject). > -method SKIPPED: Test 25, Skipping test for non-existant object > +method Test 26 of 155: Test _EJ2 (Eject). > +method SKIPPED: Test 26, Skipping test for non-existant object > method _EJ2. > method > -method Test 26 of 150: Test _EJ3 (Eject). > -method SKIPPED: Test 26, Skipping test for non-existant object > +method Test 27 of 155: Test _EJ3 (Eject). > +method SKIPPED: Test 27, Skipping test for non-existant object > method _EJ3. > method > -method Test 27 of 150: Test _EJ4 (Eject). > -method SKIPPED: Test 27, Skipping test for non-existant object > +method Test 28 of 155: Test _EJ4 (Eject). > +method SKIPPED: Test 28, Skipping test for non-existant object > method _EJ4. > method > -method Test 28 of 150: Test _LCK (Lock). > -method SKIPPED: Test 28, Skipping test for non-existant object > +method Test 29 of 155: Test _LCK (Lock). > +method SKIPPED: Test 29, Skipping test for non-existant object > method _LCK. > method > -method Test 29 of 150: Test _RMV (Remove). > -method PASSED: Test 29, \_SB_.PCI0.RP03.PXSX._RMV correctly > +method Test 30 of 155: Test _RMV (Remove). > +method PASSED: Test 30, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 30 of 150: Test _STA (Status). > -method PASSED: Test 30, \_SB_.PCI0.PEGP.VGA_._STA correctly > +method Test 31 of 155: Test _STA (Status). > +method PASSED: Test 31, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKA._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKA._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKB._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKB._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKC._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKC._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKD._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKD._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKE._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKE._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKF._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKF._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKG._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKG._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKH._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKH._STA correctly > method returned sane looking value 0x0000000b. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.HPET._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.HPET._STA correctly > method returned sane looking value 0x00000000. > -method PASSED: Test 30, \_SB_.PCI0.LPCB.BAT1._STA correctly > +method PASSED: Test 31, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 31 of 150: Test _BDN (BIOS Dock Name). > -method SKIPPED: Test 31, Skipping test for non-existant object > +method Test 32 of 155: Test _BDN (BIOS Dock Name). > +method SKIPPED: Test 32, Skipping test for non-existant object > method _BDN. > method > -method Test 32 of 150: Test _BBN (Base Bus Number). > -method SKIPPED: Test 32, Skipping test for non-existant object > +method Test 33 of 155: Test _BBN (Base Bus Number). > +method SKIPPED: Test 33, Skipping test for non-existant object > method _BBN. > method > -method Test 33 of 150: Test _DCK (Dock). > -method SKIPPED: Test 33, Skipping test for non-existant object > +method Test 34 of 155: Test _DCK (Dock). > +method SKIPPED: Test 34, Skipping test for non-existant object > method _DCK. > method > -method Test 34 of 150: Test _INI (Initialize). > -method PASSED: Test 34, \_SB_._INI returned no values as > +method Test 35 of 155: Test _INI (Initialize). > +method PASSED: Test 35, \_SB_._INI returned no values as > method expected. > method > -method Test 35 of 150: Test _SEG (Segment). > -method SKIPPED: Test 35, Skipping test for non-existant object > +method Test 36 of 155: Test _SEG (Segment). > +method SKIPPED: Test 36, Skipping test for non-existant object > method _SEG. > method > -method Test 36 of 150: Test _OFF (Set resource off). > -method SKIPPED: Test 36, Skipping test for non-existant object > +method Test 37 of 155: Test _OFF (Set resource off). > +method SKIPPED: Test 37, Skipping test for non-existant object > method _OFF. > method > -method Test 37 of 150: Test _ON (Set resource on). > -method SKIPPED: Test 37, Skipping test for non-existant object > +method Test 38 of 155: Test _ON (Set resource on). > +method SKIPPED: Test 38, Skipping test for non-existant object > method _ON. > method > -method Test 38 of 150: Test _DSW (Device Sleep Wake). > -method SKIPPED: Test 38, Skipping test for non-existant object > +method Test 39 of 155: Test _DSW (Device Sleep Wake). > +method SKIPPED: Test 39, Skipping test for non-existant object > method _DSW. > method > -method Test 39 of 150: Test _IRC (In Rush Current). > -method SKIPPED: Test 39, Skipping test for non-existant object > +method Test 40 of 155: Test _IRC (In Rush Current). > +method SKIPPED: Test 40, Skipping test for non-existant object > method _IRC. > method > -method Test 40 of 150: Test _PRE (Power Resources for > +method Test 41 of 155: Test _PRE (Power Resources for > method Enumeration). > -method SKIPPED: Test 40, Skipping test for non-existant object > +method SKIPPED: Test 41, Skipping test for non-existant object > method _PRE. > method > -method Test 41 of 150: Test _PR0 (Power Resources for D0). > -method SKIPPED: Test 41, Skipping test for non-existant object > +method Test 42 of 155: Test _PR0 (Power Resources for D0). > +method SKIPPED: Test 42, Skipping test for non-existant object > method _PR0. > method > -method Test 42 of 150: Test _PR1 (Power Resources for D1). > -method SKIPPED: Test 42, Skipping test for non-existant object > +method Test 43 of 155: Test _PR1 (Power Resources for D1). > +method SKIPPED: Test 43, Skipping test for non-existant object > method _PR1. > method > -method Test 43 of 150: Test _PR2 (Power Resources for D2). > -method SKIPPED: Test 43, Skipping test for non-existant object > +method Test 44 of 155: Test _PR2 (Power Resources for D2). > +method SKIPPED: Test 44, Skipping test for non-existant object > method _PR2. > method > -method Test 44 of 150: Test _PR3 (Power Resources for D3). > -method SKIPPED: Test 44, Skipping test for non-existant object > +method Test 45 of 155: Test _PR3 (Power Resources for D3). > +method SKIPPED: Test 45, Skipping test for non-existant object > method _PR3. > method > -method Test 45 of 150: Test _PS0 (Power State 0). > -method PASSED: Test 45, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > +method Test 46 of 155: Test _PS0 (Power State 0). > +method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > -method PASSED: Test 45, \_PS0 returned no values as expected. > +method PASSED: Test 46, \_PS0 returned no values as expected. > method > -method Test 46 of 150: Test _PS1 (Power State 1). > -method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > +method Test 47 of 155: Test _PS1 (Power State 1). > +method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 47 of 150: Test _PS2 (Power State 2). > -method SKIPPED: Test 47, Skipping test for non-existant object > +method Test 48 of 155: Test _PS2 (Power State 2). > +method SKIPPED: Test 48, Skipping test for non-existant object > method _PS2. > method > -method Test 48 of 150: Test _PS3 (Power State 3). > -method PASSED: Test 48, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > +method Test 49 of 155: Test _PS3 (Power State 3). > +method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > -method PASSED: Test 48, \_PS3 returned no values as expected. > +method PASSED: Test 49, \_PS3 returned no values as expected. > method > -method Test 49 of 150: Test _PSC (Power State Current). > -method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PSC correctly > +method Test 50 of 155: Test _PSC (Power State Current). > +method PASSED: Test 50, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > -method PASSED: Test 49, \_PSC correctly returned an integer. > +method PASSED: Test 50, \_PSC correctly returned an integer. > method > -method Test 50 of 150: Test _PSE (Power State for Enumeration). > -method SKIPPED: Test 50, Skipping test for non-existant object > +method Test 51 of 155: Test _PSE (Power State for Enumeration). > +method SKIPPED: Test 51, Skipping test for non-existant object > method _PSE. > method > -method Test 51 of 150: Test _PSW (Power State Wake). > -method PASSED: Test 51, \_SB_.PCI0.USB1._PSW returned no values > +method Test 52 of 155: Test _PSW (Power State Wake). > +method PASSED: Test 52, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB2._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB2._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB3._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB3._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB4._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB4._PSW returned no values > method as expected. > -method PASSED: Test 51, \_SB_.PCI0.USB5._PSW returned no values > +method PASSED: Test 52, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 52 of 150: Test _S1D (S1 Device State). > -method SKIPPED: Test 52, Skipping test for non-existant object > +method Test 53 of 155: Test _S1D (S1 Device State). > +method SKIPPED: Test 53, Skipping test for non-existant object > method _S1D. > method > -method Test 53 of 150: Test _S2D (S2 Device State). > -method SKIPPED: Test 53, Skipping test for non-existant object > +method Test 54 of 155: Test _S2D (S2 Device State). > +method SKIPPED: Test 54, Skipping test for non-existant object > method _S2D. > method > -method Test 54 of 150: Test _S3D (S3 Device State). > -method PASSED: Test 54, \_SB_.PCI0._S3D correctly returned an > +method Test 55 of 155: Test _S3D (S3 Device State). > +method PASSED: Test 55, \_SB_.PCI0._S3D correctly returned an > method integer. > -method PASSED: Test 54, \_SB_.PCI0.USB1._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB1._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB2._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB2._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB3._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB3._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB4._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB4._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.USB5._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.USB5._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.EHC1._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.EHC1._S3D correctly returned > method an integer. > -method PASSED: Test 54, \_SB_.PCI0.EHC2._S3D correctly returned > +method PASSED: Test 55, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 55 of 150: Test _S4D (S4 Device State). > -method PASSED: Test 55, \_SB_.PCI0._S4D correctly returned an > +method Test 56 of 155: Test _S4D (S4 Device State). > +method PASSED: Test 56, \_SB_.PCI0._S4D correctly returned an > method integer. > -method PASSED: Test 55, \_SB_.PCI0.USB1._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB1._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB2._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB2._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB3._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB3._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB4._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB4._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.USB5._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.USB5._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.EHC1._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.EHC1._S4D correctly returned > method an integer. > -method PASSED: Test 55, \_SB_.PCI0.EHC2._S4D correctly returned > +method PASSED: Test 56, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 56 of 150: Test _S0W (S0 Device Wake State). > -method SKIPPED: Test 56, Skipping test for non-existant object > +method Test 57 of 155: Test _S0W (S0 Device Wake State). > +method SKIPPED: Test 57, Skipping test for non-existant object > method _S0W. > method > -method Test 57 of 150: Test _S1W (S1 Device Wake State). > -method SKIPPED: Test 57, Skipping test for non-existant object > +method Test 58 of 155: Test _S1W (S1 Device Wake State). > +method SKIPPED: Test 58, Skipping test for non-existant object > method _S1W. > method > -method Test 58 of 150: Test _S2W (S2 Device Wake State). > -method SKIPPED: Test 58, Skipping test for non-existant object > +method Test 59 of 155: Test _S2W (S2 Device Wake State). > +method SKIPPED: Test 59, Skipping test for non-existant object > method _S2W. > method > -method Test 59 of 150: Test _S3W (S3 Device Wake State). > -method SKIPPED: Test 59, Skipping test for non-existant object > +method Test 60 of 155: Test _S3W (S3 Device Wake State). > +method SKIPPED: Test 60, Skipping test for non-existant object > method _S3W. > method > -method Test 60 of 150: Test _S4W (S4 Device Wake State). > -method SKIPPED: