| Message ID | 20190208032314.15215-9-alex.hung@canonical.com |
|---|---|
| State | Accepted |
| Headers | show |
| Series | Updates for ACPI 6.2b and 6.3 | expand |
On 08/02/2019 03:23, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/method-0001/method-0001.log | 748 +++++++++++++------------- > 1 file changed, 386 insertions(+), 362 deletions(-) > > diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log > index ba25c50e..5d8b4f0a 100644 > --- a/fwts-test/method-0001/method-0001.log > +++ b/fwts-test/method-0001/method-0001.log > @@ -1,41 +1,41 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 195: Test Method Names. > +method Test 1 of 200: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 195: Test _AEI. > +method Test 2 of 200: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existent object > method _AEI. > method > -method Test 3 of 195: Test _EVT (Event Method). > +method Test 3 of 200: Test _EVT (Event Method). > method SKIPPED: Test 3, Skipping test for non-existent object > method _EVT. > method > -method Test 4 of 195: Test _DLM (Device Lock Mutex). > +method Test 4 of 200: Test _DLM (Device Lock Mutex). > method SKIPPED: Test 4, Skipping test for non-existent object > method _DLM. > method > -method Test 5 of 195: Test _PIC (Inform AML of Interrupt Model). > +method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model). > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method > -method Test 6 of 195: Test _CID (Compatible ID). > +method Test 6 of 200: Test _CID (Compatible ID). > method PASSED: Test 6, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 7 of 195: Test _CLS (Class Code). > +method Test 7 of 200: Test _CLS (Class Code). > method SKIPPED: Test 7, Skipping test for non-existent object > method _CLS. > method > -method Test 8 of 195: Test _DDN (DOS Device Name). > +method Test 8 of 200: Test _DDN (DOS Device Name). > method SKIPPED: Test 8, Skipping test for non-existent object > method _DDN. > method > -method Test 9 of 195: Test _HID (Hardware ID). > +method Test 9 of 200: Test _HID (Hardware ID). > method PASSED: Test 9, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 9, \_SB_.LID0._HID returned an integer > @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 10 of 195: Test _HRV (Hardware Revision Number). > +method Test 10 of 200: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 10, Skipping test for non-existent object > method _HRV. > method > -method Test 11 of 195: Test _MLS (Multiple Language String). > +method Test 11 of 200: Test _MLS (Multiple Language String). > method SKIPPED: Test 11, Skipping test for non-existent object > method _MLS. > method > -method Test 12 of 195: Test _PLD (Physical Device Location). > +method Test 12 of 200: Test _PLD (Physical Device Location). > method SKIPPED: Test 12, Skipping test for non-existent object > method _PLD. > method > -method Test 13 of 195: Test _SUB (Subsystem ID). > +method Test 13 of 200: Test _SUB (Subsystem ID). > method SKIPPED: Test 13, Skipping test for non-existent object > method _SUB. > method > -method Test 14 of 195: Test _SUN (Slot User Number). > +method Test 14 of 200: Test _SUN (Slot User Number). > method SKIPPED: Test 14, Skipping test for non-existent object > method _SUN. > method > -method Test 15 of 195: Test _STR (String). > +method Test 15 of 200: Test _STR (String). > method SKIPPED: Test 15, Skipping test for non-existent object > method _STR. > method > -method Test 16 of 195: Test _UID (Unique ID). > +method Test 16 of 200: Test _UID (Unique ID). > method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned > @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. > method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 17 of 195: Test _CDM (Clock Domain). > +method Test 17 of 200: Test _CDM (Clock Domain). > method SKIPPED: Test 17, Skipping test for non-existent object > method _CDM. > method > -method Test 18 of 195: Test _CRS (Current Resource Settings). > +method Test 18 of 200: Test _CRS (Current Resource Settings). > method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -187,11 +187,11 @@ method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 19 of 195: Test _DSD (Device Specific Data). > +method Test 19 of 200: Test _DSD (Device Specific Data). > method SKIPPED: Test 19, Skipping test for non-existent object > method _DSD. > method > -method Test 20 of 195: Test _DIS (Disable). > +method Test 20 of 200: Test _DIS (Disable). > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -209,24 +209,24 @@ method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 21 of 195: Test _DMA (Direct Memory Access). > +method Test 21 of 200: Test _DMA (Direct Memory Access). > method SKIPPED: Test 21, Skipping test for non-existent object > method _DMA. > method > -method Test 22 of 195: Test _FIX (Fixed Register Resource > +method Test 22 of 200: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 22, Skipping test for non-existent object > method _FIX. > method > -method Test 23 of 195: Test _GSB (Global System Interrupt Base). > +method Test 23 of 200: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 23, Skipping test for non-existent object > method _GSB. > method > -method Test 24 of 195: Test _HPP (Hot Plug Parameters). > +method Test 24 of 200: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 24, Skipping test for non-existent object > method _HPP. > method > -method Test 25 of 195: Test _PRS (Possible Resource Settings). > +method Test 25 of 200: Test _PRS (Possible Resource Settings). > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -244,7 +244,7 @@ method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 26 of 195: Test _PRT (PCI Routing Table). > +method Test 26 of 200: Test _PRT (PCI Routing Table). > method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane > method looking package. > method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a > @@ -264,51 +264,51 @@ method sane looking package. > method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a > method sane looking package. > method > -method Test 27 of 195: Test _PXM (Proximity). > +method Test 27 of 200: Test _PXM (Proximity). > method SKIPPED: Test 27, Skipping test for non-existent object > method _PXM. > method > -method Test 28 of 195: Test _CCA (Cache Coherency Attribute). > +method Test 28 of 200: Test _CCA (Cache Coherency Attribute). > method SKIPPED: Test 28, Skipping test for non-existent object > method _CCA. > method > -method Test 29 of 195: Test _EDL (Eject Device List). > +method Test 29 of 200: Test _EDL (Eject Device List). > method SKIPPED: Test 29, Skipping test for non-existent object > method _EDL. > method > -method Test 30 of 195: Test _EJD (Ejection Dependent Device). > +method Test 30 of 200: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 30, Skipping test for non-existent object > method _EJD. > method > -method Test 31 of 195: Test _EJ0 (Eject). > +method Test 31 of 200: Test _EJ0 (Eject). > method SKIPPED: Test 31, Skipping test for non-existent object > method _EJ0. > method > -method Test 32 of 195: Test _EJ1 (Eject). > +method Test 32 of 200: Test _EJ1 (Eject). > method SKIPPED: Test 32, Skipping test for non-existent object > method _EJ1. > method > -method Test 33 of 195: Test _EJ2 (Eject). > +method Test 33 of 200: Test _EJ2 (Eject). > method SKIPPED: Test 33, Skipping test for non-existent object > method _EJ2. > method > -method Test 34 of 195: Test _EJ3 (Eject). > +method Test 34 of 200: Test _EJ3 (Eject). > method SKIPPED: Test 34, Skipping test for non-existent object > method _EJ3. > method > -method Test 35 of 195: Test _EJ4 (Eject). > +method Test 35 of 200: Test _EJ4 (Eject). > method SKIPPED: Test 35, Skipping test for non-existent object > method _EJ4. > method > -method Test 36 of 195: Test _LCK (Lock). > +method Test 36 of 200: Test _LCK (Lock). > method SKIPPED: Test 36, Skipping test for non-existent object > method _LCK. > method > -method Test 37 of 195: Test _RMV (Remove). > +method Test 37 of 200: Test _RMV (Remove). > method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 38 of 195: Test _STA (Status). > +method Test 38 of 200: Test _STA (Status). > method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000. > method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 39 of 195: Test _DEP (Operational Region > +method Test 39 of 200: Test _DEP (Operational Region > method Dependencies). > method SKIPPED: Test 39, Skipping test for non-existent object > method _DEP. > method > -method Test 40 of 195: Test _FIT (Firmware Interface Table). > +method Test 40 of 200: Test _FIT (Firmware Interface Table). > method SKIPPED: Test 40, Skipping test for non-existent object > method _FIT. > method > -method Test 41 of 195: Test _BDN (BIOS Dock Name). > +method Test 41 of 200: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 41, Skipping test for non-existent object > method _BDN. > method > -method Test 42 of 195: Test _BBN (Base Bus Number). > +method Test 42 of 200: Test _BBN (Base Bus Number). > method SKIPPED: Test 42, Skipping test for non-existent object > method _BBN. > method > -method Test 43 of 195: Test _DCK (Dock). > +method Test 43 of 200: Test _DCK (Dock). > method SKIPPED: Test 43, Skipping test for non-existent object > method _DCK. > method > -method Test 44 of 195: Test _INI (Initialize). > +method Test 44 of 200: Test _INI (Initialize). > method PASSED: Test 44, \_SB_._INI returned no values as > method expected. > method > -method Test 45 of 195: Test _GLK (Global Lock). > +method Test 45 of 200: Test _GLK (Global Lock). > method SKIPPED: Test 45, Skipping test for non-existent object > method _GLK. > method > -method Test 46 of 195: Test _SEG (Segment). > +method Test 46 of 200: Test _SEG (Segment). > method SKIPPED: Test 46, Skipping test for non-existent object > method _SEG. > method > -method Test 47 of 195: Test _LSI (Label Storage Information). > +method Test 47 of 200: Test _LSI (Label Storage Information). > method SKIPPED: Test 47, Skipping test for non-existent object > method _LSI. > method > -method Test 48 of 195: Test _OFF (Set resource off). > +method Test 48 of 200: Test _OFF (Set resource off). > method SKIPPED: Test 48, Skipping test for non-existent object > method _OFF. > method > -method Test 49 of 195: Test _ON_ (Set resource on). > +method Test 49 of 200: Test _ON_ (Set resource on). > method SKIPPED: Test 49, Skipping test for non-existent object > method _ON_. > method > -method Test 50 of 195: Test _DSW (Device Sleep Wake). > +method Test 50 of 200: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 50, Skipping test for non-existent object > method _DSW. > method > -method Test 51 of 195: Test _IRC (In Rush Current). > +method Test 51 of 200: Test _IRC (In Rush Current). > method SKIPPED: Test 51, Skipping test for non-existent object > method _IRC. > method > -method Test 52 of 195: Test _PRE (Power Resources for > +method Test 52 of 200: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 52, Skipping test for non-existent object > method _PRE. > method > -method Test 53 of 195: Test _PR0 (Power Resources for D0). > +method Test 53 of 200: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 53, Skipping test for non-existent object > method _PR0. > method > -method Test 54 of 195: Test _PR1 (Power Resources for D1). > +method Test 54 of 200: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 54, Skipping test for non-existent object > method _PR1. > method > -method Test 55 of 195: Test _PR2 (Power Resources for D2). > +method Test 55 of 200: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 55, Skipping test for non-existent object > method _PR2. > method > -method Test 56 of 195: Test _PR3 (Power Resources for D3). > +method Test 56 of 200: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 56, Skipping test for non-existent object > method _PR3. > method > -method Test 57 of 195: Test _PRW (Power Resources for Wake). > +method Test 57 of 200: Test _PRW (Power Resources for Wake). > method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a > method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly > @@ -426,34 +426,34 @@ method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a > method sane looking package. > method > -method Test 58 of 195: Test _PS0 (Power State 0). > +method Test 58 of 200: Test _PS0 (Power State 0). > method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 58, \_PS0 returned no values as expected. > method > -method Test 59 of 195: Test _PS1 (Power State 1). > +method Test 59 of 200: Test _PS1 (Power State 1). > method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 60 of 195: Test _PS2 (Power State 2). > +method Test 60 of 200: Test _PS2 (Power State 2). > method SKIPPED: Test 60, Skipping test for non-existent object > method _PS2. > method > -method Test 61 of 195: Test _PS3 (Power State 3). > +method Test 61 of 200: Test _PS3 (Power State 3). > method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 61, \_PS3 returned no values as expected. > method > -method Test 62 of 195: Test _PSC (Power State Current). > +method Test 62 of 200: Test _PSC (Power State Current). > method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 62, \_PSC correctly returned an integer. > method > -method Test 63 of 195: Test _PSE (Power State for Enumeration). > +method Test 63 of 200: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 63, Skipping test for non-existent object > method _PSE. > method > -method Test 64 of 195: Test _PSW (Power State Wake). > +method Test 64 of 200: Test _PSW (Power State Wake). > method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values > @@ -465,15 +465,15 @@ method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 65 of 195: Test _S1D (S1 Device State). > +method Test 65 of 200: Test _S1D (S1 Device State). > method SKIPPED: Test 65, Skipping test for non-existent object > method _S1D. > method > -method Test 66 of 195: Test _S2D (S2 Device State). > +method Test 66 of 200: Test _S2D (S2 Device State). > method SKIPPED: Test 66, Skipping test for non-existent object > method _S2D. > method > -method Test 67 of 195: Test _S3D (S3 Device State). > +method Test 67 of 200: Test _S3D (S3 Device State). > method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned > @@ -491,7 +491,7 @@ method an integer. > method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 68 of 195: Test _S4D (S4 Device State). > +method Test 68 of 200: Test _S4D (S4 Device State). > method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned > @@ -509,132 +509,132 @@ method an integer. > method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 69 of 195: Test _S0W (S0 Device Wake State). > +method Test 69 of 200: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 69, Skipping test for non-existent object > method _S0W. > method > -method Test 70 of 195: Test _S1W (S1 Device Wake State). > +method Test 70 of 200: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 70, Skipping test for non-existent object > method _S1W. > method > -method Test 71 of 195: Test _S2W (S2 Device Wake State). > +method Test 71 of 200: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 71, Skipping test for non-existent object > method _S2W. > method > -method Test 72 of 195: Test _S3W (S3 Device Wake State). > +method Test 72 of 200: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 72, Skipping test for non-existent object > method _S3W. > method > -method Test 73 of 195: Test _S4W (S4 Device Wake State). > +method Test 73 of 200: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 73, Skipping test for non-existent object > method _S4W. > method > -method Test 74 of 195: Test _RST (Device Reset). > +method Test 74 of 200: Test _RST (Device Reset). > method SKIPPED: Test 74, Skipping test for non-existent object > method _RST. > method > -method Test 75 of 195: Test _PRR (Power Resource for Reset). > +method Test 75 of 200: Test _PRR (Power Resource for Reset). > method SKIPPED: Test 75, Skipping test for non-existent object > method _PRR. > method > -method Test 76 of 195: Test _S0_ (S0 System State). > +method Test 76 of 200: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 76, \_S0_ correctly returned a sane looking > method package. > method > -method Test 77 of 195: Test _S1_ (S1 System State). > +method Test 77 of 200: Test _S1_ (S1 System State). > method SKIPPED: Test 77, Skipping test for non-existent object > method _S1_. > method > -method Test 78 of 195: Test _S2_ (S2 System State). > +method Test 78 of 200: Test _S2_ (S2 System State). > method SKIPPED: Test 78, Skipping test for non-existent object > method _S2_. > method > -method Test 79 of 195: Test _S3_ (S3 System State). > +method Test 79 of 200: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 79, \_S3_ correctly returned a sane looking > method package. > method > -method Test 80 of 195: Test _S4_ (S4 System State). > +method Test 80 of 200: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 80, \_S4_ correctly returned a sane looking > method package. > method > -method Test 81 of 195: Test _S5_ (S5 System State). > +method Test 81 of 200: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 81, \_S5_ correctly returned a sane looking > method package. > method > -method Test 82 of 195: Test _SWS (System Wake Source). > +method Test 82 of 200: Test _SWS (System Wake Source). > method SKIPPED: Test 82, Skipping test for non-existent object > method _SWS. > method > -method Test 83 of 195: Test _PSS (Performance Supported States). > +method Test 83 of 200: Test _PSS (Performance Supported States). > method SKIPPED: Test 83, Skipping test for non-existent object > method _PSS. > method > -method Test 84 of 195: Test _CPC (Continuous Performance > +method Test 84 of 200: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 84, Skipping test for non-existent object > method _CPC. > method > -method Test 85 of 195: Test _CSD (C State Dependencies). > +method Test 85 of 200: Test _CSD (C State Dependencies). > method SKIPPED: Test 85, Skipping test for non-existent object > method _CSD. > method > -method Test 86 of 195: Test _CST (C States). > +method Test 86 of 200: Test _CST (C States). > method SKIPPED: Test 86, Skipping test for non-existent object > method _CST. > method > -method Test 87 of 195: Test _PCT (Performance Control). > +method Test 87 of 200: Test _PCT (Performance Control). > method SKIPPED: Test 87, Skipping test for non-existent object > method _PCT. > method > -method Test 88 of 195: Test _PDL (P-State Depth Limit). > +method Test 88 of 200: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 88, Skipping test for non-existent object > method _PDL. > method > -method Test 89 of 195: Test _PPC (Performance Present > +method Test 89 of 200: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 89, Skipping test for non-existent object > method _PPC. > method > -method Test 90 of 195: Test _PPE (Polling for Platform Error). > +method Test 90 of 200: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 90, Skipping test for non-existent object > method _PPE. > method > -method Test 91 of 195: Test _PSD (Power State Dependencies). > +method Test 91 of 200: Test _PSD (Power State Dependencies). > method SKIPPED: Test 91, Skipping test for non-existent object > method _PSD. > method > -method Test 92 of 195: Test _PTC (Processor Throttling Control). > +method Test 92 of 200: Test _PTC (Processor Throttling Control). > method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane > method looking package. > method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane > method looking package. > method > -method Test 93 of 195: Test _TDL (T-State Depth Limit). > +method Test 93 of 200: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 93, Skipping test for non-existent object > method _TDL. > method > -method Test 94 of 195: Test _TPC (Throttling Present > +method Test 94 of 200: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 95 of 195: Test _TSD (Throttling State Dependencies). > +method Test 95 of 200: Test _TSD (Throttling State Dependencies). > method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 96 of 195: Test _TSS (Throttling Supported States). > +method Test 96 of 200: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00 > method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 97 of 195: Test _LPI (Low Power Idle States). > +method Test 97 of 200: Test _LPI (Low Power Idle States). > method SKIPPED: Test 97, Skipping test for non-existent object > method _LPI. > method > -method Test 98 of 195: Test _RDI (Resource Dependencies for > +method Test 98 of 200: Test _RDI (Resource Dependencies for > method Idle). > method SKIPPED: Test 98, Skipping test for non-existent object > method _RDI. > method > -method Test 99 of 195: Test _PUR (Processor Utilization Request). > +method Test 99 of 200: Test _PUR (Processor Utilization Request). > method SKIPPED: Test 99, Skipping test for non-existent object > method _PUR. > method > -method Test 100 of 195: Test _MSG (Message). > +method Test 100 of 200: Test _MSG (Message). > method SKIPPED: Test 100, Skipping test for non-existent object > method _MSG. > method > -method Test 101 of 195: Test _SST (System Status). > +method Test 101 of 200: Test _SST (System Status). > method SKIPPED: Test 101, Skipping test for non-existent object > method _SST. > method > -method Test 102 of 195: Test _ALC (Ambient Light Colour > +method Test 102 of 200: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 102, Skipping test for non-existent object > method _ALC. > method > -method Test 103 of 195: Test _ALI (Ambient Light Illuminance). > +method Test 103 of 200: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 103, Skipping test for non-existent object > method _ALI. > method > -method Test 104 of 195: Test _ALT (Ambient Light Temperature). > +method Test 104 of 200: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 104, Skipping test for non-existent object > method _ALT. > method > -method Test 105 of 195: Test _ALP (Ambient Light Polling). > +method Test 105 of 200: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 105, Skipping test for non-existent object > method _ALP. > method > -method Test 106 of 195: Test _ALR (Ambient Light Response). > +method Test 106 of 200: Test _ALR (Ambient Light Response). > method SKIPPED: Test 106, Skipping test for non-existent object > method _ALR. > method > -method Test 107 of 195: Test _LID (Lid Status). > +method Test 107 of 200: Test _LID (Lid Status). > method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 108 of 195: Test _GTF (Get Task File). > +method Test 108 of 200: Test _GTF (Get Task File). > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly > method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly > @@ -720,540 +720,564 @@ method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly > method returned a sane looking buffer. > method > -method Test 109 of 195: Test _GTM (Get Timing Mode). > +method Test 109 of 200: Test _GTM (Get Timing Mode). > method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly > method returned a sane looking buffer. > method > -method Test 110 of 195: Test _MBM (Memory Bandwidth Monitoring > +method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring > method Data). > method SKIPPED: Test 110, Skipping test for non-existent object > method _MBM. > method > -method Test 111 of 195: Test _UPC (USB Port Capabilities). > +method Test 111 of 200: Test _UPC (USB Port Capabilities). > method SKIPPED: Test 111, Skipping test for non-existent object > method _UPC. > method > -method Test 112 of 195: Test _UPD (User Presence Detect). > +method Test 112 of 200: Test _UPD (User Presence Detect). > method SKIPPED: Test 112, Skipping test for non-existent object > method _UPD. > method > -method Test 113 of 195: Test _UPP (User Presence Polling). > +method Test 113 of 200: Test _UPP (User Presence Polling). > method SKIPPED: Test 113, Skipping test for non-existent object > method _UPP. > method > -method Test 114 of 195: Test _GCP (Get Capabilities). > +method Test 114 of 200: Test _GCP (Get Capabilities). > method SKIPPED: Test 114, Skipping test for non-existent object > method _GCP. > method > -method Test 115 of 195: Test _GRT (Get Real Time). > +method Test 115 of 200: Test _GRT (Get Real Time). > method SKIPPED: Test 115, Skipping test for non-existent object > method _GRT. > method > -method Test 116 of 195: Test _GWS (Get Wake Status). > +method Test 116 of 200: Test _GWS (Get Wake Status). > method SKIPPED: Test 116, Skipping test for non-existent object > method _GWS. > method > -method Test 117 of 195: Test _CWS (Clear Wake Status). > +method Test 117 of 200: Test _CWS (Clear Wake Status). > method SKIPPED: Test 117, Skipping test for non-existent object > method _CWS. > method > -method Test 118 of 195: Test _SRT (Set Real Time). > +method Test 118 of 200: Test _SRT (Set Real Time). > method SKIPPED: Test 118, Skipping test for non-existent object > method _SRT. > method > -method Test 119 of 195: Test _STP (Set Expired Timer Wake > +method Test 119 of 200: Test _STP (Set Expired Timer Wake > method Policy). > method SKIPPED: Test 119, Skipping test for non-existent object > method _STP. > method > -method Test 120 of 195: Test _STV (Set Timer Value). > +method Test 120 of 200: Test _STV (Set Timer Value). > method SKIPPED: Test 120, Skipping test for non-existent object > method _STV. > method > -method Test 121 of 195: Test _TIP (Expired Timer Wake Policy). > +method Test 121 of 200: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 121, Skipping test for non-existent object > method _TIP. > method > -method Test 122 of 195: Test _TIV (Timer Values). > +method Test 122 of 200: Test _TIV (Timer Values). > method SKIPPED: Test 122, Skipping test for non-existent object > method _TIV. > method > -method Test 123 of 195: Test _SBS (Smart Battery Subsystem). > +method Test 123 of 200: Test _NBS (NVDIMM Boot Status). > method SKIPPED: Test 123, Skipping test for non-existent object > -method _SBS. > +method _NBS. > method > -method Test 124 of 195: Test _BCT (Battery Charge Time). > +method Test 124 of 200: Test _NCH (NVDIMM Current Health > +method Information). > method SKIPPED: Test 124, Skipping test for non-existent object > +method _NCH. > +method > +method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection > +method Capabilities). > +method SKIPPED: Test 125, Skipping test for non-existent object > +method _NIC. > +method > +method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health > +method Errors). > +method SKIPPED: Test 126, Skipping test for non-existent object > +method _NIH. > +method > +method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error > +method Status). > +method SKIPPED: Test 127, Skipping test for non-existent object > +method _NIG. > +method > +method Test 128 of 200: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 128, Skipping test for non-existent object > +method _SBS. > +method > +method Test 129 of 200: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 129, Skipping test for non-existent object > method _BCT. > method > -method Test 125 of 195: Test _BIF (Battery Information). > -method PASSED: Test 125, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 130 of 200: Test _BIF (Battery Information). > +method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 126 of 195: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 126, Skipping test for non-existent object > +method Test 131 of 200: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 131, Skipping test for non-existent object > method _BIX. > method > -method Test 127 of 195: Test _BMA (Battery Measurement > +method Test 132 of 200: Test _BMA (Battery Measurement > method Averaging). > -method SKIPPED: Test 127, Skipping test for non-existent object > +method SKIPPED: Test 132, Skipping test for non-existent object > method _BMA. > method > -method Test 128 of 195: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 128, Skipping test for non-existent object > +method Test 133 of 200: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 133, Skipping test for non-existent object > method _BMC. > method > -method Test 129 of 195: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 129, Skipping test for non-existent object > +method Test 134 of 200: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 134, Skipping test for non-existent object > method _BMD. > method > -method Test 130 of 195: Test _BMS (Battery Measurement Sampling > +method Test 135 of 200: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 130, Skipping test for non-existent object > +method SKIPPED: Test 135, Skipping test for non-existent object > method _BMS. > method > -method Test 131 of 195: Test _BST (Battery Status). > -method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 136 of 200: Test _BST (Battery Status). > +method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 132 of 195: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 132, Skipping test for non-existent object > +method Test 137 of 200: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 137, Skipping test for non-existent object > method _BTP. > method > -method Test 133 of 195: Test _BTH (Battery Throttle Limit). > -method SKIPPED: Test 133, Skipping test for non-existent object > +method Test 138 of 200: Test _BTH (Battery Throttle Limit). > +method SKIPPED: Test 138, Skipping test for non-existent object > method _BTH. > method > -method Test 134 of 195: Test _BTM (Battery Time). > -method SKIPPED: Test 134, Skipping test for non-existent object > +method Test 139 of 200: Test _BTM (Battery Time). > +method SKIPPED: Test 139, Skipping test for non-existent object > method _BTM. > method > -method Test 135 of 195: Test _PCL (Power Consumer List). > -method PASSED: Test 135, \_SB_.PCI0.LPCB.ACAD._PCL returned a > +method Test 140 of 200: Test _PCL (Power Consumer List). > +method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a > method sane package of 1 references. > -method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._PCL returned a > +method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a > method sane package of 1 references. > method > -method Test 136 of 195: Test _PIF (Power Source Information). > -method SKIPPED: Test 136, Skipping test for non-existent object > +method Test 141 of 200: Test _PIF (Power Source Information). > +method SKIPPED: Test 141, Skipping test for non-existent object > method _PIF. > method > -method Test 137 of 195: Test _PRL (Power Source Redundancy List). > -method SKIPPED: Test 137, Skipping test for non-existent object > +method Test 142 of 200: Test _PRL (Power Source Redundancy List). > +method SKIPPED: Test 142, Skipping test for non-existent object > method _PRL. > method > -method Test 138 of 195: Test _PSR (Power Source). > -method PASSED: Test 138, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 143 of 200: Test _PSR (Power Source). > +method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 139 of 195: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 139, Skipping test for non-existent object > +method Test 144 of 200: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 144, Skipping test for non-existent object > method _GAI. > method > -method Test 140 of 195: Test _GHL (Get Harware Limit). > -method SKIPPED: Test 140, Skipping test for non-existent object > +method Test 145 of 200: Test _GHL (Get Harware Limit). > +method SKIPPED: Test 145, Skipping test for non-existent object > method _GHL. > method > -method Test 141 of 195: Test _PMC (Power Meter Capabilities). > -method SKIPPED: Test 141, Skipping test for non-existent object > +method Test 146 of 200: Test _PMC (Power Meter Capabilities). > +method SKIPPED: Test 146, Skipping test for non-existent object > method _PMC. > method > -method Test 142 of 195: Test _PMD (Power Meter Devices). > -method SKIPPED: Test 142, Skipping test for non-existent object > +method Test 147 of 200: Test _PMD (Power Meter Devices). > +method SKIPPED: Test 147, Skipping test for non-existent object > method _PMD. > method > -method Test 143 of 195: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 143, Skipping test for non-existent object > +method Test 148 of 200: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 148, Skipping test for non-existent object > method _PMM. > method > -method Test 144 of 195: Test _WPC (Wireless Power Calibration). > -method SKIPPED: Test 144, Skipping test for non-existent object > +method Test 149 of 200: Test _WPC (Wireless Power Calibration). > +method SKIPPED: Test 149, Skipping test for non-existent object > method _WPC. > method > -method Test 145 of 195: Test _WPP (Wireless Power Polling). > -method SKIPPED: Test 145, Skipping test for non-existent object > +method Test 150 of 200: Test _WPP (Wireless Power Polling). > +method SKIPPED: Test 150, Skipping test for non-existent object > method _WPP. > method > -method Test 146 of 195: Test _FIF (Fan Information). > -method SKIPPED: Test 146, Skipping test for non-existent object > +method Test 151 of 200: Test _FIF (Fan Information). > +method SKIPPED: Test 151, Skipping test for non-existent object > method _FIF. > method > -method Test 147 of 195: Test _FPS (Fan Performance States). > -method SKIPPED: Test 147, Skipping test for non-existent object > +method Test 152 of 200: Test _FPS (Fan Performance States). > +method SKIPPED: Test 152, Skipping test for non-existent object > method _FPS. > method > -method Test 148 of 195: Test _FSL (Fan Set Level). > -method SKIPPED: Test 148, Skipping test for non-existent object > +method Test 153 of 200: Test _FSL (Fan Set Level). > +method SKIPPED: Test 153, Skipping test for non-existent object > method _FSL. > method > -method Test 149 of 195: Test _FST (Fan Status). > -method SKIPPED: Test 149, Skipping test for non-existent object > +method Test 154 of 200: Test _FST (Fan Status). > +method SKIPPED: Test 154, Skipping test for non-existent object > method _FST. > method > -method Test 150 of 195: Test _ACx (Active Cooling). > -method SKIPPED: Test 150, Skipping test for non-existent object > +method Test 155 of 200: Test _ACx (Active Cooling). > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC0. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC1. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC2. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC3. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC4. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC5. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC6. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC7. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC8. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC9. > method > method > -method Test 151 of 195: Test _ART (Active Cooling Relationship > +method Test 156 of 200: Test _ART (Active Cooling Relationship > method Table). > -method SKIPPED: Test 151, Skipping test for non-existent object > +method SKIPPED: Test 156, Skipping test for non-existent object > method _ART. > method > -method Test 152 of 195: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 152, Skipping test for non-existent object > +method Test 157 of 200: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 157, Skipping test for non-existent object > method _CRT. > method > -method Test 153 of 195: Test _CR3 (Warm/Standby Temperature). > -method SKIPPED: Test 153, Skipping test for non-existent object > +method Test 158 of 200: Test _CR3 (Warm/Standby Temperature). > +method SKIPPED: Test 158, Skipping test for non-existent object > method _CR3. > method > -method Test 154 of 195: Test _DTI (Device Temperature > +method Test 159 of 200: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 154, Skipping test for non-existent object > +method SKIPPED: Test 159, Skipping test for non-existent object > method _DTI. > method > -method Test 155 of 195: Test _HOT (Hot Temperature). > -method SKIPPED: Test 155, Skipping test for non-existent object > +method Test 160 of 200: Test _HOT (Hot Temperature). > +method SKIPPED: Test 160, Skipping test for non-existent object > method _HOT. > method > -method Test 156 of 195: Test _MTL (Minimum Throttle Limit). > -method SKIPPED: Test 156, Skipping test for non-existent object > +method Test 161 of 200: Test _MTL (Minimum Throttle Limit). > +method SKIPPED: Test 161, Skipping test for non-existent object > method _MTL. > method > -method Test 157 of 195: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 157, Skipping test for non-existent object > +method Test 162 of 200: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 162, Skipping test for non-existent object > method _NTT. > method > -method Test 158 of 195: Test _PSL (Passive List). > -method SKIPPED: Test 158, Skipping test for non-existent object > +method Test 163 of 200: Test _PSL (Passive List). > +method SKIPPED: Test 163, Skipping test for non-existent object > method _PSL. > method > -method Test 159 of 195: Test _PSV (Passive Temp). > -method SKIPPED: Test 159, Skipping test for non-existent object > +method Test 164 of 200: Test _PSV (Passive Temp). > +method SKIPPED: Test 164, Skipping test for non-existent object > method _PSV. > method > -method Test 160 of 195: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 160, Skipping test for non-existent object > +method Test 165 of 200: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 165, Skipping test for non-existent object > method _RTV. > method > -method Test 161 of 195: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 161, Skipping test for non-existent object > +method Test 166 of 200: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 166, Skipping test for non-existent object > method _DTI. > method > -method Test 162 of 195: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 162, Skipping test for non-existent object > +method Test 167 of 200: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 167, Skipping test for non-existent object > method _TC1. > method > -method Test 163 of 195: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 163, Skipping test for non-existent object > +method Test 168 of 200: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 168, Skipping test for non-existent object > method _TC2. > method > -method Test 164 of 195: Test _TFP (Thermal fast Sampling Period). > -method SKIPPED: Test 164, Skipping test for non-existent object > +method Test 169 of 200: Test _TFP (Thermal fast Sampling Period). > +method SKIPPED: Test 169, Skipping test for non-existent object > method _TFP. > method > -method Test 165 of 195: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 165, Skipping test for non-existent object > +method Test 170 of 200: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 170, Skipping test for non-existent object > method _TMP. > method > -method Test 166 of 195: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 166, Skipping test for non-existent object > +method Test 171 of 200: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 171, Skipping test for non-existent object > method _TPT. > method > -method Test 167 of 195: Test _TRT (Thermal Relationship Table). > -method SKIPPED: Test 167, Skipping test for non-existent object > +method Test 172 of 200: Test _TRT (Thermal Relationship Table). > +method SKIPPED: Test 172, Skipping test for non-existent object > method _TRT. > method > -method Test 168 of 195: Test _TSN (Thermal Sensor Device). > -method SKIPPED: Test 168, Skipping test for non-existent object > +method Test 173 of 200: Test _TSN (Thermal Sensor Device). > +method SKIPPED: Test 173, Skipping test for non-existent object > method _TSN. > method > -method Test 169 of 195: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 169, Skipping test for non-existent object > +method Test 174 of 200: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 174, Skipping test for non-existent object > method _TSP. > method > -method Test 170 of 195: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 170, Skipping test for non-existent object > +method Test 175 of 200: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 175, Skipping test for non-existent object > method _TST. > method > -method Test 171 of 195: Test _TZD (Thermal Zone Devices). > -method SKIPPED: Test 171, Skipping test for non-existent object > +method Test 176 of 200: Test _TZD (Thermal Zone Devices). > +method SKIPPED: Test 176, Skipping test for non-existent object > method _TZD. > method > -method Test 172 of 195: Test _TZM (Thermal Zone member). > -method SKIPPED: Test 172, Skipping test for non-existent object > +method Test 177 of 200: Test _TZM (Thermal Zone member). > +method SKIPPED: Test 177, Skipping test for non-existent object > method _TZM. > method > -method Test 173 of 195: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 173, Skipping test for non-existent object > +method Test 178 of 200: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 178, Skipping test for non-existent object > method _TZP. > method > -method Test 174 of 195: Test _GPE (General Purpose Events). > -method PASSED: Test 174, \_SB_.PCI0.LPCB.EC0_._GPE returned an > +method Test 179 of 200: Test _GPE (General Purpose Events). > +method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an > method integer 0x0000001c > method > -method Test 175 of 195: Test _EC_ (EC Offset Query). > -method SKIPPED: Test 175, Skipping test for non-existent object > +method Test 180 of 200: Test _EC_ (EC Offset Query). > +method SKIPPED: Test 180, Skipping test for non-existent object > method _EC_. > method > -method Test 176 of 195: Test _PTS (Prepare to Sleep). > +method Test 181 of 200: Test _PTS (Prepare to Sleep). > method Test _PTS(3). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method > -method Test 177 of 195: Test _TTS (Transition to State). > -method SKIPPED: Test 177, Optional control method _TTS does not > +method Test 182 of 200: Test _TTS (Transition to State). > +method SKIPPED: Test 182, Optional control method _TTS does not > method exist. > method > -method Test 178 of 195: Test _WAK (System Wake). > +method Test 183 of 200: Test _WAK (System Wake). > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 179 of 195: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 184 of 200: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 180 of 195: Test _BCL (Query List of Brightness > +method Test 185 of 200: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 181 of 195: Test _BCM (Set Brightness Level). > -method PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 186 of 200: Test _BCM (Set Brightness Level). > +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 182 of 195: Test _BQC (Brightness Query Current > +method Test 187 of 200: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 183 of 195: Test _DCS (Return the Status of Output > +method Test 188 of 200: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 184 of 195: Test _DDC (Return the EDID for this > +method Test 189 of 200: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 184, Skipping test for non-existent object > +method SKIPPED: Test 189, Skipping test for non-existent object > method _DDC. > method > -method Test 185 of 195: Test _DSS (Device Set State). > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 190 of 200: Test _DSS (Device Set State). > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 186 of 195: Test _DGS (Query Graphics State). > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 191 of 200: Test _DGS (Query Graphics State). > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 187 of 195: Test _DOD (Enumerate All Devices Attached > +method Test 192 of 200: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1276,7 +1300,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1313,45 +1337,45 @@ method Type of display: 0 (Other) > method BIOS can detect device: 1 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 188 of 195: Test _DOS (Enable/Disable Output > +method Test 193 of 200: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 189 of 195: Test _GPD (Get POST Device). > -method SKIPPED: Test 189, Skipping test for non-existent object > +method Test 194 of 200: Test _GPD (Get POST Device). > +method SKIPPED: Test 194, Skipping test for non-existent object > method _GPD. > method > -method Test 190 of 195: Test _ROM (Get ROM Data). > -method SKIPPED: Test 190, Skipping test for non-existent object > +method Test 195 of 200: Test _ROM (Get ROM Data). > +method SKIPPED: Test 195, Skipping test for non-existent object > method _ROM. > method > -method Test 191 of 195: Test _SPD (Set POST Device). > -method SKIPPED: Test 191, Skipping test for non-existent object > +method Test 196 of 200: Test _SPD (Set POST Device). > +method SKIPPED: Test 196, Skipping test for non-existent object > method _SPD. > method > -method Test 192 of 195: Test _VPO (Video POST Options). > -method SKIPPED: Test 192, Skipping test for non-existent object > +method Test 197 of 200: Test _VPO (Video POST Options). > +method SKIPPED: Test 197, Skipping test for non-existent object > method _VPO. > method > -method Test 193 of 195: Test _CBA (Configuration Base Address). > -method SKIPPED: Test 193, Skipping test for non-existent object > +method Test 198 of 200: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 198, Skipping test for non-existent object > method _CBA. > method > -method Test 194 of 195: Test _IFT (IPMI Interface Type). > -method SKIPPED: Test 194, Skipping test for non-existent object > +method Test 199 of 200: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 199, Skipping test for non-existent object > method _IFT. > method > -method Test 195 of 195: Test _SRV (IPMI Interface Revision). > -method SKIPPED: Test 195, Skipping test for non-existent object > +method Test 200 of 200: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 200, Skipping test for non-existent object > method _SRV. > method > method ========================================================== > -method 260 passed, 0 failed, 0 warning, 0 aborted, 157 skipped, 0 > +method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0 > method info only. > method ========================================================== > I'll ack these once the V2 of the patch 7 is out.
On 08/02/2019 03:23, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/method-0001/method-0001.log | 748 +++++++++++++------------- > 1 file changed, 386 insertions(+), 362 deletions(-) > > diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log > index ba25c50e..5d8b4f0a 100644 > --- a/fwts-test/method-0001/method-0001.log > +++ b/fwts-test/method-0001/method-0001.log > @@ -1,41 +1,41 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 195: Test Method Names. > +method Test 1 of 200: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 195: Test _AEI. > +method Test 2 of 200: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existent object > method _AEI. > method > -method Test 3 of 195: Test _EVT (Event Method). > +method Test 3 of 200: Test _EVT (Event Method). > method SKIPPED: Test 3, Skipping test for non-existent object > method _EVT. > method > -method Test 4 of 195: Test _DLM (Device Lock Mutex). > +method Test 4 of 200: Test _DLM (Device Lock Mutex). > method SKIPPED: Test 4, Skipping test for non-existent object > method _DLM. > method > -method Test 5 of 195: Test _PIC (Inform AML of Interrupt Model). > +method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model). > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method > -method Test 6 of 195: Test _CID (Compatible ID). > +method Test 6 of 200: Test _CID (Compatible ID). > method PASSED: Test 6, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 7 of 195: Test _CLS (Class Code). > +method Test 7 of 200: Test _CLS (Class Code). > method SKIPPED: Test 7, Skipping test for non-existent object > method _CLS. > method > -method Test 8 of 195: Test _DDN (DOS Device Name). > +method Test 8 of 200: Test _DDN (DOS Device Name). > method SKIPPED: Test 8, Skipping test for non-existent object > method _DDN. > method > -method Test 9 of 195: Test _HID (Hardware ID). > +method Test 9 of 200: Test _HID (Hardware ID). > method PASSED: Test 9, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 9, \_SB_.LID0._HID returned an integer > @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 10 of 195: Test _HRV (Hardware Revision Number). > +method Test 10 of 200: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 10, Skipping test for non-existent object > method _HRV. > method > -method Test 11 of 195: Test _MLS (Multiple Language String). > +method Test 11 of 200: Test _MLS (Multiple Language String). > method SKIPPED: Test 11, Skipping test for non-existent object > method _MLS. > method > -method Test 12 of 195: Test _PLD (Physical Device Location). > +method Test 12 of 200: Test _PLD (Physical Device Location). > method SKIPPED: Test 12, Skipping test for non-existent object > method _PLD. > method > -method Test 13 of 195: Test _SUB (Subsystem ID). > +method Test 13 of 200: Test _SUB (Subsystem ID). > method SKIPPED: Test 13, Skipping test for non-existent object > method _SUB. > method > -method Test 14 of 195: Test _SUN (Slot User Number). > +method Test 14 of 200: Test _SUN (Slot User Number). > method SKIPPED: Test 14, Skipping test for non-existent object > method _SUN. > method > -method Test 15 of 195: Test _STR (String). > +method Test 15 of 200: Test _STR (String). > method SKIPPED: Test 15, Skipping test for non-existent object > method _STR. > method > -method Test 16 of 195: Test _UID (Unique ID). > +method Test 16 of 200: Test _UID (Unique ID). > method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned > @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. > method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 17 of 195: Test _CDM (Clock Domain). > +method Test 17 of 200: Test _CDM (Clock Domain). > method SKIPPED: Test 17, Skipping test for non-existent object > method _CDM. > method > -method Test 18 of 195: Test _CRS (Current Resource Settings). > +method Test 18 of 200: Test _CRS (Current Resource Settings). > method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -187,11 +187,11 @@ method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 19 of 195: Test _DSD (Device Specific Data). > +method Test 19 of 200: Test _DSD (Device Specific Data). > method SKIPPED: Test 19, Skipping test for non-existent object > method _DSD. > method > -method Test 20 of 195: Test _DIS (Disable). > +method Test 20 of 200: Test _DIS (Disable). > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -209,24 +209,24 @@ method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 21 of 195: Test _DMA (Direct Memory Access). > +method Test 21 of 200: Test _DMA (Direct Memory Access). > method SKIPPED: Test 21, Skipping test for non-existent object > method _DMA. > method > -method Test 22 of 195: Test _FIX (Fixed Register Resource > +method Test 22 of 200: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 22, Skipping test for non-existent object > method _FIX. > method > -method Test 23 of 195: Test _GSB (Global System Interrupt Base). > +method Test 23 of 200: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 23, Skipping test for non-existent object > method _GSB. > method > -method Test 24 of 195: Test _HPP (Hot Plug Parameters). > +method Test 24 of 200: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 24, Skipping test for non-existent object > method _HPP. > method > -method Test 25 of 195: Test _PRS (Possible Resource Settings). > +method Test 25 of 200: Test _PRS (Possible Resource Settings). > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -244,7 +244,7 @@ method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 26 of 195: Test _PRT (PCI Routing Table). > +method Test 26 of 200: Test _PRT (PCI Routing Table). > method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane > method looking package. > method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a > @@ -264,51 +264,51 @@ method sane looking package. > method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a > method sane looking package. > method > -method Test 27 of 195: Test _PXM (Proximity). > +method Test 27 of 200: Test _PXM (Proximity). > method SKIPPED: Test 27, Skipping test for non-existent object > method _PXM. > method > -method Test 28 of 195: Test _CCA (Cache Coherency Attribute). > +method Test 28 of 200: Test _CCA (Cache Coherency Attribute). > method SKIPPED: Test 28, Skipping test for non-existent object > method _CCA. > method > -method Test 29 of 195: Test _EDL (Eject Device List). > +method Test 29 of 200: Test _EDL (Eject Device List). > method SKIPPED: Test 29, Skipping test for non-existent object > method _EDL. > method > -method Test 30 of 195: Test _EJD (Ejection Dependent Device). > +method Test 30 of 200: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 30, Skipping test for non-existent object > method _EJD. > method > -method Test 31 of 195: Test _EJ0 (Eject). > +method Test 31 of 200: Test _EJ0 (Eject). > method SKIPPED: Test 31, Skipping test for non-existent object > method _EJ0. > method > -method Test 32 of 195: Test _EJ1 (Eject). > +method Test 32 of 200: Test _EJ1 (Eject). > method SKIPPED: Test 32, Skipping test for non-existent object > method _EJ1. > method > -method Test 33 of 195: Test _EJ2 (Eject). > +method Test 33 of 200: Test _EJ2 (Eject). > method SKIPPED: Test 33, Skipping test for non-existent object > method _EJ2. > method > -method Test 34 of 195: Test _EJ3 (Eject). > +method Test 34 of 200: Test _EJ3 (Eject). > method SKIPPED: Test 34, Skipping test for non-existent object > method _EJ3. > method > -method Test 35 of 195: Test _EJ4 (Eject). > +method Test 35 of 200: Test _EJ4 (Eject). > method SKIPPED: Test 35, Skipping test for non-existent object > method _EJ4. > method > -method Test 36 of 195: Test _LCK (Lock). > +method Test 36 of 200: Test _LCK (Lock). > method SKIPPED: Test 36, Skipping test for non-existent object > method _LCK. > method > -method Test 37 of 195: Test _RMV (Remove). > +method Test 37 of 200: Test _RMV (Remove). > method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 38 of 195: Test _STA (Status). > +method Test 38 of 200: Test _STA (Status). > method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000. > method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 39 of 195: Test _DEP (Operational Region > +method Test 39 of 200: Test _DEP (Operational Region > method Dependencies). > method SKIPPED: Test 39, Skipping test for non-existent object > method _DEP. > method > -method Test 40 of 195: Test _FIT (Firmware Interface Table). > +method Test 40 of 200: Test _FIT (Firmware Interface Table). > method SKIPPED: Test 40, Skipping test for non-existent object > method _FIT. > method > -method Test 41 of 195: Test _BDN (BIOS Dock Name). > +method Test 41 of 200: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 41, Skipping test for non-existent object > method _BDN. > method > -method Test 42 of 195: Test _BBN (Base Bus Number). > +method Test 42 of 200: Test _BBN (Base Bus Number). > method SKIPPED: Test 42, Skipping test for non-existent object > method _BBN. > method > -method Test 43 of 195: Test _DCK (Dock). > +method Test 43 of 200: Test _DCK (Dock). > method SKIPPED: Test 43, Skipping test for non-existent object > method _DCK. > method > -method Test 44 of 195: Test _INI (Initialize). > +method Test 44 of 200: Test _INI (Initialize). > method PASSED: Test 44, \_SB_._INI returned no values as > method expected. > method > -method Test 45 of 195: Test _GLK (Global Lock). > +method Test 45 of 200: Test _GLK (Global Lock). > method SKIPPED: Test 45, Skipping test for non-existent object > method _GLK. > method > -method Test 46 of 195: Test _SEG (Segment). > +method Test 46 of 200: Test _SEG (Segment). > method SKIPPED: Test 46, Skipping test for non-existent object > method _SEG. > method > -method Test 47 of 195: Test _LSI (Label Storage Information). > +method Test 47 of 200: Test _LSI (Label Storage Information). > method SKIPPED: Test 47, Skipping test for non-existent object > method _LSI. > method > -method Test 48 of 195: Test _OFF (Set resource off). > +method Test 48 of 200: Test _OFF (Set resource off). > method SKIPPED: Test 48, Skipping test for non-existent object > method _OFF. > method > -method Test 49 of 195: Test _ON_ (Set resource on). > +method Test 49 of 200: Test _ON_ (Set resource on). > method SKIPPED: Test 49, Skipping test for non-existent object > method _ON_. > method > -method Test 50 of 195: Test _DSW (Device Sleep Wake). > +method Test 50 of 200: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 50, Skipping test for non-existent object > method _DSW. > method > -method Test 51 of 195: Test _IRC (In Rush Current). > +method Test 51 of 200: Test _IRC (In Rush Current). > method SKIPPED: Test 51, Skipping test for non-existent object > method _IRC. > method > -method Test 52 of 195: Test _PRE (Power Resources for > +method Test 52 of 200: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 52, Skipping test for non-existent object > method _PRE. > method > -method Test 53 of 195: Test _PR0 (Power Resources for D0). > +method Test 53 of 200: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 53, Skipping test for non-existent object > method _PR0. > method > -method Test 54 of 195: Test _PR1 (Power Resources for D1). > +method Test 54 of 200: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 54, Skipping test for non-existent object > method _PR1. > method > -method Test 55 of 195: Test _PR2 (Power Resources for D2). > +method Test 55 of 200: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 55, Skipping test for non-existent object > method _PR2. > method > -method Test 56 of 195: Test _PR3 (Power Resources for D3). > +method Test 56 of 200: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 56, Skipping test for non-existent object > method _PR3. > method > -method Test 57 of 195: Test _PRW (Power Resources for Wake). > +method Test 57 of 200: Test _PRW (Power Resources for Wake). > method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a > method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly > @@ -426,34 +426,34 @@ method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a > method sane looking package. > method > -method Test 58 of 195: Test _PS0 (Power State 0). > +method Test 58 of 200: Test _PS0 (Power State 0). > method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 58, \_PS0 returned no values as expected. > method > -method Test 59 of 195: Test _PS1 (Power State 1). > +method Test 59 of 200: Test _PS1 (Power State 1). > method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 60 of 195: Test _PS2 (Power State 2). > +method Test 60 of 200: Test _PS2 (Power State 2). > method SKIPPED: Test 60, Skipping test for non-existent object > method _PS2. > method > -method Test 61 of 195: Test _PS3 (Power State 3). > +method Test 61 of 200: Test _PS3 (Power State 3). > method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 61, \_PS3 returned no values as expected. > method > -method Test 62 of 195: Test _PSC (Power State Current). > +method Test 62 of 200: Test _PSC (Power State Current). > method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 62, \_PSC correctly returned an integer. > method > -method Test 63 of 195: Test _PSE (Power State for Enumeration). > +method Test 63 of 200: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 63, Skipping test for non-existent object > method _PSE. > method > -method Test 64 of 195: Test _PSW (Power State Wake). > +method Test 64 of 200: Test _PSW (Power State Wake). > method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values > @@ -465,15 +465,15 @@ method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 65 of 195: Test _S1D (S1 Device State). > +method Test 65 of 200: Test _S1D (S1 Device State). > method SKIPPED: Test 65, Skipping test for non-existent object > method _S1D. > method > -method Test 66 of 195: Test _S2D (S2 Device State). > +method Test 66 of 200: Test _S2D (S2 Device State). > method SKIPPED: Test 66, Skipping test for non-existent object > method _S2D. > method > -method Test 67 of 195: Test _S3D (S3 Device State). > +method Test 67 of 200: Test _S3D (S3 Device State). > method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned > @@ -491,7 +491,7 @@ method an integer. > method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 68 of 195: Test _S4D (S4 Device State). > +method Test 68 of 200: Test _S4D (S4 Device State). > method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned > @@ -509,132 +509,132 @@ method an integer. > method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 69 of 195: Test _S0W (S0 Device Wake State). > +method Test 69 of 200: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 69, Skipping test for non-existent object > method _S0W. > method > -method Test 70 of 195: Test _S1W (S1 Device Wake State). > +method Test 70 of 200: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 70, Skipping test for non-existent object > method _S1W. > method > -method Test 71 of 195: Test _S2W (S2 Device Wake State). > +method Test 71 of 200: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 71, Skipping test for non-existent object > method _S2W. > method > -method Test 72 of 195: Test _S3W (S3 Device Wake State). > +method Test 72 of 200: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 72, Skipping test for non-existent object > method _S3W. > method > -method Test 73 of 195: Test _S4W (S4 Device Wake State). > +method Test 73 of 200: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 73, Skipping test for non-existent object > method _S4W. > method > -method Test 74 of 195: Test _RST (Device Reset). > +method Test 74 of 200: Test _RST (Device Reset). > method SKIPPED: Test 74, Skipping test for non-existent object > method _RST. > method > -method Test 75 of 195: Test _PRR (Power Resource for Reset). > +method Test 75 of 200: Test _PRR (Power Resource for Reset). > method SKIPPED: Test 75, Skipping test for non-existent object > method _PRR. > method > -method Test 76 of 195: Test _S0_ (S0 System State). > +method Test 76 of 200: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 76, \_S0_ correctly returned a sane looking > method package. > method > -method Test 77 of 195: Test _S1_ (S1 System State). > +method Test 77 of 200: Test _S1_ (S1 System State). > method SKIPPED: Test 77, Skipping test for non-existent object > method _S1_. > method > -method Test 78 of 195: Test _S2_ (S2 System State). > +method Test 78 of 200: Test _S2_ (S2 System State). > method SKIPPED: Test 78, Skipping test for non-existent object > method _S2_. > method > -method Test 79 of 195: Test _S3_ (S3 System State). > +method Test 79 of 200: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 79, \_S3_ correctly