| Message ID | 1383220919-17743-1-git-send-email-colin.king@canonical.com |
|---|---|
| State | Accepted |
| Headers | show |
On 10/31/2013 08:01 PM, Colin King wrote: > From: Colin Ian King <colin.king@canonical.com> > > Replacment of "Check" with "Test" in LP: #1246650 means we > need to update the affected tests. > > Signed-off-by: Colin Ian King <colin.king@canonical.com> > --- > acpitables-0001/acpitables-0001.log | 4 +- > acpitables-0002/acpitables-0001.log | 4 +- > acpitables-0002/acpitables-0002.log | 4 +- > acpitables-0003/acpitables-0001.log | 4 +- > acpitables-0004/acpitables-0001.log | 4 +- > acpitables-0005/acpitables-0001.log | 4 +- > acpitables-0006/acpitables-0001.log | 4 +- > acpitables-0007/acpitables-0001.log | 4 +- > acpitables-0008/acpitables-0001.log | 4 +- > apicinstance-0001/apicinstance-0001.log | 5 +- > apicinstance-0001/apicinstance-0002.log | 5 +- > arg-show-tests-0001/arg-show-tests-0001.log | 62 ++-- > .../arg-show-tests-full-0001.log | 394 ++++++++++----------- > checksum-0001/checksum-0001.log | 4 +- > checksum-0001/checksum-0003.log | 4 +- > checksum-0001/checksum-0004.log | 4 +- > method-0001/method-0001.log | 296 ++++++++-------- > wmi-0001/wmi-0001.log | 2 +- > wmi-0001/wmi-0002.log | 2 +- > wmi-0001/wmi-0003.log | 2 +- > 20 files changed, 405 insertions(+), 411 deletions(-) > > diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log > index 2f05d15..57d8813 100644 > --- a/acpitables-0001/acpitables-0001.log > +++ b/acpitables-0001/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables PASSED: Test 1, Table APIC passed. > acpitables Table ECDT not present to check. > acpitables PASSED: Test 1, Table FACP passed. > diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log > index 042c83e..22f07a2 100644 > --- a/acpitables-0002/acpitables-0001.log > +++ b/acpitables-0002/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables PASSED: Test 1, Table APIC passed. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log > index db437af..c16d257 100644 > --- a/acpitables-0002/acpitables-0002.log > +++ b/acpitables-0002/acpitables-0002.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local > acpitables APIC flags field, bits 1..31 are reserved and should be > acpitables zero, but are set as: f. > diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log > index 2a4d63e..715978b 100644 > --- a/acpitables-0003/acpitables-0001.log > +++ b/acpitables-0003/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit > diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log > index 52491c3..f33e083 100644 > --- a/acpitables-0004/acpitables-0001.log > +++ b/acpitables-0004/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log > index cf09a01..2e97b45 100644 > --- a/acpitables-0005/acpitables-0001.log > +++ b/acpitables-0005/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log > index 1c2633c..b931cf3 100644 > --- a/acpitables-0006/acpitables-0001.log > +++ b/acpitables-0006/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log > index 3e02f91..5d17103 100644 > --- a/acpitables-0007/acpitables-0001.log > +++ b/acpitables-0007/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log > index 1a127a6..80ecd20 100644 > --- a/acpitables-0008/acpitables-0001.log > +++ b/acpitables-0008/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log > index a185d24..0fcec6e 100644 > --- a/apicinstance-0001/apicinstance-0001.log > +++ b/apicinstance-0001/apicinstance-0001.log > @@ -1,7 +1,6 @@ > -apicinstance apicinstance: Check for single instance of APIC/MADT > -apicinstance table. > +apicinstance apicinstance: Test for single instance of APIC/MADT table. > apicinstance ---------------------------------------------------------- > -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. > +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. > apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 > apicinstance Found APIC/MADT table APIC @ bf6dff70, length 0x104 > apicinstance (and differs from first APIC/MADT table). > diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log > index 91fd42e..d3f2eb3 100644 > --- a/apicinstance-0001/apicinstance-0002.log > +++ b/apicinstance-0001/apicinstance-0002.log > @@ -1,7 +1,6 @@ > -apicinstance apicinstance: Check for single instance of APIC/MADT > -apicinstance table. > +apicinstance apicinstance: Test for single instance of APIC/MADT table. > apicinstance ---------------------------------------------------------- > -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. > +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. > apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 > apicinstance PASSED: Test 1, Found 1 APIC/MADT table(s), as expected. > apicinstance > diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log > index 06a7619..3068592 100644 > --- a/arg-show-tests-0001/arg-show-tests-0001.log > +++ b/arg-show-tests-0001/arg-show-tests-0001.log > @@ -1,49 +1,49 @@ > Batch tests: > - acpiinfo General ACPI information check. > - acpitables ACPI table settings sanity checks. > - apicedge APIC Edge/Level Check. > - apicinstance Check for single instance of APIC/MADT table. > - aspm PCIe ASPM check. > - bios32 Check BIOS32 Service Directory. > + acpiinfo General ACPI information test. > + acpitables ACPI table settings sanity tests. > + apicedge APIC edge/level test. > + apicinstance Test for single instance of APIC/MADT table. > + aspm PCIe ASPM test. > + bios32 BIOS32 Service Directory test. > bios_info Gather BIOS DMI information. > - checksum Check ACPI table checksum. > + checksum ACPI table checksum test. > cpufreq CPU frequency scaling tests. > - crs Check PCI host bridge configuration using _CRS. > - csm Check for UEFI Compatibility Support Module. > - cstates Check processor C state support. > - dmar Check sane DMA Remapping (VT-d). > - dmicheck Test DMI/SMBIOS tables for errors. > - ebda Validate EBDA region is mapped and reserved in memory map table. > - fadt FADT SCI_EN enabled check. > - fan Simple Fan Tests. > - hda_audio Check HDA Audio Pin Configs. > - hpet_check HPET configuration test. > + crs Test PCI host bridge configuration using _CRS. > + csm UEFI Compatibility Support Module test. > + cstates Processor C state support test. > + dmar DMA Remapping (VT-d) test. > + dmicheck DMI/SMBIOS table tests. > + ebda Test EBDA region is mapped and reserved in memory map table. > + fadt FADT SCI_EN enabled tests. > + fan Simple fan tests. > + hda_audio HDA Audio Pin Configuration test. > + hpet_check HPET configuration tests. > klog Scan kernel log for errors and warnings. > - maxfreq Check max CPU frequencies against max scaling frequency. > - maxreadreq Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. > - mcfg MCFG PCI Express* memory mapped config space. > - method ACPI DSDT Method Semantic Tests. > - microcode Check if system is using latest microcode. > - mpcheck Check MultiProcessor Tables. > + maxfreq Test max CPU frequencies against max scaling frequency. > + maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. > + mcfg MCFG PCI Express* memory mapped config space test. > + method ACPI DSDT Method Semantic tests. > + microcode Test if system is using latest microcode. > + mpcheck MultiProcessor Tables tests. > msr MSR register tests. > - mtrr MTRR validation. > + mtrr MTRR tests. > nx Test if CPU NX is disabled by the BIOS. > oops Scan kernel log for Oopses. > os2gap OS/2 memory hole test. > osilinux Disassemble DSDT to check for _OSI("Linux"). > - pcc Processor Clocking Control (PCC) Test. > - pciirq Check PCI IRQ Routing Table. > - pnp Check BIOS Support Installation structure. > + pcc Processor Clocking Control (PCC) test. > + pciirq PCI IRQ Routing Table test. > + pnp BIOS Support Installation structure test. > securebootcert Ubuntu UEFI secure boot test. > syntaxcheck Re-assemble DSDT and find syntax errors and warnings. > version Gather kernel system information. > - virt Test CPU Virtualisation Configuration. > - wakealarm Test ACPI Wakealarm. > + virt CPU Virtualisation Configuration test. > + wakealarm ACPI Wakealarm tests. > wmi Extract and analyse Windows Management Instrumentation (WMI). > > Interactive tests: > ac_adapter Interactive ac_adapter power test. > - battery Battery Tests. > + battery Battery tests. > brightness Interactive LCD brightness test. > hotkey Hotkey scan code tests. > lid Interactive lid button test. > @@ -71,7 +71,7 @@ Unsafe tests: > uefirtvariable UEFI Runtime service variable interface tests. > > UEFI tests: > - csm Check for UEFI Compatibility Support Module. > + csm UEFI Compatibility Support Module test. > securebootcert Ubuntu UEFI secure boot test. > uefirtmisc UEFI miscellaneous runtime service interface tests. > uefirttime UEFI Runtime service time interface tests. > diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log > index f6d3b89..c9c13c5 100644 > --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log > +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log > @@ -4,240 +4,240 @@ Batch tests: > Determine machine's ACPI version. > Determine AML compiler. > acpitables (1 test): > - Check ACPI tables. > + Test ACPI tables. > apicedge (1 test): > - Legacy and PCI Interrupt Edge/Level trigger checks. > + Legacy and PCI Interrupt Edge/Level trigger tests. > apicinstance (1 test): > - Check single instance of APIC/MADT table. > + Test for single instance of APIC/MADT table. > aspm (2 tests): > PCIe ASPM ACPI test. > PCIe ASPM registers test. > bios32 (1 test): > - Check BIOS32 Service Directory. > + BIOS32 Service Directory test. > bios_info (1 test): > Gather BIOS DMI information > checksum (1 test): > - Check ACPI table checksums. > + ACPI table checksum test. > cpufreq (1 test): > - CPU P-State Checks. > + CPU P-State tests. > crs (1 test): > - Check PCI host bridge configuration using _CRS. > + Test PCI host bridge configuration using _CRS. > csm (1 test): > - Check for UEFI Compatibility Support Module. > + UEFI Compatibility Support Module test. > cstates (1 test): > - Check all CPUs C-states. > + Test all CPUs C-states. > dmar (1 test): > - Check DMA Remapping. > + DMA Remapping test. > dmicheck (2 tests): > - Find and Check SMBIOS Table Entry Point. > + Find and test SMBIOS Table Entry Point. > Test DMI/SMBIOS tables for errors. > ebda (1 test): > - Check EBDA is reserved in E820 table. > + Test EBDA is reserved in E820 table. > fadt (2 tests): > - Check FADT SCI_EN bit is enabled. > - Check FADT reset register. > + Test FADT SCI_EN bit is enabled. > + Test FADT reset register. > fan (2 tests): > - Check fan status. > + Test fan status. > Load system, check CPU fan status. > hda_audio (1 test): > - Check HDA Audio Pin Configs. > + HDA Audio Pin Configuration test. > hpet_check (4 tests): > - Check HPET base in kernel log. > - Check HPET base in HPET table. > - Check HPET base in DSDT and/or SSDT. > - Sanity check HPET configuration. > + Test HPET base in kernel log. > + Test HPET base in HPET table. > + Test HPET base in DSDT and/or SSDT. > + Test HPET configuration. > klog (1 test): > Kernel log error check. > maxfreq (1 test): > - Maximum CPU frequency check. > + Maximum CPU frequency test. > maxreadreq (1 test): > - Check firmware settings MaxReadReq for PCI Express devices. > + Test firmware settings MaxReadReq for PCI Express devices. > mcfg (2 tests): > Validate MCFG table. > Validate MCFG PCI config space. > method (144 tests): > - Check Method Names. > - Check _AEI. > - Check _DDN (DOS Device Name). > - Check _HID (Hardware ID). > - Check _HRV (Hardware Revision Number). > - Check _PLD (Physical Device Location). > - Check _SUB (Subsystem ID). > - Check _SUN (Slot User Number). > - Check _STR (String). > - Check _UID (Unique ID). > - Check _CRS (Current Resource Settings). > - Check _DIS (Disable). > - Check _DMA (Direct Memory Access). > - Check _FIX (Fixed Register Resource Provider). > - Check _GSB (Global System Interrupt Base). > - Check _HPP (Hot Plug Parameters). > - Check _PRS (Possible Resource Settings). > - Check _PXM (Proximity). > - Check _EDL (Eject Device List). > - Check _EJD (Ejection Dependent Device). > - Check _EJ0 (Eject). > - Check _EJ1 (Eject). > - Check _EJ2 (Eject). > - Check _EJ3 (Eject). > - Check _EJ4 (Eject). > - Check _LCK (Lock). > - Check _RMV (Remove). > - Check _STA (Status). > - Check _BDN (BIOS Dock Name). > - Check _BBN (Base Bus Number). > - Check _DCK (Dock). > - Check _INI (Initialize). > - Check _SEG (Segment). > - Check _OFF (Set resource off). > - Check _ON (Set resource on). > - Check _DSW (Device Sleep Wake). > - Check _IRC (In Rush Current). > - Check _PRE (Power Resources for Enumeration). > - Check _PR0 (Power Resources for D0). > - Check _PR1 (Power Resources for D1). > - Check _PR2 (Power Resources for D2). > - Check _PR3 (Power Resources for D3). > - Check _PS0 (Power State 0). > - Check _PS1 (Power State 1). > - Check _PS2 (Power State 2). > - Check _PS3 (Power State 3). > - Check _PSC (Power State Current). > - Check _PSE (Power State for Enumeration). > - Check _PSW (Power State Wake). > - Check _S1D (S1 Device State). > - Check _S2D (S2 Device State). > - Check _S3D (S3 Device State). > - Check _S4D (S4 Device State). > - Check _S0W (S0 Device Wake State). > - Check _S1W (S1 Device Wake State). > - Check _S2W (S2 Device Wake State). > - Check _S3W (S3 Device Wake State). > - Check _S4W (S4 Device Wake State). > - Check _S0_ (S0 System State). > - Check _S1_ (S1 System State). > - Check _S2_ (S2 System State). > - Check _S3_ (S3 System State). > - Check _S4_ (S4 System State). > - Check _S5_ (S5 System State). > - Check _SWS (System Wake Source). > - Check _PSS (Performance Supported States). > - Check _CPC (Continuous Performance Control). > - Check _CSD (C State Dependencies). > - Check _CST (C States). > - Check _PCT (Performance Control). > - Check _PDL (P-State Depth Limit). > - Check _PPC (Performance Present Capabilities). > - Check _PPE (Polling for Platform Error). > - Check _TDL (T-State Depth Limit). > - Check _TPC (Throttling Present Capabilities). > - Check _TSD (Throttling State Dependencies). > - Check _TSS (Throttling Supported States). > - Check _ALC (Ambient Light Colour Chromaticity). > - Check _ALI (Ambient Light Illuminance). > - Check _ALT (Ambient Light Temperature). > - Check _ALP (Ambient Light Polling). > - Check _LID (Lid Status). > - Check _GCP (Get Capabilities). > - Check _GRT (Get Real Time). > - Check _GWS (Get Wake Status). > - Check _STP (Set Expired Timer Wake Policy). > - Check _STV (Set Timer Value). > - Check _TIP (Expired Timer Wake Policy). > - Check _TIV (Timer Values). > - Check _SBS (Smart Battery Subsystem). > - Check _BCT (Battery Charge Time). > - Check _BIF (Battery Information). > - Check _BIX (Battery Information Extended). > - Check _BMA (Battery Measurement Averaging). > - Check _BMC (Battery Maintenance Control). > - Check _BMD (Battery Maintenance Data). > - Check _BMS (Battery Measurement Sampling Time). > - Check _BST (Battery Status). > - Check _BTP (Battery Trip Point). > - Check _BTM (Battery Time). > - Check _PCL (Power Consumer List). > - Check _PIF (Power Source Information). > - Check _PSR (Power Source). > - Check _FIF (Fan Information). > - Check _FSL (Fan Set Level). > - Check _FST (Fan Status). > - Check _ACx (Active Cooling). > - Check _CRT (Critical Trip Point). > - Check _DTI (Device Temperature Indication). > - Check _HOT (Hot Temperature). > - Check _NTT (Notification Temp Threshold). > - Check _PSV (Passive Temp). > - Check _RTV (Relative Temp Values). > - Check _SCP (Set Cooling Policy). > - Check _TC1 (Thermal Constant 1). > - Check _TC2 (Thermal Constant 2). > - Check _TMP (Thermal Zone Current Temp). > - Check _TPT (Trip Point Temperature). > - Check _TSP (Thermal Sampling Period). > - Check _TST (Temperature Sensor Threshold). > - Check _TZP (Thermal Zone Polling). > - Check _PTS (Prepare to Sleep). > - Check _TTS (Transition to State). > - Check _S0 (System S0 State). > - Check _S1 (System S1 State). > - Check _S2 (System S2 State). > - Check _S3 (System S3 State). > - Check _S4 (System S4 State). > - Check _S5 (System S5 State). > - Check _WAK (System Wake). > - Check _ADR (Return Unique ID for Device). > - Check _BCL (Query List of Brightness Control Levels Supported). > - Check _BCM (Set Brightness Level). > - Check _BQC (Brightness Query Current Level). > - Check _DCS (Return the Status of Output Device). > - Check _DDC (Return the EDID for this Device). > - Check _DSS (Device Set State). > - Check _DGS (Query Graphics State). > - Check _DOD (Enumerate All Devices Attached to Display Adapter). > - Check _DOS (Enable/Disable Output Switching). > - Check _GPD (Get POST Device). > - Check _ROM (Get ROM Data). > - Check _SPD (Set POST Device). > - Check _VPO (Video POST Options). > + Test Method Names. > + Test _AEI. > + Test _DDN (DOS Device Name). > + Test _HID (Hardware ID). > + Test _HRV (Hardware Revision Number). > + Test _PLD (Physical Device Location). > + Test _SUB (Subsystem ID). > + Test _SUN (Slot User Number). > + Test _STR (String). > + Test _UID (Unique ID). > + Test _CRS (Current Resource Settings). > + Test _DIS (Disable). > + Test _DMA (Direct Memory Access). > + Test _FIX (Fixed Register Resource Provider). > + Test _GSB (Global System Interrupt Base). > + Test _HPP (Hot Plug Parameters). > + Test _PRS (Possible Resource Settings). > + Test _PXM (Proximity). > + Test _EDL (Eject Device List). > + Test _EJD (Ejection Dependent Device). > + Test _EJ0 (Eject). > + Test _EJ1 (Eject). > + Test _EJ2 (Eject). > + Test _EJ3 (Eject). > + Test _EJ4 (Eject). > + Test _LCK (Lock). > + Test _RMV (Remove). > + Test _STA (Status). > + Test _BDN (BIOS Dock Name). > + Test _BBN (Base Bus Number). > + Test _DCK (Dock). > + Test _INI (Initialize). > + Test _SEG (Segment). > + Test _OFF (Set resource off). > + Test _ON (Set resource on). > + Test _DSW (Device Sleep Wake). > + Test _IRC (In Rush Current). > + Test _PRE (Power Resources for Enumeration). > + Test _PR0 (Power Resources for D0). > + Test _PR1 (Power Resources for D1). > + Test _PR2 (Power Resources for D2). > + Test _PR3 (Power Resources for D3). > + Test _PS0 (Power State 0). > + Test _PS1 (Power State 1). > + Test _PS2 (Power State 2). > + Test _PS3 (Power State 3). > + Test _PSC (Power State Current). > + Test _PSE (Power State for Enumeration). > + Test _PSW (Power State Wake). > + Test _S1D (S1 Device State). > + Test _S2D (S2 Device State). > + Test _S3D (S3 Device State). > + Test _S4D (S4 Device State). > + Test _S0W (S0 Device Wake State). > + Test _S1W (S1 Device Wake State). > + Test _S2W (S2 Device Wake State). > + Test _S3W (S3 Device Wake State). > + Test _S4W (S4 Device Wake State). > + Test _S0_ (S0 System State). > + Test _S1_ (S1 System State). > + Test _S2_ (S2 System State). > + Test _S3_ (S3 System State). > + Test _S4_ (S4 System State). > + Test _S5_ (S5 System State). > + Test _SWS (System Wake Source). > + Test _PSS (Performance Supported States). > + Test _CPC (Continuous Performance Control). > + Test _CSD (C State Dependencies). > + Test _CST (C States). > + Test _PCT (Performance Control). > + Test _PDL (P-State Depth Limit). > + Test _PPC (Performance Present Capabilities). > + Test _PPE (Polling for Platform Error). > + Test _TDL (T-State Depth Limit). > + Test _TPC (Throttling Present Capabilities). > + Test _TSD (Throttling State Dependencies). > + Test _TSS (Throttling Supported States). > + Test _ALC (Ambient Light Colour Chromaticity). > + Test _ALI (Ambient Light Illuminance). > + Test _ALT (Ambient Light Temperature). > + Test _ALP (Ambient Light Polling). > + Test _LID (Lid Status). > + Test _GCP (Get Capabilities). > + Test _GRT (Get Real Time). > + Test _GWS (Get Wake Status). > + Test _STP (Set Expired Timer Wake Policy). > + Test _STV (Set Timer Value). > + Test _TIP (Expired Timer Wake Policy). > + Test _TIV (Timer Values). > + Test _SBS (Smart Battery Subsystem). > + Test _BCT (Battery Charge Time). > + Test _BIF (Battery Information). > + Test _BIX (Battery Information Extended). > + Test _BMA (Battery Measurement Averaging). > + Test _BMC (Battery Maintenance Control). > + Test _BMD (Battery Maintenance Data). > + Test _BMS (Battery Measurement Sampling Time). > + Test _BST (Battery Status). > + Test _BTP (Battery Trip Point). > + Test _BTM (Battery Time). > + Test _PCL (Power Consumer List). > + Test _PIF (Power Source Information). > + Test _PSR (Power Source). > + Test _FIF (Fan Information). > + Test _FSL (Fan Set Level). > + Test _FST (Fan Status). > + Test _ACx (Active Cooling). > + Test _CRT (Critical Trip Point). > + Test _DTI (Device Temperature Indication). > + Test _HOT (Hot Temperature). > + Test _NTT (Notification Temp Threshold). > + Test _PSV (Passive Temp). > + Test _RTV (Relative Temp Values). > + Test _SCP (Set Cooling Policy). > + Test _TC1 (Thermal Constant 1). > + Test _TC2 (Thermal Constant 2). > + Test _TMP (Thermal Zone Current Temp). > + Test _TPT (Trip Point Temperature). > + Test _TSP (Thermal Sampling Period). > + Test _TST (Temperature Sensor Threshold). > + Test _TZP (Thermal Zone Polling). > + Test _PTS (Prepare to Sleep). > + Test _TTS (Transition to State). > + Test _S0 (System S0 State). > + Test _S1 (System S1 State). > + Test _S2 (System S2 State). > + Test _S3 (System S3 State). > + Test _S4 (System S4 State). > + Test _S5 (System S5 State). > + Test _WAK (System Wake). > + Test _ADR (Return Unique ID for Device). > + Test _BCL (Query List of Brightness Control Levels Supported). > + Test _BCM (Set Brightness Level). > + Test _BQC (Brightness Query Current Level). > + Test _DCS (Return the Status of Output Device). > + Test _DDC (Return the EDID for this Device). > + Test _DSS (Device Set State). > + Test _DGS (Query Graphics State). > + Test _DOD (Enumerate All Devices Attached to Display Adapter). > + Test _DOS (Enable/Disable Output Switching). > + Test _GPD (Get POST Device). > + Test _ROM (Get ROM Data). > + Test _SPD (Set POST Device). > + Test _VPO (Video POST Options). > microcode (1 test): > - Check for most recent microcode being loaded. > + Test for most recent microcode being loaded. > mpcheck (9 tests): > - Check MP header. > - Check MP CPU entries. > - Check MP Bus entries. > - Check MP IO APIC entries. > - Check MP IO Interrupt entries. > - Check MP Local Interrupt entries. > - Check MP System Address entries. > - Check MP Bus Hierarchy entries. > - Check MP Compatible Bus Address Space entries. > + Test MP header. > + Test MP CPU entries. > + Test MP Bus entries. > + Test MP IO APIC entries. > + Test MP IO Interrupt entries. > + Test MP Local Interrupt entries. > + Test MP System Address entries. > + Test MP Bus Hierarchy entries. > + Test MP Compatible Bus Address Space entries. > msr (5 tests): > - Check CPU generic MSRs. > - Check CPU specific model MSRs. > - Check all P State Ratios. > - Check C1 and C3 autodemotion. > - Check SMRR MSR registers. > + Test CPU generic MSRs. > + Test CPU specific model MSRs. > + Test all P State Ratios. > + Test C1 and C3 autodemotion. > + Test SMRR MSR registers. > mtrr (3 tests): > Validate the kernel MTRR IOMEM setup. > Validate the MTRR setup across all processors. > - Check for AMD MtrrFixDramModEn being cleared by the BIOS. > + Test for AMD MtrrFixDramModEn being cleared by the BIOS. > nx (3 tests): > - Check CPU NX capability. > - Check all CPUs have same BIOS set NX flag. > - Check all CPUs have same msr setting in MSR 0x1a0. > + Test CPU NX capability. > + Test all CPUs have same BIOS set NX flag. > + Test all CPUs have same msr setting in MSR 0x1a0. > oops (1 test): > Kernel log oops check. > os2gap (1 test): > - Check the OS/2 15Mb memory hole is absent. > + Test the OS/2 15Mb memory hole is absent. > osilinux (1 test): > Disassemble DSDT to check for _OSI("Linux"). > pcc (1 test): > - Check PCCH. > + Processor Clocking Control (PCC) test. > pciirq (1 test): > - PCI IRQ Routing Table. > + PCI IRQ Routing Table test. > pnp (1 test): > - Check PnP BIOS Support Installation structure. > + PnP BIOS Support Installation structure test. > securebootcert (1 test): > Ubuntu UEFI secure boot test. > syntaxcheck (2 tests): > @@ -249,14 +249,14 @@ Batch tests: > Gather kernel boot command line. > Gather ACPI driver version. > virt (1 test): > - Check CPU Virtualisation Configuration. > + CPU Virtualisation Configuration test. > wakealarm (4 tests): > - Check existence of /sys/class/rtc/rtc0/wakealarm. > + Test existence of /sys/class/rtc/rtc0/wakealarm. > Trigger wakealarm for 1 seconds in the future. > - Check if wakealarm is fired. > + Test if wakealarm is fired. > Multiple wakealarm firing tests. > wmi (1 test): > - Check Windows Management Instrumentation > + Windows Management Instrumentation test. > > Interactive tests: > ac_adapter (3 tests): > @@ -264,13 +264,13 @@ Interactive tests: > Test ac_adapter initial on-line state. > Test ac_adapter state changes. > battery (1 test): > - Check batteries. > + Battery test. > brightness (5 tests): > - Check for maximum and actual brightness. > + Test for maximum and actual brightness. > Change actual brightness. > Observe all brightness changes. > Observe min, max brightness changes. > - Check brightness hotkeys. > + Test brightness hotkeys. > hotkey (1 test): > Hotkey keypress checks. > lid (3 tests): > @@ -328,7 +328,7 @@ Unsafe tests: > > UEFI tests: > csm (1 test): > - Check for UEFI Compatibility Support Module. > + UEFI Compatibility Support Module test. > securebootcert (1 test): > Ubuntu UEFI secure boot test. > uefirtmisc (2 tests): > diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log > index 4efca9b..d720e06 100644 > --- a/checksum-0001/checksum-0001.log > +++ b/checksum-0001/checksum-0001.