Test 60, Skipping test for non-existant object > +method Test 61 of 155: Test _S4W (S4 Device Wake State). > +method SKIPPED: Test 61, Skipping test for non-existant object > method _S4W. > method > -method Test 61 of 150: Test _S0_ (S0 System State). > +method Test 62 of 155: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > -method PASSED: Test 61, \_S0_ correctly returned a sane looking > +method PASSED: Test 62, \_S0_ correctly returned a sane looking > method package. > method > -method Test 62 of 150: Test _S1_ (S1 System State). > -method SKIPPED: Test 62, Skipping test for non-existant object > +method Test 63 of 155: Test _S1_ (S1 System State). > +method SKIPPED: Test 63, Skipping test for non-existant object > method _S1_. > method > -method Test 63 of 150: Test _S2_ (S2 System State). > -method SKIPPED: Test 63, Skipping test for non-existant object > +method Test 64 of 155: Test _S2_ (S2 System State). > +method SKIPPED: Test 64, Skipping test for non-existant object > method _S2_. > method > -method Test 64 of 150: Test _S3_ (S3 System State). > +method Test 65 of 155: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > -method PASSED: Test 64, \_S3_ correctly returned a sane looking > +method PASSED: Test 65, \_S3_ correctly returned a sane looking > method package. > method > -method Test 65 of 150: Test _S4_ (S4 System State). > +method Test 66 of 155: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > -method PASSED: Test 65, \_S4_ correctly returned a sane looking > +method PASSED: Test 66, \_S4_ correctly returned a sane looking > method package. > method > -method Test 66 of 150: Test _S5_ (S5 System State). > +method Test 67 of 155: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > -method PASSED: Test 66, \_S5_ correctly returned a sane looking > +method PASSED: Test 67, \_S5_ correctly returned a sane looking > method package. > method > -method Test 67 of 150: Test _SWS (System Wake Source). > -method SKIPPED: Test 67, Skipping test for non-existant object > +method Test 68 of 155: Test _SWS (System Wake Source). > +method SKIPPED: Test 68, Skipping test for non-existant object > method _SWS. > method > -method Test 68 of 150: Test _PSS (Performance Supported States). > -method SKIPPED: Test 68, Skipping test for non-existant object > +method Test 69 of 155: Test _PSS (Performance Supported States). > +method SKIPPED: Test 69, Skipping test for non-existant object > method _PSS. > method > -method Test 69 of 150: Test _CPC (Continuous Performance > +method Test 70 of 155: Test _CPC (Continuous Performance > method Control). > -method SKIPPED: Test 69, Skipping test for non-existant object > +method SKIPPED: Test 70, Skipping test for non-existant object > method _CPC. > method > -method Test 70 of 150: Test _CSD (C State Dependencies). > -method SKIPPED: Test 70, Skipping test for non-existant object > +method Test 71 of 155: Test _CSD (C State Dependencies). > +method SKIPPED: Test 71, Skipping test for non-existant object > method _CSD. > method > -method Test 71 of 150: Test _CST (C States). > -method SKIPPED: Test 71, Skipping test for non-existant object > +method Test 72 of 155: Test _CST (C States). > +method SKIPPED: Test 72, Skipping test for non-existant object > method _CST. > method > -method Test 72 of 150: Test _PCT (Performance Control). > -method SKIPPED: Test 72, Skipping test for non-existant object > +method Test 73 of 155: Test _PCT (Performance Control). > +method SKIPPED: Test 73, Skipping test for non-existant object > method _PCT. > method > -method Test 73 of 150: Test _PDL (P-State Depth Limit). > -method SKIPPED: Test 73, Skipping test for non-existant object > +method Test 74 of 155: Test _PDL (P-State Depth Limit). > +method SKIPPED: Test 74, Skipping test for non-existant object > method _PDL. > method > -method Test 74 of 150: Test _PPC (Performance Present > +method Test 75 of 155: Test _PPC (Performance Present > method Capabilities). > -method SKIPPED: Test 74, Skipping test for non-existant object > +method SKIPPED: Test 75, Skipping test for non-existant object > method _PPC. > method > -method Test 75 of 150: Test _PPE (Polling for Platform Error). > -method SKIPPED: Test 75, Skipping test for non-existant object > +method Test 76 of 155: Test _PPE (Polling for Platform Error). > +method SKIPPED: Test 76, Skipping test for non-existant object > method _PPE. > method > -method Test 76 of 150: Test _TDL (T-State Depth Limit). > -method SKIPPED: Test 76, Skipping test for non-existant object > +method Test 77 of 155: Test _TDL (T-State Depth Limit). > +method SKIPPED: Test 77, Skipping test for non-existant object > method _TDL. > method > -method Test 77 of 150: Test _TPC (Throttling Present > +method Test 78 of 155: Test _TPC (Throttling Present > method Capabilities). > -method PASSED: Test 77, \_PR_.CPU0._TPC correctly returned an > +method PASSED: Test 78, \_PR_.CPU0._TPC correctly returned an > method integer. > -method PASSED: Test 77, \_PR_.CPU1._TPC correctly returned an > +method PASSED: Test 78, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 78 of 150: Test _TSD (Throttling State Dependencies). > -method PASSED: Test 78, \_PR_.CPU0._TSD correctly returned a sane > +method Test 79 of 155: Test _TSD (Throttling State Dependencies). > +method PASSED: Test 79, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > -method PASSED: Test 78, \_PR_.CPU1._TSD correctly returned a sane > +method PASSED: Test 79, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 79 of 150: Test _TSS (Throttling Supported States). > +method Test 80 of 155: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -542,7 +547,7 @@ method 4 50% 500 0 0c 00 > method 5 38% 375 0 0b 00 > method 6 25% 250 0 0a 00 > method 7 13% 125 0 09 00 > -method PASSED: Test 79, \_PR_.CPU0._TSS correctly returned a sane > +method PASSED: Test 80, \_PR_.CPU0._TSS correctly returned a sane > method looking package. > method \_PR_.CPU1._TSS values: > method T-State CPU Power Latency Control Status > @@ -555,494 +560,503 @@ method 4 50% 500 0 0c 00 > method 5 38% 375 0 0b 00 > method 6 25% 250 0 0a 00 > method 7 13% 125 0 09 00 > -method PASSED: Test 79, \_PR_.CPU1._TSS correctly returned a sane > +method PASSED: Test 80, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 80 of 150: Test _MSG (Message). > -method SKIPPED: Test 80, Skipping test for non-existant object > +method Test 81 of 155: Test _MSG (Message). > +method SKIPPED: Test 81, Skipping test for non-existant object > method _MSG. > method > -method Test 81 of 150: Test _ALC (Ambient Light Colour > +method Test 82 of 155: Test _ALC (Ambient Light Colour > method Chromaticity). > -method SKIPPED: Test 81, Skipping test for non-existant object > +method SKIPPED: Test 82, Skipping test for non-existant object > method _ALC. > method > -method Test 82 of 150: Test _ALI (Ambient Light Illuminance). > -method SKIPPED: Test 82, Skipping test for non-existant object > +method Test 83 of 155: Test _ALI (Ambient Light Illuminance). > +method SKIPPED: Test 83, Skipping test for non-existant object > method _ALI. > method > -method Test 83 of 150: Test _ALT (Ambient Light Temperature). > -method SKIPPED: Test 83, Skipping test for non-existant object > +method Test 84 of 155: Test _ALT (Ambient Light Temperature). > +method SKIPPED: Test 84, Skipping test for non-existant object > method _ALT. > method > -method Test 84 of 150: Test _ALP (Ambient Light Polling). > -method SKIPPED: Test 84, Skipping test for non-existant object > +method Test 85 of 155: Test _ALP (Ambient Light Polling). > +method SKIPPED: Test 85, Skipping test for non-existant object > method _ALP. > method > -method Test 85 of 150: Test _LID (Lid Status). > -method PASSED: Test 85, \_SB_.LID0._LID correctly returned sane > +method Test 86 of 155: Test _LID (Lid Status). > +method PASSED: Test 86, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 86 of 150: Test _GCP (Get Capabilities). > -method SKIPPED: Test 86, Skipping test for non-existant object > +method Test 87 of 155: Test _UPD (User Presence Detect). > +method SKIPPED: Test 87, Skipping test for non-existant object > +method _UPD. > +method > +method Test 88 of 155: Test _UPP (User Presence Polling). > +method SKIPPED: Test 88, Skipping test for non-existant object > +method _UPP. > +method > +method Test 89 of 155: Test _GCP (Get Capabilities). > +method SKIPPED: Test 89, Skipping test for non-existant object > method _GCP. > method > -method Test 87 of 150: Test _GRT (Get Real Time). > -method SKIPPED: Test 87, Skipping test for non-existant object > +method Test 90 of 155: Test _GRT (Get Real Time). > +method SKIPPED: Test 90, Skipping test for non-existant object > method _GRT. > method > -method Test 88 of 150: Test _GWS (Get Wake Status). > -method SKIPPED: Test 88, Skipping test for non-existant object > +method Test 91 of 155: Test _GWS (Get Wake Status). > +method SKIPPED: Test 91, Skipping test for non-existant object > method _GWS. > method > -method Test 89 of 150: Test _STP (Set Expired Timer Wake Policy). > -method SKIPPED: Test 89, Skipping test for non-existant object > +method Test 92 of 155: Test _STP (Set Expired Timer Wake Policy). > +method SKIPPED: Test 92, Skipping test for non-existant object > method _STP. > method > -method Test 90 of 150: Test _STV (Set Timer Value). > -method SKIPPED: Test 90, Skipping test for non-existant object > +method Test 93 of 155: Test _STV (Set Timer Value). > +method SKIPPED: Test 93, Skipping test for non-existant object > method _STV. > method > -method Test 91 of 150: Test _TIP (Expired Timer Wake Policy). > -method SKIPPED: Test 91, Skipping test for non-existant object > +method Test 94 of 155: Test _TIP (Expired Timer Wake Policy). > +method SKIPPED: Test 94, Skipping test for non-existant object > method _TIP. > method > -method Test 92 of 150: Test _TIV (Timer Values). > -method SKIPPED: Test 92, Skipping test for non-existant object > +method Test 95 of 155: Test _TIV (Timer Values). > +method SKIPPED: Test 95, Skipping test for non-existant object > method _TIV. > method > -method Test 93 of 150: Test _SBS (Smart Battery Subsystem). > -method SKIPPED: Test 93, Skipping test for non-existant object > +method Test 96 of 155: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 96, Skipping test for non-existant object > method _SBS. > method > -method Test 94 of 150: Test _BCT (Battery Charge Time). > -method SKIPPED: Test 94, Skipping test for non-existant object > +method Test 97 of 155: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 97, Skipping test for non-existant object > method _BCT. > method > -method Test 95 of 150: Test _BIF (Battery Information). > -method PASSED: Test 95, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 98 of 155: Test _BIF (Battery Information). > +method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 96 of 150: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 96, Skipping test for non-existant object > +method Test 99 of 155: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 99, Skipping test for non-existant object > method _BIX. > method > -method Test 97 of 150: Test _BMA (Battery Measurement Averaging). > -method SKIPPED: Test 97, Skipping test for non-existant object > +method Test 100 of 155: Test _BMA (Battery Measurement > +method Averaging). > +method SKIPPED: Test 100, Skipping test for non-existant object > method _BMA. > method > -method Test 98 of 150: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 98, Skipping test for non-existant object > +method Test 101 of 155: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 101, Skipping test for non-existant object > method _BMC. > method > -method Test 99 of 150: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 99, Skipping test for non-existant object > +method Test 102 of 155: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 102, Skipping test for non-existant object > method _BMD. > method > -method Test 100 of 150: Test _BMS (Battery Measurement Sampling > +method Test 103 of 155: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 100, Skipping test for non-existant object > +method SKIPPED: Test 103, Skipping test for non-existant object > method _BMS. > method > -method Test 101 of 150: Test _BST (Battery Status). > -method PASSED: Test 101, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 104 of 155: Test _BST (Battery Status). > +method PASSED: Test 104, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 102 of 150: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 102, Skipping test for non-existant object > +method Test 105 of 155: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 105, Skipping test for non-existant object > method _BTP. > method > -method Test 103 of 150: Test _BTM (Battery Time). > -method SKIPPED: Test 103, Skipping test for non-existant object > +method Test 106 of 155: Test _BTM (Battery Time). > +method