returned a sane looking > method package. > method > -method Test 80 of 195: Test _S4_ (S4 System State). > +method Test 80 of 200: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 80, \_S4_ correctly returned a sane looking > method package. > method > -method Test 81 of 195: Test _S5_ (S5 System State). > +method Test 81 of 200: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 81, \_S5_ correctly returned a sane looking > method package. > method > -method Test 82 of 195: Test _SWS (System Wake Source). > +method Test 82 of 200: Test _SWS (System Wake Source). > method SKIPPED: Test 82, Skipping test for non-existent object > method _SWS. > method > -method Test 83 of 195: Test _PSS (Performance Supported States). > +method Test 83 of 200: Test _PSS (Performance Supported States). > method SKIPPED: Test 83, Skipping test for non-existent object > method _PSS. > method > -method Test 84 of 195: Test _CPC (Continuous Performance > +method Test 84 of 200: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 84, Skipping test for non-existent object > method _CPC. > method > -method Test 85 of 195: Test _CSD (C State Dependencies). > +method Test 85 of 200: Test _CSD (C State Dependencies). > method SKIPPED: Test 85, Skipping test for non-existent object > method _CSD. > method > -method Test 86 of 195: Test _CST (C States). > +method Test 86 of 200: Test _CST (C States). > method SKIPPED: Test 86, Skipping test for non-existent object > method _CST. > method > -method Test 87 of 195: Test _PCT (Performance Control). > +method Test 87 of 200: Test _PCT (Performance Control). > method SKIPPED: Test 87, Skipping test for non-existent object > method _PCT. > method > -method Test 88 of 195: Test _PDL (P-State Depth Limit). > +method Test 88 of 200: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 88, Skipping test for non-existent object > method _PDL. > method > -method Test 89 of 195: Test _PPC (Performance Present > +method Test 89 of 200: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 89, Skipping test for non-existent object > method _PPC. > method > -method Test 90 of 195: Test _PPE (Polling for Platform Error). > +method Test 90 of 200: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 90, Skipping test for non-existent object > method _PPE. > method > -method Test 91 of 195: Test _PSD (Power State Dependencies). > +method Test 91 of 200: Test _PSD (Power State Dependencies). > method SKIPPED: Test 91, Skipping test for non-existent object > method _PSD. > method > -method Test 92 of 195: Test _PTC (Processor Throttling Control). > +method Test 92 of 200: Test _PTC (Processor Throttling Control). > method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane > method looking package. > method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane > method looking package. > method > -method Test 93 of 195: Test _TDL (T-State Depth Limit). > +method Test 93 of 200: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 93, Skipping test for non-existent object > method _TDL. > method > -method Test 94 of 195: Test _TPC (Throttling Present > +method Test 94 of 200: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 95 of 195: Test _TSD (Throttling State Dependencies). > +method Test 95 of 200: Test _TSD (Throttling State Dependencies). > method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 96 of 195: Test _TSS (Throttling Supported States). > +method Test 96 of 200: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00 > method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 97 of 195: Test _LPI (Low Power Idle States). > +method Test 97 of 200: Test _LPI (Low Power Idle States). > method SKIPPED: Test 97, Skipping test for non-existent object > method _LPI. > method > -method Test 98 of 195: Test _RDI (Resource Dependencies for > +method Test 98 of 200: Test _RDI (Resource Dependencies for > method Idle). > method SKIPPED: Test 98, Skipping test for non-existent object > method _RDI. > method > -method Test 99 of 195: Test _PUR (Processor Utilization Request). > +method Test 99 of 200: Test _PUR (Processor Utilization Request). > method SKIPPED: Test 99, Skipping test for non-existent object > method _PUR. > method > -method Test 100 of 195: Test _MSG (Message). > +method Test 100 of 200: Test _MSG (Message). > method SKIPPED: Test 100, Skipping test for non-existent object > method _MSG. > method > -method Test 101 of 195: Test _SST (System Status). > +method Test 101 of 200: Test _SST (System Status). > method SKIPPED: Test 101, Skipping test for non-existent object > method _SST. > method > -method Test 102 of 195: Test _ALC (Ambient Light Colour > +method Test 102 of 200: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 102, Skipping test for non-existent object > method _ALC. > method > -method Test 103 of 195: Test _ALI (Ambient Light Illuminance). > +method Test 103 of 200: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 103, Skipping test for non-existent object > method _ALI. > method > -method Test 104 of 195: Test _ALT (Ambient Light Temperature). > +method Test 104 of 200: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 104, Skipping test for non-existent object > method _ALT. > method > -method Test 105 of 195: Test _ALP (Ambient Light Polling). > +method Test 105 of 200: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 105, Skipping test for non-existent object > method _ALP. > method > -method Test 106 of 195: Test _ALR (Ambient Light Response). > +method Test 106 of 200: Test _ALR (Ambient Light Response). > method SKIPPED: Test 106, Skipping test for non-existent object > method _ALR. > method > -method Test 107 of 195: Test _LID (Lid Status). > +method Test 107 of 200: Test _LID (Lid Status). > method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 108 of 195: Test _GTF (Get Task File). > +method Test 108 of 200: Test _GTF (Get Task File). > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly > method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly > @@ -720,540 +720,564 @@ method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly > method returned a sane looking buffer. > method > -method Test 109 of 195: Test _GTM (Get Timing Mode). > +method Test 109 of 200: Test _GTM (Get Timing Mode). > method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly > method returned a sane looking buffer. > method > -method Test 110 of 195: Test _MBM (Memory Bandwidth Monitoring > +method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring > method Data). > method SKIPPED: Test 110, Skipping test for non-existent object > method _MBM. > method > -method Test 111 of 195: Test _UPC (USB Port Capabilities). > +method Test 111 of 200: Test _UPC (USB Port Capabilities). > method SKIPPED: Test 111, Skipping test for non-existent object > method _UPC. > method > -method Test 112 of 195: Test _UPD (User Presence Detect). > +method Test 112 of 200: Test _UPD (User Presence Detect). > method SKIPPED: Test 112, Skipping test for non-existent object > method _UPD. > method > -method Test 113 of 195: Test _UPP (User Presence Polling). > +method Test 113 of 200: Test _UPP (User Presence Polling). > method SKIPPED: Test 113, Skipping test for non-existent object > method _UPP. > method > -method Test 114 of 195: Test _GCP (Get Capabilities). > +method Test 114 of 200: Test _GCP (Get Capabilities). > method SKIPPED: Test 114, Skipping test for non-existent object > method _GCP. > method > -method Test 115 of 195: Test _GRT (Get Real Time). > +method Test 115 of 200: Test _GRT (Get Real Time). > method SKIPPED: Test 115, Skipping test for non-existent object > method _GRT. > method > -method Test 116 of 195: Test _GWS (Get Wake Status). > +method Test 116 of 200: Test _GWS (Get Wake Status). > method SKIPPED: Test 116, Skipping test for non-existent object > method _GWS. > method > -method Test 117 of 195: Test _CWS (Clear Wake Status). > +method Test 117 of 200: Test _CWS (Clear Wake Status). > method SKIPPED: Test 117, Skipping test for non-existent object > method _CWS. > method > -method Test 118 of 195: Test _SRT (Set Real Time). > +method Test 118 of 200: Test _SRT (Set Real Time). > method SKIPPED: Test 118, Skipping test for non-existent object > method _SRT. > method > -method Test 119 of 195: Test _STP (Set Expired Timer Wake > +method Test 119 of 200: Test _STP (Set Expired Timer Wake > method Policy). > method SKIPPED: Test 119, Skipping test for non-existent object > method _STP. > method > -method Test 120 of 195: Test _STV (Set Timer Value). > +method Test 120 of 200: Test _STV (Set Timer Value). > method SKIPPED: Test 120, Skipping test for non-existent object > method _STV. > method > -method Test 121 of 195: Test _TIP (Expired Timer Wake Policy). > +method Test 121 of 200: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 121, Skipping test for non-existent object > method _TIP. > method > -method Test 122 of 195: Test _TIV (Timer Values). > +method Test 122 of 200: Test _TIV (Timer Values). > method SKIPPED: Test 122, Skipping test for non-existent object > method _TIV. > method > -method Test 123 of 195: Test _SBS (Smart Battery Subsystem). > +method Test 123 of 200: Test _NBS (NVDIMM Boot Status). > method SKIPPED: Test 123, Skipping test for non-existent object > -method _SBS. > +method _NBS. > method > -method Test 124 of 195: Test _BCT (Battery Charge Time). > +method Test 124 of 200: Test _NCH (NVDIMM Current Health > +method Information). > method SKIPPED: Test 124, Skipping test for non-existent object > +method _NCH. > +method > +method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection > +method Capabilities). > +method SKIPPED: Test 125, Skipping test for non-existent object > +method _NIC. > +method > +method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health > +method Errors). > +method SKIPPED: Test 126, Skipping test for non-existent object > +method _NIH. > +method > +method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error > +method Status). > +method SKIPPED: Test 127, Skipping test for non-existent object > +method _NIG. > +method > +method Test 128 of 200: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 128, Skipping test for non-existent object > +method _SBS. > +method > +method Test 129 of 200: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 129, Skipping test for non-existent object > method _BCT. > method > -method Test 125 of 195: Test _BIF (Battery Information). > -method PASSED: Test 125, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 130 of 200: Test _BIF (Battery Information). > +method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 126 of 195: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 126, Skipping test for non-existent object > +method Test 131 of 200: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 131, Skipping test for non-existent object > method _BIX. > method > -method Test 127 of 195: Test _BMA (Battery Measurement > +method Test 132 of 200: Test _BMA (Battery Measurement > method Averaging). > -method SKIPPED: Test 127, Skipping test for non-existent object > +method SKIPPED: Test 132, Skipping test for non-existent object > method _BMA. > method > -method Test 128 of 195: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 128, Skipping test for non-existent object > +method Test 133 of 200: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 133, Skipping test for non-existent object > method _BMC. > method > -method Test 129 of 195: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 129, Skipping test for non-existent object > +method Test 134 of 200: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 134, Skipping test for non-existent object > method _BMD. > method > -method Test 130 of 195: Test _BMS (Battery Measurement Sampling > +method Test 135 of 200: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 130, Skipping test for non-existent object > +method SKIPPED: Test 135, Skipping test for non-existent object > method _BMS. > method > -method Test 131 of 195: Test _BST (Battery Status). > -method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 136 of 200: Test _BST (Battery Status). > +method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 132 of 195: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 132, Skipping test for non-existent object > +method Test 137 of 200: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 137, Skipping test for non-existent object > method _BTP. > method > -method Test 133 of 195: Test _BTH (Battery Throttle Limit). > -method SKIPPED: Test 133, Skipping test for non-existent object > +method Test 138 of 200: Test _BTH (Battery Throttle Limit). > +method SKIPPED: Test 138, Skipping test for non-existent object > method _BTH. > method > -method Test 134 of 195: Test _BTM (Battery Time). > -method SKIPPED: Test 134, Skipping test for non-existent object > +method Test 139 of 200: Test _BTM (Battery Time). > +method SKIPPED: Test 139, Skipping test for non-existent object > method _BTM. > method > -method Test 135 of 195: Test _PCL (Power Consumer List). > -method PASSED: Test 135, \_SB_.PCI0.LPCB.ACAD._PCL returned a > +method Test 140 of 200: Test _PCL (Power Consumer List). > +method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a > method sane package of 1 references. > -method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._PCL returned a > +method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a > method sane package of 1 references. > method > -method Test 136 of 195: Test _PIF (Power Source Information). > -method SKIPPED: Test 136, Skipping test for non-existent object > +method Test 141 of 200: Test _PIF (Power Source Information). > +method SKIPPED: Test 141, Skipping test for non-existent object > method _PIF. > method > -method Test 137 of 195: Test _PRL (Power Source Redundancy List). > -method SKIPPED: Test 137, Skipping test for non-existent object > +method Test 142 of 200: Test _PRL (Power Source Redundancy List). > +method SKIPPED: Test 142, Skipping test for non-existent object > method _PRL. > method > -method Test 138 of 195: Test _PSR (Power Source). > -method PASSED: Test 138, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 143 of 200: Test _PSR (Power Source). > +method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 139 of 195: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 139, Skipping test for non-existent object > +method Test 144 of 200: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 144, Skipping test for non-existent object > method _GAI. > method > -method Test 140 of 195: Test _GHL (Get Harware Limit). > -method SKIPPED: Test 140, Skipping test for non-existent object > +method Test 145 of 200: Test _GHL (Get Harware Limit). > +method SKIPPED: Test 145, Skipping test for non-existent object > method _GHL. > method > -method Test 141 of 195: Test _PMC (Power Meter Capabilities). > -method SKIPPED: Test 141, Skipping test for non-existent object > +method Test 146 of 200: Test _PMC (Power Meter Capabilities). > +method SKIPPED: Test 146, Skipping test for non-existent object > method _PMC. > method > -method Test 142 of 195: Test _PMD (Power Meter Devices). > -method SKIPPED: Test 142, Skipping test for non-existent object > +method Test 147 of 200: Test _PMD (Power Meter Devices). > +method SKIPPED: Test 147, Skipping test for non-existent object > method _PMD. > method > -method Test 143 of 195: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 143, Skipping test for non-existent object > +method Test 148 of 200: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 148, Skipping test for non-existent object > method _PMM. > method > -method Test 144 of 195: Test _WPC (Wireless Power Calibration). > -method SKIPPED: Test 144, Skipping test for non-existent object > +method Test 149 of 200: Test _WPC (Wireless Power Calibration). > +method SKIPPED: Test 149, Skipping test for non-existent object > method _WPC. > method > -method Test 145 of 195: Test _WPP (Wireless Power Polling). > -method SKIPPED: Test 145, Skipping test for non-existent object > +method Test 150 of 200: Test _WPP (Wireless Power Polling). > +method SKIPPED: Test 150, Skipping test for non-existent object > method _WPP. > method > -method Test 146 of 195: Test _FIF (Fan Information). > -method SKIPPED: Test 146, Skipping test for non-existent object > +method Test 151 of 200: Test _FIF (Fan Information). > +method SKIPPED: Test 151, Skipping test for non-existent object > method _FIF. > method > -method Test 147 of 195: Test _FPS (Fan Performance States). > -method SKIPPED: Test 147, Skipping test for non-existent object > +method Test 152 of 200: Test _FPS (Fan Performance States). > +method SKIPPED: Test 152, Skipping test for non-existent object > method _FPS. > method > -method Test 148 of 195: Test _FSL (Fan Set Level). > -method SKIPPED: Test 148, Skipping test for non-existent object > +method Test 153 of 200: Test _FSL (Fan Set Level). > +method SKIPPED: Test 153, Skipping test for non-existent object > method _FSL. > method > -method Test 149 of 195: Test _FST (Fan Status). > -method SKIPPED: Test 149, Skipping test for non-existent object > +method Test 154 of 200: Test _FST (Fan Status). > +method SKIPPED: Test 154, Skipping test for non-existent object > method _FST. > method > -method Test 150 of 195: Test _ACx (Active Cooling). > -method SKIPPED: Test 150, Skipping test for non-existent object > +method Test 155 of 200: Test _ACx (Active Cooling). > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC0. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC1. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC2. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC3. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC4. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC5. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC6. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC7. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC8. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC9. > method > method > -method Test 151 of 195: Test _ART (Active Cooling Relationship > +method Test 156 of 200: Test _ART (Active Cooling Relationship > method Table). > -method SKIPPED: Test 151, Skipping test for non-existent object > +method SKIPPED: Test 156, Skipping test for non-existent object > method _ART. > method > -method Test 152 of 195: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 152, Skipping test for non-existent object > +method Test 157 of 200: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 157, Skipping test for non-existent object > method _CRT. > method > -method Test 153 of 195: Test _CR3 (Warm/Standby Temperature). > -method SKIPPED: Test 153, Skipping test for non-existent object > +method Test 158 of 200: Test _CR3 (Warm/Standby Temperature). > +method SKIPPED: Test 158, Skipping test for non-existent object > method _CR3. > method > -method Test 154 of 195: Test _DTI (Device Temperature > +method Test 159 of 200: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 154, Skipping test for non-existent object > +method SKIPPED: Test 159, Skipping test for non-existent object > method _DTI. > method > -method Test 155 of 195: Test _HOT (Hot Temperature). > -method SKIPPED: Test 155, Skipping test for non-existent object > +method Test 160 of 200: Test _HOT (Hot Temperature). > +method SKIPPED: Test 160, Skipping test for non-existent object > method _HOT. > method > -method Test 156 of 195: Test _MTL (Minimum Throttle Limit). > -method SKIPPED: Test 156, Skipping test for non-existent object > +method Test 161 of 200: Test _MTL (Minimum Throttle Limit). > +method SKIPPED: Test 161, Skipping test for non-existent object > method _MTL. > method > -method Test 157 of 195: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 157, Skipping test for non-existent object > +method Test 162 of 200: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 162, Skipping test for non-existent object > method _NTT. > method > -method Test 158 of 195: Test _PSL (Passive List). > -method SKIPPED: Test 158, Skipping test for non-existent object > +method Test 163 of 200: Test _PSL (Passive List). > +method SKIPPED: Test 163, Skipping test for non-existent object > method _PSL. > method > -method Test 159 of 195: Test _PSV (Passive Temp). > -method SKIPPED: Test 159, Skipping test for non-existent object > +method Test 164 of 200: Test _PSV (Passive Temp). > +method SKIPPED: Test 164, Skipping test for non-existent object > method _PSV. > method > -method Test 160 of 195: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 160, Skipping test for non-existent object > +method Test 165 of 200: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 165, Skipping test for non-existent object > method _RTV. > method > -method Test 161 of 195: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 161, Skipping test for non-existent object > +method Test 166 of 200: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 166, Skipping test for non-existent object > method _DTI. > method > -method Test 162 of 195: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 162, Skipping test for non-existent object > +method Test 167 of 200: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 167, Skipping test for non-existent object > method _TC1. > method > -method Test 163 of 195: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 163, Skipping test for non-existent object > +method Test 168 of 200: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 168, Skipping test for non-existent object > method _TC2. > method > -method Test 164 of 195: Test _TFP (Thermal fast Sampling Period). > -method SKIPPED: Test 164, Skipping test for non-existent object > +method Test 169 of 200: Test _TFP (Thermal fast Sampling Period). > +method SKIPPED: Test 169, Skipping test for non-existent object > method _TFP. > method > -method Test 165 of 195: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 165, Skipping test for non-existent object > +method Test 170 of 200: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 170, Skipping test for non-existent object > method _TMP. > method > -method Test 166 of 195: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 166, Skipping test for non-existent object > +method Test 171 of 200: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 171, Skipping test for non-existent object > method _TPT. > method > -method Test 167 of 195: Test _TRT (Thermal Relationship Table). > -method SKIPPED: Test 167, Skipping test for non-existent object > +method Test 172 of 200: Test _TRT (Thermal Relationship Table). > +method SKIPPED: Test 172, Skipping test for non-existent object > method _TRT. > method > -method Test 168 of 195: Test _TSN (Thermal Sensor Device). > -method SKIPPED: Test 168, Skipping test for non-existent object > +method Test 173 of 200: Test _TSN (Thermal Sensor Device). > +method SKIPPED: Test 173, Skipping test for non-existent object > method _TSN. > method > -method Test 169 of 195: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 169, Skipping test for non-existent object > +method Test 174 of 200: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 174, Skipping test for non-existent object > method _TSP. > method > -method Test 170 of 195: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 170, Skipping test for non-existent object > +method Test 175 of 200: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 175, Skipping test for non-existent object > method _TST. > method > -method Test 171 of 195: Test _TZD (Thermal Zone Devices). > -method SKIPPED: Test 171, Skipping test for non-existent object > +method Test 176 of 200: Test _TZD (Thermal Zone Devices). > +method SKIPPED: Test 176, Skipping test for non-existent object > method _TZD. > method > -method Test 172 of 195: Test _TZM (Thermal Zone member). > -method SKIPPED: Test 172, Skipping test for non-existent object > +method Test 177 of 200: Test _TZM (Thermal Zone member). > +method SKIPPED: Test 177, Skipping test for non-existent object > method _TZM. > method > -method Test 173 of 195: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 173, Skipping test for non-existent object > +method Test 178 of 200: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 178, Skipping test for non-existent object > method _TZP. > method > -method Test 174 of 195: Test _GPE (General Purpose Events). > -method PASSED: Test 174, \_SB_.PCI0.LPCB.EC0_._GPE returned an > +method Test 179 of 200: Test _GPE (General Purpose Events). > +method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an > method integer 0x0000001c > method > -method Test 175 of 195: Test _EC_ (EC Offset Query). > -method SKIPPED: Test 175, Skipping test for non-existent object > +method Test 180 of 200: Test _EC_ (EC Offset Query). > +method SKIPPED: Test 180, Skipping test for non-existent object > method _EC_. > method > -method Test 176 of 195: Test _PTS (Prepare to Sleep). > +method Test 181 of 200: Test _PTS (Prepare to Sleep). > method Test _PTS(3). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method > -method Test 177 of 195: Test _TTS (Transition to State). > -method SKIPPED: Test 177, Optional control method _TTS does not > +method Test 182 of 200: Test _TTS (Transition to State). > +method SKIPPED: Test 182, Optional control method _TTS does not > method exist. > method > -method Test 178 of 195: Test _WAK (System Wake). > +method Test 183 of 200: Test _WAK (System Wake). > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 179 of 195: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 184 of 200: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 180 of 195: Test _BCL (Query List of Brightness > +method Test 185 of 200: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 181 of 195: Test _BCM (Set Brightness Level). > -method PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 186 of 200: Test _BCM (Set Brightness Level). > +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 182 of 195: Test _BQC (Brightness Query Current > +method Test 187 of 200: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 183 of 195: Test _DCS (Return the Status of Output > +method Test 188 of 200: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 184 of 195: Test _DDC (Return the EDID for this > +method Test 189 of 200: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 184, Skipping test for non-existent object > +method SKIPPED: Test 189, Skipping test for non-existent object > method _DDC. > method > -method Test 185 of 195: Test _DSS (Device Set State). > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 190 of 200: Test _DSS (Device Set State). > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 186 of 195: Test _DGS (Query Graphics State). > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 191 of 200: Test _DGS (Query Graphics State). > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 187 of 195: Test _DOD (Enumerate All Devices Attached > +method Test 192 of 200: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1276,7 +1300,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1313,45 +1337,45 @@ method Type of display: 0 (Other) > method BIOS can detect device: 1 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 188 of 195: Test _DOS (Enable/Disable Output > +method Test 193 of 200: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 189 of 195: Test _GPD (Get POST Device). > -method SKIPPED: Test 189, Skipping test for non-existent object > +method Test 194 of 200: Test _GPD (Get POST Device). > +method SKIPPED: Test 194, Skipping test for non-existent object > method _GPD. > method > -method Test 190 of 195: Test _ROM (Get ROM Data). > -method SKIPPED: Test 190, Skipping test for non-existent object > +method Test 195 of 200: Test _ROM (Get ROM Data). > +method SKIPPED: Test 195, Skipping test for non-existent object > method _ROM. > method > -method Test 191 of 195: Test _SPD (Set POST Device). > -method SKIPPED: Test 191, Skipping test for non-existent object > +method Test 196 of 200: Test _SPD (Set POST Device). > +method SKIPPED: Test 196, Skipping test for non-existent object > method _SPD. > method > -method Test 192 of 195: Test _VPO (Video POST Options). > -method SKIPPED: Test 192, Skipping test for non-existent object > +method Test 197 of 200: Test _VPO (Video POST Options). > +method SKIPPED: Test 197, Skipping test for non-existent object > method _VPO. > method > -method Test 193 of 195: Test _CBA (Configuration Base Address). > -method SKIPPED: Test 193, Skipping test for non-existent object > +method Test 198 of 200: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 198, Skipping test for non-existent object > method _CBA. > method > -method Test 194 of 195: Test _IFT (IPMI Interface Type). > -method SKIPPED: Test 194, Skipping test for non-existent object > +method Test 199 of 200: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 199, Skipping test for non-existent object > method _IFT. > method > -method Test 195 of 195: Test _SRV (IPMI Interface Revision). > -method SKIPPED: Test 195, Skipping test for non-existent object > +method Test 200 of 200: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 200, Skipping test for non-existent object > method _SRV. > method > method ========================================================== > -method 260 passed, 0 failed, 0 warning, 0 aborted, 157 skipped, 0 > +method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0 > method info only. > method ========================================================== > I'll ack these once v2 of patch 7 is out