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. > checksum PASSED: Test 1, Table FACP has correct checksum 0x52. > checksum PASSED: Test 1, Table APIC has correct checksum 0xcc. > diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log > index 75925bb..4ab586a 100644 > --- a/checksum-0001/checksum-0003.log > +++ b/checksum-0001/checksum-0003.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got > checksum 0x10. > checksum > diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log > index d092674..f69a42a 100644 > --- a/checksum-0001/checksum-0004.log > +++ b/checksum-0001/checksum-0004.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. > checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got > checksum 0x53. > diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log > index e41aa26..bf2c976 100644 > --- a/method-0001/method-0001.log > +++ b/method-0001/method-0001.log > @@ -1,18 +1,18 @@ > -method method: ACPI DSDT Method Semantic Tests. > +method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 144: Check Method Names. > +method Test 1 of 144: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 144: Check _AEI. > +method Test 2 of 144: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existant object > method _AEI. > method > -method Test 3 of 144: Check _DDN (DOS Device Name). > +method Test 3 of 144: Test _DDN (DOS Device Name). > method SKIPPED: Test 3, Skipping test for non-existant object > method _DDN. > method > -method Test 4 of 144: Check _HID (Hardware ID). > +method Test 4 of 144: Test _HID (Hardware ID). > method PASSED: Test 4, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 4, \_SB_.LID0._HID returned an integer > @@ -66,27 +66,27 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 5 of 144: Check _HRV (Hardware Revision Number). > +method Test 5 of 144: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 5, Skipping test for non-existant object > method _HRV. > method > -method Test 6 of 144: Check _PLD (Physical Device Location). > +method Test 6 of 144: Test _PLD (Physical Device Location). > method SKIPPED: Test 6, Skipping test for non-existant object > method _PLD. > method > -method Test 7 of 144: Check _SUB (Subsystem ID). > +method Test 7 of 144: Test _SUB (Subsystem ID). > method SKIPPED: Test 7, Skipping test for non-existant object > method _SUB. > method > -method Test 8 of 144: Check _SUN (Slot User Number). > +method Test 8 of 144: Test _SUN (Slot User Number). > method SKIPPED: Test 8, Skipping test for non-existant object > method _SUN. > method > -method Test 9 of 144: Check _STR (String). > +method Test 9 of 144: Test _STR (String). > method SKIPPED: Test 9, Skipping test for non-existant object > method _STR. > method > -method Test 10 of 144: Check _UID (Unique ID). > +method Test 10 of 144: Test _UID (Unique ID). > method PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned > @@ -112,7 +112,7 @@ method returned sane looking value 0x00000002. > method PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 11 of 144: Check _CRS (Current Resource Settings). > +method Test 11 of 144: Test _CRS (Current Resource Settings). > method PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -156,7 +156,7 @@ method Descriptor) looks sane. > method PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 12 of 144: Check _DIS (Disable). > +method Test 12 of 144: Test _DIS (Disable). > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -174,24 +174,24 @@ method values as expected. > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 13 of 144: Check _DMA (Direct Memory Access). > +method Test 13 of 144: Test _DMA (Direct Memory Access). > method SKIPPED: Test 13, Skipping test for non-existant object > method _DMA. > method > -method Test 14 of 144: Check _FIX (Fixed Register Resource > +method Test 14 of 144: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 14, Skipping test for non-existant object > method _FIX. > method > -method Test 15 of 144: Check _GSB (Global System Interrupt Base). > +method Test 15 of 144: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 15, Skipping test for non-existant object > method _GSB. > method > -method Test 16 of 144: Check _HPP (Hot Plug Parameters). > +method Test 16 of 144: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 16, Skipping test for non-existant object > method _HPP. > method > -method Test 17 of 144: Check _PRS (Possible Resource Settings). > +method Test 17 of 144: Test _PRS (Possible Resource Settings). > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -209,47 +209,47 @@ method Descriptor) looks sane. > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 18 of 144: Check _PXM (Proximity). > +method Test 18 of 144: Test _PXM (Proximity). > method SKIPPED: Test 18, Skipping test for non-existant object > method _PXM. > method > -method Test 19 of 144: Check _EDL (Eject Device List). > +method Test 19 of 144: Test _EDL (Eject Device List). > method SKIPPED: Test 19, Skipping test for non-existant object > method _EDL. > method > -method Test 20 of 144: Check _EJD (Ejection Dependent Device). > +method Test 20 of 144: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 20, Skipping test for non-existant object > method _EJD. > method > -method Test 21 of 144: Check _EJ0 (Eject). > +method Test 21 of 144: Test _EJ0 (Eject). > method SKIPPED: Test 21, Skipping test for non-existant object > method _EJ0. > method > -method Test 22 of 144: Check _EJ1 (Eject). > +method Test 22 of 144: Test _EJ1 (Eject). > method SKIPPED: Test 22, Skipping test for non-existant object > method _EJ1. > method > -method Test 23 of 144: Check _EJ2 (Eject). > +method Test 23 of 144: Test _EJ2 (Eject). > method SKIPPED: Test 23, Skipping test for non-existant object > method _EJ2. > method > -method Test 24 of 144: Check _EJ3 (Eject). > +method Test 24 of 144: Test _EJ3 (Eject). > method SKIPPED: Test 24, Skipping test for non-existant object > method _EJ3. > method > -method Test 25 of 144: Check _EJ4 (Eject). > +method Test 25 of 144: Test _EJ4 (Eject). > method SKIPPED: Test 25, Skipping test for non-existant object > method _EJ4. > method > -method Test 26 of 144: Check _LCK (Lock). > +method Test 26 of 144: Test _LCK (Lock). > method SKIPPED: Test 26, Skipping test for non-existant object > method _LCK. > method > -method Test 27 of 144: Check _RMV (Remove). > +method Test 27 of 144: Test _RMV (Remove). > method PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 28 of 144: Check _STA (Status). > +method Test 28 of 144: Test _STA (Status). > method PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -273,91 +273,91 @@ method returned sane looking value 0x00000000. > method PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 29 of 144: Check _BDN (BIOS Dock Name). > +method Test 29 of 144: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 29, Skipping test for non-existant object > method _BDN. > method > -method Test 30 of 144: Check _BBN (Base Bus Number). > +method Test 30 of 144: Test _BBN (Base Bus Number). > method SKIPPED: Test 30, Skipping test for non-existant object > method _BBN. > method > -method Test 31 of 144: Check _DCK (Dock). > +method Test 31 of 144: Test _DCK (Dock). > method SKIPPED: Test 31, Skipping test for non-existant object > method _DCK. > method > -method Test 32 of 144: Check _INI (Initialize). > +method Test 32 of 144: Test _INI (Initialize). > method PASSED: Test 32, \_SB_._INI returned no values as > method expected. > method > -method Test 33 of 144: Check _SEG (Segment). > +method Test 33 of 144: Test _SEG (Segment). > method SKIPPED: Test 33, Skipping test for non-existant object > method _SEG. > method > -method Test 34 of 144: Check _OFF (Set resource off). > +method Test 34 of 144: Test _OFF (Set resource off). > method SKIPPED: Test 34, Skipping test for non-existant object > method _OFF. > method > -method Test 35 of 144: Check _ON (Set resource on). > +method Test 35 of 144: Test _ON (Set resource on). > method SKIPPED: Test 35, Skipping test for non-existant object > method _ON. > method > -method Test 36 of 144: Check _DSW (Device Sleep Wake). > +method Test 36 of 144: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 36, Skipping test for non-existant object > method _DSW. > method > -method Test 37 of 144: Check _IRC (In Rush Current). > +method Test 37 of 144: Test _IRC (In Rush Current). > method SKIPPED: Test 37, Skipping test for non-existant object > method _IRC. > method > -method Test 38 of 144: Check _PRE (Power Resources for > +method Test 38 of 144: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 38, Skipping test for non-existant object > method _PRE. > method > -method Test 39 of 144: Check _PR0 (Power Resources for D0). > +method Test 39 of 144: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 39, Skipping test for non-existant object > method _PR0. > method > -method Test 40 of 144: Check _PR1 (Power Resources for D1). > +method Test 40 of 144: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 40, Skipping test for non-existant object > method _PR1. > method > -method Test 41 of 144: Check _PR2 (Power Resources for D2). > +method Test 41 of 144: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 41, Skipping test for non-existant object > method _PR2. > method > -method Test 42 of 144: Check _PR3 (Power Resources for D3). > +method Test 42 of 144: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 42, Skipping test for non-existant object > method _PR3. > method > -method Test 43 of 144: Check _PS0 (Power State 0). > +method Test 43 of 144: Test _PS0 (Power State 0). > method PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 43, \_PS0 returned no values as expected. > method > -method Test 44 of 144: Check _PS1 (Power State 1). > +method Test 44 of 144: Test _PS1 (Power State 1). > method PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 45 of 144: Check _PS2 (Power State 2). > +method Test 45 of 144: Test _PS2 (Power State 2). > method SKIPPED: Test 45, Skipping test for non-existant object > method _PS2. > method > -method Test 46 of 144: Check _PS3 (Power State 3). > +method Test 46 of 144: Test _PS3 (Power State 3). > method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 46, \_PS3 returned no values as expected. > method > -method Test 47 of 144: Check _PSC (Power State Current). > +method Test 47 of 144: Test _PSC (Power State Current). > method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 47, \_PSC correctly returned an integer. > method > -method Test 48 of 144: Check _PSE (Power State for Enumeration). > +method Test 48 of 144: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 48, Skipping test for non-existant object > method _PSE. > method > -method Test 49 of 144: Check _PSW (Power State Wake). > +method Test 49 of 144: Test _PSW (Power State Wake). > method PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values > @@ -369,15 +369,15 @@ method as expected. > method PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 50 of 144: Check _S1D (S1 Device State). > +method Test 50 of 144: Test _S1D (S1 Device State). > method SKIPPED: Test 50, Skipping test for non-existant object > method _S1D. > method > -method Test 51 of 144: Check _S2D (S2 Device State). > +method Test 51 of 144: Test _S2D (S2 Device State). > method SKIPPED: Test 51, Skipping test for non-existant object > method _S2D. > method > -method Test 52 of 144: Check _S3D (S3 Device State). > +method Test 52 of 144: Test _S3D (S3 Device State). > method PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned > @@ -395,7 +395,7 @@ method an integer. > method PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 53 of 144: Check _S4D (S4 Device State). > +method Test 53 of 144: Test _S4D (S4 Device State). > method PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned > @@ -413,115 +413,114 @@ method an integer. > method PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 54 of 144: Check _S0W (S0 Device Wake State). > +method Test 54 of 144: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 54, Skipping test for non-existant object > method _S0W. > method > -method Test 55 of 144: Check _S1W (S1 Device Wake State). > +method Test 55 of 144: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 55, Skipping test for non-existant object > method _S1W. > method > -method Test 56 of 144: Check _S2W (S2 Device Wake State). > +method Test 56 of 144: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 56, Skipping test for non-existant object > method _S2W. > method > -method Test 57 of 144: Check _S3W (S3 Device Wake State). > +method Test 57 of 144: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 57, Skipping test for non-existant object > method _S3W. > method > -method Test 58 of 144: Check _S4W (S4 Device Wake State). > +method Test 58 of 144: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 58, Skipping test for non-existant object > method _S4W. > method > -method Test 59 of 144: Check _S0_ (S0 System State). > +method Test 59 of 144: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 59, \_S0_ correctly returned a sane looking > method package. > method > -method Test 60 of 144: Check _S1_ (S1 System State). > +method Test 60 of 144: Test _S1_ (S1 System State). > method SKIPPED: Test 60, Skipping test for non-existant object > method _S1_. > method > -method Test 61 of 144: Check _S2_ (S2 System State). > +method Test 61 of 144: Test _S2_ (S2 System State). > method SKIPPED: Test 61, Skipping test for non-existant object > method _S2_. > method > -method Test 62 of 144: Check _S3_ (S3 System State). > +method Test 62 of 144: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 62, \_S3_ correctly returned a sane looking > method package. > method > -method Test 63 of 144: Check _S4_ (S4 System State). > +method Test 63 of 144: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 63, \_S4_ correctly returned a sane looking > method package. > method > -method Test 64 of 144: Check _S5_ (S5 System State). > +method Test 64 of 144: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 64, \_S5_ correctly returned a sane looking > method package. > method > -method Test 65 of 144: Check _SWS (System Wake Source). > +method Test 65 of 144: Test _SWS (System Wake Source). > method SKIPPED: Test 65, Skipping test for non-existant object > method _SWS. > method > -method Test 66 of 144: Check _PSS (Performance Supported States). > +method Test 66 of 144: Test _PSS (Performance Supported States). > method SKIPPED: Test 66, Skipping test for non-existant object > method _PSS. > method > -method Test 67 of 144: Check _CPC (Continuous Performance > +method Test 67 of 144: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 67, Skipping test for non-existant object > method _CPC. > method > -method Test 68 of 144: Check _CSD (C State Dependencies). > +method Test 68 of 144: Test _CSD (C State Dependencies). > method SKIPPED: Test 68, Skipping test for non-existant object > method _CSD. > method > -method Test 69 of 144: Check _CST (C States). > +method Test 69 of 144: Test _CST (C States). > method SKIPPED: Test 69, Skipping test for non-existant object > method _CST. > method > -method Test 70 of 144: Check _PCT (Performance Control). > +method Test 70 of 144: Test _PCT (Performance Control). > method SKIPPED: Test 70, Skipping test for non-existant object > method _PCT. > method > -method Test 71 of 144: Check _PDL (P-State Depth Limit). > +method Test 71 of 144: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 71, Skipping test for non-existant object > method _PDL. > method > -method Test 72 of 144: Check _PPC (Performance Present > +method Test 72 of 144: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 72, Skipping test for non-existant object > method _PPC. > method > -method Test 73 of 144: Check _PPE (Polling for Platform Error). > +method Test 73 of 144: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 73, Skipping test for non-existant object > method _PPE. > method > -method Test 74 of 144: Check _TDL (T-State Depth Limit). > +method Test 74 of 144: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 74, Skipping test for non-existant object > method _TDL. > method > -method Test 75 of 144: Check _TPC (Throttling Present > +method Test 75 of 144: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 76 of 144: Check _TSD (Throttling State > -method Dependencies). > +method Test 76 of 144: Test _TSD (Throttling State Dependencies). > method PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 77 of 144: Check _TSS (Throttling Supported States). > +method Test 77 of 144: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -549,125 +548,123 @@ method 7 13% 125 0 09 00 > method PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 78 of 144: Check _ALC (Ambient Light Colour > +method Test 78 of 144: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 78, Skipping test for non-existant object > method _ALC. > method > -method Test 79 of 144: Check _ALI (Ambient Light Illuminance). > +method Test 79 of 144: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 79, Skipping test for non-existant object > method _ALI. > method > -method Test 80 of 144: Check _ALT (Ambient Light Temperature). > +method Test 80 of 144: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 80, Skipping test for non-existant object > method _ALT. > method > -method Test 81 of 144: Check _ALP (Ambient Light Polling). > +method Test 81 of 144: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 81, Skipping test for non-existant object > method _ALP. > method > -method Test 82 of 144: Check _LID (Lid Status). > +method Test 82 of 144: Test _LID (Lid Status). > method PASSED: Test 82, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 83 of 144: Check _GCP (Get Capabilities). > +method Test 83 of 144: Test _GCP (Get Capabilities). > method SKIPPED: Test 83, Skipping test for non-existant object > method _GCP. > method > -method Test 84 of 144: Check _GRT (Get Real Time). > +method Test 84 of 144: Test _GRT (Get Real Time). > method SKIPPED: Test 84, Skipping test for non-existant object > method _GRT. > method > -method Test 85 of 144: Check _GWS (Get Wake Status). > +method Test 85 of 144: Test _GWS (Get Wake Status). > method SKIPPED: Test 85, Skipping test for non-existant object > method _GWS. > method > -method Test 86 of 144: Check _STP (Set Expired Timer Wake > -method Policy). > +method Test 86 of 144: Test _STP (Set Expired Timer Wake Policy). > method SKIPPED: Test 86, Skipping test for non-existant object > method _STP. > method > -method Test 87 of 144: Check _STV (Set Timer Value). > +method Test 87 of 144: Test _STV (Set Timer Value). > method SKIPPED: Test 87, Skipping test for non-existant object > method _STV. > method > -method Test 88 of 144: Check _TIP (Expired Timer Wake Policy). > +method Test 88 of 144: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 88, Skipping test