SKIPPED: Test 106, Skipping test for non-existant object > method _BTM. > method > -method Test 104 of 150: Test _PCL (Power Consumer List). > +method Test 107 of 155: Test _PCL (Power Consumer List). > method > -method Test 105 of 150: Test _PIF (Power Source Information). > -method SKIPPED: Test 105, Skipping test for non-existant object > +method Test 108 of 155: Test _PIF (Power Source Information). > +method SKIPPED: Test 108, Skipping test for non-existant object > method _PIF. > method > -method Test 106 of 150: Test _PSR (Power Source). > -method PASSED: Test 106, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 109 of 155: Test _PSR (Power Source). > +method PASSED: Test 109, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 107 of 150: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 107, Skipping test for non-existant object > +method Test 110 of 155: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 110, Skipping test for non-existant object > method _GAI. > method > -method Test 108 of 150: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 108, Skipping test for non-existant object > +method Test 111 of 155: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 111, Skipping test for non-existant object > method _PMM. > method > -method Test 109 of 150: Test _FIF (Fan Information). > -method SKIPPED: Test 109, Skipping test for non-existant object > +method Test 112 of 155: Test _FIF (Fan Information). > +method SKIPPED: Test 112, Skipping test for non-existant object > method _FIF. > method > -method Test 110 of 150: Test _FSL (Fan Set Level). > -method SKIPPED: Test 110, Skipping test for non-existant object > +method Test 113 of 155: Test _FSL (Fan Set Level). > +method SKIPPED: Test 113, Skipping test for non-existant object > method _FSL. > method > -method Test 111 of 150: Test _FST (Fan Status). > -method SKIPPED: Test 111, Skipping test for non-existant object > +method Test 114 of 155: Test _FST (Fan Status). > +method SKIPPED: Test 114, Skipping test for non-existant object > method _FST. > method > -method Test 112 of 150: Test _ACx (Active Cooling). > -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > +method Test 115 of 155: Test _ACx (Active Cooling). > +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > method returned a sane looking return type. > method > -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly > +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly > method returned a sane looking return type. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC2. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC3. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC4. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC5. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC6. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC7. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC8. > method > -method SKIPPED: Test 112, Skipping test for non-existant object > +method SKIPPED: Test 115, Skipping test for non-existant object > method AC9. > method > method > -method Test 113 of 150: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 113, Skipping test for non-existant object > +method Test 116 of 155: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 116, Skipping test for non-existant object > method _CRT. > method > -method Test 114 of 150: Test _DTI (Device Temperature > +method Test 117 of 155: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 114, Skipping test for non-existant object > +method SKIPPED: Test 117, Skipping test for non-existant object > method _DTI. > method > -method Test 115 of 150: Test _HOT (Hot Temperature). > -method SKIPPED: Test 115, Skipping test for non-existant object > +method Test 118 of 155: Test _HOT (Hot Temperature). > +method SKIPPED: Test 118, Skipping test for non-existant object > method _HOT. > method > -method Test 116 of 150: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 116, Skipping test for non-existant object > +method Test 119 of 155: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 119, Skipping test for non-existant object > method _NTT. > method > -method Test 117 of 150: Test _PSV (Passive Temp). > -method SKIPPED: Test 117, Skipping test for non-existant object > +method Test 120 of 155: Test _PSV (Passive Temp). > +method SKIPPED: Test 120, Skipping test for non-existant object > method _PSV. > method > -method Test 118 of 150: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 118, Skipping test for non-existant object > +method Test 121 of 155: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 121, Skipping test for non-existant object > method _RTV. > method > -method Test 119 of 150: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 119, Skipping test for non-existant object > +method Test 122 of 155: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 122, Skipping test for non-existant object > method _DTI. > method > -method Test 120 of 150: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 120, Skipping test for non-existant object > +method Test 123 of 155: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 123, Skipping test for non-existant object > method _TC1. > method > -method Test 121 of 150: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 121, Skipping test for non-existant object > +method Test 124 of 155: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 124, Skipping test for non-existant object > method _TC2. > method > -method Test 122 of 150: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 122, Skipping test for non-existant object > +method Test 125 of 155: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 125, Skipping test for non-existant object > method _TMP. > method > -method Test 123 of 150: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 123, Skipping test for non-existant object > +method Test 126 of 155: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 126, Skipping test for non-existant object > method _TPT. > method > -method Test 124 of 150: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 124, Skipping test for non-existant object > +method Test 127 of 155: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 127, Skipping test for non-existant object > method _TSP. > method > -method Test 125 of 150: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 125, Skipping test for non-existant object > +method Test 128 of 155: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 128, Skipping test for non-existant object > method _TST. > method > -method Test 126 of 150: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 126, Skipping test for non-existant object > +method Test 129 of 155: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 129, Skipping test for non-existant object > method _TZP. > method > -method Test 127 of 150: Test _PTS (Prepare to Sleep). > +method Test 130 of 155: Test _PTS (Prepare to Sleep). > method Test _PTS(1). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(2). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(3). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 127, \_PTS returned no values as expected. > +method PASSED: Test 130, \_PTS returned no values as expected. > method > method > -method Test 128 of 150: Test _TTS (Transition to State). > -method SKIPPED: Test 128, Optional control method _TTS does not > +method Test 131 of 155: Test _TTS (Transition to State). > +method SKIPPED: Test 131, Optional control method _TTS does not > method exist. > method > -method Test 129 of 150: Test _S0 (System S0 State). > -method SKIPPED: Test 129, Skipping test for non-existant object > +method Test 132 of 155: Test _S0 (System S0 State). > +method SKIPPED: Test 132, Skipping test for non-existant object > method _S0. > method > -method Test 130 of 150: Test _S1 (System S1 State). > -method SKIPPED: Test 130, Skipping test for non-existant object > +method Test 133 of 155: Test _S1 (System S1 State). > +method SKIPPED: Test 133, Skipping test for non-existant object > method _S1. > method > -method Test 131 of 150: Test _S2 (System S2 State). > -method SKIPPED: Test 131, Skipping test for non-existant object > +method Test 134 of 155: Test _S2 (System S2 State). > +method SKIPPED: Test 134, Skipping test for non-existant object > method _S2. > method > -method Test 132 of 150: Test _S3 (System S3 State). > -method SKIPPED: Test 132, Skipping test for non-existant object > +method Test 135 of 155: Test _S3 (System S3 State). > +method SKIPPED: Test 135, Skipping test for non-existant object > method _S3. > method > -method Test 133 of 150: Test _S4 (System S4 State). > -method SKIPPED: Test 133, Skipping test for non-existant object > +method Test 136 of 155: Test _S4 (System S4 State). > +method SKIPPED: Test 136, Skipping test for non-existant object > method _S4. > method > -method Test 134 of 150: Test _S5 (System S5 State). > -method SKIPPED: Test 134, Skipping test for non-existant object > +method Test 137 of 155: Test _S5 (System S5 State). > +method SKIPPED: Test 137, Skipping test for non-existant object > method _S5. > method > -method Test 135 of 150: Test _WAK (System Wake). > +method Test 138 of 155: Test _WAK (System Wake). > method Test _WAK(1) System Wake, State S1. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(2) System Wake, State S2. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 135, \_WAK correctly returned a sane looking > +method PASSED: Test 138, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 136 of 150: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 136, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 139 of 155: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 139, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 136, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 139, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 137 of 150: Test _BCL (Query List of Brightness > +method Test 140 of 155: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 137, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 138 of 150: Test _BCM (Set Brightness Level). > -method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 141 of 155: Test _BCM (Set Brightness Level). > +method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 138, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 141, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 139 of 150: Test _BQC (Brightness Query Current > +method Test 142 of 155: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 140 of 150: Test _DCS (Return the Status of Output > +method Test 143 of 155: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 141 of 150: Test _DDC (Return the EDID for this > +method Test 144 of 155: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 141, Skipping test for non-existant object > +method SKIPPED: Test 144, Skipping test for non-existant object > method _DDC. > method > -method Test 142 of 150: Test _DSS (Device Set State). > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 145 of 155: Test _DSS (Device Set State). > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 143 of 150: Test _DGS (Query Graphics State). > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 146 of 155: Test _DGS (Query Graphics State). > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 144 of 150: Test _DOD (Enumerate All Devices Attached > +method Test 147 of 155: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1065,7 +1079,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 144, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1074,37 +1088,45 @@ method Type of display: 4 (Internal/Integrated Digital Flat P > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 144, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 147, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 145 of 150: Test _DOS (Enable/Disable Output > +method Test 148 of 155: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 145, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 148, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 146 of 150: Test _GPD (Get POST Device). > -method SKIPPED: Test 146, Skipping test for non-existant object > +method Test 149 of 155: Test _GPD (Get POST Device). > +method SKIPPED: Test 149, Skipping test for non-existant object > method _GPD. > method > -method Test 147 of 150: Test _ROM (Get ROM Data). > -method SKIPPED: Test 147, Skipping test for non-existant object > +method Test 150 of 155: Test _ROM (Get ROM Data). > +method SKIPPED: Test 150, Skipping test for non-existant object > method _ROM. > method > -method Test 148 of 150: Test _SPD (Set POST Device). > -method SKIPPED: Test 148, Skipping test for non-existant object > +method Test 151 of 155: Test _SPD (Set POST Device). > +method SKIPPED: Test 151, Skipping test for non-existant object > method _SPD. > method > -method Test 149 of 150: Test _VPO (Video POST Options). > -method SKIPPED: Test 149, Skipping test for non-existant object > +method Test 152 of 155: Test _VPO (Video POST Options). > +method SKIPPED: Test 152, Skipping test for non-existant object > method _VPO. > method > -method Test 150 of 150: Check _CBA (Configuration Base Address). > -method SKIPPED: Test 150, Skipping test for non-existant object > +method Test 153 of 155: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 153, Skipping test for non-existant object > method _CBA. > method > +method Test 154 of 155: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 154, Skipping test for non-existant object > +method _IFT. > +method > +method Test 155 of 155: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 155, Skipping test for non-existant object > +method _SRV. > +method > method ========================================================== > -method 234 passed, 0 failed, 0 warning, 0 aborted, 117 skipped, 0 > +method 237 passed, 0 failed, 0 warning, 0 aborted, 121 skipped, 0 > method info only. > method ========================================================== > Acked-by: Alex Hung <alex.hung@canonical.com>
diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log index 1d4adb2..d8802a8 100644 --- a/method-0001/method-0001.log +++ b/method-0001/method-0001.log @@ -1,536 +1,541 @@ method method: ACPI DSDT Method Semantic tests. method ---------------------------------------------------------- -method Test 1 of 150: Test Method Names. +method Test 1 of 155: Test Method Names. method Found 1061 Objects method PASSED: Test 1, Method names contain legal characters. method -method Test 2 of 150: Test _AEI. +method Test 2 of 155: Test _AEI. method SKIPPED: Test 2, Skipping test for non-existant object method _AEI. method -method Test 3 of 150: Test _CID (Compatible ID). -method PASSED: Test 3, \_SB_.PCI0._CID returned an integer +method Test 3 of 155: Test _PIC (Inform AML of Interrupt Model). +method PASSED: Test 3, \_PIC returned no values as expected. +method PASSED: Test 3, \_PIC returned no values as expected. +method PASSED: Test 3, \_PIC returned no values as expected. +method +method Test 4 of 155: Test _CID (Compatible ID). +method PASSED: Test 4, \_SB_.PCI0._CID returned an integer method 0x030ad041 (EISA ID PNP0A03). -method PASSED: Test 3, \_SB_.PCI0.LPCB.HPET._CID returned an +method PASSED: Test 4, \_SB_.PCI0.LPCB.HPET._CID returned an method integer 0x010cd041 (EISA ID PNP0C01). method -method Test 4 of 150: Test _DDN (DOS Device Name). -method SKIPPED: Test 4, Skipping test for non-existant object +method Test 5 of 155: Test _DDN (DOS Device Name). +method SKIPPED: Test 5, Skipping test for non-existant object method _DDN. method -method Test 5 of 150: Test _HID (Hardware ID). -method PASSED: Test 5, \_SB_.AMW0._HID returned a string +method Test 6 of 155: Test _HID (Hardware ID). +method PASSED: Test 6, \_SB_.AMW0._HID returned a string method 'PNP0C14' as expected. -method PASSED: Test 5, \_SB_.LID0._HID returned an integer +method PASSED: Test 6, \_SB_.LID0._HID returned an integer method 0x0d0cd041 (EISA ID PNP0C0D). -method PASSED: Test 5, \_SB_.PWRB._HID returned an integer +method PASSED: Test 6, \_SB_.PWRB._HID returned an integer method 0x0c0cd041 (EISA ID PNP0C0C). -method PASSED: Test 5, \_SB_.PCI0._HID returned an integer +method PASSED: Test 6, \_SB_.PCI0._HID returned an integer method 0x080ad041 (EISA ID PNP0A08). -method PASSED: Test 5, \_SB_.PCI0.PDRC._HID returned an integer +method PASSED: Test 6, \_SB_.PCI0.PDRC._HID returned an integer method 0x020cd041 (EISA ID PNP0C02). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKA._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKA._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKB._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKB._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKC._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKC._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKD._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKD._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKE._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKE._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKF._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKF._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKG._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKG._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LNKH._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LNKH._HID returned an method integer 0x0f0cd041 (EISA ID PNP0C0F). -method PASSED: Test 5, \_SB_.PCI0.LPCB.DMAC._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.DMAC._HID returned an method integer 0x0002d041 (EISA ID PNP0200). -method PASSED: Test 5, \_SB_.PCI0.LPCB.FWHD._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.FWHD._HID returned an method integer 0x0008d425 (EISA ID INT0800). -method PASSED: Test 5, \_SB_.PCI0.LPCB.HPET._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._HID returned an method integer 0x0301d041 (EISA ID PNP0103). -method PASSED: Test 5, \_SB_.PCI0.LPCB.IPIC._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.IPIC._HID returned an method integer 0x0000d041 (EISA ID PNP0000). -method PASSED: Test 5, \_SB_.PCI0.LPCB.MATH._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.MATH._HID returned an method integer 0x040cd041 (EISA ID PNP0C04). -method PASSED: Test 5, \_SB_.PCI0.LPCB.LDRC._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.LDRC._HID returned an method integer 0x020cd041 (EISA ID PNP0C02). -method PASSED: Test 5, \_SB_.PCI0.LPCB.RTC_._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.RTC_._HID returned an method integer 0x000bd041 (EISA ID PNP0B00). -method PASSED: Test 5, \_SB_.PCI0.LPCB.TIMR._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.TIMR._HID returned an method integer 0x0001d041 (EISA ID PNP0100). -method PASSED: Test 5, \_SB_.PCI0.LPCB.ACAD._HID returned a +method PASSED: Test 6, \_SB_.PCI0.LPCB.ACAD._HID returned a method string 'ACPI0003' as expected. -method PASSED: Test 5, \_SB_.PCI0.LPCB.EC0_._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.EC0_._HID returned an method integer 0x090cd041 (EISA ID PNP0C09). -method PASSED: Test 5, \_SB_.PCI0.LPCB.BAT1._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.BAT1._HID returned an method integer 0x0a0cd041 (EISA ID PNP0C0A). -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2K._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2K._HID returned an method integer 0x0303d041 (EISA ID PNP0303). -method PASSED: Test 5, \_SB_.PCI0.LPCB.PS2M._HID returned an +method PASSED: Test 6, \_SB_.PCI0.LPCB.PS2M._HID returned an method integer 0x130fd041 (EISA ID PNP0F13). method -method Test 6 of 150: Test _HRV (Hardware Revision Number). -method SKIPPED: Test 6, Skipping test for non-existant object +method Test 7 of 155: Test _HRV (Hardware Revision Number). +method SKIPPED: Test 7, Skipping test for non-existant object method _HRV. method -method Test 7 of 150: Test _PLD (Physical Device Location). -method SKIPPED: Test 7, Skipping test for non-existant object +method Test 8 of 155: Test _PLD (Physical Device Location). +method SKIPPED: Test 8, Skipping test for non-existant object method _PLD. method -method Test 8 of 150: Test _SUB (Subsystem ID). -method SKIPPED: Test 8, Skipping test for non-existant object +method Test 9 of 155: Test _SUB (Subsystem ID). +method SKIPPED: Test 9, Skipping test for non-existant object method _SUB. method -method Test 9 of 150: Test _SUN (Slot User Number). -method SKIPPED: Test 9, Skipping test for non-existant object +method Test 10 of 155: Test _SUN (Slot User Number). +method SKIPPED: Test 10, Skipping test for non-existant object method _SUN. method -method Test 10 of 150: Test _STR (String). -method SKIPPED: Test 10, Skipping test for non-existant object +method Test 11 of 155: Test _STR (String). +method SKIPPED: Test 11, Skipping test for non-existant object method _STR. method -method Test 11 of 150: Test _UID (Unique ID). -method PASSED: Test 11, \_SB_.AMW0._UID correctly returned sane +method Test 12 of 155: Test _UID (Unique ID). +method PASSED: Test 12, \_SB_.AMW0._UID correctly returned sane method looking value 0x00000000. -method PASSED: Test 11, \_SB_.PCI0.PDRC._UID correctly returned +method PASSED: Test 12, \_SB_.PCI0.PDRC._UID correctly returned method sane looking value 0x00000001. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKA._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._UID correctly method returned sane looking value 0x00000001. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKB._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._UID correctly method returned sane looking value 0x00000002. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKC._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKC._UID correctly method returned sane looking value 0x00000003. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKD._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKD._UID correctly method returned sane looking value 0x00000004. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKE._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKE._UID correctly method returned sane looking value 0x00000005. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKF._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKF._UID correctly method returned sane looking value 0x00000006. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKG._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKG._UID correctly method returned sane looking value 0x00000007. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LNKH._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._UID correctly method returned sane looking value 0x00000008. -method PASSED: Test 11, \_SB_.PCI0.LPCB.LDRC._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.LDRC._UID correctly method returned sane looking value 0x00000002. -method PASSED: Test 11, \_SB_.PCI0.LPCB.BAT1._UID correctly +method PASSED: Test 12, \_SB_.PCI0.LPCB.BAT1._UID correctly method returned sane looking value 0x00000001. method -method Test 12 of 150: Test _CDM (Clock Domain). -method SKIPPED: Test 12, Skipping test for non-existant object +method Test 13 of 155: Test _CDM (Clock Domain). +method SKIPPED: Test 13, Skipping test for non-existant object method _CDM. method -method Test 13 of 150: Test _CRS (Current Resource Settings). -method PASSED: Test 13, \_SB_.PCI0._CRS (WORD Address Space +method Test 14 of 155: Test _CRS (Current Resource Settings). +method PASSED: Test 14, \_SB_.PCI0._CRS (WORD Address Space method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.PDRC._CRS (32-bit Fixed +method PASSED: Test 14, \_SB_.PCI0.PDRC._CRS (32-bit Fixed method Location Memory Range Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._CRS (IRQ method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.DMAC._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed +method PASSED: Test 14, \_SB_.PCI0.LPCB.FWHD._CRS (32-bit Fixed method Location Memory Range Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed +method PASSED: Test 14, \_SB_.PCI0.LPCB.HPET._CRS (32-bit Fixed method Location Memory Range Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.IPIC._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.MATH._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.LDRC._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.RTC_._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.TIMR._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.EC0_._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2K._CRS (I/O Port method Descriptor) looks sane. -method PASSED: Test 13, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ +method PASSED: Test 14, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ method Descriptor) looks sane. method -method Test 14 of 150: Test _DIS (Disable). -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKA._DIS returned no +method Test 15 of 155: Test _DIS (Disable). +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKA._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKB._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKB._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKC._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKC._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKD._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKD._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKE._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKE._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKF._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKF._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKG._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKG._DIS returned no method values as expected. -method PASSED: Test 14, \_SB_.PCI0.LPCB.LNKH._DIS returned no +method PASSED: Test 15, \_SB_.PCI0.LPCB.LNKH._DIS returned no method values as expected. method -method Test 15 of 150: Test _DMA (Direct Memory Access). -method SKIPPED: Test 15, Skipping test for non-existant object +method Test 16 of 155: Test _DMA (Direct Memory Access). +method SKIPPED: Test 16, Skipping test for non-existant object method _DMA. method -method Test 16 of 150: Test _FIX (Fixed Register Resource +method Test 17 of 155: Test _FIX (Fixed Register Resource method Provider). -method SKIPPED: Test 16, Skipping test for non-existant object +method SKIPPED: Test 17, Skipping test for non-existant object method _FIX. method -method Test 17 of 150: Test _GSB (Global System Interrupt Base). -method SKIPPED: Test 17, Skipping test for non-existant object +method Test 18 of 155: Test _GSB (Global System Interrupt Base). +method SKIPPED: Test 18, Skipping test for non-existant object method _GSB. method -method Test 18 of 150: Test _HPP (Hot Plug Parameters). -method SKIPPED: Test 18, Skipping test for non-existant object +method Test 19 of 155: Test _HPP (Hot Plug Parameters). +method SKIPPED: Test 19, Skipping test for non-existant object method _HPP. method -method Test 19 of 150: Test _PRS (Possible Resource Settings). -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ +method Test 20 of 155: Test _PRS (Possible Resource Settings). +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKC._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKD._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKE._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKF._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKG._PRS (IRQ method Descriptor) looks sane. -method PASSED: Test 19, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ +method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ method Descriptor) looks sane. method -method Test 20 of 150: Test _PXM (Proximity). -method SKIPPED: Test 20, Skipping test for non-existant object +method Test 21 of 155: Test _PXM (Proximity). +method SKIPPED: Test 21, Skipping test for non-existant object method _PXM. method -method Test 21 of 150: Test _EDL (Eject Device List). -method SKIPPED: Test 21, Skipping test for non-existant object +method Test 22 of 155: Test _EDL (Eject Device List). +method SKIPPED: Test 22, Skipping test for non-existant object method _EDL. method -method Test 22 of 150: Test _EJD (Ejection Dependent Device). -method SKIPPED: Test 22, Skipping test for non-existant object +method Test 23 of 155: Test _EJD (Ejection Dependent Device). +method SKIPPED: Test 23, Skipping test for non-existant object method _EJD. method -method Test 23 of 150: Test _EJ0 (Eject). -method SKIPPED: Test 23, Skipping test for non-existant object +method Test 24 of 155: Test _EJ0 (Eject). +method SKIPPED: Test 24, Skipping test for non-existant object method _EJ0. method -method Test 24 of 150: Test _EJ1 (Eject). -method SKIPPED: Test 24, Skipping test for non-existant object +method Test 25 of 155: Test _EJ1 (Eject). +method SKIPPED: Test 25, Skipping test for non-existant object method _EJ1. method -method Test 25 of 150: Test _EJ2 (Eject). -method SKIPPED: Test 25, Skipping test for non-existant object +method Test 26 of 155: Test _EJ2 (Eject). +method SKIPPED: Test 26, Skipping test for non-existant object method _EJ2. method -method Test 26 of 150: Test _EJ3 (Eject). -method SKIPPED: Test 26, Skipping test for non-existant object +method Test 27 of 155: Test _EJ3 (Eject). +method SKIPPED: Test 27, Skipping test for non-existant object method _EJ3. method -method Test 27 of 150: Test _EJ4 (Eject). -method SKIPPED: Test 27, Skipping test for non-existant object +method Test 28 of 155: Test _EJ4 (Eject). +method SKIPPED: Test 28, Skipping test for non-existant object method _EJ4. method -method Test 28 of 150: Test _LCK (Lock). -method SKIPPED: Test 28, Skipping test for non-existant object +method Test 29 of 155: Test _LCK (Lock). +method SKIPPED: Test 29, Skipping test for non-existant object method _LCK. method -method Test 29 of 150: Test _RMV (Remove). -method PASSED: Test 29, \_SB_.PCI0.RP03.PXSX._RMV correctly +method Test 30 of 155: Test _RMV (Remove). +method PASSED: Test 30, \_SB_.PCI0.RP03.PXSX._RMV correctly method returned sane looking value 0x00000001. method -method Test 30 of 150: Test _STA (Status). -method PASSED: Test 30, \_SB_.PCI0.PEGP.VGA_._STA correctly +method Test 31 of 155: Test _STA (Status). +method PASSED: Test 31, \_SB_.PCI0.PEGP.VGA_._STA correctly method returned sane looking value 0x0000000f. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKA._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKA._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKB._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKB._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKC._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKC._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKD._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKD._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKE._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKE._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKF._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKF._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKG._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKG._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.LNKH._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.LNKH._STA correctly method returned sane looking value 0x0000000b. -method PASSED: Test 30, \_SB_.PCI0.LPCB.HPET._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.HPET._STA correctly method returned sane looking value 0x00000000. -method PASSED: Test 30, \_SB_.PCI0.LPCB.BAT1._STA correctly +method PASSED: Test 31, \_SB_.PCI0.LPCB.BAT1._STA correctly method returned sane looking value 0x0000001f. method -method Test 31 of 150: Test _BDN (BIOS Dock Name). -method SKIPPED: Test 31, Skipping test for non-existant object +method Test 32 of 155: Test _BDN (BIOS Dock Name). +method SKIPPED: Test 32, Skipping test for non-existant object method _BDN. method -method Test 32 of 150: Test _BBN (Base Bus Number). -method SKIPPED: Test 32, Skipping test for non-existant object +method Test 33 of 155: Test _BBN (Base Bus Number). +method SKIPPED: Test 33, Skipping test for non-existant object method _BBN. method -method Test 33 of 150: Test _DCK (Dock). -method SKIPPED: Test 33, Skipping test for non-existant object +method Test 34 of 155: Test _DCK (Dock). +method SKIPPED: Test 34, Skipping test for non-existant object method _DCK. method -method Test 34 of 150: Test _INI (Initialize). -method PASSED: Test 34, \_SB_._INI returned no values as +method Test 35 of 155: Test _INI (Initialize). +method PASSED: Test 35, \_SB_._INI returned no values as method expected. method -method Test 35 of 150: Test _SEG (Segment). -method SKIPPED: Test 35, Skipping test for non-existant object +method Test 36 of 155: Test _SEG (Segment). +method SKIPPED: Test 36, Skipping test for non-existant object method _SEG. method -method Test 36 of 150: Test _OFF (Set resource off). -method SKIPPED: Test 36, Skipping test for non-existant object +method Test 37 of 155: Test _OFF (Set resource off). +method SKIPPED: Test 37, Skipping test for non-existant object method _OFF. method -method Test 37 of 150: Test _ON (Set resource on). -method SKIPPED: Test 37, Skipping test for non-existant object +method Test 38 of 155: Test _ON (Set resource on). +method SKIPPED: Test 38, Skipping test for non-existant object method _ON. method -method Test 38 of 150: Test _DSW (Device Sleep Wake). -method SKIPPED: Test 38, Skipping test for non-existant object +method Test 39 of 155: Test _DSW (Device Sleep Wake). +method SKIPPED: Test 39, Skipping test for non-existant object method _DSW. method -method Test 39 of 150: Test _IRC (In Rush Current). -method SKIPPED: Test 39, Skipping test for non-existant object +method Test 40 of 155: Test _IRC (In Rush Current). +method SKIPPED: Test 40, Skipping test for non-existant object method _IRC. method -method Test 40 of 150: Test _PRE (Power Resources for +method Test 41 of 155: Test _PRE (Power Resources for method Enumeration). -method SKIPPED: Test 40, Skipping test for non-existant object +method SKIPPED: Test 41, Skipping test for non-existant object method _PRE. method -method Test 41 of 150: Test _PR0 (Power Resources for D0). -method SKIPPED: Test 41, Skipping test for non-existant object +method Test 42 of 155: Test _PR0 (Power Resources for D0). +method SKIPPED: Test 42, Skipping test for non-existant object method _PR0. method -method Test 42 of 150: Test _PR1 (Power Resources for D1). -method SKIPPED: Test 42, Skipping test for non-existant object +method Test 43 of 155: Test _PR1 (Power Resources for D1). +method SKIPPED: Test 43, Skipping test for non-existant object method _PR1. method -method Test 43 of 150: Test _PR2 (Power Resources for D2). -method SKIPPED: Test 43, Skipping test for non-existant object +method Test 44 of 155: Test _PR2 (Power Resources for D2). +method SKIPPED: Test 44, Skipping test for non-existant object method _PR2. method -method Test 44 of 150: Test _PR3 (Power Resources for D3). -method SKIPPED: Test 44, Skipping test for non-existant object +method Test 45 of 155: Test _PR3 (Power Resources for D3). +method SKIPPED: Test 45, Skipping test for non-existant object method _PR3. method -method Test 45 of 150: Test _PS0 (Power State 0). -method PASSED: Test 45, \_SB_.PCI0.PEGP.VGA_._PS0 returned no +method Test 46 of 155: Test _PS0 (Power State 0). +method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS0 returned no method values as expected. -method PASSED: Test 45, \_PS0 returned no values as expected. +method PASSED: Test 46, \_PS0 returned no values as expected. method -method Test 46 of 150: Test _PS1 (Power State 1). -method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS1 returned no +method Test 47 of 155: Test _PS1 (Power State 1). +method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PS1 returned no method values as expected. method -method Test 47 of 150: Test _PS2 (Power State 2). -method SKIPPED: Test 47, Skipping test for non-existant object +method Test 48 of 155: Test _PS2 (Power State 2). +method SKIPPED: Test 48, Skipping test for non-existant object method _PS2. method -method Test 48 of 150: Test _PS3 (Power State 3). -method PASSED: Test 48, \_SB_.PCI0.PEGP.VGA_._PS3 returned no +method Test 49 of 155: Test _PS3 (Power State 3). +method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PS3 returned no method values as expected. -method PASSED: Test 48, \_PS3 returned no values as expected. +method PASSED: Test 49, \_PS3 returned no values as expected. method -method Test 49 of 150: Test _PSC (Power State Current). -method PASSED: Test 49, \_SB_.PCI0.PEGP.VGA_._PSC correctly +method Test 50 of 155: Test _PSC (Power State Current). +method PASSED: Test 50, \_SB_.PCI0.PEGP.VGA_._PSC correctly method returned an integer. -method PASSED: Test 49, \_PSC correctly returned an integer. +method PASSED: Test 50, \_PSC correctly returned an integer. method -method Test 50 of 150: Test _PSE (Power State for Enumeration). -method SKIPPED: Test 50, Skipping test for non-existant object +method Test 51 of 155: Test _PSE (Power State for Enumeration). +method SKIPPED: Test 51, Skipping test for non-existant object method _PSE. method -method Test 51 of 150: Test _PSW (Power State Wake). -method PASSED: Test 51, \_SB_.PCI0.USB1._PSW returned no values +method Test 52 of 155: Test _PSW (Power State Wake). +method PASSED: Test 52, \_SB_.PCI0.USB1._PSW returned no values method as expected. -method PASSED: Test 51, \_SB_.PCI0.USB2._PSW returned no values +method PASSED: Test 52, \_SB_.PCI0.USB2._PSW returned no values method as expected. -method PASSED: Test 51, \_SB_.PCI0.USB3._PSW returned no values +method PASSED: Test 52, \_SB_.PCI0.USB3._PSW returned no values method as expected. -method PASSED: Test 51, \_SB_.PCI0.USB4._PSW returned no values +method PASSED: Test 52, \_SB_.PCI0.USB4._PSW returned no values method as expected. -method PASSED: Test 51, \_SB_.PCI0.USB5._PSW returned no values +method PASSED: Test 52, \_SB_.PCI0.USB5._PSW returned no values method as expected. method -method Test 52 of 150: Test _S1D (S1 Device State). -method SKIPPED: Test 52, Skipping test for non-existant object +method Test 53 of 155: Test _S1D (S1 Device State). +method SKIPPED: Test 53, Skipping test for non-existant object method _S1D. method -method Test 53 of 150: Test _S2D (S2 Device State). -method SKIPPED: Test 53, Skipping test for non-existant object +method Test 54 of 155: Test _S2D (S2 Device State). +method SKIPPED: Test 54, Skipping test for non-existant object method _S2D. method -method Test 54 of 150: Test _S3D (S3 Device State). -method PASSED: Test 54, \_SB_.PCI0._S3D correctly returned an +method Test 55 of 155: Test _S3D (S3 Device State). +method PASSED: Test 55, \_SB_.PCI0._S3D correctly returned an method