On 2/8/19 11:23 AM, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/method-0001/method-0001.log | 748 +++++++++++++------------- > 1 file changed, 386 insertions(+), 362 deletions(-) > > diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log > index ba25c50e..5d8b4f0a 100644 > --- a/fwts-test/method-0001/method-0001.log > +++ b/fwts-test/method-0001/method-0001.log > @@ -1,41 +1,41 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 195: Test Method Names. > +method Test 1 of 200: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 195: Test _AEI. > +method Test 2 of 200: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existent object > method _AEI. > method > -method Test 3 of 195: Test _EVT (Event Method). > +method Test 3 of 200: Test _EVT (Event Method). > method SKIPPED: Test 3, Skipping test for non-existent object > method _EVT. > method > -method Test 4 of 195: Test _DLM (Device Lock Mutex). > +method Test 4 of 200: Test _DLM (Device Lock Mutex). > method SKIPPED: Test 4, Skipping test for non-existent object > method _DLM. > method > -method Test 5 of 195: Test _PIC (Inform AML of Interrupt Model). > +method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model). > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method > -method Test 6 of 195: Test _CID (Compatible ID). > +method Test 6 of 200: Test _CID (Compatible ID). > method PASSED: Test 6, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 7 of 195: Test _CLS (Class Code). > +method Test 7 of 200: Test _CLS (Class Code). > method SKIPPED: Test 7, Skipping test for non-existent object > method _CLS. > method > -method Test 8 of 195: Test _DDN (DOS Device Name). > +method Test 8 of 200: Test _DDN (DOS Device Name). > method SKIPPED: Test 8, Skipping test for non-existent object > method _DDN. > method > -method Test 9 of 195: Test _HID (Hardware ID). > +method Test 9 of 200: Test _HID (Hardware ID). > method PASSED: Test 9, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 9, \_SB_.LID0._HID returned an integer > @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 10 of 195: Test _HRV (Hardware Revision Number). > +method Test 10 of 200: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 10, Skipping test for non-existent object > method _HRV. > method > -method Test 11 of 195: Test _MLS (Multiple Language String). > +method Test 11 of 200: Test _MLS (Multiple Language String). > method SKIPPED: Test 11, Skipping test for non-existent object > method _MLS. > method > -method Test 12 of 195: Test _PLD (Physical Device Location). > +method Test 12 of 200: Test _PLD (Physical Device Location). > method SKIPPED: Test 12, Skipping test for non-existent object > method _PLD. > method > -method Test 13 of 195: Test _SUB (Subsystem ID). > +method Test 13 of 200: Test _SUB (Subsystem ID). > method SKIPPED: Test 13, Skipping test for non-existent object > method _SUB. > method > -method Test 14 of 195: Test _SUN (Slot User Number). > +method Test 14 of 200: Test _SUN (Slot User Number). > method SKIPPED: Test 14, Skipping test for non-existent object > method _SUN. > method > -method Test 15 of 195: Test _STR (String). > +method Test 15 of 200: Test _STR (String). > method SKIPPED: Test 15, Skipping test for non-existent object > method _STR. > method > -method Test 16 of 195: Test _UID (Unique ID). > +method Test 16 of 200: Test _UID (Unique ID). > method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned > @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. > method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 17 of 195: Test _CDM (Clock Domain). > +method Test 17 of 200: Test _CDM (Clock Domain). > method SKIPPED: Test 17, Skipping test for non-existent object > method _CDM. > method > -method Test 18 of 195: Test _CRS (Current Resource Settings). > +method Test 18 of 200: Test _CRS (Current Resource Settings). > method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -187,11 +187,11 @@ method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 19 of 195: Test _DSD (Device Specific Data). > +method Test 19 of 200: Test _DSD (Device Specific Data). > method SKIPPED: Test 19, Skipping test for non-existent object > method _DSD. > method > -method Test 20 of 195: Test _DIS (Disable). > +method Test 20 of 200: Test _DIS (Disable). > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -209,24 +209,24 @@ method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 21 of 195: Test _DMA (Direct Memory Access). > +method Test 21 of 200: Test _DMA (Direct Memory Access). > method SKIPPED: Test 21, Skipping test for non-existent object > method _DMA. > method > -method Test 22 of 195: Test _FIX (Fixed Register Resource > +method Test 22 of 200: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 22, Skipping test for non-existent object > method _FIX. > method > -method Test 23 of 195: Test _GSB (Global System Interrupt Base). > +method Test 23 of 200: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 23, Skipping test for non-existent object > method _GSB. > method > -method Test 24 of 195: Test _HPP (Hot Plug Parameters). > +method Test 24 of 200: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 24, Skipping test for non-existent object > method _HPP. > method > -method Test 25 of 195: Test _PRS (Possible Resource Settings). > +method Test 25 of 200: Test _PRS (Possible Resource Settings). > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -244,7 +244,7 @@ method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 26 of 195: Test _PRT (PCI Routing Table). > +method Test 26 of 200: Test _PRT (PCI Routing Table). > method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane > method looking package. > method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a > @@ -264,51 +264,51 @@ method sane looking package. > method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a > method sane looking package. > method > -method Test 27 of 195: Test _PXM (Proximity). > +method Test 27 of 200: Test _PXM (Proximity). > method SKIPPED: Test 27, Skipping test for non-existent object > method _PXM. > method > -method Test 28 of 195: Test _CCA (Cache Coherency Attribute). > +method Test 28 of 200: Test _CCA (Cache Coherency Attribute). > method SKIPPED: Test 28, Skipping test for non-existent object > method _CCA. > method > -method Test 29 of 195: Test _EDL (Eject Device List). > +method Test 29 of 200: Test _EDL (Eject Device List). > method SKIPPED: Test 29, Skipping test for non-existent object > method _EDL. > method > -method Test 30 of 195: Test _EJD (Ejection Dependent Device). > +method Test 30 of 200: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 30, Skipping test for non-existent object > method _EJD. > method > -method Test 31 of 195: Test _EJ0 (Eject). > +method Test 31 of 200: Test _EJ0 (Eject). > method SKIPPED: Test 31, Skipping test for non-existent object > method _EJ0. > method > -method Test 32 of 195: Test _EJ1 (Eject). > +method Test 32 of 200: Test _EJ1 (Eject). > method SKIPPED: Test 32, Skipping test for non-existent object > method _EJ1. > method > -method Test 33 of 195: Test _EJ2 (Eject). > +method Test 33 of 200: Test _EJ2 (Eject). > method SKIPPED: Test 33, Skipping test for non-existent object > method _EJ2. > method > -method Test 34 of 195: Test _EJ3 (Eject). > +method Test 34 of 200: Test _EJ3 (Eject). > method SKIPPED: Test 34, Skipping test for non-existent object > method _EJ3. > method > -method Test 35 of 195: Test _EJ4 (Eject). > +method Test 35 of 200: Test _EJ4 (Eject). > method SKIPPED: Test 35, Skipping test for non-existent object > method _EJ4. > method > -method Test 36 of 195: Test _LCK (Lock). > +method Test 36 of 200: Test _LCK (Lock). > method SKIPPED: Test 36, Skipping test for non-existent object > method _LCK. > method > -method Test 37 of 195: Test _RMV (Remove). > +method Test 37 of 200: Test _RMV (Remove). > method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 38 of 195: Test _STA (Status). > +method Test 38 of 200: Test _STA (Status). > method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000. > method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 39 of 195: Test _DEP (Operational Region > +method Test 39 of 200: Test _DEP (Operational Region > method Dependencies). > method SKIPPED: Test 39, Skipping test for non-existent object > method _DEP. > method > -method Test 40 of 195: Test _FIT (Firmware Interface Table). > +method Test 40 of 200: Test _FIT (Firmware Interface Table). > method SKIPPED: Test 40, Skipping test for non-existent object > method _FIT. > method > -method Test 41 of 195: Test _BDN (BIOS Dock Name). > +method Test 41 of 200: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 41, Skipping test for non-existent object > method _BDN. > method > -method Test 42 of 195: Test _BBN (Base Bus Number). > +method Test 42 of 200: Test _BBN (Base Bus Number). > method SKIPPED: Test 42, Skipping test for non-existent object > method _BBN. > method > -method Test 43 of 195: Test _DCK (Dock). > +method Test 43 of 200: Test _DCK (Dock). > method SKIPPED: Test 43, Skipping test for non-existent object > method _DCK. > method > -method Test 44 of 195: Test _INI (Initialize). > +method Test 44 of 200: Test _INI (Initialize). > method PASSED: Test 44, \_SB_._INI returned no values as > method expected. > method > -method Test 45 of 195: Test _GLK (Global Lock). > +method Test 45 of 200: Test _GLK (Global Lock). > method SKIPPED: Test 45, Skipping test for non-existent object > method _GLK. > method > -method Test 46 of 195: Test _SEG (Segment). > +method Test 46 of 200: Test _SEG (Segment). > method SKIPPED: Test 46, Skipping test for non-existent object > method _SEG. > method > -method Test 47 of 195: Test _LSI (Label Storage Information). > +method Test 47 of 200: Test _LSI (Label Storage Information). > method SKIPPED: Test 47, Skipping test for non-existent object > method _LSI. > method > -method Test 48 of 195: Test _OFF (Set resource off). > +method Test 48 of 200: Test _OFF (Set resource off). > method SKIPPED: Test 48, Skipping test for non-existent object > method _OFF. > method > -method Test 49 of 195: Test _ON_ (Set resource on). > +method Test 49 of 200: Test _ON_ (Set resource on). > method SKIPPED: Test 49, Skipping test for non-existent object > method _ON_. > method > -method Test 50 of 195: Test _DSW (Device Sleep Wake). > +method Test 50 of 200: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 50, Skipping test for non-existent object > method _DSW. > method > -method Test 51 of 195: Test _IRC (In Rush Current). > +method Test 51 of 200: Test _IRC (In Rush Current). > method SKIPPED: Test 51, Skipping test for non-existent object > method _IRC. > method > -method Test 52 of 195: Test _PRE (Power Resources for > +method Test 52 of 200: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 52, Skipping test for non-existent object > method _PRE. > method > -method Test 53 of 195: Test _PR0 (Power Resources for D0). > +method Test 53 of 200: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 53, Skipping test for non-existent object > method _PR0. > method > -method Test 54 of 195: Test _PR1 (Power Resources for D1). > +method Test 54 of 200: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 54, Skipping test for non-existent object > method _PR1. > method > -method Test 55 of 195: Test _PR2 (Power Resources for D2). > +method Test 55 of 200: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 55, Skipping test for non-existent object > method _PR2. > method > -method Test 56 of 195: Test _PR3 (Power Resources for D3). > +method Test 56 of 200: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 56, Skipping test for non-existent object > method _PR3. > method > -method Test 57 of 195: Test _PRW (Power Resources for Wake). > +method Test 57 of 200: Test _PRW (Power Resources for Wake). > method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a > method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly > @@ -426,34 +426,34 @@ method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a > method sane looking package. > method > -method Test 58 of 195: Test _PS0 (Power State 0). > +method Test 58 of 200: Test _PS0 (Power State 0). > method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 58, \_PS0 returned no values as expected. > method > -method Test 59 of 195: Test _PS1 (Power State 1). > +method Test 59 of 200: Test _PS1 (Power State 1). > method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 60 of 195: Test _PS2 (Power State 2). > +method Test 60 of 200: Test _PS2 (Power State 2). > method SKIPPED: Test 60, Skipping test for non-existent object > method _PS2. > method > -method Test 61 of 195: Test _PS3 (Power State 3). > +method Test 61 of 200: Test _PS3 (Power State 3). > method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 61, \_PS3 returned no values as expected. > method > -method Test 62 of 195: Test _PSC (Power State Current). > +method Test 62 of 200: Test _PSC (Power State Current). > method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 62, \_PSC correctly returned an integer. > method > -method Test 63 of 195: Test _PSE (Power State for Enumeration). > +method Test 63 of 200: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 63, Skipping test for non-existent object > method _PSE. > method > -method Test 64 of 195: Test _PSW (Power State Wake). > +method Test 64 of 200: Test _PSW (Power State Wake). > method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values > @@ -465,15 +465,15 @@ method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 65 of 195: Test _S1D (S1 Device State). > +method Test 65 of 200: Test _S1D (S1 Device State). > method SKIPPED: Test 65, Skipping test for non-existent object > method _S1D. > method > -method Test 66 of 195: Test _S2D (S2 Device State). > +method Test 66 of 200: Test _S2D (S2 Device State). > method SKIPPED: Test 66, Skipping test for non-existent object > method _S2D. > method > -method Test 67 of 195: Test _S3D (S3 Device State). > +method Test 67 of 200: Test _S3D (S3 Device State). > method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned > @@ -491,7 +491,7 @@ method an integer. > method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 68 of 195: Test _S4D (S4 Device State). > +method Test 68 of 200: Test _S4D (S4 Device State). > method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned > @@ -509,132 +509,132 @@ method an integer. > method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 69 of 195: Test _S0W (S0 Device Wake State). > +method Test 69 of 200: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 69, Skipping test for non-existent object > method _S0W. > method > -method Test 70 of 195: Test _S1W (S1 Device Wake State). > +method Test 70 of 200: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 70, Skipping test for non-existent object > method _S1W. > method > -method Test 71 of 195: Test _S2W (S2 Device Wake State). > +method Test 71 of 200: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 71, Skipping test for non-existent object > method _S2W. > method > -method Test 72 of 195: Test _S3W (S3 Device Wake State). > +method Test 72 of 200: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 72, Skipping test for non-existent object > method _S3W. > method > -method Test 73 of 195: Test _S4W (S4 Device Wake State). > +method Test 73 of 200: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 73, Skipping test for non-existent object > method _S4W. > method > -method Test 74 of 195: Test _RST (Device Reset). > +method Test 74 of 200: Test _RST (Device Reset). > method SKIPPED: Test 74, Skipping test for non-existent object > method _RST. > method > -method Test 75 of 195: Test _PRR (Power Resource for Reset). > +method Test 75 of 200: Test _PRR (Power Resource for Reset). > method SKIPPED: Test 75, Skipping test for non-existent object > method _PRR. > method > -method Test 76 of 195: Test _S0_ (S0 System State). > +method Test 76 of 200: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 76, \_S0_ correctly returned a sane looking > method package. > method > -method Test 77 of 195: Test _S1_ (S1 System State). > +method Test 77 of 200: Test _S1_ (S1 System State). > method SKIPPED: Test 77, Skipping test for non-existent object > method _S1_. > method > -method Test 78 of 195: Test _S2_ (S2 System State). > +method Test 78 of 200: Test _S2_ (S2 System State). > method SKIPPED: Test 78, Skipping test for non-existent object > method _S2_. > method > -method Test 79 of 195: Test _S3_ (S3 System State). > +method Test 79 of 200: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 79, \_S3_ correctly returned a sane looking > method package. > method > -method Test 80 of 195: Test _S4_ (S4 System State). > +method Test 80 of 200: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 80, \_S4_ correctly returned a sane looking > method package. > method > -method Test 81 of 195: Test _S5_ (S5 System State). > +method Test 81 of 200: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 81, \_S5_ correctly returned a sane looking > method package. > method > -method Test 82 of 195: Test _SWS (System Wake Source). > +method Test 82 of 200: Test _SWS (System Wake Source). > method SKIPPED: Test 82, Skipping test for non-existent object > method _SWS. > method > -method Test 83 of 195: Test _PSS (Performance Supported States). > +method Test 83 of 200: Test _PSS (Performance Supported States). > method SKIPPED: Test 83, Skipping test for non-existent object > method _PSS. > method > -method Test 84 of 195: Test _CPC (Continuous Performance > +method Test 84 of 200: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 84, Skipping test for non-existent object > method _CPC. > method > -method Test 85 of 195: Test _CSD (C State Dependencies). > +method Test 85 of 200: Test _CSD (C State Dependencies). > method SKIPPED: Test 85, Skipping test for non-existent object > method _CSD. > method > -method Test 86 of 195: Test _CST (C States). > +method Test 86 of 200: Test _CST (C States). > method SKIPPED: Test 86, Skipping test for non-existent object > method _CST. > method > -method Test 87 of 195: Test _PCT (Performance Control). > +method Test 87 of 200: Test _PCT (Performance Control). > method SKIPPED: Test 87, Skipping test for non-existent object > method _PCT. > method > -method Test 88 of 195: Test _PDL (P-State Depth Limit). > +method Test 88 of 200: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 88, Skipping test for non-existent object > method _PDL. > method > -method Test 89 of 195: Test _PPC (Performance Present > +method Test 89 of 200: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 89, Skipping test for non-existent object > method _PPC. > method > -method Test 90 of 195: Test _PPE (Polling for Platform Error). > +method Test 90 of 200: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 90, Skipping test for non-existent object > method _PPE. > method > -method Test 91 of 195: Test _PSD (Power State Dependencies). > +method Test 91 of 200: Test _PSD (Power State Dependencies). > method SKIPPED: Test 91, Skipping test for non-existent object > method _PSD. > method > -method Test 92 of 195: Test _PTC (Processor Throttling Control). > +method Test 92 of 200: Test _PTC (Processor Throttling Control). > method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane > method looking package. > method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane > method looking package. > method > -method Test 93 of 195: Test _TDL (T-State Depth Limit). > +method Test 93 of 200: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 93, Skipping test for non-existent object > method _TDL. > method > -method Test 94 of 195: Test _TPC (Throttling Present > +method Test 94 of 200: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 95 of 195: Test _TSD (Throttling State Dependencies). > +method Test 95 of 200: Test _TSD (Throttling State Dependencies). > method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 96 of 195: Test _TSS (Throttling Supported States). > +method Test 96 of 200: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00 > method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 97 of 195: Test _LPI (Low Power Idle States). > +method Test 97 of 200: Test _LPI (Low Power Idle States). > method SKIPPED: Test 97, Skipping test for non-existent object > method _LPI. > method > -method Test 98 of 195: Test _RDI (Resource Dependencies for > +method Test 98 of 200: Test _RDI (Resource Dependencies for > method Idle). > method SKIPPED: Test 98, Skipping test for non-existent object > method _RDI. > method > -method Test 99 of 195: Test _PUR (Processor Utilization Request). > +method Test 99 of 200: Test _PUR (Processor Utilization Request). > method SKIPPED: Test 99, Skipping test for non-existent object > method _PUR. > method > -method Test 100 of 195: Test _MSG (Message). > +method Test 100 of 200: Test _MSG (Message). > method SKIPPED: Test 100, Skipping test for non-existent object > method _MSG. > method > -method Test 101 of 195: Test _SST (System Status). > +method Test 101 of 200: Test _SST (System Status). > method SKIPPED: Test 101, Skipping test for non-existent object > method _SST. > method > -method Test 102 of 195: Test _ALC (Ambient Light Colour > +method Test 102 of 200: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 102, Skipping test for non-existent object > method _ALC. > method > -method Test 103 of 195: Test _ALI (Ambient Light Illuminance). > +method Test 103 of 200: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 103, Skipping test for non-existent object > method _ALI. > method > -method Test 104 of 195: Test _ALT (Ambient Light Temperature). > +method Test 104 of 200: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 104, Skipping test for non-existent object > method _ALT. > method > -method Test 105 of 195: Test _ALP (Ambient Light Polling). > +method Test 105 of 200: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 105, Skipping test for non-existent object > method _ALP. > method > -method Test 106 of 195: Test _ALR (Ambient Light Response). > +method Test 106 of 200: Test _ALR (Ambient Light Response). > method SKIPPED: Test 106, Skipping test for non-existent object > method _ALR. > method > -method Test 107 of 195: Test _LID (Lid Status). > +method Test 107 of 200: Test _LID (Lid Status). > method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 108 of 195: Test _GTF (Get Task File). > +method Test 108 of 200: Test _GTF (Get Task File). > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly > method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly > @@ -720,540 +720,564 @@ method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly > method returned a sane looking buffer. > method > -method Test 109 of 195: Test _GTM (Get Timing Mode). > +method Test 109 of 200: Test _GTM (Get Timing Mode). > method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly > method returned a sane looking buffer. > method > -method Test 110 of 195: Test _MBM (Memory Bandwidth Monitoring > +method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring > method Data). > method SKIPPED: Test 110, Skipping test for non-existent object > method _MBM. > method > -method Test 111 of 195: Test _UPC (USB Port Capabilities). > +method Test 111 of 200: Test _UPC (USB Port Capabilities). > method SKIPPED: Test 111, Skipping test for non-existent object > method _UPC. > method > -method Test 112 of 195: Test _UPD (User Presence Detect). > +method Test 112 of 200: Test _UPD (User Presence Detect). > method SKIPPED: Test 112, Skipping test for non-existent object > method _UPD. > method > -method Test 113 of 195: Test _UPP (User Presence Polling). > +method Test 113 of 200: Test _UPP (User Presence Polling). > method SKIPPED: Test 113, Skipping test for non-existent object > method _UPP. > method > -method Test 114 of 195: Test _GCP (Get Capabilities). > +method Test 114 of 200: Test _GCP (Get Capabilities). > method SKIPPED: Test 114, Skipping test for non-existent object > method _GCP. > method > -method Test 115 of 195: Test _GRT (Get Real Time). > +method Test 115 of 200: Test _GRT (Get Real Time). > method SKIPPED: Test 115, Skipping test for non-existent object > method _GRT. > method > -method Test 116 of 195: Test _GWS (Get Wake Status). > +method Test 116 of 200: Test _GWS (Get Wake Status). > method SKIPPED: Test 116, Skipping test for non-existent object > method _GWS. > method > -method Test 117 of 195: Test _CWS (Clear Wake Status). > +method Test 117 of 200: Test _CWS (Clear Wake Status). > method SKIPPED: Test 117, Skipping test for non-existent object > method _CWS. > method > -method Test 118 of 195: Test _SRT (Set Real Time). > +method Test 118 of 200: Test _SRT (Set Real Time). > method SKIPPED: Test 118, Skipping test for non-existent object > method _SRT. > method > -method Test 119 of 195: Test _STP (Set Expired Timer Wake > +method Test 119 of 200: Test _STP (Set Expired Timer Wake > method Policy). > method SKIPPED: Test 119, Skipping test for non-existent object > method _STP. > method > -method Test 120 of 195: Test _STV (Set Timer Value). > +method Test 120 of 200: Test _STV (Set Timer Value). > method SKIPPED: Test 120, Skipping test for non-existent object > method _STV. > method > -method Test 121 of 195: Test _TIP (Expired Timer Wake Policy). > +method Test 121 of 200: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 121, Skipping test for non-existent object > method _TIP. > method > -method Test 122 of 195: Test _TIV (Timer Values). > +method Test 122 of 200: Test _TIV (Timer Values). > method SKIPPED: Test 122, Skipping test for non-existent object > method _TIV. > method > -method Test 123 of 195: Test _SBS (Smart Battery Subsystem). > +method Test 123 of 200: Test _NBS (NVDIMM Boot Status). > method SKIPPED: Test 123, Skipping test for non-existent object > -method _SBS. > +method _NBS. > method > -method Test 124 of 195: Test _BCT (Battery Charge Time). > +method Test 124 of 200: Test _NCH (NVDIMM Current Health > +method Information). > method SKIPPED: Test 124, Skipping test for non-existent object > +method _NCH. > +method > +method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection > +method Capabilities). > +method SKIPPED: Test 125, Skipping test for non-existent object > +method _NIC. > +method > +method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health > +method Errors). > +method SKIPPED: Test 126, Skipping test for non-existent object > +method _NIH. > +method > +method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error > +method Status). > +method SKIPPED: Test 127, Skipping test for non-existent object > +method _NIG. > +method > +method Test 128 of 200: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 128, Skipping test for non-existent object > +method _SBS. > +method > +method Test 129 of 200: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 129, Skipping test for non-existent object > method _BCT. > method > -method Test 125 of 195: Test _BIF (Battery Information). > -method PASSED: Test 125, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 130 of 200: Test _BIF (Battery Information). > +method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 126 of 195: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 126, Skipping test for non-existent object > +method Test 131 of 200: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 131, Skipping test for non-existent object > method _BIX. > method > -method Test 127 of 195: Test _BMA (Battery Measurement > +method Test 132 of 200: Test _BMA (Battery Measurement > method Averaging). > -method SKIPPED: Test 127, Skipping test for non-existent object > +method SKIPPED: Test 132, Skipping test for non-existent object > method _BMA. > method > -method Test 128 of 195: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 128, Skipping test for non-existent object > +method Test 133 of 200: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 133, Skipping test for non-existent object > method _BMC. > method > -method Test 129 of 195: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 129, Skipping test for non-existent object > +method Test 134 of 200: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 134, Skipping test for non-existent object > method _BMD. > method > -method Test 130 of 195: Test _BMS (Battery Measurement Sampling > +method Test 135 of 200: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 130, Skipping test for non-existent object > +method SKIPPED: Test 135, Skipping test for non-existent object > method _BMS. > method > -method Test 131 of 195: Test _BST (Battery Status). > -method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 136 of 200: Test _BST (Battery Status). > +method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 132 of 195: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 132, Skipping test for non-existent object > +method Test 137 of 200: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 137, Skipping test for non-existent object > method _BTP. > method > -method Test 133 of 195: Test _BTH (Battery Throttle Limit). > -method SKIPPED: Test 133, Skipping test for non-existent object > +method Test 138 of 200: Test _BTH (Battery Throttle Limit). > +method SKIPPED: Test 138, Skipping test for non-existent object > method _BTH. > method > -method Test 134 of 195: Test _BTM (Battery Time). > -method SKIPPED: Test 134, Skipping test for non-existent object > +method Test 139 of 200: Test _BTM (Battery Time). > +method SKIPPED: Test 139, Skipping test for non-existent object > method _BTM. > method > -method Test 135 of 195: Test _PCL (Power Consumer List). > -method PASSED: Test 135, \_SB_.PCI0.LPCB.ACAD._PCL returned a > +method Test 140 of 200: Test _PCL (Power Consumer List). > +method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a > method sane package of 1 references. > -method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._PCL returned a > +method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a > method sane package of 1 references. > method > -method Test 136 of 195: Test _PIF (Power Source Information). > -method SKIPPED: Test 136, Skipping test for non-existent object > +method Test 141 of 200: Test _PIF (Power Source Information). > +method SKIPPED: Test 141, Skipping test for non-existent object > method _PIF. > method > -method Test 137 of 195: Test _PRL (Power Source Redundancy List). > -method SKIPPED: Test 137, Skipping test for non-existent object > +method Test 142 of 200: Test _PRL (Power Source Redundancy List). > +method SKIPPED: Test 142, Skipping test for non-existent object > method _PRL. > method > -method Test 138 of 195: Test _PSR (Power Source). > -method PASSED: Test 138, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 143 of 200: Test _PSR (Power Source). > +method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 139 of 195: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 139, Skipping test for non-existent object > +method Test 144 of 200: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 144, Skipping test for non-existent object > method _GAI. > method > -method Test 140 of 195: Test _GHL (Get Harware Limit). > -method SKIPPED: Test 140, Skipping test for non-existent object > +method Test 145 of 200: Test _GHL (Get Harware Limit). > +method SKIPPED: Test 145, Skipping test for non-existent object > method _GHL. > method > -method Test 141 of 195: Test _PMC (Power Meter Capabilities). > -method SKIPPED: Test 141, Skipping test for non-existent object > +method Test 146 of 200: Test _PMC (Power Meter Capabilities). > +method SKIPPED: Test 146, Skipping test for non-existent object > method _PMC. > method > -method Test 142 of 195: Test _PMD (Power Meter Devices). > -method SKIPPED: Test 142, Skipping test for non-existent object > +method Test 147 of 200: Test _PMD (Power Meter Devices). > +method SKIPPED: Test 147, Skipping test for non-existent object > method _PMD. > method > -method Test 143 of 195: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 143, Skipping test for non-existent object > +method Test 148 of 200: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 148, Skipping test for non-existent object > method _PMM. > method > -method Test 144 of 195: Test _WPC (Wireless Power Calibration). > -method SKIPPED: Test 144, Skipping test for non-existent object > +method Test 149 of 200: Test _WPC (Wireless Power Calibration). > +method SKIPPED: Test 149, Skipping test for non-existent object > method _WPC. > method > -method Test 145 of 195: Test _WPP (Wireless Power Polling). > -method SKIPPED: Test 145, Skipping test for non-existent object > +method Test 150 of 200: Test _WPP (Wireless Power Polling). > +method SKIPPED: Test 150, Skipping test for non-existent object > method _WPP. > method > -method Test 146 of 195: Test _FIF (Fan Information). > -method SKIPPED: Test 146, Skipping test for non-existent object > +method Test 151 of 200: Test _FIF (Fan Information). > +method SKIPPED: Test 151, Skipping test for non-existent object > method _FIF. > method > -method Test 147 of 195: Test _FPS (Fan Performance States). > -method SKIPPED: Test 147, Skipping test for non-existent object > +method Test 152 of 200: Test _FPS (Fan Performance States). > +method SKIPPED: Test 152, Skipping test for non-existent object > method _FPS. > method > -method Test 148 of 195: Test _FSL (Fan Set Level). > -method SKIPPED: Test 148, Skipping test for non-existent object > +method Test 153 of 200: Test _FSL (Fan Set Level). > +method SKIPPED: Test 153, Skipping test for non-existent object > method _FSL. > method > -method Test 149 of 195: Test _FST (Fan Status). > -method SKIPPED: Test 149, Skipping test for non-existent object > +method Test 154 of 200: Test _FST (Fan Status). > +method SKIPPED: Test 154, Skipping test for non-existent object > method _FST. > method > -method Test 150 of 195: Test _ACx (Active Cooling). > -method SKIPPED: Test 150, Skipping test for non-existent object > +method Test 155 of 200: Test _ACx (Active Cooling). > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC0. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC1. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC2. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC3. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC4. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC5. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC6. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC7. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC8. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC9. > method > method > -method Test 151 of 195: Test _ART (Active Cooling Relationship > +method Test 156 of 200: Test _ART (Active Cooling Relationship > method Table). > -method SKIPPED: Test 151, Skipping test for non-existent object > +method SKIPPED: Test 156, Skipping test for non-existent object > method _ART. > method > -method Test 152 of 195: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 152, Skipping test for non-existent object > +method Test 157 of 200: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 157, Skipping test for non-existent object > method _CRT. > method > -method Test 153 of 195: Test _CR3 (Warm/Standby Temperature). > -method SKIPPED: Test 153, Skipping test for non-existent object > +method Test 158 of 200: Test _CR3 (Warm/Standby Temperature). > +method SKIPPED: Test 158, Skipping test for non-existent object > method _CR3. > method > -method Test 154 of 195: Test _DTI (Device Temperature > +method Test 159 of 200: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 154, Skipping test for non-existent object > +method SKIPPED: Test 159, Skipping test for non-existent object > method _DTI. > method > -method Test 155 of 195: Test _HOT (Hot Temperature). > -method SKIPPED: Test 155, Skipping test for non-existent object > +method Test 160 of 200: Test _HOT (Hot Temperature). > +method SKIPPED: Test 160, Skipping test for non-existent object > method _HOT. > method > -method Test 156 of 195: Test _MTL (Minimum Throttle Limit). > -method SKIPPED: Test 156, Skipping test for non-existent object > +method Test 161 of 200: Test _MTL (Minimum Throttle Limit). > +method SKIPPED: Test 161, Skipping test for non-existent object > method _MTL. > method > -method Test 157 of 195: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 157, Skipping test for non-existent object > +method Test 162 of 200: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 162, Skipping test for non-existent object > method _NTT. > method > -method Test 158 of 195: Test _PSL (Passive List). > -method SKIPPED: Test 158, Skipping test for non-existent object > +method Test 163 of 200: Test _PSL (Passive List). > +method SKIPPED: Test 163, Skipping test for non-existent object > method _PSL. > method > -method Test 159 of 195: Test _PSV (Passive Temp). > -method SKIPPED: Test 159, Skipping test for non-existent object > +method Test 164 of 200: Test _PSV (Passive Temp). > +method SKIPPED: Test 164, Skipping test for non-existent object > method _PSV. > method > -method Test 160 of 195: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 160, Skipping test for non-existent object > +method Test 165 of 200: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 165, Skipping test for non-existent object > method _RTV. > method > -method Test 161 of 195: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 161, Skipping test for non-existent object > +method Test 166 of 200: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 166, Skipping test for non-existent object > method _DTI. > method > -method Test 162 of 195: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 162, Skipping test for non-existent object > +method Test 167 of 200: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 167, Skipping test for non-existent object > method _TC1. > method > -method Test 163 of 195: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 163, Skipping test for non-existent object > +method Test 168 of 200: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 168, Skipping test for non-existent object > method _TC2. > method > -method Test 164 of 195: Test _TFP (Thermal fast Sampling Period). > -method SKIPPED: Test 164, Skipping test for non-existent object > +method Test 169 of 200: Test _TFP (Thermal fast Sampling Period). > +method SKIPPED: Test 169, Skipping test for non-existent object > method _TFP. > method > -method Test 165 of 195: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 165, Skipping test for non-existent object > +method Test 170 of 200: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 170, Skipping test for non-existent object > method _TMP. > method > -method Test 166 of 195: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 166, Skipping test for non-existent object > +method Test 171 of 200: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 171, Skipping test for non-existent object > method _TPT. > method > -method Test 167 of 195: Test _TRT (Thermal Relationship Table). > -method SKIPPED: Test 167, Skipping test for non-existent object > +method Test 172 of 200: Test _TRT (Thermal Relationship Table). > +method SKIPPED: Test 172, Skipping test for non-existent object > method _TRT. > method > -method Test 168 of 195: Test _TSN (Thermal Sensor Device). > -method SKIPPED: Test 168, Skipping test for non-existent object > +method Test 173 of 200: Test _TSN (Thermal Sensor Device). > +method SKIPPED: Test 173, Skipping test for non-existent object > method _TSN. > method > -method Test 169 of 195: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 169, Skipping test for non-existent object > +method Test 174 of 200: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 174, Skipping test for non-existent object > method _TSP. > method > -method Test 170 of 195: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 170, Skipping test for non-existent object > +method Test 175 of 200: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 175, Skipping test for non-existent object > method _TST. > method > -method Test 171 of 195: Test _TZD (Thermal Zone Devices). > -method SKIPPED: Test 171, Skipping test for non-existent object > +method Test 176 of 200: Test _TZD (Thermal Zone Devices). > +method SKIPPED: Test 176, Skipping test for non-existent object > method _TZD. > method > -method Test 172 of 195: Test _TZM (Thermal Zone member). > -method SKIPPED: Test 172, Skipping test for non-existent object > +method Test 177 of 200: Test _TZM (Thermal Zone member). > +method SKIPPED: Test 177, Skipping test for non-existent object > method _TZM. > method > -method Test 173 of 195: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 173, Skipping test for non-existent object > +method Test 178 of 200: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 178, Skipping test for non-existent object > method _TZP. > method > -method Test 174 of 195: Test _GPE (General Purpose Events). > -method PASSED: Test 174, \_SB_.PCI0.LPCB.EC0_._GPE returned an > +method Test 179 of 200: Test _GPE (General Purpose Events). > +method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an > method integer 0x0000001c > method > -method Test 175 of 195: Test _EC_ (EC Offset Query). > -method SKIPPED: Test 175, Skipping test for non-existent object > +method Test 180 of 200: Test _EC_ (EC Offset Query). > +method SKIPPED: Test 180, Skipping test for non-existent object > method _EC_. > method > -method Test 176 of 195: Test _PTS (Prepare to Sleep). > +method Test 181 of 200: Test _PTS (Prepare to Sleep). > method Test _PTS(3). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method > -method Test 177 of 195: Test _TTS (Transition to State). > -method SKIPPED: Test 177, Optional control method _TTS does not > +method Test 182 of 200: Test _TTS (Transition to State). > +method SKIPPED: Test 182, Optional control method _TTS does not > method exist. > method > -method Test 178 of 195: Test _WAK (System Wake). > +method Test 183 of 200: Test _WAK (System Wake). > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 179 of 195: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 184 of 200: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 180 of 195: Test _BCL (Query List of Brightness > +method Test 185 of 200: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 181 of 195: Test _BCM (Set Brightness Level). > -method PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 186 of 200: Test _BCM (Set Brightness Level). > +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 182 of 195: Test _BQC (Brightness Query Current > +method Test 187 of 200: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 183 of 195: Test _DCS (Return the Status of Output > +method Test 188 of 200: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 184 of 195: Test _DDC (Return the EDID for this > +method Test 189 of 200: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 184, Skipping test for non-existent object > +method SKIPPED: Test 189, Skipping test for non-existent object > method _DDC. > method > -method Test 185 of 195: Test _DSS (Device Set State). > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 190 of 200: Test _DSS (Device Set State). > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 186 of 195: Test _DGS (Query Graphics State). > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 191 of 200: Test _DGS (Query Graphics State). > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 187 of 195: Test _DOD (Enumerate All Devices Attached > +method Test 192 of 200: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1276,7 +1300,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1313,45 +1337,45 @@ method Type of display: 0 (Other) > method BIOS can detect device: 1 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 188 of 195: Test _DOS (Enable/Disable Output > +method Test 193 of 200: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 189 of 195: Test _GPD (Get POST Device). > -method SKIPPED: Test 189, Skipping test for non-existent object > +method Test 194 of 200: Test _GPD (Get POST Device). > +method SKIPPED: Test 194, Skipping test for non-existent object > method _GPD. > method > -method Test 190 of 195: Test _ROM (Get ROM Data). > -method SKIPPED: Test 190, Skipping test for non-existent object > +method Test 195 of 200: Test _ROM (Get ROM Data). > +method SKIPPED: Test 195, Skipping test for non-existent object > method _ROM. > method > -method Test 191 of 195: Test _SPD (Set POST Device). > -method SKIPPED: Test 191, Skipping test for non-existent object > +method Test 196 of 200: Test _SPD (Set POST Device). > +method SKIPPED: Test 196, Skipping test for non-existent object > method _SPD. > method > -method Test 192 of 195: Test _VPO (Video POST Options). > -method SKIPPED: Test 192, Skipping test for non-existent object > +method Test 197 of 200: Test _VPO (Video POST Options). > +method SKIPPED: Test 197, Skipping test for non-existent object > method _VPO. > method > -method Test 193 of 195: Test _CBA (Configuration Base Address). > -method SKIPPED: Test 193, Skipping test for non-existent object > +method Test 198 of 200: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 198, Skipping test for non-existent object > method _CBA. > method > -method Test 194 of 195: Test _IFT (IPMI Interface Type). > -method SKIPPED: Test 194, Skipping test for non-existent object > +method Test 199 of 200: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 199, Skipping test for non-existent object > method _IFT. > method > -method Test 195 of 195: Test _SRV (IPMI Interface Revision). > -method SKIPPED: Test 195, Skipping test for non-existent object > +method Test 200 of 200: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 200, Skipping test for non-existent object > method _SRV. > method > method ========================================================== > -method 260 passed, 0 failed, 0 warning, 0 aborted, 157 skipped, 0 > +method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0 > method info only. > method ========================================================== Acked-by: Ivan Hu <ivan.hu@canonical.com>
On 08/02/2019 03:23, Alex Hung wrote: > Signed-off-by: Alex Hung <alex.hung@canonical.com> > --- > fwts-test/method-0001/method-0001.log | 748 +++++++++++++------------- > 1 file changed, 386 insertions(+), 362 deletions(-) > > diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log > index ba25c50e..5d8b4f0a 100644 > --- a/fwts-test/method-0001/method-0001.log > +++ b/fwts-test/method-0001/method-0001.log > @@ -1,41 +1,41 @@ > method method: ACPI DSDT Method Semantic tests. > method ---------------------------------------------------------- > -method Test 1 of 195: Test Method Names. > +method Test 1 of 200: Test Method Names. > method Found 1061 Objects > method PASSED: Test 1, Method names contain legal characters. > method > -method Test 2 of 195: Test _AEI. > +method Test 2 of 200: Test _AEI. > method SKIPPED: Test 2, Skipping test for non-existent object > method _AEI. > method > -method Test 3 of 195: Test _EVT (Event Method). > +method Test 3 of 200: Test _EVT (Event Method). > method SKIPPED: Test 3, Skipping test for non-existent object > method _EVT. > method > -method Test 4 of 195: Test _DLM (Device Lock Mutex). > +method Test 4 of 200: Test _DLM (Device Lock Mutex). > method SKIPPED: Test 4, Skipping test for non-existent object > method _DLM. > method > -method Test 5 of 195: Test _PIC (Inform AML of Interrupt Model). > +method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model). > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method PASSED: Test 5, \_PIC returned no values as expected. > method > -method Test 6 of 195: Test _CID (Compatible ID). > +method Test 6 of 200: Test _CID (Compatible ID). > method PASSED: Test 6, \_SB_.PCI0._CID returned an integer > method 0x030ad041 (EISA ID PNP0A03). > method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an > method integer 0x010cd041 (EISA ID PNP0C01). > method > -method Test 7 of 195: Test _CLS (Class Code). > +method Test 7 of 200: Test _CLS (Class Code). > method SKIPPED: Test 7, Skipping test for non-existent object > method _CLS. > method > -method Test 8 of 195: Test _DDN (DOS Device Name). > +method Test 8 of 200: Test _DDN (DOS Device Name). > method SKIPPED: Test 8, Skipping test for non-existent object > method _DDN. > method > -method Test 9 of 195: Test _HID (Hardware ID). > +method Test 9 of 200: Test _HID (Hardware ID). > method PASSED: Test 9, \_SB_.AMW0._HID returned a string > method 'PNP0C14' as expected. > method PASSED: Test 9, \_SB_.LID0._HID returned an integer > @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). > method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an > method integer 0x130fd041 (EISA ID PNP0F13). > method > -method Test 10 of 195: Test _HRV (Hardware Revision Number). > +method Test 10 of 200: Test _HRV (Hardware Revision Number). > method SKIPPED: Test 10, Skipping test for non-existent object > method _HRV. > method > -method Test 11 of 195: Test _MLS (Multiple Language String). > +method Test 11 of 200: Test _MLS (Multiple Language String). > method SKIPPED: Test 11, Skipping test for non-existent object > method _MLS. > method > -method Test 12 of 195: Test _PLD (Physical Device Location). > +method Test 12 of 200: Test _PLD (Physical Device Location). > method SKIPPED: Test 12, Skipping test for non-existent object > method _PLD. > method > -method Test 13 of 195: Test _SUB (Subsystem ID). > +method Test 13 of 200: Test _SUB (Subsystem ID). > method SKIPPED: Test 13, Skipping test for non-existent object > method _SUB. > method > -method Test 14 of 195: Test _SUN (Slot User Number). > +method Test 14 of 200: Test _SUN (Slot User Number). > method SKIPPED: Test 14, Skipping test for non-existent object > method _SUN. > method > -method Test 15 of 195: Test _STR (String). > +method Test 15 of 200: Test _STR (String). > method SKIPPED: Test 15, Skipping test for non-existent object > method _STR. > method > -method Test 16 of 195: Test _UID (Unique ID). > +method Test 16 of 200: Test _UID (Unique ID). > method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane > method looking value 0x00000000. > method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned > @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. > method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly > method returned sane looking value 0x00000001. > method > -method Test 17 of 195: Test _CDM (Clock Domain). > +method Test 17 of 200: Test _CDM (Clock Domain). > method SKIPPED: Test 17, Skipping test for non-existent object > method _CDM. > method > -method Test 18 of 195: Test _CRS (Current Resource Settings). > +method Test 18 of 200: Test _CRS (Current Resource Settings). > method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space > method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed > @@ -187,11 +187,11 @@ method Descriptor) looks sane. > method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ > method Descriptor) looks sane. > method > -method Test 19 of 195: Test _DSD (Device Specific Data). > +method Test 19 of 200: Test _DSD (Device Specific Data). > method SKIPPED: Test 19, Skipping test for non-existent object > method _DSD. > method > -method Test 20 of 195: Test _DIS (Disable). > +method Test 20 of 200: Test _DIS (Disable). > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no > method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no > @@ -209,24 +209,24 @@ method values as expected. > method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no > method values as expected. > method > -method Test 21 of 195: Test _DMA (Direct Memory Access). > +method Test 21 of 200: Test _DMA (Direct Memory Access). > method SKIPPED: Test 21, Skipping test for non-existent object > method _DMA. > method > -method Test 22 of 195: Test _FIX (Fixed Register Resource > +method Test 22 of 200: Test _FIX (Fixed Register Resource > method Provider). > method SKIPPED: Test 22, Skipping test for non-existent object > method _FIX. > method > -method Test 23 of 195: Test _GSB (Global System Interrupt Base). > +method Test 23 of 200: Test _GSB (Global System Interrupt Base). > method SKIPPED: Test 23, Skipping test for non-existent object > method _GSB. > method > -method Test 24 of 195: Test _HPP (Hot Plug Parameters). > +method Test 24 of 200: Test _HPP (Hot Plug Parameters). > method SKIPPED: Test 24, Skipping test for non-existent object > method _HPP. > method > -method Test 25 of 195: Test _PRS (Possible Resource Settings). > +method Test 25 of 200: Test _PRS (Possible Resource Settings). > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ > method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ > @@ -244,7 +244,7 @@ method Descriptor) looks sane. > method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ > method Descriptor) looks sane. > method > -method Test 26 of 195: Test _PRT (PCI Routing Table). > +method Test 26 of 200: Test _PRT (PCI Routing Table). > method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane > method looking package. > method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a > @@ -264,51 +264,51 @@ method sane looking package. > method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a > method sane looking package. > method > -method Test 27 of 195: Test _PXM (Proximity). > +method Test 27 of 200: Test _PXM (Proximity). > method SKIPPED: Test 27, Skipping test for non-existent object > method _PXM. > method > -method Test 28 of 195: Test _CCA (Cache Coherency Attribute). > +method Test 28 of 200: Test _CCA (Cache Coherency Attribute). > method SKIPPED: Test 28, Skipping test for non-existent object > method _CCA. > method > -method Test 29 of 195: Test _EDL (Eject Device List). > +method Test 29 of 200: Test _EDL (Eject Device List). > method SKIPPED: Test 29, Skipping test for non-existent object > method _EDL. > method > -method Test 30 of 195: Test _EJD (Ejection Dependent Device). > +method Test 30 of 200: Test _EJD (Ejection Dependent Device). > method SKIPPED: Test 30, Skipping test for non-existent object > method _EJD. > method > -method Test 31 of 195: Test _EJ0 (Eject). > +method Test 31 of 200: Test _EJ0 (Eject). > method SKIPPED: Test 31, Skipping test for non-existent object > method _EJ0. > method > -method Test 32 of 195: Test _EJ1 (Eject). > +method Test 32 of 200: Test _EJ1 (Eject). > method SKIPPED: Test 32, Skipping test for non-existent object > method _EJ1. > method > -method Test 33 of 195: Test _EJ2 (Eject). > +method Test 33 of 200: Test _EJ2 (Eject). > method SKIPPED: Test 33, Skipping test for non-existent object > method _EJ2. > method > -method Test 34 of 195: Test _EJ3 (Eject). > +method Test 34 of 200: Test _EJ3 (Eject). > method SKIPPED: Test 34, Skipping test for non-existent object > method _EJ3. > method > -method Test 35 of 195: Test _EJ4 (Eject). > +method Test 35 of 200: Test _EJ4 (Eject). > method SKIPPED: Test 35, Skipping test for non-existent object > method _EJ4. > method > -method Test 36 of 195: Test _LCK (Lock). > +method Test 36 of 200: Test _LCK (Lock). > method SKIPPED: Test 36, Skipping test for non-existent object > method _LCK. > method > -method Test 37 of 195: Test _RMV (Remove). > +method Test 37 of 200: Test _RMV (Remove). > method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly > method returned sane looking value 0x00000001. > method > -method Test 38 of 195: Test _STA (Status). > +method Test 38 of 200: Test _STA (Status). > method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly > method returned sane looking value 0x0000000f. > method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly > @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000. > method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly > method returned sane looking value 0x0000001f. > method > -method Test 39 of 195: Test _DEP (Operational Region > +method Test 39 of 200: Test _DEP (Operational Region > method Dependencies). > method SKIPPED: Test 39, Skipping test for non-existent object > method _DEP. > method > -method Test 40 of 195: Test _FIT (Firmware Interface Table). > +method Test 40 of 200: Test _FIT (Firmware Interface Table). > method SKIPPED: Test 40, Skipping test for non-existent object > method _FIT. > method > -method Test 41 of 195: Test _BDN (BIOS Dock Name). > +method Test 41 of 200: Test _BDN (BIOS Dock Name). > method SKIPPED: Test 41, Skipping test for non-existent object > method _BDN. > method > -method Test 42 of 195: Test _BBN (Base Bus Number). > +method Test 42 of 200: Test _BBN (Base Bus Number). > method SKIPPED: Test 42, Skipping test for non-existent object > method _BBN. > method > -method Test 43 of 195: Test _DCK (Dock). > +method Test 43 of 200: Test _DCK (Dock). > method SKIPPED: Test 43, Skipping test for non-existent object > method _DCK. > method > -method Test 44 of 195: Test _INI (Initialize). > +method Test 44 of 200: Test _INI (Initialize). > method PASSED: Test 44, \_SB_._INI returned no values as > method expected. > method > -method Test 45 of 195: Test _GLK (Global Lock). > +method Test 45 of 200: Test _GLK (Global Lock). > method SKIPPED: Test 45, Skipping test for non-existent object > method _GLK. > method > -method Test 46 of 195: Test _SEG (Segment). > +method Test 46 of 200: Test _SEG (Segment). > method SKIPPED: Test 46, Skipping test for non-existent object > method _SEG. > method > -method Test 47 of 195: Test _LSI (Label Storage Information). > +method Test 47 of 200: Test _LSI (Label Storage Information). > method SKIPPED: Test 47, Skipping test for non-existent object > method _LSI. > method > -method Test 48 of 195: Test _OFF (Set resource off). > +method Test 48 of 200: Test _OFF (Set resource off). > method SKIPPED: Test 48, Skipping test for non-existent object > method _OFF. > method > -method Test 49 of 195: Test _ON_ (Set resource on). > +method Test 49 of 200: Test _ON_ (Set resource on). > method SKIPPED: Test 49, Skipping test for non-existent object > method _ON_. > method > -method Test 50 of 195: Test _DSW (Device Sleep Wake). > +method Test 50 of 200: Test _DSW (Device Sleep Wake). > method SKIPPED: Test 50, Skipping test for non-existent object > method _DSW. > method > -method Test 51 of 195: Test _IRC (In Rush Current). > +method Test 51 of 200: Test _IRC (In Rush Current). > method SKIPPED: Test 51, Skipping test for non-existent object > method _IRC. > method > -method Test 52 of 195: Test _PRE (Power Resources for > +method Test 52 of 200: Test _PRE (Power Resources for > method Enumeration). > method SKIPPED: Test 52, Skipping test for non-existent object > method _PRE. > method > -method Test 53 of 195: Test _PR0 (Power Resources for D0). > +method Test 53 of 200: Test _PR0 (Power Resources for D0). > method SKIPPED: Test 53, Skipping test for non-existent object > method _PR0. > method > -method Test 54 of 195: Test _PR1 (Power Resources for D1). > +method Test 54 of 200: Test _PR1 (Power Resources for D1). > method SKIPPED: Test 54, Skipping test for non-existent object > method _PR1. > method > -method Test 55 of 195: Test _PR2 (Power Resources for D2). > +method Test 55 of 200: Test _PR2 (Power Resources for D2). > method SKIPPED: Test 55, Skipping test for non-existent object > method _PR2. > method > -method Test 56 of 195: Test _PR3 (Power Resources for D3). > +method Test 56 of 200: Test _PR3 (Power Resources for D3). > method SKIPPED: Test 56, Skipping test for non-existent object > method _PR3. > method > -method Test 57 of 195: Test _PRW (Power Resources for Wake). > +method Test 57 of 200: Test _PRW (Power Resources for Wake). > method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a > method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly > @@ -426,34 +426,34 @@ method sane looking package. > method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a > method sane looking package. > method > -method Test 58 of 195: Test _PS0 (Power State 0). > +method Test 58 of 200: Test _PS0 (Power State 0). > method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no > method values as expected. > method PASSED: Test 58, \_PS0 returned no values as expected. > method > -method Test 59 of 195: Test _PS1 (Power State 1). > +method Test 59 of 200: Test _PS1 (Power State 1). > method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no > method values as expected. > method > -method Test 60 of 195: Test _PS2 (Power State 2). > +method Test 60 of 200: Test _PS2 (Power State 2). > method SKIPPED: Test 60, Skipping test for non-existent object > method _PS2. > method > -method Test 61 of 195: Test _PS3 (Power State 3). > +method Test 61 of 200: Test _PS3 (Power State 3). > method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no > method values as expected. > method PASSED: Test 61, \_PS3 returned no values as expected. > method > -method Test 62 of 195: Test _PSC (Power State Current). > +method Test 62 of 200: Test _PSC (Power State Current). > method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly > method returned an integer. > method PASSED: Test 62, \_PSC correctly returned an integer. > method > -method Test 63 of 195: Test _PSE (Power State for Enumeration). > +method Test 63 of 200: Test _PSE (Power State for Enumeration). > method SKIPPED: Test 63, Skipping test for non-existent object > method _PSE. > method > -method Test 64 of 195: Test _PSW (Power State Wake). > +method Test 64 of 200: Test _PSW (Power State Wake). > method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values > method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values > @@ -465,15 +465,15 @@ method as expected. > method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values > method as expected. > method > -method Test 65 of 195: Test _S1D (S1 Device State). > +method Test 65 of 200: Test _S1D (S1 Device State). > method SKIPPED: Test 65, Skipping test for non-existent object > method _S1D. > method > -method Test 66 of 195: Test _S2D (S2 Device State). > +method Test 66 of 200: Test _S2D (S2 Device State). > method SKIPPED: Test 66, Skipping test for non-existent object > method _S2D. > method > -method Test 67 of 195: Test _S3D (S3 Device State). > +method Test 67 of 200: Test _S3D (S3 Device State). > method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an > method integer. > method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned > @@ -491,7 +491,7 @@ method an integer. > method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned > method an integer. > method > -method Test 68 of 195: Test _S4D (S4 Device State). > +method Test 68 of 200: Test _S4D (S4 Device State). > method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an > method integer. > method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned > @@ -509,132 +509,132 @@ method an integer. > method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned > method an integer. > method > -method Test 69 of 195: Test _S0W (S0 Device Wake State). > +method Test 69 of 200: Test _S0W (S0 Device Wake State). > method SKIPPED: Test 69, Skipping test for non-existent object > method _S0W. > method > -method Test 70 of 195: Test _S1W (S1 Device Wake State). > +method Test 70 of 200: Test _S1W (S1 Device Wake State). > method SKIPPED: Test 70, Skipping test for non-existent object > method _S1W. > method > -method Test 71 of 195: Test _S2W (S2 Device Wake State). > +method Test 71 of 200: Test _S2W (S2 Device Wake State). > method SKIPPED: Test 71, Skipping test for non-existent object > method _S2W. > method > -method Test 72 of 195: Test _S3W (S3 Device Wake State). > +method Test 72 of 200: Test _S3W (S3 Device Wake State). > method SKIPPED: Test 72, Skipping test for non-existent object > method _S3W. > method > -method Test 73 of 195: Test _S4W (S4 Device Wake State). > +method Test 73 of 200: Test _S4W (S4 Device Wake State). > method SKIPPED: Test 73, Skipping test for non-existent object > method _S4W. > method > -method Test 74 of 195: Test _RST (Device Reset). > +method Test 74 of 200: Test _RST (Device Reset). > method SKIPPED: Test 74, Skipping test for non-existent object > method _RST. > method > -method Test 75 of 195: Test _PRR (Power Resource for Reset). > +method Test 75 of 200: Test _PRR (Power Resource for Reset). > method SKIPPED: Test 75, Skipping test for non-existent object > method _PRR. > method > -method Test 76 of 195: Test _S0_ (S0 System State). > +method Test 76 of 200: Test _S0_ (S0 System State). > method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 > method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 > method PASSED: Test 76, \_S0_ correctly returned a sane looking > method package. > method > -method Test 77 of 195: Test _S1_ (S1 System State). > +method Test 77 of 200: Test _S1_ (S1 System State). > method SKIPPED: Test 77, Skipping test for non-existent object > method _S1_. > method > -method