for non-existant object > method _TIP. > method > -method Test 89 of 144: Check _TIV (Timer Values). > +method Test 89 of 144: Test _TIV (Timer Values). > method SKIPPED: Test 89, Skipping test for non-existant object > method _TIV. > method > -method Test 90 of 144: Check _SBS (Smart Battery Subsystem). > +method Test 90 of 144: Test _SBS (Smart Battery Subsystem). > method SKIPPED: Test 90, Skipping test for non-existant object > method _SBS. > method > -method Test 91 of 144: Check _BCT (Battery Charge Time). > +method Test 91 of 144: Test _BCT (Battery Charge Time). > method SKIPPED: Test 91, Skipping test for non-existant object > method _BCT. > method > -method Test 92 of 144: Check _BIF (Battery Information). > +method Test 92 of 144: Test _BIF (Battery Information). > method PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 93 of 144: Check _BIX (Battery Information Extended). > +method Test 93 of 144: Test _BIX (Battery Information Extended). > method SKIPPED: Test 93, Skipping test for non-existant object > method _BIX. > method > -method Test 94 of 144: Check _BMA (Battery Measurement > -method Averaging). > +method Test 94 of 144: Test _BMA (Battery Measurement Averaging). > method SKIPPED: Test 94, Skipping test for non-existant object > method _BMA. > method > -method Test 95 of 144: Check _BMC (Battery Maintenance Control). > +method Test 95 of 144: Test _BMC (Battery Maintenance Control). > method SKIPPED: Test 95, Skipping test for non-existant object > method _BMC. > method > -method Test 96 of 144: Check _BMD (Battery Maintenance Data). > +method Test 96 of 144: Test _BMD (Battery Maintenance Data). > method SKIPPED: Test 96, Skipping test for non-existant object > method _BMD. > method > -method Test 97 of 144: Check _BMS (Battery Measurement Sampling > +method Test 97 of 144: Test _BMS (Battery Measurement Sampling > method Time). > method SKIPPED: Test 97, Skipping test for non-existant object > method _BMS. > method > -method Test 98 of 144: Check _BST (Battery Status). > +method Test 98 of 144: Test _BST (Battery Status). > method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 99 of 144: Check _BTP (Battery Trip Point). > +method Test 99 of 144: Test _BTP (Battery Trip Point). > method SKIPPED: Test 99, Skipping test for non-existant object > method _BTP. > method > -method Test 100 of 144: Check _BTM (Battery Time). > +method Test 100 of 144: Test _BTM (Battery Time). > method SKIPPED: Test 100, Skipping test for non-existant object > method _BTM. > method > -method Test 101 of 144: Check _PCL (Power Consumer List). > +method Test 101 of 144: Test _PCL (Power Consumer List). > method > -method Test 102 of 144: Check _PIF (Power Source Information). > +method Test 102 of 144: Test _PIF (Power Source Information). > method SKIPPED: Test 102, Skipping test for non-existant object > method _PIF. > method > -method Test 103 of 144: Check _PSR (Power Source). > +method Test 103 of 144: Test _PSR (Power Source). > method PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 104 of 144: Check _FIF (Fan Information). > +method Test 104 of 144: Test _FIF (Fan Information). > method SKIPPED: Test 104, Skipping test for non-existant object > method _FIF. > method > -method Test 105 of 144: Check _FSL (Fan Set Level). > +method Test 105 of 144: Test _FSL (Fan Set Level). > method SKIPPED: Test 105, Skipping test for non-existant object > method _FSL. > method > -method Test 106 of 144: Check _FST (Fan Status). > +method Test 106 of 144: Test _FST (Fan Status). > method SKIPPED: Test 106, Skipping test for non-existant object > method _FST. > method > -method Test 107 of 144: Check _ACx (Active Cooling). > +method Test 107 of 144: Test _ACx (Active Cooling). > method PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > method returned a sane looking return type. > method > @@ -699,65 +696,64 @@ method SKIPPED: Test 107, Skipping test for non-existant object > method AC9. > method > method > -method Test 108 of 144: Check _CRT (Critical Trip Point). > +method Test 108 of 144: Test _CRT (Critical Trip Point). > method SKIPPED: Test 108, Skipping test for non-existant object > method _CRT. > method > -method Test 109 of 144: Check _DTI (Device Temperature > +method Test 109 of 144: Test _DTI (Device Temperature > method Indication). > method SKIPPED: Test 109, Skipping test for non-existant object > method _DTI. > method > -method Test 110 of 144: Check _HOT (Hot Temperature). > +method Test 110 of 144: Test _HOT (Hot Temperature). > method SKIPPED: Test 110, Skipping test for non-existant object > method _HOT. > method > -method Test 111 of 144: Check _NTT (Notification Temp Threshold). > +method Test 111 of 144: Test _NTT (Notification Temp Threshold). > method SKIPPED: Test 111, Skipping test for non-existant object > method _NTT. > method > -method Test 112 of 144: Check _PSV (Passive Temp). > +method Test 112 of 144: Test _PSV (Passive Temp). > method SKIPPED: Test 112, Skipping test for non-existant object > method _PSV. > method > -method Test 113 of 144: Check _RTV (Relative Temp Values). > +method Test 113 of 144: Test _RTV (Relative Temp Values). > method SKIPPED: Test 113, Skipping test for non-existant object > method _RTV. > method > -method Test 114 of 144: Check _SCP (Set Cooling Policy). > +method Test 114 of 144: Test _SCP (Set Cooling Policy). > method SKIPPED: Test 114, Skipping test for non-existant object > method _DTI. > method > -method Test 115 of 144: Check _TC1 (Thermal Constant 1). > +method Test 115 of 144: Test _TC1 (Thermal Constant 1). > method SKIPPED: Test 115, Skipping test for non-existant object > method _TC1. > method > -method Test 116 of 144: Check _TC2 (Thermal Constant 2). > +method Test 116 of 144: Test _TC2 (Thermal Constant 2). > method SKIPPED: Test 116, Skipping test for non-existant object > method _TC2. > method > -method Test 117 of 144: Check _TMP (Thermal Zone Current Temp). > +method Test 117 of 144: Test _TMP (Thermal Zone Current Temp). > method SKIPPED: Test 117, Skipping test for non-existant object > method _TMP. > method > -method Test 118 of 144: Check _TPT (Trip Point Temperature). > +method Test 118 of 144: Test _TPT (Trip Point Temperature). > method SKIPPED: Test 118, Skipping test for non-existant object > method _TPT. > method > -method Test 119 of 144: Check _TSP (Thermal Sampling Period). > +method Test 119 of 144: Test _TSP (Thermal Sampling Period). > method SKIPPED: Test 119, Skipping test for non-existant object > method _TSP. > method > -method Test 120 of 144: Check _TST (Temperature Sensor > -method Threshold). > +method Test 120 of 144: Test _TST (Temperature Sensor Threshold). > method SKIPPED: Test 120, Skipping test for non-existant object > method _TST. > method > -method Test 121 of 144: Check _TZP (Thermal Zone Polling). > +method Test 121 of 144: Test _TZP (Thermal Zone Polling). > method SKIPPED: Test 121, Skipping test for non-existant object > method _TZP. > method > -method Test 122 of 144: Check _PTS (Prepare to Sleep). > +method Test 122 of 144: Test _PTS (Prepare to Sleep). > method Test _PTS(1). > method PASSED: Test 122, \_PTS returned no values as expected. > method > @@ -774,35 +770,35 @@ method Test _PTS(5). > method PASSED: Test 122, \_PTS returned no values as expected. > method > method > -method Test 123 of 144: Check _TTS (Transition to State). > +method Test 123 of 144: Test _TTS (Transition to State). > method SKIPPED: Test 123, Optional control method _TTS does not > method exist. > method > -method Test 124 of 144: Check _S0 (System S0 State). > +method Test 124 of 144: Test _S0 (System S0 State). > method SKIPPED: Test 124, Skipping test for non-existant object > method _S0. > method > -method Test 125 of 144: Check _S1 (System S1 State). > +method Test 125 of 144: Test _S1 (System S1 State). > method SKIPPED: Test 125, Skipping test for non-existant object > method _S1. > method > -method Test 126 of 144: Check _S2 (System S2 State). > +method Test 126 of 144: Test _S2 (System S2 State). > method SKIPPED: Test 126, Skipping test for non-existant object > method _S2. > method > -method Test 127 of 144: Check _S3 (System S3 State). > +method Test 127 of 144: Test _S3 (System S3 State). > method SKIPPED: Test 127, Skipping test for non-existant object > method _S3. > method > -method Test 128 of 144: Check _S4 (System S4 State). > +method Test 128 of 144: Test _S4 (System S4 State). > method SKIPPED: Test 128, Skipping test for non-existant object > method _S4. > method > -method Test 129 of 144: Check _S5 (System S5 State). > +method Test 129 of 144: Test _S5 (System S5 State). > method SKIPPED: Test 129, Skipping test for non-existant object > method _S5. > method > -method Test 130 of 144: Check _WAK (System Wake). > +method Test 130 of 144: Test _WAK (System Wake). > method Test _WAK(1) System Wake, State S1. > method PASSED: Test 130, \_WAK correctly returned a sane looking > method package. > @@ -824,7 +820,7 @@ method PASSED: Test 130, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 131 of 144: Check _ADR (Return Unique ID for Device). > +method Test 131 of 144: Test _ADR (Return Unique ID for Device). > method PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > method PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned > @@ -936,7 +932,7 @@ method returned an integer. > method PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 132 of 144: Check _BCL (Query List of Brightness > +method Test 132 of 144: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > @@ -951,20 +947,20 @@ method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > method PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 133 of 144: Check _BCM (Set Brightness Level). > +method Test 133 of 144: Test _BCM (Set Brightness Level). > method PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > method PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 134 of 144: Check _BQC (Brightness Query Current > +method Test 134 of 144: Test _BQC (Brightness Query Current > method Level). > method PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > method PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 135 of 144: Check _DCS (Return the Status of Output > +method Test 135 of 144: Test _DCS (Return the Status of Output > method Device). > method PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > @@ -983,12 +979,12 @@ method returned an integer. > method PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 136 of 144: Check _DDC (Return the EDID for this > +method Test 136 of 144: Test _DDC (Return the EDID for this > method Device). > method SKIPPED: Test 136, Skipping test for non-existant object > method _DDC. > method > -method Test 137 of 144: Check _DSS (Device Set State). > +method Test 137 of 144: Test _DSS (Device Set State). > method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > @@ -1006,7 +1002,7 @@ method values as expected. > method PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 138 of 144: Check _DGS (Query Graphics State). > +method Test 138 of 144: Test _DGS (Query Graphics State). > method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > @@ -1024,8 +1020,8 @@ method returned an integer. > method PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 139 of 144: Check _DOD (Enumerate All Devices > -method Attached to Display Adapter). > +method Test 139 of 144: Test _DOD (Enumerate All Devices Attached > +method to Display Adapter). > method Device 0: > method Instance: 0 > method Display port attachment: 0 > @@ -1059,26 +1055,26 @@ method Head or pipe ID: 0 > method PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 140 of 144: Check _DOS (Enable/Disable Output > +method Test 140 of 144: Test _DOS (Enable/Disable Output > method Switching). > method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > method PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 141 of 144: Check _GPD (Get POST Device). > +method Test 141 of 144: Test _GPD (Get POST Device). > method SKIPPED: Test 141, Skipping test for non-existant object > method _GPD. > method > -method Test 142 of 144: Check _ROM (Get ROM Data). > +method Test 142 of 144: Test _ROM (Get ROM Data). > method SKIPPED: Test 142, Skipping test for non-existant object > method _ROM. > method > -method Test 143 of 144: Check _SPD (Set POST Device). > +method Test 143 of 144: Test _SPD (Set POST Device). > method SKIPPED: Test 143, Skipping test for non-existant object > method _SPD. > method > -method Test 144 of 144: Check _VPO (Video POST Options). > +method Test 144 of 144: Test _VPO (Video POST Options). > method SKIPPED: Test 144, Skipping test for non-existant object > method _VPO. > method > diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log > index 0540ba3..aca6243 100644 > --- a/wmi-0001/wmi-0001.log > +++ b/wmi-0001/wmi-0001.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.WMI1._WDG (1 of 9) > wmi GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7 > diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log > index ab5b704..1732e65 100644 > --- a/wmi-0001/wmi-0002.log > +++ b/wmi-0001/wmi-0002.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.ATKD._WDG (1 of 2) > wmi GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66 > diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log > index 5f4084d..f1e9aa3 100644 > --- a/wmi-0001/wmi-0003.log > +++ b/wmi-0001/wmi-0003.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.AMW0._WDG (1 of 6) > wmi GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492 > Acked-by: Ivan Hu <ivan.hu@canonical.com>
On Thu, Oct 31, 2013 at 8:01 PM, Colin King <colin.king@canonical.com> wrote: > From: Colin Ian King <colin.king@canonical.com> > > Replacment of "Check" with "Test" in LP: #1246650 means we > need to update the affected tests. > > Signed-off-by: Colin Ian King <colin.king@canonical.com> > --- > acpitables-0001/acpitables-0001.log | 4 +- > acpitables-0002/acpitables-0001.log | 4 +- > acpitables-0002/acpitables-0002.log | 4 +- > acpitables-0003/acpitables-0001.log | 4 +- > acpitables-0004/acpitables-0001.log | 4 +- > acpitables-0005/acpitables-0001.log | 4 +- > acpitables-0006/acpitables-0001.log | 4 +- > acpitables-0007/acpitables-0001.log | 4 +- > acpitables-0008/acpitables-0001.log | 4 +- > apicinstance-0001/apicinstance-0001.log | 5 +- > apicinstance-0001/apicinstance-0002.log | 5 +- > arg-show-tests-0001/arg-show-tests-0001.log | 62 ++-- > .../arg-show-tests-full-0001.log | 394 ++++++++++----------- > checksum-0001/checksum-0001.log | 4 +- > checksum-0001/checksum-0003.log | 4 +- > checksum-0001/checksum-0004.log | 4 +- > method-0001/method-0001.log | 296 ++++++++-------- > wmi-0001/wmi-0001.log | 2 +- > wmi-0001/wmi-0002.log | 2 +- > wmi-0001/wmi-0003.log | 2 +- > 20 files changed, 405 insertions(+), 411 deletions(-) > > diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log > index 2f05d15..57d8813 100644 > --- a/acpitables-0001/acpitables-0001.log > +++ b/acpitables-0001/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables PASSED: Test 1, Table APIC passed. > acpitables Table ECDT not present to check. > acpitables PASSED: Test 1, Table FACP passed. > diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log > index 042c83e..22f07a2 100644 > --- a/acpitables-0002/acpitables-0001.log > +++ b/acpitables-0002/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables PASSED: Test 1, Table APIC passed. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log > index db437af..c16d257 100644 > --- a/acpitables-0002/acpitables-0002.log > +++ b/acpitables-0002/acpitables-0002.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local > acpitables APIC flags field, bits 1..31 are reserved and should be > acpitables zero, but are set as: f. > diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log > index 2a4d63e..715978b 100644 > --- a/acpitables-0003/acpitables-0001.log > +++ b/acpitables-0003/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit > diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log > index 52491c3..f33e083 100644 > --- a/acpitables-0004/acpitables-0001.log > +++ b/acpitables-0004/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log > index cf09a01..2e97b45 100644 > --- a/acpitables-0005/acpitables-0001.log > +++ b/acpitables-0005/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log > index 1c2633c..b931cf3 100644 > --- a/acpitables-0006/acpitables-0001.log > +++ b/acpitables-0006/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log > index 3e02f91..5d17103 100644 > --- a/acpitables-0007/acpitables-0001.log > +++ b/acpitables-0007/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log > index 1a127a6..80ecd20 100644 > --- a/acpitables-0008/acpitables-0001.log > +++ b/acpitables-0008/acpitables-0001.log > @@ -1,6 +1,6 @@ > -acpitables acpitables: ACPI table settings sanity checks. > +acpitables acpitables: ACPI table settings sanity tests. > acpitables ---------------------------------------------------------- > -acpitables Test 1 of 1: Check ACPI tables. > +acpitables Test 1 of 1: Test ACPI tables. > acpitables Table APIC not present to check. > acpitables Table ECDT not present to check. > acpitables Table FACP not present to check. > diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log > index a185d24..0fcec6e 100644 > --- a/apicinstance-0001/apicinstance-0001.log > +++ b/apicinstance-0001/apicinstance-0001.log > @@ -1,7 +1,6 @@ > -apicinstance apicinstance: Check for single instance of APIC/MADT > -apicinstance table. > +apicinstance apicinstance: Test for single instance of APIC/MADT table. > apicinstance ---------------------------------------------------------- > -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. > +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. > apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 > apicinstance Found APIC/MADT table APIC @ bf6dff70, length 0x104 > apicinstance (and differs from first APIC/MADT table). > diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log > index 91fd42e..d3f2eb3 100644 > --- a/apicinstance-0001/apicinstance-0002.log > +++ b/apicinstance-0001/apicinstance-0002.log > @@ -1,7 +1,6 @@ > -apicinstance apicinstance: Check for single instance of APIC/MADT > -apicinstance table. > +apicinstance apicinstance: Test for single instance of APIC/MADT table. > apicinstance ---------------------------------------------------------- > -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. > +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. > apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 > apicinstance PASSED: Test 1, Found 1 APIC/MADT table(s), as expected. > apicinstance > diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log > index 06a7619..3068592 100644 > --- a/arg-show-tests-0001/arg-show-tests-0001.log > +++ b/arg-show-tests-0001/arg-show-tests-0001.log > @@ -1,49 +1,49 @@ > Batch tests: > - acpiinfo General ACPI information check. > - acpitables ACPI table settings sanity checks. > - apicedge APIC Edge/Level Check. > - apicinstance Check for single instance of APIC/MADT table. > - aspm PCIe ASPM check. > - bios32 Check BIOS32 Service Directory. > + acpiinfo General ACPI information test. > + acpitables ACPI table settings sanity tests. > + apicedge APIC edge/level test. > + apicinstance Test for single instance of APIC/MADT table. > + aspm PCIe ASPM test. > + bios32 BIOS32 Service Directory test. > bios_info Gather BIOS DMI information. > - checksum Check ACPI table checksum. > + checksum ACPI table checksum test. > cpufreq CPU frequency scaling tests. > - crs Check PCI host bridge configuration using _CRS. > - csm Check for UEFI Compatibility Support Module. > - cstates Check processor C state support. > - dmar Check sane DMA Remapping (VT-d). > - dmicheck Test DMI/SMBIOS tables for errors. > - ebda Validate EBDA region is mapped and reserved in memory map table. > - fadt FADT SCI_EN enabled check. > - fan Simple Fan Tests. > - hda_audio Check HDA Audio Pin Configs. > - hpet_check HPET configuration test. > + crs Test PCI host bridge configuration using _CRS. > + csm UEFI Compatibility Support Module test. > + cstates Processor C state support test. > + dmar DMA Remapping (VT-d) test. > + dmicheck DMI/SMBIOS table tests. > + ebda Test EBDA region is mapped and reserved in memory map table. > + fadt FADT SCI_EN enabled tests. > + fan Simple fan tests. > + hda_audio HDA Audio Pin Configuration test. > + hpet_check HPET configuration tests. > klog Scan kernel log for errors and warnings. > - maxfreq Check max CPU frequencies against max scaling frequency. > - maxreadreq Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. > - mcfg MCFG PCI Express* memory mapped config space. > - method ACPI DSDT Method Semantic Tests. > - microcode Check if system is using latest microcode. > - mpcheck Check MultiProcessor Tables. > + maxfreq Test max CPU frequencies against max scaling frequency. > + maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. > + mcfg MCFG PCI Express* memory mapped config space test. > + method ACPI DSDT Method Semantic tests. > + microcode Test if system is using latest microcode. > + mpcheck MultiProcessor Tables tests. > msr MSR register tests. > - mtrr MTRR validation. > + mtrr MTRR tests. > nx Test if CPU NX is disabled by the BIOS. > oops Scan kernel log for Oopses. > os2gap OS/2 memory hole test. > osilinux Disassemble DSDT to check for _OSI("Linux"). > - pcc Processor Clocking Control (PCC) Test. > - pciirq Check PCI IRQ Routing Table. > - pnp Check BIOS Support Installation structure. > + pcc Processor Clocking Control (PCC) test. > + pciirq PCI IRQ Routing Table test. > + pnp BIOS Support Installation structure test. > securebootcert Ubuntu UEFI secure boot test. > syntaxcheck Re-assemble DSDT and find syntax errors and warnings. > version Gather kernel system information. > - virt Test CPU Virtualisation Configuration. > - wakealarm Test ACPI Wakealarm. > + virt CPU Virtualisation Configuration test. > + wakealarm ACPI Wakealarm tests. > wmi Extract and analyse Windows Management Instrumentation (WMI). > > Interactive tests: > ac_adapter Interactive ac_adapter power test. > - battery Battery Tests. > + battery Battery tests. > brightness Interactive LCD brightness test. > hotkey Hotkey scan code tests. > lid Interactive