integer. -method PASSED: Test 54, \_SB_.PCI0.USB1._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.USB1._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.USB2._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.USB2._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.USB3._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.USB3._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.USB4._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.USB4._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.USB5._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.USB5._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.EHC1._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.EHC1._S3D correctly returned method an integer. -method PASSED: Test 54, \_SB_.PCI0.EHC2._S3D correctly returned +method PASSED: Test 55, \_SB_.PCI0.EHC2._S3D correctly returned method an integer. method -method Test 55 of 150: Test _S4D (S4 Device State). -method PASSED: Test 55, \_SB_.PCI0._S4D correctly returned an +method Test 56 of 155: Test _S4D (S4 Device State). +method PASSED: Test 56, \_SB_.PCI0._S4D correctly returned an method integer. -method PASSED: Test 55, \_SB_.PCI0.USB1._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.USB1._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.USB2._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.USB2._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.USB3._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.USB3._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.USB4._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.USB4._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.USB5._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.USB5._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.EHC1._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.EHC1._S4D correctly returned method an integer. -method PASSED: Test 55, \_SB_.PCI0.EHC2._S4D correctly returned +method PASSED: Test 56, \_SB_.PCI0.EHC2._S4D correctly returned method an integer. method -method Test 56 of 150: Test _S0W (S0 Device Wake State). -method SKIPPED: Test 56, Skipping test for non-existant object +method Test 57 of 155: Test _S0W (S0 Device Wake State). +method SKIPPED: Test 57, Skipping test for non-existant object method _S0W. method -method Test 57 of 150: Test _S1W (S1 Device Wake State). -method SKIPPED: Test 57, Skipping test for non-existant object +method Test 58 of 155: Test _S1W (S1 Device Wake State). +method SKIPPED: Test 58, Skipping test for non-existant object method _S1W. method -method Test 58 of 150: Test _S2W (S2 Device Wake State). -method SKIPPED: Test 58, Skipping test for non-existant object +method Test 59 of 155: Test _S2W (S2 Device Wake State). +method SKIPPED: Test 59, Skipping test for non-existant object method _S2W. method -method Test 59 of 150: Test _S3W (S3 Device Wake State). -method SKIPPED: Test 59, Skipping test for non-existant object +method Test 60 of 155: Test _S3W (S3 Device Wake State). +method SKIPPED: Test 60, Skipping test for non-existant object method _S3W. method -method Test 60 of 150: Test _S4W (S4 Device Wake State). -method SKIPPED: Test 60, Skipping test for non-existant object +method Test 61 of 155: Test _S4W (S4 Device Wake State). +method SKIPPED: Test 61, Skipping test for non-existant object method _S4W. method -method Test 61 of 150: Test _S0_ (S0 System State). +method Test 62 of 155: Test _S0_ (S0 System State). method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 -method PASSED: Test 61, \_S0_ correctly returned a sane looking +method PASSED: Test 62, \_S0_ correctly returned a sane looking method package. method -method Test 62 of 150: Test _S1_ (S1 System State). -method SKIPPED: Test 62, Skipping test for non-existant object +method Test 63 of 155: Test _S1_ (S1 System State). +method SKIPPED: Test 63, Skipping test for non-existant object method _S1_. method -method Test 63 of 150: Test _S2_ (S2 System State). -method SKIPPED: Test 63, Skipping test for non-existant object +method Test 64 of 155: Test _S2_ (S2 System State). +method SKIPPED: Test 64, Skipping test for non-existant object method _S2_. method -method Test 64 of 150: Test _S3_ (S3 System State). +method Test 65 of 155: Test _S3_ (S3 System State). method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 -method PASSED: Test 64, \_S3_ correctly returned a sane looking +method PASSED: Test 65, \_S3_ correctly returned a sane looking method package. method -method Test 65 of 150: Test _S4_ (S4 System State). +method Test 66 of 155: Test _S4_ (S4 System State). method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 -method PASSED: Test 65, \_S4_ correctly returned a sane looking +method PASSED: Test 66, \_S4_ correctly returned a sane looking method package. method -method Test 66 of 150: Test _S5_ (S5 System State). +method Test 67 of 155: Test _S5_ (S5 System State). method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 -method PASSED: Test 66, \_S5_ correctly returned a sane looking +method PASSED: Test 67, \_S5_ correctly returned a sane looking method package. method -method Test 67 of 150: Test _SWS (System Wake Source). -method SKIPPED: Test 67, Skipping test for non-existant object +method Test 68 of 155: Test _SWS (System Wake Source). +method SKIPPED: Test 68, Skipping test for non-existant object method _SWS. method -method Test 68 of 150: Test _PSS (Performance Supported States). -method SKIPPED: Test 68, Skipping test for non-existant object +method Test 69 of 155: Test _PSS (Performance Supported States). +method SKIPPED: Test 69, Skipping test for non-existant object method _PSS. method -method Test 69 of 150: Test _CPC (Continuous Performance +method Test 70 of 155: Test _CPC (Continuous Performance method Control). -method SKIPPED: Test 69, Skipping test for non-existant object +method SKIPPED: Test 70, Skipping test for non-existant object method _CPC. method -method Test 70 of 150: Test _CSD (C State Dependencies). -method SKIPPED: Test 70, Skipping test for non-existant object +method Test 71 of 155: Test _CSD (C State Dependencies). +method SKIPPED: Test 71, Skipping test for non-existant object method _CSD. method -method Test 71 of 150: Test _CST (C States). -method SKIPPED: Test 71, Skipping test for non-existant object +method Test 72 of 155: Test _CST (C States). +method SKIPPED: Test 72, Skipping test for non-existant object method _CST. method -method Test 72 of 150: Test _PCT (Performance Control). -method SKIPPED: Test 72, Skipping test for non-existant object +method Test 73 of 155: Test _PCT (Performance Control). +method SKIPPED: Test 73, Skipping test for non-existant object method _PCT. method -method Test 73 of 150: Test _PDL (P-State Depth Limit). -method SKIPPED: Test 73, Skipping test for non-existant object +method Test 74 of 155: Test _PDL (P-State Depth Limit). +method SKIPPED: Test 74, Skipping test for non-existant object method _PDL. method -method Test 74 of 150: Test _PPC (Performance Present +method Test 75 of 155: Test _PPC (Performance Present method Capabilities). -method SKIPPED: Test 74, Skipping test for non-existant object +method SKIPPED: Test 75, Skipping test for non-existant object method _PPC. method -method Test 75 of 150: Test _PPE (Polling for Platform Error). -method SKIPPED: Test 75, Skipping test for non-existant object +method Test 76 of 155: Test _PPE (Polling for Platform Error). +method SKIPPED: Test 76, Skipping test for non-existant object method _PPE. method -method Test 76 of 150: Test _TDL (T-State Depth Limit). -method SKIPPED: Test 76, Skipping test for non-existant object +method Test 77 of 155: Test _TDL (T-State Depth Limit). +method SKIPPED: Test 77, Skipping test for non-existant object method _TDL. method -method Test 77 of 150: Test _TPC (Throttling Present +method Test 78 of 155: Test _TPC (Throttling Present method Capabilities). -method PASSED: Test 77, \_PR_.CPU0._TPC correctly returned an +method PASSED: Test 78, \_PR_.CPU0._TPC correctly returned an method integer. -method PASSED: Test 77, \_PR_.CPU1._TPC correctly returned an +method PASSED: Test 78, \_PR_.CPU1._TPC correctly returned an method integer. method -method Test 78 of 150: Test _TSD (Throttling State Dependencies). -method PASSED: Test 78, \_PR_.CPU0._TSD correctly returned a sane +method Test 79 of 155: Test _TSD (Throttling State Dependencies). +method PASSED: Test 79, \_PR_.CPU0._TSD correctly returned a sane method looking package. -method PASSED: Test 78, \_PR_.CPU1._TSD correctly returned a sane +method PASSED: Test 79, \_PR_.CPU1._TSD correctly returned a sane method looking package. method -method Test 79 of 150: Test _TSS (Throttling Supported States). +method Test 80 of 155: Test _TSS (Throttling Supported States). method \_PR_.CPU0._TSS values: method T-State CPU Power Latency Control Status method Freq (mW) (usecs) @@ -542,7 +547,7 @@ method 4 50% 500 0 0c 00 method 5 38% 375 0 0b 00 method 6 25% 250 0 0a 00 method 7 13% 125 0 09 00 -method PASSED: Test 79, \_PR_.CPU0._TSS correctly returned a sane +method PASSED: Test 80, \_PR_.CPU0._TSS correctly returned a sane method looking package. method \_PR_.CPU1._TSS values: method T-State CPU Power Latency Control Status @@ -555,494 +560,503 @@ method 4 50% 500 0 0c 00 method 5 38% 375 0 0b 00 method 6 25% 250 0 0a 00 method 7 13% 125 0 09 00 -method PASSED: Test 79, \_PR_.CPU1._TSS correctly returned a sane +method PASSED: Test 80, \_PR_.CPU1._TSS correctly returned a sane method looking package. method -method Test 80 of 150: Test _MSG (Message). -method SKIPPED: Test 80, Skipping test for non-existant object +method Test 81 of 155: Test _MSG (Message). +method SKIPPED: Test 81, Skipping test for non-existant object method _MSG. method -method Test 81 of 150: Test _ALC (Ambient Light Colour +method Test 82 of 155: Test _ALC (Ambient Light Colour method Chromaticity). -method SKIPPED: Test 81, Skipping test for non-existant object +method SKIPPED: Test 82, Skipping test for non-existant object method _ALC. method -method Test 82 of 150: Test _ALI (Ambient Light Illuminance). -method SKIPPED: Test 82, Skipping test for non-existant object +method Test 83 of 155: Test _ALI (Ambient Light Illuminance). +method SKIPPED: Test 83, Skipping test for non-existant object method _ALI. method -method Test 83 of 150: Test _ALT (Ambient Light Temperature). -method SKIPPED: Test 83, Skipping test for non-existant object +method Test 84 of 155: Test _ALT (Ambient Light Temperature). +method SKIPPED: Test 84, Skipping test for non-existant object method _ALT. method -method Test 84 of 150: Test _ALP (Ambient Light Polling). -method SKIPPED: Test 84, Skipping test for non-existant object +method Test 85 of 155: Test _ALP (Ambient Light Polling). +method SKIPPED: Test 85, Skipping test for non-existant object method _ALP. method -method Test 85 of 150: Test _LID (Lid Status). -method PASSED: Test 85, \_SB_.LID0._LID correctly returned sane +method Test 86 of 155: Test _LID (Lid Status). +method PASSED: Test 86, \_SB_.LID0._LID correctly returned sane method looking value 0x00000000. method -method Test 86 of 150: Test _GCP (Get Capabilities). -method SKIPPED: Test 86, Skipping test for non-existant object +method Test 87 of 155: Test _UPD (User Presence Detect). +method SKIPPED: Test 87, Skipping test for non-existant object +method _UPD. +method +method Test 88 of 155: Test _UPP (User Presence Polling). +method SKIPPED: Test 88, Skipping test for non-existant object +method _UPP. +method +method Test 89 of 155: Test _GCP (Get Capabilities). +method SKIPPED: Test 89, Skipping test for non-existant object method _GCP. method -method Test 87 of 150: Test _GRT (Get Real Time). -method SKIPPED: Test 87, Skipping test for non-existant object +method Test 90 of 155: Test _GRT (Get Real Time). +method SKIPPED: Test 90, Skipping test for non-existant object method _GRT. method -method Test 88 of 150: Test _GWS (Get Wake Status). -method SKIPPED: Test 88, Skipping test for non-existant object +method Test 91 of 155: Test _GWS (Get Wake Status). +method SKIPPED: Test 91, Skipping test for non-existant object method _GWS. method -method Test 89 of 150: Test _STP (Set Expired Timer Wake Policy). -method SKIPPED: Test 89, Skipping test for non-existant object +method Test 92 of 155: Test _STP (Set Expired Timer Wake Policy). +method SKIPPED: Test 92, Skipping test for non-existant object method _STP. method -method Test 90 of 150: Test _STV (Set Timer Value). -method SKIPPED: Test 90, Skipping test for non-existant object +method Test 93 of 155: Test _STV (Set Timer Value). +method SKIPPED: Test 93, Skipping test for non-existant object method _STV. method -method Test 91 of 150: Test _TIP (Expired Timer Wake Policy). -method SKIPPED: Test 91, Skipping test for non-existant object +method Test 94 of 155: Test _TIP (Expired Timer Wake Policy). +method SKIPPED: Test 94, Skipping test for