Test 78 of 195: Test _S2_ (S2 System State). > +method Test 78 of 200: Test _S2_ (S2 System State). > method SKIPPED: Test 78, Skipping test for non-existent object > method _S2_. > method > -method Test 79 of 195: Test _S3_ (S3 System State). > +method Test 79 of 200: Test _S3_ (S3 System State). > method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 > method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 > method PASSED: Test 79, \_S3_ correctly returned a sane looking > method package. > method > -method Test 80 of 195: Test _S4_ (S4 System State). > +method Test 80 of 200: Test _S4_ (S4 System State). > method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 > method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 > method PASSED: Test 80, \_S4_ correctly returned a sane looking > method package. > method > -method Test 81 of 195: Test _S5_ (S5 System State). > +method Test 81 of 200: Test _S5_ (S5 System State). > method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 > method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 > method PASSED: Test 81, \_S5_ correctly returned a sane looking > method package. > method > -method Test 82 of 195: Test _SWS (System Wake Source). > +method Test 82 of 200: Test _SWS (System Wake Source). > method SKIPPED: Test 82, Skipping test for non-existent object > method _SWS. > method > -method Test 83 of 195: Test _PSS (Performance Supported States). > +method Test 83 of 200: Test _PSS (Performance Supported States). > method SKIPPED: Test 83, Skipping test for non-existent object > method _PSS. > method > -method Test 84 of 195: Test _CPC (Continuous Performance > +method Test 84 of 200: Test _CPC (Continuous Performance > method Control). > method SKIPPED: Test 84, Skipping test for non-existent object > method _CPC. > method > -method Test 85 of 195: Test _CSD (C State Dependencies). > +method Test 85 of 200: Test _CSD (C State Dependencies). > method SKIPPED: Test 85, Skipping test for non-existent object > method _CSD. > method > -method Test 86 of 195: Test _CST (C States). > +method Test 86 of 200: Test _CST (C States). > method SKIPPED: Test 86, Skipping test for non-existent object > method _CST. > method > -method Test 87 of 195: Test _PCT (Performance Control). > +method Test 87 of 200: Test _PCT (Performance Control). > method SKIPPED: Test 87, Skipping test for non-existent object > method _PCT. > method > -method Test 88 of 195: Test _PDL (P-State Depth Limit). > +method Test 88 of 200: Test _PDL (P-State Depth Limit). > method SKIPPED: Test 88, Skipping test for non-existent object > method _PDL. > method > -method Test 89 of 195: Test _PPC (Performance Present > +method Test 89 of 200: Test _PPC (Performance Present > method Capabilities). > method SKIPPED: Test 89, Skipping test for non-existent object > method _PPC. > method > -method Test 90 of 195: Test _PPE (Polling for Platform Error). > +method Test 90 of 200: Test _PPE (Polling for Platform Error). > method SKIPPED: Test 90, Skipping test for non-existent object > method _PPE. > method > -method Test 91 of 195: Test _PSD (Power State Dependencies). > +method Test 91 of 200: Test _PSD (Power State Dependencies). > method SKIPPED: Test 91, Skipping test for non-existent object > method _PSD. > method > -method Test 92 of 195: Test _PTC (Processor Throttling Control). > +method Test 92 of 200: Test _PTC (Processor Throttling Control). > method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane > method looking package. > method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane > method looking package. > method > -method Test 93 of 195: Test _TDL (T-State Depth Limit). > +method Test 93 of 200: Test _TDL (T-State Depth Limit). > method SKIPPED: Test 93, Skipping test for non-existent object > method _TDL. > method > -method Test 94 of 195: Test _TPC (Throttling Present > +method Test 94 of 200: Test _TPC (Throttling Present > method Capabilities). > method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an > method integer. > method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an > method integer. > method > -method Test 95 of 195: Test _TSD (Throttling State Dependencies). > +method Test 95 of 200: Test _TSD (Throttling State Dependencies). > method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane > method looking package. > method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane > method looking package. > method > -method Test 96 of 195: Test _TSS (Throttling Supported States). > +method Test 96 of 200: Test _TSS (Throttling Supported States). > method \_PR_.CPU0._TSS values: > method T-State CPU Power Latency Control Status > method Freq (mW) (usecs) > @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00 > method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane > method looking package. > method > -method Test 97 of 195: Test _LPI (Low Power Idle States). > +method Test 97 of 200: Test _LPI (Low Power Idle States). > method SKIPPED: Test 97, Skipping test for non-existent object > method _LPI. > method > -method Test 98 of 195: Test _RDI (Resource Dependencies for > +method Test 98 of 200: Test _RDI (Resource Dependencies for > method Idle). > method SKIPPED: Test 98, Skipping test for non-existent object > method _RDI. > method > -method Test 99 of 195: Test _PUR (Processor Utilization Request). > +method Test 99 of 200: Test _PUR (Processor Utilization Request). > method SKIPPED: Test 99, Skipping test for non-existent object > method _PUR. > method > -method Test 100 of 195: Test _MSG (Message). > +method Test 100 of 200: Test _MSG (Message). > method SKIPPED: Test 100, Skipping test for non-existent object > method _MSG. > method > -method Test 101 of 195: Test _SST (System Status). > +method Test 101 of 200: Test _SST (System Status). > method SKIPPED: Test 101, Skipping test for non-existent object > method _SST. > method > -method Test 102 of 195: Test _ALC (Ambient Light Colour > +method Test 102 of 200: Test _ALC (Ambient Light Colour > method Chromaticity). > method SKIPPED: Test 102, Skipping test for non-existent object > method _ALC. > method > -method Test 103 of 195: Test _ALI (Ambient Light Illuminance). > +method Test 103 of 200: Test _ALI (Ambient Light Illuminance). > method SKIPPED: Test 103, Skipping test for non-existent object > method _ALI. > method > -method Test 104 of 195: Test _ALT (Ambient Light Temperature). > +method Test 104 of 200: Test _ALT (Ambient Light Temperature). > method SKIPPED: Test 104, Skipping test for non-existent object > method _ALT. > method > -method Test 105 of 195: Test _ALP (Ambient Light Polling). > +method Test 105 of 200: Test _ALP (Ambient Light Polling). > method SKIPPED: Test 105, Skipping test for non-existent object > method _ALP. > method > -method Test 106 of 195: Test _ALR (Ambient Light Response). > +method Test 106 of 200: Test _ALR (Ambient Light Response). > method SKIPPED: Test 106, Skipping test for non-existent object > method _ALR. > method > -method Test 107 of 195: Test _LID (Lid Status). > +method Test 107 of 200: Test _LID (Lid Status). > method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane > method looking value 0x00000000. > method > -method Test 108 of 195: Test _GTF (Get Task File). > +method Test 108 of 200: Test _GTF (Get Task File). > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly > method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly > @@ -720,540 +720,564 @@ method returned a sane looking buffer. > method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly > method returned a sane looking buffer. > method > -method Test 109 of 195: Test _GTM (Get Timing Mode). > +method Test 109 of 200: Test _GTM (Get Timing Mode). > method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly > method returned a sane looking buffer. > method > -method Test 110 of 195: Test _MBM (Memory Bandwidth Monitoring > +method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring > method Data). > method SKIPPED: Test 110, Skipping test for non-existent object > method _MBM. > method > -method Test 111 of 195: Test _UPC (USB Port Capabilities). > +method Test 111 of 200: Test _UPC (USB Port Capabilities). > method SKIPPED: Test 111, Skipping test for non-existent object > method _UPC. > method > -method Test 112 of 195: Test _UPD (User Presence Detect). > +method Test 112 of 200: Test _UPD (User Presence Detect). > method SKIPPED: Test 112, Skipping test for non-existent object > method _UPD. > method > -method Test 113 of 195: Test _UPP (User Presence Polling). > +method Test 113 of 200: Test _UPP (User Presence Polling). > method SKIPPED: Test 113, Skipping test for non-existent object > method _UPP. > method > -method Test 114 of 195: Test _GCP (Get Capabilities). > +method Test 114 of 200: Test _GCP (Get Capabilities). > method SKIPPED: Test 114, Skipping test for non-existent object > method _GCP. > method > -method Test 115 of 195: Test _GRT (Get Real Time). > +method Test 115 of 200: Test _GRT (Get Real Time). > method SKIPPED: Test 115, Skipping test for non-existent object > method _GRT. > method > -method Test 116 of 195: Test _GWS (Get Wake Status). > +method Test 116 of 200: Test _GWS (Get Wake Status). > method SKIPPED: Test 116, Skipping test for non-existent object > method _GWS. > method > -method Test 117 of 195: Test _CWS (Clear Wake Status). > +method Test 117 of 200: Test _CWS (Clear Wake Status). > method SKIPPED: Test 117, Skipping test for non-existent object > method _CWS. > method > -method Test 118 of 195: Test _SRT (Set Real Time). > +method Test 118 of 200: Test _SRT (Set Real Time). > method SKIPPED: Test 118, Skipping test for non-existent object > method _SRT. > method > -method Test 119 of 195: Test _STP (Set Expired Timer Wake > +method Test 119 of 200: Test _STP (Set Expired Timer Wake > method Policy). > method SKIPPED: Test 119, Skipping test for non-existent object > method _STP. > method > -method Test 120 of 195: Test _STV (Set Timer Value). > +method Test 120 of 200: Test _STV (Set Timer Value). > method SKIPPED: Test 120, Skipping test for non-existent object > method _STV. > method > -method Test 121 of 195: Test _TIP (Expired Timer Wake Policy). > +method Test 121 of 200: Test _TIP (Expired Timer Wake Policy). > method SKIPPED: Test 121, Skipping test for non-existent object > method _TIP. > method > -method Test 122 of 195: Test _TIV (Timer Values). > +method Test 122 of 200: Test _TIV (Timer Values). > method SKIPPED: Test 122, Skipping test for non-existent object > method _TIV. > method > -method Test 123 of 195: Test _SBS (Smart Battery Subsystem). > +method Test 123 of 200: Test _NBS (NVDIMM Boot Status). > method SKIPPED: Test 123, Skipping test for non-existent object > -method _SBS. > +method _NBS. > method > -method Test 124 of 195: Test _BCT (Battery Charge Time). > +method Test 124 of 200: Test _NCH (NVDIMM Current Health > +method Information). > method SKIPPED: Test 124, Skipping test for non-existent object > +method _NCH. > +method > +method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection > +method Capabilities). > +method SKIPPED: Test 125, Skipping test for non-existent object > +method _NIC. > +method > +method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health > +method Errors). > +method SKIPPED: Test 126, Skipping test for non-existent object > +method _NIH. > +method > +method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error > +method Status). > +method SKIPPED: Test 127, Skipping test for non-existent object > +method _NIG. > +method > +method Test 128 of 200: Test _SBS (Smart Battery Subsystem). > +method SKIPPED: Test 128, Skipping test for non-existent object > +method _SBS. > +method > +method Test 129 of 200: Test _BCT (Battery Charge Time). > +method SKIPPED: Test 129, Skipping test for non-existent object > method _BCT. > method > -method Test 125 of 195: Test _BIF (Battery Information). > -method PASSED: Test 125, \_SB_.PCI0.LPCB.BAT1._BIF correctly > +method Test 130 of 200: Test _BIF (Battery Information). > +method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly > method returned a sane looking package. > method > -method Test 126 of 195: Test _BIX (Battery Information Extended). > -method SKIPPED: Test 126, Skipping test for non-existent object > +method Test 131 of 200: Test _BIX (Battery Information Extended). > +method SKIPPED: Test 131, Skipping test for non-existent object > method _BIX. > method > -method Test 127 of 195: Test _BMA (Battery Measurement > +method Test 132 of 200: Test _BMA (Battery Measurement > method Averaging). > -method SKIPPED: Test 127, Skipping test for non-existent object > +method SKIPPED: Test 132, Skipping test for non-existent object > method _BMA. > method > -method Test 128 of 195: Test _BMC (Battery Maintenance Control). > -method SKIPPED: Test 128, Skipping test for non-existent object > +method Test 133 of 200: Test _BMC (Battery Maintenance Control). > +method SKIPPED: Test 133, Skipping test for non-existent object > method _BMC. > method > -method Test 129 of 195: Test _BMD (Battery Maintenance Data). > -method SKIPPED: Test 129, Skipping test for non-existent object > +method Test 134 of 200: Test _BMD (Battery Maintenance Data). > +method SKIPPED: Test 134, Skipping test for non-existent object > method _BMD. > method > -method Test 130 of 195: Test _BMS (Battery Measurement Sampling > +method Test 135 of 200: Test _BMS (Battery Measurement Sampling > method Time). > -method SKIPPED: Test 130, Skipping test for non-existent object > +method SKIPPED: Test 135, Skipping test for non-existent object > method _BMS. > method > -method Test 131 of 195: Test _BST (Battery Status). > -method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BST correctly > +method Test 136 of 200: Test _BST (Battery Status). > +method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly > method returned a sane looking package. > method > -method Test 132 of 195: Test _BTP (Battery Trip Point). > -method SKIPPED: Test 132, Skipping test for non-existent object > +method Test 137 of 200: Test _BTP (Battery Trip Point). > +method SKIPPED: Test 137, Skipping test for non-existent object > method _BTP. > method > -method Test 133 of 195: Test _BTH (Battery Throttle Limit). > -method SKIPPED: Test 133, Skipping test for non-existent object > +method Test 138 of 200: Test _BTH (Battery Throttle Limit). > +method SKIPPED: Test 138, Skipping test for non-existent object > method _BTH. > method > -method Test 134 of 195: Test _BTM (Battery Time). > -method SKIPPED: Test 134, Skipping test for non-existent object > +method Test 139 of 200: Test _BTM (Battery Time). > +method SKIPPED: Test 139, Skipping test for non-existent object > method _BTM. > method > -method Test 135 of 195: Test _PCL (Power Consumer List). > -method PASSED: Test 135, \_SB_.PCI0.LPCB.ACAD._PCL returned a > +method Test 140 of 200: Test _PCL (Power Consumer List). > +method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a > method sane package of 1 references. > -method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._PCL returned a > +method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a > method sane package of 1 references. > method > -method Test 136 of 195: Test _PIF (Power Source Information). > -method SKIPPED: Test 136, Skipping test for non-existent object > +method Test 141 of 200: Test _PIF (Power Source Information). > +method SKIPPED: Test 141, Skipping test for non-existent object > method _PIF. > method > -method Test 137 of 195: Test _PRL (Power Source Redundancy List). > -method SKIPPED: Test 137, Skipping test for non-existent object > +method Test 142 of 200: Test _PRL (Power Source Redundancy List). > +method SKIPPED: Test 142, Skipping test for non-existent object > method _PRL. > method > -method Test 138 of 195: Test _PSR (Power Source). > -method PASSED: Test 138, \_SB_.PCI0.LPCB.ACAD._PSR correctly > +method Test 143 of 200: Test _PSR (Power Source). > +method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly > method returned sane looking value 0x00000000. > method > -method Test 139 of 195: Test _GAI (Get Averaging Level). > -method SKIPPED: Test 139, Skipping test for non-existent object > +method Test 144 of 200: Test _GAI (Get Averaging Level). > +method SKIPPED: Test 144, Skipping test for non-existent object > method _GAI. > method > -method Test 140 of 195: Test _GHL (Get Harware Limit). > -method SKIPPED: Test 140, Skipping test for non-existent object > +method Test 145 of 200: Test _GHL (Get Harware Limit). > +method SKIPPED: Test 145, Skipping test for non-existent object > method _GHL. > method > -method Test 141 of 195: Test _PMC (Power Meter Capabilities). > -method SKIPPED: Test 141, Skipping test for non-existent object > +method Test 146 of 200: Test _PMC (Power Meter Capabilities). > +method SKIPPED: Test 146, Skipping test for non-existent object > method _PMC. > method > -method Test 142 of 195: Test _PMD (Power Meter Devices). > -method SKIPPED: Test 142, Skipping test for non-existent object > +method Test 147 of 200: Test _PMD (Power Meter Devices). > +method SKIPPED: Test 147, Skipping test for non-existent object > method _PMD. > method > -method Test 143 of 195: Test _PMM (Power Meter Measurement). > -method SKIPPED: Test 143, Skipping test for non-existent object > +method Test 148 of 200: Test _PMM (Power Meter Measurement). > +method SKIPPED: Test 148, Skipping test for non-existent object > method _PMM. > method > -method Test 144 of 195: Test _WPC (Wireless Power Calibration). > -method SKIPPED: Test 144, Skipping test for non-existent object > +method Test 149 of 200: Test _WPC (Wireless Power Calibration). > +method SKIPPED: Test 149, Skipping test for non-existent object > method _WPC. > method > -method Test 145 of 195: Test _WPP (Wireless Power Polling). > -method SKIPPED: Test 145, Skipping test for non-existent object > +method Test 150 of 200: Test _WPP (Wireless Power Polling). > +method SKIPPED: Test 150, Skipping test for non-existent object > method _WPP. > method > -method Test 146 of 195: Test _FIF (Fan Information). > -method SKIPPED: Test 146, Skipping test for non-existent object > +method Test 151 of 200: Test _FIF (Fan Information). > +method SKIPPED: Test 151, Skipping test for non-existent object > method _FIF. > method > -method Test 147 of 195: Test _FPS (Fan Performance States). > -method SKIPPED: Test 147, Skipping test for non-existent object > +method Test 152 of 200: Test _FPS (Fan Performance States). > +method SKIPPED: Test 152, Skipping test for non-existent object > method _FPS. > method > -method Test 148 of 195: Test _FSL (Fan Set Level). > -method SKIPPED: Test 148, Skipping test for non-existent object > +method Test 153 of 200: Test _FSL (Fan Set Level). > +method SKIPPED: Test 153, Skipping test for non-existent object > method _FSL. > method > -method Test 149 of 195: Test _FST (Fan Status). > -method SKIPPED: Test 149, Skipping test for non-existent object > +method Test 154 of 200: Test _FST (Fan Status). > +method SKIPPED: Test 154, Skipping test for non-existent object > method _FST. > method > -method Test 150 of 195: Test _ACx (Active Cooling). > -method SKIPPED: Test 150, Skipping test for non-existent object > +method Test 155 of 200: Test _ACx (Active Cooling). > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC0. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC1. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC2. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC3. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC4. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC5. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC6. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC7. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC8. > method > -method SKIPPED: Test 150, Skipping test for non-existent object > +method SKIPPED: Test 155, Skipping test for non-existent object > method _AC9. > method > method > -method Test 151 of 195: Test _ART (Active Cooling Relationship > +method Test 156 of 200: Test _ART (Active Cooling Relationship > method Table). > -method SKIPPED: Test 151, Skipping test for non-existent object > +method SKIPPED: Test 156, Skipping test for non-existent object > method _ART. > method > -method Test 152 of 195: Test _CRT (Critical Trip Point). > -method SKIPPED: Test 152, Skipping test for non-existent object > +method Test 157 of 200: Test _CRT (Critical Trip Point). > +method SKIPPED: Test 157, Skipping test for non-existent object > method _CRT. > method > -method Test 153 of 195: Test _CR3 (Warm/Standby Temperature). > -method SKIPPED: Test 153, Skipping test for non-existent object > +method Test 158 of 200: Test _CR3 (Warm/Standby Temperature). > +method SKIPPED: Test 158, Skipping test for non-existent object > method _CR3. > method > -method Test 154 of 195: Test _DTI (Device Temperature > +method Test 159 of 200: Test _DTI (Device Temperature > method Indication). > -method SKIPPED: Test 154, Skipping test for non-existent object > +method SKIPPED: Test 159, Skipping test for non-existent object > method _DTI. > method > -method Test 155 of 195: Test _HOT (Hot Temperature). > -method SKIPPED: Test 155, Skipping test for non-existent object > +method Test 160 of 200: Test _HOT (Hot Temperature). > +method SKIPPED: Test 160, Skipping test for non-existent object > method _HOT. > method > -method Test 156 of 195: Test _MTL (Minimum Throttle Limit). > -method SKIPPED: Test 156, Skipping test for non-existent object > +method Test 161 of 200: Test _MTL (Minimum Throttle Limit). > +method SKIPPED: Test 161, Skipping test for non-existent object > method _MTL. > method > -method Test 157 of 195: Test _NTT (Notification Temp Threshold). > -method SKIPPED: Test 157, Skipping test for non-existent object > +method Test 162 of 200: Test _NTT (Notification Temp Threshold). > +method SKIPPED: Test 162, Skipping test for non-existent object > method _NTT. > method > -method Test 158 of 195: Test _PSL (Passive List). > -method SKIPPED: Test 158, Skipping test for non-existent object > +method Test 163 of 200: Test _PSL (Passive List). > +method SKIPPED: Test 163, Skipping test for non-existent object > method _PSL. > method > -method Test 159 of 195: Test _PSV (Passive Temp). > -method SKIPPED: Test 159, Skipping test for non-existent object > +method Test 164 of 200: Test _PSV (Passive Temp). > +method SKIPPED: Test 164, Skipping test for non-existent object > method _PSV. > method > -method Test 160 of 195: Test _RTV (Relative Temp Values). > -method SKIPPED: Test 160, Skipping test for non-existent object > +method Test 165 of 200: Test _RTV (Relative Temp Values). > +method SKIPPED: Test 165, Skipping test for non-existent object > method _RTV. > method > -method Test 161 of 195: Test _SCP (Set Cooling Policy). > -method SKIPPED: Test 161, Skipping test for non-existent object > +method Test 166 of 200: Test _SCP (Set Cooling Policy). > +method SKIPPED: Test 166, Skipping test for non-existent object > method _DTI. > method > -method Test 162 of 195: Test _TC1 (Thermal Constant 1). > -method SKIPPED: Test 162, Skipping test for non-existent object > +method Test 167 of 200: Test _TC1 (Thermal Constant 1). > +method SKIPPED: Test 167, Skipping test for non-existent object > method _TC1. > method > -method Test 163 of 195: Test _TC2 (Thermal Constant 2). > -method SKIPPED: Test 163, Skipping test for non-existent object > +method Test 168 of 200: Test _TC2 (Thermal Constant 2). > +method SKIPPED: Test 168, Skipping test for non-existent object > method _TC2. > method > -method Test 164 of 195: Test _TFP (Thermal fast Sampling Period). > -method SKIPPED: Test 164, Skipping test for non-existent object > +method Test 169 of 200: Test _TFP (Thermal fast Sampling Period). > +method SKIPPED: Test 169, Skipping test for non-existent object > method _TFP. > method > -method Test 165 of 195: Test _TMP (Thermal Zone Current Temp). > -method SKIPPED: Test 165, Skipping test for non-existent object > +method Test 170 of 200: Test _TMP (Thermal Zone Current Temp). > +method SKIPPED: Test 170, Skipping test for non-existent object > method _TMP. > method > -method Test 166 of 195: Test _TPT (Trip Point Temperature). > -method SKIPPED: Test 166, Skipping test for non-existent object > +method Test 171 of 200: Test _TPT (Trip Point Temperature). > +method SKIPPED: Test 171, Skipping test for non-existent object > method _TPT. > method > -method Test 167 of 195: Test _TRT (Thermal Relationship Table). > -method SKIPPED: Test 167, Skipping test for non-existent object > +method Test 172 of 200: Test _TRT (Thermal Relationship Table). > +method SKIPPED: Test 172, Skipping test for non-existent object > method _TRT. > method > -method Test 168 of 195: Test _TSN (Thermal Sensor Device). > -method SKIPPED: Test 168, Skipping test for non-existent object > +method Test 173 of 200: Test _TSN (Thermal Sensor Device). > +method SKIPPED: Test 173, Skipping test for non-existent object > method _TSN. > method > -method Test 169 of 195: Test _TSP (Thermal Sampling Period). > -method SKIPPED: Test 169, Skipping test for non-existent object > +method Test 174 of 200: Test _TSP (Thermal Sampling Period). > +method SKIPPED: Test 174, Skipping test for non-existent object > method _TSP. > method > -method Test 170 of 195: Test _TST (Temperature Sensor Threshold). > -method SKIPPED: Test 170, Skipping test for non-existent object > +method Test 175 of 200: Test _TST (Temperature Sensor Threshold). > +method SKIPPED: Test 175, Skipping test for non-existent object > method _TST. > method > -method Test 171 of 195: Test _TZD (Thermal Zone Devices). > -method SKIPPED: Test 171, Skipping test for non-existent object > +method Test 176 of 200: Test _TZD (Thermal Zone Devices). > +method SKIPPED: Test 176, Skipping test for non-existent object > method _TZD. > method > -method Test 172 of 195: Test _TZM (Thermal Zone member). > -method SKIPPED: Test 172, Skipping test for non-existent object > +method Test 177 of 200: Test _TZM (Thermal Zone member). > +method SKIPPED: Test 177, Skipping test for non-existent object > method _TZM. > method > -method Test 173 of 195: Test _TZP (Thermal Zone Polling). > -method SKIPPED: Test 173, Skipping test for non-existent object > +method Test 178 of 200: Test _TZP (Thermal Zone Polling). > +method SKIPPED: Test 178, Skipping test for non-existent object > method _TZP. > method > -method Test 174 of 195: Test _GPE (General Purpose Events). > -method PASSED: Test 174, \_SB_.PCI0.LPCB.EC0_._GPE returned an > +method Test 179 of 200: Test _GPE (General Purpose Events). > +method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an > method integer 0x0000001c > method > -method Test 175 of 195: Test _EC_ (EC Offset Query). > -method SKIPPED: Test 175, Skipping test for non-existent object > +method Test 180 of 200: Test _EC_ (EC Offset Query). > +method SKIPPED: Test 180, Skipping test for non-existent object > method _EC_. > method > -method Test 176 of 195: Test _PTS (Prepare to Sleep). > +method Test 181 of 200: Test _PTS (Prepare to Sleep). > method Test _PTS(3). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(4). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method Test _PTS(5). > -method PASSED: Test 176, \_PTS returned no values as expected. > +method PASSED: Test 181, \_PTS returned no values as expected. > method > method > -method Test 177 of 195: Test _TTS (Transition to State). > -method SKIPPED: Test 177, Optional control method _TTS does not > +method Test 182 of 200: Test _TTS (Transition to State). > +method SKIPPED: Test 182, Optional control method _TTS does not > method exist. > method > -method Test 178 of 195: Test _WAK (System Wake). > +method Test 183 of 200: Test _WAK (System Wake). > method Test _WAK(3) System Wake, State S3. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(4) System Wake, State S4. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method Test _WAK(5) System Wake, State S5. > -method PASSED: Test 178, \_WAK correctly returned a sane looking > +method PASSED: Test 183, \_WAK correctly returned a sane looking > method package. > method > method > -method Test 179 of 195: Test _ADR (Return Unique ID for Device). > -method PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned > +method Test 184 of 200: Test _ADR (Return Unique ID for Device). > +method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned > method an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly > +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly > method returned an integer. > -method PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned > +method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned > method an integer. > method > -method Test 180 of 195: Test _BCL (Query List of Brightness > +method Test 185 of 200: Test _BCL (Query List of Brightness > method Control Levels Supported). > method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned > method a sane package of 10 integers. > method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: > method Level on full power : 70 > method Level on battery power: 40 > method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 > -method PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a > +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a > method sane package of 10 integers. > method > -method Test 181 of 195: Test _BCM (Set Brightness Level). > -method PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > +method Test 186 of 200: Test _BCM (Set Brightness Level). > +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned > method no values as expected. > -method PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no > +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no > method values as expected. > method > -method Test 182 of 195: Test _BQC (Brightness Query Current > +method Test 187 of 200: Test _BQC (Brightness Query Current > method Level). > -method PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly > method returned an integer. > -method PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly > +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly > method returned an integer. > method > -method Test 183 of 195: Test _DCS (Return the Status of Output > +method Test 188 of 200: Test _DCS (Return the Status of Output > method Device). > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly > method returned an integer. > -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly > +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly > method returned an integer. > method > -method Test 184 of 195: Test _DDC (Return the EDID for this > +method Test 189 of 200: Test _DDC (Return the EDID for this > method Device). > -method SKIPPED: Test 184, Skipping test for non-existent object > +method SKIPPED: Test 189, Skipping test for non-existent object > method _DDC. > method > -method Test 185 of 195: Test _DSS (Device Set State). > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > +method Test 190 of 200: Test _DSS (Device Set State). > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned > method no values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no > method values as expected. > -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no > +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no > method values as expected. > method > -method Test 186 of 195: Test _DGS (Query Graphics State). > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > +method Test 191 of 200: Test _DGS (Query Graphics State). > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly > method returned an integer. > -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly > +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly > method returned an integer. > method > -method Test 187 of 195: Test _DOD (Enumerate All Devices Attached > +method Test 192 of 200: Test _DOD (Enumerate All Devices Attached > method to Display Adapter). > method Device 0: > method Instance: 0 > @@ -1276,7 +1300,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni > method BIOS can detect device: 0 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly > +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly > method returned a sane looking package. > method Device 0: > method Instance: 0 > @@ -1313,45 +1337,45 @@ method Type of display: 0 (Other) > method BIOS can detect device: 1 > method Non-VGA device: 0 > method Head or pipe ID: 0 > -method PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned > +method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned > method a sane looking package. > method > -method Test 188 of 195: Test _DOS (Enable/Disable Output > +method Test 193 of 200: Test _DOS (Enable/Disable Output > method Switching). > -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no > +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no > method values as expected. > -method PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values > +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values > method as expected. > method > -method Test 189 of 195: Test _GPD (Get POST Device). > -method SKIPPED: Test 189, Skipping test for non-existent object > +method Test 194 of 200: Test _GPD (Get POST Device). > +method SKIPPED: Test 194, Skipping test for non-existent object > method _GPD. > method > -method Test 190 of 195: Test _ROM (Get ROM Data). > -method SKIPPED: Test 190, Skipping test for non-existent object > +method Test 195 of 200: Test _ROM (Get ROM Data). > +method SKIPPED: Test 195, Skipping test for non-existent object > method _ROM. > method > -method Test 191 of 195: Test _SPD (Set POST Device). > -method SKIPPED: Test 191, Skipping test for non-existent object > +method Test 196 of 200: Test _SPD (Set POST Device). > +method SKIPPED: Test 196, Skipping test for non-existent object > method _SPD. > method > -method Test 192 of 195: Test _VPO (Video POST Options). > -method SKIPPED: Test 192, Skipping test for non-existent object > +method Test 197 of 200: Test _VPO (Video POST Options). > +method SKIPPED: Test 197, Skipping test for non-existent object > method _VPO. > method > -method Test 193 of 195: Test _CBA (Configuration Base Address). > -method SKIPPED: Test 193, Skipping test for non-existent object > +method Test 198 of 200: Test _CBA (Configuration Base Address). > +method SKIPPED: Test 198, Skipping test for non-existent object > method _CBA. > method > -method Test 194 of 195: Test _IFT (IPMI Interface Type). > -method SKIPPED: Test 194, Skipping test for non-existent object > +method Test 199 of 200: Test _IFT (IPMI Interface Type). > +method SKIPPED: Test 199, Skipping test for non-existent object > method _IFT. > method > -method Test 195 of 195: Test _SRV (IPMI Interface Revision). > -method SKIPPED: Test 195, Skipping test for non-existent object > +method Test 200 of 200: Test _SRV (IPMI Interface Revision). > +method SKIPPED: Test 200, Skipping test for non-existent object > method _SRV. > method > method ========================================================== > -method 260 passed, 0 failed, 0 warning, 0 aborted, 157 skipped, 0 > +method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0 > method info only. > method ========================================================== > Acked-by: Colin Ian King <colin.king@canonical.com>