lid button test. > @@ -71,7 +71,7 @@ Unsafe tests: > uefirtvariable UEFI Runtime service variable interface tests. > > UEFI tests: > - csm Check for UEFI Compatibility Support Module. > + csm UEFI Compatibility Support Module test. > securebootcert Ubuntu UEFI secure boot test. > uefirtmisc UEFI miscellaneous runtime service interface tests. > uefirttime UEFI Runtime service time interface tests. > diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log > index f6d3b89..c9c13c5 100644 > --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log > +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log > @@ -4,240 +4,240 @@ Batch tests: > Determine machine's ACPI version. > Determine AML compiler. > acpitables (1 test): > - Check ACPI tables. > + Test ACPI tables. > apicedge (1 test): > - Legacy and PCI Interrupt Edge/Level trigger checks. > + Legacy and PCI Interrupt Edge/Level trigger tests. > apicinstance (1 test): > - Check single instance of APIC/MADT table. > + Test for single instance of APIC/MADT table. > aspm (2 tests): > PCIe ASPM ACPI test. > PCIe ASPM registers test. > bios32 (1 test): > - Check BIOS32 Service Directory. > + BIOS32 Service Directory test. > bios_info (1 test): > Gather BIOS DMI information > checksum (1 test): > - Check ACPI table checksums. > + ACPI table checksum test. > cpufreq (1 test): > - CPU P-State Checks. > + CPU P-State tests. > crs (1 test): > - Check PCI host bridge configuration using _CRS. > + Test PCI host bridge configuration using _CRS. > csm (1 test): > - Check for UEFI Compatibility Support Module. > + UEFI Compatibility Support Module test. > cstates (1 test): > - Check all CPUs C-states. > + Test all CPUs C-states. > dmar (1 test): > - Check DMA Remapping. > + DMA Remapping test. > dmicheck (2 tests): > - Find and Check SMBIOS Table Entry Point. > + Find and test SMBIOS Table Entry Point. > Test DMI/SMBIOS tables for errors. > ebda (1 test): > - Check EBDA is reserved in E820 table. > + Test EBDA is reserved in E820 table. > fadt (2 tests): > - Check FADT SCI_EN bit is enabled. > - Check FADT reset register. > + Test FADT SCI_EN bit is enabled. > + Test FADT reset register. > fan (2 tests): > - Check fan status. > + Test fan status. > Load system, check CPU fan status. > hda_audio (1 test): > - Check HDA Audio Pin Configs. > + HDA Audio Pin Configuration test. > hpet_check (4 tests): > - Check HPET base in kernel log. > - Check HPET base in HPET table. > - Check HPET base in DSDT and/or SSDT. > - Sanity check HPET configuration. > + Test HPET base in kernel log. > + Test HPET base in HPET table. > + Test HPET base in DSDT and/or SSDT. > + Test HPET configuration. > klog (1 test): > Kernel log error check. > maxfreq (1 test): > - Maximum CPU frequency check. > + Maximum CPU frequency test. > maxreadreq (1 test): > - Check firmware settings MaxReadReq for PCI Express devices. > + Test firmware settings MaxReadReq for PCI Express devices. > mcfg (2 tests): > Validate MCFG table. > Validate MCFG PCI config space. > method (144 tests): > - Check Method Names. > - Check _AEI. > - Check _DDN (DOS Device Name). > - Check _HID (Hardware ID). > - Check _HRV (Hardware Revision Number). > - Check _PLD (Physical Device Location). > - Check _SUB (Subsystem ID). > - Check _SUN (Slot User Number). > - Check _STR (String). > - Check _UID (Unique ID). > - Check _CRS (Current Resource Settings). > - Check _DIS (Disable). > - Check _DMA (Direct Memory Access). > - Check _FIX (Fixed Register Resource Provider). > - Check _GSB (Global System Interrupt Base). > - Check _HPP (Hot Plug Parameters). > - Check _PRS (Possible Resource Settings). > - Check _PXM (Proximity). > - Check _EDL (Eject Device List). > - Check _EJD (Ejection Dependent Device). > - Check _EJ0 (Eject). > - Check _EJ1 (Eject). > - Check _EJ2 (Eject). > - Check _EJ3 (Eject). > - Check _EJ4 (Eject). > - Check _LCK (Lock). > - Check _RMV (Remove). > - Check _STA (Status). > - Check _BDN (BIOS Dock Name). > - Check _BBN (Base Bus Number). > - Check _DCK (Dock). > - Check _INI (Initialize). > - Check _SEG (Segment). > - Check _OFF (Set resource off). > - Check _ON (Set resource on). > - Check _DSW (Device Sleep Wake). > - Check _IRC (In Rush Current). > - Check _PRE (Power Resources for Enumeration). > - Check _PR0 (Power Resources for D0). > - Check _PR1 (Power Resources for D1). > - Check _PR2 (Power Resources for D2). > - Check _PR3 (Power Resources for D3). > - Check _PS0 (Power State 0). > - Check _PS1 (Power State 1). > - Check _PS2 (Power State 2). > - Check _PS3 (Power State 3). > - Check _PSC (Power State Current). > - Check _PSE (Power State for Enumeration). > - Check _PSW (Power State Wake). > - Check _S1D (S1 Device State). > - Check _S2D (S2 Device State). > - Check _S3D (S3 Device State). > - Check _S4D (S4 Device State). > - Check _S0W (S0 Device Wake State). > - Check _S1W (S1 Device Wake State). > - Check _S2W (S2 Device Wake State). > - Check _S3W (S3 Device Wake State). > - Check _S4W (S4 Device Wake State). > - Check _S0_ (S0 System State). > - Check _S1_ (S1 System State). > - Check _S2_ (S2 System State). > - Check _S3_ (S3 System State). > - Check _S4_ (S4 System State). > - Check _S5_ (S5 System State). > - Check _SWS (System Wake Source). > - Check _PSS (Performance Supported States). > - Check _CPC (Continuous Performance Control). > - Check _CSD (C State Dependencies). > - Check _CST (C States). > - Check _PCT (Performance Control). > - Check _PDL (P-State Depth Limit). > - Check _PPC (Performance Present Capabilities). > - Check _PPE (Polling for Platform Error). > - Check _TDL (T-State Depth Limit). > - Check _TPC (Throttling Present Capabilities). > - Check _TSD (Throttling State Dependencies). > - Check _TSS (Throttling Supported States). > - Check _ALC (Ambient Light Colour Chromaticity). > - Check _ALI (Ambient Light Illuminance). > - Check _ALT (Ambient Light Temperature). > - Check _ALP (Ambient Light Polling). > - Check _LID (Lid Status). > - Check _GCP (Get Capabilities). > - Check _GRT (Get Real Time). > - Check _GWS (Get Wake Status). > - Check _STP (Set Expired Timer Wake Policy). > - Check _STV (Set Timer Value). > - Check _TIP (Expired Timer Wake Policy). > - Check _TIV (Timer Values). > - Check _SBS (Smart Battery Subsystem). > - Check _BCT (Battery Charge Time). > - Check _BIF (Battery Information). > - Check _BIX (Battery Information Extended). > - Check _BMA (Battery Measurement Averaging). > - Check _BMC (Battery Maintenance Control). > - Check _BMD (Battery Maintenance Data). > - Check _BMS (Battery Measurement Sampling Time). > - Check _BST (Battery Status). > - Check _BTP (Battery Trip Point). > - Check _BTM (Battery Time). > - Check _PCL (Power Consumer List). > - Check _PIF (Power Source Information). > - Check _PSR (Power Source). > - Check _FIF (Fan Information). > - Check _FSL (Fan Set Level). > - Check _FST (Fan Status). > - Check _ACx (Active Cooling). > - Check _CRT (Critical Trip Point). > - Check _DTI (Device Temperature Indication). > - Check _HOT (Hot Temperature). > - Check _NTT (Notification Temp Threshold). > - Check _PSV (Passive Temp). > - Check _RTV (Relative Temp Values). > - Check _SCP (Set Cooling Policy). > - Check _TC1 (Thermal Constant 1). > - Check _TC2 (Thermal Constant 2). > - Check _TMP (Thermal Zone Current Temp). > - Check _TPT (Trip Point Temperature). > - Check _TSP (Thermal Sampling Period). > - Check _TST (Temperature Sensor Threshold). > - Check _TZP (Thermal Zone Polling). > - Check _PTS (Prepare to Sleep). > - Check _TTS (Transition to State). > - Check _S0 (System S0 State). > - Check _S1 (System S1 State). > - Check _S2 (System S2 State). > - Check _S3 (System S3 State). > - Check _S4 (System S4 State). > - Check _S5 (System S5 State). > - Check _WAK (System Wake). > - Check _ADR (Return Unique ID for Device). > - Check _BCL (Query List of Brightness Control Levels Supported). > - Check _BCM (Set Brightness Level). > - Check _BQC (Brightness Query Current Level). > - Check _DCS (Return the Status of Output Device). > - Check _DDC (Return the EDID for this Device). > - Check _DSS (Device Set State). > - Check _DGS (Query Graphics State). > - Check _DOD (Enumerate All Devices Attached to Display Adapter). > - Check _DOS (Enable/Disable Output Switching). > - Check _GPD (Get POST Device). > - Check _ROM (Get ROM Data). > - Check _SPD (Set POST Device). > - Check _VPO (Video POST Options). > + Test Method Names. > + Test _AEI. > + Test _DDN (DOS Device Name). > + Test _HID (Hardware ID). > + Test _HRV (Hardware Revision Number). > + Test _PLD (Physical Device Location). > + Test _SUB (Subsystem ID). > + Test _SUN (Slot User Number). > + Test _STR (String). > + Test _UID (Unique ID). > + Test _CRS (Current Resource Settings). > + Test _DIS (Disable). > + Test _DMA (Direct Memory Access). > + Test _FIX (Fixed Register Resource Provider). > + Test _GSB (Global System Interrupt Base). > + Test _HPP (Hot Plug Parameters). > + Test _PRS (Possible Resource Settings). > + Test _PXM (Proximity). > + Test _EDL (Eject Device List). > + Test _EJD (Ejection Dependent Device). > + Test _EJ0 (Eject). > + Test _EJ1 (Eject). > + Test _EJ2 (Eject). > + Test _EJ3 (Eject). > + Test _EJ4 (Eject). > + Test _LCK (Lock). > + Test _RMV (Remove). > + Test _STA (Status). > + Test _BDN (BIOS Dock Name). > + Test _BBN (Base Bus Number). > + Test _DCK (Dock). > + Test _INI (Initialize). > + Test _SEG (Segment). > + Test _OFF (Set resource off). > + Test _ON (Set resource on). > + Test _DSW (Device Sleep Wake). > + Test _IRC (In Rush Current). > + Test _PRE (Power Resources for Enumeration). > + Test _PR0 (Power Resources for D0). > + Test _PR1 (Power Resources for D1). > + Test _PR2 (Power Resources for D2). > + Test _PR3 (Power Resources for D3). > + Test _PS0 (Power State 0). > + Test _PS1 (Power State 1). > + Test _PS2 (Power State 2). > + Test _PS3 (Power State 3). > + Test _PSC (Power State Current). > + Test _PSE (Power State for Enumeration). > + Test _PSW (Power State Wake). > + Test _S1D (S1 Device State). > + Test _S2D (S2 Device State). > + Test _S3D (S3 Device State). > + Test _S4D (S4 Device State). > + Test _S0W (S0 Device Wake State). > + Test _S1W (S1 Device Wake State). > + Test _S2W (S2 Device Wake State). > + Test _S3W (S3 Device Wake State). > + Test _S4W (S4 Device Wake State). > + Test _S0_ (S0 System State). > + Test _S1_ (S1 System State). > + Test _S2_ (S2 System State). > + Test _S3_ (S3 System State). > + Test _S4_ (S4 System State). > + Test _S5_ (S5 System State). > + Test _SWS (System Wake Source). > + Test _PSS (Performance Supported States). > + Test _CPC (Continuous Performance Control). > + Test _CSD (C State Dependencies). > + Test _CST (C States). > + Test _PCT (Performance Control). > + Test _PDL (P-State Depth Limit). > + Test _PPC (Performance Present Capabilities). > + Test _PPE (Polling for Platform Error). > + Test _TDL (T-State Depth Limit). > + Test _TPC (Throttling Present Capabilities). > + Test _TSD (Throttling State Dependencies). > + Test _TSS (Throttling Supported States). > + Test _ALC (Ambient Light Colour Chromaticity). > + Test _ALI (Ambient Light Illuminance). > + Test _ALT (Ambient Light Temperature). > + Test _ALP (Ambient Light Polling). > + Test _LID (Lid Status). > + Test _GCP (Get Capabilities). > + Test _GRT (Get Real Time). > + Test _GWS (Get Wake Status). > + Test _STP (Set Expired Timer Wake Policy). > + Test _STV (Set Timer Value). > + Test _TIP (Expired Timer Wake Policy). > + Test _TIV (Timer Values). > + Test _SBS (Smart Battery Subsystem). > + Test _BCT (Battery Charge Time). > + Test _BIF (Battery Information). > + Test _BIX (Battery Information Extended). > + Test _BMA (Battery Measurement Averaging). > + Test _BMC (Battery Maintenance Control). > + Test _BMD (Battery Maintenance Data). > + Test _BMS (Battery Measurement Sampling Time). > + Test _BST (Battery Status). > + Test _BTP (Battery Trip Point). > + Test _BTM (Battery Time). > + Test _PCL (Power Consumer List). > + Test _PIF (Power Source Information). > + Test _PSR (Power Source). > + Test _FIF (Fan Information). > + Test _FSL (Fan Set Level). > + Test _FST (Fan Status). > + Test _ACx (Active Cooling). > + Test _CRT (Critical Trip Point). > + Test _DTI (Device Temperature Indication). > + Test _HOT (Hot Temperature). > + Test _NTT (Notification Temp Threshold). > + Test _PSV (Passive Temp). > + Test _RTV (Relative Temp Values). > + Test _SCP (Set Cooling Policy). > + Test _TC1 (Thermal Constant 1). > + Test _TC2 (Thermal Constant 2). > + Test _TMP (Thermal Zone Current Temp). > + Test _TPT (Trip Point Temperature). > + Test _TSP (Thermal Sampling Period). > + Test _TST (Temperature Sensor Threshold). > + Test _TZP (Thermal Zone Polling). > + Test _PTS (Prepare to Sleep). > + Test _TTS (Transition to State). > + Test _S0 (System S0 State). > + Test _S1 (System S1 State). > + Test _S2 (System S2 State). > + Test _S3 (System S3 State). > + Test _S4 (System S4 State). > + Test _S5 (System S5 State). > + Test _WAK (System Wake). > + Test _ADR (Return Unique ID for Device). > + Test _BCL (Query List of Brightness Control Levels Supported). > + Test _BCM (Set Brightness Level). > + Test _BQC (Brightness Query Current Level). > + Test _DCS (Return the Status of Output Device). > + Test _DDC (Return the EDID for this Device). > + Test _DSS (Device Set State). > + Test _DGS (Query Graphics State). > + Test _DOD (Enumerate All Devices Attached to Display Adapter). > + Test _DOS (Enable/Disable Output Switching). > + Test _GPD (Get POST Device). > + Test _ROM (Get ROM Data). > + Test _SPD (Set POST Device). > + Test _VPO (Video POST Options). > microcode (1 test): > - Check for most recent microcode being loaded. > + Test for most recent microcode being loaded. > mpcheck (9 tests): > - Check MP header. > - Check MP CPU entries. > - Check MP Bus entries. > - Check MP IO APIC entries. > - Check MP IO Interrupt entries. > - Check MP Local Interrupt entries. > - Check MP System Address entries. > - Check MP Bus Hierarchy entries. > - Check MP Compatible Bus Address Space entries. > + Test MP header. > + Test MP CPU entries. > + Test MP Bus entries. > + Test MP IO APIC entries. > + Test MP IO Interrupt entries. > + Test MP Local Interrupt entries. > + Test MP System Address entries. > + Test MP Bus Hierarchy entries. > + Test MP Compatible Bus Address Space entries. > msr (5 tests): > - Check CPU generic MSRs. > - Check CPU specific model MSRs. > - Check all P State Ratios. > - Check C1 and C3 autodemotion. > - Check SMRR MSR registers. > + Test CPU generic MSRs. > + Test CPU specific model MSRs. > + Test all P State Ratios. > + Test C1 and C3 autodemotion. > + Test SMRR MSR registers. > mtrr (3 tests): > Validate the kernel MTRR IOMEM setup. > Validate the MTRR setup across all processors. > - Check for AMD MtrrFixDramModEn being cleared by the BIOS. > + Test for AMD MtrrFixDramModEn being cleared by the BIOS. > nx (3 tests): > - Check CPU NX capability. > - Check all CPUs have same BIOS set NX flag. > - Check all CPUs have same msr setting in MSR 0x1a0. > + Test CPU NX capability. > + Test all CPUs have same BIOS set NX flag. > + Test all CPUs have same msr setting in MSR 0x1a0. > oops (1 test): > Kernel log oops check. > os2gap (1 test): > - Check the OS/2 15Mb memory hole is absent. > + Test the OS/2 15Mb memory hole is absent. > osilinux (1 test): > Disassemble DSDT to check for _OSI("Linux"). > pcc (1 test): > - Check PCCH. > + Processor Clocking Control (PCC) test. > pciirq (1 test): > - PCI IRQ Routing Table. > + PCI IRQ Routing Table test. > pnp (1 test): > - Check PnP BIOS Support Installation structure. > + PnP BIOS Support Installation structure test. > securebootcert (1 test): > Ubuntu UEFI secure boot test. > syntaxcheck (2 tests): > @@ -249,14 +249,14 @@ Batch tests: > Gather kernel boot command line. > Gather ACPI driver version. > virt (1 test): > - Check CPU Virtualisation Configuration. > + CPU Virtualisation Configuration test. > wakealarm (4 tests): > - Check existence of /sys/class/rtc/rtc0/wakealarm. > + Test existence of /sys/class/rtc/rtc0/wakealarm. > Trigger wakealarm for 1 seconds in the future. > - Check if wakealarm is fired. > + Test if wakealarm is fired. > Multiple wakealarm firing tests. > wmi (1 test): > - Check Windows Management Instrumentation > + Windows Management Instrumentation test. > > Interactive tests: > ac_adapter (3 tests): > @@ -264,13 +264,13 @@ Interactive tests: > Test ac_adapter initial on-line state. > Test ac_adapter state changes. > battery (1 test): > - Check batteries. > + Battery test. > brightness (5 tests): > - Check for maximum and actual brightness. > + Test for maximum and actual brightness. > Change actual brightness. > Observe all brightness changes. > Observe min, max brightness changes. > - Check brightness hotkeys. > + Test brightness hotkeys. > hotkey (1 test): > Hotkey keypress checks. > lid (3 tests): > @@ -328,7 +328,7 @@ Unsafe tests: > > UEFI tests: > csm (1 test): > - Check for UEFI Compatibility Support Module. > + UEFI Compatibility Support Module test. > securebootcert (1 test): > Ubuntu UEFI secure boot test. > uefirtmisc (2 tests): > diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log > index 4efca9b..d720e06 100644 > --- a/checksum-0001/checksum-0001.log > +++ b/checksum-0001/checksum-0001.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. > checksum PASSED: Test 1, Table FACP has correct checksum 0x52. > checksum PASSED: Test 1, Table APIC has correct checksum 0xcc. > diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log > index 75925bb..4ab586a 100644 > --- a/checksum-0001/checksum-0003.log > +++ b/checksum-0001/checksum-0003.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got > checksum 0x10. > checksum > diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log > index d092674..f69a42a 100644 > --- a/checksum-0001/checksum-0004.log > +++ b/checksum-0001/checksum-0004.log > @@ -1,6 +1,6 @@ > -checksum checksum: Check ACPI table checksum. > +checksum checksum: ACPI table checksum test. > checksum -------------------------------------------------------------------------------------------------- > -checksum Test 1 of 1: Check ACPI table checksums. > +checksum Test 1 of 1: ACPI table checksum test. > checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. > checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got > checksum 0x53. > diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log > index e41aa26..bf2c976 100644 > --- a/method-0001/method-0001.log > +++ b/method-0001/method-0001.log > @@ -1,18 +1,18 @@ > -method method: ACPI DSDT Method Semantic Tests. > +method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 144: Check Method Names. > +method Test 1 of 144: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 144: Check _AEI. > +method Test 2 of 144: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existant object > method _AEI. > method > -method Test 3 of 144: Check _DDN (DOS Device Name). > +method Test 3 of 144: Test _DDN (DOS Device Name). > method SKIPPED: Test 3, Skipping test for non-existant object > method _DDN. > method > -method Test 4 of 144: Check _HID (Hardware ID). > +method Test 4 of 144: Test _HID (Hardware ID). > method PASSED: Test 4, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 4, \_SB_.LID0._HID returned an integer > @@ -66,27 +66,27 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 5 of 144: Check _HRV (Hardware Revision Number). > +method Test 5 of 144: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 5, Skipping test for non-existant object > method _HRV. > method > -method Test 6 of 144: Check _PLD (Physical Device Location). > +method Test 6 of 144: Test _PLD (Physical Device Location). > method SKIPPED: Test 6, Skipping test for non-existant object > method _PLD. > method > -method Test 7 of 144: Check _SUB (Subsystem ID). > +method Test 7 of 144: Test _SUB (Subsystem ID). > method SKIPPED: Test 7, Skipping test for non-existant object > method _SUB. > method > -method Test 8 of 144: Check _SUN (Slot User Number). > +method Test 8 of 144: Test _SUN (Slot User Number). > method SKIPPED: Test 8, Skipping test for non-existant object > method _SUN. > method > -method Test 9 of 144: Check _STR (String). > +method Test 9 of 144: Test _STR (String). > method SKIPPED: Test 9, Skipping test for non-existant object > method _STR. > method > -method Test 10 of 144: Check _UID (Unique ID). > +method Test 10 of 144: Test _UID (Unique ID). > method PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned > @@ -112,7 +112,7 @@ method returned sane looking value 0x00000002. > method PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 11 of 144: Check _CRS (Current Resource Settings). > +method Test 11 of 144: Test _CRS (Current Resource Settings). > method PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -156,7 +156,7 @@ method Descriptor) looks sane. > method PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 12 of 144: Check _DIS (Disable). > +method Test 12 of 144: Test _DIS (Disable). > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -174,24 +174,24 @@ method values as expected. > method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 13 of 144: Check _DMA (Direct Memory Access). > +method Test 13 of 144: Test _DMA (Direct Memory Access). > method SKIPPED: Test 13, Skipping test for non-existant object > method _DMA. > method > -method Test 14 of 144: Check _FIX (Fixed Register Resource > +method Test 14 of 144: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 14, Skipping test for non-existant object > method _FIX. > method > -method Test 15 of 144: Check _GSB (Global System Interrupt Base). > +method Test 15 of 144: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 15, Skipping test for non-existant object > method _GSB. > method > -method Test 16 of 144: Check _HPP (Hot Plug Parameters). > +method Test 16 of 144: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 16, Skipping test for non-existant object > method _HPP. > method > -method Test 17 of 144: Check _PRS (Possible Resource Settings). > +method Test 17 of 144: Test _PRS (Possible Resource Settings). > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -209,47 +209,47 @@ method Descriptor) looks sane. > method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 18 of 