non-existant object method _TIP. method -method Test 92 of 150: Test _TIV (Timer Values). -method SKIPPED: Test 92, Skipping test for non-existant object +method Test 95 of 155: Test _TIV (Timer Values). +method SKIPPED: Test 95, Skipping test for non-existant object method _TIV. method -method Test 93 of 150: Test _SBS (Smart Battery Subsystem). -method SKIPPED: Test 93, Skipping test for non-existant object +method Test 96 of 155: Test _SBS (Smart Battery Subsystem). +method SKIPPED: Test 96, Skipping test for non-existant object method _SBS. method -method Test 94 of 150: Test _BCT (Battery Charge Time). -method SKIPPED: Test 94, Skipping test for non-existant object +method Test 97 of 155: Test _BCT (Battery Charge Time). +method SKIPPED: Test 97, Skipping test for non-existant object method _BCT. method -method Test 95 of 150: Test _BIF (Battery Information). -method PASSED: Test 95, \_SB_.PCI0.LPCB.BAT1._BIF correctly +method Test 98 of 155: Test _BIF (Battery Information). +method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BIF correctly method returned a sane looking package. method -method Test 96 of 150: Test _BIX (Battery Information Extended). -method SKIPPED: Test 96, Skipping test for non-existant object +method Test 99 of 155: Test _BIX (Battery Information Extended). +method SKIPPED: Test 99, Skipping test for non-existant object method _BIX. method -method Test 97 of 150: Test _BMA (Battery Measurement Averaging). -method SKIPPED: Test 97, Skipping test for non-existant object +method Test 100 of 155: Test _BMA (Battery Measurement +method Averaging). +method SKIPPED: Test 100, Skipping test for non-existant object method _BMA. method -method Test 98 of 150: Test _BMC (Battery Maintenance Control). -method SKIPPED: Test 98, Skipping test for non-existant object +method Test 101 of 155: Test _BMC (Battery Maintenance Control). +method SKIPPED: Test 101, Skipping test for non-existant object method _BMC. method -method Test 99 of 150: Test _BMD (Battery Maintenance Data). -method SKIPPED: Test 99, Skipping test for non-existant object +method Test 102 of 155: Test _BMD (Battery Maintenance Data). +method SKIPPED: Test 102, Skipping test for non-existant object method _BMD. method -method Test 100 of 150: Test _BMS (Battery Measurement Sampling +method Test 103 of 155: Test _BMS (Battery Measurement Sampling method Time). -method SKIPPED: Test 100, Skipping test for non-existant object +method SKIPPED: Test 103, Skipping test for non-existant object method _BMS. method -method Test 101 of 150: Test _BST (Battery Status). -method PASSED: Test 101, \_SB_.PCI0.LPCB.BAT1._BST correctly +method Test 104 of 155: Test _BST (Battery Status). +method PASSED: Test 104, \_SB_.PCI0.LPCB.BAT1._BST correctly method returned a sane looking package. method -method Test 102 of 150: Test _BTP (Battery Trip Point). -method SKIPPED: Test 102, Skipping test for non-existant object +method Test 105 of 155: Test _BTP (Battery Trip Point). +method SKIPPED: Test 105, Skipping test for non-existant object method _BTP. method -method Test 103 of 150: Test _BTM (Battery Time). -method SKIPPED: Test 103, Skipping test for non-existant object +method Test 106 of 155: Test _BTM (Battery Time). +method SKIPPED: Test 106, Skipping test for non-existant object method _BTM. method -method Test 104 of 150: Test _PCL (Power Consumer List). +method Test 107 of 155: Test _PCL (Power Consumer List). method -method Test 105 of 150: Test _PIF (Power Source Information). -method SKIPPED: Test 105, Skipping test for non-existant object +method Test 108 of 155: Test _PIF (Power Source Information). +method SKIPPED: Test 108, Skipping test for non-existant object method _PIF. method -method Test 106 of 150: Test _PSR (Power Source). -method PASSED: Test 106, \_SB_.PCI0.LPCB.ACAD._PSR correctly +method Test 109 of 155: Test _PSR (Power Source). +method PASSED: Test 109, \_SB_.PCI0.LPCB.ACAD._PSR correctly method returned sane looking value 0x00000000. method -method Test 107 of 150: Test _GAI (Get Averaging Level). -method SKIPPED: Test 107, Skipping test for non-existant object +method Test 110 of 155: Test _GAI (Get Averaging Level). +method SKIPPED: Test 110, Skipping test for non-existant object method _GAI. method -method Test 108 of 150: Test _PMM (Power Meter Measurement). -method SKIPPED: Test 108, Skipping test for non-existant object +method Test 111 of 155: Test _PMM (Power Meter Measurement). +method SKIPPED: Test 111, Skipping test for non-existant object method _PMM. method -method Test 109 of 150: Test _FIF (Fan Information). -method SKIPPED: Test 109, Skipping test for non-existant object +method Test 112 of 155: Test _FIF (Fan Information). +method SKIPPED: Test 112, Skipping test for non-existant object method _FIF. method -method Test 110 of 150: Test _FSL (Fan Set Level). -method SKIPPED: Test 110, Skipping test for non-existant object +method Test 113 of 155: Test _FSL (Fan Set Level). +method SKIPPED: Test 113, Skipping test for non-existant object method _FSL. method -method Test 111 of 150: Test _FST (Fan Status). -method SKIPPED: Test 111, Skipping test for non-existant object +method Test 114 of 155: Test _FST (Fan Status). +method SKIPPED: Test 114, Skipping test for non-existant object method _FST. method -method Test 112 of 150: Test _ACx (Active Cooling). -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly +method Test 115 of 155: Test _ACx (Active Cooling). +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly method returned a sane looking return type. method -method PASSED: Test 112, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly +method PASSED: Test 115, \_SB_.PCI0.LPCB.EC0_.BAC1 correctly method returned a sane looking return type. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC2. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC3. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC4. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC5. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC6. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC7. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC8. method -method SKIPPED: Test 112, Skipping test for non-existant object +method SKIPPED: Test 115, Skipping test for non-existant object method AC9. method method -method Test 113 of 150: Test _CRT (Critical Trip Point). -method SKIPPED: Test 113, Skipping test for non-existant object +method Test 116 of 155: Test _CRT (Critical Trip Point). +method SKIPPED: Test 116, Skipping test for non-existant object method _CRT. method -method Test 114 of 150: Test _DTI (Device Temperature +method Test 117 of 155: Test _DTI (Device Temperature method Indication). -method SKIPPED: Test 114, Skipping test for non-existant object +method SKIPPED: Test 117, Skipping test for non-existant object method _DTI. method -method Test 115 of 150: Test _HOT (Hot Temperature). -method SKIPPED: Test 115, Skipping test for non-existant object +method Test 118 of 155: Test _HOT (Hot Temperature). +method SKIPPED: Test 118, Skipping test for non-existant object method _HOT. method -method Test 116 of 150: Test _NTT (Notification Temp Threshold). -method SKIPPED: Test 116, Skipping test for non-existant object +method Test 119 of 155: Test _NTT (Notification Temp Threshold). +method SKIPPED: Test 119, Skipping test for non-existant object method _NTT. method -method Test 117 of 150: Test _PSV (Passive Temp). -method SKIPPED: Test 117, Skipping test for non-existant object +method Test 120 of 155: Test _PSV (Passive Temp). +method SKIPPED: Test 120, Skipping test for non-existant object method _PSV. method -method Test 118 of 150: Test _RTV (Relative Temp Values). -method SKIPPED: Test 118, Skipping test for non-existant object +method Test 121 of 155: Test _RTV (Relative Temp Values). +method SKIPPED: Test 121, Skipping test for non-existant object method _RTV. method -method Test 119 of 150: Test _SCP (Set Cooling Policy). -method SKIPPED: Test 119, Skipping test for non-existant object +method Test 122 of 155: Test _SCP (Set Cooling Policy). +method SKIPPED: Test 122, Skipping test for non-existant object method _DTI. method -method Test 120 of 150: Test _TC1 (Thermal Constant 1). -method SKIPPED: Test 120, Skipping test for non-existant object +method Test 123 of 155: Test _TC1 (Thermal Constant 1). +method SKIPPED: Test 123, Skipping test for non-existant object method _TC1. method -method Test 121 of 150: Test _TC2 (Thermal Constant 2). -method SKIPPED: Test 121, Skipping test for non-existant object +method Test 124 of 155: Test _TC2 (Thermal Constant 2). +method SKIPPED: Test 124, Skipping test for non-existant object method _TC2. method -method Test 122 of 150: Test _TMP (Thermal Zone Current Temp). -method SKIPPED: Test 122, Skipping test for non-existant object +method Test 125 of 155: Test _TMP (Thermal Zone Current Temp). +method SKIPPED: Test 125, Skipping test for non-existant object method _TMP. method -method Test 123 of 150: Test _TPT (Trip Point Temperature). -method SKIPPED: Test 123, Skipping test for non-existant object +method Test 126 of 155: Test _TPT (Trip Point Temperature). +method SKIPPED: Test 126, Skipping test for non-existant object method _TPT. method -method Test 124 of 150: Test _TSP (Thermal Sampling Period). -method SKIPPED: Test 124, Skipping test for non-existant object +method Test 127 of 155: Test _TSP (Thermal Sampling Period). +method SKIPPED: Test 127, Skipping test for non-existant object method _TSP. method -method Test 125 of 150: Test _TST (Temperature Sensor Threshold). -method SKIPPED: Test 125, Skipping test for non-existant object +method Test 128 of 155: Test _TST (Temperature Sensor Threshold). +method SKIPPED: Test 128, Skipping test for non-existant object method _TST. method -method Test 126 of 150: Test _TZP (Thermal Zone Polling). -method SKIPPED: Test 126, Skipping test for non-existant object +method Test 129 of 155: Test _TZP (Thermal Zone Polling). +method SKIPPED: Test 129, Skipping test for non-existant object method _TZP. method -method Test 127 of 150: Test _PTS (Prepare to Sleep). +method Test 130 of 155: Test _PTS (Prepare to Sleep). method Test _PTS(1). -method PASSED: Test 127, \_PTS returned no values as expected. +method PASSED: Test 130, \_PTS returned no values as expected. method method Test _PTS(2). -method PASSED: Test 127, \_PTS returned no values as expected. +method PASSED: Test 130, \_PTS returned no values as expected. method method Test _PTS(3). -method PASSED: Test 127, \_PTS returned no values as expected. +method PASSED: Test 130, \_PTS returned no values as expected. method method Test _PTS(4). -method PASSED: Test 127, \_PTS returned no values as expected. +method PASSED: Test 130, \_PTS returned no values as expected. method method Test _PTS(5). -method PASSED: Test 127, \_PTS returned no values as expected. +method PASSED: Test 130, \_PTS returned no values as expected. method method -method Test 128 of 150: Test _TTS (Transition to State). -method SKIPPED: Test 128, Optional control method _TTS does not +method Test 131 of 155: Test _TTS (Transition to State). +method SKIPPED: Test 131, Optional control method _TTS does not method exist. method -method Test 129 of 150: Test _S0 (System S0 State). -method SKIPPED: Test 129, Skipping test for non-existant object +method Test 132 of 155: Test _S0 (System S0 State). +method SKIPPED: Test 132, Skipping test for non-existant object method _S0. method -method Test 130 of 150: Test _S1 (System S1 State). -method SKIPPED: Test 130, Skipping test for non-existant object +method Test 133 of 155: Test _S1 (System S1 State). +method SKIPPED: Test 133, Skipping test for non-existant object method _S1. method -method Test 131 of 150: Test _S2 (System S2 State). -method SKIPPED: Test 131, Skipping test for non-existant object +method Test 134 of 155: Test _S2 (System S2 State). +method SKIPPED: Test 134, Skipping test for non-existant object method _S2. method -method Test 132 of 150: Test _S3 (System S3 State). -method SKIPPED: Test 132, Skipping test for non-existant object +method Test 135 of 155: Test _S3 (System S3 State). +method SKIPPED: Test 135, Skipping test for non-existant object method _S3. method -method Test 133 of 150: Test _S4 (System S4 State). -method SKIPPED: Test 133, Skipping test for non-existant object +method Test 136 of 155: Test _S4 (System S4 State). +method SKIPPED: Test 136, Skipping test for non-existant object method _S4. method -method Test 134 of 150: Test _S5 (System S5 State). -method SKIPPED: Test 134, Skipping test for non-existant object +method Test 137 of 155: Test _S5 (System S5 State). +method SKIPPED: Test 137, Skipping test for non-existant object method _S5. method -method Test 135 of 150: Test _WAK (System Wake). +method Test 138 of 155: Test _WAK (System Wake). method Test _WAK(1) System Wake, State S1. -method PASSED: Test 135, \_WAK correctly returned a sane looking +method