diff --git a/fwts-test/method-0001/method-0001.log b/fwts-test/method-0001/method-0001.log index ba25c50e..5d8b4f0a 100644 --- a/fwts-test/method-0001/method-0001.log +++ b/fwts-test/method-0001/method-0001.log @@ -1,41 +1,41 @@ method method: ACPI DSDT Method Semantic tests. method ---------------------------------------------------------- -method Test 1 of 195: Test Method Names. +method Test 1 of 200: Test Method Names. method Found 1061 Objects method PASSED: Test 1, Method names contain legal characters. method -method Test 2 of 195: Test _AEI. +method Test 2 of 200: Test _AEI. method SKIPPED: Test 2, Skipping test for non-existent object method _AEI. method -method Test 3 of 195: Test _EVT (Event Method). +method Test 3 of 200: Test _EVT (Event Method). method SKIPPED: Test 3, Skipping test for non-existent object method _EVT. method -method Test 4 of 195: Test _DLM (Device Lock Mutex). +method Test 4 of 200: Test _DLM (Device Lock Mutex). method SKIPPED: Test 4, Skipping test for non-existent object method _DLM. method -method Test 5 of 195: Test _PIC (Inform AML of Interrupt Model). +method Test 5 of 200: Test _PIC (Inform AML of Interrupt Model). method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method PASSED: Test 5, \_PIC returned no values as expected. method -method Test 6 of 195: Test _CID (Compatible ID). +method Test 6 of 200: Test _CID (Compatible ID). method PASSED: Test 6, \_SB_.PCI0._CID returned an integer method 0x030ad041 (EISA ID PNP0A03). method PASSED: Test 6, \_SB_.PCI0.LPCB.HPET._CID returned an method integer 0x010cd041 (EISA ID PNP0C01). method -method Test 7 of 195: Test _CLS (Class Code). +method Test 7 of 200: Test _CLS (Class Code). method SKIPPED: Test 7, Skipping test for non-existent object method _CLS. method -method Test 8 of 195: Test _DDN (DOS Device Name). +method Test 8 of 200: Test _DDN (DOS Device Name). method SKIPPED: Test 8, Skipping test for non-existent object method _DDN. method -method Test 9 of 195: Test _HID (Hardware ID). +method Test 9 of 200: Test _HID (Hardware ID). method PASSED: Test 9, \_SB_.AMW0._HID returned a string method 'PNP0C14' as expected. method PASSED: Test 9, \_SB_.LID0._HID returned an integer @@ -89,31 +89,31 @@ method integer 0x0303d041 (EISA ID PNP0303). method PASSED: Test 9, \_SB_.PCI0.LPCB.PS2M._HID returned an method integer 0x130fd041 (EISA ID PNP0F13). method -method Test 10 of 195: Test _HRV (Hardware Revision Number). +method Test 10 of 200: Test _HRV (Hardware Revision Number). method SKIPPED: Test 10, Skipping test for non-existent object method _HRV. method -method Test 11 of 195: Test _MLS (Multiple Language String). +method Test 11 of 200: Test _MLS (Multiple Language String). method SKIPPED: Test 11, Skipping test for non-existent object method _MLS. method -method Test 12 of 195: Test _PLD (Physical Device Location). +method Test 12 of 200: Test _PLD (Physical Device Location). method SKIPPED: Test 12, Skipping test for non-existent object method _PLD. method -method Test 13 of 195: Test _SUB (Subsystem ID). +method Test 13 of 200: Test _SUB (Subsystem ID). method SKIPPED: Test 13, Skipping test for non-existent object method _SUB. method -method Test 14 of 195: Test _SUN (Slot User Number). +method Test 14 of 200: Test _SUN (Slot User Number). method SKIPPED: Test 14, Skipping test for non-existent object method _SUN. method -method Test 15 of 195: Test _STR (String). +method Test 15 of 200: Test _STR (String). method SKIPPED: Test 15, Skipping test for non-existent object method _STR. method -method Test 16 of 195: Test _UID (Unique ID). +method Test 16 of 200: Test _UID (Unique ID). method PASSED: Test 16, \_SB_.AMW0._UID correctly returned sane method looking value 0x00000000. method PASSED: Test 16, \_SB_.PCI0.PDRC._UID correctly returned @@ -139,11 +139,11 @@ method returned sane looking value 0x00000002. method PASSED: Test 16, \_SB_.PCI0.LPCB.BAT1._UID correctly method returned sane looking value 0x00000001. method -method Test 17 of 195: Test _CDM (Clock Domain). +method Test 17 of 200: Test _CDM (Clock Domain). method SKIPPED: Test 17, Skipping test for non-existent object method _CDM. method -method Test 18 of 195: Test _CRS (Current Resource Settings). +method Test 18 of 200: Test _CRS (Current Resource Settings). method PASSED: Test 18, \_SB_.PCI0._CRS (WORD Address Space method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.PDRC._CRS (32-bit Fixed @@ -187,11 +187,11 @@ method Descriptor) looks sane. method PASSED: Test 18, \_SB_.PCI0.LPCB.PS2M._CRS (IRQ method Descriptor) looks sane. method -method Test 19 of 195: Test _DSD (Device Specific Data). +method Test 19 of 200: Test _DSD (Device Specific Data). method SKIPPED: Test 19, Skipping test for non-existent object method _DSD. method -method Test 20 of 195: Test _DIS (Disable). +method Test 20 of 200: Test _DIS (Disable). method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKA._DIS returned no method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKB._DIS returned no @@ -209,24 +209,24 @@ method values as expected. method PASSED: Test 20, \_SB_.PCI0.LPCB.LNKH._DIS returned no method values as expected. method -method Test 21 of 195: Test _DMA (Direct Memory Access). +method Test 21 of 200: Test _DMA (Direct Memory Access). method SKIPPED: Test 21, Skipping test for non-existent object method _DMA. method -method Test 22 of 195: Test _FIX (Fixed Register Resource +method Test 22 of 200: Test _FIX (Fixed Register Resource method Provider). method SKIPPED: Test 22, Skipping test for non-existent object method _FIX. method -method Test 23 of 195: Test _GSB (Global System Interrupt Base). +method Test 23 of 200: Test _GSB (Global System Interrupt Base). method SKIPPED: Test 23, Skipping test for non-existent object method _GSB. method -method Test 24 of 195: Test _HPP (Hot Plug Parameters). +method Test 24 of 200: Test _HPP (Hot Plug Parameters). method SKIPPED: Test 24, Skipping test for non-existent object method _HPP. method -method Test 25 of 195: Test _PRS (Possible Resource Settings). +method Test 25 of 200: Test _PRS (Possible Resource Settings). method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKA._PRS (IRQ method Descriptor) looks sane. method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKB._PRS (IRQ @@ -244,7 +244,7 @@ method Descriptor) looks sane. method PASSED: Test 25, \_SB_.PCI0.LPCB.LNKH._PRS (IRQ method Descriptor) looks sane. method -method Test 26 of 195: Test _PRT (PCI Routing Table). +method Test 26 of 200: Test _PRT (PCI Routing Table). method PASSED: Test 26, \_SB_.PCI0._PRT correctly returned a sane method looking package. method PASSED: Test 26, \_SB_.PCI0.PEGP._PRT correctly returned a @@ -264,51 +264,51 @@ method sane looking package. method PASSED: Test 26, \_SB_.PCI0.PCIB._PRT correctly returned a method sane looking package. method -method Test 27 of 195: Test _PXM (Proximity). +method Test 27 of 200: Test _PXM (Proximity). method SKIPPED: Test 27, Skipping test for non-existent object method _PXM. method -method Test 28 of 195: Test _CCA (Cache Coherency Attribute). +method Test 28 of 200: Test _CCA (Cache Coherency Attribute). method SKIPPED: Test 28, Skipping test for non-existent object method _CCA. method -method Test 29 of 195: Test _EDL (Eject Device List). +method Test 29 of 200: Test _EDL (Eject Device List). method SKIPPED: Test 29, Skipping test for non-existent object method _EDL. method -method Test 30 of 195: Test _EJD (Ejection Dependent Device). +method Test 30 of 200: Test _EJD (Ejection Dependent Device). method SKIPPED: Test 30, Skipping test for non-existent object method _EJD. method -method Test 31 of 195: Test _EJ0 (Eject). +method Test 31 of 200: Test _EJ0 (Eject). method SKIPPED: Test 31, Skipping test for non-existent object method _EJ0. method -method Test 32 of 195: Test _EJ1 (Eject). +method Test 32 of 200: Test _EJ1 (Eject). method SKIPPED: Test 32, Skipping test for non-existent object method _EJ1. method -method Test 33 of 195: Test _EJ2 (Eject). +method Test 33 of 200: Test _EJ2 (Eject). method SKIPPED: Test 33, Skipping test for non-existent object method _EJ2. method -method Test 34 of 195: Test _EJ3 (Eject). +method Test 34 of 200: Test _EJ3 (Eject). method SKIPPED: Test 34, Skipping test for non-existent object method _EJ3. method -method Test 35 of 195: Test _EJ4 (Eject). +method Test 35 of 200: Test _EJ4 (Eject). method SKIPPED: Test 35, Skipping test for non-existent object method _EJ4. method -method Test 36 of 195: Test _LCK (Lock). +method Test 36 of 200: Test _LCK (Lock). method SKIPPED: Test 36, Skipping test for non-existent object method _LCK. method -method Test 37 of 195: Test _RMV (Remove). +method Test 37 of 200: Test _RMV (Remove). method PASSED: Test 37, \_SB_.PCI0.RP03.PXSX._RMV correctly method returned sane looking value 0x00000001. method -method Test 38 of 195: Test _STA (Status). +method Test 38 of 200: Test _STA (Status). method PASSED: Test 38, \_SB_.PCI0.PEGP.VGA_._STA correctly method returned sane looking value 0x0000000f. method PASSED: Test 38, \_SB_.PCI0.LPCB.LNKA._STA correctly @@ -332,81 +332,81 @@ method returned sane looking value 0x00000000. method PASSED: Test 38, \_SB_.PCI0.LPCB.BAT1._STA correctly method returned sane looking value 0x0000001f. method -method Test 39 of 195: Test _DEP (Operational Region +method Test 39 of 200: Test _DEP (Operational Region method Dependencies). method SKIPPED: Test 39, Skipping test for non-existent object method _DEP. method -method Test 40 of 195: Test _FIT (Firmware Interface Table). +method Test 40 of 200: Test _FIT (Firmware Interface Table). method SKIPPED: Test 40, Skipping test for non-existent object method _FIT. method -method Test 41 of 195: Test _BDN (BIOS Dock Name). +method Test 41 of 200: Test _BDN (BIOS Dock Name). method SKIPPED: Test 41, Skipping test for non-existent object method _BDN. method -method Test 42 of 195: Test _BBN (Base Bus Number). +method Test 42 of 200: Test _BBN (Base Bus Number). method SKIPPED: Test 42, Skipping test for non-existent object method _BBN. method -method Test 43 of 195: Test _DCK (Dock). +method Test 43 of 200: Test _DCK (Dock). method SKIPPED: Test 43, Skipping test for non-existent object method _DCK. method -method Test 44 of 195: Test _INI (Initialize). +method Test 44 of 200: Test _INI (Initialize). method PASSED: Test 44, \_SB_._INI returned no values as method expected. method -method Test 45 of 195: Test _GLK (Global Lock). +method Test 45 of 200: Test _GLK (Global Lock). method SKIPPED: Test 45, Skipping test for non-existent object method _GLK. method -method Test 46 of 195: Test _SEG (Segment). +method Test 46 of 200: Test _SEG (Segment). method SKIPPED: Test 46, Skipping test for non-existent object method _SEG. method -method Test 47 of 195: Test _LSI (Label Storage Information). +method Test 47 of 200: Test _LSI (Label Storage Information). method SKIPPED: Test 47, Skipping test for non-existent object method _LSI. method -method Test 48 of 195: Test _OFF (Set resource off). +method Test 48 of 200: Test _OFF (Set resource off). method SKIPPED: Test 48, Skipping test for non-existent object method _OFF. method -method Test 49 of 195: Test _ON_ (Set resource on). +method Test 49 of 200: Test _ON_ (Set resource on). method SKIPPED: Test 49, Skipping test for non-existent object method _ON_. method -method Test 50 of 195: Test _DSW (Device Sleep Wake). +method Test 50 of 200: Test _DSW (Device Sleep Wake). method SKIPPED: Test 50, Skipping test for non-existent object method _DSW. method -method Test 51 of 195: Test _IRC (In Rush Current). +method Test 51 of 200: Test _IRC (In Rush Current). method SKIPPED: Test 51, Skipping test for non-existent object method _IRC. method -method Test 52 of 195: Test _PRE (Power Resources for +method Test 52 of 200: Test _PRE (Power Resources for method Enumeration). method SKIPPED: Test 52, Skipping test for non-existent object method _PRE. method -method Test 53 of 195: Test _PR0 (Power Resources for D0). +method Test 53 of 200: Test _PR0 (Power Resources for D0). method SKIPPED: Test 53, Skipping test for non-existent object method _PR0. method -method Test 54 of 195: Test _PR1 (Power Resources for D1). +method Test 54 of 200: Test _PR1 (Power Resources for D1). method SKIPPED: Test 54, Skipping test for non-existent object method _PR1. method -method Test 55 of 195: Test _PR2 (Power Resources for D2). +method Test 55 of 200: Test _PR2 (Power Resources for D2). method SKIPPED: Test 55, Skipping test for non-existent object method _PR2. method -method Test 56 of 195: Test _PR3 (Power Resources for D3). +method Test 56 of 200: Test _PR3 (Power Resources for D3). method SKIPPED: Test 56, Skipping test for non-existent object method _PR3. method -method Test 57 of 195: Test _PRW (Power Resources for Wake). +method Test 57 of 200: Test _PRW (Power Resources for Wake). method PASSED: Test 57, \_SB_.PCI0.HDEF._PRW correctly returned a method sane looking package. method PASSED: Test 57, \_SB_.PCI0.RP03.PXSX._PRW correctly @@ -426,34 +426,34 @@ method sane looking package. method PASSED: Test 57, \_SB_.PCI0.EHC2._PRW correctly returned a method sane looking package. method -method Test 58 of 195: Test _PS0 (Power State 0). +method Test 58 of 200: Test _PS0 (Power State 0). method PASSED: Test 58, \_SB_.PCI0.PEGP.VGA_._PS0 returned no method values as expected. method PASSED: Test 58, \_PS0 returned no values as expected. method -method Test 59 of 195: Test _PS1 (Power State 1). +method Test 59 of 200: Test _PS1 (Power State 1). method PASSED: Test 59, \_SB_.PCI0.PEGP.VGA_._PS1 returned no method values as expected. method -method Test 60 of 195: Test _PS2 (Power State 2). +method Test 60 of 200: Test _PS2 (Power State 2). method SKIPPED: Test 60, Skipping test for non-existent object method _PS2. method -method Test 61 of 195: Test _PS3 (Power State 3). +method Test 61 of 200: Test _PS3 (Power State 3). method PASSED: Test 61, \_SB_.PCI0.PEGP.VGA_._PS3 returned no method values as expected. method PASSED: Test 61, \_PS3 returned no values as expected. method -method Test 62 of 195: Test _PSC (Power State Current). +method Test 62 of 200: Test _PSC (Power State Current). method PASSED: Test 62, \_SB_.PCI0.PEGP.VGA_._PSC correctly method returned an integer. method PASSED: Test 62, \_PSC correctly returned an integer. method -method Test 63 of 195: Test _PSE (Power State for Enumeration). +method Test 63 of 200: Test _PSE (Power State for Enumeration). method SKIPPED: Test 63, Skipping test for non-existent object method _PSE. method -method Test 64 of 195: Test _PSW (Power State Wake). +method Test 64 of 200: Test _PSW (Power State Wake). method PASSED: Test 64, \_SB_.PCI0.USB1._PSW returned no values method as expected. method PASSED: Test 64, \_SB_.PCI0.USB2._PSW returned no values @@ -465,15 +465,15 @@ method as expected. method PASSED: Test 64, \_SB_.PCI0.USB5._PSW returned no values method as expected. method -method Test 65 of 195: Test _S1D (S1 Device State). +method Test 65 of 200: Test _S1D (S1 Device State). method SKIPPED: Test 65, Skipping test for non-existent object method _S1D. method -method Test 66 of 195: Test _S2D (S2 Device State). +method Test 66 of 200: Test _S2D (S2 Device State). method SKIPPED: Test 66, Skipping test for non-existent object method _S2D. method -method Test 67 of 195: Test _S3D (S3 Device State). +method Test 67 of 200: Test _S3D (S3 Device State). method PASSED: Test 67, \_SB_.PCI0._S3D correctly returned an method integer. method PASSED: Test 67, \_SB_.PCI0.USB1._S3D correctly returned @@ -491,7 +491,7 @@ method an integer. method PASSED: Test 67, \_SB_.PCI0.EHC2._S3D correctly returned method an integer. method -method Test 68 of 195: Test _S4D (S4 Device State). +method Test 68 of 200: Test _S4D (S4 Device State). method PASSED: Test 68, \_SB_.PCI0._S4D correctly returned an method integer. method PASSED: Test 68, \_SB_.PCI0.USB1._S4D correctly returned @@ -509,132 +509,132 @@ method an integer. method PASSED: Test 68, \_SB_.PCI0.EHC2._S4D correctly returned method an integer. method -method Test 69 of 195: Test _S0W (S0 Device Wake State). +method Test 69 of 200: Test _S0W (S0 Device Wake State). method SKIPPED: Test 69, Skipping test for non-existent object method _S0W. method -method Test 70 of 195: Test _S1W (S1 Device Wake State). +method Test 70 of 200: Test _S1W (S1 Device Wake State). method SKIPPED: Test 70, Skipping test for non-existent object method _S1W. method -method Test 71 of 195: Test _S2W (S2 Device Wake State). +method Test 71 of 200: Test _S2W (S2 Device Wake State). method SKIPPED: Test 71, Skipping test for non-existent object method _S2W. method -method Test 72 of 195: Test _S3W (S3 Device Wake State). +method Test 72 of 200: Test _S3W (S3 Device Wake State). method SKIPPED: Test 72, Skipping test for non-existent object method _S3W. method -method Test 73 of 195: Test _S4W (S4 Device Wake State). +method Test 73 of 200: Test _S4W (S4 Device Wake State). method SKIPPED: Test 73, Skipping test for non-existent object method _S4W. method -method Test 74 of 195: Test _RST (Device Reset). +method Test 74 of 200: Test _RST (Device Reset). method SKIPPED: Test 74, Skipping test for non-existent object method _RST. method -method Test 75 of 195: Test _PRR (Power Resource for Reset). +method Test 75 of 200: Test _PRR (Power Resource for Reset). method SKIPPED: Test 75, Skipping test for non-existent object method _PRR. method -method Test 76 of 195: Test _S0_ (S0 System State). +method Test 76 of 200: Test _S0_ (S0 System State). method \_S0_ PM1a_CNT.SLP_TYP value: 0x00000000 method \_S0_ PM1b_CNT.SLP_TYP value: 0x00000000 method PASSED: Test 76, \_S0_ correctly returned a sane looking method package. method -method Test 77 of 195: Test _S1_ (S1 System State). +method Test 77 of 200: Test _S1_ (S1 System State). method SKIPPED: Test 77, Skipping test for non-existent object method _S1_. method -method Test 78 of 195: Test _S2_ (S2 System State). +method Test 78 of 200: Test _S2_ (S2 System State). method SKIPPED: Test 78, Skipping test for non-existent object method _S2_. method -method Test 79 of 195: Test _S3_ (S3 System State). +method Test 79 of 200: Test _S3_ (S3 System State). method \_S3_ PM1a_CNT.SLP_TYP value: 0x00000005 method \_S3_ PM1b_CNT.SLP_TYP value: 0x00000005 method PASSED: Test 79, \_S3_ correctly returned a sane looking method package. method -method Test 80 of 195: Test _S4_ (S4 System State). +method Test 80 of 200: Test _S4_ (S4 System State). method \_S4_ PM1a_CNT.SLP_TYP value: 0x00000006 method \_S4_ PM1b_CNT.SLP_TYP value: 0x00000006 method PASSED: Test 80, \_S4_ correctly returned a sane looking method package. method -method Test 81 of 195: Test _S5_ (S5 System State). +method Test 81 of 200: Test _S5_ (S5 System State). method \_S5_ PM1a_CNT.SLP_TYP value: 0x00000007 method \_S5_ PM1b_CNT.SLP_TYP value: 0x00000007 method PASSED: Test 81, \_S5_ correctly returned a sane looking method package. method -method Test 82 of 195: Test _SWS (System Wake Source). +method Test 82 of 200: Test _SWS (System Wake Source). method SKIPPED: Test 82, Skipping test for non-existent object method _SWS. method -method Test 83 of 195: Test _PSS (Performance Supported States). +method Test 83 of 200: Test _PSS (Performance Supported States). method SKIPPED: Test 83, Skipping test for non-existent object method _PSS. method -method Test 84 of 195: Test _CPC (Continuous Performance +method Test 84 of 200: Test _CPC (Continuous Performance method Control). method SKIPPED: Test 84, Skipping test for non-existent object method _CPC. method -method Test 85 of 195: Test _CSD (C State Dependencies). +method Test 85 of 200: Test _CSD (C State Dependencies). method SKIPPED: Test 85, Skipping test for non-existent object method _CSD. method -method Test 86 of 195: Test _CST (C States). +method Test 86 of 200: Test _CST (C States). method SKIPPED: Test 86, Skipping test for non-existent object method _CST. method -method Test 87 of 195: Test _PCT (Performance Control). +method Test 87 of 200: Test _PCT (Performance Control). method SKIPPED: Test 87, Skipping test for non-existent object method _PCT. method -method Test 88 of 195: Test _PDL (P-State Depth Limit). +method Test 88 of 200: Test _PDL (P-State Depth Limit). method SKIPPED: Test 88, Skipping test for non-existent object method _PDL. method -method Test 89 of 195: Test _PPC (Performance Present +method Test 89 of 200: Test _PPC (Performance Present method Capabilities). method SKIPPED: Test 89, Skipping test for non-existent object method _PPC. method -method Test 90 of 195: Test _PPE (Polling for Platform Error). +method Test 90 of 200: Test _PPE (Polling for Platform Error). method SKIPPED: Test 90, Skipping test for non-existent object method _PPE. method -method Test 91 of 195: Test _PSD (Power State Dependencies). +method Test 91 of 200: Test _PSD (Power State Dependencies). method SKIPPED: Test 91, Skipping test for non-existent object method _PSD. method -method Test 92 of 195: Test _PTC (Processor Throttling Control). +method Test 92 of 200: Test _PTC (Processor Throttling Control). method PASSED: Test 92, \_PR_.CPU0._PTC correctly returned a sane method looking package. method PASSED: Test 92, \_PR_.CPU1._PTC correctly returned a sane method looking package. method -method Test 93 of 195: Test _TDL (T-State Depth Limit). +method Test 93 of 200: Test _TDL (T-State Depth Limit). method SKIPPED: Test 93, Skipping test for non-existent object method _TDL. method -method Test 94 of 195: Test _TPC (Throttling Present +method Test 94 of 200: Test _TPC (Throttling Present method Capabilities). method PASSED: Test 94, \_PR_.CPU0._TPC correctly returned an method integer. method PASSED: Test 94, \_PR_.CPU1._TPC correctly returned an method integer. method -method Test 95 of 195: Test _TSD (Throttling State Dependencies). +method Test 95 of 200: Test _TSD (Throttling State Dependencies). method PASSED: Test 95, \_PR_.CPU0._TSD correctly returned a sane method looking package. method PASSED: Test 95, \_PR_.CPU1._TSD correctly returned a sane method looking package. method -method Test 96 of 195: Test _TSS (Throttling Supported States). +method Test 96 of 200: Test _TSS (Throttling Supported States). method \_PR_.CPU0._TSS values: method T-State CPU Power Latency Control Status method Freq (mW) (usecs) @@ -662,53 +662,53 @@ method 7 13% 125 0 09 00 method PASSED: Test 96, \_PR_.CPU1._TSS correctly returned a sane method looking package. method -method Test 97 of 195: Test _LPI (Low Power Idle States). +method Test 97 of 200: Test _LPI (Low Power Idle States). method SKIPPED: Test 97, Skipping test for non-existent object method _LPI. method -method Test 98 of 195: Test _RDI (Resource Dependencies for +method Test 98 of 200: Test _RDI (Resource Dependencies for method Idle). method SKIPPED: Test 98, Skipping test for non-existent object method _RDI. method -method Test 99 of 195: Test _PUR (Processor Utilization Request). +method Test 99 of 200: Test _PUR (Processor Utilization Request). method SKIPPED: Test 99, Skipping test for non-existent object method _PUR. method -method Test 100 of 195: Test _MSG (Message). +method Test 100 of 200: Test _MSG (Message). method SKIPPED: Test 100, Skipping test for non-existent object method _MSG. method -method Test 101 of 195: Test _SST (System Status). +method Test 101 of 200: Test _SST (System Status). method SKIPPED: Test 101, Skipping test for non-existent object method _SST. method -method Test 102 of 195: Test _ALC (Ambient Light Colour +method Test 102 of 200: Test _ALC (Ambient Light Colour method Chromaticity). method SKIPPED: Test 102, Skipping test for non-existent object method _ALC. method -method Test 103 of 195: Test _ALI (Ambient Light Illuminance). +method Test 103 of 200: Test _ALI (Ambient Light Illuminance). method SKIPPED: Test 103, Skipping test for non-existent object method _ALI. method -method Test 104 of 195: Test _ALT (Ambient Light Temperature). +method Test 104 of 200: Test _ALT (Ambient Light Temperature). method SKIPPED: Test 104, Skipping test for non-existent object method _ALT. method -method Test 105 of 195: Test _ALP (Ambient Light Polling). +method Test 105 of 200: Test _ALP (Ambient Light Polling). method SKIPPED: Test 105, Skipping test for non-existent object method _ALP. method -method Test 106 of 195: Test _ALR (Ambient Light Response). +method Test 106 of 200: Test _ALR (Ambient Light Response). method SKIPPED: Test 106, Skipping test for non-existent object method _ALR. method -method Test 107 of 195: Test _LID (Lid Status). +method Test 107 of 200: Test _LID (Lid Status). method PASSED: Test 107, \_SB_.LID0._LID correctly returned sane method looking value 0x00000000. method -method Test 108 of 195: Test _GTF (Get Task File). +method Test 108 of 200: Test _GTF (Get Task File). method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D0._GTF correctly method returned a sane looking buffer. method PASSED: Test 108, \_SB_.PCI0.PATA.PRID.P_D1._GTF correctly @@ -720,540 +720,564 @@ method returned a sane looking buffer. method PASSED: Test 108, \_SB_.PCI0.SATA.PRT2._GTF correctly method returned a sane looking buffer. method -method Test 109 of 195: Test _GTM (Get Timing Mode). +method Test 109 of 200: Test _GTM (Get Timing Mode). method PASSED: Test 109, \_SB_.PCI0.PATA.PRID._GTM correctly method returned a sane looking buffer. method -method Test 110 of 195: Test _MBM (Memory Bandwidth Monitoring +method Test 110 of 200: Test _MBM (Memory Bandwidth Monitoring method Data). method SKIPPED: Test 110, Skipping test for non-existent object method _MBM. method -method Test 111 of 195: Test _UPC (USB Port Capabilities). +method Test 111 of 200: Test _UPC (USB Port Capabilities). method SKIPPED: Test 111, Skipping test for non-existent object method _UPC. method -method Test 112 of 195: Test _UPD (User Presence Detect). +method Test 112 of 200: Test _UPD (User Presence Detect). method SKIPPED: Test 112, Skipping test for non-existent object method _UPD. method -method Test 113 of 195: Test _UPP (User Presence Polling). +method Test 113 of 200: Test _UPP (User Presence Polling). method SKIPPED: Test 113, Skipping test for non-existent object method _UPP. method -method Test 114 of 195: Test _GCP (Get Capabilities). +method Test 114 of 200: Test _GCP (Get Capabilities). method SKIPPED: Test 114, Skipping test for non-existent object method _GCP. method -method Test 115 of 195: Test _GRT (Get Real Time). +method Test 115 of 200: Test _GRT (Get Real Time). method SKIPPED: Test 115, Skipping test for non-existent object method _GRT. method -method Test 116 of 195: Test _GWS (Get Wake Status). +method Test 116 of 200: Test _GWS (Get Wake Status). method SKIPPED: Test 116, Skipping test for non-existent object method _GWS. method -method Test 117 of 195: Test _CWS (Clear Wake Status). +method Test 117 of 200: Test _CWS (Clear Wake Status). method SKIPPED: Test 117, Skipping test for non-existent object method _CWS. method -method Test 118 of 195: Test _SRT (Set Real Time). +method Test 118 of 200: Test _SRT (Set Real Time). method SKIPPED: Test 118, Skipping test for non-existent object method _SRT. method -method Test 119 of 195: Test _STP (Set Expired Timer Wake +method Test 119 of 200: Test _STP (Set Expired Timer Wake method Policy). method SKIPPED: Test 119, Skipping test for non-existent object method _STP. method -method Test 120 of 195: Test _STV (Set Timer Value). +method Test 120 of 200: Test _STV (Set Timer Value). method SKIPPED: Test 120, Skipping test for non-existent object method _STV. method -method Test 121 of 195: Test _TIP (Expired Timer Wake Policy). +method Test 121 of 200: Test _TIP (Expired Timer Wake Policy). method SKIPPED: Test 121, Skipping test for