144: Check _PXM (Proximity). > +method Test 18 of 144: Test _PXM (Proximity). > method SKIPPED: Test 18, Skipping test for non-existant object > method _PXM. > method > -method Test 19 of 144: Check _EDL (Eject Device List). > +method Test 19 of 144: Test _EDL (Eject Device List). > method SKIPPED: Test 19, Skipping test for non-existant object > method _EDL. > method > -method Test 20 of 144: Check _EJD (Ejection Dependent Device). > +method Test 20 of 144: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 20, Skipping test for non-existant object > method _EJD. > method > -method Test 21 of 144: Check _EJ0 (Eject). > +method Test 21 of 144: Test _EJ0 (Eject). > method SKIPPED: Test 21, Skipping test for non-existant object > method _EJ0. > method > -method Test 22 of 144: Check _EJ1 (Eject). > +method Test 22 of 144: Test _EJ1 (Eject). > method SKIPPED: Test 22, Skipping test for non-existant object > method _EJ1. > method > -method Test 23 of 144: Check _EJ2 (Eject). > +method Test 23 of 144: Test _EJ2 (Eject). > method SKIPPED: Test 23, Skipping test for non-existant object > method _EJ2. > method > -method Test 24 of 144: Check _EJ3 (Eject). > +method Test 24 of 144: Test _EJ3 (Eject). > method SKIPPED: Test 24, Skipping test for non-existant object > method _EJ3. > method > -method Test 25 of 144: Check _EJ4 (Eject). > +method Test 25 of 144: Test _EJ4 (Eject). > method SKIPPED: Test 25, Skipping test for non-existant object > method _EJ4. > method > -method Test 26 of 144: Check _LCK (Lock). > +method Test 26 of 144: Test _LCK (Lock). > method SKIPPED: Test 26, Skipping test for non-existant object > method _LCK. > method > -method Test 27 of 144: Check _RMV (Remove). > +method Test 27 of 144: Test _RMV (Remove). > method PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 28 of 144: Check _STA (Status). > +method Test 28 of 144: Test _STA (Status). > method PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -273,91 +273,91 @@ method returned sane looking value 0x00000000. > method PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 29 of 144: Check _BDN (BIOS Dock Name). > +method Test 29 of 144: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 29, Skipping test for non-existant object > method _BDN. > method > -method Test 30 of 144: Check _BBN (Base Bus Number). > +method Test 30 of 144: Test _BBN (Base Bus Number). > method SKIPPED: Test 30, Skipping test for non-existant object > method _BBN. > method > -method Test 31 of 144: Check _DCK (Dock). > +method Test 31 of 144: Test _DCK (Dock). > method SKIPPED: Test 31, Skipping test for non-existant object > method _DCK. > method > -method Test 32 of 144: Check _INI (Initialize). > +method Test 32 of 144: Test _INI (Initialize). > method PASSED: Test 32, \_SB_._INI returned no values as > method expected. > method > -method Test 33 of 144: Check _SEG (Segment). > +method Test 33 of 144: Test _SEG (Segment). > method SKIPPED: Test 33, Skipping test for non-existant object > method _SEG. > method > -method Test 34 of 144: Check _OFF (Set resource off). > +method Test 34 of 144: Test _OFF (Set resource off). > method SKIPPED: Test 34, Skipping test for non-existant object > method _OFF. > method > -method Test 35 of 144: Check _ON (Set resource on). > +method Test 35 of 144: Test _ON (Set resource on). > method SKIPPED: Test 35, Skipping test for non-existant object > method _ON. > method > -method Test 36 of 144: Check _DSW (Device Sleep Wake). > +method Test 36 of 144: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 36, Skipping test for non-existant object > method _DSW. > method > -method Test 37 of 144: Check _IRC (In Rush Current). > +method Test 37 of 144: Test _IRC (In Rush Current). > method SKIPPED: Test 37, Skipping test for non-existant object > method _IRC. > method > -method Test 38 of 144: Check _PRE (Power Resources for > +method Test 38 of 144: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 38, Skipping test for non-existant object > method _PRE. > method > -method Test 39 of 144: Check _PR0 (Power Resources for D0). > +method Test 39 of 144: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 39, Skipping test for non-existant object > method _PR0. > method > -method Test 40 of 144: Check _PR1 (Power Resources for D1). > +method Test 40 of 144: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 40, Skipping test for non-existant object > method _PR1. > method > -method Test 41 of 144: Check _PR2 (Power Resources for D2). > +method Test 41 of 144: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 41, Skipping test for non-existant object > method _PR2. > method > -method Test 42 of 144: Check _PR3 (Power Resources for D3). > +method Test 42 of 144: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 42, Skipping test for non-existant object > method _PR3. > method > -method Test 43 of 144: Check _PS0 (Power State 0). > +method Test 43 of 144: Test _PS0 (Power State 0). > method PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 43, \_PS0 returned no values as expected. > method > -method Test 44 of 144: Check _PS1 (Power State 1). > +method Test 44 of 144: Test _PS1 (Power State 1). > method PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 45 of 144: Check _PS2 (Power State 2). > +method Test 45 of 144: Test _PS2 (Power State 2). > method SKIPPED: Test 45, Skipping test for non-existant object > method _PS2. > method > -method Test 46 of 144: Check _PS3 (Power State 3). > +method Test 46 of 144: Test _PS3 (Power State 3). > method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 46, \_PS3 returned no values as expected. > method > -method Test 47 of 144: Check _PSC (Power State Current). > +method Test 47 of 144: Test _PSC (Power State Current). > method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 47, \_PSC correctly returned an integer. > method > -method Test 48 of 144: Check _PSE (Power State for Enumeration). > +method Test 48 of 144: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 48, Skipping test for non-existant object > method _PSE. > method > -method Test 49 of 144: Check _PSW (Power State Wake). > +method Test 49 of 144: Test _PSW (Power State Wake). > method PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values > @@ -369,15 +369,15 @@ method as expected. > method PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 50 of 144: Check _S1D (S1 Device State). > +method Test 50 of 144: Test _S1D (S1 Device State). > method SKIPPED: Test 50, Skipping test for non-existant object > method _S1D. > method > -method Test 51 of 144: Check _S2D (S2 Device State). > +method Test 51 of 144: Test _S2D (S2 Device State). > method SKIPPED: Test 51, Skipping test for non-existant object > method _S2D. > method > -method Test 52 of 144: Check _S3D (S3 Device State). > +method Test 52 of 144: Test _S3D (S3 Device State). > method PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned > @@ -395,7 +395,7 @@ method an integer. > method PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 53 of 144: Check _S4D (S4 Device State). > +method Test 53 of 144: Test _S4D (S4 Device State). > method PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned > @@ -413,115 +413,114 @@ method an integer. > method PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 54 of 144: Check _S0W (S0 Device Wake State). > +method Test 54 of 144: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 54, Skipping test for non-existant object > method _S0W. > method > -method Test 55 of 144: Check _S1W (S1 Device Wake State). > +method Test 55 of 144: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 55, Skipping test for non-existant object > method _S1W. > method > -method Test 56 of 144: Check _S2W (S2 Device Wake State). > +method Test 56 of 144: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 56, Skipping test for non-existant object > method _S2W. > method > -method Test 57 of 144: Check _S3W (S3 Device Wake State). > +method Test 57 of 144: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 57, Skipping test for non-existant object > method _S3W. > method > -method Test 58 of 144: Check _S4W (S4 Device Wake State). > +method Test 58 of 144: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 58, Skipping test for non-existant object > method _S4W. > method > -method Test 59 of 144: Check _S0_ (S0 System State). > +method Test 59 of 144: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 59, \_S0_ correctly returned a sane looking > method package. > method > -method Test 60 of 144: Check _S1_ (S1 System State). > +method Test 60 of 144: Test _S1_ (S1 System State). > method SKIPPED: Test 60, Skipping test for non-existant object > method _S1_. > method > -method Test 61 of 144: Check _S2_ (S2 System State). > +method Test 61 of 144: Test _S2_ (S2 System State). > method SKIPPED: Test 61, Skipping test for non-existant object > method _S2_. > method > -method Test 62 of 144: Check _S3_ (S3 System State). > +method Test 62 of 144: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 62, \_S3_ correctly returned a sane looking > method package. > method > -method Test 63 of 144: Check _S4_ (S4 System State). > +method Test 63 of 144: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 63, \_S4_ correctly returned a sane looking > method package. > method > -method Test 64 of 144: Check _S5_ (S5 System State). > +method Test 64 of 144: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 64, \_S5_ correctly returned a sane looking > method package. > method > -method Test 65 of 144: Check _SWS (System Wake Source). > +method Test 65 of 144: Test _SWS (System Wake Source). > method SKIPPED: Test 65, Skipping test for non-existant object > method _SWS. > method > -method Test 66 of 144: Check _PSS (Performance Supported States). > +method Test 66 of 144: Test _PSS (Performance Supported States). > method SKIPPED: Test 66, Skipping test for non-existant object > method _PSS. > method > -method Test 67 of 144: Check _CPC (Continuous Performance > +method Test 67 of 144: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 67, Skipping test for non-existant object > method _CPC. > method > -method Test 68 of 144: Check _CSD (C State Dependencies). > +method Test 68 of 144: Test _CSD (C State Dependencies). > method SKIPPED: Test 68, Skipping test for non-existant object > method _CSD. > method > -method Test 69 of 144: Check _CST (C States). > +method Test 69 of 144: Test _CST (C States). > method SKIPPED: Test 69, Skipping test for non-existant object > method _CST. > method > -method Test 70 of 144: Check _PCT (Performance Control). > +method Test 70 of 144: Test _PCT (Performance Control). > method SKIPPED: Test 70, Skipping test for non-existant object > method _PCT. > method > -method Test 71 of 144: Check _PDL (P-State Depth Limit). > +method Test 71 of 144: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 71, Skipping test for non-existant object > method _PDL. > method > -method Test 72 of 144: Check _PPC (Performance Present > +method Test 72 of 144: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 72, Skipping test for non-existant object > method _PPC. > method > -method Test 73 of 144: Check _PPE (Polling for Platform Error). > +method Test 73 of 144: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 73, Skipping test for non-existant object > method _PPE. > method > -method Test 74 of 144: Check _TDL (T-State Depth Limit). > +method Test 74 of 144: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 74, Skipping test for non-existant object > method _TDL. > method > -method Test 75 of 144: Check _TPC (Throttling Present > +method Test 75 of 144: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 76 of 144: Check _TSD (Throttling State > -method Dependencies). > +method Test 76 of 144: Test _TSD (Throttling State Dependencies). > method PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 77 of 144: Check _TSS (Throttling Supported States). > +method Test 77 of 144: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -549,125 +548,123 @@ method 7 13% 125 0 09 00 > method PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 78 of 144: Check _ALC (Ambient Light Colour > +method Test 78 of 144: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 78, Skipping test for non-existant object > method _ALC. > method > -method Test 79 of 144: Check _ALI (Ambient Light Illuminance). > +method Test 79 of 144: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 79, Skipping test for non-existant object > method _ALI. > method > -method Test 80 of 144: Check _ALT (Ambient Light Temperature). > +method Test 80 of 144: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 80, Skipping test for non-existant object > method _ALT. > method > -method Test 81 of 144: Check _ALP (Ambient Light Polling). > +method Test 81 of 144: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 81, Skipping test for non-existant object > method _ALP. > method > -method Test 82 of 144: Check _LID (Lid Status). > +method Test 82 of 144: Test _LID (Lid Status). > method PASSED: Test 82, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 83 of 144: Check _GCP (Get Capabilities). > +method Test 83 of 144: Test _GCP (Get Capabilities). > method SKIPPED: Test 83, Skipping test for non-existant object > method _GCP. > method > -method Test 84 of 144: Check _GRT (Get Real Time). > +method Test 84 of 144: Test _GRT (Get Real Time). > method SKIPPED: Test 84, Skipping test for non-existant object > method _GRT. > method > -method Test 85 of 144: Check _GWS (Get Wake Status). > +method Test 85 of 144: Test _GWS (Get Wake Status). > method SKIPPED: Test 85, Skipping test for non-existant object > method _GWS. > method > -method Test 86 of 144: Check _STP (Set Expired Timer Wake > -method Policy). > +method Test 86 of 144: Test _STP (Set Expired Timer Wake Policy). > method SKIPPED: Test 86, Skipping test for non-existant object > method _STP. > method > -method Test 87 of 144: Check _STV (Set Timer Value). > +method Test 87 of 144: Test _STV (Set Timer Value). > method SKIPPED: Test 87, Skipping test for non-existant object > method _STV. > method > -method Test 88 of 144: Check _TIP (Expired Timer Wake Policy). > +method Test 88 of 144: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 88, Skipping test for non-existant object > method _TIP. > method > -method Test 89 of 144: Check _TIV (Timer Values). > +method Test 89 of 144: Test _TIV (Timer Values). > method SKIPPED: Test 89, Skipping test for non-existant object > method _TIV. > method > -method Test 90 of 144: Check _SBS (Smart Battery Subsystem). > +method Test 90 of 144: Test _SBS (Smart Battery Subsystem). > method SKIPPED: Test 90, Skipping test for non-existant object > method _SBS. > method > -method Test 91 of 144: Check _BCT (Battery Charge Time). > +method Test 91 of 144: Test _BCT (Battery Charge Time). > method SKIPPED: Test 91, Skipping test for non-existant object > method _BCT. > method > -method Test 92 of 144: Check _BIF (Battery Information). > +method Test 92 of 144: Test _BIF (Battery Information). > method PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 93 of 144: Check _BIX (Battery Information Extended). > +method Test 93 of 144: Test _BIX (Battery Information Extended). > method SKIPPED: Test 93, Skipping test for non-existant object > method _BIX. > method > -method Test 94 of 144: Check _BMA (Battery Measurement > -method Averaging). > +method Test 94 of 144: Test _BMA (Battery Measurement Averaging). > method SKIPPED: Test 94, Skipping test for non-existant object > method _BMA. > method > -method Test 95 of 144: Check _BMC (Battery Maintenance Control). > +method Test 95 of 144: Test _BMC (Battery Maintenance Control). > method SKIPPED: Test 95, Skipping test for non-existant object > method _BMC. > method > -method Test 96 of 144: Check _BMD (Battery Maintenance Data). > +method Test 96 of 144: Test _BMD (Battery Maintenance Data). > method SKIPPED: Test 96, Skipping test for non-existant object > method _BMD. > method > -method Test 97 of 144: Check _BMS (Battery Measurement Sampling > +method Test 97 of 144: Test _BMS (Battery Measurement Sampling > method Time). > method SKIPPED: Test 97, Skipping test for non-existant object > method _BMS. > method > -method Test 98 of 144: Check _BST (Battery Status). > +method Test 98 of 144: Test _BST (Battery Status). > method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 99 of 144: Check _BTP (Battery Trip Point). > +method Test 99 of 144: Test _BTP (Battery Trip Point). > method SKIPPED: Test 99, Skipping test for non-existant object > method _BTP. > method > -method Test 100 of 144: Check _BTM (Battery Time). > +method Test 100 of 144: Test _BTM (Battery Time). > method SKIPPED: Test 100, Skipping test for non-existant object > method _BTM. > method > -method Test 101 of 144: Check _PCL (Power Consumer List). > +method Test 101 of 144: Test _PCL (Power Consumer List). > method > -method Test 102 of 144: Check _PIF (Power Source Information). > +method Test 102 of 144: Test _PIF (Power Source Information). > method SKIPPED: Test 102, Skipping test for non-existant object > method _PIF. > method > -method Test 103 of 144: Check _PSR (Power Source). > +method Test 103 of 144: Test _PSR (Power Source). > method PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 104 of 144: Check _FIF (Fan Information). > +method Test 104 of 144: Test _FIF (Fan Information). > method SKIPPED: Test 104, Skipping test for non-existant object > method _FIF. > method > -method Test 105 of 144: Check _FSL (Fan Set Level). > +method Test 105 of 144: Test _FSL (Fan Set Level). > method SKIPPED: Test 105, Skipping test for non-existant object > method _FSL. > method > -method Test 106 of 144: Check _FST (Fan Status). > +method Test 106 of 144: Test _FST (Fan Status). > method SKIPPED: Test 106, Skipping test for non-existant object > method _FST. > method > -method Test 107 of 144: Check _ACx (Active Cooling). > +method Test 107 of 144: Test _ACx (Active Cooling). > method PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly > method returned a sane looking return type. > method > @@ -699,65 +696,64 @@ method SKIPPED: Test 107, Skipping test for non-existant object > method AC9. > method > method > -method Test 108 of 144: Check _CRT (Critical Trip Point). > +method Test 108 of 144: Test _CRT (Critical Trip Point). > method SKIPPED: Test 108, Skipping test for non-existant object > method _CRT. > method > -method Test 109 of 144: Check _DTI (Device Temperature > +method Test 109 of 144: Test _DTI (Device Temperature > method Indication). > method SKIPPED: Test 109, Skipping test for non-existant object > method _DTI. > method > -method Test 110 of 144: Check _HOT (Hot Temperature). > +method Test 110 of 144: Test _HOT (Hot Temperature). > method SKIPPED: Test 110, Skipping test for non-existant object > method _HOT. > method > -method Test 111 of 144: Check _NTT (Notification Temp Threshold). > +method Test 111 of 144: Test _NTT (Notification Temp Threshold). > method SKIPPED: Test 111, Skipping test for non-existant object > method _NTT. > method > -method Test 112 of 144: Check _PSV (Passive Temp). > +method Test 112 of 144: Test _PSV (Passive Temp). > method SKIPPED: Test 112, Skipping test for non-existant object > method _PSV. > method > -method Test 113 of 144: Check _RTV (Relative Temp Values). > +method Test 113 of 144: Test _RTV (Relative Temp Values). > method SKIPPED: Test 113, Skipping test for non-existant object > method _RTV. > method > -method Test 114 of 144: Check _SCP (Set Cooling Policy). > +method Test 114 of 144: Test _SCP (Set Cooling Policy). > method SKIPPED: Test 114, Skipping test for non-existant object > method _DTI. > method > -method Test 115 of 144: Check _TC1 (Thermal Constant 1). > +method Test 115 of 144: Test _TC1 (Thermal Constant 1). > method SKIPPED: Test 115, Skipping test for non-existant object > method _TC1. > method > -method Test 116 of 144: Check _TC2 (Thermal Constant 2). > +method Test 116 of 144: Test _TC2 (Thermal Constant 2). > method SKIPPED: Test 116, Skipping test for non-existant object > method _TC2. > method > -method Test 117 of 144: Check _TMP (Thermal Zone Current Temp). > +method Test 117 of 144: Test _TMP (Thermal Zone Current Temp). > method SKIPPED: Test 117, Skipping test for non-existant object > method _TMP. > method > -method Test 118 of 144: Check _TPT (Trip Point Temperature). > +method Test 118 of 144: Test _TPT (Trip Point Temperature). > method SKIPPED: Test 118, Skipping test for non-existant object > method _TPT. > method > -method Test 119 of 144: Check _TSP (Thermal Sampling Period). > +method Test 119 of 144: Test _TSP (Thermal Sampling Period). > method SKIPPED: Test 119, Skipping test for non-existant object > method _TSP. > method > -method Test 120 of 144: Check _TST (Temperature Sensor > -method Threshold). > +method Test 120 of 144: Test _TST (Temperature Sensor Threshold). > method SKIPPED: Test 120, Skipping test for non-existant object > method _TST. > method > -method Test 121 of 144: Check _TZP (Thermal Zone Polling). > +method Test 121 of 144: Test _TZP (Thermal Zone Polling). > method SKIPPED: Test 121, Skipping test for non-existant object > method _TZP. > method > -method Test 122 of 144: Check _PTS (Prepare to Sleep). > +method Test 122 of 144: Test _PTS (Prepare to Sleep). > method Test _PTS(1). > method PASSED: Test 122, \_PTS returned no values as expected. > method > @@ -774,35 +770,35 @@ method Test _PTS(5). > method PASSED: Test 122, \_PTS returned no values as expected. > method > method > -method Test 123 of 144: Check _TTS (Transition to State). > +method Test 123 of 144: Test _TTS (Transition to State). > method SKIPPED: Test 123, Optional control method _TTS does not > method exist. > method > -method Test 124 of 144: Check _S0 (System S0 State). > +method Test 124 of 144: Test _S0 (System S0 State). > method SKIPPED: Test 124, Skipping test for non-existant object > method _S0. > method > -method Test 125 of 144: Check _S1 (System S1 State). > +method Test 125 of 144: Test _S1 (System S1 State). > method SKIPPED: Test 125, Skipping test for non-existant object > method _S1. > method > -method Test 126 of 144: Check _S2 (System S2 State). > +method Test 