PASSED: Test 138, \_WAK correctly returned a sane looking method package. method method Test _WAK(2) System Wake, State S2. -method PASSED: Test 135, \_WAK correctly returned a sane looking +method PASSED: Test 138, \_WAK correctly returned a sane looking method package. method method Test _WAK(3) System Wake, State S3. -method PASSED: Test 135, \_WAK correctly returned a sane looking +method PASSED: Test 138, \_WAK correctly returned a sane looking method package. method method Test _WAK(4) System Wake, State S4. -method PASSED: Test 135, \_WAK correctly returned a sane looking +method PASSED: Test 138, \_WAK correctly returned a sane looking method package. method method Test _WAK(5) System Wake, State S5. -method PASSED: Test 135, \_WAK correctly returned a sane looking +method PASSED: Test 138, \_WAK correctly returned a sane looking method package. method method -method Test 136 of 150: Test _ADR (Return Unique ID for Device). -method PASSED: Test 136, \_SB_.PCI0.MCHC._ADR correctly returned +method Test 139 of 155: Test _ADR (Return Unique ID for Device). +method PASSED: Test 139, \_SB_.PCI0.MCHC._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.PEGP._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.PEGP._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.GFX0._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD01._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD01._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD02._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD02._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD03._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD04._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD04._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.GFX0.DD05._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.GFX0.DD05._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.HDEF._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.HDEF._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP01._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP01._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP01.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP01.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.RP02._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP02._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP02.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP02.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.RP03._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP03._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP03.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP03.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.RP04._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP04._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP04.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP04.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.RP05._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP05._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP05.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP05.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.RP06._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.RP06._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.RP06.PXSX._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.RP06.PXSX._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.USB1._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.USB1._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.USB2._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.USB2._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.USB3._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.USB3._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.USB4._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.USB4._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.USB5._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.USB5._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.EHC1._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.EHC2._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PCIB._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.PCIB._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.LPCB._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.LPCB._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.PATA._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.PATA._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.SATA._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.SATA._ADR correctly returned method an integer. -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT0._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT0._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT1._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT1._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.SATA.PRT2._ADR correctly +method PASSED: Test 139, \_SB_.PCI0.SATA.PRT2._ADR correctly method returned an integer. -method PASSED: Test 136, \_SB_.PCI0.SBUS._ADR correctly returned +method PASSED: Test 139, \_SB_.PCI0.SBUS._ADR correctly returned method an integer. method -method Test 137 of 150: Test _BCL (Query List of Brightness +method Test 140 of 155: Test _BCL (Query List of Brightness method Control Levels Supported). method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned +method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned method a sane package of 10 integers. method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 137, \_SB_.PCI0.GFX0.DD03._BCL returned a +method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._BCL returned a method sane package of 10 integers. method -method Test 138 of 150: Test _BCM (Set Brightness Level). -method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned +method Test 141 of 155: Test _BCM (Set Brightness Level). +method PASSED: Test 141, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned method no values as expected. -method PASSED: Test 138, \_SB_.PCI0.GFX0.DD03._BCM returned no +method PASSED: Test 141, \_SB_.PCI0.GFX0.DD03._BCM returned no method values as expected. method -method Test 139 of 150: Test _BQC (Brightness Query Current +method Test 142 of 155: Test _BQC (Brightness Query Current method Level). -method PASSED: Test 139, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly +method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly method returned an integer. -method PASSED: Test 139, \_SB_.PCI0.GFX0.DD03._BQC correctly +method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._BQC correctly method returned an integer. method -method Test 140 of 150: Test _DCS (Return the Status of Output +method Test 143 of 155: Test _DCS (Return the Status of Output method Device). -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD01._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD02._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD03._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD04._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DCS correctly method returned an integer. -method PASSED: Test 140, \_SB_.PCI0.GFX0.DD05._DCS correctly +method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DCS correctly method returned an integer. method -method Test 141 of 150: Test _DDC (Return the EDID for this +method Test 144 of 155: Test _DDC (Return the EDID for this method Device). -method SKIPPED: Test 141, Skipping test for non-existant object +method SKIPPED: Test 144, Skipping test for non-existant object method _DDC. method -method Test 142 of 150: Test _DSS (Device Set State). -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned +method Test 145 of 155: Test _DSS (Device Set State). +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned method no values as expected. -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned method no values as expected. -method PASSED: Test 142, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned +method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned method no values as expected. -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD01._DSS returned no +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD01._DSS returned no method values as expected. -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD02._DSS returned no +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD02._DSS returned no method values as expected. -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD03._DSS returned no +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD03._DSS returned no method values as expected. -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD04._DSS returned no +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD04._DSS returned no method values as expected. -method PASSED: Test 142, \_SB_.PCI0.GFX0.DD05._DSS returned no +method PASSED: Test 145, \_SB_.PCI0.GFX0.DD05._DSS returned no method values as expected. method -method Test 143 of 150: Test _DGS (Query Graphics State). -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly +method Test 146 of 155: Test _DGS (Query Graphics State). +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD01._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD01._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD02._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD02._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD03._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD03._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD04._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD04._DGS correctly method returned an integer. -method PASSED: Test 143, \_SB_.PCI0.GFX0.DD05._DGS correctly +method PASSED: Test 146, \_SB_.PCI0.GFX0.DD05._DGS correctly method returned an integer. method -method Test 144 of 150: Test _DOD (Enumerate All Devices Attached +method Test 147 of 155: Test _DOD (Enumerate All Devices Attached method to Display Adapter). method Device 0: method Instance: 0 @@ -1065,7 +1079,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni method BIOS can detect device: 0 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 144, \_SB_.PCI0.PEGP.VGA_._DOD correctly +method PASSED: Test 147, \_SB_.PCI0.PEGP.VGA_._DOD correctly method returned a sane looking package. method Device 0: method Instance: 0 @@ -1074,37 +1088,45 @@ method Type of display: 4 (Internal/Integrated Digital Flat P method BIOS can detect device: 0 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 144, \_SB_.PCI0.GFX0._DOD correctly returned +method PASSED: Test 147, \_SB_.PCI0.GFX0._DOD correctly returned method a sane looking package. method -method Test 145 of 150: Test _DOS (Enable/Disable Output +method Test 148 of 155: Test _DOS (Enable/Disable Output method Switching). -method PASSED: Test 145, \_SB_.PCI0.PEGP.VGA_._DOS returned no +method PASSED: Test 148, \_SB_.PCI0.PEGP.VGA_._DOS returned no method values as expected. -method PASSED: Test 145, \_SB_.PCI0.GFX0._DOS returned no values +method PASSED: Test 148, \_SB_.PCI0.GFX0._DOS returned no values method as expected. method -method Test 146 of 150: Test _GPD (Get POST Device). -method SKIPPED: Test 146, Skipping test for non-existant object +method Test 149 of 155: Test _GPD (Get POST Device). +method SKIPPED: Test 149, Skipping test for non-existant object method _GPD. method -method Test 147 of 150: Test _ROM (Get ROM Data). -method SKIPPED: Test 147, Skipping test for non-existant object +method Test 150 of 155: Test _ROM (Get ROM Data). +method SKIPPED: Test 150, Skipping test for non-existant object method _ROM. method -method Test 148 of 150: Test _SPD (Set POST Device). -method SKIPPED: Test 148, Skipping test for non-existant object +method Test 151 of 155: Test _SPD (Set POST Device). +method SKIPPED: Test 151, Skipping test for non-existant object method _SPD. method -method Test 149 of 150: Test _VPO (Video POST Options). -method SKIPPED: Test 149, Skipping test for non-existant object +method Test 152 of 155: Test _VPO (Video POST Options). +method SKIPPED: Test 152, Skipping test for non-existant object method _VPO. method -method Test 150 of 150: Check _CBA (Configuration Base Address). -method SKIPPED: Test 150, Skipping test for non-existant object +method Test 153 of 155: Test _CBA (Configuration Base Address). +method SKIPPED: Test 153, Skipping test for non-existant object method _CBA. method +method Test 154 of 155: Test _IFT (IPMI Interface Type). +method SKIPPED: Test 154, Skipping test for non-existant object +method _IFT. +method +method Test 155 of 155: Test _SRV (IPMI Interface Revision). +method SKIPPED: Test 155, Skipping test for non-existant object +method _SRV. +method method ========================================================== -method 234 passed, 0 failed, 0 warning, 0 aborted, 117 skipped, 0 +method 237 passed, 0 failed, 0 warning, 0 aborted, 121 skipped, 0 method info only. method ==========================================================