non-existent object method _TIP. method -method Test 122 of 195: Test _TIV (Timer Values). +method Test 122 of 200: Test _TIV (Timer Values). method SKIPPED: Test 122, Skipping test for non-existent object method _TIV. method -method Test 123 of 195: Test _SBS (Smart Battery Subsystem). +method Test 123 of 200: Test _NBS (NVDIMM Boot Status). method SKIPPED: Test 123, Skipping test for non-existent object -method _SBS. +method _NBS. method -method Test 124 of 195: Test _BCT (Battery Charge Time). +method Test 124 of 200: Test _NCH (NVDIMM Current Health +method Information). method SKIPPED: Test 124, Skipping test for non-existent object +method _NCH. +method +method Test 125 of 200: Test _NIC (NVDIMM Health Error Injection +method Capabilities). +method SKIPPED: Test 125, Skipping test for non-existent object +method _NIC. +method +method Test 126 of 200: Test _NIH (NVDIMM Inject/Clear Health +method Errors). +method SKIPPED: Test 126, Skipping test for non-existent object +method _NIH. +method +method Test 127 of 200: Test _NIG (NVDIMM Inject Health Error +method Status). +method SKIPPED: Test 127, Skipping test for non-existent object +method _NIG. +method +method Test 128 of 200: Test _SBS (Smart Battery Subsystem). +method SKIPPED: Test 128, Skipping test for non-existent object +method _SBS. +method +method Test 129 of 200: Test _BCT (Battery Charge Time). +method SKIPPED: Test 129, Skipping test for non-existent object method _BCT. method -method Test 125 of 195: Test _BIF (Battery Information). -method PASSED: Test 125, \_SB_.PCI0.LPCB.BAT1._BIF correctly +method Test 130 of 200: Test _BIF (Battery Information). +method PASSED: Test 130, \_SB_.PCI0.LPCB.BAT1._BIF correctly method returned a sane looking package. method -method Test 126 of 195: Test _BIX (Battery Information Extended). -method SKIPPED: Test 126, Skipping test for non-existent object +method Test 131 of 200: Test _BIX (Battery Information Extended). +method SKIPPED: Test 131, Skipping test for non-existent object method _BIX. method -method Test 127 of 195: Test _BMA (Battery Measurement +method Test 132 of 200: Test _BMA (Battery Measurement method Averaging). -method SKIPPED: Test 127, Skipping test for non-existent object +method SKIPPED: Test 132, Skipping test for non-existent object method _BMA. method -method Test 128 of 195: Test _BMC (Battery Maintenance Control). -method SKIPPED: Test 128, Skipping test for non-existent object +method Test 133 of 200: Test _BMC (Battery Maintenance Control). +method SKIPPED: Test 133, Skipping test for non-existent object method _BMC. method -method Test 129 of 195: Test _BMD (Battery Maintenance Data). -method SKIPPED: Test 129, Skipping test for non-existent object +method Test 134 of 200: Test _BMD (Battery Maintenance Data). +method SKIPPED: Test 134, Skipping test for non-existent object method _BMD. method -method Test 130 of 195: Test _BMS (Battery Measurement Sampling +method Test 135 of 200: Test _BMS (Battery Measurement Sampling method Time). -method SKIPPED: Test 130, Skipping test for non-existent object +method SKIPPED: Test 135, Skipping test for non-existent object method _BMS. method -method Test 131 of 195: Test _BST (Battery Status). -method PASSED: Test 131, \_SB_.PCI0.LPCB.BAT1._BST correctly +method Test 136 of 200: Test _BST (Battery Status). +method PASSED: Test 136, \_SB_.PCI0.LPCB.BAT1._BST correctly method returned a sane looking package. method -method Test 132 of 195: Test _BTP (Battery Trip Point). -method SKIPPED: Test 132, Skipping test for non-existent object +method Test 137 of 200: Test _BTP (Battery Trip Point). +method SKIPPED: Test 137, Skipping test for non-existent object method _BTP. method -method Test 133 of 195: Test _BTH (Battery Throttle Limit). -method SKIPPED: Test 133, Skipping test for non-existent object +method Test 138 of 200: Test _BTH (Battery Throttle Limit). +method SKIPPED: Test 138, Skipping test for non-existent object method _BTH. method -method Test 134 of 195: Test _BTM (Battery Time). -method SKIPPED: Test 134, Skipping test for non-existent object +method Test 139 of 200: Test _BTM (Battery Time). +method SKIPPED: Test 139, Skipping test for non-existent object method _BTM. method -method Test 135 of 195: Test _PCL (Power Consumer List). -method PASSED: Test 135, \_SB_.PCI0.LPCB.ACAD._PCL returned a +method Test 140 of 200: Test _PCL (Power Consumer List). +method PASSED: Test 140, \_SB_.PCI0.LPCB.ACAD._PCL returned a method sane package of 1 references. -method PASSED: Test 135, \_SB_.PCI0.LPCB.BAT1._PCL returned a +method PASSED: Test 140, \_SB_.PCI0.LPCB.BAT1._PCL returned a method sane package of 1 references. method -method Test 136 of 195: Test _PIF (Power Source Information). -method SKIPPED: Test 136, Skipping test for non-existent object +method Test 141 of 200: Test _PIF (Power Source Information). +method SKIPPED: Test 141, Skipping test for non-existent object method _PIF. method -method Test 137 of 195: Test _PRL (Power Source Redundancy List). -method SKIPPED: Test 137, Skipping test for non-existent object +method Test 142 of 200: Test _PRL (Power Source Redundancy List). +method SKIPPED: Test 142, Skipping test for non-existent object method _PRL. method -method Test 138 of 195: Test _PSR (Power Source). -method PASSED: Test 138, \_SB_.PCI0.LPCB.ACAD._PSR correctly +method Test 143 of 200: Test _PSR (Power Source). +method PASSED: Test 143, \_SB_.PCI0.LPCB.ACAD._PSR correctly method returned sane looking value 0x00000000. method -method Test 139 of 195: Test _GAI (Get Averaging Level). -method SKIPPED: Test 139, Skipping test for non-existent object +method Test 144 of 200: Test _GAI (Get Averaging Level). +method SKIPPED: Test 144, Skipping test for non-existent object method _GAI. method -method Test 140 of 195: Test _GHL (Get Harware Limit). -method SKIPPED: Test 140, Skipping test for non-existent object +method Test 145 of 200: Test _GHL (Get Harware Limit). +method SKIPPED: Test 145, Skipping test for non-existent object method _GHL. method -method Test 141 of 195: Test _PMC (Power Meter Capabilities). -method SKIPPED: Test 141, Skipping test for non-existent object +method Test 146 of 200: Test _PMC (Power Meter Capabilities). +method SKIPPED: Test 146, Skipping test for non-existent object method _PMC. method -method Test 142 of 195: Test _PMD (Power Meter Devices). -method SKIPPED: Test 142, Skipping test for non-existent object +method Test 147 of 200: Test _PMD (Power Meter Devices). +method SKIPPED: Test 147, Skipping test for non-existent object method _PMD. method -method Test 143 of 195: Test _PMM (Power Meter Measurement). -method SKIPPED: Test 143, Skipping test for non-existent object +method Test 148 of 200: Test _PMM (Power Meter Measurement). +method SKIPPED: Test 148, Skipping test for non-existent object method _PMM. method -method Test 144 of 195: Test _WPC (Wireless Power Calibration). -method SKIPPED: Test 144, Skipping test for non-existent object +method Test 149 of 200: Test _WPC (Wireless Power Calibration). +method SKIPPED: Test 149, Skipping test for non-existent object method _WPC. method -method Test 145 of 195: Test _WPP (Wireless Power Polling). -method SKIPPED: Test 145, Skipping test for non-existent object +method Test 150 of 200: Test _WPP (Wireless Power Polling). +method SKIPPED: Test 150, Skipping test for non-existent object method _WPP. method -method Test 146 of 195: Test _FIF (Fan Information). -method SKIPPED: Test 146, Skipping test for non-existent object +method Test 151 of 200: Test _FIF (Fan Information). +method SKIPPED: Test 151, Skipping test for non-existent object method _FIF. method -method Test 147 of 195: Test _FPS (Fan Performance States). -method SKIPPED: Test 147, Skipping test for non-existent object +method Test 152 of 200: Test _FPS (Fan Performance States). +method SKIPPED: Test 152, Skipping test for non-existent object method _FPS. method -method Test 148 of 195: Test _FSL (Fan Set Level). -method SKIPPED: Test 148, Skipping test for non-existent object +method Test 153 of 200: Test _FSL (Fan Set Level). +method SKIPPED: Test 153, Skipping test for non-existent object method _FSL. method -method Test 149 of 195: Test _FST (Fan Status). -method SKIPPED: Test 149, Skipping test for non-existent object +method Test 154 of 200: Test _FST (Fan Status). +method SKIPPED: Test 154, Skipping test for non-existent object method _FST. method -method Test 150 of 195: Test _ACx (Active Cooling). -method SKIPPED: Test 150, Skipping test for non-existent object +method Test 155 of 200: Test _ACx (Active Cooling). +method SKIPPED: Test 155, Skipping test for non-existent object method _AC0. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC1. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC2. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC3. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC4. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC5. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC6. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC7. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC8. method -method SKIPPED: Test 150, Skipping test for non-existent object +method SKIPPED: Test 155, Skipping test for non-existent object method _AC9. method method -method Test 151 of 195: Test _ART (Active Cooling Relationship +method Test 156 of 200: Test _ART (Active Cooling Relationship method Table). -method SKIPPED: Test 151, Skipping test for non-existent object +method SKIPPED: Test 156, Skipping test for non-existent object method _ART. method -method Test 152 of 195: Test _CRT (Critical Trip Point). -method SKIPPED: Test 152, Skipping test for non-existent object +method Test 157 of 200: Test _CRT (Critical Trip Point). +method SKIPPED: Test 157, Skipping test for non-existent object method _CRT. method -method Test 153 of 195: Test _CR3 (Warm/Standby Temperature). -method SKIPPED: Test 153, Skipping test for non-existent object +method Test 158 of 200: Test _CR3 (Warm/Standby Temperature). +method SKIPPED: Test 158, Skipping test for non-existent object method _CR3. method -method Test 154 of 195: Test _DTI (Device Temperature +method Test 159 of 200: Test _DTI (Device Temperature method Indication). -method SKIPPED: Test 154, Skipping test for non-existent object +method SKIPPED: Test 159, Skipping test for non-existent object method _DTI. method -method Test 155 of 195: Test _HOT (Hot Temperature). -method SKIPPED: Test 155, Skipping test for non-existent object +method Test 160 of 200: Test _HOT (Hot Temperature). +method SKIPPED: Test 160, Skipping test for non-existent object method _HOT. method -method Test 156 of 195: Test _MTL (Minimum Throttle Limit). -method SKIPPED: Test 156, Skipping test for non-existent object +method Test 161 of 200: Test _MTL (Minimum Throttle Limit). +method SKIPPED: Test 161, Skipping test for non-existent object method _MTL. method -method Test 157 of 195: Test _NTT (Notification Temp Threshold). -method SKIPPED: Test 157, Skipping test for non-existent object +method Test 162 of 200: Test _NTT (Notification Temp Threshold). +method SKIPPED: Test 162, Skipping test for non-existent object method _NTT. method -method Test 158 of 195: Test _PSL (Passive List). -method SKIPPED: Test 158, Skipping test for non-existent object +method Test 163 of 200: Test _PSL (Passive List). +method SKIPPED: Test 163, Skipping test for non-existent object method _PSL. method -method Test 159 of 195: Test _PSV (Passive Temp). -method SKIPPED: Test 159, Skipping test for non-existent object +method Test 164 of 200: Test _PSV (Passive Temp). +method SKIPPED: Test 164, Skipping test for non-existent object method _PSV. method -method Test 160 of 195: Test _RTV (Relative Temp Values). -method SKIPPED: Test 160, Skipping test for non-existent object +method Test 165 of 200: Test _RTV (Relative Temp Values). +method SKIPPED: Test 165, Skipping test for non-existent object method _RTV. method -method Test 161 of 195: Test _SCP (Set Cooling Policy). -method SKIPPED: Test 161, Skipping test for non-existent object +method Test 166 of 200: Test _SCP (Set Cooling Policy). +method SKIPPED: Test 166, Skipping test for non-existent object method _DTI. method -method Test 162 of 195: Test _TC1 (Thermal Constant 1). -method SKIPPED: Test 162, Skipping test for non-existent object +method Test 167 of 200: Test _TC1 (Thermal Constant 1). +method SKIPPED: Test 167, Skipping test for non-existent object method _TC1. method -method Test 163 of 195: Test _TC2 (Thermal Constant 2). -method SKIPPED: Test 163, Skipping test for non-existent object +method Test 168 of 200: Test _TC2 (Thermal Constant 2). +method SKIPPED: Test 168, Skipping test for non-existent object method _TC2. method -method Test 164 of 195: Test _TFP (Thermal fast Sampling Period). -method SKIPPED: Test 164, Skipping test for non-existent object +method Test 169 of 200: Test _TFP (Thermal fast Sampling Period). +method SKIPPED: Test 169, Skipping test for non-existent object method _TFP. method -method Test 165 of 195: Test _TMP (Thermal Zone Current Temp). -method SKIPPED: Test 165, Skipping test for non-existent object +method Test 170 of 200: Test _TMP (Thermal Zone Current Temp). +method SKIPPED: Test 170, Skipping test for non-existent object method _TMP. method -method Test 166 of 195: Test _TPT (Trip Point Temperature). -method SKIPPED: Test 166, Skipping test for non-existent object +method Test 171 of 200: Test _TPT (Trip Point Temperature). +method SKIPPED: Test 171, Skipping test for non-existent object method _TPT. method -method Test 167 of 195: Test _TRT (Thermal Relationship Table). -method SKIPPED: Test 167, Skipping test for non-existent object +method Test 172 of 200: Test _TRT (Thermal Relationship Table). +method SKIPPED: Test 172, Skipping test for non-existent object method _TRT. method -method Test 168 of 195: Test _TSN (Thermal Sensor Device). -method SKIPPED: Test 168, Skipping test for non-existent object +method Test 173 of 200: Test _TSN (Thermal Sensor Device). +method SKIPPED: Test 173, Skipping test for non-existent object method _TSN. method -method Test 169 of 195: Test _TSP (Thermal Sampling Period). -method SKIPPED: Test 169, Skipping test for non-existent object +method Test 174 of 200: Test _TSP (Thermal Sampling Period). +method SKIPPED: Test 174, Skipping test for non-existent object method _TSP. method -method Test 170 of 195: Test _TST (Temperature Sensor Threshold). -method SKIPPED: Test 170, Skipping test for non-existent object +method Test 175 of 200: Test _TST (Temperature Sensor Threshold). +method SKIPPED: Test 175, Skipping test for non-existent object method _TST. method -method Test 171 of 195: Test _TZD (Thermal Zone Devices). -method SKIPPED: Test 171, Skipping test for non-existent object +method Test 176 of 200: Test _TZD (Thermal Zone Devices). +method SKIPPED: Test 176, Skipping test for non-existent object method _TZD. method -method Test 172 of 195: Test _TZM (Thermal Zone member). -method SKIPPED: Test 172, Skipping test for non-existent object +method Test 177 of 200: Test _TZM (Thermal Zone member). +method SKIPPED: Test 177, Skipping test for non-existent object method _TZM. method -method Test 173 of 195: Test _TZP (Thermal Zone Polling). -method SKIPPED: Test 173, Skipping test for non-existent object +method Test 178 of 200: Test _TZP (Thermal Zone Polling). +method SKIPPED: Test 178, Skipping test for non-existent object method _TZP. method -method Test 174 of 195: Test _GPE (General Purpose Events). -method PASSED: Test 174, \_SB_.PCI0.LPCB.EC0_._GPE returned an +method Test 179 of 200: Test _GPE (General Purpose Events). +method PASSED: Test 179, \_SB_.PCI0.LPCB.EC0_._GPE returned an method integer 0x0000001c method -method Test 175 of 195: Test _EC_ (EC Offset Query). -method SKIPPED: Test 175, Skipping test for non-existent object +method Test 180 of 200: Test _EC_ (EC Offset Query). +method SKIPPED: Test 180, Skipping test for non-existent object method _EC_. method -method Test 176 of 195: Test _PTS (Prepare to Sleep). +method Test 181 of 200: Test _PTS (Prepare to Sleep). method Test _PTS(3). -method PASSED: Test 176, \_PTS returned no values as expected. +method PASSED: Test 181, \_PTS returned no values as expected. method method Test _PTS(4). -method PASSED: Test 176, \_PTS returned no values as expected. +method PASSED: Test 181, \_PTS returned no values as expected. method method Test _PTS(5). -method PASSED: Test 176, \_PTS returned no values as expected. +method PASSED: Test 181, \_PTS returned no values as expected. method method -method Test 177 of 195: Test _TTS (Transition to State). -method SKIPPED: Test 177, Optional control method _TTS does not +method Test 182 of 200: Test _TTS (Transition to State). +method SKIPPED: Test 182, Optional control method _TTS does not method exist. method -method Test 178 of 195: Test _WAK (System Wake). +method Test 183 of 200: Test _WAK (System Wake). method Test _WAK(3) System Wake, State S3. -method PASSED: Test 178, \_WAK correctly returned a sane looking +method PASSED: Test 183, \_WAK correctly returned a sane looking method package. method method Test _WAK(4) System Wake, State S4. -method PASSED: Test 178, \_WAK correctly returned a sane looking +method PASSED: Test 183, \_WAK correctly returned a sane looking method package. method method Test _WAK(5) System Wake, State S5. -method PASSED: Test 178, \_WAK correctly returned a sane looking +method PASSED: Test 183, \_WAK correctly returned a sane looking method package. method method -method Test 179 of 195: Test _ADR (Return Unique ID for Device). -method PASSED: Test 179, \_SB_.PCI0.MCHC._ADR correctly returned +method Test 184 of 200: Test _ADR (Return Unique ID for Device). +method PASSED: Test 184, \_SB_.PCI0.MCHC._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.PEGP._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.PEGP._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.CRT_._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.LCD_._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PEGP.VGA_.TV__._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.GFX0._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD01._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD01._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD02._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD02._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD03._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD03._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD04._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD04._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.GFX0.DD05._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.GFX0.DD05._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.HDEF._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.HDEF._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP01._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP01._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP01.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP01.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.RP02._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP02._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP02.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP02.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.RP03._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP03._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP03.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP03.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.RP04._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP04._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP04.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP04.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.RP05._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP05._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP05.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP05.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.RP06._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.RP06._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.RP06.PXSX._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.RP06.PXSX._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.USB1._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.USB1._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.USB2._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.USB2._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.USB3._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.USB3._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.USB4._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.USB4._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.USB5._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.USB5._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.EHC1._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT5._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC1.HUB7.PRT6._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.EHC2._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT1._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT2._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT3._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.EHC2.HUB7.PRT4._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PCIB._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.PCIB._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.LPCB._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.LPCB._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.PATA._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.PATA._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D0._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.PATA.PRID.P_D1._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.SATA._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.SATA._ADR correctly returned method an integer. -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT0._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT0._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT1._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT1._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.SATA.PRT2._ADR correctly +method PASSED: Test 184, \_SB_.PCI0.SATA.PRT2._ADR correctly method returned an integer. -method PASSED: Test 179, \_SB_.PCI0.SBUS._ADR correctly returned +method PASSED: Test 184, \_SB_.PCI0.SBUS._ADR correctly returned method an integer. method -method Test 180 of 195: Test _BCL (Query List of Brightness +method Test 185 of 200: Test _BCL (Query List of Brightness method Control Levels Supported). method Brightness levels for \_SB_.PCI0.PEGP.VGA_.LCD_._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 180, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned +method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._BCL returned method a sane package of 10 integers. method Brightness levels for \_SB_.PCI0.GFX0.DD03._BCL: method Level on full power : 70 method Level on battery power: 40 method Brightness Levels : 0, 10, 20, 30, 40, 50, 60, 70 -method PASSED: Test 180, \_SB_.PCI0.GFX0.DD03._BCL returned a +method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._BCL returned a method sane package of 10 integers. method -method Test 181 of 195: Test _BCM (Set Brightness Level). -method PASSED: Test 181, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned +method Test 186 of 200: Test _BCM (Set Brightness Level). +method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._BCM returned method no values as expected. -method PASSED: Test 181, \_SB_.PCI0.GFX0.DD03._BCM returned no +method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._BCM returned no method values as expected. method -method Test 182 of 195: Test _BQC (Brightness Query Current +method Test 187 of 200: Test _BQC (Brightness Query Current method Level). -method PASSED: Test 182, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly +method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_.LCD_._BQC correctly method returned an integer. -method PASSED: Test 182, \_SB_.PCI0.GFX0.DD03._BQC correctly +method PASSED: Test 187, \_SB_.PCI0.GFX0.DD03._BQC correctly method returned an integer. method -method Test 183 of 195: Test _DCS (Return the Status of Output +method Test 188 of 200: Test _DCS (Return the Status of Output method Device). -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.CRT_._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.LCD_._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_.TV__._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD01._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD01._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD02._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD02._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD03._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD03._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD04._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD04._DCS correctly method returned an integer. -method PASSED: Test 183, \_SB_.PCI0.GFX0.DD05._DCS correctly +method PASSED: Test 188, \_SB_.PCI0.GFX0.DD05._DCS correctly method returned an integer. method -method Test 184 of 195: Test _DDC (Return the EDID for this +method Test 189 of 200: Test _DDC (Return the EDID for this method Device). -method SKIPPED: Test 184, Skipping test for non-existent object +method SKIPPED: Test 189, Skipping test for non-existent object method _DDC. method -method Test 185 of 195: Test _DSS (Device Set State). -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned +method Test 190 of 200: Test _DSS (Device Set State). +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.CRT_._DSS returned method no values as expected. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.LCD_._DSS returned method no values as expected. -method PASSED: Test 185, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned +method PASSED: Test 190, \_SB_.PCI0.PEGP.VGA_.TV__._DSS returned method no values as expected. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD01._DSS returned no +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD01._DSS returned no method values as expected. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD02._DSS returned no +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD02._DSS returned no method values as expected. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD03._DSS returned no +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD03._DSS returned no method values as expected. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD04._DSS returned no +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD04._DSS returned no method values as expected. -method PASSED: Test 185, \_SB_.PCI0.GFX0.DD05._DSS returned no +method PASSED: Test 190, \_SB_.PCI0.GFX0.DD05._DSS returned no method values as expected. method -method Test 186 of 195: Test _DGS (Query Graphics State). -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly +method Test 191 of 200: Test _DGS (Query Graphics State). +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.CRT_._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.LCD_._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.PEGP.VGA_.TV__._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD01._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD01._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD02._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD02._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD03._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD03._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD04._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD04._DGS correctly method returned an integer. -method PASSED: Test 186, \_SB_.PCI0.GFX0.DD05._DGS correctly +method PASSED: Test 191, \_SB_.PCI0.GFX0.DD05._DGS correctly method returned an integer. method -method Test 187 of 195: Test _DOD (Enumerate All Devices Attached +method Test 192 of 200: Test _DOD (Enumerate All Devices Attached method to Display Adapter). method Device 0: method Instance: 0 @@ -1276,7 +1300,7 @@ method Type of display: 2 (TV/HDTV or other Analog-Video Moni method BIOS can detect device: 0 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 187, \_SB_.PCI0.PEGP.VGA_._DOD correctly +method PASSED: Test 192, \_SB_.PCI0.PEGP.VGA_._DOD correctly method returned a sane looking package. method Device 0: method Instance: 0 @@ -1313,45 +1337,45 @@ method Type of display: 0 (Other) method BIOS can detect device: 1 method Non-VGA device: 0 method Head or pipe ID: 0 -method PASSED: Test 187, \_SB_.PCI0.GFX0._DOD correctly returned +method PASSED: Test 192, \_SB_.PCI0.GFX0._DOD correctly returned method a sane looking package. method -method Test 188 of 195: Test _DOS (Enable/Disable Output +method Test 193 of 200: Test _DOS (Enable/Disable Output method Switching). -method PASSED: Test 188, \_SB_.PCI0.PEGP.VGA_._DOS returned no +method PASSED: Test 193, \_SB_.PCI0.PEGP.VGA_._DOS returned no method values as expected. -method PASSED: Test 188, \_SB_.PCI0.GFX0._DOS returned no values +method PASSED: Test 193, \_SB_.PCI0.GFX0._DOS returned no values method as expected. method -method Test 189 of 195: Test _GPD (Get POST Device). -method SKIPPED: Test 189, Skipping test for non-existent object +method Test 194 of 200: Test _GPD (Get POST Device). +method SKIPPED: Test 194, Skipping test for non-existent object method _GPD. method -method Test 190 of 195: Test _ROM (Get ROM Data). -method SKIPPED: Test 190, Skipping test for non-existent object +method Test 195 of 200: Test _ROM (Get ROM Data). +method SKIPPED: Test 195, Skipping test for non-existent object method _ROM. method -method Test 191 of 195: Test _SPD (Set POST Device). -method SKIPPED: Test 191, Skipping test for non-existent object +method Test 196 of 200: Test _SPD (Set POST Device). +method SKIPPED: Test 196, Skipping test for non-existent object method _SPD. method -method Test 192 of 195: Test _VPO (Video POST Options). -method SKIPPED: Test 192, Skipping test for non-existent object +method Test 197 of 200: Test _VPO (Video POST Options). +method SKIPPED: Test 197, Skipping test for non-existent object method _VPO. method -method Test 193 of 195: Test _CBA (Configuration Base Address). -method SKIPPED: Test 193, Skipping test for non-existent object +method Test 198 of 200: Test _CBA (Configuration Base Address). +method SKIPPED: Test 198, Skipping test for non-existent object method _CBA. method -method Test 194 of 195: Test _IFT (IPMI Interface Type). -method SKIPPED: Test 194, Skipping test for non-existent object +method Test 199 of 200: Test _IFT (IPMI Interface Type). +method SKIPPED: Test 199, Skipping test for non-existent object method _IFT. method -method Test 195 of 195: Test _SRV (IPMI Interface Revision). -method SKIPPED: Test 195, Skipping test for non-existent object +method Test 200 of 200: Test _SRV (IPMI Interface Revision). +method SKIPPED: Test 200, Skipping test for non-existent object method _SRV. method method ========================================================== -method 260 passed, 0 failed, 0 warning, 0 aborted, 157 skipped, 0 +method 260 passed, 0 failed, 0 warning, 0 aborted, 162 skipped, 0 method info only. method ==========================================================
Signed-off-by: Alex Hung <alex.hung@canonical.com> --- fwts-test/method-0001/method-0001.log | 748 +++++++++++++------------- 1 file changed, 386 insertions(+), 362 deletions(-)