126 of 144: Test _S2 (System S2 State). > method SKIPPED: Test 126, Skipping test for non-existant object > method _S2. > method > -method Test 127 of 144: Check _S3 (System S3 State). > +method Test 127 of 144: Test _S3 (System S3 State). > method SKIPPED: Test 127, Skipping test for non-existant object > method _S3. > method > -method Test 128 of 144: Check _S4 (System S4 State). > +method Test 128 of 144: Test _S4 (System S4 State). > method SKIPPED: Test 128, Skipping test for non-existant object > method _S4. > method > -method Test 129 of 144: Check _S5 (System S5 State). > +method Test 129 of 144: Test _S5 (System S5 State). > method SKIPPED: Test 129, Skipping test for non-existant object > method _S5. > method > -method Test 130 of 144: Check _WAK (System Wake). > +method Test 130 of 144: Test _WAK (System Wake). > method Test _WAK(1) System Wake, State S1. > method PASSED: Test 130, \_WAK correctly returned a sane looking > method package. > @@ -824,7 +820,7 @@ method PASSED: Test 130, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 131 of 144: Check _ADR (Return Unique ID for Device). > +method Test 131 of 144: Test _ADR (Return Unique ID for Device). > method PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > method PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned > @@ -936,7 +932,7 @@ method returned an integer. > method PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 132 of 144: Check _BCL (Query List of Brightness > +method Test 132 of 144: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > @@ -951,20 +947,20 @@ method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > method PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 133 of 144: Check _BCM (Set Brightness Level). > +method Test 133 of 144: Test _BCM (Set Brightness Level). > method PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > method PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 134 of 144: Check _BQC (Brightness Query Current > +method Test 134 of 144: Test _BQC (Brightness Query Current > method Level). > method PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > method PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 135 of 144: Check _DCS (Return the Status of Output > +method Test 135 of 144: Test _DCS (Return the Status of Output > method Device). > method PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > @@ -983,12 +979,12 @@ method returned an integer. > method PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 136 of 144: Check _DDC (Return the EDID for this > +method Test 136 of 144: Test _DDC (Return the EDID for this > method Device). > method SKIPPED: Test 136, Skipping test for non-existant object > method _DDC. > method > -method Test 137 of 144: Check _DSS (Device Set State). > +method Test 137 of 144: Test _DSS (Device Set State). > method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > @@ -1006,7 +1002,7 @@ method values as expected. > method PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 138 of 144: Check _DGS (Query Graphics State). > +method Test 138 of 144: Test _DGS (Query Graphics State). > method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > @@ -1024,8 +1020,8 @@ method returned an integer. > method PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 139 of 144: Check _DOD (Enumerate All Devices > -method Attached to Display Adapter). > +method Test 139 of 144: Test _DOD (Enumerate All Devices Attached > +method to Display Adapter). > method Device 0: > method Instance: 0 > method Display port attachment: 0 > @@ -1059,26 +1055,26 @@ method Head or pipe ID: 0 > method PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 140 of 144: Check _DOS (Enable/Disable Output > +method Test 140 of 144: Test _DOS (Enable/Disable Output > method Switching). > method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > method PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 141 of 144: Check _GPD (Get POST Device). > +method Test 141 of 144: Test _GPD (Get POST Device). > method SKIPPED: Test 141, Skipping test for non-existant object > method _GPD. > method > -method Test 142 of 144: Check _ROM (Get ROM Data). > +method Test 142 of 144: Test _ROM (Get ROM Data). > method SKIPPED: Test 142, Skipping test for non-existant object > method _ROM. > method > -method Test 143 of 144: Check _SPD (Set POST Device). > +method Test 143 of 144: Test _SPD (Set POST Device). > method SKIPPED: Test 143, Skipping test for non-existant object > method _SPD. > method > -method Test 144 of 144: Check _VPO (Video POST Options). > +method Test 144 of 144: Test _VPO (Video POST Options). > method SKIPPED: Test 144, Skipping test for non-existant object > method _VPO. > method > diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log > index 0540ba3..aca6243 100644 > --- a/wmi-0001/wmi-0001.log > +++ b/wmi-0001/wmi-0001.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.WMI1._WDG (1 of 9) > wmi GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7 > diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log > index ab5b704..1732e65 100644 > --- a/wmi-0001/wmi-0002.log > +++ b/wmi-0001/wmi-0002.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.ATKD._WDG (1 of 2) > wmi GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66 > diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log > index 5f4084d..f1e9aa3 100644 > --- a/wmi-0001/wmi-0003.log > +++ b/wmi-0001/wmi-0003.log > @@ -1,7 +1,7 @@ > wmi wmi: Extract and analyse Windows Management > wmi Instrumentation (WMI). > wmi ---------------------------------------------------------- > -wmi Test 1 of 1: Check Windows Management Instrumentation > +wmi Test 1 of 1: Windows Management Instrumentation test. > wmi > wmi \_SB_.AMW0._WDG (1 of 6) > wmi GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492 > -- > 1.8.3.2 > Acked-by: Keng-Yu Lin <kengyu@canonical.com>
diff --git a/acpitables-0001/acpitables-0001.log b/acpitables-0001/acpitables-0001.log index 2f05d15..57d8813 100644 --- a/acpitables-0001/acpitables-0001.log +++ b/acpitables-0001/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables PASSED: Test 1, Table APIC passed. acpitables Table ECDT not present to check. acpitables PASSED: Test 1, Table FACP passed. diff --git a/acpitables-0002/acpitables-0001.log b/acpitables-0002/acpitables-0001.log index 042c83e..22f07a2 100644 --- a/acpitables-0002/acpitables-0001.log +++ b/acpitables-0002/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables PASSED: Test 1, Table APIC passed. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/acpitables-0002/acpitables-0002.log b/acpitables-0002/acpitables-0002.log index db437af..c16d257 100644 --- a/acpitables-0002/acpitables-0002.log +++ b/acpitables-0002/acpitables-0002.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables FAILED [MEDIUM] MADTAPICFlagsNonZero: Test 1, MADT Local acpitables APIC flags field, bits 1..31 are reserved and should be acpitables zero, but are set as: f. diff --git a/acpitables-0003/acpitables-0001.log b/acpitables-0003/acpitables-0001.log index 2a4d63e..715978b 100644 --- a/acpitables-0003/acpitables-0001.log +++ b/acpitables-0003/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables FAILED [CRITICAL] FADTFACSZero: Test 1, FADT 32 bit diff --git a/acpitables-0004/acpitables-0001.log b/acpitables-0004/acpitables-0001.log index 52491c3..f33e083 100644 --- a/acpitables-0004/acpitables-0001.log +++ b/acpitables-0004/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/acpitables-0005/acpitables-0001.log b/acpitables-0005/acpitables-0001.log index cf09a01..2e97b45 100644 --- a/acpitables-0005/acpitables-0001.log +++ b/acpitables-0005/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/acpitables-0006/acpitables-0001.log b/acpitables-0006/acpitables-0001.log index 1c2633c..b931cf3 100644 --- a/acpitables-0006/acpitables-0001.log +++ b/acpitables-0006/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/acpitables-0007/acpitables-0001.log b/acpitables-0007/acpitables-0001.log index 3e02f91..5d17103 100644 --- a/acpitables-0007/acpitables-0001.log +++ b/acpitables-0007/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/acpitables-0008/acpitables-0001.log b/acpitables-0008/acpitables-0001.log index 1a127a6..80ecd20 100644 --- a/acpitables-0008/acpitables-0001.log +++ b/acpitables-0008/acpitables-0001.log @@ -1,6 +1,6 @@ -acpitables acpitables: ACPI table settings sanity checks. +acpitables acpitables: ACPI table settings sanity tests. acpitables ---------------------------------------------------------- -acpitables Test 1 of 1: Check ACPI tables. +acpitables Test 1 of 1: Test ACPI tables. acpitables Table APIC not present to check. acpitables Table ECDT not present to check. acpitables Table FACP not present to check. diff --git a/apicinstance-0001/apicinstance-0001.log b/apicinstance-0001/apicinstance-0001.log index a185d24..0fcec6e 100644 --- a/apicinstance-0001/apicinstance-0001.log +++ b/apicinstance-0001/apicinstance-0001.log @@ -1,7 +1,6 @@ -apicinstance apicinstance: Check for single instance of APIC/MADT -apicinstance table. +apicinstance apicinstance: Test for single instance of APIC/MADT table. apicinstance ---------------------------------------------------------- -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 apicinstance Found APIC/MADT table APIC @ bf6dff70, length 0x104 apicinstance (and differs from first APIC/MADT table). diff --git a/apicinstance-0001/apicinstance-0002.log b/apicinstance-0001/apicinstance-0002.log index 91fd42e..d3f2eb3 100644 --- a/apicinstance-0001/apicinstance-0002.log +++ b/apicinstance-0001/apicinstance-0002.log @@ -1,7 +1,6 @@ -apicinstance apicinstance: Check for single instance of APIC/MADT -apicinstance table. +apicinstance apicinstance: Test for single instance of APIC/MADT table. apicinstance ---------------------------------------------------------- -apicinstance Test 1 of 1: Check single instance of APIC/MADT table. +apicinstance Test 1 of 1: Test for single instance of APIC/MADT table. apicinstance Found APIC/MADT table APIC @ bf6dfcc6, length 0x104 apicinstance PASSED: Test 1, Found 1 APIC/MADT table(s), as expected. apicinstance diff --git a/arg-show-tests-0001/arg-show-tests-0001.log b/arg-show-tests-0001/arg-show-tests-0001.log index 06a7619..3068592 100644 --- a/arg-show-tests-0001/arg-show-tests-0001.log +++ b/arg-show-tests-0001/arg-show-tests-0001.log @@ -1,49 +1,49 @@ Batch tests: - acpiinfo General ACPI information check. - acpitables ACPI table settings sanity checks. - apicedge APIC Edge/Level Check. - apicinstance Check for single instance of APIC/MADT table. - aspm PCIe ASPM check. - bios32 Check BIOS32 Service Directory. + acpiinfo General ACPI information test. + acpitables ACPI table settings sanity tests. + apicedge APIC edge/level test. + apicinstance Test for single instance of APIC/MADT table. + aspm PCIe ASPM test. + bios32 BIOS32 Service Directory test. bios_info Gather BIOS DMI information. - checksum Check ACPI table checksum. + checksum ACPI table checksum test. cpufreq CPU frequency scaling tests. - crs Check PCI host bridge configuration using _CRS. - csm Check for UEFI Compatibility Support Module. - cstates Check processor C state support. - dmar Check sane DMA Remapping (VT-d). - dmicheck Test DMI/SMBIOS tables for errors. - ebda Validate EBDA region is mapped and reserved in memory map table. - fadt FADT SCI_EN enabled check. - fan Simple Fan Tests. - hda_audio Check HDA Audio Pin Configs. - hpet_check HPET configuration test. + crs Test PCI host bridge configuration using _CRS. + csm UEFI Compatibility Support Module test. + cstates Processor C state support test. + dmar DMA Remapping (VT-d) test. + dmicheck DMI/SMBIOS table tests. + ebda Test EBDA region is mapped and reserved in memory map table. + fadt FADT SCI_EN enabled tests. + fan Simple fan tests. + hda_audio HDA Audio Pin Configuration test. + hpet_check HPET configuration tests. klog Scan kernel log for errors and warnings. - maxfreq Check max CPU frequencies against max scaling frequency. - maxreadreq Checks firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. - mcfg MCFG PCI Express* memory mapped config space. - method ACPI DSDT Method Semantic Tests. - microcode Check if system is using latest microcode. - mpcheck Check MultiProcessor Tables. + maxfreq Test max CPU frequencies against max scaling frequency. + maxreadreq Test firmware has set PCI Express MaxReadReq to a higher value on non-motherboard devices. + mcfg MCFG PCI Express* memory mapped config space test. + method ACPI DSDT Method Semantic tests. + microcode Test if system is using latest microcode. + mpcheck MultiProcessor Tables tests. msr MSR register tests. - mtrr MTRR validation. + mtrr MTRR tests. nx Test if CPU NX is disabled by the BIOS. oops Scan kernel log for Oopses. os2gap OS/2 memory hole test. osilinux Disassemble DSDT to check for _OSI("Linux"). - pcc Processor Clocking Control (PCC) Test. - pciirq Check PCI IRQ Routing Table. - pnp Check BIOS Support Installation structure. + pcc Processor Clocking Control (PCC) test. + pciirq PCI IRQ Routing Table test. + pnp BIOS Support Installation structure test. securebootcert Ubuntu UEFI secure boot test. syntaxcheck Re-assemble DSDT and find syntax errors and warnings. version Gather kernel system information. - virt Test CPU Virtualisation Configuration. - wakealarm Test ACPI Wakealarm. + virt CPU Virtualisation Configuration test. + wakealarm ACPI Wakealarm tests. wmi Extract and analyse Windows Management Instrumentation (WMI). Interactive tests: ac_adapter Interactive ac_adapter power test. - battery Battery Tests. + battery Battery tests. brightness Interactive LCD brightness test. hotkey Hotkey scan code tests. lid Interactive lid button test. @@ -71,7 +71,7 @@ Unsafe tests: uefirtvariable UEFI Runtime service variable interface tests. UEFI tests: - csm Check for UEFI Compatibility Support Module. + csm UEFI Compatibility Support Module test. securebootcert Ubuntu UEFI secure boot test. uefirtmisc UEFI miscellaneous runtime service interface tests. uefirttime UEFI Runtime service time interface tests. diff --git a/arg-show-tests-full-0001/arg-show-tests-full-0001.log b/arg-show-tests-full-0001/arg-show-tests-full-0001.log index f6d3b89..c9c13c5 100644 --- a/arg-show-tests-full-0001/arg-show-tests-full-0001.log +++ b/arg-show-tests-full-0001/arg-show-tests-full-0001.log @@ -4,240 +4,240 @@ Batch tests: Determine machine's ACPI version. Determine AML compiler. acpitables (1 test): - Check ACPI tables. + Test ACPI tables. apicedge (1 test): - Legacy and PCI Interrupt Edge/Level trigger checks. + Legacy and PCI Interrupt Edge/Level trigger tests. apicinstance (1 test): - Check single instance of APIC/MADT table. + Test for single instance of APIC/MADT table. aspm (2 tests): PCIe ASPM ACPI test. PCIe ASPM registers test. bios32 (1 test): - Check BIOS32 Service Directory. + BIOS32 Service Directory test. bios_info (1 test): Gather BIOS DMI information checksum (1 test): - Check ACPI table checksums. + ACPI table checksum test. cpufreq (1 test): - CPU P-State Checks. + CPU P-State tests. crs (1 test): - Check PCI host bridge configuration using _CRS. + Test PCI host bridge configuration using _CRS. csm (1 test): - Check for UEFI Compatibility Support Module. + UEFI Compatibility Support Module test. cstates (1 test): - Check all CPUs C-states. + Test all CPUs C-states. dmar (1 test): - Check DMA Remapping. + DMA Remapping test. dmicheck (2 tests): - Find and Check SMBIOS Table Entry Point. + Find and test SMBIOS Table Entry Point. Test DMI/SMBIOS tables for errors. ebda (1 test): - Check EBDA is reserved in E820 table. + Test EBDA is reserved in E820 table. fadt (2 tests): - Check FADT SCI_EN bit is enabled. - Check FADT reset register. + Test FADT SCI_EN bit is enabled. + Test FADT reset register. fan (2 tests): - Check fan status. + Test fan status. Load system, check CPU fan status. hda_audio (1 test): - Check HDA Audio Pin Configs. + HDA Audio Pin Configuration test. hpet_check (4 tests): - Check HPET base in kernel log. - Check HPET base in HPET table. - Check HPET base in DSDT and/or SSDT. - Sanity check HPET configuration. + Test HPET base in kernel log. + Test HPET base in HPET table. + Test HPET base in DSDT and/or SSDT. + Test HPET configuration. klog (1 test): Kernel log error check. maxfreq (1 test): - Maximum CPU frequency check. + Maximum CPU frequency test. maxreadreq (1 test): - Check firmware settings MaxReadReq for PCI Express devices. + Test firmware settings MaxReadReq for PCI Express devices. mcfg (2 tests): Validate MCFG table. Validate MCFG PCI config space. method (144 tests): - Check Method Names. - Check _AEI. - Check _DDN (DOS Device Name). - Check _HID (Hardware ID). - Check _HRV (Hardware Revision Number). - Check _PLD (Physical Device Location). - Check _SUB (Subsystem ID). - Check _SUN (Slot User Number). - Check _STR (String). - Check _UID (Unique ID). - Check _CRS (Current Resource Settings). - Check _DIS (Disable). - Check _DMA (Direct Memory Access). - Check _FIX (Fixed Register Resource Provider). - Check _GSB (Global System Interrupt Base). - Check _HPP (Hot Plug Parameters). - Check _PRS (Possible Resource Settings). - Check _PXM (Proximity). - Check _EDL (Eject Device List). - Check _EJD (Ejection Dependent Device). - Check _EJ0 (Eject). - Check _EJ1 (Eject). - Check _EJ2 (Eject). - Check _EJ3 (Eject). - Check _EJ4 (Eject). - Check _LCK (Lock). - Check _RMV (Remove). - Check _STA (Status). - Check _BDN (BIOS Dock Name). - Check _BBN (Base Bus Number). - Check _DCK (Dock). - Check _INI (Initialize). - Check _SEG (Segment). - Check _OFF (Set resource off). - Check _ON (Set resource on). - Check _DSW (Device Sleep Wake). - Check _IRC (In Rush Current). - Check _PRE (Power Resources for Enumeration). - Check _PR0 (Power Resources for D0). - Check _PR1 (Power Resources for D1). - Check _PR2 (Power Resources for D2). - Check _PR3 (Power Resources for D3). - Check _PS0 (Power State 0). - Check _PS1 (Power State 1). - Check _PS2 (Power State 2). - Check _PS3 (Power State 3). - Check _PSC (Power State Current). - Check _PSE (Power State for Enumeration). - Check _PSW (Power State Wake). - Check _S1D (S1 Device State). - Check _S2D (S2 Device State). - Check _S3D (S3 Device State). - Check _S4D (S4 Device State). - Check _S0W (S0 Device Wake State). - Check _S1W (S1 Device Wake State). - Check _S2W (S2 Device Wake State). - Check _S3W (S3 Device Wake State). - Check _S4W (S4 Device Wake State). - Check _S0_ (S0 System State). - Check _S1_ (S1 System State). - Check _S2_ (S2 System State). - Check _S3_ (S3 System State). - Check _S4_ (S4 System State). - Check _S5_ (S5 System State). - Check _SWS (System Wake Source). - Check _PSS (Performance Supported States). - Check _CPC (Continuous Performance Control). - Check _CSD (C State Dependencies). - Check _CST (C States). - Check _PCT (Performance Control). - Check _PDL (P-State Depth Limit). - Check _PPC (Performance Present Capabilities). - Check _PPE (Polling for Platform Error). - Check _TDL (T-State Depth Limit). - Check _TPC (Throttling Present Capabilities). - Check _TSD (Throttling State Dependencies). - Check _TSS (Throttling Supported States). - Check _ALC (Ambient Light Colour Chromaticity). - Check _ALI (Ambient Light Illuminance). - Check _ALT (Ambient Light Temperature). - Check _ALP (Ambient Light Polling). - Check _LID (Lid Status). - Check _GCP (Get Capabilities). - Check _GRT (Get Real Time). - Check _GWS (Get Wake Status). - Check _STP (Set Expired Timer Wake Policy). - Check _STV (Set Timer Value). - Check _TIP (Expired Timer Wake Policy). - Check _TIV (Timer Values). - Check _SBS (Smart Battery Subsystem). - Check _BCT (Battery Charge Time). - Check _BIF (Battery Information). - Check _BIX (Battery Information Extended). - Check _BMA (Battery Measurement Averaging). - Check _BMC (Battery Maintenance Control). - Check _BMD (Battery Maintenance Data). - Check _BMS (Battery Measurement Sampling Time). - Check _BST (Battery Status). - Check _BTP (Battery Trip Point). - Check _BTM (Battery Time). - Check _PCL (Power Consumer List). - Check _PIF (Power Source Information). - Check _PSR (Power Source). - Check _FIF (Fan Information). - Check _FSL (Fan Set Level). - Check _FST (Fan Status). - Check _ACx (Active Cooling). - Check _CRT (Critical Trip Point). - Check _DTI (Device Temperature Indication). - Check _HOT (Hot Temperature). - Check _NTT (Notification Temp Threshold). - Check _PSV (Passive Temp). - Check _RTV (Relative Temp Values). - Check _SCP (Set Cooling Policy). - Check _TC1 (Thermal Constant 1). - Check _TC2 (Thermal Constant 2). - Check _TMP (Thermal Zone Current Temp). - Check _TPT (Trip Point Temperature). - Check _TSP (Thermal Sampling Period). - Check _TST (Temperature Sensor Threshold). - Check _TZP (Thermal Zone Polling). - Check _PTS (Prepare to Sleep). - Check _TTS (Transition to State). - Check _S0 (System S0 State). - Check _S1 (System S1 State). - Check _S2 (System S2 State). - Check _S3 (System S3 State). - Check _S4 (System S4 State). - Check _S5 (System S5 State). - Check _WAK (System Wake). - Check _ADR (Return Unique ID for Device). - Check _BCL (Query List of Brightness Control Levels Supported). - Check _BCM (Set Brightness Level). - Check _BQC (Brightness Query Current Level). - Check _DCS (Return the Status of Output Device). - Check _DDC (Return the EDID for this Device). - Check _DSS (Device Set State). - Check _DGS (Query Graphics State). - Check _DOD (Enumerate All Devices Attached to Display Adapter). - Check _DOS (Enable/Disable Output Switching). - Check _GPD (Get POST Device). - Check _ROM (Get ROM Data). - Check _SPD (Set POST Device). - Check _VPO (Video POST Options). + Test Method Names. + Test _AEI. + Test _DDN (DOS Device Name). + Test _HID (Hardware ID). + Test _HRV (Hardware Revision Number). + Test _PLD (Physical Device Location). + Test _SUB (Subsystem ID). + Test _SUN (Slot User Number). + Test _STR (String). + Test _UID (Unique ID). + Test _CRS (Current Resource Settings). + Test _DIS (Disable). + Test _DMA (Direct Memory Access). + Test _FIX (Fixed Register Resource Provider). + Test _GSB (Global System Interrupt Base). + Test _HPP (Hot Plug Parameters). + Test _PRS (Possible Resource Settings). + Test _PXM (Proximity). + Test _EDL (Eject Device List). + Test _EJD (Ejection Dependent Device). + Test _EJ0 (Eject). + Test _EJ1 (Eject). + Test _EJ2 (Eject). + Test _EJ3 (Eject). + Test _EJ4 (Eject). + Test _LCK (Lock). + Test _RMV (Remove). + Test _STA (Status). + Test _BDN (BIOS Dock Name). + Test _BBN (Base Bus Number). + Test _DCK (Dock). + Test _INI (Initialize). + Test _SEG (Segment). + Test _OFF (Set resource off). + Test _ON (Set resource on). + Test _DSW (Device Sleep Wake). + Test _IRC (In Rush Current). + Test _PRE (Power Resources for Enumeration). + Test _PR0 (Power Resources for D0). + Test _PR1 (Power Resources for D1). + Test _PR2 (Power Resources for D2). + Test _PR3 (Power Resources for D3). + Test _PS0 (Power State 0). + Test _PS1 (Power State 1). + Test _PS2 (Power State 2). + Test _PS3 (Power State 3). + Test _PSC (Power State Current). + Test _PSE (Power State for Enumeration). + Test _PSW (Power State Wake). + Test _S1D (S1 Device State). + Test _S2D (S2 Device State). + Test _S3D (S3 Device State). + Test _S4D (S4 Device State). + Test _S0W (S0 Device Wake State). + Test _S1W (S1 Device Wake State). + Test _S2W (S2 Device Wake State). + Test _S3W (S3 Device Wake State). + Test _S4W (S4 Device Wake State). + Test _S0_ (S0 System State). + Test _S1_ (S1 System State). + Test _S2_ (S2 System State). + Test _S3_ (S3 System State). + Test _S4_ (S4 System State). + Test _S5_ (S5 System State). + Test _SWS (System Wake Source). + Test _PSS (Performance Supported States). + Test _CPC (Continuous Performance Control). + Test _CSD (C State Dependencies). + Test _CST (C States). + Test _PCT (Performance Control). + Test _PDL (P-State Depth Limit). + Test _PPC (Performance Present Capabilities). + Test _PPE (Polling for Platform Error). + Test _TDL (T-State Depth Limit). + Test _TPC (Throttling Present Capabilities). + Test _TSD (Throttling State Dependencies). + Test _TSS (Throttling Supported States). + Test _ALC (Ambient Light Colour Chromaticity). + Test _ALI (Ambient Light Illuminance). + Test _ALT (Ambient Light Temperature). + Test _ALP (Ambient Light Polling). + Test _LID (Lid Status). + Test _GCP (Get Capabilities). + Test _GRT (Get Real Time). + Test _GWS (Get Wake Status). + Test _STP (Set Expired Timer Wake Policy). + Test _STV (Set Timer Value). + Test _TIP (Expired Timer Wake Policy). + Test _TIV (Timer Values). + Test _SBS (Smart Battery Subsystem). + Test _BCT (Battery Charge Time). + Test _BIF (Battery Information). + Test _BIX (Battery Information Extended). + Test _BMA (Battery Measurement Averaging). + Test _BMC (Battery Maintenance Control). + Test _BMD (Battery Maintenance Data). + Test _BMS (Battery Measurement Sampling Time). + Test _BST (Battery Status). + Test _BTP (Battery Trip Point). + Test _BTM (Battery Time). + Test _PCL (Power Consumer List). + Test _PIF (Power Source Information). + Test _PSR (Power Source). + Test _FIF (Fan Information). + Test _FSL (Fan Set Level). + Test _FST (Fan Status). + Test _ACx (Active Cooling). + Test _CRT (Critical Trip Point). + Test _DTI (Device Temperature Indication). + Test _HOT (Hot Temperature). + Test _NTT (Notification Temp Threshold). + Test _PSV (Passive Temp). + Test _RTV (Relative Temp Values). + Test _SCP (Set Cooling Policy). + Test _TC1 (Thermal Constant 1). + Test _TC2 (Thermal Constant 2). + Test _TMP (Thermal Zone Current Temp). + Test _TPT (Trip Point Temperature). + Test _TSP (Thermal Sampling Period). + Test _TST (Temperature Sensor Threshold). + Test _TZP (Thermal Zone Polling). + Test _PTS (Prepare to Sleep). + Test _TTS (Transition to State). + Test _S0 (System S0 State). + Test _S1 (System S1 State). + Test _S2 (System S2 State). + Test _S3 (System S3 State). + Test _S4 (System S4 State). + Test _S5 (System S5 State). + Test _WAK (System Wake). + Test _ADR (Return Unique ID for Device). + Test _BCL (Query List of Brightness Control Levels Supported). + Test _BCM (Set Brightness Level). + Test _BQC (Brightness Query Current Level). + Test _DCS (Return the Status of Output Device). + Test _DDC (Return the EDID for this Device). + Test _DSS (Device Set State). + Test _DGS (Query Graphics State). + Test _DOD (Enumerate All Devices Attached to Display Adapter). + Test _DOS (Enable/Disable Output Switching). + Test _GPD (Get POST Device). + Test _ROM (Get ROM Data). + Test _SPD (Set POST Device). + Test _VPO (Video POST Options). microcode (1 test): - Check for most recent microcode being loaded. + Test for most recent microcode being loaded. mpcheck (9 tests): - Check MP header. - Check MP CPU entries. - Check MP Bus entries. - Check MP IO APIC entries. - Check MP IO Interrupt entries. - Check MP Local Interrupt entries. - Check MP System Address entries. - Check MP Bus Hierarchy entries. - Check MP Compatible Bus Address Space entries. + Test MP header. + Test MP CPU entries. + Test MP Bus entries. + Test MP IO APIC entries. + Test MP IO Interrupt entries. + Test MP Local Interrupt entries. + Test MP System Address entries. + Test MP Bus Hierarchy entries. + Test MP Compatible Bus Address Space entries. msr (5 tests): - Check CPU generic MSRs. - Check CPU specific model MSRs. - Check all P State Ratios. - Check C1 and C3 autodemotion. - Check SMRR MSR registers. + Test CPU generic MSRs. + Test CPU specific model MSRs. + Test all P State Ratios. + Test C1 and C3 autodemotion. + Test SMRR MSR registers. mtrr (3 tests): Validate the kernel MTRR IOMEM setup. Validate the MTRR setup across all processors. - Check for AMD MtrrFixDramModEn being cleared by the BIOS. + Test for AMD MtrrFixDramModEn being cleared by the BIOS. nx (3 tests): - Check CPU NX capability. - Check all CPUs have same BIOS set NX flag. - Check all CPUs have same msr setting in MSR 0x1a0. + Test CPU NX capability. + Test all CPUs have same BIOS set NX flag. + Test all CPUs have same msr setting in MSR 0x1a0. oops (1 test): Kernel log oops check. os2gap (1 test): - Check the OS/2 15Mb memory hole is absent. + Test the OS/2 15Mb memory hole is absent. osilinux (1 test): Disassemble DSDT to check for _OSI("Linux"). pcc (1 test): - Check PCCH. + Processor Clocking Control (PCC) test. pciirq (1 test): - PCI IRQ Routing Table. + PCI IRQ Routing Table test. pnp (1 test): - Check PnP BIOS Support Installation structure. + PnP BIOS Support Installation structure test. securebootcert (1 test): Ubuntu UEFI secure boot test. syntaxcheck (2 tests): @@ -249,14 +249,14 @@ Batch tests: Gather kernel boot command line. Gather ACPI driver version. virt (1 test): - Check CPU Virtualisation Configuration. + CPU Virtualisation Configuration test. wakealarm (4 tests): - Check existence of /sys/class/rtc/rtc0/wakealarm. + Test existence of /sys/class/rtc/rtc0/wakealarm. Trigger wakealarm for 1 seconds in the future. - Check if wakealarm is fired. + Test if wakealarm is fired. Multiple wakealarm firing tests. wmi (1 test): - Check Windows Management Instrumentation + Windows Management Instrumentation test. Interactive tests: ac_adapter (3 tests): @@ -264,13 +264,13 @@ Interactive tests: Test ac_adapter initial on-line state. Test ac_adapter state changes. battery (1 test): - Check batteries. + Battery test. brightness (5 tests): - Check for maximum and actual brightness. + Test for maximum and actual brightness. Change actual brightness. Observe all brightness changes. Observe min, max brightness changes. - Check brightness hotkeys. + Test brightness hotkeys. hotkey (1 test): Hotkey keypress checks. lid (3 tests): @@ -328,7 +328,7 @@ Unsafe tests: UEFI tests: csm (1 test): - Check for UEFI Compatibility Support Module. + UEFI Compatibility Support Module test. securebootcert (1 test): Ubuntu UEFI secure boot test. uefirtmisc (2 tests): diff --git a/checksum-0001/checksum-0001.log b/checksum-0001/checksum-0001.log index 4efca9b..d720e06 100644 --- a/checksum-0001/checksum-0001.log +++ b/checksum-0001/checksum-0001.log @@ -1,6 +1,6 @@ -checksum checksum: Check ACPI table checksum. +checksum checksum: ACPI table checksum test. checksum -------------------------------------------------------------------------------------------------- -checksum Test 1 of 1: Check ACPI table checksums. +checksum Test 1 of 1: ACPI table checksum test. checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. checksum PASSED: Test 1, Table FACP has correct checksum 0x52. checksum PASSED: Test 1, Table APIC has correct checksum 0xcc. diff --git a/checksum-0001/checksum-0003.log b/checksum-0001/checksum-0003.log index 75925bb..4ab586a 100644 --- a/checksum-0001/checksum-0003.log +++ b/checksum-0001/checksum-0003.log @@ -1,6 +1,6 @@ -checksum checksum: Check ACPI table checksum. +checksum checksum: ACPI table checksum test. checksum -------------------------------------------------------------------------------------------------- -checksum Test 1 of 1: Check ACPI table checksums. +checksum Test 1 of 1: ACPI table checksum test. checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table DSDT has incorrect checksum, expected 0x11, got checksum 0x10. checksum diff --git a/checksum-0001/checksum-0004.log b/checksum-0001/checksum-0004.log index d092674..f69a42a 100644 --- a/checksum-0001/checksum-0004.log +++ b/checksum-0001/checksum-0004.log @@ -1,6 +1,6 @@ -checksum checksum: Check ACPI table checksum. +checksum checksum: ACPI table checksum test. checksum -------------------------------------------------------------------------------------------------- -checksum Test 1 of 1: Check ACPI table checksums. +checksum Test 1 of 1: ACPI table checksum test. checksum PASSED: Test 1, Table DSDT has correct checksum 0x11. checksum FAILED [MEDIUM] ACPITableChecksum: Test 1, Table FACP has incorrect checksum, expected 0x52, got checksum 0x53. diff --git a/method-0001/method-0001.log b/method-0001/method-0001.log index e41aa26..bf2c976 100644 --- a/method-0001/method-0001.log +++ b/method-0001/method-0001.log @@ -1,18 +1,18 @@ -method method: ACPI DSDT Method Semantic Tests. +method method: ACPI DSDT Method Semantic tests. method ---------------------------------------------------------- -method Test 1 of 144: Check Method Names. +method Test 1 of 144: Test Method Names. method Found 1061 Objects method PASSED: Test 1, Method names contain legal characters. method -method Test 2 of 144: Check _AEI. +method Test 2 of 144: Test _AEI. method SKIPPED: Test 2, Skipping test for non-existant object method _AEI. method -method Test 3 of 144: Check _DDN (DOS Device Name). +method Test 3 of 144: Test _DDN (DOS Device Name). method SKIPPED: Test 3, Skipping test for non-existant object method _DDN. method -method Test 4 of 144: Check _HID (Hardware ID). +method Test 4 of 144: Test _HID (Hardware ID). method PASSED: Test 4, \_SB_.AMW0._HID returned a string method 'PNP0C14' as expected. method PASSED: Test 4, \_SB_.LID0._HID returned an integer @@ -66,27 +66,27 @@ method integer 0x0303d041 (EISA ID PNP0303). method PASSED: Test 4, \_SB_.PCI0.LPCB.PS2M._HID returned an method integer 0x130fd041 (EISA ID PNP0F13). method -method Test 5 of 144: Check _HRV (Hardware Revision Number). +method Test 5 of 144: Test _HRV (Hardware Revision Number). method SKIPPED: Test 5, Skipping test for non-existant object method _HRV. method -method Test 6 of 144: Check _PLD (Physical Device Location). +method Test 6 of 144: Test _PLD (Physical Device Location). method SKIPPED: Test 6, Skipping test for non-existant object method _PLD. method -method Test 7 of 144: Check _SUB (Subsystem ID). +method Test 7 of 144: Test _SUB (Subsystem ID). method SKIPPED: Test 7, Skipping test for non-existant object method _SUB. method -method Test 8 of 144: Check _SUN (Slot User Number). +method Test 8 of 144: Test _SUN (Slot User Number). method SKIPPED: Test 8, Skipping test for non-existant object method _SUN. method -method Test 9 of 144: Check _STR (String). +method Test 9 of 144: Test _STR (String). method SKIPPED: Test 9, Skipping test for non-existant object method _STR. method -method Test 10 of 144: Check _UID (Unique ID). +method Test 10 of 144: Test _UID (Unique ID). method PASSED: Test 10, \_SB_.AMW0._UID correctly returned sane method looking value 0x00000000. method PASSED: Test 10, \_SB_.PCI0.PDRC._UID correctly returned @@ -112,7 +112,7 @@ method returned sane looking value 0x00000002. method PASSED: Test 10, \_SB_.PCI0.LPCB.BAT1._UID correctly method returned sane looking value 0x00000001. method -method Test 11 of 144: Check _CRS (Current Resource Settings). +method Test 11 of 144: Test _CRS (Current Resource Settings). method PASSED: Test 11, \_SB_.PCI0._CRS (WORD Address Space method Descriptor) looks sane. method PASSED: Test 11, \_SB_.PCI0.PDRC._CRS (32-bit Fixed @@ -156,7 +156,7 @@ method Descriptor) looks sane. method PASSED: Test 11, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ method Descriptor) looks sane. method -method Test 12 of 144: Check _DIS (Disable). +method Test 12 of 144: Test _DIS (Disable). method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKA._DIS returned no method values as expected. method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKB._DIS returned no @@ -174,24 +174,24 @@ method values as expected. method PASSED: Test 12, \_SB_.PCI0.LPCB.LNKH._DIS returned no method values as expected. method -method Test 13 of 144: Check _DMA (Direct Memory Access). +method Test 13 of 144: Test _DMA (Direct Memory Access). method SKIPPED: Test 13, Skipping test for non-existant object method _DMA. method -method Test 14 of 144: Check _FIX (Fixed Register Resource +method Test 14 of 144: Test _FIX (Fixed Register Resource method Provider). method SKIPPED: Test 14, Skipping test for non-existant object method _FIX. method -method Test 15 of 144: Check _GSB (Global System Interrupt Base). +method Test 15 of 144: Test _GSB (Global System Interrupt Base). method SKIPPED: Test 15, Skipping test for non-existant object method _GSB. method -method Test 16 of 144: Check _HPP (Hot Plug Parameters). +method Test 16 of 144: Test _HPP (Hot Plug Parameters). method SKIPPED: Test 16, Skipping test for non-existant object method _HPP. method -method Test 17 of 144: Check _PRS (Possible Resource Settings). +method Test 17 of 144: Test _PRS (Possible Resource Settings). method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ method Descriptor) looks sane. method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ @@ -209,47 +209,47 @@ method Descriptor) looks sane. method PASSED: Test 17, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ method Descriptor) looks sane. method -method Test 18 of 144: Check _PXM (Proximity). +method Test 18 of 144: Test _PXM (Proximity). method SKIPPED: Test 18, Skipping test for non-existant object method _PXM. method -method Test 19 of 144: Check _EDL (Eject Device List). +method Test 19 of 144: Test _EDL (Eject Device List). method SKIPPED: Test 19, Skipping test for non-existant object method _EDL. method -method Test 20 of 144: Check _EJD (Ejection Dependent Device). +method Test 20 of 144: Test _EJD (Ejection Dependent Device). method SKIPPED: Test 20, Skipping test for non-existant object method _EJD. method -method Test 21 of 144: Check _EJ0 (Eject). +method Test 21 of 144: Test _EJ0 (Eject). method SKIPPED: Test 21, Skipping test for non-existant object method _EJ0. method -method Test 22 of 144: Check _EJ1 (Eject). +method Test 22 of 144: Test _EJ1 (Eject). method SKIPPED: Test 22, Skipping test for non-existant object method _EJ1. method -method Test 23 of 144: Check _EJ2 (Eject). +method Test 23 of 144: Test _EJ2 (Eject). method SKIPPED: Test 23, Skipping test for non-existant object method _EJ2. method -method Test 24 of 144: Check _EJ3 (Eject). +method Test 24 of 144: Test _EJ3 (Eject). method SKIPPED: Test 24, Skipping test for non-existant object method _EJ3. method -method Test 25 of 144: Check _EJ4 (Eject). +method Test 25 of 144: Test _EJ4 (Eject). method SKIPPED: Test 25, Skipping test for non-existant object method _EJ4. method -method Test 26 of 144: Check _LCK (Lock). +method Test 26 of 144: Test _LCK (Lock). method SKIPPED: Test 26, Skipping test for non-existant object method _LCK. method -method Test 27 of 144: Check _RMV (Remove). +method Test 27 of 144: Test _RMV (Remove). method PASSED: Test 27, \_SB_.PCI0.RP03.PXSX._RMV correctly method returned sane looking value 0x00000001. method -method Test 28 of 144: Check _STA (Status). +method Test 28 of 144: Test _STA (Status). method PASSED: Test 28, \_SB_.PCI0.PEGP.VGA_._STA correctly method returned sane looking value 0x0000000f. method PASSED: Test 28, \_SB_.PCI0.LPCB.LNKA._STA correctly @@ -273,91 +273,91 @@ method returned sane looking value 0x00000000. method PASSED: Test 28, \_SB_.PCI0.LPCB.BAT1._STA correctly method returned sane looking value 0x0000001f. method -method Test 29 of 144: Check _BDN (BIOS Dock Name). +method Test 29 of 144: Test _BDN (BIOS Dock Name). method SKIPPED: Test 29, Skipping test for non-existant object method _BDN. method -method Test 30 of 144: Check _BBN (Base Bus Number). +method Test 30 of 144: Test _BBN (Base Bus Number). method SKIPPED: Test 30, Skipping test for non-existant object method _BBN. method -method Test 31 of 144: Check _DCK (Dock). +method Test 31 of 144: Test _DCK (Dock). method SKIPPED: Test 31, Skipping test for non-existant object method _DCK. method -method Test 32 of 144: Check _INI (Initialize). +method Test 32 of 144: Test _INI (Initialize). method PASSED: Test 32, \_SB_._INI returned no values as method expected. method -method Test 33 of 144: Check _SEG (Segment). +method Test 33 of 144: Test _SEG (Segment). method SKIPPED: Test 33, Skipping test for non-existant object method _SEG. method -method Test 34 of 144: Check _OFF (Set resource off). +method Test 34 of 144: Test _OFF (Set resource off). method SKIPPED: Test 34, Skipping test for non-existant object method _OFF. method -method Test 35 of 144: Check _ON (Set resource on). +method Test 35 of 144: Test _ON (Set resource on). method SKIPPED: Test 35, Skipping test for non-existant object method _ON. method -method Test 36 of 144: Check _DSW (Device Sleep Wake). +method Test 36 of 144: Test _DSW (Device Sleep Wake). method SKIPPED: Test 36, Skipping test for non-existant object method _DSW. method -method Test 37 of 144: Check _IRC (In Rush Current). +method Test 37 of 144: Test _IRC (In Rush Current). method SKIPPED: Test 37, Skipping test for non-existant object method _IRC. method -method Test 38 of 144: Check _PRE (Power Resources for +method Test 38 of 144: Test _PRE (Power Resources for method Enumeration). method SKIPPED: Test 38, Skipping test for non-existant object method _PRE. method -method Test 39 of 144: Check _PR0 (Power Resources for D0). +method Test 39 of 144: Test _PR0 (Power Resources for D0). method SKIPPED: Test 39, Skipping test for non-existant object method _PR0. method -method Test 40 of 144: Check _PR1 (Power Resources for D1). +method Test 40 of 144: Test _PR1 (Power Resources for D1). method SKIPPED: Test 40, Skipping test for non-existant object method _PR1. method -method Test 41 of 144: Check _PR2 (Power Resources for D2). +method Test 41 of 144: Test _PR2 (Power Resources for D2). method SKIPPED: Test 41, Skipping test for non-existant object method _PR2. method -method Test 42 of 144: Check _PR3 (Power Resources for D3). +method Test 42 of 144: Test _PR3 (Power Resources for D3). method SKIPPED: Test 42, Skipping test for non-existant object method _PR3. method -method Test 43 of 144: Check _PS0 (Power State 0). +method Test 43 of 144: Test _PS0 (Power State 0). method PASSED: Test 43, \_SB_.PCI0.PEGP.VGA_._PS0 returned no method values as expected. method PASSED: Test 43, \_PS0 returned no values as expected. method -method Test 44 of 144: Check _PS1 (Power State 1). +method Test 44 of 144: Test _PS1 (Power State 1). method PASSED: Test 44, \_SB_.PCI0.PEGP.VGA_._PS1 returned no method values as expected. method -method Test 45 of 144: Check _PS2 (Power State 2). +method Test 45 of 144: Test _PS2 (Power State 2). method SKIPPED: Test 45, Skipping test for non-existant object method _PS2. method -method Test 46 of 144: Check _PS3 (Power State 3). +method Test 46 of 144: Test _PS3 (Power State 3). method PASSED: Test 46, \_SB_.PCI0.PEGP.VGA_._PS3 returned no method values as expected. method PASSED: Test 46, \_PS3 returned no values as expected. method -method Test 47 of 144: Check _PSC (Power State Current). +method Test 47 of 144: Test _PSC (Power State Current). method PASSED: Test 47, \_SB_.PCI0.PEGP.VGA_._PSC correctly method returned an integer. method PASSED: Test 47, \_PSC correctly returned an integer. method -method Test 48 of 144: Check _PSE (Power State for Enumeration). +method Test 48 of 144: Test _PSE (Power State for Enumeration). method SKIPPED: Test 48, Skipping test for non-existant object method _PSE. method -method Test 49 of 144: Check _PSW (Power State Wake). +method Test 49 of 144: Test _PSW (Power State Wake). method PASSED: Test 49, \_SB_.PCI0.USB1._PSW returned no values method as expected. method PASSED: Test 49, \_SB_.PCI0.USB2._PSW returned no values @@ -369,15 +369,15 @@ method as expected. method PASSED: Test 49, \_SB_.PCI0.USB5._PSW returned no values method as expected. method -method Test 50 of 144: Check _S1D (S1 Device State). +method Test 50 of 144: Test _S1D (S1 Device State). method SKIPPED: Test 50, Skipping test for non-existant object method _S1D. method -method Test 51 of 144: Check _S2D (S2 Device State). +method Test 51 of 144: Test _S2D (S2 Device State). method SKIPPED: Test 51, Skipping test for non-existant object method _S2D. method -method Test 52 of 144: Check _S3D (S3 Device State). +method Test 52 of 144: Test _S3D (S3 Device State). method PASSED: Test 52, \_SB_.PCI0._S3D correctly returned an method integer. method PASSED: Test 52, \_SB_.PCI0.USB1._S3D correctly returned @@ -395,7 +395,7 @@ method an integer. method PASSED: Test 52, \_SB_.PCI0.EHC2._S3D correctly returned method an integer. method -method Test 53 of 144: Check _S4D (S4 Device State). +method Test 53 of 144: Test _S4D (S4 Device State). method PASSED: Test 53, \_SB_.PCI0._S4D correctly returned an method integer. method PASSED: Test 53, \_SB_.PCI0.USB1._S4D correctly returned @@ -413,115 +413,114 @@ method an integer. method PASSED: Test 53, \_SB_.PCI0.EHC2._S4D correctly returned method an integer. method -method Test 54 of 144: Check _S0W (S0 Device Wake State). +method Test 54 of 144: Test _S0W (S0 Device Wake State). method SKIPPED: Test 54, Skipping test for non-existant object method _S0W. method -method Test 55 of 144: Check _S1W (S1 Device Wake State). +method Test 55 of 144: Test _S1W (S1 Device Wake State). method SKIPPED: Test 55, Skipping test for non-existant object method _S1W. method -method Test 56 of 144: Check _S2W (S2 Device Wake State). +method Test 56 of 144: Test _S2W (S2 Device Wake State). method SKIPPED: Test 56, Skipping test for non-existant object method _S2W. method -method Test 57 of 144: Check _S3W (S3 Device Wake State). +method Test 57 of 144: Test _S3W (S3 Device Wake State). method SKIPPED: Test 57, Skipping test for non-existant object method _S3W. method -method Test 58 of 144: Check _S4W (S4 Device Wake State). +method Test 58 of 144: Test _S4W (S4 Device Wake State). method SKIPPED: Test 58, Skipping test for non-existant object method _S4W. method -method Test 59 of 144: Check _S0_ (S0 System State). +method Test 59 of 144: Test _S0_ (S0 System State). method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 method PASSED: Test 59, \_S0_ correctly returned a sane looking method package. method -method Test 60 of 144: Check _S1_ (S1 System State). +method Test 60 of 144: Test _S1_ (S1 System State). method SKIPPED: Test 60, Skipping test for non-existant object method _S1_. method -method Test 61 of 144: Check _S2_ (S2 System State). +method Test 61 of 144: Test _S2_ (S2 System State). method SKIPPED: Test 61, Skipping test for non-existant object method _S2_. method -method Test 62 of 144: Check _S3_ (S3 System State). +method Test 62 of 144: Test _S3_ (S3 System State). method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 method PASSED: Test 62, \_S3_ correctly returned a sane looking method package. method -method Test 63 of 144: Check _S4_ (S4 System State). +method Test 63 of 144: Test _S4_ (S4 System State). method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 method PASSED: Test 63, \_S4_ correctly returned a sane looking method package. method -method Test 64 of 144: Check _S5_ (S5 System State). +method Test 64 of 144: Test _S5_ (S5 System State). method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 method PASSED: Test 64, \_S5_ correctly returned a sane looking method package. method -method Test 65 of 144: Check _SWS (System Wake Source). +method Test 65 of 144: Test _SWS (System Wake Source). method SKIPPED: Test 65, Skipping test for non-existant object method _SWS. method -method Test 66 of 144: Check _PSS (Performance Supported States). +method Test 66 of 144: Test _PSS (Performance Supported States). method SKIPPED: Test 66, Skipping test for non-existant object method _PSS. method -method Test 67 of 144: Check _CPC (Continuous Performance +method Test 67 of 144: Test _CPC (Continuous Performance method Control). method SKIPPED: Test 67, Skipping test for non-existant object method _CPC. method -method Test 68 of 144: Check _CSD (C State Dependencies). +method Test 68 of 144: Test _CSD (C State Dependencies). method SKIPPED: Test 68, Skipping test for non-existant object method _CSD. method -method Test 69 of 144: Check _CST (C States). +method Test 69 of 144: Test _CST (C States). method SKIPPED: Test 69, Skipping test for non-existant object method _CST. method -method Test 70 of 144: Check _PCT (Performance Control). +method Test 70 of 144: Test _PCT (Performance Control). method SKIPPED: Test 70, Skipping test for non-existant object method _PCT. method -method Test 71 of 144: Check _PDL (P-State Depth Limit). +method Test 71 of 144: Test _PDL (P-State Depth Limit). method SKIPPED: Test 71, Skipping test for non-existant object method _PDL. method -method Test 72 of 144: Check _PPC (Performance Present +method Test 72 of 144: Test _PPC (Performance Present method Capabilities). method SKIPPED: Test 72, Skipping test for non-existant object method _PPC. method -method Test 73 of 144: Check _PPE (Polling for Platform Error). +method Test 73 of 144: Test _PPE (Polling for Platform Error). method SKIPPED: Test 73, Skipping test for non-existant object method _PPE. method -method Test 74 of 144: Check _TDL (T-State Depth Limit). +method Test 74 of 144: Test _TDL (T-State Depth Limit). method SKIPPED: Test 74, Skipping test for non-existant object method _TDL. method -method Test 75 of 144: Check _TPC (Throttling Present +method Test 75 of 144: Test _TPC (Throttling Present method Capabilities). method PASSED: Test 75, \_PR_.CPU0._TPC correctly returned an method integer. method PASSED: Test 75, \_PR_.CPU1._TPC correctly returned an method integer. method -method Test 76 of 144: Check _TSD (Throttling State -method Dependencies). +method Test 76 of 144: Test _TSD (Throttling State Dependencies). method PASSED: Test 76, \_PR_.CPU0._TSD correctly returned a sane method looking package. method PASSED: Test 76, \_PR_.CPU1._TSD correctly returned a sane method looking package. method -method Test 77 of 144: Check _TSS (Throttling Supported States). +method Test 77 of 144: Test _TSS (Throttling Supported States). method \_PR_.CPU0._TSS values: method T-State CPU Power Latency Control Status method Freq (mW) (usecs) @@ -549,125 +548,123 @@ method 7 13% 125 0 09 00 method PASSED: Test 77, \_PR_.CPU1._TSS correctly returned a sane method looking package. method -method Test 78 of 144: Check _ALC (Ambient Light Colour +method Test 78 of 144: Test _ALC (Ambient Light Colour method Chromaticity). method SKIPPED: Test 78, Skipping test for non-existant object method _ALC. method -method Test 79 of 144: Check _ALI (Ambient Light Illuminance). +method Test 79 of 144: Test _ALI (Ambient Light Illuminance). method SKIPPED: Test 79, Skipping test for non-existant object method _ALI. method -method Test 80 of 144: Check _ALT (Ambient Light Temperature). +method Test 80 of 144: Test _ALT (Ambient Light Temperature). method SKIPPED: Test 80, Skipping test for non-existant object method _ALT. method -method Test 81 of 144: Check _ALP (Ambient Light Polling). +method Test 81 of 144: Test _ALP (Ambient Light Polling). method SKIPPED: Test 81, Skipping test for non-existant object method _ALP. method -method Test 82 of 144: Check _LID (Lid Status). +method Test 82 of 144: Test _LID (Lid Status). method PASSED: Test 82, \_SB_.LID0._LID correctly returned sane method looking value 0x00000000. method -method Test 83 of 144: Check _GCP (Get Capabilities). +method Test 83 of 144: Test _GCP (Get Capabilities). method SKIPPED: Test 83, Skipping test for non-existant object method _GCP. method -method Test 84 of 144: Check _GRT (Get Real Time). +method Test 84 of 144: Test _GRT (Get Real Time). method SKIPPED: Test 84, Skipping test for non-existant object method _GRT. method -method Test 85 of 144: Check _GWS (Get Wake Status). +method Test 85 of 144: Test _GWS (Get Wake Status). method SKIPPED: Test 85, Skipping test for non-existant object method _GWS. method -method Test 86 of 144: Check _STP (Set Expired Timer Wake -method Policy). +method Test 86 of 144: Test _STP (Set Expired Timer Wake Policy). method SKIPPED: Test 86, Skipping test for non-existant object method _STP. method -method Test 87 of 144: Check _STV (Set Timer Value). +method Test 87 of 144: Test _STV (Set Timer Value). method SKIPPED: Test 87, Skipping test for non-existant object method _STV. method -method Test 88 of 144: Check _TIP (Expired Timer Wake Policy). +method Test 88 of 144: Test _TIP (Expired Timer Wake Policy). method SKIPPED: Test 88, Skipping test for non-existant object method _TIP. method -method Test 89 of 144: Check _TIV (Timer Values). +method Test 89 of 144: Test _TIV (Timer Values). method SKIPPED: Test 89, Skipping test for non-existant object method _TIV. method -method Test 90 of 144: Check _SBS (Smart Battery Subsystem). +method Test 90 of 144: Test _SBS (Smart Battery Subsystem). method SKIPPED: Test 90, Skipping test for non-existant object method _SBS. method -method Test 91 of 144: Check _BCT (Battery Charge Time). +method Test 91 of 144: Test _BCT (Battery Charge Time). method SKIPPED: Test 91, Skipping test for non-existant object method _BCT. method -method Test 92 of 144: Check _BIF (Battery Information). +method Test 92 of 144: Test _BIF (Battery Information). method PASSED: Test 92, \_SB_.PCI0.LPCB.BAT1._BIF correctly method returned a sane looking package. method -method Test 93 of 144: Check _BIX (Battery Information Extended). +method Test 93 of 144: Test _BIX (Battery Information Extended). method SKIPPED: Test 93, Skipping test for non-existant object method _BIX. method -method Test 94 of 144: Check _BMA (Battery Measurement -method Averaging). +method Test 94 of 144: Test _BMA (Battery Measurement Averaging). method SKIPPED: Test 94, Skipping test for non-existant object method _BMA. method -method Test 95 of 144: Check _BMC (Battery Maintenance Control). +method Test 95 of 144: Test _BMC (Battery Maintenance Control). method SKIPPED: Test 95, Skipping test for non-existant object method _BMC. method -method Test 96 of 144: Check _BMD (Battery Maintenance Data). +method Test 96 of 144: Test _BMD (Battery Maintenance Data). method SKIPPED: Test 96, Skipping test for non-existant object method _BMD. method -method Test 97 of 144: Check _BMS (Battery Measurement Sampling +method Test 97 of 144: Test _BMS (Battery Measurement Sampling method Time). method SKIPPED: Test 97, Skipping test for non-existant object method _BMS. method -method Test 98 of 144: Check _BST (Battery Status). +method Test 98 of 144: Test _BST (Battery Status). method PASSED: Test 98, \_SB_.PCI0.LPCB.BAT1._BST correctly method returned a sane looking package. method -method Test 99 of 144: Check _BTP (Battery Trip Point). +method Test 99 of 144: Test _BTP (Battery Trip Point). method SKIPPED: Test 99, Skipping test for non-existant object method _BTP. method -method Test 100 of 144: Check _BTM (Battery Time). +method Test 100 of 144: Test _BTM (Battery Time). method SKIPPED: Test 100, Skipping test for non-existant object method _BTM. method -method Test 101 of 144: Check _PCL (Power Consumer List). +method Test 101 of 144: Test _PCL (Power Consumer List). method -method Test 102 of 144: Check _PIF (Power Source Information). +method Test 102 of 144: Test _PIF (Power Source Information). method SKIPPED: Test 102, Skipping test for non-existant object method _PIF. method -method Test 103 of 144: Check _PSR (Power Source). +method Test 103 of 144: Test _PSR (Power Source). method PASSED: Test 103, \_SB_.PCI0.LPCB.ACAD._PSR correctly method returned sane looking value 0x00000000. method -method Test 104 of 144: Check _FIF (Fan Information). +method Test 104 of 144: Test _FIF (Fan Information). method SKIPPED: Test 104, Skipping test for non-existant object method _FIF. method -method Test 105 of 144: Check _FSL (Fan Set Level). +method Test 105 of 144: Test _FSL (Fan Set Level). method SKIPPED: Test 105, Skipping test for non-existant object method _FSL. method -method Test 106 of 144: Check _FST (Fan Status). +method Test 106 of 144: Test _FST (Fan Status). method SKIPPED: Test 106, Skipping test for non-existant object method _FST. method -method Test 107 of 144: Check _ACx (Active Cooling). +method Test 107 of 144: Test _ACx (Active Cooling). method PASSED: Test 107, \_SB_.PCI0.LPCB.EC0_.BAC0 correctly method returned a sane looking return type. method @@ -699,65 +696,64 @@ method SKIPPED: Test 107, Skipping test for non-existant object method AC9. method method -method Test 108 of 144: Check _CRT (Critical Trip Point). +method Test 108 of 144: Test _CRT (Critical Trip Point). method SKIPPED: Test 108, Skipping test for non-existant object method _CRT. method -method Test 109 of 144: Check _DTI (Device Temperature +method Test 109 of 144: Test _DTI (Device Temperature method Indication). method SKIPPED: Test 109, Skipping test for non-existant object method _DTI. method -method Test 110 of 144: Check _HOT (Hot Temperature). +method Test 110 of 144: Test _HOT (Hot Temperature). method SKIPPED: Test 110, Skipping test for non-existant object method _HOT. method -method Test 111 of 144: Check _NTT (Notification Temp Threshold). +method Test 111 of 144: Test _NTT (Notification Temp Threshold). method SKIPPED: Test 111, Skipping test for non-existant object method _NTT. method -method Test 112 of 144: Check _PSV (Passive Temp). +method Test 112 of 144: Test _PSV (Passive Temp). method SKIPPED: Test 112, Skipping test for non-existant object method _PSV. method -method Test 113 of 144: Check _RTV (Relative Temp Values). +method Test 113 of 144: Test _RTV (Relative Temp Values). method SKIPPED: Test 113, Skipping test for non-existant object method _RTV. method -method Test 114 of 144: Check _SCP (Set Cooling Policy). +method Test 114 of 144: Test _SCP (Set Cooling Policy). method SKIPPED: Test 114, Skipping test for non-existant object method _DTI. method -method Test 115 of 144: Check _TC1 (Thermal Constant 1). +method Test 115 of 144: Test _TC1 (Thermal Constant 1). method SKIPPED: Test 115, Skipping test for non-existant object method _TC1. method -method Test 116 of 144: Check _TC2 (Thermal Constant 2). +method Test 116 of 144: Test _TC2 (Thermal Constant 2). method SKIPPED: Test 116, Skipping test for non-existant object method _TC2. method -method Test 117 of 144: Check _TMP (Thermal Zone Current Temp). +method Test 117 of 144: Test _TMP (Thermal Zone Current Temp). method SKIPPED: Test 117, Skipping test for non-existant object method _TMP. method -method Test 118 of 144: Check _TPT (Trip Point Temperature). +method Test 118 of 144: Test _TPT (Trip Point Temperature). method SKIPPED: Test 118, Skipping test for non-existant object method _TPT. method -method Test 119 of 144: Check _TSP (Thermal Sampling Period). +method Test 119 of 144: Test _TSP (Thermal Sampling Period). method SKIPPED: Test 119, Skipping test for non-existant object method _TSP. method -method Test 120 of 144: Check _TST (Temperature Sensor -method Threshold). +method Test 120 of 144: Test _TST (Temperature Sensor Threshold). method SKIPPED: Test 120, Skipping test for non-existant object method _TST. method -method Test 121 of 144: Check _TZP (Thermal Zone Polling). +method Test 121 of 144: Test _TZP (Thermal Zone Polling). method SKIPPED: Test 121, Skipping test for non-existant object method _TZP. method -method Test 122 of 144: Check _PTS (Prepare to Sleep). +method Test 122 of 144: Test _PTS (Prepare to Sleep). method Test _PTS(1). method PASSED: Test 122, \_PTS returned no values as expected. method @@ -774,35 +770,35 @@ method Test _PTS(5). method PASSED: Test 122, \_PTS returned no values as expected. method method -method Test 123 of 144: Check _TTS (Transition to State). +method Test 123 of 144: Test _TTS (Transition to State). method SKIPPED: Test 123, Optional control method _TTS does not method exist. method -method Test 124 of 144: Check _S0 (System S0 State). +method Test 124 of 144: Test _S0 (System S0 State). method SKIPPED: Test 124, Skipping test for non-existant object method _S0. method -method Test 125 of 144: Check _S1 (System S1 State). +method Test 125 of 144: Test _S1 (System S1 State). method SKIPPED: Test 125, Skipping test for non-existant object method _S1. method -method Test 126 of 144: Check _S2 (System S2 State). +method Test 126 of 144: Test _S2 (System S2 State). method SKIPPED: Test 126, Skipping test for non-existant object method _S2. method -method Test 127 of 144: Check _S3 (System S3 State). +method Test 127 of 144: Test _S3 (System S3 State). method SKIPPED: Test 127, Skipping test for non-existant object method _S3. method -method Test 128 of 144: Check _S4 (System S4 State). +method Test 128 of 144: Test _S4 (System S4 State). method SKIPPED: Test 128, Skipping test for non-existant object method _S4. method -method Test 129 of 144: Check _S5 (System S5 State). +method Test 129 of 144: Test _S5 (System S5 State). method SKIPPED: Test 129, Skipping test for non-existant object method _S5. method -method Test 130 of 144: Check _WAK (System Wake). +method Test 130 of 144: Test _WAK (System Wake). method Test _WAK(1) System Wake, State S1. method PASSED: Test 130, \_WAK correctly returned a sane looking method package. @@ -824,7 +820,7 @@ method PASSED: Test 130, \_WAK correctly returned a sane looking method package. method method -method Test 131 of 144: Check _ADR (Return Unique ID for Device). +method Test 131 of 144: Test _ADR (Return Unique ID for Device). method PASSED: Test 131, \_SB_.PCI0.MCHC._ADR correctly returned method an integer. method PASSED: Test 131, \_SB_.PCI0.PEGP._ADR correctly returned @@ -936,7 +932,7 @@ method returned an integer. method PASSED: Test 131, \_SB_.PCI0.SBUS._ADR correctly returned method an integer. method -method Test 132 of 144: Check _BCL (Query List of Brightness +method Test 132 of 144: Test _BCL (Query List of Brightness method Control Levels Supported). method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: method Level on full power : 70 @@ -951,20 +947,20 @@ method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 method PASSED: Test 132, \_SB_.PCI0.GFX0.DD03._BCL returned a method sane package of 10 integers. method -method Test 133 of 144: Check _BCM (Set Brightness Level). +method Test 133 of 144: Test _BCM (Set Brightness Level). method PASSED: Test 133, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned method no values as expected. method PASSED: Test 133, \_SB_.PCI0.GFX0.DD03._BCM returned no method values as expected. method -method Test 134 of 144: Check _BQC (Brightness Query Current +method Test 134 of 144: Test _BQC (Brightness Query Current method Level). method PASSED: Test 134, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly method returned an integer. method PASSED: Test 134, \_SB_.PCI0.GFX0.DD03._BQC correctly method returned an integer. method -method Test 135 of 144: Check _DCS (Return the Status of Output +method Test 135 of 144: Test _DCS (Return the Status of Output method Device). method PASSED: Test 135, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly method returned an integer. @@ -983,12 +979,12 @@ method returned an integer. method PASSED: Test 135, \_SB_.PCI0.GFX0.DD05._DCS correctly method returned an integer. method -method Test 136 of 144: Check _DDC (Return the EDID for this +method Test 136 of 144: Test _DDC (Return the EDID for this method Device). method SKIPPED: Test 136, Skipping test for non-existant object method _DDC. method -method Test 137 of 144: Check _DSS (Device Set State). +method Test 137 of 144: Test _DSS (Device Set State). method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned method no values as expected. method PASSED: Test 137, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned @@ -1006,7 +1002,7 @@ method values as expected. method PASSED: Test 137, \_SB_.PCI0.GFX0.DD05._DSS returned no method values as expected. method -method Test 138 of 144: Check _DGS (Query Graphics State). +method Test 138 of 144: Test _DGS (Query Graphics State). method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly method returned an integer. method PASSED: Test 138, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly @@ -1024,8 +1020,8 @@ method returned an integer. method PASSED: Test 138, \_SB_.PCI0.GFX0.DD05._DGS correctly method returned an integer. method -method Test 139 of 144: Check _DOD (Enumerate All Devices -method Attached to Display Adapter). +method Test 139 of 144: Test _DOD (Enumerate All Devices Attached +method to Display Adapter). method Device 0: method Instance: 0 method Display port attachment: 0 @@ -1059,26 +1055,26 @@ method Head or pipe ID: 0 method PASSED: Test 139, \_SB_.PCI0.GFX0._DOD correctly returned method a sane looking package. method -method Test 140 of 144: Check _DOS (Enable/Disable Output +method Test 140 of 144: Test _DOS (Enable/Disable Output method Switching). method PASSED: Test 140, \_SB_.PCI0.PEGP.VGA_._DOS returned no method values as expected. method PASSED: Test 140, \_SB_.PCI0.GFX0._DOS returned no values method as expected. method -method Test 141 of 144: Check _GPD (Get POST Device). +method Test 141 of 144: Test _GPD (Get POST Device). method SKIPPED: Test 141, Skipping test for non-existant object method _GPD. method -method Test 142 of 144: Check _ROM (Get ROM Data). +method Test 142 of 144: Test _ROM (Get ROM Data). method SKIPPED: Test 142, Skipping test for non-existant object method _ROM. method -method Test 143 of 144: Check _SPD (Set POST Device). +method Test 143 of 144: Test _SPD (Set POST Device). method SKIPPED: Test 143, Skipping test for non-existant object method _SPD. method -method Test 144 of 144: Check _VPO (Video POST Options). +method Test 144 of 144: Test _VPO (Video POST Options). method SKIPPED: Test 144, Skipping test for non-existant object method _VPO. method diff --git a/wmi-0001/wmi-0001.log b/wmi-0001/wmi-0001.log index 0540ba3..aca6243 100644 --- a/wmi-0001/wmi-0001.log +++ b/wmi-0001/wmi-0001.log @@ -1,7 +1,7 @@ wmi wmi: Extract and analyse Windows Management wmi Instrumentation (WMI). wmi ---------------------------------------------------------- -wmi Test 1 of 1: Check Windows Management Instrumentation +wmi Test 1 of 1: Windows Management Instrumentation test. wmi wmi \_SB_.WMI1._WDG (1 of 9) wmi GUID: 51F5230E-9677-46CD-A1CF-C0B23EE34DB7 diff --git a/wmi-0001/wmi-0002.log b/wmi-0001/wmi-0002.log index ab5b704..1732e65 100644 --- a/wmi-0001/wmi-0002.log +++ b/wmi-0001/wmi-0002.log @@ -1,7 +1,7 @@ wmi wmi: Extract and analyse Windows Management wmi Instrumentation (WMI). wmi ---------------------------------------------------------- -wmi Test 1 of 1: Check Windows Management Instrumentation +wmi Test 1 of 1: Windows Management Instrumentation test. wmi wmi \_SB_.ATKD._WDG (1 of 2) wmi GUID: 97845ED0-4E6D-11DE-8A39-0800200C9A66 diff --git a/wmi-0001/wmi-0003.log b/wmi-0001/wmi-0003.log index 5f4084d..f1e9aa3 100644 --- a/wmi-0001/wmi-0003.log +++ b/wmi-0001/wmi-0003.log @@ -1,7 +1,7 @@ wmi wmi: Extract and analyse Windows Management wmi Instrumentation (WMI). wmi ---------------------------------------------------------- -wmi Test 1 of 1: Check Windows Management Instrumentation +wmi Test 1 of 1: Windows Management Instrumentation test. wmi wmi \_SB_.AMW0._WDG (1 of 6) wmi GUID: 8D9DDCBC-A997-11DA-B012-B622A1EF5492